Real Time Touch



new TOP 200 Companies filing patents this week

new Companies with the Most Patent Filings (2010+)




Real Time Touch

Similar
Filing Names

Bruker Nano Inc
Bruker Nano Incorporated

Bruker Nano Inc patents


Recent patent applications related to Bruker Nano Inc. Bruker Nano Inc is listed as an Agent/Assignee. Note: Bruker Nano Inc may have other listings under different names/spellings. We're not affiliated with Bruker Nano Inc, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "B" | Bruker Nano Inc-related inventors


Field-mapping and focal-spot tracking for s-snom

System and method for optical alignment of a near-field system, employing reiterative analysis of amplitude (irradiance) and phase maps of irradiated field obtained in back-scattered light while adjusting the system to arrive at field pattern indicative of and sensitive to a near-field optical wave produced by diffraction-limited irradiation of a... Bruker Nano Inc

Super resolution microscopy

A super resolution microscope system is disclosed and described. The system can include a sample stage (180) adapted to receive a sample (185) including probe molecules. At least one light source (105) is provided to produce a coherent excitation light to excite the probe molecules and cause luminescence of the... Bruker Nano Inc

Method and apparatus of operating a scanning probe microscope

An improved mode of AFM imaging (Peak Force Tapping (PFT) Mode) uses force as the feedback variable to reduce tip-sample interaction forces while maintaining scan speeds achievable by all existing AFM operating modes. Sample imaging and mechanical property mapping are achieved with improved resolution and high sample throughput, with the... Bruker Nano Inc

Force measurement with real-time baseline determination

An atomic force microscope (AFM) and corresponding method to provide low force (sub-20 pN) AFM control and mechanical property measurement is provided. The preferred embodiments employ real-time false deflection correction/discrimination by adaptively modifying the drive ramp to accommodate to deflection artifacts.... Bruker Nano Inc

Field-mapping and focal-spot tracking for s-snom

System and method for optical alignment of a near-field system, employing reiterative analysis of amplitude (irradiance) and phase maps of irradiated field obtained in back-scattered light while adjusting the system to arrive at field pattern indicative of and sensitive to a near-field optical wave produced by diffraction-limited irradiation of a... Bruker Nano Inc

Peakforce photothermal-based detection of ir nanoabsorption

An apparatus and method of performing photothermal chemical nanoidentification of a sample includes positioning a tip of a probe at a region of interest of the sample, with the tip-sample separation being less than about 10 nm. Then, IR electromagnetic energy having a selected frequency, w, is directed towards the... Bruker Nano Inc








ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009



###

This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Bruker Nano Inc in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Bruker Nano Inc with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

###