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Carl Zeiss Microscopy Gmbh patents

Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors

Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12015028604210/08/15  new patent  Microscope and spim microscopy
22015027709310/01/15 Procedure for terminating microscopic applications with an immersion objective
32015026845809/24/15 Method for fluorescence microscopy of a sample
42015026097509/17/15 Procedure and device for terminating the immersion at a microscope
52015025355609/10/15 Confocal incident-light scanning microsope for multipoint scanning
62015025355709/10/15 Confocal microscope with freely adjustable sample scanning
72015025355909/10/15 Optical arrangement and light microscope
82015025356209/10/15 Method for the correction of spherical aberration in microscopic applications
92015024800109/03/15 Apochromatic microscope objective
102015024800309/03/15 Calibration plate for measuring calibration of a digital microscope and methods of using the same
112015024801509/03/15 Optical assembly and light microscope
122015024168208/27/15 Immersion medium and its layout in an optical system
132015023582908/20/15 Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor
142015022667008/13/15 Microscope
152015021988608/06/15 Optical system for digital microscopy
162015021988708/06/15 High aperture immersion objective
172015021400407/30/15 Method for preparing and analyzing an object as well as particle beam device for performing the method
182015018545407/02/15 High-resolution scanning microscopy
192015016870606/18/15 Microscope and spim microscopy
202015016873206/18/15 Microscope and spim microscopy
212015016044606/11/15 Microscope and high-resolution 3d fluorescence microscopy
222015015356006/04/15 Method for preparing for and carrying out the acquisition of image stacks of a sample from various orientation angles
232015014478705/28/15 Electron microscope
242015014480105/28/15 Particle beam operating the same
252015014598105/28/15 Light scanning microscope with spectral detection
262015011429404/30/15 Processing system
272015011680704/30/15 Microscope and microscopy method
282015009087904/02/15 Charged particle multi-beam inspection system and operating the same
292015009090804/02/15 Light microscope and microscopy examining a microscopic specimen
302015008391103/26/15 Method of detecting electrons, an electron-detector and an inspection system
312015008509903/26/15 High-resolution scanning microscopy
322015007784203/19/15 High-resolution scanning microscopy
332015007784303/19/15 High-resolution scanning microscopy
342015007784503/19/15 Device and microscopy
352015006923503/12/15 Particle optical system
362015007075703/12/15 Microscope
372015005493702/26/15 Light microscope and image recording using a light microscope
382015004824802/19/15 Method for processing and/or for observing an object, and particle beam device for carrying out the method
392015004918002/19/15 Microscope
402015004306402/12/15 Tube shield lens unit
412015003596402/05/15 High-resolution luminescence microscopy
422015003596502/05/15 Method for calibrating a digital optical imaging system having a zoom system, correcting aberrations in a digital optical imaging system having a zoom system, and digital optical imaging system
432015003602702/05/15 Method for calibrating a digital optical instrument and digital optical instrument
442015003612202/05/15 Fib-sem array tomography
452015002822501/29/15 Method for manufacturing a tem-lamella and assembly having a tem-lamella protective structure
462015002958301/29/15 Apparatus and transmitted light illumination for light microscopes and microscope system
472015001452801/15/15 Method of operating a particle beam microscope and a particle beam microscope
482015001592901/15/15 Optical switch and beam stabilization device
492015001594201/15/15 Method for detecting and controlling supply of an immersion medium
502015001594301/15/15 Device for forming an immersion film
512015000830901/08/15 High-resolution scanning microscopy
522015000263201/01/15 Microscope and high-resolution 3-d fluorescence microscopy
532014035479612/04/14 Apparatus and transmitted light illumination for light microscopes and microscope system
542014035510912/04/14 Immersion fluid for microscopy
552014034746111/27/14 Microscope for widefield microscopy
562014033942411/20/14 Device for mass selective determination of an ion
572014033943911/20/14 Method for high-resolution 3d localization microscopy
582014034048311/20/14 Method for three-dimensional high resolution localization microscopy
592014034074211/20/14 Ring illumination device for a microscope objective, and microscope objective
602014032687411/06/14 Printed circuit board multipole units used for ion transportation
612014032796111/06/14 Slider for introduction into an optical path of a light microscope
622014031331110/23/14 Control device and controlling a motorized digital microscope
632014031331210/23/14 Digital microscope and optimizing the work process in a digital microscope
642014031357710/23/14 Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope
