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Carl Zeiss Microscopy Gmbh patents


      
Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors



Optical microscope and method for examining a microscopic sample

Carl Zeiss Microscopy

Optical microscope and method for examining a microscopic sample

Laser scanning microscope

Carl Zeiss Microscopy

Laser scanning microscope

Search recent Press Releases: Carl Zeiss Microscopy Gmbh-related press releases
Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12014029148410/02/14Microscope with structured illumination
22014029303710/02/14Optical microscope and method for examining a microscopic sample
32014029341010/02/14Laser scanning microscope
42014023284408/21/14Method and apparatus for defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
52014023302908/21/14Spectrometer
62014022620408/14/14Optical assembly and light microscope
72014021730308/07/14Particle beam system and method for operating the same
82014021130507/31/14Laser scanning microscope
92014020226507/24/14Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
102014019732807/17/14Ion beam system and method of operating an ion beam system
112014019094607/10/14Laser microdissection method and laser microdissection device
122014019112607/10/14Method of depositing protective structures
132014019240607/10/14Laser scanning microscope having an illumination array
142014018477707/03/14High-resolution luminescence microscopy
152014017667806/26/14Method for high-resolution 3d-localization microscopy
162014017704406/26/14Method and configuration for the optical detection of an illuminated specimen
172014016876306/19/14Variable imaging system with an objective of fixed focal length
182014015888406/12/14Method for operating a particle beam device and/or for analyzing an object in a particle beam device
192014015890206/12/14Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
202014015308806/05/14Slider for sliding into the observation beam path of a microscope
212014014637605/29/14Light microscope and microscopy method
222014011852805/01/14Setting unit and method for setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
232014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
242014011852805/01/14Setting unit and method for setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
252014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
262014011057704/24/14Particle beam system and method of processing a tem-sample
272014011163304/24/14Wide field microscope and method for wide field microscopy
282014011057704/24/14Particle beam system and method of processing a tem-sample
292014011163304/24/14Wide field microscope and method for wide field microscopy
302014009246004/03/14Optical filter device, in particular for microscopes
312014009246004/03/14Optical filter device, in particular for microscopes
322014007009703/13/14Particle beam device and method for operating a particle beam device
332014007009903/13/14Particle beam microscope for generating material data
342014007009703/13/14Particle beam device and method for operating a particle beam device
352014007009903/13/14Particle beam microscope for generating material data
362014005585102/27/14Laser scanning microscope
372014000136101/02/14Micro-gripper
382014000137301/02/14Method for setting a position of a carrier element in a particle beam device
392013034267312/26/13Method and device for focussing a microscope automatically
402013032022612/05/13Method and apparatus for scanning a surface of an object using a particle beam
412013032393712/05/13Combined laser processing system and focused ion beam system
422013030820111/21/13Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
432013030083311/14/133d localisation microscopy and 4d localisation microscopy and tracking methods and systems
442013030290511/14/13Increased depth-resolution microscopy
452013029256611/07/13Transmission electron microscopy system and method of operating a transmission electron microscopy system
462013029388611/07/13Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
472013027176410/17/13Measurement devices and apparatuses for spectroscopic examination of samples
482013027184710/17/13Immersion objective and light microscope
492013026540710/10/13Method and device for determining a critical angle of an excitation light beam
502013025656310/03/13High-resolution fluorescence microscopy
512013025809010/03/13Light microscope and method for recording images with a light microscope
522013025006909/26/13Device and method for the three-dimensional measurement of an object
532013025040709/26/13Device for increasing the depth discrimination of optical imaging systems
542013024240709/19/13Wide range zoom system
552013023545309/12/13Device for positioning optical components on a microscope
562013022870409/05/13Wavelength-resolving and high spatial resolution fluorescence microscopy
572013022256708/29/13Microscope and method for wavelength-selective and high spatial resolving microscopy
582013022256708/29/13Microscope and method for wavelength-selective and high spatial resolving microscopy
592013021394508/22/13Methods and apparatus for the preparation of microscopy samples by using pulsed light
602013021394508/22/13Methods and apparatus for the preparation of microscopy samples by using pulsed light
612013020835508/15/13X-y stage for microscopes
622013020835508/15/13X-y stage for microscopes
632013018706407/25/13Particle beam system including a supply of process gas to a processing location
642013018706407/25/13Particle beam system including a supply of process gas to a processing location
652013018096207/18/13Methods and systems for raster scanning a surface of an object using a particle beam
662013018096207/18/13Methods and systems for raster scanning a surface of an object using a particle beam
672013013432805/30/13Processing system
682013013432805/30/13Processing system
692013010046104/25/13Methods and apparatuses for position and force detection
702013010052604/25/13Filter holder for correlative particle analysis
712013010053704/25/13Planapochromatically-corrected microscope objective
722013010118804/25/13Microscopy of several samples using optical microscopy and particle beam microscopy
732013008771604/11/13Charged particle source
742013002776801/31/13Attachment of optical microscope components
752013002166401/24/13Arrangement for adjusting illumination devices in transmitted-light microscopes
762013000317101/03/13Inverted microscope
772013000318701/03/13High-aperture immersion objective
782012032603212/27/12Particle beam microscope


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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