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Freescale Semiconductor Inc
Freescale Semiconductor Inc A Corporation
Freescale Semiconductor Inc formerly Known As Sigmatel Inc
Freescale Semiconductor Inc Austin Texas
Freescale Semiconductor Inc_20100107
Freescale Semiconductor Inc_20100114
Freescale Semiconductor Inc_20131212
Freescale Semiconductor Inc_20100128
Freescale Semiconductor Inc_20100121


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Freescale Semiconductor Inc patents

Recent patent applications related to Freescale Semiconductor Inc. Freescale Semiconductor Inc is listed as an Agent/Assignee. Note: Freescale Semiconductor Inc may have other listings under different names/spellings. We're not affiliated with Freescale Semiconductor Inc, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "F" | Freescale Semiconductor Inc-related inventors

Heating system and  testing a semiconductor device using a heating system

Freescale Semiconductor

Heating system and testing a semiconductor device using a heating system

Copper ball bond features and structure

Freescale Semiconductor

Copper ball bond features and structure

Search recent Press Releases: Freescale Semiconductor Inc-related press releases
Count Application # Date Freescale Semiconductor Inc patents (updated weekly) - BOOKMARK this page
12015008413803/26/15 new patent  Integrated circuit having varying substrate depth and forming same
22015008419903/26/15 new patent  Copper ball bond features and structure
32015008441703/26/15 new patent  Electronic device and operating a power switch
42015008465703/26/15 new patent  Heating system and testing a semiconductor device using a heating system
52015008468403/26/15 new patent  Temperature dependent biasing for leakage power reduction
62015008930503/26/15 new patent  Interrupt supervision system, processing interrupt supervison
72015007540103/19/15Squib driver diagnostic circuit and method
82015007655603/19/15Integrated circuit device and a providing esd protection
92015007716303/19/15Dynamic frequency divider circuit
102015008200503/19/15Processing system and instruction set encoding space utilization
112015008201703/19/15Electronic device having a pin for setting its mode of operation and method to set a mode of operation for an electronic device having a pin
122015008228403/19/15Method and system for generating a memory trace of a program code executable on a programmable target
132015006952403/12/15Method of forming different voltage devices with high-k metal gate
142015006962403/12/15Recessed semiconductor die stack
152015007431903/12/15Universal spi (serial peripheral interface)
162015006175003/05/15Method and circuit for controlling turnoff of a semiconductor switching element
172015005947303/05/15Multiple sense axis mems gyroscope having a single drive mode
182015006104403/05/15Sequential wafer bonding
192015006109703/05/15Edge coupling of semiconductor dies
202015006110603/05/15Cavity-type semiconductor package and packaging same
212015006157703/05/15Wireless power transmitters with wide input voltage range and methods of their operation
222015006161203/05/15Switch mode power supply
232015006163703/05/15Negative voltage measurement
242015006172803/05/15Electronic device and maintaining functionality of an integrated circuit during electrical aggressions
252015006178003/05/15Oscillator circuit, a semiconductor device and an apparatus
262015006727903/05/15Data processing operating a data processing system
272015006742803/05/15System-on-chip, manufacture thereof and communicating diagnostic data
282015006742903/05/15Wafer-level gate stress testing
292015006766203/05/15Computer system and a generating an optimized program code
302015005404402/26/15Method to form a polysilicon nanocrystal thin film storage bitcell within a high k metal gate platform technology using a gate last process to form transistor gates
312015005409602/26/15Reducing mems stiction by introduction of a carbon barrier
322015005447702/26/15Power switch with current limitation and zero direct current (dc) power consumption
332015005448702/26/15Reference voltage source and providing a curvature-compensated reference voltage
342015005456202/26/15Level shifter with static precharge circuit
352015004846202/19/15Sensor package and forming same
362015004884802/19/15Test structure and methodology for estimating sensitivity of pressure sensors
372015004940602/19/15Electrostatic discharge protection circuit arrangement, electronic circuit and esd protection method
382015004192702/12/15Mems device with differential vertical sense electrodes
392015004665802/12/15Cache organization and method
402015004675302/12/15Embedded software debug system with partial hardware acceleration
412015004689302/12/15Techniques for electromigration stress mitigation in interconnects of an integrated circuit design
422015003515102/05/15Capping layer interface interruption for stress migration mitigation
432015003560402/05/15Coupler with distributed feeding and compensation
442015003795802/05/15Methods of making multi-state non-volatile memory cells
452015004009202/05/15Stress migration mitigation
462015002719801/29/15Mems parameter identification using modulated waveforms
472015002776701/29/15System and lead frame package degating
482015002894801/29/15Switch-mode amplifier
