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Freescale Semiconductor Inc
Freescale Semiconductor Inc A Corporation
Freescale Semiconductor Inc formerly Known As Sigmatel Inc
Freescale Semiconductor Inc Austin Texas
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Freescale Semiconductor Inc_20100114
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Freescale Semiconductor Inc_20100128
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Freescale Semiconductor Inc patents


      
Recent patent applications related to Freescale Semiconductor Inc. Freescale Semiconductor Inc is listed as an Agent/Assignee. Note: Freescale Semiconductor Inc may have other listings under different names/spellings. We're not affiliated with Freescale Semiconductor Inc, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "F" | Freescale Semiconductor Inc-related inventors


Semiconductor devices with inner via

Freescale Semiconductor

Semiconductor devices with inner via

Method and system for scrolling a data set across a screen

Freescale Semiconductor

Method and system for scrolling a data set across a screen

Selective gate oxide properties adjustment using fluorine

Freescale Semiconductor

Selective gate oxide properties adjustment using fluorine

Search recent Press Releases: Freescale Semiconductor Inc-related press releases
Count Application # Date Freescale Semiconductor Inc patents (updated weekly) - BOOKMARK this page
12015017707506/25/15 new patent  Production-test die temperature measurement method and apparatus
22015017775506/25/15 new patent  Linear voltage regulator device and electronic device
32015017777506/25/15 new patent  Digital sample clock generator, a vibration gyroscope circuitry comprising such digital sample clock generator, an associated apparatus, an associated semiconductor device and associated methods
42015017797606/25/15 new patent  Method and system for scrolling a data set across a screen
52015017810206/25/15 new patent  System-on-chip, manufacture thereof and controlling a system-on-chip
62015017956606/25/15 new patent  Semiconductor devices with inner via
72015017982106/25/15 new patent  Selective gate oxide properties adjustment using fluorine
82015018045206/25/15 new patent  Low leakage cmos cell with low voltage swing
92015018045406/25/15 new patent  Delay compensation circuit
102015018047506/25/15 new patent  Input/output driver circuit, integrated circuit and method therefor
112015018121106/25/15 new patent  Video information processing system with selective chroma deblock filtering
122015016949406/18/15Data path configuration component, signal processing device and method therefor
132015017098606/18/15Semiconductor package having an isolation wall to reduce electromagnetic coupling
142015017105706/18/15Method and multi-chip structure semiconductor package
152015017186606/18/15Level shifter circuit
162015017222006/18/15Ethercat packet forwarding with distributed clocking
172015016008906/11/15Pressure sensor with built-in calibration capability
182015016066806/11/15Voltage reculator circuit and method therefor
192015016071806/11/15Memory circuit with power status sensor
202015016175906/11/15Diagnostic data generation apparatus, integrated circuit and generating diagnostic data
212015016281806/11/15System on a chip, voltage ripple reduction on a power supply line of an integrated circuit device operable in at least two modes
222015016304606/11/15Clock for serial communication device
232015016349606/11/15Method and performing compression of image data
242015015283306/04/15Rf power amplification and distribution systems, plasma ignition systems, and methods of operation therefor
252015015340906/04/15Circuit for testing power supplies in multiple power modes
262015015501706/04/15Bypass system and method that mimics clock to data memory read timing
272015015535006/04/15Resurf high voltage diode
282015015583006/04/15Multiple-state, switch-mode power amplifier systems and methods of their operation
292015015583806/04/15Amplifier with adjustable load
302015015584006/04/15Multiple-state, switch-mode power amplifier systems and methods of their operation
312015015612806/04/15Scheduling module and method thereof
322015015617906/04/15Security key generator
332015015682806/04/15Systems that include microwave adaptors and methods of their operation
342015014511405/28/15Thermally enhanced package with lid heat spreader
352015014514805/28/15Copper ball bond interface structure and formation
362015014554305/28/15Mems device positioning apparatus, test system, and test method
372015014555605/28/15Io driver impedance calibration
382015014556305/28/15Differential line driver circuit and method therefor
392015014570605/28/15Pin entry device, a user identification terminal and a obtaining a pin code
402015014661205/28/15Method and system for processing data flows
412015014661305/28/15Method and resetting at least one node within a cpri radio base station system
422015014683505/28/15Calibration arrangement for frequency synthesizers
432015014944605/28/15Circuitry for a computing system and computing system
442015013950005/21/15Method and system for optimizing image processing in driver assistance systems
452015013784105/21/15Built-in self test system, system on a chip and controlling built-in self tests
462015013901105/21/15Method and detecting a set up signal used for data communication over a communication network
472015014330805/21/15Simulation testing a simulation of a device against one or more violation rules
482015013430505/14/15Static modelling of an electronic device
