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Carl Zeiss Microscopy Gmbh patents

Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors

Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
06/22/17 new patent  Fast high-resolution microscopy method and fast high-resolution microscope
06/22/17 new patent  Zoom objective lens
06/22/17 new patent  Method for correcting illumination-dependent aberrations in a modular digital microscope, digital microscope and data-processing program
06/15/17Determining the position of an object in the beam path of an optical device
06/15/173d localization microscopy and 4d localization microscopy and tracking methods and systems
06/15/17Light field imaging with scanning optical unit
06/08/17Light microscope with inner focussing objective and microscopy examining a plurality of microscopic objects
06/01/17Charged particle optical through-the lens detection of particles
05/18/17Device for simultaneous fluorescence contrasting effect in transmitted light and reflected light
05/11/17Movable mirror device
05/11/17Particle beam system
05/04/17Device for optical examination of a specimen, examining a specimen and transferring a device into an operation-ready state
04/27/17Method for segmenting a color image and digital microscope
04/27/17Method for operating a multi-beam particle microscope
04/20/17Confocal microscope with aperture correlation
04/13/17Image correction method and microscope
04/06/17Autofocus microscope and microscope comprising autofocus device
03/09/17Microscope and microscopy techniques
02/09/17Analyzing an object using a particle beam apparatus
02/09/17Arrangement for light sheet microscopy
01/26/17Method of determining crystallographic properties of a sample and electron beam microscope for performing the method
01/12/17Method for preparing cross-sections by ion beam milling
01/05/17Optics device with an optics module that comprises at least one optical element
12/29/16Multifocal scanning fluorescence microscope
12/29/16Apparatus and light modulation
12/22/16Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor
12/15/16Analyzing energy of charged particles
12/01/16Arrangement for light sheet microscopy
11/17/16Device and forming an immersion agent film
11/10/16Laser scanning microscope and amplifier assembly
11/03/16Multi-color scanning microscope
11/03/16Method for generating a contrast image of an object structure and apparatuses relating thereto
11/03/16Method for reflection correction of images and devices in this regard
11/03/16Arrangement for correcting aberrations in a microscope
10/27/16High-voltage supply unit and circuit arrangement for generating a high voltage for a particle beam apparatus
10/20/16Image-capturing device with a moving device for a digital microscope, and digital microscope
10/13/16Method for scanning microscopy and scanning microscope
10/06/16Optical transmission system and microscope with such a transmission system
10/06/16Arrangement for light sheet microscopy
09/29/16Method of generating a zoom sequence and microscope system configured to perform the method
09/22/16Method for generating image data relating to an object and particle beam device for carrying out this method
09/15/16Scanning microscope and determining the point spread function (psf)of a scanning microscope
09/08/16Methods and devices for charge compensation
08/25/16Charged particle beam system and operating the same
08/18/16Charged particle inspection method and charged particle system
08/11/16Digital microscope comprising pivoting stand, calibration and automatic focus and image center tracking for such a digital microscope
08/04/16Particle beam microscope and operating a particle beam microscope
08/04/16Particle beam microscope and operating a particle beam microscope
07/28/16Arrangement for changing the focus of a microscope objective
07/28/16High-resolution microscope and image splitter arrangement
07/21/16Optoelectronic detector, in particular for high-resolution light scanning microscopy
07/07/16High-resolution 3d fluorescence microscopy
06/30/16Beam combiner for combining two independently scanned illuminating beams of a light scanning microscope
06/23/16Analyzing an object using a particle beam apparatus
06/23/16Control system for a microscope and controlling a microscope
06/23/16Objective lens arrangement usable in particle-optical systems
06/23/16Method of adjusting a stigmator in a particle beam apparatus and a particle beam system
06/23/16Method for processing and/or for observing an object, and particle beam device for carrying out the method
06/16/16Arrangement for light sheet microscopy
06/02/16Assembly for light sheet microscopy
06/02/16Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
05/12/16Laser scanning microscope
05/12/16High-resolution scanning microscopy
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05/12/16Device for imaging sample
05/12/16Lens and optical observation device
04/28/16Luminescence microscopy
04/28/16Method for measuring a distance of a component from an object and for setting a position of a component in a particle beam device
