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Advantest Corporation
Advantest Corporation A Japanese Corporation
Advantest Corporation A Japanese Corporation_20100114
Advantest Corporation_20100107
Advantest Corporation_20100114
Advantest Corporation_20100128
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Advantest Corporation patents

Recent patent applications related to Advantest Corporation. Advantest Corporation is listed as an Agent/Assignee. Note: Advantest Corporation may have other listings under different names/spellings. We're not affiliated with Advantest Corporation, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "A" | Advantest Corporation-related inventors




Date Advantest Corporation patents (updated weekly) - BOOKMARK this page
04/13/17Test apparatus, test signal supply apparatus, test method, and computer readable medium
03/30/17Exposure apparatus and exposure method
03/23/17Measuring apparatus, measuring method, and recording medium
03/16/17Probe
03/16/17Electromagnetic wave measurement device, measurement method, program, and recording medium
03/16/17Electromagnetic wave measurement device, measurement method, program, and recording medium
02/16/17Test apparatus
01/26/17Infrared optical biosensing apparatus and probe thereof
12/08/16Millimeter wave pogo pin contactor design
11/17/16Test testing a device under test
11/03/16Method and system for advanced fail data transfer mechanisms
10/27/16Device, manufacturing method, and exposure apparatus
10/27/16Exposure apparatus and exposure method
10/06/16Multi-port measurement technique
10/06/16Power supply device, a test equipment comprising a power supply device and a operating a power supply device
10/06/16Frequency modulated (fm) chirp testing for automotive radars using standard automated test equipment (ate) digital pin channels
09/22/16Instruction provider and providing a sequence of instructions, test processor and providing a device under test
09/01/16Tester
09/01/16Tester
08/04/16Generation of rf stimulus signal using dc modulating signal
06/30/16Cable assembly, connector and semiconductor tester
06/30/16Exposure apparatus and exposure method
06/16/16Automated test equipment for testing a device under test and testing a device under test
06/09/16Member for ink recording, ink recording body, and laminated body for ink recording
06/02/16Measurement apparatus
06/02/16Current measurement circuit
06/02/16Measurement apparatus
06/02/16Automated test equipment, instruction provider for providing a sequence of instructions, providing signal to a device under test, providing a sequence of instructions and test system
05/12/16Charged particle beam exposure apparatus suitable for drawing on line patterns, and exposure method using the same
05/05/16Authentication terminal
05/05/16Authentication system, authentication method and service providing system
04/28/16Electronic device handling apparatus and electronic device testing apparatus
04/21/16Ate thermal overload detection and recovery techniques
04/07/16Non-invasive in situ glucose level sensing using electromagnetic radiation
04/07/16Non-invasive in situ glucose level sensing using electromagnetic radiation
03/03/16Exposure apparatus
02/04/16Scan speed optimization of input and output paths
02/04/16Method and apparatus to provide both high speed and low speed signaling from the high speed transceivers on an field programmable gate array
01/21/16Semiconductor switch
01/14/16Scan test multiplexing
01/14/16Scan test multiplexing
01/07/16Test carrier
12/24/15System, methods and apparatus using virtual appliances in a semiconductor test environment
12/24/15Switchable signal routing circuit
12/10/15Universal test floor system
12/10/15Universal container for device under test
12/10/15Universal test cell
12/10/15Supporting automated testing of devices in a test floor system
12/10/15Multi-configurable testing module for automated testing of a device
12/10/15Customizable tester having testing modules for automated testing of devices
12/10/15Controlling automated testing of devices
11/12/15Dynamic measurement of density using terahertz radiation with real-time thickness measurement for process control
11/12/15Dynamic measurement of material properties using terahertz radiation with real-time thickness measurement for process control
10/29/15Compensating circuit, information processing apparatus, compensation method, and computer readable storage medium
10/15/15Api-based pattern-controlled test on an ate
10/15/15Method and defect repair in nand memory device
10/01/15Measurement apparatus, measurement method, and ultrasonic measurement apparatus
10/01/15Measurement apparatus, measurement method, and ultrasonic diagnosis apparatus
10/01/15Fixture unit, fixture apparatus, handler apparatus, and test apparatus
10/01/15Rf probe
10/01/15Actuator, handler apparatus and test apparatus
10/01/15Ate digital channel for rf frequency/power measurement
10/01/15Test apparatus and circuit substrate unit
10/01/15Device holder, inner unit, outer unit, and tray
10/01/15Handler apparatus, device holder, and test apparatus
Patent Packs
10/01/15Handler apparatus, adjustment handler apparatus, and test apparatus
10/01/15Handler apparatus and test apparatus
10/01/15Handler apparatus and test apparatus
09/24/15Wafer for testing and a test system
09/24/15Temperature control apparatus and test apparatus
09/17/15Body fat diagnostic apparatus
09/17/15Body fat diagnostic apparatus