492015013514905/14/15Monitoring coverage for static modelling of an electronic device
502015012992805/14/15Packaged semiconductor device, a semiconductor device and a manufacturing a packaged semiconductor device
512015013293205/14/15Semiconductor device with selectively etched surface passivation
522015013489005/14/15Memory controller, computing device with a memory controller, and calibrating data transfer of a memory system
532015013515305/14/15Method of validating timing issues in gate-level simulation
542015013518105/14/15Information processing device and protecting data in a call stack
552015012316805/07/15Mishfet and schottky device integration
562015012322205/07/15Sensor protective coating
572015012323605/07/15Diodes with multiple junctions and fabrication methods therefor
582015012393805/07/15Electronic device for proximity detection, a light emitting diode for such electronic device, a control unit for such electronic device, an apparatus comprising such electronic device and an associated method
592015012451905/07/15Circuitry including resistive random access memory storage cells and methods for forming same
602015012800105/07/15Efficient testing digital shadow logic around non-logic design structures
612015011457204/30/15Devices and methods of operation for separating semiconductor die from adhesive tape
622015011526604/30/15Die crack detector with integrated one-time programmable element
632015011545104/30/15Method and high temperature semiconductor device packages and structures using a low temperature process
642015011593604/30/15Signal error compensation for a magnetometer in a sensor package
652015011603904/30/15Adaptive adjustment of power splitter
662015011744604/30/15Cut-through forwarding module and a receiving and transmitting data frames in a cut-through forwarding mode
672015011880204/30/15Dual corner top gate molding
682015012023404/30/15Smart handler resource distribution system
692015012132504/30/15Simulation testing a simulation of a device against one or more violation rules
702015010862504/23/15Semiconductor device with heat spreader
712015010893604/23/15Method and charging a bootstrap charge storage device
722015010905404/23/15Ready-flag circuitry for differential amplifiers
732015010933004/23/15Display controller with blending stage
742015011012604/23/15Cut through packet forwarding device
752015010238404/16/15Esd protection with asymmetrical bipolar-based device
762015010243704/16/15Mems sensor device with multi-stimulus sensing and fabrication
772015010283904/16/15Low power inverter circuit
782015010488604/16/15Semiconductor device arrangement, a analysing a performance of a functional circuit on a semiconductor device and a device analysis system
792015010641504/16/15True random number generator with repeatedly activated oscillator
802015010667104/16/15Memory device retention mode based on error information
812015009816004/09/15Protection circuit and a gate driving circuitry
822015009723804/09/15Mergeable semiconductor device with improved reliability
832015009726504/09/15Semiconductor device with buried conduction path
842015009727804/09/15Surface mount semiconductor device with additional bottom face contacts
852015009728004/09/15Heat conductive substrate for integrated circuit package
862015009755604/09/15Variable reluctance sensor interfaces and methods of their operation
872015009755704/09/15Variable reluctance sensor interfaces with signal pre-processing and methods of their operation
882015009762304/09/15Power amplifiers with signal conditioning
892015009854004/09/15Clock distribution module, synchronous digital system and method therefor
902015010079204/09/15Semiconductor device and a manufacturing a semiconductor device
912015009005204/02/15Pressure sensor having multiple pressure cells and sensitivity estimation methodology
922015009107904/02/15Non-volatile memory (nvm) and high-k and metal gate integration using gate-first methodology
932015009116004/02/153d device packaging using through-substrate posts
942015009117804/02/153d device packaging using through-substrate pillars
952015009118704/02/153d device packaging using through-substrate posts
962015009160704/02/15Sequential logic circuit and providing setup timing violation tolerance therefor
972015009162204/02/15System and enabling maximum performance operation within an extended ambient temperature range
982015009386404/02/15Non-volatile memory (nvm) and high-k and metal gate integration using gate-last methodology
992015009539304/02/15Method and device for generating floating-point values
1002015009552504/02/15Integrated circuit comprising an io buffer driver and method therefor
1012015008413803/26/15Integrated circuit having varying substrate depth and forming same
1022015008419903/26/15Copper ball bond features and structure
1032015008441703/26/15Electronic device and operating a power switch
1042015008465703/26/15Heating system and testing a semiconductor device using a heating system
1052015008468403/26/15Temperature dependent biasing for leakage power reduction
1062015008930503/26/15Interrupt supervision system, processing interrupt supervison
1072015007540103/19/15Squib driver diagnostic circuit and method
1082015007655603/19/15Integrated circuit device and a providing esd protection
1092015007716303/19/15Dynamic frequency divider circuit
1102015008200503/19/15Processing system and instruction set encoding space utilization
1112015008201703/19/15Electronic device having a pin for setting its mode of operation and method to set a mode of operation for an electronic device having a pin
