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Carl Zeiss Microscopy Gmbh patents


      
Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors



Optical switch and beam stabilization device

Carl Zeiss Microscopy

Optical switch and beam stabilization device

Method for detecting and controlling supply of an immersion medium

Carl Zeiss Microscopy

Method for detecting and controlling supply of an immersion medium

Method for detecting and controlling supply of an immersion medium

Carl Zeiss Microscopy

Device for forming an immersion film

Search recent Press Releases: Carl Zeiss Microscopy Gmbh-related press releases
Count Application # Date Carl Zeiss Microscopy Gmbh patents (updated weekly) - BOOKMARK this page
12015001452801/15/15Method of operating a particle beam microscope and a particle beam microscope
22015001592901/15/15Optical switch and beam stabilization device
32015001594201/15/15Method for detecting and controlling supply of an immersion medium
42015001594301/15/15Device for forming an immersion film
52015000830901/08/15High-resolution scanning microscopy
62015000263201/01/15Microscope and high-resolution 3-d fluorescence microscopy
72014035479612/04/14Apparatus and transmitted light illumination for light microscopes and microscope system
82014035510912/04/14Immersion fluid for microscopy
92014034746111/27/14Microscope for widefield microscopy
102014033942411/20/14Device for mass selective determination of an ion
112014033943911/20/14Method for high-resolution 3d localization microscopy
122014034048311/20/14Method for three-dimensional high resolution localization microscopy
132014034074211/20/14Ring illumination device for a microscope objective, and microscope objective
142014032687411/06/14Printed circuit board multipole units used for ion transportation
152014032796111/06/14Slider for introduction into an optical path of a light microscope
162014031331110/23/14Control device and controlling a motorized digital microscope
172014031331210/23/14Digital microscope and optimizing the work process in a digital microscope
182014031357710/23/14Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope
192014031358910/23/14Telecentric modular zoom system
202014031360310/23/14Objective lens mount
212014029148410/02/14Microscope with structured illumination
222014029303710/02/14Optical microscope and examining a microscopic sample
232014029341010/02/14Laser scanning microscope
242014023284408/21/14Method and defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope
252014023302908/21/14Spectrometer
262014022620408/14/14Optical assembly and light microscope
272014021730308/07/14Particle beam operating the same
282014021130507/31/14Laser scanning microscope
292014020226507/24/14Method for embedding a biological sample in a transparent matrix for analysis using single plane illumination microscopy
302014019732807/17/14Ion beam system and operating an ion beam system
312014019094607/10/14Laser microdissection method and laser microdissection device
322014019112607/10/14Method of depositing protective structures
332014019240607/10/14Laser scanning microscope having an illumination array
342014018477707/03/14High-resolution luminescence microscopy
352014017667806/26/14Method for high-resolution 3d-localization microscopy
362014017704406/26/14Method and configuration for the optical detection of an illuminated specimen
372014016876306/19/14Variable imaging system with an objective of fixed focal length
382014015888406/12/14Method for operating a particle beam device and/or for analyzing an object in a particle beam device
392014015890206/12/14Particle-optical systems and arrangements and particle-optical components for such systems and arrangements
402014015308806/05/14Slider for sliding into the observation beam path of a microscope
412014014637605/29/14Light microscope and microscopy method
422014011852805/01/14Setting unit and setting a sequence for the automatic recording of images of an object by means of a recording device, and recording device having such a setting unit
432014011875005/01/14Method and configuration for depth resolved optical detection of an illuminated specimen
442014011057704/24/14Particle beam system and processing a tem-sample
452014011163304/24/14Wide field microscope and wide field microscopy
462014009246004/03/14Optical filter device, in particular for microscopes
472014007009703/13/14Particle beam device and operating a particle beam device
482014007009903/13/14Particle beam microscope for generating material data
492014005585102/27/14Laser scanning microscope
502014000136101/02/14Micro-gripper
512014000137301/02/14Method for setting a position of a carrier element in a particle beam device
522013034267312/26/13Method and device for focussing a microscope automatically
532013032022612/05/13Method and scanning a surface of an object using a particle beam
542013032393712/05/13Combined laser processing system and focused ion beam system
552013030820111/21/13Optical inspection system with a variation system consisting of five lens groups for imaging an object into infinity
562013030083311/14/133d localisation microscopy and 4d localisation microscopy and tracking methods and systems
572013030290511/14/13Increased depth-resolution microscopy
582013029256611/07/13Transmission electron microscopy system and operating a transmission electron microscopy system
592013029388611/07/13Flange for closing off an optical device against a sample stream, and an optical device for partial immersion in a sample stream
602013027176410/17/13Measurement devices and apparatuses for spectroscopic examination of samples
612013027184710/17/13Immersion objective and light microscope
622013026540710/10/13Method and device for determining a critical angle of an excitation light beam
632013025656310/03/13High-resolution fluorescence microscopy
642013025809010/03/13Light microscope and recording images with a light microscope
652013025006909/26/13Device and the three-dimensional measurement of an object
662013025040709/26/13Device for increasing the depth discrimination of optical imaging systems
672013024240709/19/13Wide range zoom system
682013023545309/12/13Device for positioning optical components on a microscope
692013022870409/05/13Wavelength-resolving and high spatial resolution fluorescence microscopy
702013022256708/29/13Microscope and wavelength-selective and high spatial resolving microscopy
712013021394508/22/13Methods and the preparation of microscopy samples by using pulsed light
722013020835508/15/13X-y stage for microscopes
732013018706407/25/13Particle beam system including a supply of process gas to a processing location
742013018096207/18/13Methods and systems for raster scanning a surface of an object using a particle beam
752013013432805/30/13Processing system
762013010046104/25/13Methods and apparatuses for position and force detection
772013010052604/25/13Filter holder for correlative particle analysis
782013010053704/25/13Planapochromatically-corrected microscope objective
792013010118804/25/13Microscopy of several samples using optical microscopy and particle beam microscopy
802013008771604/11/13Charged particle source
812013002776801/31/13Attachment of optical microscope components
822013002166401/24/13Arrangement for adjusting illumination devices in transmitted-light microscopes
832013000317101/03/13Inverted microscope
842013000318701/03/13High-aperture immersion objective
852012032603212/27/12Particle beam microscope


ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Carl Zeiss Microscopy Gmbh in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Carl Zeiss Microscopy Gmbh with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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