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Freescale Semiconductor, Inc. patents


      
Recent patent applications related to Freescale Semiconductor, Inc.. Freescale Semiconductor, Inc. is listed as an Agent/Assignee. Note: Freescale Semiconductor, Inc. may have other listings under different names/spellings. We're not affiliated with Freescale Semiconductor, Inc., we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "F" | Freescale Semiconductor, Inc.-related inventors



Freescale Semiconductor

Pressure sensor and method of packaging same

Freescale Semiconductor

Secure provisioning in an untrusted environment

Search recent Press Releases: Freescale Semiconductor, Inc.-related press releases
Count Application # Date Freescale Semiconductor, Inc. patents (updated weekly) - BOOKMARK this page
12014020335807/24/14 new patent  Semiconductor device with enhanced 3d resurf
22014020341007/24/14 new patent  Die edge sealing structures and related fabrication methods
32014020385707/24/14 new patent  Variable delay and setup time flip-flop
42014020410307/24/14 new patent  Data processing system and method for task scheduling in a data processing system
52014020509207/24/14 new patent  Secure provisioning in an untrusted environment
62014020612407/24/14 new patent  Pressure sensor and method of packaging same
72014020797907/24/14 new patent  Dma-assisted irregular sampling sequences
82014019754107/17/14Microelectronic assembly having a heat spreader for a plurality of die
92014019780707/17/14Reducing output voltage ripple of power supplies
102014019797307/17/14Digital to analog converter with current steering source for reduced glitch energy error
112014020147907/17/14Integrated circuit device, memory interface module, data processing system and method for providing data access control
122014020159707/17/14Error correction with extended cam
132014019137707/10/14Integrated circuit package
142014019138307/10/14Power device and method of packaging same
152014018372907/03/14Sensor packages having semiconductor dies of differing sizes
162014018701207/03/14Customized shield plate for a field effect transistor
172014018701407/03/14Methods for forming bipolar transistors
182014018946207/03/14Error correcting device, method for monitoring an error correcting device and data processing system
192014017622006/26/14Integrated circuit device, voltage regulator module and method for compensating a voltage signal
202014016949506/19/14Signalling circuit, processing device and safety critical system
212014016710206/19/14Semiconductor device with single-event latch-up prevention circuitry
222014016785506/19/14Rf power transistor circuits
232014016786306/19/14Rf power transistor circuits
242014017324706/19/14Processing apparatus and method of synchronizing a first processing unit and a second processing unit
252014017335306/19/14Integrated circuit device and method of identifying a presence of a broken connection within an external signal path
262014016086206/12/14Reducing the power consumption of memory devices
272014016086906/12/14Built-in self trim for non-volatile memory reference current
282014016477906/12/14Secure provisioning in an untrusted environment
292014015724006/05/14Method and apparatus for enabling an executed control flow path through computer program code to be determined
302014015248106/05/14Integrated circuit device and method of dynamically modifying at least one characteristic within a digital to analogue converter module
312014015359006/05/14Method and apparatus for transmitting data
322014015502706/05/14Electronic device and a computer program product
332014014423105/29/14Inertial sensor and method of levitation effect compensation
342014014533905/29/14Encapsulant for a semiconductor device
352014014534005/29/14Flip chip interconnection structure
362014014576505/29/14Voltage ramp-up protection
372014014798505/29/14Methods for the fabrication of semiconductor devices including sub-isolation buried layers
382014013920105/22/14Low-power voltage tamper detection
392014013920105/22/14Low-power voltage tamper detection
402014013178805/15/14Semiconductor devices with non-volatile memory cells
412014013229305/15/14Integrated circuit with degradation monitoring
422014013355205/15/14Method and apparatus for encoding an image
432014013479905/15/14Wettable lead ends on a flat-pack no-lead microelectronic package
442014013178805/15/14Semiconductor devices with non-volatile memory cells
452014013229305/15/14Integrated circuit with degradation monitoring
462014013355205/15/14Method and apparatus for encoding an image
472014013479905/15/14Wettable lead ends on a flat-pack no-lead microelectronic package
482014012495805/08/14Sensor packaging method and sensor packages
492014012540905/08/14Amplifier calibration
502014012609105/08/14Protection device and related fabrication methods
512014012988305/08/14Hardware-based memory initialization
522014012495805/08/14Sensor packaging method and sensor packages
532014012540905/08/14Amplifier calibration
542014012609105/08/14Protection device and related fabrication methods
552014012988305/08/14Hardware-based memory initialization
562014011746805/01/14Methods and integrated circuit package for sensing fluid properties
572014011752105/01/14Semiconductor device with thermal dissipation lead frame