492015002901301/29/15Method and system for facilitating viewing of information in a machine
502015002137601/22/15Wire bonding capillary with working tip protrusion
512015002174601/22/15Backscattering for localized annealing
522015002453501/22/15Semiconductor sensor device with footed lid
532015002641001/22/15Least recently used (lru) cache replacement implementation using a fifo
542015002652301/22/15Debugging method and computer program product
552015001524001/15/15Method of detecting irregular current flow in an integrated circuit device and apparatus therefor
562015001105301/08/15Semiconductor device and assembling same
572015000211601/01/15Dc to dc converter and method to operate a dc to dc converter
582015000218301/01/15Semiconductor device comprising an output driver circuitry, a packaged semiconductor device and associated methods
592015000221801/01/15Device and compensating for voltage drops
602015000222601/01/15Semiconductor package having wire bond wall to reduce coupling
612015000222901/01/15Semiconductor packages having wire bond wall to reduce coupling
622015000474701/01/15Reram device structure
632015000476801/01/15Drain-end drift diminution in semiconductor devices
642015000682701/01/15Method for detecting bank collision at a memory and device therefor
652015000686301/01/15Debug for providing indexed trace messages
662015000686901/01/15Debug for handling exceptions and interrupts
672014038025812/25/14Method and performing integrated circuit layout verification
682014037484912/25/14Angular rate sensor with quadrature error compensation
692014037485112/25/14Mems device and fabricating mems devices
702014037534112/25/14Die fracture detection and humidity protection with double guard ring arrangement
712014037631712/25/14Reducing the power consumption of memory devices
722014037658612/25/14Multi-chip device with temperature control element for temperature calibration
732014038001712/25/14Memory management and allocation using free-list
742014036723912/18/14Capacitive keypad position sensor with low cross-interference
752014036783012/18/14Esd protection device
762014036785912/18/14Tin-based wirebond structures
772014036901512/18/14Warp compensated electronic assemblies
782014035240012/04/14Transducer-including devices, and methods and their calibration
792014035383012/04/14Semiconductor devices with multilayer flex interconnect structures
802014035436212/04/14Amplifier calibration
812014035536712/04/14Multiple data rate memory with read timing information
822014035702312/04/14Semiconductor device package with cap element
832014034511711/27/14Semiconductor device with thermal dissipation lead frame
842014035157011/27/14Programming interface and method
852014035178111/27/14Method for placing operational cells in a semiconductor device
862014033965611/20/14Mems pressure transducer assembly
872014034121411/20/14Method and detecting one or more predetermined tones transmitted over a communication network
882014034251811/20/14Power mosfet structure and method
892014033290111/13/14Semiconductor device with notched gate
902014033294111/13/14System, leadless surface mounted semiconductor package
912014033332711/13/14On-die capacitance measurement module and measuring an on-die capacitive load
922014033336711/13/14Metal-oxide-semiconductor (mos) voltage divider with dynamic impedance control
932014033405311/13/14Over-current protection device
942014033785911/13/14Processing load with normal or fast operation mode
952014032934411/06/14Testing an electrical connection of a device cap
962014031959710/30/14Methods and systems for gate dimension control in multi-gate structures for semiconductor devices
972014032121210/30/14Non-volatile memory (nvm) with variable verify operations
982014032305010/30/14System for monitoring and controlling the power of a radio frequency (rf) signal in a short-range rf transmitter
992014032307410/30/14Power management for a battery-powered handheld audio device
1002014032518310/30/14Integrated circuit device, asymmetric multi-core processing module, electronic device and managing execution of computer program code therefor
1012014032546310/30/14Integrated circuit design verification through forced clock glitches
1022014031124310/23/14Estimation of sidewall skew angles of a structure
1032014031243510/23/14Mems device with stress isolation and fabrication
1042014031245710/23/14Integrated circuit chip with discontinuous guard ring
1052014031287510/23/14Startup circuits with native transistors
1062014031297510/23/14Amplifier using nonlinear drivers
1072014031297610/23/14Amplfiers and related integrated circuits
1082014031739510/23/14Microprocessor, and managing reset events therefor
1092014030674510/16/14Flip-flop having shared feedback and operation
1102014030877910/16/14Integrated circuit package with voltage distributor
1112014030264110/09/14Stiffened semiconductor die package
1122014029993510/09/14Shallow trench isolation for soi structures combining sidewall spacer and bottom liner
1132014030019310/09/14Power safety circuit, integrated circuit device and safety critical system
1142014030061510/09/14Memory access controller, data processing system, and managing data flow between a memory unit and a processing unit
