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Freescale Semiconductor Inc
Freescale Semiconductor Inc A Corporation
Freescale Semiconductor Inc formerly Known As Sigmatel Inc
Freescale Semiconductor Inc Austin Texas
Freescale Semiconductor Inc_20100107
Freescale Semiconductor Inc_20100114
Freescale Semiconductor Inc_20131212
Freescale Semiconductor Inc_20100128
Freescale Semiconductor Inc_20100121


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Freescale Semiconductor, Inc. patents

Recent patent applications related to Freescale Semiconductor, Inc.. Freescale Semiconductor, Inc. is listed as an Agent/Assignee. Note: Freescale Semiconductor, Inc. may have other listings under different names/spellings. We're not affiliated with Freescale Semiconductor, Inc., we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "F" | Freescale Semiconductor, Inc.-related inventors

Power switch with current limitation and zero direct current (dc) power consumption

Freescale Semiconductor

Power switch with current limitation and zero direct current (dc) power consumption

Search recent Press Releases: Freescale Semiconductor, Inc.-related press releases
Count Application # Date Freescale Semiconductor, Inc. patents (updated weekly) - BOOKMARK this page
12015005404402/26/15Method to form a polysilicon nanocrystal thin film storage bitcell within a high k metal gate platform technology using a gate last process to form transistor gates
22015005409602/26/15Reducing mems stiction by introduction of a carbon barrier
32015005447702/26/15Power switch with current limitation and zero direct current (dc) power consumption
42015005448702/26/15Reference voltage source and providing a curvature-compensated reference voltage
52015005456202/26/15Level shifter with static precharge circuit
62015004846202/19/15Sensor package and forming same
72015004884802/19/15Test structure and methodology for estimating sensitivity of pressure sensors
82015004940602/19/15Electrostatic discharge protection circuit arrangement, electronic circuit and esd protection method
92015004192702/12/15Mems device with differential vertical sense electrodes
102015004665802/12/15Cache organization and method
112015004675302/12/15Embedded software debug system with partial hardware acceleration
122015004689302/12/15Techniques for electromigration stress mitigation in interconnects of an integrated circuit design
132015003515102/05/15Capping layer interface interruption for stress migration mitigation
142015003560402/05/15Coupler with distributed feeding and compensation
152015003795802/05/15Methods of making multi-state non-volatile memory cells
162015004009202/05/15Stress migration mitigation
172015002719801/29/15Mems parameter identification using modulated waveforms
182015002776701/29/15System and lead frame package degating
192015002894801/29/15Switch-mode amplifier
202015002901301/29/15Method and system for facilitating viewing of information in a machine
212015002137601/22/15Wire bonding capillary with working tip protrusion
222015002174601/22/15Backscattering for localized annealing
232015002453501/22/15Semiconductor sensor device with footed lid
242015002641001/22/15Least recently used (lru) cache replacement implementation using a fifo
252015002652301/22/15Debugging method and computer program product
262015001524001/15/15Method of detecting irregular current flow in an integrated circuit device and apparatus therefor
272015001105301/08/15Semiconductor device and assembling same
282015000211601/01/15Dc to dc converter and method to operate a dc to dc converter
292015000218301/01/15Semiconductor device comprising an output driver circuitry, a packaged semiconductor device and associated methods
302015000221801/01/15Device and compensating for voltage drops
312015000222601/01/15Semiconductor package having wire bond wall to reduce coupling
322015000222901/01/15Semiconductor packages having wire bond wall to reduce coupling
332015000474701/01/15Reram device structure
342015000476801/01/15Drain-end drift diminution in semiconductor devices
352015000682701/01/15Method for detecting bank collision at a memory and device therefor
362015000686301/01/15Debug for providing indexed trace messages
372015000686901/01/15Debug for handling exceptions and interrupts
382014038025812/25/14Method and performing integrated circuit layout verification
392014037484912/25/14Angular rate sensor with quadrature error compensation
402014037485112/25/14Mems device and fabricating mems devices
412014037534112/25/14Die fracture detection and humidity protection with double guard ring arrangement
422014037631712/25/14Reducing the power consumption of memory devices
432014037658612/25/14Multi-chip device with temperature control element for temperature calibration
442014038001712/25/14Memory management and allocation using free-list
452014036723912/18/14Capacitive keypad position sensor with low cross-interference
462014036783012/18/14Esd protection device
472014036785912/18/14Tin-based wirebond structures
482014036901512/18/14Warp compensated electronic assemblies
492014035240012/04/14Transducer-including devices, and methods and their calibration
502014035383012/04/14Semiconductor devices with multilayer flex interconnect structures
512014035436212/04/14Amplifier calibration
