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Carl Zeiss Microscopy Gmbh patents


      
Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors



Device for mass selective determination of an ion

Carl Zeiss Microscopy

Device for mass selective determination of an ion

Method for high-resolution 3d localization microscopy

Carl Zeiss Microscopy

Method for high-resolution 3d localization microscopy

Method for high-resolution 3d localization microscopy

Carl Zeiss Microscopy

Method for three-dimensional high resolution localization microscopy

Search recent Press Releases: Carl Zeiss Microscopy Gmbh-related press releases
Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12014034746111/27/14 new patent  Microscope for widefield microscopy
22014033942411/20/14Device for mass selective determination of an ion
32014033943911/20/14Method for high-resolution 3d localization microscopy
42014034048311/20/14Method for three-dimensional high resolution localization microscopy
52014034074211/20/14Ring illumination device for a microscope objective, and microscope objective
62014032687411/06/14Printed circuit board multipole units used for ion transportation
72014032796111/06/14Slider for introduction into an optical path of a light microscope
82014031331110/23/14Control device and method for controlling a motorized digital microscope
92014031331210/23/14Digital microscope and method for optimizing the work process in a digital microscope
102014031357710/23/14Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope
112014031358910/23/14Telecentric modular zoom system
122014031360310/23/14Objective lens mount
132014029148410/02/14Microscope with structured illumination
142014029303710/02/14Optical microscope and method for examining a microscopic sample
152014029341010/02/14Laser scanning microscope
162014023284408/21/14Defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
172014023302908/21/14Spectrometer
182014022620408/14/14Optical assembly and light microscope
192014021730308/07/14Particle beam system and method for operating the same
202014021130507/31/14Laser scanning microscope
212014020226507/24/14Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
222014019732807/17/14Ion beam system and method of operating an ion beam system
232014019094607/10/14Laser microdissection method and laser microdissection device
242014019112607/10/14Method of depositing protective structures
252014019240607/10/14Laser scanning microscope having an illumination array
262014018477707/03/14High-resolution luminescence microscopy
272014017667806/26/14Method for high-resolution 3d-localization microscopy
282014017704406/26/14Method and configuration for the optical detection of an illuminated specimen
292014016876306/19/14Variable imaging system with an objective of fixed focal length
302014015888406/12/14Method for operating a particle beam device and/or for analyzing an object in a particle beam device
312014015890206/12/14Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
322014015308806/05/14Slider for sliding into the observation beam path of a microscope
332014014637605/29/14Light microscope and microscopy method
342014011852805/01/14Setting unit and method for setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
352014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
362014011057704/24/14Particle beam system and method of processing a tem-sample
372014011163304/24/14Wide field microscope and method for wide field microscopy
382014009246004/03/14Optical filter device, in particular for microscopes
392014007009703/13/14Particle beam device and method for operating a particle beam device
402014007009903/13/14Particle beam microscope for generating material data
412014005585102/27/14Laser scanning microscope
422014000136101/02/14Micro-gripper
432014000137301/02/14Method for setting a position of a carrier element in a particle beam device
442013034267312/26/13Method and device for focussing a microscope automatically
452013032022612/05/13Scanning a surface of an object using a particle beam
462013032393712/05/13Combined laser processing system and focused ion beam system
472013030820111/21/13Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
482013030083311/14/133d localisation microscopy and 4d localisation microscopy and tracking methods and systems
492013030290511/14/13Increased depth-resolution microscopy
502013029256611/07/13Transmission electron microscopy system and method of operating a transmission electron microscopy system
512013029388611/07/13Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
522013027176410/17/13Measurement devices and apparatuses for spectroscopic examination of samples
532013027184710/17/13Immersion objective and light microscope
542013026540710/10/13Method and device for determining a critical angle of an excitation light beam
552013025656310/03/13High-resolution fluorescence microscopy
562013025809010/03/13Light microscope and method for recording images with a light microscope
572013025006909/26/13Device and method for the three-dimensional measurement of an object
582013025040709/26/13Device for increasing the depth discrimination of optical imaging systems
592013024240709/19/13Wide range zoom system
602013023545309/12/13Device for positioning optical components on a microscope
612013022870409/05/13Wavelength-resolving and high spatial resolution fluorescence microscopy
622013022256708/29/13Microscope and method for wavelength-selective and high spatial resolving microscopy
632013021394508/22/13Methods and apparatus for the preparation of microscopy samples by using pulsed light
642013020835508/15/13X-y stage for microscopes
652013018706407/25/13Particle beam system including a supply of process gas to a processing location
662013018096207/18/13Raster scanning a surface of an object using a particle beam
672013013432805/30/13Processing system
682013010046104/25/13Methods and apparatuses for position and force detection
692013010052604/25/13Filter holder for correlative particle analysis
702013010053704/25/13Planapochromatically-corrected microscope objective
712013010118804/25/13Microscopy of several samples using optical microscopy and particle beam microscopy
722013008771604/11/13Charged particle source
732013002776801/31/13Attachment of optical microscope components
742013002166401/24/13Arrangement for adjusting illumination devices in transmitted-light microscopes
752013000317101/03/13Inverted microscope
762013000318701/03/13High-aperture immersion objective
772012032603212/27/12Particle beam microscope


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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