1152014030380410/09/14Method of controlling a thermal budget of an integrated circuit device, an integrated circuit, a thermal control module and an electronic device therefor
1162014029225210/02/14Circuit and speed monitoring of an electric motor
1172014029563910/02/14Field focusing features in a reram cell
1182014029800510/02/14Microprocessor device, and managing reset events therefor
1192014029811110/02/14Controller, sata system and operation therefor
1202014028471609/25/14Ldmos device with minority carrier shunt region
1212014028517509/25/14Reference voltage generating circuit, integrated circuit and voltage or current sensing device
1222014028523909/25/14Power monitoring circuitry
1232014028754709/25/14Inhibiting propagation of surface cracks in a mems device
1242014028755409/25/14Method for plating a semiconductor package lead
1252014028935709/25/14Data processing system and controlling access to a shared memory unit
1262014026638509/18/14Dual supply level shifter circuits
1272014028129109/18/14Method and memory array access
1282014028260309/18/14Method and detecting a collision between multiple threads of execution for accessing a memory array
1292014026050809/18/14Compensation and calibration for mems devices
1302014026060809/18/14Angular rate sensor having multiple axis sensing capability
1312014026061009/18/14Multiple axis rate sensor
1322014026061609/18/14Mems device having variable gap width and manufacture
1332014026472409/18/14Deep trench isolation
1342014026472809/18/14Active tiling placement for improved latch-up immunity
1352014026624609/18/14Mcu-based compensation and calibration for mems devices
1362014026636609/18/14Compensated hysteresis circuit
1372014026647409/18/14System and improved mems oscillator startup
1382014026900809/18/14Non-volatile memory using bi-directional resistive elements
1392014027335209/18/14Semiconductor device
1402014027339109/18/14Inductive element with interrupter region and forming
1412014027794909/18/14Airbag apparatus
1422014028139009/18/14System and ordering packet transfers in a data processor
1432014028234009/18/14Method for provisioning decoupling capacitance in an integrated circuit
1442014025097009/11/14System and monitoring a gyroscope
1452014025097109/11/14System and monitoring an accelerometer
1462014025100909/11/14System and reducing offset variation in multifunction sensor devices
1472014025246709/11/14Laterally diffused metal oxide semiconductor transistors for radio frequency power amplifiers
1482014025247009/11/14Semiconductor device with integrated electrostatic discharge (esd) clamp
1492014025247209/11/14Semiconductor device with increased safe operating area
1502014025248709/11/14Gate security feature
1512014025257009/11/14Lead-frame circuit package
1522014025258609/11/14Semiconductor devices that include a die bonded to a substrate with a gold interface layer
1532014025320409/11/14Clock signal generator module, integrated circuit, electronic device and method therefor
1542014025324809/11/14Phase shift and attenuation circuits for use with multiple-path amplifiers
1552014025325809/11/14System for reducing electromagnetic induction interference
1562014025463609/11/14System and demodulating an incoming signal
1572014025463709/11/14Direct sequence spread spectrum signal receiving device and method
1582014025609109/11/14Methods for bonding a die and a substrate
1592014025858209/11/14Semiconductor device with vias on a bridge connecting two buses
1602014025879809/11/14Test control point insertion and x-bounding for logic built-in self-test (lbist) using observation circuitry
1612014024708009/04/14Multi-level clock signal distribution network and integrated circuit
1622014024708109/04/14Combinatorial circuit and operation of such a combinatorial circuit
1632014023848308/28/14Three-dimensional solar cell having increased efficiency
1642014023934608/28/14Mishfet and schottky device integration
1652014023992708/28/14Transition control for a hybrid switched-mode power supply (smps)
1662014024276208/28/14Tunable schottky diode with depleted conduction path
1672014024489508/28/14Robust sector id scheme for tracking dead sectors to automate search and copydown
1682014023054908/21/14Spring system for mems device
1692014023201708/21/14Identification mechanism for semiconductor device die
1702014023234408/21/14Circuit and voltage equalization in large batteries
1712014023234708/21/14Circuit and battery equalization
1722014023257908/21/14Low power quantizer for analog to digital converter
1732014023258908/21/14Receiver circuit, phased-array receiver and radar system
1742014023337208/21/14Real-time distributed network module, real-time distributed network and method therefor
1752014022515608/14/14Esd protection with integrated ldmos triggering junction
1762014022517608/14/14Embedded nvm in a hkmg process
1772014022645908/14/14Real-time distributed network slave device, real-time distributed network and method therefor
1782014022073808/07/14Lead frame array package with flip chip die attach
1792014022091708/07/14Multimode rake receiver, cellular base station and cellular communication device
1802014022312808/07/14Memory device and organizing a homogeneous memory
1812014020998807/31/14Nonvolatile memory bitcell
1822014021001607/31/14Implant for performance enhancement of selected transistors in an integrated circuit
1832014021056507/31/14Amplitude loop control for oscillators