582014011795305/01/14Method and apparatus for a tunable driver circuit
592014011887405/01/14Gate driver with desaturation detection and active clamping
602014011913105/01/14Memory device redundancy management system
612014011940505/01/14Production-test die temperature measurement
622014012201005/01/14Lcd driver verification system
632014012273505/01/14System and method for assigning a message
642014012277505/01/14Memory controller for memory device
652014011746805/01/14Methods and integrated circuit package for sensing fluid properties
662014011752105/01/14Semiconductor device with thermal dissipation lead frame
672014011795305/01/14Method and apparatus for a tunable driver circuit
682014011887405/01/14Gate driver with desaturation detection and active clamping
692014011913105/01/14Memory device redundancy management system
702014011940505/01/14Production-test die temperature measurement
712014012201005/01/14Lcd driver verification system
722014012273505/01/14System and method for assigning a message
732014012277505/01/14Memory controller for memory device
742014011081504/24/14High voltage diode
752014011127804/24/14Dynamically biased output structure
762014011246404/24/14Conference call system, method, and computer program product
772014011528004/24/14Flexible control mechanism for store gathering in a write buffer
782014011535804/24/14Integrated circuit device and method for controlling an operating mode of an on-die memory
792014011554904/24/14Method for verifying digital to analog converter design
802014011081504/24/14High voltage diode
812014011127804/24/14Dynamically biased output structure
822014011246404/24/14Conference call system, method, and computer program product
832014011528004/24/14Flexible control mechanism for store gathering in a write buffer
842014011535804/24/14Integrated circuit device and method for controlling an operating mode of an on-die memory
852014011554904/24/14Method for verifying digital to analog converter design
862014010343104/17/14Laterally double diffused metal oxide semiconductor transistors having a reduced surface field structures
872014010510104/17/14Method and system for low power transmission and data alignment
882014010518504/17/14Timing event generation circuit for mobile communication device
892014010887604/17/14Processor switchable between test and debug modes
902014010343104/17/14Laterally double diffused metal oxide semiconductor transistors having a reduced surface field structures
912014010510104/17/14Method and system for low power transmission and data alignment
922014010518504/17/14Timing event generation circuit for mobile communication device
932014010887604/17/14Processor switchable between test and debug modes
942014009788404/10/14Integrated circuit device and method of implementing power gating within an integrated circuit device
952014009861504/10/14Latent slow bit detection for non-volatile memory
962014009882404/10/14Integrated circuit device and method of performing cut-through forwarding of packet data
972014010138704/10/14Opportunistic cache replacement policy
982014009788404/10/14Integrated circuit device and method of implementing power gating within an integrated circuit device
992014009861504/10/14Latent slow bit detection for non-volatile memory
1002014009882404/10/14Integrated circuit device and method of performing cut-through forwarding of packet data
1012014010138704/10/14Opportunistic cache replacement policy
1022014009788404/10/14Integrated circuit device and method of implementing power gating within an integrated circuit device
1032014009861504/10/14Latent slow bit detection for non-volatile memory
1042014009882404/10/14Integrated circuit device and method of performing cut-through forwarding of packet data
1052014010138704/10/14Opportunistic cache replacement policy
1062014009138004/03/14Split gate flash cell
1072014009171104/03/14Circuit arrangement, lighting apparatus and method of crosstalk-compensated current sensing
1082014009250004/03/14Ground loss monitoring circuit and integrated circuit comprising the same
1092014009415704/03/14Method and system for automatically controlling the insertion of control word in cpri daisy chain configuration
1102014009557204/03/14Multiply and accumulate feedback
1112014009138004/03/14Split gate flash cell
1122014009171104/03/14Circuit arrangement, lighting apparatus and method of crosstalk-compensated current sensing
1132014009250004/03/14Ground loss monitoring circuit and integrated circuit comprising the same
1142014009415704/03/14Method and system for automatically controlling the insertion of control word in cpri daisy chain configuration
1152014009557204/03/14Multiply and accumulate feedback
1162014008575803/27/14Integrated circuit device and method of enabling thermal regulation within an integrated circuit device
1172014008443203/27/14Method and apparatus for multi-chip structure semiconductor package
1182014008494003/27/14Apparatus and a method for detecting faults in the delivery of electrical power to electrical loads
1192014008627703/27/14Thermal sensor system and method based on current ratio
1202014008627903/27/14Thermal sensor system and method based on current ratio
1212014008630903/27/14Method and device for encoding and decoding an image
1222014008755003/27/14Method for forming patterned doping regions
