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Fei Company patents

Recent patent applications related to Fei Company. Fei Company is listed as an Agent/Assignee. Note: Fei Company may have other listings under different names/spellings. We're not affiliated with Fei Company, we're just tracking patents.

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "F" | Fei Company-related inventors




Date Fei Company patents (updated weekly) - BOOKMARK this page
11/16/17 new patent  Attachment of nano-objects to beam-deposited structures
10/26/17System for orienting a sample using a diffraction pattern
10/26/17Three-dimensional imaging in charged-particle microscopy
09/07/17Automated tem sample preparation
08/31/17High throughput tem preparation processes and hardware for backside thinning of cross-sectional view lamella
08/24/17Studying dynamic specimen behavior in a charged-particle microscope
08/10/17Correction of beam hardening artifacts in microtomography for samples imaged in containers
08/03/17Charged-particle microscope with astigmatism compensation and energy-selection
07/27/17Holder assembly for cooperating with a nanoreactor and an electron microscope
07/13/17Charged particle beam-induced etching
06/15/17Preparation of cryogenic sample for charged-particle microscopy
06/01/17Method and device for testing samples by means of an electron or ion beam microscope
05/18/17Novel x-ray imaging technique
05/11/17Waveform mapping and gated laser voltage imaging
05/11/17Systems and methods for imaging device interfaces
05/11/17Method of material deposition
05/11/17Method for detecting particulate radiation
05/04/17Method for optimizing charged particle beams formed by shaped apertures
05/04/17Charged particle microscope with vibration detection / correction
05/04/17Post column filter with enhanced energy range
04/27/17Standing wave interferometric microscope
04/27/17In-situ packaging decapsulation feature for electrical fault localization
04/13/17Investigation of high-temperature specimens in a charged particle microscope
03/16/17Nanofabrication using a new class of electron beam induced surface processing techniques
03/02/17Novel data processing in a tomographic imaging apparatus
03/02/17Positional error correction in a tomographic imaging apparatus
03/02/17Cad-assisted tem prep recipe creation
02/23/17Optimized wavelength photon emission microscope for vlsi devices
02/23/17Novel acquisition and processing of data in a tomographic imaging apparatus
02/02/17Micro-chamber for inspecting sample material
01/26/17Method of ptychographic imaging
01/26/17Fiducial formation for tem/stem tomography tilt-series acquisition and alignment
01/05/17Adaptive beam current for high throughput patterning
01/05/17Adaptive control for charged particle beam processing
12/29/16Optical nanoprobing of integrated circuits
12/15/16Method of analyzing surface modification of a specimen in a charged-particle microscope
12/01/16Dynamic creation of backup fiducials
11/24/16Electron beam microscope with improved imaging gas and use
11/03/16Adaptive scanning for particle size using directed beam signal analysis
10/20/16Method of manipulating a sample in an evacuated chamber of a charged particle apparatus
10/20/16Method of performing tomographic imaging in a charged-particle microscope
10/06/16Charged particle beam processing using process gas and cooled surface
09/22/16Method of performing spectroscopy in a transmission charged-particle microscope
09/01/16Methods and systems for managing multiple versions of a process in a processing chain
09/01/16Pulse processing
08/25/16Multi-source gis for particle-optical apparatus
08/25/16Preparation of sample for charged-particle microscopy
08/25/16Sample-specific reference spectra library
08/25/16Pattern matching using a lamella of known shape for automated s/tem acquisition and metrology
08/11/16Method for rapid switching between a high current mode and a low current mode in a charged particle beam system
07/21/16Differential imaging with pattern recognition for process automation of cross sectioning applications
07/14/16Method of modifying a sample surface layer from a microscopic sample
06/30/16Localized, in-vacuum modification of small structures
06/30/16Charged particle microscope with improved spectroscopic functionality
06/23/16Specimen holder for a charged particle microscope
06/23/16Fiducial-based correlative microscopy
06/16/16Source for selectively providing positively or negatively charged particles for a focusing column
06/09/16Method for s/tem sample analysis
06/02/16Multiple gas injection system
05/19/16Automated tem sample preparation
05/12/16Contactless temperature measurement in a charged particle microscope
05/12/16Charged particle microscope with barometric pressure correction
05/05/16Method for coincident alignment of a laser beam and a charged particle beam
04/28/16Composite scan path in a charged particle microscope
04/21/16Charged particle microscope with special aperture plate
Patent Packs
04/14/16Aligning a featureless thin film in a tem
04/14/16Multi species ion source
04/07/16Method of producing a freestanding thin film of nano-crystalline carbon
03/31/16Chicane blanker assemblies for charged particle beam systems and methods of using the same
03/24/16Spectroscopy in a transmission charged-particle microscope
03/17/16Autoslice and view undercut method
03/10/16Method of performing spectroscopy in a transmission charged-particle microscope
03/03/16Blend modes for mineralogy images
02/25/16Method of acquiring ebsp patterns
