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Carl Zeiss Microscopy Gmbh patents

Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors

Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12016003553402/04/16  new patent  Method for analyzing and/or processing an object as well as a particle beam device for carrying out the method
22016002006401/21/16 Apparatus for focusing and for storage of ions and for separation of pressure areas
32016001111301/14/16 Method for the operation of a laser scanning microscope
42016000377701/07/16 Recording device and recording method
52015037814112/31/15 Light microscope and microscopy method
62015037005712/24/15 Method for operating a light microscope and optical assembly
72015035544612/10/15 Method for the microscope imaging of samples adhering to bottoms of fluid filled wells of a microtiter plate
82015035715712/10/15 Particle beam operating a particle optical unit
92015034874212/03/15 Charged particle optical apparatus having a selectively positionable differential pressure module
102015034874912/03/15 Multi-beam particle microscope and operating same
112015032377411/12/15 Microscope with a light sheet
122015030929710/29/15 Autofocus microscope and microscope comprising autofocus device
132015030132510/22/15 Optical arrangement and light microscope
142015029333810/15/15 System for microscopic applications
152015028604210/08/15 Microscope and spim microscopy
162015027709310/01/15 Procedure for terminating microscopic applications with an immersion objective
172015026845809/24/15 Method for fluorescence microscopy of a sample
182015026097509/17/15 Procedure and device for terminating the immersion at a microscope
192015025355609/10/15 Confocal incident-light scanning microsope for multipoint scanning
202015025355709/10/15 Confocal microscope with freely adjustable sample scanning
212015025355909/10/15 Optical arrangement and light microscope
222015025356209/10/15 Method for the correction of spherical aberration in microscopic applications
232015024800109/03/15 Apochromatic microscope objective
242015024800309/03/15 Calibration plate for measuring calibration of a digital microscope and methods of using the same
252015024801509/03/15 Optical assembly and light microscope
262015024168208/27/15 Immersion medium and its layout in an optical system
272015023582908/20/15 Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor
282015022667008/13/15 Microscope
292015021988608/06/15 Optical system for digital microscopy
302015021988708/06/15 High aperture immersion objective
312015021400407/30/15 Method for preparing and analyzing an object as well as particle beam device for performing the method
322015018545407/02/15 High-resolution scanning microscopy
332015016870606/18/15 Microscope and spim microscopy
342015016873206/18/15 Microscope and spim microscopy
352015016044606/11/15 Microscope and high-resolution 3d fluorescence microscopy
362015015356006/04/15 Method for preparing for and carrying out the acquisition of image stacks of a sample from various orientation angles
372015014478705/28/15 Electron microscope
382015014480105/28/15 Particle beam operating the same
392015014598105/28/15 Light scanning microscope with spectral detection
402015011429404/30/15 Processing system
412015011680704/30/15 Microscope and microscopy method
422015009087904/02/15 Charged particle multi-beam inspection system and operating the same
432015009090804/02/15 Light microscope and microscopy examining a microscopic specimen
442015008391103/26/15 Method of detecting electrons, an electron-detector and an inspection system
452015008509903/26/15 High-resolution scanning microscopy
462015007784203/19/15 High-resolution scanning microscopy
472015007784303/19/15 High-resolution scanning microscopy
482015007784503/19/15 Device and microscopy
492015006923503/12/15 Particle optical system
502015007075703/12/15 Microscope
512015005493702/26/15 Light microscope and image recording using a light microscope
522015004824802/19/15 Method for processing and/or for observing an object, and particle beam device for carrying out the method
532015004918002/19/15 Microscope
542015004306402/12/15 Tube shield lens unit
552015003596402/05/15 High-resolution luminescence microscopy
562015003596502/05/15 Method for calibrating a digital optical imaging system having a zoom system, correcting aberrations in a digital optical imaging system having a zoom system, and digital optical imaging system
572015003602702/05/15 Method for calibrating a digital optical instrument and digital optical instrument
582015003612202/05/15 Fib-sem array tomography
592015002822501/29/15 Method for manufacturing a tem-lamella and assembly having a tem-lamella protective structure
602015002958301/29/15 Apparatus and transmitted light illumination for light microscopes and microscope system
612015001452801/15/15 Method of operating a particle beam microscope and a particle beam microscope
622015001592901/15/15 Optical switch and beam stabilization device
632015001594201/15/15 Method for detecting and controlling supply of an immersion medium
642015001594301/15/15 Device for forming an immersion film
652015000830901/08/15 High-resolution scanning microscopy
662015000263201/01/15 Microscope and high-resolution 3-d fluorescence microscopy
672014035479612/04/14 Apparatus and transmitted light illumination for light microscopes and microscope system
682014035510912/04/14 Immersion fluid for microscopy
692014034746111/27/14 Microscope for widefield microscopy
702014033942411/20/14 Device for mass selective determination of an ion
712014033943911/20/14 Method for high-resolution 3d localization microscopy
722014034048311/20/14 Method for three-dimensional high resolution localization microscopy