09/17/15Staged buffer caching in a system for testing a device under test
09/10/15Distributed power supply architecture in automatic test equipment
09/10/15Test apparatus, test method, calibration device, and calibration method
09/10/15Memory testing and failure data filtering
09/10/15Memory test ecc auto-correction of failing data
08/27/15Light measurement apparatus, method, program and recording medium
08/27/15Testing memory devices with parallel processing operations
08/27/15Testing memory devices with distributed processing operations
Patent Packs
08/27/15Charged particle beam exposure apparatus and manufacturing semiconductor device
08/27/15Electron beam exposure method
08/20/15Integrated cooling system for electronics testing apparatus
07/23/15Electronic component transfer shuttle
07/16/15Charged particle beam exposure apparatus
07/09/15Pulse light source, and stably controlling phase difference between pulse laser lights
07/09/15Integrated rf mems on ate loadboards for smart self rf matching
06/25/15Method and an efficient framework for testcell development
06/25/15Wireless power receiving apparatus
06/18/15Test carrier
06/11/15Lumped element radio frequency tuning calibration process
06/04/15Socket and electronic device test apparatus
06/04/15Socket and electronic device test apparatus
05/21/15Flexible test site synchronization
05/21/15Handler apparatus and test method
05/14/15Test carrier
05/14/15Electronic device testing apparatus, electronic device housing apparatus, electronic device retrieving apparatus, and electronic device testing method
05/14/15Test carrier
05/14/15Seamless fail analysis with memory efficient storage of fail lists
05/07/15Photoacoustic wave measurement device
05/07/15Test program and test system
04/30/15Programming multiple serial input devices
04/16/15Carrier disassembling apparatus, electronic device housing apparatus, electronic device retrieving apparatus, and electronic device testing apparatus
03/19/15Photoacoustic wave measurement device
03/05/15Test carrier, defect determination apparatus, and defect determination method
03/05/15Test system
02/26/15Microwave frequency setting device, microwave frequency setting method, and recording medium
02/26/15Test program
02/26/15Test program
02/26/15Distributed pin map memory
Social Network Patent Pack
02/19/15Photoacoustic wave measurement device, method, program, and recording medium
02/19/15Test system
02/19/15Flexible interrupt generation mechanism
02/05/15Photoacoustic diagnosis device, method, program and recording medium
01/29/15Impedance measurement apparatus
01/29/15High speed tester communication interface between test slice and trays
01/15/15Wireless power transmitting apparatus and wireless power supply system
01/15/15Device interface apparatus, test apparatus, and test method
12/11/14Wireless power receiving apparatus
12/11/14Drive circuit, switch apparatus, and test apparatus
Patent Packs
12/04/14Test system
11/27/14Low overdrive probes with high overdrive substrate
10/30/14Automated generation of a test class pre-header from an interactive graphical user interface
10/23/14Testing stacked devices
10/16/14Implementing edit and update functionality within a development environment used to compile test plans for automated semiconductor device testing
09/25/14Current compensation circuit
09/11/14Adaptive thermal control
08/28/14Tester with acceleration for packet building within a fpga block
08/21/14Tester with acceleration on memory and acceleration for automatic pattern generation within a fpga block
08/21/14Test architecture having multiple fpga based hardware accelerator blocks for testing multiple duts independently
08/21/14Tester with mixed protocol engine in a fpga block
08/21/14Cloud based infrastructure for supporting protocol reconfigurations in protocol independent device testing systems
08/21/14Using shared pins in a concurrent test execution environment
08/21/14Gui implementations on central controller computer system for supporting protocol independent device testing
08/14/14Wireless power receiver
07/17/14Detecting apparatus, wafer and electronic device
07/03/14Wireless power transmitter and wireless power receiver
07/03/14Wireless power transmitter and wireless power receiver
07/03/14Measurement apparatus and electronic device
07/03/14Test apparatus and test method
06/19/14Electromagnetic lens for electron beam exposure apparatus
06/19/14Reflection measurement apparatus
06/12/14Correction apparatus, probe apparatus, and test apparatus
06/05/14Relay device of wireless power transmission system
05/29/14Probe apparatus and test apparatus
05/15/14Electron beam exposure apparatus and method
05/15/14Wireless power transmitter
05/01/14Electron beam exposure method
04/24/14Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing method
04/03/14Wireless power receiver
Patent Packs
04/03/14Test apparatus
03/13/14System and protecting probes by using an intelligent current sensing switch
03/06/14Electron beam detector, electron beam processing apparatus, and manufacturing electron beam detector
03/06/14Measurement apparatus and measurement method
03/06/14Pattern printing apparatus, pattern printing method, and test apparatus
02/20/14Sample holder of electron beam exposure apparatus and electron beam exposure method using the same
01/09/14Power supply testing apparatus
01/02/14Switch apparatus and test apparatus
12/19/13Test apparatus
11/14/13Signal processing circuit