652014031358910/23/14 Telecentric modular zoom system
662014031360310/23/14 Objective lens mount
672014029148410/02/14 Microscope with structured illumination
682014029303710/02/14 Optical microscope and examining a microscopic sample
692014029341010/02/14 Laser scanning microscope
702014023284408/21/14 Method and defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
712014023302908/21/14 Spectrometer
722014022620408/14/14 Optical assembly and light microscope
732014021730308/07/14 Particle beam operating the same
742014021130507/31/14 Laser scanning microscope
752014020226507/24/14 Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
762014019732807/17/14 Ion beam system and operating an ion beam system
772014019094607/10/14 Laser microdissection method and laser microdissection device
782014019112607/10/14 Method of depositing protective structures
792014019240607/10/14 Laser scanning microscope having an illumination array
802014018477707/03/14 High-resolution luminescence microscopy
812014017667806/26/14 Method for high-resolution 3d-localization microscopy
822014017704406/26/14 Method and configuration for the optical detection of an illuminated specimen
832014016876306/19/14 Variable imaging system with an objective of fixed focal length
842014015888406/12/14 Method for operating a particle beam device and/or for analyzing an object in a particle beam device
852014015890206/12/14 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
862014015308806/05/14 Slider for sliding into the observation beam path of a microscope
872014014637605/29/14 Light microscope and microscopy method
882014011852805/01/14 Setting unit and setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
892014011875005/01/14 Method and configuration for depth resolved optical detection of an illuminated specimen
902014011057704/24/14 Particle beam system and processing a tem-sample
912014011163304/24/14 Wide field microscope and wide field microscopy
922014009246004/03/14 Optical filter device, in particular for microscopes
932014007009703/13/14 Particle beam device and operating a particle beam device
942014007009903/13/14 Particle beam microscope for generating material data
952014005585102/27/14 Laser scanning microscope
962014000136101/02/14 Micro-gripper
972014000137301/02/14 Method for setting a position of a carrier element in a particle beam device
982013034267312/26/13 Method and device for focussing a microscope automatically
992013032022612/05/13 Method and scanning a surface of an object using a particle beam
1002013032393712/05/13 Combined laser processing system and focused ion beam system
1012013030820111/21/13 Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
1022013030083311/14/13 3d localisation microscopy and 4d localisation microscopy and tracking methods and systems
1032013030290511/14/13 Increased depth-resolution microscopy
1042013029256611/07/13 Transmission electron microscopy system and operating a transmission electron microscopy system
1052013029388611/07/13 Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
1062013027176410/17/13 Measurement devices and apparatuses for spectroscopic examination of samples
1072013027184710/17/13 Immersion objective and light microscope
1082013026540710/10/13 Method and device for determining a critical angle of an excitation light beam
1092013025656310/03/13 High-resolution fluorescence microscopy
1102013025809010/03/13 Light microscope and recording images with a light microscope
1112013025006909/26/13 Device and the three-dimensional measurement of an object
1122013025040709/26/13 Device for increasing the depth discrimination of optical imaging systems
1132013024240709/19/13 Wide range zoom system
1142013023545309/12/13 Device for positioning optical components on a microscope
1152013022870409/05/13 Wavelength-resolving and high spatial resolution fluorescence microscopy
1162013022256708/29/13 Microscope and wavelength-selective and high spatial resolving microscopy
1172013021394508/22/13 Methods and the preparation of microscopy samples by using pulsed light
1182013020835508/15/13 X-y stage for microscopes
1192013018706407/25/13 Particle beam system including a supply of process gas to a processing location
1202013018096207/18/13 Methods and systems for raster scanning a surface of an object using a particle beam
1212013013432805/30/13 Processing system
1222013010046104/25/13 Methods and apparatuses for position and force detection
1232013010052604/25/13 Filter holder for correlative particle analysis
1242013010053704/25/13 Planapochromatically-corrected microscope objective
1252013010118804/25/13 Microscopy of several samples using optical microscopy and particle beam microscopy
1262013008771604/11/13 Charged particle source
1272013002776801/31/13 Attachment of optical microscope components
1282013002166401/24/13 Arrangement for adjusting illumination devices in transmitted-light microscopes
1292013000317101/03/13 Inverted microscope
1302013000318701/03/13 High-aperture immersion objective
1312012032603212/27/12 Particle beam microscope

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by