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Carl Zeiss Microscopy Gmbh patents


      
Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors



Carl Zeiss Microscopy

Laser microdissection method and laser microdissection device

Carl Zeiss Microscopy

Method of depositing protective structures

Carl Zeiss Microscopy

Laser scanning microscope having an illumination array

Search recent Press Releases: Carl Zeiss Microscopy Gmbh-related press releases
Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12014019732807/17/14Ion beam system and method of operating an ion beam system
22014019094607/10/14Laser microdissection method and laser microdissection device
32014019112607/10/14Method of depositing protective structures
42014019240607/10/14Laser scanning microscope having an illumination array
52014018477707/03/14High-resolution luminescence microscopy
62014017667806/26/14Method for high-resolution 3d-localization microscopy
72014017704406/26/14Method and configuration for the optical detection of an illuminated specimen
82014016876306/19/14Variable imaging system with an objective of fixed focal length
92014015888406/12/14Method for operating a particle beam device and/or for analyzing an object in a particle beam device
102014015890206/12/14Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
112014015308806/05/14Slider for sliding into the observation beam path of a microscope
122014014637605/29/14Light microscope and microscopy method
132014011852805/01/14Setting unit and method for setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
142014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
152014011852805/01/14Setting unit and method for setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
162014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
172014011057704/24/14Particle beam system and method of processing a tem-sample
182014011163304/24/14Wide field microscope and method for wide field microscopy
192014011057704/24/14Particle beam system and method of processing a tem-sample
202014011163304/24/14Wide field microscope and method for wide field microscopy
212014009246004/03/14Optical filter device, in particular for microscopes
222014009246004/03/14Optical filter device, in particular for microscopes
232014007009703/13/14Particle beam device and method for operating a particle beam device
242014007009903/13/14Particle beam microscope for generating material data
252014007009703/13/14Particle beam device and method for operating a particle beam device
262014007009903/13/14Particle beam microscope for generating material data
272014005585102/27/14Laser scanning microscope
282014000136101/02/14Micro-gripper
292014000137301/02/14Method for setting a position of a carrier element in a particle beam device
302013034267312/26/13Method and device for focussing a microscope automatically
312013032022612/05/13Method and apparatus for scanning a surface of an object using a particle beam
322013032393712/05/13Combined laser processing system and focused ion beam system
332013030820111/21/13Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
342013030083311/14/133d localisation microscopy and 4d localisation microscopy and tracking methods and systems
352013030290511/14/13Increased depth-resolution microscopy
362013029256611/07/13Transmission electron microscopy system and method of operating a transmission electron microscopy system
372013029388611/07/13Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
382013027176410/17/13Measurement devices and apparatuses for spectroscopic examination of samples
392013027184710/17/13Immersion objective and light microscope
402013026540710/10/13Method and device for determining a critical angle of an excitation light beam
412013025656310/03/13High-resolution fluorescence microscopy
422013025809010/03/13Light microscope and method for recording images with a light microscope
432013025006909/26/13Device and method for the three-dimensional measurement of an object
442013025040709/26/13Device for increasing the depth discrimination of optical imaging systems
452013024240709/19/13Wide range zoom system
462013023545309/12/13Device for positioning optical components on a microscope
472013022870409/05/13Wavelength-resolving and high spatial resolution fluorescence microscopy
482013022256708/29/13Microscope and method for wavelength-selective and high spatial resolving microscopy
492013022256708/29/13Microscope and method for wavelength-selective and high spatial resolving microscopy
502013021394508/22/13Methods and apparatus for the preparation of microscopy samples by using pulsed light
512013021394508/22/13Methods and apparatus for the preparation of microscopy samples by using pulsed light
522013020835508/15/13X-y stage for microscopes
532013020835508/15/13X-y stage for microscopes
542013018706407/25/13Particle beam system including a supply of process gas to a processing location
552013018706407/25/13Particle beam system including a supply of process gas to a processing location
562013018096207/18/13Methods and systems for raster scanning a surface of an object using a particle beam
572013018096207/18/13Methods and systems for raster scanning a surface of an object using a particle beam
582013013432805/30/13Processing system
592013013432805/30/13Processing system
602013010046104/25/13Methods and apparatuses for position and force detection
612013010052604/25/13Filter holder for correlative particle analysis
622013010053704/25/13Planapochromatically-corrected microscope objective
632013010118804/25/13Microscopy of several samples using optical microscopy and particle beam microscopy
642013008771604/11/13Charged particle source
652013002776801/31/13Attachment of optical microscope components
662013002166401/24/13Arrangement for adjusting illumination devices in transmitted-light microscopes
672013000317101/03/13Inverted microscope
682013000318701/03/13High-aperture immersion objective
692012032603212/27/12Particle beam microscope


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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