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Cascade Microtech Inc patents

Recent patent applications related to Cascade Microtech Inc. Cascade Microtech Inc is listed as an Agent/Assignee. Note: Cascade Microtech Inc may have other listings under different names/spellings. We're not affiliated with Cascade Microtech Inc, we're just tracking patents.

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Cascade Microtech Inc-related inventors




Date Cascade Microtech Inc patents (updated weekly) - BOOKMARK this page
09/21/17 new patent  Test standards and methods for impedance calibration of a probe system, and probe systems that include the test standards or utilize the methods
08/31/17Probe systems and methods including active environmental control
07/27/17Probe head assemblies with constrained internal motion and probe systems including the probe head assemblies
07/20/17Probes with fiducial marks, probe systems including the same, and associated methods
07/20/17Shielded probe systems
05/25/17Probe automatically maintaining alignment between a probe and a device under test during a temperature change
11/17/16Method of replacing an existing contact of a wafer probing assembly
07/07/16High voltage chuck for a probe station
04/14/16Probe head assemblies, components thereof, test systems including the same, and methods of operating the same
10/22/15Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same
09/10/15Wafer-handling end effectors
08/27/15Systems and methods for on-wafer dynamic testing of electronic devices
04/30/15Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same
01/08/15Prober for testing devices in a repeat structure on a substrate
08/28/14Method for verifying a test substrate in a prober under defined thermal conditions
07/03/14Systems and methods for rotational alignment of a device under test
07/03/14Systems and methods for handling substrates at below dew point temperatures
07/03/14Systems and methods for providing wafer access in a wafer processing system
05/08/14Systems and methods for testing electronic devices that include low power output drivers
01/30/14Method for testing a test substrate under defined thermal conditions and thermally conditionable prober
12/05/13Membrane probing method using improved contact
08/29/13Replaceable coupon for a probing apparatus
07/18/13Systems and methods for non-contact power and data transfer in electronic devices
03/28/13High voltage chuck for a probe station
03/21/13Risers including a plurality of high aspect ratio electrical conduits and systems and methods of manufacture and use therof
02/21/13Optically enhanced digital imaging system
01/31/13Method and device for contacting a row of contact areas with probe tips
01/17/13Systems, devices, and methods for two-sided testing of electronic devices
12/06/12High frequency interconnect structures, electronic assemblies that utilize high frequency interconnect structures, and methods of operating the same
11/15/12Probe head assemblies, components thereof, test systems including the same, and methods of operating the same
06/14/12Method for measurement of a power device
05/10/12Resilient electrical interposers, systems that include the interposers, and methods for using and forming the same
04/26/12Systems and methods for simultaneous optical testing of a plurality of devices under test
12/01/11Chuck for supporting and retaining a test substrate and a calibration substrate
07/21/11Line-reflect-reflect match calibration
10/28/10Membrane probing method using improved contact
10/21/10Differential signal probing system
10/07/10Wafer probe
10/07/10Active wafer probe
09/30/10Test structure and probe for differential signals
07/01/10Low insertion force bga socket assembly
05/27/10Test system for flicker noise
05/06/10Chuck for holding a device under test
04/22/10System for testing semiconductors
10/29/09Probe for testing a device under test
09/10/09Membrane probing system with local contact scrub
07/16/09Method of constructing a membrane probe using a depression
05/28/09Interface for testing semiconductors
03/26/09High frequency probe







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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Cascade Microtech Inc in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Cascade Microtech Inc with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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