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Advantest Corporation
Advantest Corporation A Japanese Corporation
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Advantest Corporation patents


Recent patent applications related to Advantest Corporation. Advantest Corporation is listed as an Agent/Assignee. Note: Advantest Corporation may have other listings under different names/spellings. We're not affiliated with Advantest Corporation, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "A" | Advantest Corporation-related inventors


 new patent  Compound semiconductor device

A compound semiconductor device includes a first transistor formed on a gan epitaxial layer. The first transistor includes a gate electrode, a source electrode, a drain electrode, and a protective film covering them. ... Advantest Corporation

High frequency integrated circuit and emitting device for irradiating the integrated circuit

What is described is a high-frequency integrated circuit provided on a iii-v compound semiconductor, wherein an emitting device is radiation-coupled with the integrated circuit such that the emitting device irradiates the integrated circuit, and wherein the integrated circuit has at least one of an oscillator, a mixer, a phase shifter, a frequency divider or an amplifier.. . ... Advantest Corporation

Automated test equipment for combined signals

An automated test equipment for testing devices under test is configured to combine different output signals from multiple pins of a single device under test or from pins of a plurality of devices under test to obtain a combined signal; and to extract individual signals or properties of the individual signals from the combined signal.. . ... Advantest Corporation

Exposure apparatus and computer readable non-transitory storage medium

An exposure apparatus including a plurality of column units to generate a plurality of charged particle beams arrayed in a first direction, a column control unit to separately control irradiation timings of the charged particle beams, a converting unit to convert design data describing an arrangement coordinate of device patterns as a base into exposure data including second data which is divided into belt-like regions having a width of one charged particle beam and extending in a second direction, and first data which specifies the second data based on a position of the first direction, a first storing unit to store the exposure data, and a distributing unit to distribute each of the column units by reconfiguring the exposure data in accordance with an exposure order, and a method of creating exposure data structure and beam control data for such an exposure apparatus are provided.. . ... Advantest Corporation

Switch circuit, method for operating a switch circuit and an automated test equipment

A switch circuit includes at least a first and a second switch element connected in series and a switch control configured for providing control signals for switching the first and the second switch element, such that the control signals have a different timing and such that the first and the second switch element perform one joint switch function.. . ... Advantest Corporation

Method for operating a test apparatus and a test apparatus

A method for operating a test apparatus including a plurality of shared resources is shown, wherein the plurality of shared resources can be used in different instruments. The method includes blocking a first set of resource blockers when a first instrument, which requires a first subset of the shared resources, is to be executed. ... Advantest Corporation

Magnetic field measurement apparatus and method for noise environment

In a magnetic field measurement apparatus and a magnetic field measurement method provided herein, a magnetic field from an object is measured by a magnetic sensor group including a plurality of magnetic sensors. Then, an estimated value of a common noise component included in observed quantities of the magnetic sensors of all the channels of the magnetic sensor group is obtained as an external magnetic noise component. ... Advantest Corporation

Characterization of phase shifter circuitry in integrated circuits (ics) using standard automated test equipment (ate)

A method for characterizing a phase shifter in a device under test (dut) using automated test equipment (ate) is disclosed. The method comprises down converting an input signal received from the transmitter dut to an intermediate frequency and routing the down converted input signal to a signal processor, wherein the signal processor generates i and q signals using the input signal. ... Advantest Corporation

Method and apparatus for socket power calibration with flexible printed circuit board

A structure for performing socket power calibration is disclosed. The structure comprises a plurality of socket ports on a load board electrically coupled to a plurality of traces on a first end of a flexible printed circuit board, wherein the plurality of traces are configured to allow traversal of an electrical signal from the plurality of socket ports to a waveguide. ... Advantest Corporation

Manufacturing method for compound semiconductor device

A support substrate is bonded to a gan epitaxial substrate including at least an electron transport layer and an electron supply layer grown on a growth substrate in the ga-polar direction such that the support substrate faces the ga-plane of the gan epitaxial substrate. Furthermore, at least the growth substrate is removed from the gan epitaxial substrate so as to expose an n-plane of the gan epitaxial substrate. ... Advantest Corporation

Epitaxial substrate

A gan epitaxial substrate comprises a growth substrate and a multilayer structure grown on the growth substrate in the ga-polar direction. The multilayer structure comprises: a buffer layer, an n-type conductive layer formed on the buffer layer, a first gan layer formed on the n-type conductive layer, an electron supply layer formed on the first gan layer, and a second gan layer formed on the electron supply layer.. ... Advantest Corporation

Multicolumn charged particle beam exposure apparatus

A multicolumn charged particle beam exposure apparatus includes a plurality of column cells which generate charged particle beams, and the column cell includes a yoke which is made of a magnetic material and generates a magnetic field of a predetermined intensity distribution around an optical axis of the column, and a coil which is wound around the yoke. The coil includes a plurality of divided windings, which are driven by different power sources.. ... Advantest Corporation