522014035536712/04/14Multiple data rate memory with read timing information
532014035702312/04/14Semiconductor device package with cap element
542014034511711/27/14Semiconductor device with thermal dissipation lead frame
552014035157011/27/14Programming interface and method
562014035178111/27/14Method for placing operational cells in a semiconductor device
572014033965611/20/14Mems pressure transducer assembly
582014034121411/20/14Method and detecting one or more predetermined tones transmitted over a communication network
592014034251811/20/14Power mosfet structure and method
602014033290111/13/14Semiconductor device with notched gate
612014033294111/13/14System, leadless surface mounted semiconductor package
622014033332711/13/14On-die capacitance measurement module and measuring an on-die capacitive load
632014033336711/13/14Metal-oxide-semiconductor (mos) voltage divider with dynamic impedance control
642014033405311/13/14Over-current protection device
652014033785911/13/14Processing load with normal or fast operation mode
662014032934411/06/14Testing an electrical connection of a device cap
672014031959710/30/14Methods and systems for gate dimension control in multi-gate structures for semiconductor devices
682014032121210/30/14Non-volatile memory (nvm) with variable verify operations
692014032305010/30/14System for monitoring and controlling the power of a radio frequency (rf) signal in a short-range rf transmitter
702014032307410/30/14Power management for a battery-powered handheld audio device
712014032518310/30/14Integrated circuit device, asymmetric multi-core processing module, electronic device and managing execution of computer program code therefor
722014032546310/30/14Integrated circuit design verification through forced clock glitches
732014031124310/23/14Estimation of sidewall skew angles of a structure
742014031243510/23/14Mems device with stress isolation and fabrication
752014031245710/23/14Integrated circuit chip with discontinuous guard ring
762014031287510/23/14Startup circuits with native transistors
772014031297510/23/14Amplifier using nonlinear drivers
782014031297610/23/14Amplfiers and related integrated circuits
792014031739510/23/14Microprocessor, and managing reset events therefor
802014030674510/16/14Flip-flop having shared feedback and operation
812014030877910/16/14Integrated circuit package with voltage distributor
822014030264110/09/14Stiffened semiconductor die package
832014029993510/09/14Shallow trench isolation for soi structures combining sidewall spacer and bottom liner
842014030019310/09/14Power safety circuit, integrated circuit device and safety critical system
852014030061510/09/14Memory access controller, data processing system, and managing data flow between a memory unit and a processing unit
862014030380410/09/14Method of controlling a thermal budget of an integrated circuit device, an integrated circuit, a thermal control module and an electronic device therefor
872014029225210/02/14Circuit and speed monitoring of an electric motor
882014029563910/02/14Field focusing features in a reram cell
892014029800510/02/14Microprocessor device, and managing reset events therefor
902014029811110/02/14Controller, sata system and operation therefor
912014028471609/25/14Ldmos device with minority carrier shunt region
922014028517509/25/14Reference voltage generating circuit, integrated circuit and voltage or current sensing device
932014028523909/25/14Power monitoring circuitry
942014028754709/25/14Inhibiting propagation of surface cracks in a mems device
952014028755409/25/14Method for plating a semiconductor package lead
962014028935709/25/14Data processing system and controlling access to a shared memory unit
972014026638509/18/14Dual supply level shifter circuits
982014028129109/18/14Method and memory array access
992014028260309/18/14Method and detecting a collision between multiple threads of execution for accessing a memory array
1002014026050809/18/14Compensation and calibration for mems devices
1012014026060809/18/14Angular rate sensor having multiple axis sensing capability
1022014026061009/18/14Multiple axis rate sensor
1032014026061609/18/14Mems device having variable gap width and manufacture
1042014026472409/18/14Deep trench isolation
1052014026472809/18/14Active tiling placement for improved latch-up immunity
1062014026624609/18/14Mcu-based compensation and calibration for mems devices
1072014026636609/18/14Compensated hysteresis circuit
1082014026647409/18/14System and improved mems oscillator startup
1092014026900809/18/14Non-volatile memory using bi-directional resistive elements
1102014027335209/18/14Semiconductor device
1112014027339109/18/14Inductive element with interrupter region and forming
1122014027794909/18/14Airbag apparatus
1132014028139009/18/14System and ordering packet transfers in a data processor
1142014028234009/18/14Method for provisioning decoupling capacitance in an integrated circuit
1152014025097009/11/14System and monitoring a gyroscope
1162014025097109/11/14System and monitoring an accelerometer
1172014025100909/11/14System and reducing offset variation in multifunction sensor devices
1182014025246709/11/14Laterally diffused metal oxide semiconductor transistors for radio frequency power amplifiers
