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Carl Zeiss Microscopy Gmbh patents

Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors

Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12016017854306/23/16  new patent  Analyzing an object using a particle beam apparatus
22016017888206/23/16  new patent  Control system for a microscope and controlling a microscope
32016018105406/23/16  new patent  Objective lens arrangement usable in particle-optical systems
42016018105506/23/16  new patent  Method of adjusting a stigmator in a particle beam apparatus and a particle beam system
52016018105806/23/16  new patent  Method for processing and/or for observing an object, and particle beam device for carrying out the method
62016017019506/16/16 Arrangement for light sheet microscopy
72016015423606/02/16 Assembly for light sheet microscopy
82016015560306/02/16 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
92016013188105/12/16 Laser scanning microscope
102016013188305/12/16 High-resolution scanning microscopy
112016013188405/12/16 Device for imaging sample
122016013190005/12/16 Lens and optical observation device
132016011672804/28/16 Luminescence microscopy
142016011821604/28/16 Method for measuring a distance of a component from an object and for setting a position of a component in a particle beam device
152016011125104/21/16 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
162016011126904/21/16 Mass spectrometer, use thereof, and the mass spectrometric examination of a gas mixture
172016009064503/31/16 Method for structuring an object with the aid of a particle beam apparatus
182016008506203/24/16 Microscope and 3d high-resolution localization microscopy with an enlarged measurement region
192016006211103/03/16 Microscopical imaging system
202016005455102/25/16 Method for imaging a sample by means of a microscope and microscope
212016004896702/18/16 Method and device for determining a distance between two optical boundary surfaces which are spaced apart from each other along a first direction
222016004137702/11/16 Transmitted-light microscope and transmitted-light microscopy
232016003553402/04/16 Method for analyzing and/or processing an object as well as a particle beam device for carrying out the method
242016002006401/21/16 Apparatus for focusing and for storage of ions and for separation of pressure areas
252016001111301/14/16 Method for the operation of a laser scanning microscope
262016000377701/07/16 Recording device and recording method
272015037814112/31/15 Light microscope and microscopy method
282015037005712/24/15 Method for operating a light microscope and optical assembly
292015035544612/10/15 Method for the microscope imaging of samples adhering to bottoms of fluid filled wells of a microtiter plate
302015035715712/10/15 Particle beam operating a particle optical unit
312015034874212/03/15 Charged particle optical apparatus having a selectively positionable differential pressure module
322015034874912/03/15 Multi-beam particle microscope and operating same
332015032377411/12/15 Microscope with a light sheet
342015030929710/29/15 Autofocus microscope and microscope comprising autofocus device
352015030132510/22/15 Optical arrangement and light microscope
362015029333810/15/15 System for microscopic applications
372015028604210/08/15 Microscope and spim microscopy
382015027709310/01/15 Procedure for terminating microscopic applications with an immersion objective
392015026845809/24/15 Method for fluorescence microscopy of a sample
402015026097509/17/15 Procedure and device for terminating the immersion at a microscope
412015025355609/10/15 Confocal incident-light scanning microsope for multipoint scanning
422015025355709/10/15 Confocal microscope with freely adjustable sample scanning
432015025355909/10/15 Optical arrangement and light microscope
442015025356209/10/15 Method for the correction of spherical aberration in microscopic applications
452015024800109/03/15 Apochromatic microscope objective
462015024800309/03/15 Calibration plate for measuring calibration of a digital microscope and methods of using the same
472015024801509/03/15 Optical assembly and light microscope
482015024168208/27/15 Immersion medium and its layout in an optical system
492015023582908/20/15 Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor
502015022667008/13/15 Microscope
512015021988608/06/15 Optical system for digital microscopy
522015021988708/06/15 High aperture immersion objective
532015021400407/30/15 Method for preparing and analyzing an object as well as particle beam device for performing the method
542015018545407/02/15 High-resolution scanning microscopy
552015016870606/18/15 Microscope and spim microscopy
562015016873206/18/15 Microscope and spim microscopy
572015016044606/11/15 Microscope and high-resolution 3d fluorescence microscopy
582015015356006/04/15 Method for preparing for and carrying out the acquisition of image stacks of a sample from various orientation angles
592015014478705/28/15 Electron microscope
602015014480105/28/15 Particle beam operating the same
612015014598105/28/15 Light scanning microscope with spectral detection
622015011429404/30/15 Processing system
632015011680704/30/15 Microscope and microscopy method
642015009087904/02/15 Charged particle multi-beam inspection system and operating the same
652015009090804/02/15 Light microscope and microscopy examining a microscopic specimen
662015008391103/26/15 Method of detecting electrons, an electron-detector and an inspection system
672015008509903/26/15 High-resolution scanning microscopy
682015007784203/19/15 High-resolution scanning microscopy
692015007784303/19/15 High-resolution scanning microscopy
702015007784503/19/15 Device and microscopy
712015006923503/12/15 Particle optical system
722015007075703/12/15 Microscope
732015005493702/26/15 Light microscope and image recording using a light microscope
742015004824802/19/15 Method for processing and/or for observing an object, and particle beam device for carrying out the method
752015004918002/19/15 Microscope
762015004306402/12/15 Tube shield lens unit
772015003596402/05/15 High-resolution luminescence microscopy
782015003596502/05/15 Method for calibrating a digital optical imaging system having a zoom system, correcting aberrations in a digital optical imaging system having a zoom system, and digital optical imaging system
792015003602702/05/15 Method for calibrating a digital optical instrument and digital optical instrument
802015003612202/05/15 Fib-sem array tomography
812015002822501/29/15 Method for manufacturing a tem-lamella and assembly having a tem-lamella protective structure
