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Carl Zeiss Microscopy Gmbh patents


      
Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors




Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12016017854306/23/16  new patent  Analyzing an object using a particle beam apparatus
22016017888206/23/16  new patent  Control system for a microscope and controlling a microscope
32016018105406/23/16  new patent  Objective lens arrangement usable in particle-optical systems
42016018105506/23/16  new patent  Method of adjusting a stigmator in a particle beam apparatus and a particle beam system
52016018105806/23/16  new patent  Method for processing and/or for observing an object, and particle beam device for carrying out the method
62016017019506/16/16 Arrangement for light sheet microscopy
72016015423606/02/16 Assembly for light sheet microscopy
82016015560306/02/16 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
92016013188105/12/16 Laser scanning microscope
102016013188305/12/16 High-resolution scanning microscopy
112016013188405/12/16 Device for imaging sample
122016013190005/12/16 Lens and optical observation device
132016011672804/28/16 Luminescence microscopy
142016011821604/28/16 Method for measuring a distance of a component from an object and for setting a position of a component in a particle beam device
152016011125104/21/16 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
162016011126904/21/16 Mass spectrometer, use thereof, and the mass spectrometric examination of a gas mixture
172016009064503/31/16 Method for structuring an object with the aid of a particle beam apparatus
182016008506203/24/16 Microscope and 3d high-resolution localization microscopy with an enlarged measurement region
192016006211103/03/16 Microscopical imaging system
202016005455102/25/16 Method for imaging a sample by means of a microscope and microscope
212016004896702/18/16 Method and device for determining a distance between two optical boundary surfaces which are spaced apart from each other along a first direction
222016004137702/11/16 Transmitted-light microscope and transmitted-light microscopy
232016003553402/04/16 Method for analyzing and/or processing an object as well as a particle beam device for carrying out the method
242016002006401/21/16 Apparatus for focusing and for storage of ions and for separation of pressure areas
252016001111301/14/16 Method for the operation of a laser scanning microscope
262016000377701/07/16 Recording device and recording method
272015037814112/31/15 Light microscope and microscopy method
282015037005712/24/15 Method for operating a light microscope and optical assembly
292015035544612/10/15 Method for the microscope imaging of samples adhering to bottoms of fluid filled wells of a microtiter plate
302015035715712/10/15 Particle beam operating a particle optical unit
312015034874212/03/15 Charged particle optical apparatus having a selectively positionable differential pressure module
322015034874912/03/15 Multi-beam particle microscope and operating same
332015032377411/12/15 Microscope with a light sheet
342015030929710/29/15 Autofocus microscope and microscope comprising autofocus device
352015030132510/22/15 Optical arrangement and light microscope
362015029333810/15/15 System for microscopic applications
372015028604210/08/15 Microscope and spim microscopy
382015027709310/01/15 Procedure for terminating microscopic applications with an immersion objective
392015026845809/24/15 Method for fluorescence microscopy of a sample
402015026097509/17/15 Procedure and device for terminating the immersion at a microscope
412015025355609/10/15 Confocal incident-light scanning microsope for multipoint scanning
422015025355709/10/15 Confocal microscope with freely adjustable sample scanning
432015025355909/10/15 Optical arrangement and light microscope
442015025356209/10/15 Method for the correction of spherical aberration in microscopic applications
452015024800109/03/15 Apochromatic microscope objective
462015024800309/03/15 Calibration plate for measuring calibration of a digital microscope and methods of using the same
472015024801509/03/15 Optical assembly and light microscope
482015024168208/27/15 Immersion medium and its layout in an optical system
492015023582908/20/15 Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor
502015022667008/13/15 Microscope
512015021988608/06/15 Optical system for digital microscopy
522015021988708/06/15 High aperture immersion objective
532015021400407/30/15 Method for preparing and analyzing an object as well as particle beam device for performing the method
542015018545407/02/15 High-resolution scanning microscopy
552015016870606/18/15 Microscope and spim microscopy
562015016873206/18/15 Microscope and spim microscopy
572015016044606/11/15 Microscope and high-resolution 3d fluorescence microscopy
582015015356006/04/15 Method for preparing for and carrying out the acquisition of image stacks of a sample from various orientation angles
592015014478705/28/15 Electron microscope
602015014480105/28/15 Particle beam operating the same
612015014598105/28/15 Light scanning microscope with spectral detection
622015011429404/30/15 Processing system
632015011680704/30/15 Microscope and microscopy method
642015009087904/02/15 Charged particle multi-beam inspection system and operating the same
652015009090804/02/15 Light microscope and microscopy examining a microscopic specimen
662015008391103/26/15 Method of detecting electrons, an electron-detector and an inspection system
672015008509903/26/15 High-resolution scanning microscopy
682015007784203/19/15 High-resolution scanning microscopy
692015007784303/19/15 High-resolution scanning microscopy
702015007784503/19/15 Device and microscopy
712015006923503/12/15 Particle optical system
722015007075703/12/15 Microscope
732015005493702/26/15 Light microscope and image recording using a light microscope
742015004824802/19/15 Method for processing and/or for observing an object, and particle beam device for carrying out the method
752015004918002/19/15 Microscope
762015004306402/12/15 Tube shield lens unit
772015003596402/05/15 High-resolution luminescence microscopy
782015003596502/05/15 Method for calibrating a digital optical imaging system having a zoom system, correcting aberrations in a digital optical imaging system having a zoom system, and digital optical imaging system
792015003602702/05/15 Method for calibrating a digital optical instrument and digital optical instrument
802015003612202/05/15 Fib-sem array tomography
812015002822501/29/15 Method for manufacturing a tem-lamella and assembly having a tem-lamella protective structure
822015002958301/29/15 Apparatus and transmitted light illumination for light microscopes and microscope system