1842014021305007/31/14Method of making a die with recessed aluminum die pads
1852014020335807/24/14Semiconductor device with enhanced 3d resurf
1862014020341007/24/14Die edge sealing structures and related fabrication methods
1872014020385707/24/14Variable delay and setup time flip-flop
1882014020410307/24/14Data processing task scheduling in a data processing system
1892014020509207/24/14Secure provisioning in an untrusted environment
1902014020612407/24/14Pressure sensor and packaging same
1912014020797907/24/14Dma-assisted irregular sampling sequences
1922014019754107/17/14Microelectronic assembly having a heat spreader for a plurality of die
1932014019780707/17/14Reducing output voltage ripple of power supplies
1942014019797307/17/14Digital to analog converter with current steering source for reduced glitch energy error
1952014020147907/17/14Integrated circuit device, memory interface module, data processing providing data access control
1962014020159707/17/14Error correction with extended cam
1972014019137707/10/14Integrated circuit package
1982014019138307/10/14Power device and packaging same
1992014018372907/03/14Sensor packages having semiconductor dies of differing sizes
2002014018701207/03/14Customized shield plate for a field effect transistor
2012014018701407/03/14Methods for forming bipolar transistors
2022014018946207/03/14Error correcting device, monitoring an error correcting device and data processing system
2032014017622006/26/14Integrated circuit device, voltage regulator module and compensating a voltage signal
2042014016949506/19/14Signalling circuit, processing device and safety critical system
2052014016710206/19/14Semiconductor device with single-event latch-up prevention circuitry
2062014016785506/19/14Rf power transistor circuits
2072014016786306/19/14Rf power transistor circuits
2082014017324706/19/14Processing apparatus and synchronizing a first processing unit and a second processing unit
2092014017335306/19/14Integrated circuit device and identifying a presence of a broken connection within an external signal path
2102014016086206/12/14Reducing the power consumption of memory devices
2112014016086906/12/14Built-in self trim for non-volatile memory reference current
2122014016477906/12/14Secure provisioning in an untrusted environment
2132014015724006/05/14Method and enabling an executed control flow path through computer program code to be determined
2142014015248106/05/14Integrated circuit device and dynamically modifying at least one characteristic within a digital to analogue converter module
2152014015359006/05/14Method and transmitting data
2162014015502706/05/14Electronic device and a computer program product
2172014014423105/29/14Inertial sensor and levitation effect compensation
2182014014533905/29/14Encapsulant for a semiconductor device
2192014014534005/29/14Flip chip interconnection structure
2202014014576505/29/14Voltage ramp-up protection
2212014014798505/29/14Methods for the fabrication of semiconductor devices including sub-isolation buried layers
2222014013920105/22/14Low-power voltage tamper detection
2232014013178805/15/14Semiconductor devices with non-volatile memory cells
2242014013229305/15/14Integrated circuit with degradation monitoring
2252014013355205/15/14Method and encoding an image
2262014013479905/15/14Wettable lead ends on a flat-pack no-lead microelectronic package
2272014012495805/08/14Sensor packaging method and sensor packages
2282014012540905/08/14Amplifier calibration
2292014012609105/08/14Protection device and related fabrication methods
2302014012988305/08/14Hardware-based memory initialization
2312014011746805/01/14Methods and integrated circuit package for sensing fluid properties
2322014011752105/01/14Semiconductor device with thermal dissipation lead frame
2332014011795305/01/14Method and a tunable driver circuit
2342014011887405/01/14Gate driver with desaturation detection and active clamping
2352014011913105/01/14Memory device redundancy management system
2362014011940505/01/14Production-test die temperature measurement
2372014012201005/01/14Lcd driver verification system
2382014012273505/01/14System and assigning a message
2392014012277505/01/14Memory controller for memory device
2402014011081504/24/14High voltage diode
2412014011127804/24/14Dynamically biased output structure
2422014011246404/24/14Conference call system, method, and computer program product
2432014011528004/24/14Flexible control mechanism for store gathering in a write buffer
2442014011535804/24/14Integrated circuit device and controlling an operating mode of an on-die memory
2452014011554904/24/14Method for verifying digital to analog converter design
2462014010343104/17/14Laterally double diffused metal oxide semiconductor transistors having a reduced surface field structures
2472014010510104/17/14Method and system for low power transmission and data alignment
2482014010518504/17/14Timing event generation circuit for mobile communication device
2492014010887604/17/14Processor switchable between test and debug modes

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Freescale Semiconductor Inc in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Freescale Semiconductor Inc with additional patents listed. Browse our Agent directory for other possible listings. Page by