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Carl Zeiss Microscopy Gmbh patents

Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors

Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12015024800109/03/15  new patent  Apochromatic microscope objective
22015024800309/03/15  new patent  Calibration plate for measuring calibration of a digital microscope and methods of using the same
32015024801509/03/15  new patent  Optical assembly and light microscope
42015024168208/27/15 Immersion medium and its layout in an optical system
52015023582908/20/15 Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor
62015022667008/13/15 Microscope
72015021988608/06/15 Optical system for digital microscopy
82015021988708/06/15 High aperture immersion objective
92015021400407/30/15 Method for preparing and analyzing an object as well as particle beam device for performing the method
102015018545407/02/15 High-resolution scanning microscopy
112015016870606/18/15 Microscope and spim microscopy
122015016873206/18/15 Microscope and spim microscopy
132015016044606/11/15 Microscope and high-resolution 3d fluorescence microscopy
142015015356006/04/15 Method for preparing for and carrying out the acquisition of image stacks of a sample from various orientation angles
152015014478705/28/15 Electron microscope
162015014480105/28/15 Particle beam operating the same
172015014598105/28/15 Light scanning microscope with spectral detection
182015011429404/30/15 Processing system
192015011680704/30/15 Microscope and microscopy method
202015009087904/02/15 Charged particle multi-beam inspection system and operating the same
212015009090804/02/15 Light microscope and microscopy examining a microscopic specimen
222015008391103/26/15 Method of detecting electrons, an electron-detector and an inspection system
232015008509903/26/15 High-resolution scanning microscopy
242015007784203/19/15 High-resolution scanning microscopy
252015007784303/19/15 High-resolution scanning microscopy
262015007784503/19/15 Device and microscopy
272015006923503/12/15 Particle optical system
282015007075703/12/15 Microscope
292015005493702/26/15 Light microscope and image recording using a light microscope
302015004824802/19/15 Method for processing and/or for observing an object, and particle beam device for carrying out the method
312015004918002/19/15 Microscope
322015004306402/12/15 Tube shield lens unit
332015003596402/05/15 High-resolution luminescence microscopy
342015003596502/05/15 Method for calibrating a digital optical imaging system having a zoom system, correcting aberrations in a digital optical imaging system having a zoom system, and digital optical imaging system
352015003602702/05/15 Method for calibrating a digital optical instrument and digital optical instrument
362015003612202/05/15 Fib-sem array tomography
372015002822501/29/15 Method for manufacturing a tem-lamella and assembly having a tem-lamella protective structure
382015002958301/29/15 Apparatus and transmitted light illumination for light microscopes and microscope system
392015001452801/15/15 Method of operating a particle beam microscope and a particle beam microscope
402015001592901/15/15 Optical switch and beam stabilization device
412015001594201/15/15 Method for detecting and controlling supply of an immersion medium
422015001594301/15/15 Device for forming an immersion film
432015000830901/08/15 High-resolution scanning microscopy
442015000263201/01/15 Microscope and high-resolution 3-d fluorescence microscopy
452014035479612/04/14 Apparatus and transmitted light illumination for light microscopes and microscope system
462014035510912/04/14 Immersion fluid for microscopy
472014034746111/27/14 Microscope for widefield microscopy
482014033942411/20/14 Device for mass selective determination of an ion
492014033943911/20/14 Method for high-resolution 3d localization microscopy
502014034048311/20/14 Method for three-dimensional high resolution localization microscopy
512014034074211/20/14 Ring illumination device for a microscope objective, and microscope objective
522014032687411/06/14 Printed circuit board multipole units used for ion transportation
532014032796111/06/14 Slider for introduction into an optical path of a light microscope
542014031331110/23/14 Control device and controlling a motorized digital microscope
552014031331210/23/14 Digital microscope and optimizing the work process in a digital microscope
562014031357710/23/14 Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope
572014031358910/23/14 Telecentric modular zoom system
582014031360310/23/14 Objective lens mount
592014029148410/02/14 Microscope with structured illumination
602014029303710/02/14 Optical microscope and examining a microscopic sample
612014029341010/02/14 Laser scanning microscope