1232014008575803/27/14Integrated circuit device and method of enabling thermal regulation within an integrated circuit device
1242014008443203/27/14Method and apparatus for multi-chip structure semiconductor package
1252014008494003/27/14Apparatus and a method for detecting faults in the delivery of electrical power to electrical loads
1262014008627703/27/14Thermal sensor system and method based on current ratio
1272014008627903/27/14Thermal sensor system and method based on current ratio
1282014008630903/27/14Method and device for encoding and decoding an image
1292014008755003/27/14Method for forming patterned doping regions
1302014007759803/20/14Voltage regulating circuit and method
1312014007787403/20/14Adjustable power splitters and corresponding methods & apparatus
1322014007907803/20/14Multiplexing and demultiplexing data
1332014007759803/20/14Voltage regulating circuit and method
1342014007787403/20/14Adjustable power splitters and corresponding methods & apparatus
1352014007907803/20/14Multiplexing and demultiplexing data
1362014007031103/13/14Semiconductor device and related fabrication methods
1372014007031203/13/14Semiconductor device and related fabrication methods
1382014007031303/13/14Power mosfet current sense structure and method
1392014007041503/13/14Microelectronic packages having trench vias and methods for the manufacture thereof
1402014007041603/13/14Guard ring structure and method for forming the same
1412014007088103/13/14Quiescent current determination using in-package voltage measurements
1422014007165203/13/14Techniques for reducing inductance in through-die vias of an electronic assembly
1432014007441803/13/14Method and system for calibrating an inertial sensor
1442014007031103/13/14Semiconductor device and related fabrication methods
1452014007031203/13/14Semiconductor device and related fabrication methods
1462014007031303/13/14Power mosfet current sense structure and method
1472014007041503/13/14Microelectronic packages having trench vias and methods for the manufacture thereof
1482014007041603/13/14Guard ring structure and method for forming the same
1492014007088103/13/14Quiescent current determination using in-package voltage measurements
1502014007165203/13/14Techniques for reducing inductance in through-die vias of an electronic assembly
1512014007441803/13/14Method and system for calibrating an inertial sensor
1522014006171503/06/14Zener diode device and fabrication
1532014006171603/06/14Esd protection device
1542014006173103/06/14Tunable schottky diode
1552014006185803/06/14Semiconductor device with diagonal conduction path
1562014006194803/06/14Sensor packaging method and sensor packages
1572014006256003/06/14Reconfigurable flip-flop
1582014006374203/06/14Thermally enhanced electronic component packages with through mold vias
1592014006834403/06/14Method and apparatus for filtering trace information
1602014006834503/06/14Method and apparatus for filtering trace information
1612014006834603/06/14Data processor device for handling a watchpoint and method thereof
1622014006834903/06/14Data processor device for handling a watchpoint and method thereof
1632014006171503/06/14Zener diode device and fabrication
1642014006171603/06/14Esd protection device
1652014006173103/06/14Tunable schottky diode
1662014006185803/06/14Semiconductor device with diagonal conduction path
1672014006194803/06/14Sensor packaging method and sensor packages
1682014006256003/06/14Reconfigurable flip-flop
1692014006374203/06/14Thermally enhanced electronic component packages with through mold vias
1702014006834403/06/14Method and apparatus for filtering trace information
1712014006834503/06/14Method and apparatus for filtering trace information
1722014006834603/06/14Data processor device for handling a watchpoint and method thereof
1732014006834903/06/14Data processor device for handling a watchpoint and method thereof
1742014005469402/27/14Semiconductor device with hci protection region
1752014005470402/27/14Semiconductor device including an active region and two layers having different stress characteristics
1762014005474702/27/14Bipolar transistor
1772014005478302/27/14Stacked microelectronic packages having sidewall conductors and methods for the fabrication thereof
1782014005479602/27/14Stacked microelectronic packages having patterened sidewall conductors and methods for the fabrication thereof
1792014005479702/27/14Stacked microelectronic packages having sidewall conductors and methods for the fabrication thereof
1802014005479802/27/14Sensor packages and method of packaging dies of differing sizes
1812014004894602/20/14Sensor packages and method of packaging dies of various sizes
1822014005300302/20/14Random timeslot controller for enabling built-in self test module
1832014004303402/13/14Method and device for diagnosing a reservoir capacitor of a vehicle passenger protection system, and vechicle safety system incorporating such device
1842014004421502/13/14Block-based crest factor reduction
1852014003561002/06/14System and method to test a semiconductor power switch
1862014003660202/06/14Memory device
1872014003556002/06/14Method and apparatus for limiting access to an integrated circuit (ic)
1882014003556102/06/14Variable reluctance sensor interface with integration based arming threshold
1892014003563802/06/14System and method for clock signal generation
