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Carl Zeiss Microscopy Gmbh patents

Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors

Microscope for widefield microscopy

Carl Zeiss Microscopy

Microscope for widefield microscopy

Search recent Press Releases: Carl Zeiss Microscopy Gmbh-related press releases
Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12014035479612/04/14Apparatus and method for transmitted light illumination for light microscopes and microscope system
22014035510912/04/14Immersion fluid for microscopy
32014034746111/27/14Microscope for widefield microscopy
42014033942411/20/14Device for mass selective determination of an ion
52014033943911/20/14Method for high-resolution 3d localization microscopy
62014034048311/20/14Method for three-dimensional high resolution localization microscopy
72014034074211/20/14Ring illumination device for a microscope objective, and microscope objective
82014032687411/06/14Printed circuit board multipole units used for ion transportation
92014032796111/06/14Slider for introduction into an optical path of a light microscope
102014031331110/23/14Control device and method for controlling a motorized digital microscope
112014031331210/23/14Digital microscope and method for optimizing the work process in a digital microscope
122014031357710/23/14Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope
132014031358910/23/14Telecentric modular zoom system
142014031360310/23/14Objective lens mount
152014029148410/02/14Microscope with structured illumination
162014029303710/02/14Optical microscope and method for examining a microscopic sample
172014029341010/02/14Laser scanning microscope
182014023284408/21/14Defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
202014022620408/14/14Optical assembly and light microscope
212014021730308/07/14Particle beam system and method for operating the same
222014021130507/31/14Laser scanning microscope
232014020226507/24/14Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
242014019732807/17/14Ion beam system and method of operating an ion beam system
252014019094607/10/14Laser microdissection method and laser microdissection device
262014019112607/10/14Method of depositing protective structures
272014019240607/10/14Laser scanning microscope having an illumination array
282014018477707/03/14High-resolution luminescence microscopy
292014017667806/26/14Method for high-resolution 3d-localization microscopy
302014017704406/26/14Method and configuration for the optical detection of an illuminated specimen
312014016876306/19/14Variable imaging system with an objective of fixed focal length
322014015888406/12/14Method for operating a particle beam device and/or for analyzing an object in a particle beam device
332014015890206/12/14Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
342014015308806/05/14Slider for sliding into the observation beam path of a microscope
352014014637605/29/14Light microscope and microscopy method
362014011852805/01/14Setting unit and method for setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
372014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
382014011057704/24/14Particle beam system and method of processing a tem-sample
392014011163304/24/14Wide field microscope and method for wide field microscopy
402014009246004/03/14Optical filter device, in particular for microscopes
412014007009703/13/14Particle beam device and method for operating a particle beam device
422014007009903/13/14Particle beam microscope for generating material data
432014005585102/27/14Laser scanning microscope
452014000137301/02/14Method for setting a position of a carrier element in a particle beam device
462013034267312/26/13Method and device for focussing a microscope automatically
472013032022612/05/13Scanning a surface of an object using a particle beam
482013032393712/05/13Combined laser processing system and focused ion beam system
492013030820111/21/13Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
502013030083311/14/133d localisation microscopy and 4d localisation microscopy and tracking methods and systems
512013030290511/14/13Increased depth-resolution microscopy
522013029256611/07/13Transmission electron microscopy system and method of operating a transmission electron microscopy system
532013029388611/07/13Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
542013027176410/17/13Measurement devices and apparatuses for spectroscopic examination of samples
552013027184710/17/13Immersion objective and light microscope
562013026540710/10/13Method and device for determining a critical angle of an excitation light beam
572013025656310/03/13High-resolution fluorescence microscopy
582013025809010/03/13Light microscope and method for recording images with a light microscope
592013025006909/26/13Device and method for the three-dimensional measurement of an object
602013025040709/26/13Device for increasing the depth discrimination of optical imaging systems
612013024240709/19/13Wide range zoom system
622013023545309/12/13Device for positioning optical components on a microscope
632013022870409/05/13Wavelength-resolving and high spatial resolution fluorescence microscopy
642013022256708/29/13Microscope and method for wavelength-selective and high spatial resolving microscopy
652013021394508/22/13Methods and apparatus for the preparation of microscopy samples by using pulsed light
662013020835508/15/13X-y stage for microscopes
672013018706407/25/13Particle beam system including a supply of process gas to a processing location
682013018096207/18/13Raster scanning a surface of an object using a particle beam
692013013432805/30/13Processing system
702013010046104/25/13Methods and apparatuses for position and force detection
712013010052604/25/13Filter holder for correlative particle analysis
722013010053704/25/13Planapochromatically-corrected microscope objective
732013010118804/25/13Microscopy of several samples using optical microscopy and particle beam microscopy
742013008771604/11/13Charged particle source
752013002776801/31/13Attachment of optical microscope components
762013002166401/24/13Arrangement for adjusting illumination devices in transmitted-light microscopes
772013000317101/03/13Inverted microscope
782013000318701/03/13High-aperture immersion objective
792012032603212/27/12Particle beam microscope

ARCHIVE: New 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by



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