622014023284408/21/14 Method and defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
632014023302908/21/14 Spectrometer
642014022620408/14/14 Optical assembly and light microscope
652014021730308/07/14 Particle beam operating the same
662014021130507/31/14 Laser scanning microscope
672014020226507/24/14 Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
682014019732807/17/14 Ion beam system and operating an ion beam system
692014019094607/10/14 Laser microdissection method and laser microdissection device
702014019112607/10/14 Method of depositing protective structures
712014019240607/10/14 Laser scanning microscope having an illumination array
722014018477707/03/14 High-resolution luminescence microscopy
732014017667806/26/14 Method for high-resolution 3d-localization microscopy
742014017704406/26/14 Method and configuration for the optical detection of an illuminated specimen
752014016876306/19/14 Variable imaging system with an objective of fixed focal length
762014015888406/12/14 Method for operating a particle beam device and/or for analyzing an object in a particle beam device
772014015890206/12/14 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
782014015308806/05/14 Slider for sliding into the observation beam path of a microscope
792014014637605/29/14 Light microscope and microscopy method
802014011852805/01/14 Setting unit and setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
812014011875005/01/14 Method and configuration for depth resolved optical detection of an illuminated specimen
822014011057704/24/14 Particle beam system and processing a tem-sample
832014011163304/24/14 Wide field microscope and wide field microscopy
842014009246004/03/14 Optical filter device, in particular for microscopes
852014007009703/13/14 Particle beam device and operating a particle beam device
862014007009903/13/14 Particle beam microscope for generating material data
872014005585102/27/14 Laser scanning microscope
882014000136101/02/14 Micro-gripper
892014000137301/02/14 Method for setting a position of a carrier element in a particle beam device
902013034267312/26/13 Method and device for focussing a microscope automatically
912013032022612/05/13 Method and scanning a surface of an object using a particle beam
922013032393712/05/13 Combined laser processing system and focused ion beam system
932013030820111/21/13 Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
942013030083311/14/13 3d localisation microscopy and 4d localisation microscopy and tracking methods and systems
952013030290511/14/13 Increased depth-resolution microscopy
962013029256611/07/13 Transmission electron microscopy system and operating a transmission electron microscopy system
972013029388611/07/13 Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
982013027176410/17/13 Measurement devices and apparatuses for spectroscopic examination of samples
992013027184710/17/13 Immersion objective and light microscope
1002013026540710/10/13 Method and device for determining a critical angle of an excitation light beam
1012013025656310/03/13 High-resolution fluorescence microscopy
1022013025809010/03/13 Light microscope and recording images with a light microscope
1032013025006909/26/13 Device and the three-dimensional measurement of an object
1042013025040709/26/13 Device for increasing the depth discrimination of optical imaging systems
1052013024240709/19/13 Wide range zoom system
1062013023545309/12/13 Device for positioning optical components on a microscope
1072013022870409/05/13 Wavelength-resolving and high spatial resolution fluorescence microscopy
1082013022256708/29/13 Microscope and wavelength-selective and high spatial resolving microscopy
1092013021394508/22/13 Methods and the preparation of microscopy samples by using pulsed light
1102013020835508/15/13 X-y stage for microscopes
1112013018706407/25/13 Particle beam system including a supply of process gas to a processing location
1122013018096207/18/13 Methods and systems for raster scanning a surface of an object using a particle beam
1132013013432805/30/13 Processing system
1142013010046104/25/13 Methods and apparatuses for position and force detection
1152013010052604/25/13 Filter holder for correlative particle analysis
1162013010053704/25/13 Planapochromatically-corrected microscope objective
1172013010118804/25/13 Microscopy of several samples using optical microscopy and particle beam microscopy
1182013008771604/11/13 Charged particle source
1192013002776801/31/13 Attachment of optical microscope components
1202013002166401/24/13 Arrangement for adjusting illumination devices in transmitted-light microscopes
1212013000317101/03/13 Inverted microscope
1222013000318701/03/13 High-aperture immersion objective
1232012032603212/27/12 Particle beam microscope

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by