1902014003986402/06/14Method, computer program product, and apparatus for simulating electromagnetic immunity of an electronic device
1912014004059502/06/14Space efficient checkpoint facility and technique for processor with integrally indexed register mapping and free-list arrays
1922014004085802/06/14Method and apparatus for generating resource efficient computer program code
1932014002840801/30/14Comparator and relaxation oscillator employing same
1942014002962501/30/14Integrated circuit device and methods for performing cut-through forwarding
1952014002781001/30/14Single-event latch-up prevention techniques for a semiconductor device
1962014002781701/30/14Hybrid transistor
1972014002784901/30/14Ldmos device and method for improved soa
1982014002934801/30/14Dynamic programming for flash memory
1992014003213901/30/14Electronic device and method
2002014003280301/30/14Prediction of electronic component behavior in bus-based systems
2012014002155701/23/14Apparatus for forward well bias in a semiconductor integrated circuit
2022014002162101/23/14Packaged semiconductor die with power rail pads
2032014002200501/23/14Configurable multistage charge pump using a supply detect scheme
2042014002202201/23/14Error detection at an oscillator
2052014002593101/23/14Method and apparatus for controlling fetch-ahead in a vles processor architecture
2062014002596701/23/14Techniques for reducing processor power consumption through dynamic processor resource allocation
2072014001550901/16/14Bandgap reference circuit and regulator circuit with common amplifier
2082014001974101/16/14Method and system for booting electronic device from nand flash memory
2092014001509001/16/14Bipolar transistor with high breakdown voltage
2102014001512301/16/14Sensor package and method of forming same
2112014001980601/16/14Classifying processor testcases
2122014001999001/16/14Integrated circuit device and method for enabling cross-context access
2132014001308701/09/14Processor system with predicate register, computer system, method for managing predicates and computer program product
2142014001329401/09/14Method for ranking paths for power optimization of an integrated circuit design and corresponding computer program product
2152014000768101/09/14Angular rate sensor with quadrature error compensation
2162014000873901/09/14Semiconductor device and method of fabricating same
2172014000881101/09/14Device package with rigid interconnect structure connecting die and substrate and method thereof
2182014001134401/09/14Methods of forming electronic elements with esd protection
2192014001308801/09/14Integrated circuit device and methods of performing bit manipulation therefor
2202014000229101/02/14Analog to digital conversion architecture and method with input and reference voltage scaling
2212014000143201/02/14Applications for nanopillar structures
2222014000154501/02/14High breakdown voltage ldmos device
2232014000154801/02/14Semiconductor device and driver circuit with an active device and isolation structure interconnected through a diode circuit, and method of manufacture thereof
2242014000154901/02/14Semiconductor device and driver circuit with an active device and isolation structure interconnected through a resistor circuit, and method of manufacture thereof
2252014000159401/02/14Schottky diode with leakage current control structures
2262014000161601/02/14Semiconductor device package and method of manufacture
2272014000165001/02/14Electronic device including interconnects with a cavity therebetween and a process of forming the same
2282014000213201/02/14Method and device for low power control
2292014000216001/02/14Integrated circuit and method for reducing an impact of electrical stress in an integrated circuit
2302014000684101/02/14Clock glitch detection circuit
2312014000702901/02/14Method for analyzing placement context sensitivity of standard cells
2322013034179612/26/13Semiconductor device with redistributed contacts
2332013034313312/26/13System and method for soft error detection in memory devices
2342013034465612/26/13Method of making surface mount stacked semiconductor devices
2352013034677512/26/13System for reducing dynamic power consumption of wakeup source
2362013034681912/26/13Scan testing of integrated circuits and on-chip modules
2372013034137812/26/13System and method for inspecting free air ball
2382013034167812/26/13Semiconductor device with selectively etched surface passivation
2392013034167912/26/13Semiconductor device with selectively etched surface passivation
2402013034171712/26/13Semiconductor device with floating resurf region
2412013034467212/26/13Semiconductor device with self-biased isolation
2422013034592412/26/13Channel diagnostic system for sent receiver
2432013034679812/26/13Codeword error injection via checkbit modification
2442013034177612/26/13Semiconductor device apparatus and assembly with opposite die orientations
2452013033961912/19/13System for reducing memory latency in processor
2462013033976112/19/13Power management system for electronic circuit
2472013033506512/19/13Sensing device and related operating methods
2482013033606612/19/13Sense amplifier circuit
2492013033968112/19/13Temporal multithreading


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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