Real Time Touch



new TOP 200 Companies filing patents this week

new Companies with the Most Patent Filings (2010+)




Real Time Touch
  

Bruker Nano Inc patents

Recent patent applications related to Bruker Nano Inc. Bruker Nano Inc is listed as an Agent/Assignee. Note: Bruker Nano Inc may have other listings under different names/spellings. We're not affiliated with Bruker Nano Inc, we're just tracking patents.

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "B" | Bruker Nano Inc-related inventors




Date Bruker Nano Inc patents (updated weekly) - BOOKMARK this page
02/23/17Peakforce photothermal-based detection of ir nanoabsorption
12/08/16Chemical nano-identification of a sample using normalized near-field spectroscopy
10/27/16Method and apparatus of operating a scanning probe microscope
09/22/16Dual-probe scanning probe microscope
09/22/16Method and apparatus of using peak force tapping mode to measure physical properties of a sample
09/15/16Closed loop controller and fast scanning probe microscopy
09/08/16Method and apparatus of operating a scanning probe microscope
07/21/16Peakforce photothermal-based detection of ir nanoabsorption
06/23/16Method and apparatus of electrical property measurement using an afm operating in peak force tapping mode
04/21/16Method and apparatus of tuning a scanning probe microscope
02/04/16Method and apparatus of physical property measurement using a probe-based nano-localized light source
01/21/16Chemical nano-identification of a sample using normalized near-field spectroscopy
09/03/15Method and apparatus to compensate for deflection artifacts in an atomic force microscope
08/27/15Peak force photothermal-based detection of ir nanoabsorption
08/27/15Precise probe placement in automated scanning probe microscopy systems
08/13/15Apparatus and atomic force microscopy
07/23/15Method and apparatus of tuning a scanning probe microscope
07/16/15Closed loop controller and fast scanning probe microscopy
06/11/15Force measurement with real-time baseline determination
03/19/15Scanning probe microscope with improved feature location capabilities
03/12/15Low drift scanning probe microscope
03/05/15Method and apparatus of physical property measurement using a probe-based nano-localized light source
09/25/14Peakforce photothermal-based detection of ir nanoabsorption
09/18/14Method and adaptive tracking using a scanning probe microscope
09/18/14Dual-probe scanning probe microscope
09/18/14Method and apparatus of operating a scanning probe microscope
09/11/14Method and apparatus of physical property measurement using a probe-based nano-localized light source
08/14/14Method and apparatus of using peak force tapping mode to measure physical properties of a sample
08/07/14Method and apparatus of operating a scanning probe microscope
05/16/13Method and apparatus of tuning a scanning probe microscope
02/21/13Testing of electroluminescent semiconductor wafers
02/21/13Predicting led parameters from electroluminescent semiconductor wafer testing
11/22/12Cleaning station for atomic force microscope
11/01/12Scanning probe microscope with compact scanner
10/18/12Method and apparatus of analyzing sample surface data
10/11/12Interferometric measurement of non-homogeneous multi-material surfaces
10/11/12Interferometric measurement of non-homogeneous multi-material surfaces
08/09/12Fast-scanning spm scanner and operating same
05/24/12Method and apparatus of using peak force tapping mode to measure physical properties of a sample
05/03/12Optical measurement of lead angle of groove in manufactured part
07/14/11Method for automatically loading a probe assembly
05/05/11Scanning probe microscope having support stage incorporating a kinematic flexure arrangement







ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009



###

This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Bruker Nano Inc in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Bruker Nano Inc with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

###




';