10/31/13Measurement device, method, and recording medium
10/31/13Electromagnetic wave emission device
10/31/13Actuator apparatus, test apparatus, and test method
10/17/13Da conversion device and electron beam exposure system using the same
10/10/13Pattern measurement method and pattern measurement apparatus
09/26/13Wireless communication apparatus and wireless communication system
09/26/13Signal generation apparatus and signal generation method
09/26/13Communication system and test apparatus
09/19/13Electromagnetic wave measuring apparatus, measuring method, program, and recording medium
09/19/13Communication system and test apparatus
Social Network Patent Pack
09/12/13Shielded probe array
09/12/13Fine pitch probe array from bulk material
09/12/13Transferring electronic probe assemblies to space transformers
09/12/13Measurement apparatus, measurement method, and program
09/05/13Test apparatus
09/05/13Test apparatus and test module
09/05/13Test apparatus and test module
09/05/13Test apparatus and test module
09/05/13Test apparatus and test module
08/08/13Contact pressure detection apparatus and contact point pressure measurement apparatus
08/08/13Wavelength conversion apparatus, light source apparatus, and wavelength conversion method
07/18/13Electromagnetic wave emission device
07/18/13Handler apparatus and test method
07/18/13Handler and test apparatus
07/18/13Handler and test apparatus
07/18/13Converter and measuring apparatus
07/11/13Calculating apparatus, measuring apparatus, electronic device, program, recording medium and calculating method
07/04/13Electronic device transfer apparatus, electronic device handling apparatus, and electronic device testing apparatus
07/04/13Electronic device testing apparatus
07/04/13Pitch changing apparatus, electronic device handling apparatus, and electronic device testing apparatus
Social Network Patent Pack
07/04/13Transmitting system, receiving system, transmitting method, and receiving method
06/20/13Test apparatus and test method
06/13/13Test apparatus and test method
06/06/13Analog to digital converter and digital to analog converter
05/30/13Test module generation apparatus, test procedure generation apparatus, generation method, program, and test apparatus
05/23/13Spread analysis device for lubricant, method, and recording medium
05/09/13Method of manufacturing semiconductor device and semiconductor manufacturing system
05/02/13Pattern measurement apparatus and pattern measurement method
05/02/13Drive circuit and test apparatus
04/18/13Connecting device, semiconductor wafer test apparatus comprising same, and connecting method
04/04/13Wafer tray, semiconductor wafer test apparatus, and test semiconductor wafer
04/04/13Test apparatus and test method
03/28/13Electromagnetic wave detection device
03/28/13Carrier and adhesion amount measuring apparatus, and measuring method, program, and recording medium of the same
03/21/13Electromagnetic wave emission device
02/14/13Switching apparatus and test apparatus
02/14/13Switching apparatus and test apparatus
02/14/13Measuring apparatus and measuring method
02/14/13Probe structure, probe apparatus, probe structure manufacturing method, and test apparatus
01/31/13Actuator manufacturing method, switching apparatus, transmission line switching apparatus, and test apparatus
01/31/13Switching apparatus, switching apparatus manufacturing method, transmission line switching apparatus, and test apparatus
12/27/12Signal measurement device, signal measurement method, and recording medium
12/27/12Optical device and optical modulation apparatus
12/27/12Optical device and optical modulation apparatus
12/27/12Test apparatus and test method
12/20/12Test digital modulated signal
12/20/12Signal display device, method, and recording medium
12/20/12Board assembly, electronic device test apparatus and water jacket
12/20/12Test apparatus
11/29/12Test apparatus and test method
Social Network Patent Pack
11/29/12Test apparatus and test method
11/29/12Test apparatus and test method
11/29/12Test apparatus and test method
11/15/12Electromagnetic wave measurement device, measurement method, and recording medium
11/15/12Manufacturing method, switching apparatus, transmission line switching apparatus, and test apparatus
11/08/12Test head, test board and test apparatus
11/08/12Board mounting apparatus, test head, and electronic device test apparatus
10/25/12Wireless power supply apparatus
10/25/12Switching apparatus and test apparatus
10/25/12Test apparatus
10/25/12Test carrier
10/25/12Test carrier and board assembly
10/25/12Light source, optical signal generator, and electrical signal generator
10/18/12Timing generator and test apparatus
10/18/12Analog to digital converter and digital to analog converter
10/11/12Memory repair analysis apparatus, memory repair analysis method, and test apparatus
10/04/12Test apparatus
09/20/12Measurement apparatus and measurement method
09/20/12Test carrier
09/13/12Transmission coil for wireless power transmission
09/13/12Test apparatus and test a/d converter
09/06/12Test apparatus
08/30/12Test apparatus and test method
08/30/12Power supply test apparatus
08/23/12Test apparatus and test method
08/23/12Test apparatus, test method and manufacturing method
08/23/12Test apparatus
08/16/12Manufacturing apparatus, manufacturing method and packaged device
08/09/12Multi-valued driver circuit







ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009



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