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Carl Zeiss Microscopy Gmbh patents

Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors

Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12016013188105/12/16 Laser scanning microscope
22016013188305/12/16 High-resolution scanning microscopy
32016013188405/12/16 Device for imaging sample
42016013190005/12/16 Lens and optical observation device
52016011672804/28/16 Luminescence microscopy
62016011821604/28/16 Method for measuring a distance of a component from an object and for setting a position of a component in a particle beam device
72016011125104/21/16 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
82016011126904/21/16 Mass spectrometer, use thereof, and the mass spectrometric examination of a gas mixture
92016009064503/31/16 Method for structuring an object with the aid of a particle beam apparatus
102016008506203/24/16 Microscope and 3d high-resolution localization microscopy with an enlarged measurement region
112016006211103/03/16 Microscopical imaging system
122016005455102/25/16 Method for imaging a sample by means of a microscope and microscope
132016004896702/18/16 Method and device for determining a distance between two optical boundary surfaces which are spaced apart from each other along a first direction
142016004137702/11/16 Transmitted-light microscope and transmitted-light microscopy
152016003553402/04/16 Method for analyzing and/or processing an object as well as a particle beam device for carrying out the method
162016002006401/21/16 Apparatus for focusing and for storage of ions and for separation of pressure areas
172016001111301/14/16 Method for the operation of a laser scanning microscope
182016000377701/07/16 Recording device and recording method
192015037814112/31/15 Light microscope and microscopy method
202015037005712/24/15 Method for operating a light microscope and optical assembly
212015035544612/10/15 Method for the microscope imaging of samples adhering to bottoms of fluid filled wells of a microtiter plate
222015035715712/10/15 Particle beam operating a particle optical unit
232015034874212/03/15 Charged particle optical apparatus having a selectively positionable differential pressure module
242015034874912/03/15 Multi-beam particle microscope and operating same
252015032377411/12/15 Microscope with a light sheet
262015030929710/29/15 Autofocus microscope and microscope comprising autofocus device
272015030132510/22/15 Optical arrangement and light microscope
282015029333810/15/15 System for microscopic applications
292015028604210/08/15 Microscope and spim microscopy
302015027709310/01/15 Procedure for terminating microscopic applications with an immersion objective
312015026845809/24/15 Method for fluorescence microscopy of a sample
322015026097509/17/15 Procedure and device for terminating the immersion at a microscope
332015025355609/10/15 Confocal incident-light scanning microsope for multipoint scanning
342015025355709/10/15 Confocal microscope with freely adjustable sample scanning
352015025355909/10/15 Optical arrangement and light microscope
362015025356209/10/15 Method for the correction of spherical aberration in microscopic applications
372015024800109/03/15 Apochromatic microscope objective
382015024800309/03/15 Calibration plate for measuring calibration of a digital microscope and methods of using the same
392015024801509/03/15 Optical assembly and light microscope
402015024168208/27/15 Immersion medium and its layout in an optical system
412015023582908/20/15 Method for mass spectrometric examination of gas mixtures and mass spectrometer therefor
422015022667008/13/15 Microscope
432015021988608/06/15 Optical system for digital microscopy
442015021988708/06/15 High aperture immersion objective
452015021400407/30/15 Method for preparing and analyzing an object as well as particle beam device for performing the method
462015018545407/02/15 High-resolution scanning microscopy
472015016870606/18/15 Microscope and spim microscopy
482015016873206/18/15 Microscope and spim microscopy
492015016044606/11/15 Microscope and high-resolution 3d fluorescence microscopy
502015015356006/04/15 Method for preparing for and carrying out the acquisition of image stacks of a sample from various orientation angles
512015014478705/28/15 Electron microscope
522015014480105/28/15 Particle beam operating the same
532015014598105/28/15 Light scanning microscope with spectral detection
542015011429404/30/15 Processing system
552015011680704/30/15 Microscope and microscopy method
562015009087904/02/15 Charged particle multi-beam inspection system and operating the same
572015009090804/02/15 Light microscope and microscopy examining a microscopic specimen
582015008391103/26/15 Method of detecting electrons, an electron-detector and an inspection system
592015008509903/26/15 High-resolution scanning microscopy
602015007784203/19/15 High-resolution scanning microscopy
612015007784303/19/15 High-resolution scanning microscopy
622015007784503/19/15 Device and microscopy
632015006923503/12/15 Particle optical system
642015007075703/12/15 Microscope
652015005493702/26/15 Light microscope and image recording using a light microscope
662015004824802/19/15 Method for processing and/or for observing an object, and particle beam device for carrying out the method
672015004918002/19/15 Microscope
682015004306402/12/15 Tube shield lens unit
692015003596402/05/15 High-resolution luminescence microscopy
702015003596502/05/15 Method for calibrating a digital optical imaging system having a zoom system, correcting aberrations in a digital optical imaging system having a zoom system, and digital optical imaging system
712015003602702/05/15 Method for calibrating a digital optical instrument and digital optical instrument
722015003612202/05/15 Fib-sem array tomography
732015002822501/29/15 Method for manufacturing a tem-lamella and assembly having a tem-lamella protective structure
742015002958301/29/15 Apparatus and transmitted light illumination for light microscopes and microscope system
752015001452801/15/15 Method of operating a particle beam microscope and a particle beam microscope
762015001592901/15/15 Optical switch and beam stabilization device
772015001594201/15/15 Method for detecting and controlling supply of an immersion medium