02/25/16Radiation sensor, and its application in a charged-particle microscope
02/04/16Functionalized grids for locating and imaging biological specimens and methods of using the same
01/28/16Inductively-coupled plasma ion source for use with a focused ion beam column with selectable ions
01/21/16Charged-particle lens that transmits emissions from sample
01/21/16Tem sample mounting geometry
01/21/16Electron beam-induced etching
Patent Packs
01/21/16Tem sample preparation
01/14/16Beam-induced deposition of low-resistivity material
01/14/16Computational scanning microscopy with improved resolution
01/14/16Method of calibrating a scanning transmission charged-particle microscope
12/31/15Imaging and processing for plasma ion source
12/31/15Integrated light optics and gas delivery in a charged particle lens
12/31/15High - resolution amplitude contrast imaging
12/24/15Method and system of creating a symmetrical fib deposition
12/24/15System and simultaneous detection of secondary electrons and light in a charged particle beam system
12/24/15Mathematical image assembly in a scanning-type microscope
12/10/15Fiducial design for tilted or glancing mill operations with a charged particle beam
12/10/15Method for attachment of an electrode into an inductively-coupled plasma
12/03/15Method and slice and view sample imaging
12/03/15Ion implantation to alter etch rate
11/26/15Depositing material into high aspect ratio structures
11/19/15Method for preparing samples for imaging
11/19/15User interface for an electron microscope
11/12/15Method for creating s/tem sample and sample structure
11/12/15Focused ion beam low kv enhancement
11/12/15Tem sample preparation
11/05/15Multi-source plasma focused ion beam system
10/29/15Method and sample extraction and handling
10/22/15High aspect ratio x-ray targets and uses of same
10/15/15High capacity tem grid
10/15/15Gas injection system with precursor for planar deprocessing of semiconductor devices using a focused ion beam
10/01/15Method and system for reducing curtaining in charged particle beam sample preparation
10/01/15Imaging a sample with multiple beams and multiple detectors
09/17/15Multidimensional structural access
09/17/15Blend modes for mineralogy images
09/10/15Fabrication of a malleable lamella for correlative atomic-resolution tomographic analyses
Social Network Patent Pack
08/27/15Method of examining a sample in a charged-particle microscope
08/27/15Bulk deposition for tilted mill protection
08/27/15High aspect ratio structure analysis
07/30/15Correlative optical and charged particle microscope
07/30/15Surface delayering with a programmed manipulator
07/23/15Method for s/tem sample analysis
06/25/15Method for preparing samples for imaging
06/18/15Method of investigating the wavefront of a charged-particle beam
06/04/15Method of producing a freestanding thin film of nano-crystalline graphite
06/04/15Charged-particle microscopy with enhanced electron detection
Patent Packs
05/21/15Phase plate for a transmission electron microscope
05/21/15Differential imaging with pattern recognition for process automation of cross sectioning applications
05/14/15Inductively-coupled plasma ion source for use with a focused ion beam column with selectable ions
05/14/15Magnetically enhanced, inductively coupled plasma source for a focused ion beam system
05/07/15Sub-pixel analysis and display of fine grained mineral samples
04/30/15Integrated lamellae extraction station
04/16/15Method for preparing thin samples for tem imaging
04/16/15High voltage isolation of an inductively coupled plasma ion source with a liquid that is not actively pumped
04/16/15Image data processing
04/09/15Method of depositing material
04/02/15Preparation of cryogenic sample for charged-particle microscopy
03/26/15Focused ion beam low kv enhancement
03/19/15Detaching probe from tem sample during sample preparation
03/19/15Charged-particle-beam processing using a cluster source
03/12/15Method for electron tomography
03/05/15Method for coincident alignment of a laser beam and a charged particle beam
02/26/15Tem sample preparation
02/19/15Circuit probe for charged particle beam system
02/12/15Method of using an environmental transmission electron microscope
01/29/15System for in situ reactivation of fluorescence marker
01/22/15Automated slice milling for viewing a feature
01/22/15Magnetic lens for focusing a beam of charged particles
01/15/15High accuracy beam placement for local area navigation
01/08/15Internal split faraday shield for an inductively coupled plasma source
01/08/15Charged-particle microscope with raman spectroscopy capability
01/01/15Plan view sample preparation
12/25/14Detection use in charged-particle microscopy
12/18/14Method of welding a frozen aqueous sample to a microprobe
12/11/14Method for imaging a sample in a charged particle apparatus
12/04/14Precursor for planar deprocessing of semiconductor devices using a focused ion beam
Patent Packs
11/06/14Source for selectively providing positively or negatively charged particles for a focusing column
11/06/14Phase shift a tem
10/30/14Multiple image metrology
10/23/14Charged-particle microscope providing depth-resolved imagery
10/23/14Multi-source plasma focused ion beam system
10/23/14Microscope device
10/16/14Methods and structures for rapid switching between different process gases in an inductively-coupled plasma (icp) ion source
10/09/14Low energy ion milling or deposition
09/04/14Method of studying a cryogenic sample in an optical microscope
08/28/14Focused ion beam low kv enhancement