1122015008228403/19/15Method and system for generating a memory trace of a program code executable on a programmable target
1132015006952403/12/15Method of forming different voltage devices with high-k metal gate
1142015006962403/12/15Recessed semiconductor die stack
1152015007431903/12/15Universal spi (serial peripheral interface)
1162015006175003/05/15Method and circuit for controlling turnoff of a semiconductor switching element
1172015005947303/05/15Multiple sense axis mems gyroscope having a single drive mode
1182015006104403/05/15Sequential wafer bonding
1192015006109703/05/15Edge coupling of semiconductor dies
1202015006110603/05/15Cavity-type semiconductor package and packaging same
1212015006157703/05/15Wireless power transmitters with wide input voltage range and methods of their operation
1222015006161203/05/15Switch mode power supply
1232015006163703/05/15Negative voltage measurement
1242015006172803/05/15Electronic device and maintaining functionality of an integrated circuit during electrical aggressions
1252015006178003/05/15Oscillator circuit, a semiconductor device and an apparatus
1262015006727903/05/15Data processing operating a data processing system
1272015006742803/05/15System-on-chip, manufacture thereof and communicating diagnostic data
1282015006742903/05/15Wafer-level gate stress testing
1292015006766203/05/15Computer system and a generating an optimized program code
1302015005404402/26/15Method to form a polysilicon nanocrystal thin film storage bitcell within a high k metal gate platform technology using a gate last process to form transistor gates
1312015005409602/26/15Reducing mems stiction by introduction of a carbon barrier
1322015005447702/26/15Power switch with current limitation and zero direct current (dc) power consumption
1332015005448702/26/15Reference voltage source and providing a curvature-compensated reference voltage
1342015005456202/26/15Level shifter with static precharge circuit
1352015004846202/19/15Sensor package and forming same
1362015004884802/19/15Test structure and methodology for estimating sensitivity of pressure sensors
1372015004940602/19/15Electrostatic discharge protection circuit arrangement, electronic circuit and esd protection method
1382015004192702/12/15Mems device with differential vertical sense electrodes
1392015004665802/12/15Cache organization and method
1402015004675302/12/15Embedded software debug system with partial hardware acceleration
1412015004689302/12/15Techniques for electromigration stress mitigation in interconnects of an integrated circuit design
1422015003515102/05/15Capping layer interface interruption for stress migration mitigation
1432015003560402/05/15Coupler with distributed feeding and compensation
1442015003795802/05/15Methods of making multi-state non-volatile memory cells
1452015004009202/05/15Stress migration mitigation
1462015002719801/29/15Mems parameter identification using modulated waveforms
1472015002776701/29/15System and lead frame package degating
1482015002894801/29/15Switch-mode amplifier
1492015002901301/29/15Method and system for facilitating viewing of information in a machine
1502015002137601/22/15Wire bonding capillary with working tip protrusion
1512015002174601/22/15Backscattering for localized annealing
1522015002453501/22/15Semiconductor sensor device with footed lid
1532015002641001/22/15Least recently used (lru) cache replacement implementation using a fifo
1542015002652301/22/15Debugging method and computer program product
1552015001524001/15/15Method of detecting irregular current flow in an integrated circuit device and apparatus therefor
1562015001105301/08/15Semiconductor device and assembling same
1572015000211601/01/15Dc to dc converter and method to operate a dc to dc converter
1582015000218301/01/15Semiconductor device comprising an output driver circuitry, a packaged semiconductor device and associated methods
1592015000221801/01/15Device and compensating for voltage drops
1602015000222601/01/15Semiconductor package having wire bond wall to reduce coupling
1612015000222901/01/15Semiconductor packages having wire bond wall to reduce coupling
1622015000474701/01/15Reram device structure
1632015000476801/01/15Drain-end drift diminution in semiconductor devices
1642015000682701/01/15Method for detecting bank collision at a memory and device therefor
1652015000686301/01/15Debug for providing indexed trace messages
1662015000686901/01/15Debug for handling exceptions and interrupts
1672014038025812/25/14Method and performing integrated circuit layout verification
1682014037484912/25/14Angular rate sensor with quadrature error compensation
1692014037485112/25/14Mems device and fabricating mems devices
1702014037534112/25/14Die fracture detection and humidity protection with double guard ring arrangement
1712014037631712/25/14Reducing the power consumption of memory devices
1722014037658612/25/14Multi-chip device with temperature control element for temperature calibration
1732014038001712/25/14Memory management and allocation using free-list
1742014036723912/18/14Capacitive keypad position sensor with low cross-interference
1752014036783012/18/14Esd protection device
1762014036785912/18/14Tin-based wirebond structures
1772014036901512/18/14Warp compensated electronic assemblies
1782014035240012/04/14Transducer-including devices, and methods and their calibration
1792014035383012/04/14Semiconductor devices with multilayer flex interconnect structures
1802014035436212/04/14Amplifier calibration
