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Carl Zeiss Microscopy Gmbh patents


      
Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors



Method for three-dimensional high resolution localization microscopy

Carl Zeiss Microscopy

Method for three-dimensional high resolution localization microscopy

Ring illumination device for a microscope objective, and microscope objective

Carl Zeiss Microscopy

Ring illumination device for a microscope objective, and microscope objective

Search recent Press Releases: Carl Zeiss Microscopy Gmbh-related press releases
Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12014033942411/20/14 new patent  Device for mass selective determination of an ion
22014033943911/20/14 new patent  Method for high-resolution 3d localization microscopy
32014034048311/20/14 new patent  Method for three-dimensional high resolution localization microscopy
42014034074211/20/14 new patent  Ring illumination device for a microscope objective, and microscope objective
52014032687411/06/14Printed circuit board multipole units used for ion transportation
62014032796111/06/14Slider for introduction into an optical path of a light microscope
72014031331110/23/14Control device and method for controlling a motorized digital microscope
82014031331210/23/14Digital microscope and method for optimizing the work process in a digital microscope
92014031357710/23/14Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope
102014031358910/23/14Telecentric modular zoom system
112014031360310/23/14Objective lens mount
122014029148410/02/14Microscope with structured illumination
132014029303710/02/14Optical microscope and method for examining a microscopic sample
142014029341010/02/14Laser scanning microscope
152014023284408/21/14Defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
162014023302908/21/14Spectrometer
172014022620408/14/14Optical assembly and light microscope
182014021730308/07/14Particle beam system and method for operating the same
192014021130507/31/14Laser scanning microscope
202014020226507/24/14Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
212014019732807/17/14Ion beam system and method of operating an ion beam system
222014019094607/10/14Laser microdissection method and laser microdissection device
232014019112607/10/14Method of depositing protective structures
242014019240607/10/14Laser scanning microscope having an illumination array
252014018477707/03/14High-resolution luminescence microscopy
262014017667806/26/14Method for high-resolution 3d-localization microscopy
272014017704406/26/14Method and configuration for the optical detection of an illuminated specimen
282014016876306/19/14Variable imaging system with an objective of fixed focal length
292014015888406/12/14Method for operating a particle beam device and/or for analyzing an object in a particle beam device
302014015890206/12/14Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
312014015308806/05/14Slider for sliding into the observation beam path of a microscope
322014014637605/29/14Light microscope and microscopy method
332014011852805/01/14Setting unit and method for setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
342014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
352014011057704/24/14Particle beam system and method of processing a tem-sample
362014011163304/24/14Wide field microscope and method for wide field microscopy
372014009246004/03/14Optical filter device, in particular for microscopes
382014007009703/13/14Particle beam device and method for operating a particle beam device
392014007009903/13/14Particle beam microscope for generating material data
402014005585102/27/14Laser scanning microscope
412014000136101/02/14Micro-gripper
422014000137301/02/14Method for setting a position of a carrier element in a particle beam device
432013034267312/26/13Method and device for focussing a microscope automatically
442013032022612/05/13Scanning a surface of an object using a particle beam
452013032393712/05/13Combined laser processing system and focused ion beam system
462013030820111/21/13Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
472013030083311/14/133d localisation microscopy and 4d localisation microscopy and tracking methods and systems
482013030290511/14/13Increased depth-resolution microscopy
492013029256611/07/13Transmission electron microscopy system and method of operating a transmission electron microscopy system
502013029388611/07/13Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
512013027176410/17/13Measurement devices and apparatuses for spectroscopic examination of samples
522013027184710/17/13Immersion objective and light microscope
532013026540710/10/13Method and device for determining a critical angle of an excitation light beam
542013025656310/03/13High-resolution fluorescence microscopy
552013025809010/03/13Light microscope and method for recording images with a light microscope
562013025006909/26/13Device and method for the three-dimensional measurement of an object
572013025040709/26/13Device for increasing the depth discrimination of optical imaging systems
582013024240709/19/13Wide range zoom system
592013023545309/12/13Device for positioning optical components on a microscope
602013022870409/05/13Wavelength-resolving and high spatial resolution fluorescence microscopy
612013022256708/29/13Microscope and method for wavelength-selective and high spatial resolving microscopy
622013021394508/22/13Methods and apparatus for the preparation of microscopy samples by using pulsed light
632013020835508/15/13X-y stage for microscopes
642013018706407/25/13Particle beam system including a supply of process gas to a processing location
652013018096207/18/13Raster scanning a surface of an object using a particle beam
662013013432805/30/13Processing system
672013010046104/25/13Methods and apparatuses for position and force detection
682013010052604/25/13Filter holder for correlative particle analysis
692013010053704/25/13Planapochromatically-corrected microscope objective
702013010118804/25/13Microscopy of several samples using optical microscopy and particle beam microscopy
712013008771604/11/13Charged particle source
722013002776801/31/13Attachment of optical microscope components
732013002166401/24/13Arrangement for adjusting illumination devices in transmitted-light microscopes
742013000317101/03/13Inverted microscope
752013000318701/03/13High-aperture immersion objective
762012032603212/27/12Particle beam microscope


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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