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Carl Zeiss Microscopy Gmbh patents


      
Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors



Carl Zeiss Microscopy

Ion beam system and method of operating an ion beam system

Carl Zeiss Microscopy

Laser microdissection method and laser microdissection device

Carl Zeiss Microscopy

Method of depositing protective structures

Search recent Press Releases: Carl Zeiss Microscopy Gmbh-related press releases
Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12014020226507/24/14 new patent  Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
22014019732807/17/14Ion beam system and method of operating an ion beam system
32014019094607/10/14Laser microdissection method and laser microdissection device
42014019112607/10/14Method of depositing protective structures
52014019240607/10/14Laser scanning microscope having an illumination array
62014018477707/03/14High-resolution luminescence microscopy
72014017667806/26/14Method for high-resolution 3d-localization microscopy
82014017704406/26/14Method and configuration for the optical detection of an illuminated specimen
92014016876306/19/14Variable imaging system with an objective of fixed focal length
102014015888406/12/14Method for operating a particle beam device and/or for analyzing an object in a particle beam device
112014015890206/12/14Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
122014015308806/05/14Slider for sliding into the observation beam path of a microscope
132014014637605/29/14Light microscope and microscopy method
142014011852805/01/14Setting unit and method for setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
152014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
162014011852805/01/14Setting unit and method for setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
172014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
182014011057704/24/14Particle beam system and method of processing a tem-sample
192014011163304/24/14Wide field microscope and method for wide field microscopy
202014011057704/24/14Particle beam system and method of processing a tem-sample
212014011163304/24/14Wide field microscope and method for wide field microscopy
222014009246004/03/14Optical filter device, in particular for microscopes
232014009246004/03/14Optical filter device, in particular for microscopes
242014007009703/13/14Particle beam device and method for operating a particle beam device
252014007009903/13/14Particle beam microscope for generating material data
262014007009703/13/14Particle beam device and method for operating a particle beam device
272014007009903/13/14Particle beam microscope for generating material data
282014005585102/27/14Laser scanning microscope
292014000136101/02/14Micro-gripper
302014000137301/02/14Method for setting a position of a carrier element in a particle beam device
312013034267312/26/13Method and device for focussing a microscope automatically
322013032022612/05/13Method and apparatus for scanning a surface of an object using a particle beam
332013032393712/05/13Combined laser processing system and focused ion beam system
342013030820111/21/13Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
352013030083311/14/133d localisation microscopy and 4d localisation microscopy and tracking methods and systems
362013030290511/14/13Increased depth-resolution microscopy
372013029256611/07/13Transmission electron microscopy system and method of operating a transmission electron microscopy system
382013029388611/07/13Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
392013027176410/17/13Measurement devices and apparatuses for spectroscopic examination of samples
402013027184710/17/13Immersion objective and light microscope
412013026540710/10/13Method and device for determining a critical angle of an excitation light beam
422013025656310/03/13High-resolution fluorescence microscopy
432013025809010/03/13Light microscope and method for recording images with a light microscope
442013025006909/26/13Device and method for the three-dimensional measurement of an object
452013025040709/26/13Device for increasing the depth discrimination of optical imaging systems
462013024240709/19/13Wide range zoom system
472013023545309/12/13Device for positioning optical components on a microscope
482013022870409/05/13Wavelength-resolving and high spatial resolution fluorescence microscopy
492013022256708/29/13Microscope and method for wavelength-selective and high spatial resolving microscopy
502013022256708/29/13Microscope and method for wavelength-selective and high spatial resolving microscopy
512013021394508/22/13Methods and apparatus for the preparation of microscopy samples by using pulsed light
522013021394508/22/13Methods and apparatus for the preparation of microscopy samples by using pulsed light
532013020835508/15/13X-y stage for microscopes
542013020835508/15/13X-y stage for microscopes
552013018706407/25/13Particle beam system including a supply of process gas to a processing location
562013018706407/25/13Particle beam system including a supply of process gas to a processing location
572013018096207/18/13Methods and systems for raster scanning a surface of an object using a particle beam
582013018096207/18/13Methods and systems for raster scanning a surface of an object using a particle beam
592013013432805/30/13Processing system
602013013432805/30/13Processing system
612013010046104/25/13Methods and apparatuses for position and force detection
622013010052604/25/13Filter holder for correlative particle analysis
632013010053704/25/13Planapochromatically-corrected microscope objective
642013010118804/25/13Microscopy of several samples using optical microscopy and particle beam microscopy
652013008771604/11/13Charged particle source
662013002776801/31/13Attachment of optical microscope components
672013002166401/24/13Arrangement for adjusting illumination devices in transmitted-light microscopes
682013000317101/03/13Inverted microscope
692013000318701/03/13High-aperture immersion objective
702012032603212/27/12Particle beam microscope


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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