Test equipment, method for operating a test equipment and computer program

A test equipment has a signal input/signal output and a use-site calibration unit for determining a user-site compensation function. The user-site compensation function has a compensation magnitude function and a compensation hilbert phase function. ... Advantest Corporation

Pulse wave sensor unit

A pulse wave sensor unit includes a pressure sensor, and an adhesive tape to attach the pressure sensor to a measurement portion to be measured. The pressure sensor includes a diaphragm part, and an annular support part which supports the diaphragm part and has an aperture for allowing the diaphragm part to face the measurement portion, and a closed space is able to be formed between the diaphragm part and the measurement portion by attaching the pressure sensor to the measurement portion using the adhesive tape.. ... Advantest Corporation

09/28/17 / #20170279491

Handler with integrated receiver and signal path interface to tester

A method for testing a device under test (dut) is disclosed. The method comprises communicating signals wirelessly from a first plurality of patch antennae disposed on a top surface of the dut to a second plurality of patch antennae disposed on a printed circuited within a handler device, wherein the handler device is operable to place the dut in a socket of a tester system, and wherein the tester system comprises the handler device and a test fixture. ... Advantest Corporation

09/07/17 / #20170257107

Removal of sampling clock jitter induced in an output signal of an analog-to-digital converter

An automated test equipment for analyzing an analog time domain output signal of an electronic device under test includes: an analog-to-digital converter configured for converting an analog time domain signal; a sampling clock configured for producing a clock signal; a time-to-frequency converter configured for converting the digital time domain signal into a digital frequency domain signal so that the digital frequency domain signal is represented by frequency bins; a memory device configured for storing a set of empirically determined operating parameters; and a jitter components removal module for removing jitter components produced by the analog-to-digital converter, wherein the jitter removal module is configured for subtracting the lower spur and the upper spur of each frequency bin of the frequency bins from the digital frequency domain signal so that the cleaned digital frequency domain signal is produced.. . ... Advantest Corporation

08/10/17 / #20170229757

Plating methods for modular and/or ganged waveguides for automatic test equipment for semiconductor testing

Embodiments of the present disclosure perform incisions along the direction of the long axis of the waveguide, thereby exposing a trench structure which can be readily plated. Once divided and plated, the individual cut pieces can then be secured together to restore the original waveguide structure. ... Advantest Corporation

08/10/17 / #20170229754

Wave interface assembly for automatic test equipment for semiconductor testing

Embodiments of the present disclosure utilize customizable waveguide fabrication technologies (e.g., 3d printer technology) and patch antenna arrays to create adaptable wave interfaces that can provide efficient signal routing for an ate system. In this fashion, embodiments of the present disclosure allow for arbitrary waveguide routing from port to port and create high density port spacing at the pcb level and which specifically eliminates the large flange required of prior art waveguides. ... Advantest Corporation

08/10/17 / #20170229753

Multiple waveguide structure with single flange for automatic test equipment for semiconductor testing

Embodiments of the present disclosure use customizable waveguides that can be positioned next to each other in a structure that contains one single flange to provide a physical connection for the waveguides. In this fashion, many waveguides can be positioned within a small area to accommodate a tightly packed patch antenna array so that the waveguides can be positioned very close to the socket. ... Advantest Corporation

08/10/17 / #20170229285

Exposure apparatus

The invention provides an exposure apparatus (100) including a formation module (122) which forms charged particle beams with different irradiation positions on a specimen. The formation module (122) includes: a particle source (20) which emits the charged particle beams from an emission region (21) in which a width in a longitudinal direction is different from and a width in a lateral direction orthogonal to the longitudinal direction; an aperture array device (60) provided with openings (62) arranged in an illuminated region (61) in which a width in a longitudinal direction is different from a width in a lateral direction orthogonal to the longitudinal direction; illumination lenses (30, 50) provided between the particle source (20) and the aperture array device (60); and a beam cross-section deformation device (40) which is provided between the particle source (20) and the aperture array device (60), and deforms a cross-sectional shape of the charged particle beams into an anisotropic shape by an action of a magnetic field or an electric field.. ... Advantest Corporation

08/10/17 / #20170228301

Scheduler

Embodiments provide a scheduler for scheduling test times of a plurality of tester software environments for an automatic test equipment. The scheduler is configured to automatically assign test times to the plurality of tester software environments, to acquire test instructions from a tester software environment of the plurality of tester software environments to which a current test time is assigned, to control the automatic test equipment to perform a test according to the test instructions in order to obtain test results, and to provide the test results to the tester software environment of the plurality of tester software environments to which the current test time is assigned.. ... Advantest Corporation

08/10/17 / #20170227598

Integrated waveguide structure and socket structure for millimeter waveband testing

A structure for signal transmission is disclosed. The structure comprises a first plurality of waveguides tightly disposed together and disposed substantially in parallel with each other, each of said waveguides having a first opening and a second opening, wherein each first opening is operable to align with a patch antenna, and wherein the first plurality of waveguides is disposed adjacent to a socket. ... Advantest Corporation