732014034074211/20/14 Ring illumination device for a microscope objective, and microscope objective
742014032687411/06/14 Printed circuit board multipole units used for ion transportation
752014032796111/06/14 Slider for introduction into an optical path of a light microscope
762014031331110/23/14 Control device and controlling a motorized digital microscope
772014031331210/23/14 Digital microscope and optimizing the work process in a digital microscope
782014031357710/23/14 Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope
792014031358910/23/14 Telecentric modular zoom system
802014031360310/23/14 Objective lens mount
812014029148410/02/14 Microscope with structured illumination
822014029303710/02/14 Optical microscope and examining a microscopic sample
832014029341010/02/14 Laser scanning microscope
842014023284408/21/14 Method and defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
852014023302908/21/14 Spectrometer
862014022620408/14/14 Optical assembly and light microscope
872014021730308/07/14 Particle beam operating the same
882014021130507/31/14 Laser scanning microscope
892014020226507/24/14 Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
902014019732807/17/14 Ion beam system and operating an ion beam system
912014019094607/10/14 Laser microdissection method and laser microdissection device
922014019112607/10/14 Method of depositing protective structures
932014019240607/10/14 Laser scanning microscope having an illumination array
942014018477707/03/14 High-resolution luminescence microscopy
952014017667806/26/14 Method for high-resolution 3d-localization microscopy
962014017704406/26/14 Method and configuration for the optical detection of an illuminated specimen
972014016876306/19/14 Variable imaging system with an objective of fixed focal length
982014015888406/12/14 Method for operating a particle beam device and/or for analyzing an object in a particle beam device
992014015890206/12/14 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
1002014015308806/05/14 Slider for sliding into the observation beam path of a microscope
1012014014637605/29/14 Light microscope and microscopy method
1022014011852805/01/14 Setting unit and setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
1032014011875005/01/14 Method and configuration for depth resolved optical detection of an illuminated specimen
1042014011057704/24/14 Particle beam system and processing a tem-sample
1052014011163304/24/14 Wide field microscope and wide field microscopy
1062014009246004/03/14 Optical filter device, in particular for microscopes
1072014007009703/13/14 Particle beam device and operating a particle beam device
1082014007009903/13/14 Particle beam microscope for generating material data
1092014005585102/27/14 Laser scanning microscope
1102014000136101/02/14 Micro-gripper
1112014000137301/02/14 Method for setting a position of a carrier element in a particle beam device
1122013034267312/26/13 Method and device for focussing a microscope automatically
1132013032022612/05/13 Method and scanning a surface of an object using a particle beam
1142013032393712/05/13 Combined laser processing system and focused ion beam system
1152013030820111/21/13 Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
1162013030083311/14/13 3d localisation microscopy and 4d localisation microscopy and tracking methods and systems
1172013030290511/14/13 Increased depth-resolution microscopy
1182013029256611/07/13 Transmission electron microscopy system and operating a transmission electron microscopy system
1192013029388611/07/13 Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
1202013027176410/17/13 Measurement devices and apparatuses for spectroscopic examination of samples
1212013027184710/17/13 Immersion objective and light microscope
1222013026540710/10/13 Method and device for determining a critical angle of an excitation light beam
1232013025656310/03/13 High-resolution fluorescence microscopy
1242013025809010/03/13 Light microscope and recording images with a light microscope
1252013025006909/26/13 Device and the three-dimensional measurement of an object
1262013025040709/26/13 Device for increasing the depth discrimination of optical imaging systems
1272013024240709/19/13 Wide range zoom system
1282013023545309/12/13 Device for positioning optical components on a microscope
1292013022870409/05/13 Wavelength-resolving and high spatial resolution fluorescence microscopy
1302013022256708/29/13 Microscope and wavelength-selective and high spatial resolving microscopy
1312013021394508/22/13 Methods and the preparation of microscopy samples by using pulsed light
1322013020835508/15/13 X-y stage for microscopes
1332013018706407/25/13 Particle beam system including a supply of process gas to a processing location
1342013018096207/18/13 Methods and systems for raster scanning a surface of an object using a particle beam
1352013013432805/30/13 Processing system
1362013010046104/25/13 Methods and apparatuses for position and force detection
1372013010052604/25/13 Filter holder for correlative particle analysis
1382013010053704/25/13 Planapochromatically-corrected microscope objective
1392013010118804/25/13 Microscopy of several samples using optical microscopy and particle beam microscopy
1402013008771604/11/13 Charged particle source
1412013002776801/31/13 Attachment of optical microscope components
1422013002166401/24/13 Arrangement for adjusting illumination devices in transmitted-light microscopes
1432013000317101/03/13 Inverted microscope
1442013000318701/03/13 High-aperture immersion objective
1452012032603212/27/12 Particle beam microscope

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by