822015002958301/29/15 Apparatus and transmitted light illumination for light microscopes and microscope system
832015001452801/15/15 Method of operating a particle beam microscope and a particle beam microscope
842015001592901/15/15 Optical switch and beam stabilization device
852015001594201/15/15 Method for detecting and controlling supply of an immersion medium
862015001594301/15/15 Device for forming an immersion film
872015000830901/08/15 High-resolution scanning microscopy
882015000263201/01/15 Microscope and high-resolution 3-d fluorescence microscopy
892014035479612/04/14 Apparatus and transmitted light illumination for light microscopes and microscope system
902014035510912/04/14 Immersion fluid for microscopy
912014034746111/27/14 Microscope for widefield microscopy
922014033942411/20/14 Device for mass selective determination of an ion
932014033943911/20/14 Method for high-resolution 3d localization microscopy
942014034048311/20/14 Method for three-dimensional high resolution localization microscopy
952014034074211/20/14 Ring illumination device for a microscope objective, and microscope objective
962014032687411/06/14 Printed circuit board multipole units used for ion transportation
972014032796111/06/14 Slider for introduction into an optical path of a light microscope
982014031331110/23/14 Control device and controlling a motorized digital microscope
992014031331210/23/14 Digital microscope and optimizing the work process in a digital microscope
1002014031357710/23/14 Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope
1012014031358910/23/14 Telecentric modular zoom system
1022014031360310/23/14 Objective lens mount
1032014029148410/02/14 Microscope with structured illumination
1042014029303710/02/14 Optical microscope and examining a microscopic sample
1052014029341010/02/14 Laser scanning microscope
1062014023284408/21/14 Method and defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
1072014023302908/21/14 Spectrometer
1082014022620408/14/14 Optical assembly and light microscope
1092014021730308/07/14 Particle beam operating the same
1102014021130507/31/14 Laser scanning microscope
1112014020226507/24/14 Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
1122014019732807/17/14 Ion beam system and operating an ion beam system
1132014019094607/10/14 Laser microdissection method and laser microdissection device
1142014019112607/10/14 Method of depositing protective structures
1152014019240607/10/14 Laser scanning microscope having an illumination array
1162014018477707/03/14 High-resolution luminescence microscopy
1172014017667806/26/14 Method for high-resolution 3d-localization microscopy
1182014017704406/26/14 Method and configuration for the optical detection of an illuminated specimen
1192014016876306/19/14 Variable imaging system with an objective of fixed focal length
1202014015888406/12/14 Method for operating a particle beam device and/or for analyzing an object in a particle beam device
1212014015890206/12/14 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
1222014015308806/05/14 Slider for sliding into the observation beam path of a microscope
1232014014637605/29/14 Light microscope and microscopy method
1242014011852805/01/14 Setting unit and setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
1252014011875005/01/14 Method and configuration for depth resolved optical detection of an illuminated specimen
1262014011057704/24/14 Particle beam system and processing a tem-sample
1272014011163304/24/14 Wide field microscope and wide field microscopy
1282014009246004/03/14 Optical filter device, in particular for microscopes
1292014007009703/13/14 Particle beam device and operating a particle beam device
1302014007009903/13/14 Particle beam microscope for generating material data
1312014005585102/27/14 Laser scanning microscope
1322014000136101/02/14 Micro-gripper
1332014000137301/02/14 Method for setting a position of a carrier element in a particle beam device
1342013034267312/26/13 Method and device for focussing a microscope automatically
1352013032022612/05/13 Method and scanning a surface of an object using a particle beam
1362013032393712/05/13 Combined laser processing system and focused ion beam system
1372013030820111/21/13 Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
1382013030083311/14/13 3d localisation microscopy and 4d localisation microscopy and tracking methods and systems
1392013030290511/14/13 Increased depth-resolution microscopy
1402013029256611/07/13 Transmission electron microscopy system and operating a transmission electron microscopy system
1412013029388611/07/13 Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
1422013027176410/17/13 Measurement devices and apparatuses for spectroscopic examination of samples
1432013027184710/17/13 Immersion objective and light microscope
1442013026540710/10/13 Method and device for determining a critical angle of an excitation light beam
1452013025656310/03/13 High-resolution fluorescence microscopy
1462013025809010/03/13 Light microscope and recording images with a light microscope
1472013025006909/26/13 Device and the three-dimensional measurement of an object
1482013025040709/26/13 Device for increasing the depth discrimination of optical imaging systems
1492013024240709/19/13 Wide range zoom system
1502013023545309/12/13 Device for positioning optical components on a microscope
1512013022870409/05/13 Wavelength-resolving and high spatial resolution fluorescence microscopy
1522013022256708/29/13 Microscope and wavelength-selective and high spatial resolving microscopy
1532013021394508/22/13 Methods and the preparation of microscopy samples by using pulsed light
1542013020835508/15/13 X-y stage for microscopes
1552013018706407/25/13 Particle beam system including a supply of process gas to a processing location
1562013018096207/18/13 Methods and systems for raster scanning a surface of an object using a particle beam
1572013013432805/30/13 Processing system
1582013010046104/25/13 Methods and apparatuses for position and force detection
1592013010052604/25/13 Filter holder for correlative particle analysis
1602013010053704/25/13 Planapochromatically-corrected microscope objective
1612013010118804/25/13 Microscopy of several samples using optical microscopy and particle beam microscopy
1622013008771604/11/13 Charged particle source
1632013002776801/31/13 Attachment of optical microscope components
1642013002166401/24/13 Arrangement for adjusting illumination devices in transmitted-light microscopes
1652013000317101/03/13 Inverted microscope
1662013000318701/03/13 High-aperture immersion objective
1672012032603212/27/12 Particle beam microscope

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by