1812014035536712/04/14Multiple data rate memory with read timing information
1822014035702312/04/14Semiconductor device package with cap element
1832014034511711/27/14Semiconductor device with thermal dissipation lead frame
1842014035157011/27/14Programming interface and method
1852014035178111/27/14Method for placing operational cells in a semiconductor device
1862014033965611/20/14Mems pressure transducer assembly
1872014034121411/20/14Method and detecting one or more predetermined tones transmitted over a communication network
1882014034251811/20/14Power mosfet structure and method
1892014033290111/13/14Semiconductor device with notched gate
1902014033294111/13/14System, leadless surface mounted semiconductor package
1912014033332711/13/14On-die capacitance measurement module and measuring an on-die capacitive load
1922014033336711/13/14Metal-oxide-semiconductor (mos) voltage divider with dynamic impedance control
1932014033405311/13/14Over-current protection device
1942014033785911/13/14Processing load with normal or fast operation mode
1952014032934411/06/14Testing an electrical connection of a device cap
1962014031959710/30/14Methods and systems for gate dimension control in multi-gate structures for semiconductor devices
1972014032121210/30/14Non-volatile memory (nvm) with variable verify operations
1982014032305010/30/14System for monitoring and controlling the power of a radio frequency (rf) signal in a short-range rf transmitter
1992014032307410/30/14Power management for a battery-powered handheld audio device
2002014032518310/30/14Integrated circuit device, asymmetric multi-core processing module, electronic device and managing execution of computer program code therefor
2012014032546310/30/14Integrated circuit design verification through forced clock glitches
2022014031124310/23/14Estimation of sidewall skew angles of a structure
2032014031243510/23/14Mems device with stress isolation and fabrication
2042014031245710/23/14Integrated circuit chip with discontinuous guard ring
2052014031287510/23/14Startup circuits with native transistors
2062014031297510/23/14Amplifier using nonlinear drivers
2072014031297610/23/14Amplfiers and related integrated circuits
2082014031739510/23/14Microprocessor, and managing reset events therefor
2092014030674510/16/14Flip-flop having shared feedback and operation
2102014030877910/16/14Integrated circuit package with voltage distributor
2112014030264110/09/14Stiffened semiconductor die package
2122014029993510/09/14Shallow trench isolation for soi structures combining sidewall spacer and bottom liner
2132014030019310/09/14Power safety circuit, integrated circuit device and safety critical system
2142014030061510/09/14Memory access controller, data processing system, and managing data flow between a memory unit and a processing unit
2152014030380410/09/14Method of controlling a thermal budget of an integrated circuit device, an integrated circuit, a thermal control module and an electronic device therefor
2162014029225210/02/14Circuit and speed monitoring of an electric motor
2172014029563910/02/14Field focusing features in a reram cell
2182014029800510/02/14Microprocessor device, and managing reset events therefor
2192014029811110/02/14Controller, sata system and operation therefor
2202014028471609/25/14Ldmos device with minority carrier shunt region
2212014028517509/25/14Reference voltage generating circuit, integrated circuit and voltage or current sensing device
2222014028523909/25/14Power monitoring circuitry
2232014028754709/25/14Inhibiting propagation of surface cracks in a mems device
2242014028755409/25/14Method for plating a semiconductor package lead
2252014028935709/25/14Data processing system and controlling access to a shared memory unit
2262014026638509/18/14Dual supply level shifter circuits
2272014028129109/18/14Method and memory array access
2282014028260309/18/14Method and detecting a collision between multiple threads of execution for accessing a memory array
2292014026050809/18/14Compensation and calibration for mems devices
2302014026060809/18/14Angular rate sensor having multiple axis sensing capability
2312014026061009/18/14Multiple axis rate sensor
2322014026061609/18/14Mems device having variable gap width and manufacture
2332014026472409/18/14Deep trench isolation
2342014026472809/18/14Active tiling placement for improved latch-up immunity
2352014026624609/18/14Mcu-based compensation and calibration for mems devices
2362014026636609/18/14Compensated hysteresis circuit
2372014026647409/18/14System and improved mems oscillator startup
2382014026900809/18/14Non-volatile memory using bi-directional resistive elements
2392014027335209/18/14Semiconductor device
2402014027339109/18/14Inductive element with interrupter region and forming
2412014027794909/18/14Airbag apparatus
2422014028139009/18/14System and ordering packet transfers in a data processor
2432014028234009/18/14Method for provisioning decoupling capacitance in an integrated circuit
2442014025097009/11/14System and monitoring a gyroscope
2452014025097109/11/14System and monitoring an accelerometer
2462014025100909/11/14System and reducing offset variation in multifunction sensor devices
2472014025246709/11/14Laterally diffused metal oxide semiconductor transistors for radio frequency power amplifiers
2482014025247009/11/14Semiconductor device with integrated electrostatic discharge (esd) clamp
2492014025247209/11/14Semiconductor device with increased safe operating area



ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009



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