832015001452801/15/15 Method of operating a particle beam microscope and a particle beam microscope
842015001592901/15/15 Optical switch and beam stabilization device
852015001594201/15/15 Method for detecting and controlling supply of an immersion medium
862015001594301/15/15 Device for forming an immersion film
872015000830901/08/15 High-resolution scanning microscopy
882015000263201/01/15 Microscope and high-resolution 3-d fluorescence microscopy
892014035479612/04/14 Apparatus and transmitted light illumination for light microscopes and microscope system
902014035510912/04/14 Immersion fluid for microscopy
912014034746111/27/14 Microscope for widefield microscopy
922014033942411/20/14 Device for mass selective determination of an ion
932014033943911/20/14 Method for high-resolution 3d localization microscopy
942014034048311/20/14 Method for three-dimensional high resolution localization microscopy
952014034074211/20/14 Ring illumination device for a microscope objective, and microscope objective
962014032687411/06/14 Printed circuit board multipole units used for ion transportation
972014032796111/06/14 Slider for introduction into an optical path of a light microscope
982014031331110/23/14 Control device and controlling a motorized digital microscope
992014031331210/23/14 Digital microscope and optimizing the work process in a digital microscope
1002014031357710/23/14 Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope
1012014031358910/23/14 Telecentric modular zoom system
1022014031360310/23/14 Objective lens mount
1032014029148410/02/14 Microscope with structured illumination
1042014029303710/02/14 Optical microscope and examining a microscopic sample
1052014029341010/02/14 Laser scanning microscope
1062014023284408/21/14 Method and defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
1072014023302908/21/14 Spectrometer
1082014022620408/14/14 Optical assembly and light microscope
1092014021730308/07/14 Particle beam operating the same
1102014021130507/31/14 Laser scanning microscope
1112014020226507/24/14 Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
1122014019732807/17/14 Ion beam system and operating an ion beam system
1132014019094607/10/14 Laser microdissection method and laser microdissection device
1142014019112607/10/14 Method of depositing protective structures
1152014019240607/10/14 Laser scanning microscope having an illumination array
1162014018477707/03/14 High-resolution luminescence microscopy
1172014017667806/26/14 Method for high-resolution 3d-localization microscopy
1182014017704406/26/14 Method and configuration for the optical detection of an illuminated specimen
1192014016876306/19/14 Variable imaging system with an objective of fixed focal length
1202014015888406/12/14 Method for operating a particle beam device and/or for analyzing an object in a particle beam device
1212014015890206/12/14 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
1222014015308806/05/14 Slider for sliding into the observation beam path of a microscope
1232014014637605/29/14 Light microscope and microscopy method
1242014011852805/01/14 Setting unit and setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
1252014011875005/01/14 Method and configuration for depth resolved optical detection of an illuminated specimen
1262014011057704/24/14 Particle beam system and processing a tem-sample
1272014011163304/24/14 Wide field microscope and wide field microscopy
1282014009246004/03/14 Optical filter device, in particular for microscopes
1292014007009703/13/14 Particle beam device and operating a particle beam device
1302014007009903/13/14 Particle beam microscope for generating material data
1312014005585102/27/14 Laser scanning microscope
1322014000136101/02/14 Micro-gripper
1332014000137301/02/14 Method for setting a position of a carrier element in a particle beam device
1342013034267312/26/13 Method and device for focussing a microscope automatically
1352013032022612/05/13 Method and scanning a surface of an object using a particle beam
1362013032393712/05/13 Combined laser processing system and focused ion beam system
1372013030820111/21/13 Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
1382013030083311/14/13 3d localisation microscopy and 4d localisation microscopy and tracking methods and systems
1392013030290511/14/13 Increased depth-resolution microscopy
1402013029256611/07/13 Transmission electron microscopy system and operating a transmission electron microscopy system
1412013029388611/07/13 Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
1422013027176410/17/13 Measurement devices and apparatuses for spectroscopic examination of samples
1432013027184710/17/13 Immersion objective and light microscope
1442013026540710/10/13 Method and device for determining a critical angle of an excitation light beam
1452013025656310/03/13 High-resolution fluorescence microscopy
1462013025809010/03/13 Light microscope and recording images with a light microscope
1472013025006909/26/13 Device and the three-dimensional measurement of an object
1482013025040709/26/13 Device for increasing the depth discrimination of optical imaging systems
1492013024240709/19/13 Wide range zoom system
1502013023545309/12/13 Device for positioning optical components on a microscope
1512013022870409/05/13 Wavelength-resolving and high spatial resolution fluorescence microscopy
1522013022256708/29/13 Microscope and wavelength-selective and high spatial resolving microscopy
1532013021394508/22/13 Methods and the preparation of microscopy samples by using pulsed light
1542013020835508/15/13 X-y stage for microscopes
1552013018706407/25/13 Particle beam system including a supply of process gas to a processing location
1562013018096207/18/13 Methods and systems for raster scanning a surface of an object using a particle beam
1572013013432805/30/13 Processing system
1582013010046104/25/13 Methods and apparatuses for position and force detection
1592013010052604/25/13 Filter holder for correlative particle analysis
1602013010053704/25/13 Planapochromatically-corrected microscope objective
1612013010118804/25/13 Microscopy of several samples using optical microscopy and particle beam microscopy
1622013008771604/11/13 Charged particle source
1632013002776801/31/13 Attachment of optical microscope components
1642013002166401/24/13 Arrangement for adjusting illumination devices in transmitted-light microscopes
1652013000317101/03/13 Inverted microscope
1662013000318701/03/13 High-aperture immersion objective
1672012032603212/27/12 Particle beam microscope



ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009



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