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Carl Zeiss Microscopy Gmbh patents


      
Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors


Method for processing and/or for observing an object, and particle beam device for carrying out the method

Carl Zeiss Microscopy

Method for processing and/or for observing an object, and particle beam device for carrying out the method

Microscope

Carl Zeiss Microscopy

Microscope

Tube shield lens unit

Carl Zeiss Microscopy

Tube shield lens unit

Search recent Press Releases: Carl Zeiss Microscopy Gmbh-related press releases
Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12015005493702/26/15Light microscope and image recording using a light microscope
22015004824802/19/15Method for processing and/or for observing an object, and particle beam device for carrying out the method
32015004918002/19/15Microscope
42015004306402/12/15Tube shield lens unit
52015003596402/05/15High-resolution luminescence microscopy
62015003596502/05/15Method for calibrating a digital optical imaging system having a zoom system, correcting aberrations in a digital optical imaging system having a zoom system, and digital optical imaging system
72015003602702/05/15Method for calibrating a digital optical instrument and digital optical instrument
82015003612202/05/15Fib-sem array tomography
92015002822501/29/15Method for manufacturing a tem-lamella and assembly having a tem-lamella protective structure
102015002958301/29/15Apparatus and transmitted light illumination for light microscopes and microscope system
112015001452801/15/15Method of operating a particle beam microscope and a particle beam microscope
122015001592901/15/15Optical switch and beam stabilization device
132015001594201/15/15Method for detecting and controlling supply of an immersion medium
142015001594301/15/15Device for forming an immersion film
152015000830901/08/15High-resolution scanning microscopy
162015000263201/01/15Microscope and high-resolution 3-d fluorescence microscopy
172014035479612/04/14Apparatus and transmitted light illumination for light microscopes and microscope system
182014035510912/04/14Immersion fluid for microscopy
192014034746111/27/14Microscope for widefield microscopy
202014033942411/20/14Device for mass selective determination of an ion
212014033943911/20/14Method for high-resolution 3d localization microscopy
222014034048311/20/14Method for three-dimensional high resolution localization microscopy
232014034074211/20/14Ring illumination device for a microscope objective, and microscope objective
242014032687411/06/14Printed circuit board multipole units used for ion transportation
252014032796111/06/14Slider for introduction into an optical path of a light microscope
262014031331110/23/14Control device and controlling a motorized digital microscope
272014031331210/23/14Digital microscope and optimizing the work process in a digital microscope
282014031357710/23/14Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope
292014031358910/23/14Telecentric modular zoom system
302014031360310/23/14Objective lens mount
312014029148410/02/14Microscope with structured illumination
322014029303710/02/14Optical microscope and examining a microscopic sample
332014029341010/02/14Laser scanning microscope
342014023284408/21/14Method and defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
352014023302908/21/14Spectrometer
362014022620408/14/14Optical assembly and light microscope
372014021730308/07/14Particle beam operating the same
382014021130507/31/14Laser scanning microscope
392014020226507/24/14Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
402014019732807/17/14Ion beam system and operating an ion beam system
412014019094607/10/14Laser microdissection method and laser microdissection device
422014019112607/10/14Method of depositing protective structures
432014019240607/10/14Laser scanning microscope having an illumination array
442014018477707/03/14High-resolution luminescence microscopy
452014017667806/26/14Method for high-resolution 3d-localization microscopy
462014017704406/26/14Method and configuration for the optical detection of an illuminated specimen
472014016876306/19/14Variable imaging system with an objective of fixed focal length
482014015888406/12/14Method for operating a particle beam device and/or for analyzing an object in a particle beam device
492014015890206/12/14Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
502014015308806/05/14Slider for sliding into the observation beam path of a microscope
512014014637605/29/14Light microscope and microscopy method
522014011852805/01/14Setting unit and setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
532014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
542014011057704/24/14Particle beam system and processing a tem-sample
552014011163304/24/14Wide field microscope and wide field microscopy
562014009246004/03/14Optical filter device, in particular for microscopes
572014007009703/13/14Particle beam device and operating a particle beam device
582014007009903/13/14Particle beam microscope for generating material data
592014005585102/27/14Laser scanning microscope
602014000136101/02/14Micro-gripper
612014000137301/02/14Method for setting a position of a carrier element in a particle beam device
622013034267312/26/13Method and device for focussing a microscope automatically
632013032022612/05/13Method and scanning a surface of an object using a particle beam
642013032393712/05/13Combined laser processing system and focused ion beam system
652013030820111/21/13Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
662013030083311/14/133d localisation microscopy and 4d localisation microscopy and tracking methods and systems
672013030290511/14/13Increased depth-resolution microscopy
682013029256611/07/13Transmission electron microscopy system and operating a transmission electron microscopy system
692013029388611/07/13Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
702013027176410/17/13Measurement devices and apparatuses for spectroscopic examination of samples
712013027184710/17/13Immersion objective and light microscope
722013026540710/10/13Method and device for determining a critical angle of an excitation light beam
732013025656310/03/13High-resolution fluorescence microscopy
742013025809010/03/13Light microscope and recording images with a light microscope
752013025006909/26/13Device and the three-dimensional measurement of an object
762013025040709/26/13Device for increasing the depth discrimination of optical imaging systems
772013024240709/19/13Wide range zoom system
782013023545309/12/13Device for positioning optical components on a microscope
792013022870409/05/13Wavelength-resolving and high spatial resolution fluorescence microscopy
802013022256708/29/13Microscope and wavelength-selective and high spatial resolving microscopy
812013021394508/22/13Methods and the preparation of microscopy samples by using pulsed light
822013020835508/15/13X-y stage for microscopes
832013018706407/25/13Particle beam system including a supply of process gas to a processing location
842013018096207/18/13Methods and systems for raster scanning a surface of an object using a particle beam
852013013432805/30/13Processing system
862013010046104/25/13Methods and apparatuses for position and force detection
872013010052604/25/13Filter holder for correlative particle analysis
882013010053704/25/13Planapochromatically-corrected microscope objective
892013010118804/25/13Microscopy of several samples using optical microscopy and particle beam microscopy
902013008771604/11/13Charged particle source
912013002776801/31/13Attachment of optical microscope components
922013002166401/24/13Arrangement for adjusting illumination devices in transmitted-light microscopes
932013000317101/03/13Inverted microscope
942013000318701/03/13High-aperture immersion objective
952012032603212/27/12Particle beam microscope



ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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