04/21/16Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
04/21/16Mass spectrometer, use thereof, and the mass spectrometric examination of a gas mixture
03/31/16Method for structuring an object with the aid of a particle beam apparatus
03/24/16Microscope and 3d high-resolution localization microscopy with an enlarged measurement region
03/03/16Microscopical imaging system
02/25/16Method for imaging a sample by means of a microscope and microscope
02/18/16Method and device for determining a distance between two optical boundary surfaces which are spaced apart from each other along a first direction
02/11/16Transmitted-light microscope and transmitted-light microscopy
02/04/16Method for analyzing and/or processing an object as well as a particle beam device for carrying out the method
01/21/16Apparatus for focusing and for storage of ions and for separation of pressure areas
01/14/16Method for the operation of a laser scanning microscope
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01/07/16Recording device and recording method
12/31/15Light microscope and microscopy method
12/24/15Method for operating a light microscope and optical assembly
12/10/15Method for the microscope imaging of samples adhering to bottoms of fluid filled wells of a microtiter plate
12/10/15Particle beam operating a particle optical unit
12/03/15Charged particle optical apparatus having a selectively positionable differential pressure module
12/03/15Multi-beam particle microscope and operating same
11/12/15Microscope with a light sheet
10/29/15Autofocus microscope and microscope comprising autofocus device
10/22/15Optical arrangement and light microscope
10/15/15System for microscopic applications
10/08/15Microscope and spim microscopy
10/01/15Procedure for terminating microscopic applications with an immersion objective
09/24/15Method for fluorescence microscopy of a sample
09/17/15Procedure and device for terminating the immersion at a microscope
09/10/15Confocal incident-light scanning microsope for multipoint scanning
09/10/15Confocal microscope with freely adjustable sample scanning
09/10/15Optical arrangement and light microscope
09/10/15Method for the correction of spherical aberration in microscopic applications
09/03/15Apochromatic microscope objective
09/03/15Calibration plate for measuring calibration of a digital microscope and methods of using the same
09/03/15Optical assembly and light microscope
08/27/15Immersion medium and its layout in an optical system
08/20/15Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor
08/06/15Optical system for digital microscopy
08/06/15High aperture immersion objective
07/30/15Method for preparing and analyzing an object as well as particle beam device for performing the method
07/02/15High-resolution scanning microscopy
06/18/15Microscope and spim microscopy
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06/18/15Microscope and spim microscopy
06/11/15Microscope and high-resolution 3d fluorescence microscopy
06/04/15Method for preparing for and carrying out the acquisition of image stacks of a sample from various orientation angles
05/28/15Electron microscope
05/28/15Particle beam operating the same
05/28/15Light scanning microscope with spectral detection
04/30/15Processing system
04/30/15Microscope and microscopy method
04/02/15Charged particle multi-beam inspection system and operating the same
04/02/15Light microscope and microscopy examining a microscopic specimen
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03/26/15Method of detecting electrons, an electron-detector and an inspection system
03/26/15High-resolution scanning microscopy
03/19/15High-resolution scanning microscopy
03/19/15High-resolution scanning microscopy
03/19/15Device and microscopy
03/12/15Particle optical system
02/26/15Light microscope and image recording using a light microscope
02/19/15Method for processing and/or for observing an object, and particle beam device for carrying out the method
02/12/15Tube shield lens unit
02/05/15High-resolution luminescence microscopy
02/05/15Method for calibrating a digital optical imaging system having a zoom system, correcting aberrations in a digital optical imaging system having a zoom system, and digital optical imaging system
02/05/15Method for calibrating a digital optical instrument and digital optical instrument
02/05/15Fib-sem array tomography
01/29/15Method for manufacturing a tem-lamella and assembly having a tem-lamella protective structure
01/29/15Apparatus and transmitted light illumination for light microscopes and microscope system
01/15/15Method of operating a particle beam microscope and a particle beam microscope
01/15/15Optical switch and beam stabilization device
01/15/15Method for detecting and controlling supply of an immersion medium
01/15/15Device for forming an immersion film
01/08/15High-resolution scanning microscopy
01/01/15Microscope and high-resolution 3-d fluorescence microscopy
12/04/14Apparatus and transmitted light illumination for light microscopes and microscope system
