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Carl Zeiss Microscopy Gmbh patents


      
Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors



Carl Zeiss Microscopy

Spectrometer

Carl Zeiss Microscopy

Optical assembly and light microscope

Carl Zeiss Microscopy

Particle beam system and method for operating the same

Search recent Press Releases: Carl Zeiss Microscopy Gmbh-related press releases
Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12014023284408/21/14Method and apparatus for defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
22014023302908/21/14Spectrometer
32014022620408/14/14Optical assembly and light microscope
42014021730308/07/14Particle beam system and method for operating the same
52014021130507/31/14Laser scanning microscope
62014020226507/24/14Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
72014019732807/17/14Ion beam system and method of operating an ion beam system
82014019094607/10/14Laser microdissection method and laser microdissection device
92014019112607/10/14Method of depositing protective structures
102014019240607/10/14Laser scanning microscope having an illumination array
112014018477707/03/14High-resolution luminescence microscopy
122014017667806/26/14Method for high-resolution 3d-localization microscopy
132014017704406/26/14Method and configuration for the optical detection of an illuminated specimen
142014016876306/19/14Variable imaging system with an objective of fixed focal length
152014015888406/12/14Method for operating a particle beam device and/or for analyzing an object in a particle beam device
162014015890206/12/14Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
172014015308806/05/14Slider for sliding into the observation beam path of a microscope
182014014637605/29/14Light microscope and microscopy method
192014011852805/01/14Setting unit and method for setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
202014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
212014011852805/01/14Setting unit and method for setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
222014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
232014011057704/24/14Particle beam system and method of processing a tem-sample
242014011163304/24/14Wide field microscope and method for wide field microscopy
252014011057704/24/14Particle beam system and method of processing a tem-sample
262014011163304/24/14Wide field microscope and method for wide field microscopy
272014009246004/03/14Optical filter device, in particular for microscopes
282014009246004/03/14Optical filter device, in particular for microscopes
292014007009703/13/14Particle beam device and method for operating a particle beam device
302014007009903/13/14Particle beam microscope for generating material data
312014007009703/13/14Particle beam device and method for operating a particle beam device
322014007009903/13/14Particle beam microscope for generating material data
332014005585102/27/14Laser scanning microscope
342014000136101/02/14Micro-gripper
352014000137301/02/14Method for setting a position of a carrier element in a particle beam device
362013034267312/26/13Method and device for focussing a microscope automatically
372013032022612/05/13Method and apparatus for scanning a surface of an object using a particle beam
382013032393712/05/13Combined laser processing system and focused ion beam system
392013030820111/21/13Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
402013030083311/14/133d localisation microscopy and 4d localisation microscopy and tracking methods and systems
412013030290511/14/13Increased depth-resolution microscopy
422013029256611/07/13Transmission electron microscopy system and method of operating a transmission electron microscopy system
432013029388611/07/13Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
442013027176410/17/13Measurement devices and apparatuses for spectroscopic examination of samples
452013027184710/17/13Immersion objective and light microscope
462013026540710/10/13Method and device for determining a critical angle of an excitation light beam
472013025656310/03/13High-resolution fluorescence microscopy
482013025809010/03/13Light microscope and method for recording images with a light microscope
492013025006909/26/13Device and method for the three-dimensional measurement of an object
502013025040709/26/13Device for increasing the depth discrimination of optical imaging systems
512013024240709/19/13Wide range zoom system
522013023545309/12/13Device for positioning optical components on a microscope
532013022870409/05/13Wavelength-resolving and high spatial resolution fluorescence microscopy
542013022256708/29/13Microscope and method for wavelength-selective and high spatial resolving microscopy
552013022256708/29/13Microscope and method for wavelength-selective and high spatial resolving microscopy
562013021394508/22/13Methods and apparatus for the preparation of microscopy samples by using pulsed light
572013021394508/22/13Methods and apparatus for the preparation of microscopy samples by using pulsed light
582013020835508/15/13X-y stage for microscopes
592013020835508/15/13X-y stage for microscopes
602013018706407/25/13Particle beam system including a supply of process gas to a processing location
612013018706407/25/13Particle beam system including a supply of process gas to a processing location
622013018096207/18/13Methods and systems for raster scanning a surface of an object using a particle beam
632013018096207/18/13Methods and systems for raster scanning a surface of an object using a particle beam
642013013432805/30/13Processing system
652013013432805/30/13Processing system
662013010046104/25/13Methods and apparatuses for position and force detection
672013010052604/25/13Filter holder for correlative particle analysis
682013010053704/25/13Planapochromatically-corrected microscope objective
692013010118804/25/13Microscopy of several samples using optical microscopy and particle beam microscopy
702013008771604/11/13Charged particle source
712013002776801/31/13Attachment of optical microscope components
722013002166401/24/13Arrangement for adjusting illumination devices in transmitted-light microscopes
732013000317101/03/13Inverted microscope
742013000318701/03/13High-aperture immersion objective
752012032603212/27/12Particle beam microscope


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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