08/03/17 / #20170219661

Magnetic noise rejection apparatus and magnetic field measurement apparatus

There is provided a magnetic noise rejection apparatus which includes: a plurality of cancellation coils arranged near a target object; a plurality of magnetic sensors disposed inside the respective cancellation coils; an adder circuit configured to take a sum of outputs of the plurality of magnetic sensors; and a feedback control circuit configured to supply the cancellation coils with such a common feedback drive current that the sum of the outputs of the magnetic sensors is equal to a sum of outputs of the magnetic sensors under a zero magnetic field.. . ... Advantest Corporation

07/27/17 / #provided is a charged particle beam lens apparatus having a small size and high resolution, and a charged particle beam column and a charged particle beam exposure apparatus.

Advantest Corporation

. . ... Advantest Corporation

06/01/17 / #20170153273

Methods to manufacture semiconductor probe tips

An apparatus for electrically testing a semiconductor device is disclosed. The apparatus comprises a probe card comprising a probe, wherein the probe comprises a probe tip. ... Advantest Corporation

05/18/17 / #20170141618

Wireless power receiver

An automatic tuning assist circuit is coupled with a transmission antenna. Multiple switches sw and a first auxiliary capacitor ca are arranged between a first terminal and a second terminal of the automatic tuning assist circuit. ... Advantest Corporation

04/13/17 / #20170102429

Test apparatus, test signal supply apparatus, test method, and computer readable medium

To reduce test costs by reducing the number of pattern generators provided to a test apparatus. A test apparatus that tests a device under test and a test method are provided, the test apparatus comprising: a packet transmitting unit that packetizes and transmits, during a test of the device under test, a test pattern to be supplied to the device under test; a packet transferring unit that transfers a packet transmitted by the packet transmitting unit; a packet receiving unit that receives the test pattern transferred via the packet transferring unit; a buffering unit that buffers the test pattern received by the packet receiving unit; and a test signal supply unit that supplies the device under test with a test signal according to the test pattern acquired from the buffering unit.. ... Advantest Corporation

03/30/17 / #20170090298

Exposure apparatus and exposure method

Provided is an exposure apparatus that exposes a pattern on a sample, the exposure apparatus including a plurality of blanking electrodes that are provided corresponding to a plurality of charged particle beams and each switch whether the corresponding particle beam irradiates the sample according to an input voltage; an irradiation control section that outputs switching signals for switching blanking voltages supplied respectively to the blanking electrodes; and a measuring section that, for each blanking electrode, measures a delay amount that is from when the switching signal changes to when the blanking voltage changes.. . ... Advantest Corporation

03/23/17 / #20170082668

Measuring apparatus, measuring method, and recording medium

A measuring apparatus according to the present invention includes a response signal measuring section, an input frequency domain conversion section, a response frequency domain conversion section, and a frequency characteristic acquisition section. The response signal measuring section measures a response signal within a time domain, the response signal being acquired by applying a pulse having a width of not less than one femtosecond nor more than 1000 femtoseconds to an object to be measured. ... Advantest Corporation

03/16/17 / #20170074804

Electromagnetic wave measurement device, measurement method, program, and recording medium

According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device and an electromagnetic wave detector. The electromagnetic wave output device outputs an electromagnetic wave having a frequency equal to or more than 0.01 [thz] and equal to or less than 100 [thz] toward a sample acquired by adhering a plurality of specimens to each other by an adhesive and a reflective body arranged behind the sample. ... Advantest Corporation

03/16/17 / #20170074803

Electromagnetic wave measurement device, measurement method, program, and recording medium

According to the present invention, an electromagnetic wave measurement device includes an electromagnetic wave output device and an electromagnetic wave detector. The electromagnetic wave output device outputs and electromagnetic wave having a frequency equal to or more than 0.01 [thz] and equal to or less than 100 [thz] toward a sample acquired by adhering a plurality of specimens to each other by an adhesive. ... Advantest Corporation

03/16/17 / #20170074789

Probe

A probe includes a transmission line support substrate, a probe tip and a probe tip support substrate. The transmission line support substrate supports a transmission line through which a terahertz wave is transmitted. ... Advantest Corporation

02/16/17 / #20170045564

Test apparatus

A reception circuit receives, via a cable, a transmission signal stx generated by a dut. A comparator circuit compares a reception signal srx after signal transmission with at least one threshold signal vth, and generates a judgment value dout that represents a comparison result for every sampling timing. ... Advantest Corporation

01/26/17 / #20170023468

Infrared optical biosensing apparatus and probe thereof

A infrared optical biosensing apparatus is provided which includes: a probe including an infrared light emitting element which emits infrared light, an output variation detection element which detects output variation of the infrared light emitting element, and a light receiving element which detects the infrared light scattered in a living organism; and an operation unit which calculates information on the living organism based on output data of the light receiving element. The operation unit corrects the information on the living organism in accordance with a detection result of the output variation detection element.. ... Advantest Corporation








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