12/04/14Immersion fluid for microscopy
11/27/14Microscope for widefield microscopy
11/20/14Device for mass selective determination of an ion
11/20/14Method for high-resolution 3d localization microscopy
11/20/14Method for three-dimensional high resolution localization microscopy
11/20/14Ring illumination device for a microscope objective, and microscope objective
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11/06/14Printed circuit board multipole units used for ion transportation
11/06/14Slider for introduction into an optical path of a light microscope
10/23/14Control device and controlling a motorized digital microscope
10/23/14Digital microscope and optimizing the work process in a digital microscope
10/23/14Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope
10/23/14Telecentric modular zoom system
10/23/14Objective lens mount
10/02/14Microscope with structured illumination
10/02/14Optical microscope and examining a microscopic sample
10/02/14Laser scanning microscope
08/21/14Method and defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
08/14/14Optical assembly and light microscope
08/07/14Particle beam operating the same
07/31/14Laser scanning microscope
07/24/14Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
07/17/14Ion beam system and operating an ion beam system
07/10/14Laser microdissection method and laser microdissection device
07/10/14Method of depositing protective structures
07/10/14Laser scanning microscope having an illumination array
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07/03/14High-resolution luminescence microscopy
06/26/14Method for high-resolution 3d-localization microscopy
06/26/14Method and configuration for the optical detection of an illuminated specimen
06/19/14Variable imaging system with an objective of fixed focal length
06/12/14Method for operating a particle beam device and/or for analyzing an object in a particle beam device
06/12/14Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
06/05/14Slider for sliding into the observation beam path of a microscope
05/29/14Light microscope and microscopy method
05/01/14Setting unit and setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
05/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
04/24/14Particle beam system and processing a tem-sample
04/24/14Wide field microscope and wide field microscopy
04/03/14Optical filter device, in particular for microscopes
03/13/14Particle beam device and operating a particle beam device
03/13/14Particle beam microscope for generating material data
02/27/14Laser scanning microscope
01/02/14Method for setting a position of a carrier element in a particle beam device
12/26/13Method and device for focussing a microscope automatically
12/05/13Method and scanning a surface of an object using a particle beam
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12/05/13Combined laser processing system and focused ion beam system
11/21/13Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
11/14/133d localisation microscopy and 4d localisation microscopy and tracking methods and systems
11/14/13Increased depth-resolution microscopy
11/07/13Transmission electron microscopy system and operating a transmission electron microscopy system
11/07/13Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
10/17/13Measurement devices and apparatuses for spectroscopic examination of samples
10/17/13Immersion objective and light microscope
10/10/13Method and device for determining a critical angle of an excitation light beam
10/03/13High-resolution fluorescence microscopy
10/03/13Light microscope and recording images with a light microscope
09/26/13Device and the three-dimensional measurement of an object
09/26/13Device for increasing the depth discrimination of optical imaging systems
09/19/13Wide range zoom system
09/12/13Device for positioning optical components on a microscope
09/05/13Wavelength-resolving and high spatial resolution fluorescence microscopy
08/29/13Microscope and wavelength-selective and high spatial resolving microscopy
08/22/13Methods and the preparation of microscopy samples by using pulsed light
08/15/13X-y stage for microscopes
07/25/13Particle beam system including a supply of process gas to a processing location
07/18/13Methods and systems for raster scanning a surface of an object using a particle beam
05/30/13Processing system
04/25/13Methods and apparatuses for position and force detection
04/25/13Filter holder for correlative particle analysis
04/25/13Planapochromatically-corrected microscope objective
04/25/13Microscopy of several samples using optical microscopy and particle beam microscopy
04/11/13Charged particle source
01/31/13Attachment of optical microscope components
01/24/13Arrangement for adjusting illumination devices in transmitted-light microscopes
01/03/13Inverted microscope
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01/03/13High-aperture immersion objective
12/27/12Particle beam microscope

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009


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