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Carl Zeiss Microscopy Gmbh patents

Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors

Search recent Press Releases: Carl Zeiss Microscopy Gmbh-related press releases
Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12015011429404/30/15Processing system
22015011680704/30/15Microscope and microscopy method
32015009087904/02/15Charged particle multi-beam inspection system and operating the same
42015009090804/02/15Light microscope and microscopy examining a microscopic specimen
52015008391103/26/15Method of detecting electrons, an electron-detector and an inspection system
62015008509903/26/15High-resolution scanning microscopy
72015007784203/19/15High-resolution scanning microscopy
82015007784303/19/15High-resolution scanning microscopy
92015007784503/19/15Device and microscopy
102015006923503/12/15Particle optical system
122015005493702/26/15Light microscope and image recording using a light microscope
132015004824802/19/15Method for processing and/or for observing an object, and particle beam device for carrying out the method
152015004306402/12/15Tube shield lens unit
162015003596402/05/15High-resolution luminescence microscopy
172015003596502/05/15Method for calibrating a digital optical imaging system having a zoom system, correcting aberrations in a digital optical imaging system having a zoom system, and digital optical imaging system
182015003602702/05/15Method for calibrating a digital optical instrument and digital optical instrument
192015003612202/05/15Fib-sem array tomography
202015002822501/29/15Method for manufacturing a tem-lamella and assembly having a tem-lamella protective structure
212015002958301/29/15Apparatus and transmitted light illumination for light microscopes and microscope system
222015001452801/15/15Method of operating a particle beam microscope and a particle beam microscope
232015001592901/15/15Optical switch and beam stabilization device
242015001594201/15/15Method for detecting and controlling supply of an immersion medium
252015001594301/15/15Device for forming an immersion film
262015000830901/08/15High-resolution scanning microscopy
272015000263201/01/15Microscope and high-resolution 3-d fluorescence microscopy
282014035479612/04/14Apparatus and transmitted light illumination for light microscopes and microscope system
292014035510912/04/14Immersion fluid for microscopy
302014034746111/27/14Microscope for widefield microscopy
312014033942411/20/14Device for mass selective determination of an ion
322014033943911/20/14Method for high-resolution 3d localization microscopy
332014034048311/20/14Method for three-dimensional high resolution localization microscopy
342014034074211/20/14Ring illumination device for a microscope objective, and microscope objective
352014032687411/06/14Printed circuit board multipole units used for ion transportation
362014032796111/06/14Slider for introduction into an optical path of a light microscope
372014031331110/23/14Control device and controlling a motorized digital microscope
382014031331210/23/14Digital microscope and optimizing the work process in a digital microscope
392014031357710/23/14Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope
402014031358910/23/14Telecentric modular zoom system
412014031360310/23/14Objective lens mount
422014029148410/02/14Microscope with structured illumination
432014029303710/02/14Optical microscope and examining a microscopic sample
442014029341010/02/14Laser scanning microscope
452014023284408/21/14Method and defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
472014022620408/14/14Optical assembly and light microscope
482014021730308/07/14Particle beam operating the same
492014021130507/31/14Laser scanning microscope
502014020226507/24/14Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
512014019732807/17/14Ion beam system and operating an ion beam system
522014019094607/10/14Laser microdissection method and laser microdissection device
532014019112607/10/14Method of depositing protective structures
542014019240607/10/14Laser scanning microscope having an illumination array
552014018477707/03/14High-resolution luminescence microscopy
562014017667806/26/14Method for high-resolution 3d-localization microscopy
572014017704406/26/14Method and configuration for the optical detection of an illuminated specimen
582014016876306/19/14Variable imaging system with an objective of fixed focal length
592014015888406/12/14Method for operating a particle beam device and/or for analyzing an object in a particle beam device
602014015890206/12/14Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
612014015308806/05/14Slider for sliding into the observation beam path of a microscope
622014014637605/29/14Light microscope and microscopy method
632014011852805/01/14Setting unit and setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
642014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
652014011057704/24/14Particle beam system and processing a tem-sample
662014011163304/24/14Wide field microscope and wide field microscopy
672014009246004/03/14Optical filter device, in particular for microscopes
682014007009703/13/14Particle beam device and operating a particle beam device
692014007009903/13/14Particle beam microscope for generating material data
702014005585102/27/14Laser scanning microscope
722014000137301/02/14Method for setting a position of a carrier element in a particle beam device
732013034267312/26/13Method and device for focussing a microscope automatically
742013032022612/05/13Method and scanning a surface of an object using a particle beam
752013032393712/05/13Combined laser processing system and focused ion beam system
762013030820111/21/13Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
772013030083311/14/133d localisation microscopy and 4d localisation microscopy and tracking methods and systems
782013030290511/14/13Increased depth-resolution microscopy
792013029256611/07/13Transmission electron microscopy system and operating a transmission electron microscopy system
802013029388611/07/13Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
812013027176410/17/13Measurement devices and apparatuses for spectroscopic examination of samples
822013027184710/17/13Immersion objective and light microscope
832013026540710/10/13Method and device for determining a critical angle of an excitation light beam
842013025656310/03/13High-resolution fluorescence microscopy
852013025809010/03/13Light microscope and recording images with a light microscope
862013025006909/26/13Device and the three-dimensional measurement of an object
872013025040709/26/13Device for increasing the depth discrimination of optical imaging systems
882013024240709/19/13Wide range zoom system
892013023545309/12/13Device for positioning optical components on a microscope
902013022870409/05/13Wavelength-resolving and high spatial resolution fluorescence microscopy
912013022256708/29/13Microscope and wavelength-selective and high spatial resolving microscopy
922013021394508/22/13Methods and the preparation of microscopy samples by using pulsed light
932013020835508/15/13X-y stage for microscopes
942013018706407/25/13Particle beam system including a supply of process gas to a processing location
952013018096207/18/13Methods and systems for raster scanning a surface of an object using a particle beam
962013013432805/30/13Processing system
972013010046104/25/13Methods and apparatuses for position and force detection
982013010052604/25/13Filter holder for correlative particle analysis
992013010053704/25/13Planapochromatically-corrected microscope objective
1002013010118804/25/13Microscopy of several samples using optical microscopy and particle beam microscopy
1012013008771604/11/13Charged particle source
1022013002776801/31/13Attachment of optical microscope components
1032013002166401/24/13Arrangement for adjusting illumination devices in transmitted-light microscopes
1042013000317101/03/13Inverted microscope
1052013000318701/03/13High-aperture immersion objective
1062012032603212/27/12Particle beam microscope

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by