08/21/14In situ reactivation of fluorescence marker
08/21/14Computed tomography imaging process and system
08/07/14Tem sample preparation
07/24/14Method of observing samples with a fluorescent microscope
07/17/14Sample carrier for an electron microscope
07/10/14Sample block holder
06/19/14Backscatter reduction in thin electron detectors
06/12/14Switchable microscope arrangement with multiple detectors
05/29/14Method of performing tomographic imaging of a sample in a charged-particle microscope
05/29/14Method of sampling a sample and displaying obtained information
Social Network Patent Pack
05/29/14Signal based sample preparation
05/15/14Dual laser beam system used with an electron microscope and fib
05/15/14System and simultaneous detection of secondary electrons and light in a charged particle beam system
05/01/14Method for creating s/tem sample and sample structure
05/01/14Mineral identification using sequential decomposition into elements from mineral definitions
05/01/14Retarding field analyzer integral with particle beam column
04/24/14Configurable charged-particle apparatus
04/24/14Coated o-ring
04/17/14Beam pulsing device for use in charged-particle microscopy
04/10/14In-column detector for particle-optical column
03/27/14System and ex situ analysis of a substrate
03/20/14X-ray detector for electron microscope
03/13/14Method of performing tomographic imaging of a sample in a charged-particle microscope
03/13/14Method of using a compound particle-optical lens
03/13/14Automated coincident alignment of a laser beam and a charged particle beam
03/13/14Cooperating capillary and cap for use in a high-pressure freezer
03/06/14Dose-based end-pointing for low-kv fib milling tem sample preparation
03/06/14Imaging a sample in a tem equipped with a phase plate
03/06/14Method of investigating and correcting aberrations in a charged-particle lens system
03/06/14Seed layer laser-induced deposition
Social Network Patent Pack
02/27/14Gas-assisted laser ablation
02/20/14Automated sample preparation
02/06/14Environmental sem gas injection system
02/06/14Sequencer for combining automated and manual-assistance jobs in a charged particle beam device
01/30/14Automated eds standards calibration
01/23/14Spectroscopy technique using merged spectral data
01/02/14Cluster analysis of unknowns in sem-eds dataset
01/02/14On-axis detector for charged particle beam system
01/02/14Multi species ion source
12/26/13Method for s/tem sample analysis
12/26/13Three dimensional fiducial
12/12/13Focused charged particle column for operation at different beam energies at a target
12/12/13Lamella creation using fixed-angle beam and rotating sample stage
12/05/13Preparation of lamellae for tem viewing
12/05/13Imaging and processing for plasma ion source
11/28/13Phase plate for a tem
11/28/13High-vacuum seal
11/28/13Method of preparing a biological sample for inspection with electron microscopy and fluorescent light microscopy
11/21/13Automated slice milling for viewing a feature
11/21/13Scanning microscope having an adaptive scan
11/21/13Image-enhancing spotlight mode for digital microscopy
11/21/13Multi-source plasma focused ion beam system
10/24/13Method for analyzing an eds signal
10/10/13Method for determining distortions in a particle-optical apparatus
10/03/13Automated ion beam idle
09/26/13Multiple gas injection system
09/26/13Method and actively monitoring an inductively-coupled plasma ion source using an optical spectrometer
09/19/13X-ray detector for electron microscope
09/19/13Charged particle extraction device and design there for
09/05/13Charged-particle microscope providing depth-resolved imagery
Social Network Patent Pack
08/22/13Holder assembly for cooperating with an environmental cell and an electron microscope
08/22/13Charged particle detector
08/15/13Forming a vitrified sample for electron microscopy
08/08/13Drift control in a charged particle beam system
08/01/13High resolution plasma etch
07/25/13Glancing angle mill
07/25/13Determination of emission parameters from field emission sources
07/18/13Charged particle beam system aperture
06/20/13Method and sample extraction and handling
06/06/13Inductively-coupled plasma ion source for use with a focused ion beam column with selectable ions
06/06/13Methods for preparing thin samples for tem imaging
05/30/13Inductively coupled plasma source as an electron beam source for spectroscopic analysis
05/30/13System for attachment of an electrode into an inductively coupled plasma source
05/09/13Charged particle energy filter
05/02/13Sample block holder
05/02/13Method for adjusting a stem equipped with an aberration corrector
04/25/13Internal split faraday shield for an inductively coupled plasma source
04/25/13Detector for use in a charged particle apparatus
04/18/13Pattern modification schemes for improved fib patterning
04/18/13Method for acquiring data with an image sensor
03/21/13Localized, in-vacuum modification of small structures
03/14/13Distortion free stigmation of a tem
03/07/13Charged particle detector system comprising a conversion electrode
02/14/13Charged-particle microscopy imaging method
02/14/13Charged-particle microscope providing depth-resolved imagery
02/14/13Method of studying a sample in an etem
01/17/13Clustering of multi-modal data
01/17/13Methods and structures for rapid switching between different process gases in an inductively-coupled plasma (icp) ion source
12/27/12High accuracy beam placement for local area navigation







ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009



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