1192014025247009/11/14Semiconductor device with integrated electrostatic discharge (esd) clamp
1202014025247209/11/14Semiconductor device with increased safe operating area
1212014025248709/11/14Gate security feature
1222014025257009/11/14Lead-frame circuit package
1232014025258609/11/14Semiconductor devices that include a die bonded to a substrate with a gold interface layer
1242014025320409/11/14Clock signal generator module, integrated circuit, electronic device and method therefor
1252014025324809/11/14Phase shift and attenuation circuits for use with multiple-path amplifiers
1262014025325809/11/14System for reducing electromagnetic induction interference
1272014025463609/11/14System and demodulating an incoming signal
1282014025463709/11/14Direct sequence spread spectrum signal receiving device and method
1292014025609109/11/14Methods for bonding a die and a substrate
1302014025858209/11/14Semiconductor device with vias on a bridge connecting two buses
1312014025879809/11/14Test control point insertion and x-bounding for logic built-in self-test (lbist) using observation circuitry
1322014024708009/04/14Multi-level clock signal distribution network and integrated circuit
1332014024708109/04/14Combinatorial circuit and operation of such a combinatorial circuit
1342014023848308/28/14Three-dimensional solar cell having increased efficiency
1352014023934608/28/14Mishfet and schottky device integration
1362014023992708/28/14Transition control for a hybrid switched-mode power supply (smps)
1372014024276208/28/14Tunable schottky diode with depleted conduction path
1382014024489508/28/14Robust sector id scheme for tracking dead sectors to automate search and copydown
1392014023054908/21/14Spring system for mems device
1402014023201708/21/14Identification mechanism for semiconductor device die
1412014023234408/21/14Circuit and voltage equalization in large batteries
1422014023234708/21/14Circuit and battery equalization
1432014023257908/21/14Low power quantizer for analog to digital converter
1442014023258908/21/14Receiver circuit, phased-array receiver and radar system
1452014023337208/21/14Real-time distributed network module, real-time distributed network and method therefor
1462014022515608/14/14Esd protection with integrated ldmos triggering junction
1472014022517608/14/14Embedded nvm in a hkmg process
1482014022645908/14/14Real-time distributed network slave device, real-time distributed network and method therefor
1492014022073808/07/14Lead frame array package with flip chip die attach
1502014022091708/07/14Multimode rake receiver, cellular base station and cellular communication device
1512014022312808/07/14Memory device and organizing a homogeneous memory
1522014020998807/31/14Nonvolatile memory bitcell
1532014021001607/31/14Implant for performance enhancement of selected transistors in an integrated circuit
1542014021056507/31/14Amplitude loop control for oscillators
1552014021305007/31/14Method of making a die with recessed aluminum die pads
1562014020335807/24/14Semiconductor device with enhanced 3d resurf
1572014020341007/24/14Die edge sealing structures and related fabrication methods
1582014020385707/24/14Variable delay and setup time flip-flop
1592014020410307/24/14Data processing task scheduling in a data processing system
1602014020509207/24/14Secure provisioning in an untrusted environment
1612014020612407/24/14Pressure sensor and packaging same
1622014020797907/24/14Dma-assisted irregular sampling sequences
1632014019754107/17/14Microelectronic assembly having a heat spreader for a plurality of die
1642014019780707/17/14Reducing output voltage ripple of power supplies
1652014019797307/17/14Digital to analog converter with current steering source for reduced glitch energy error
1662014020147907/17/14Integrated circuit device, memory interface module, data processing providing data access control
1672014020159707/17/14Error correction with extended cam
1682014019137707/10/14Integrated circuit package
1692014019138307/10/14Power device and packaging same
1702014018372907/03/14Sensor packages having semiconductor dies of differing sizes
1712014018701207/03/14Customized shield plate for a field effect transistor
1722014018701407/03/14Methods for forming bipolar transistors
1732014018946207/03/14Error correcting device, monitoring an error correcting device and data processing system
1742014017622006/26/14Integrated circuit device, voltage regulator module and compensating a voltage signal
1752014016949506/19/14Signalling circuit, processing device and safety critical system
1762014016710206/19/14Semiconductor device with single-event latch-up prevention circuitry
1772014016785506/19/14Rf power transistor circuits
1782014016786306/19/14Rf power transistor circuits
1792014017324706/19/14Processing apparatus and synchronizing a first processing unit and a second processing unit
1802014017335306/19/14Integrated circuit device and identifying a presence of a broken connection within an external signal path
1812014016086206/12/14Reducing the power consumption of memory devices
1822014016086906/12/14Built-in self trim for non-volatile memory reference current
1832014016477906/12/14Secure provisioning in an untrusted environment
1842014015724006/05/14Method and enabling an executed control flow path through computer program code to be determined