782015001594301/15/15 Device for forming an immersion film
792015000830901/08/15 High-resolution scanning microscopy
802015000263201/01/15 Microscope and high-resolution 3-d fluorescence microscopy
812014035479612/04/14 Apparatus and transmitted light illumination for light microscopes and microscope system
822014035510912/04/14 Immersion fluid for microscopy
832014034746111/27/14 Microscope for widefield microscopy
842014033942411/20/14 Device for mass selective determination of an ion
852014033943911/20/14 Method for high-resolution 3d localization microscopy
862014034048311/20/14 Method for three-dimensional high resolution localization microscopy
872014034074211/20/14 Ring illumination device for a microscope objective, and microscope objective
882014032687411/06/14 Printed circuit board multipole units used for ion transportation
892014032796111/06/14 Slider for introduction into an optical path of a light microscope
902014031331110/23/14 Control device and controlling a motorized digital microscope
912014031331210/23/14 Digital microscope and optimizing the work process in a digital microscope
922014031357710/23/14 Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope
932014031358910/23/14 Telecentric modular zoom system
942014031360310/23/14 Objective lens mount
952014029148410/02/14 Microscope with structured illumination
962014029303710/02/14 Optical microscope and examining a microscopic sample
972014029341010/02/14 Laser scanning microscope
982014023284408/21/14 Method and defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
992014023302908/21/14 Spectrometer
1002014022620408/14/14 Optical assembly and light microscope
1012014021730308/07/14 Particle beam operating the same
1022014021130507/31/14 Laser scanning microscope
1032014020226507/24/14 Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
1042014019732807/17/14 Ion beam system and operating an ion beam system
1052014019094607/10/14 Laser microdissection method and laser microdissection device
1062014019112607/10/14 Method of depositing protective structures
1072014019240607/10/14 Laser scanning microscope having an illumination array
1082014018477707/03/14 High-resolution luminescence microscopy
1092014017667806/26/14 Method for high-resolution 3d-localization microscopy
1102014017704406/26/14 Method and configuration for the optical detection of an illuminated specimen
1112014016876306/19/14 Variable imaging system with an objective of fixed focal length
1122014015888406/12/14 Method for operating a particle beam device and/or for analyzing an object in a particle beam device
1132014015890206/12/14 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
1142014015308806/05/14 Slider for sliding into the observation beam path of a microscope
1152014014637605/29/14 Light microscope and microscopy method
1162014011852805/01/14 Setting unit and setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
1172014011875005/01/14 Method and configuration for depth resolved optical detection of an illuminated specimen
1182014011057704/24/14 Particle beam system and processing a tem-sample
1192014011163304/24/14 Wide field microscope and wide field microscopy
1202014009246004/03/14 Optical filter device, in particular for microscopes
1212014007009703/13/14 Particle beam device and operating a particle beam device
1222014007009903/13/14 Particle beam microscope for generating material data
1232014005585102/27/14 Laser scanning microscope
1242014000136101/02/14 Micro-gripper
1252014000137301/02/14 Method for setting a position of a carrier element in a particle beam device
1262013034267312/26/13 Method and device for focussing a microscope automatically
1272013032022612/05/13 Method and scanning a surface of an object using a particle beam
1282013032393712/05/13 Combined laser processing system and focused ion beam system
1292013030820111/21/13 Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
1302013030083311/14/13 3d localisation microscopy and 4d localisation microscopy and tracking methods and systems
1312013030290511/14/13 Increased depth-resolution microscopy
1322013029256611/07/13 Transmission electron microscopy system and operating a transmission electron microscopy system
1332013029388611/07/13 Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
1342013027176410/17/13 Measurement devices and apparatuses for spectroscopic examination of samples
1352013027184710/17/13 Immersion objective and light microscope
1362013026540710/10/13 Method and device for determining a critical angle of an excitation light beam
1372013025656310/03/13 High-resolution fluorescence microscopy
1382013025809010/03/13 Light microscope and recording images with a light microscope
1392013025006909/26/13 Device and the three-dimensional measurement of an object
1402013025040709/26/13 Device for increasing the depth discrimination of optical imaging systems
1412013024240709/19/13 Wide range zoom system
1422013023545309/12/13 Device for positioning optical components on a microscope
1432013022870409/05/13 Wavelength-resolving and high spatial resolution fluorescence microscopy
1442013022256708/29/13 Microscope and wavelength-selective and high spatial resolving microscopy
1452013021394508/22/13 Methods and the preparation of microscopy samples by using pulsed light
1462013020835508/15/13 X-y stage for microscopes
1472013018706407/25/13 Particle beam system including a supply of process gas to a processing location
1482013018096207/18/13 Methods and systems for raster scanning a surface of an object using a particle beam
1492013013432805/30/13 Processing system
1502013010046104/25/13 Methods and apparatuses for position and force detection
1512013010052604/25/13 Filter holder for correlative particle analysis
1522013010053704/25/13 Planapochromatically-corrected microscope objective
1532013010118804/25/13 Microscopy of several samples using optical microscopy and particle beam microscopy
1542013008771604/11/13 Charged particle source
1552013002776801/31/13 Attachment of optical microscope components
1562013002166401/24/13 Arrangement for adjusting illumination devices in transmitted-light microscopes
1572013000317101/03/13 Inverted microscope
1582013000318701/03/13 High-aperture immersion objective
1592012032603212/27/12 Particle beam microscope

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by