1852014015248106/05/14Integrated circuit device and dynamically modifying at least one characteristic within a digital to analogue converter module
1862014015359006/05/14Method and transmitting data
1872014015502706/05/14Electronic device and a computer program product
1882014014423105/29/14Inertial sensor and levitation effect compensation
1892014014533905/29/14Encapsulant for a semiconductor device
1902014014534005/29/14Flip chip interconnection structure
1912014014576505/29/14Voltage ramp-up protection
1922014014798505/29/14Methods for the fabrication of semiconductor devices including sub-isolation buried layers
1932014013920105/22/14Low-power voltage tamper detection
1942014013178805/15/14Semiconductor devices with non-volatile memory cells
1952014013229305/15/14Integrated circuit with degradation monitoring
1962014013355205/15/14Method and encoding an image
1972014013479905/15/14Wettable lead ends on a flat-pack no-lead microelectronic package
1982014012495805/08/14Sensor packaging method and sensor packages
1992014012540905/08/14Amplifier calibration
2002014012609105/08/14Protection device and related fabrication methods
2012014012988305/08/14Hardware-based memory initialization
2022014011746805/01/14Methods and integrated circuit package for sensing fluid properties
2032014011752105/01/14Semiconductor device with thermal dissipation lead frame
2042014011795305/01/14Method and a tunable driver circuit
2052014011887405/01/14Gate driver with desaturation detection and active clamping
2062014011913105/01/14Memory device redundancy management system
2072014011940505/01/14Production-test die temperature measurement
2082014012201005/01/14Lcd driver verification system
2092014012273505/01/14System and assigning a message
2102014012277505/01/14Memory controller for memory device
2112014011081504/24/14High voltage diode
2122014011127804/24/14Dynamically biased output structure
2132014011246404/24/14Conference call system, method, and computer program product
2142014011528004/24/14Flexible control mechanism for store gathering in a write buffer
2152014011535804/24/14Integrated circuit device and controlling an operating mode of an on-die memory
2162014011554904/24/14Method for verifying digital to analog converter design
2172014010343104/17/14Laterally double diffused metal oxide semiconductor transistors having a reduced surface field structures
2182014010510104/17/14Method and system for low power transmission and data alignment
2192014010518504/17/14Timing event generation circuit for mobile communication device
2202014010887604/17/14Processor switchable between test and debug modes
2212014009788404/10/14Integrated circuit device and implementing power gating within an integrated circuit device
2222014009861504/10/14Latent slow bit detection for non-volatile memory
2232014009882404/10/14Integrated circuit device and performing cut-through forwarding of packet data
2242014010138704/10/14Opportunistic cache replacement policy
2252014009138004/03/14Split gate flash cell
2262014009171104/03/14Circuit arrangement, lighting apparatus and crosstalk-compensated current sensing
2272014009250004/03/14Ground loss monitoring circuit and integrated circuit comprising the same
2282014009415704/03/14Method and system for automatically controlling the insertion of control word in cpri daisy chain configuration
2292014009557204/03/14Multiply and accumulate feedback
2302014008575803/27/14Integrated circuit device and enabling thermal regulation within an integrated circuit device
2312014008443203/27/14Method and multi-chip structure semiconductor package
2322014008494003/27/14Apparatus and a detecting faults in the delivery of electrical power to electrical loads
2332014008627703/27/14Thermal sensor system and method based on current ratio
2342014008627903/27/14Thermal sensor system and method based on current ratio
2352014008630903/27/14Method and device for encoding and decoding an image
2362014008755003/27/14Method for forming patterned doping regions
2372014007759803/20/14Voltage regulating circuit and method
2382014007787403/20/14Adjustable power splitters and corresponding methods & apparatus
2392014007907803/20/14Multiplexing and demultiplexing data
2402014007031103/13/14Semiconductor device and related fabrication methods
2412014007031203/13/14Semiconductor device and related fabrication methods
2422014007031303/13/14Power mosfet current sense structure and method
2432014007041503/13/14Microelectronic packages having trench vias and methods for the manufacture thereof
2442014007041603/13/14Guard ring structure and forming the same
2452014007088103/13/14Quiescent current determination using in-package voltage measurements
2462014007165203/13/14Techniques for reducing inductance in through-die vias of an electronic assembly
2472014007441803/13/14Method and system for calibrating an inertial sensor
2482014006171503/06/14Zener diode device and fabrication
2492014006171603/06/14Esd protection device

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Freescale Semiconductor, Inc. in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Freescale Semiconductor, Inc. with additional patents listed. Browse our Agent directory for other possible listings. Page by