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Freescale Semiconductor Inc
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Freescale Semiconductor, Inc. patents


      
Recent patent applications related to Freescale Semiconductor, Inc.. Freescale Semiconductor, Inc. is listed as an Agent/Assignee. Note: Freescale Semiconductor, Inc. may have other listings under different names/spellings. We're not affiliated with Freescale Semiconductor, Inc., we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "F" | Freescale Semiconductor, Inc.-related inventors



Search recent Press Releases: Freescale Semiconductor, Inc.-related press releases
Count Application # Date Freescale Semiconductor, Inc. patents (updated weekly) - BOOKMARK this page
12014020998807/31/14 new patent  Nonvolatile memory bitcell
22014021001607/31/14 new patent  Implant for performance enhancement of selected transistors in an integrated circuit
32014021056507/31/14 new patent  Amplitude loop control for oscillators
42014021305007/31/14 new patent  Method of making a die with recessed aluminum die pads
52014020335807/24/14Semiconductor device with enhanced 3d resurf
62014020341007/24/14Die edge sealing structures and related fabrication methods
72014020385707/24/14Variable delay and setup time flip-flop
82014020410307/24/14Data processing system and method for task scheduling in a data processing system
92014020509207/24/14Secure provisioning in an untrusted environment
102014020612407/24/14Pressure sensor and method of packaging same
112014020797907/24/14Dma-assisted irregular sampling sequences
122014019754107/17/14Microelectronic assembly having a heat spreader for a plurality of die
132014019780707/17/14Reducing output voltage ripple of power supplies
142014019797307/17/14Digital to analog converter with current steering source for reduced glitch energy error
152014020147907/17/14Integrated circuit device, memory interface module, data processing system and method for providing data access control
162014020159707/17/14Error correction with extended cam
172014019137707/10/14Integrated circuit package
182014019138307/10/14Power device and method of packaging same
192014018372907/03/14Sensor packages having semiconductor dies of differing sizes
202014018701207/03/14Customized shield plate for a field effect transistor
212014018701407/03/14Methods for forming bipolar transistors
222014018946207/03/14Error correcting device, method for monitoring an error correcting device and data processing system
232014017622006/26/14Integrated circuit device, voltage regulator module and method for compensating a voltage signal
242014016949506/19/14Signalling circuit, processing device and safety critical system
252014016710206/19/14Semiconductor device with single-event latch-up prevention circuitry
262014016785506/19/14Rf power transistor circuits
272014016786306/19/14Rf power transistor circuits
282014017324706/19/14Processing apparatus and method of synchronizing a first processing unit and a second processing unit
292014017335306/19/14Integrated circuit device and method of identifying a presence of a broken connection within an external signal path
302014016086206/12/14Reducing the power consumption of memory devices
312014016086906/12/14Built-in self trim for non-volatile memory reference current
322014016477906/12/14Secure provisioning in an untrusted environment
332014015724006/05/14Method and apparatus for enabling an executed control flow path through computer program code to be determined
342014015248106/05/14Integrated circuit device and method of dynamically modifying at least one characteristic within a digital to analogue converter module
352014015359006/05/14Method and apparatus for transmitting data
362014015502706/05/14Electronic device and a computer program product
372014014423105/29/14Inertial sensor and method of levitation effect compensation
382014014533905/29/14Encapsulant for a semiconductor device
392014014534005/29/14Flip chip interconnection structure
402014014576505/29/14Voltage ramp-up protection
412014014798505/29/14Methods for the fabrication of semiconductor devices including sub-isolation buried layers
422014013920105/22/14Low-power voltage tamper detection
432014013920105/22/14Low-power voltage tamper detection
442014013178805/15/14Semiconductor devices with non-volatile memory cells
452014013229305/15/14Integrated circuit with degradation monitoring
462014013355205/15/14Method and apparatus for encoding an image
472014013479905/15/14Wettable lead ends on a flat-pack no-lead microelectronic package
482014013178805/15/14Semiconductor devices with non-volatile memory cells
492014013229305/15/14Integrated circuit with degradation monitoring
502014013355205/15/14Method and apparatus for encoding an image
512014013479905/15/14Wettable lead ends on a flat-pack no-lead microelectronic package
522014012495805/08/14Sensor packaging method and sensor packages
532014012540905/08/14Amplifier calibration
542014012609105/08/14Protection device and related fabrication methods
552014012988305/08/14Hardware-based memory initialization
562014012495805/08/14Sensor packaging method and sensor packages
572014012540905/08/14Amplifier calibration
582014012609105/08/14Protection device and related fabrication methods
592014012988305/08/14Hardware-based memory initialization
602014011746805/01/14Methods and integrated circuit package for sensing fluid properties
612014011752105/01/14Semiconductor device with thermal dissipation lead frame
622014011795305/01/14Method and apparatus for a tunable driver circuit
632014011887405/01/14Gate driver with desaturation detection and active clamping
642014011913105/01/14Memory device redundancy management system
652014011940505/01/14Production-test die temperature measurement
662014012201005/01/14Lcd driver verification system
672014012273505/01/14System and method for assigning a message
682014012277505/01/14Memory controller for memory device
692014011746805/01/14Methods and integrated circuit package for sensing fluid properties
702014011752105/01/14Semiconductor device with thermal dissipation lead frame
712014011795305/01/14Method and apparatus for a tunable driver circuit
722014011887405/01/14Gate driver with desaturation detection and active clamping
732014011913105/01/14Memory device redundancy management system
742014011940505/01/14Production-test die temperature measurement
752014012201005/01/14Lcd driver verification system
762014012273505/01/14System and method for assigning a message
772014012277505/01/14Memory controller for memory device
782014011081504/24/14High voltage diode
792014011127804/24/14Dynamically biased output structure
802014011246404/24/14Conference call system, method, and computer program product
812014011528004/24/14Flexible control mechanism for store gathering in a write buffer
822014011535804/24/14Integrated circuit device and method for controlling an operating mode of an on-die memory
832014011554904/24/14Method for verifying digital to analog converter design
842014011081504/24/14High voltage diode
852014011127804/24/14Dynamically biased output structure
862014011246404/24/14Conference call system, method, and computer program product
872014011528004/24/14Flexible control mechanism for store gathering in a write buffer
882014011535804/24/14Integrated circuit device and method for controlling an operating mode of an on-die memory
892014011554904/24/14Method for verifying digital to analog converter design
902014010343104/17/14Laterally double diffused metal oxide semiconductor transistors having a reduced surface field structures
912014010510104/17/14Method and system for low power transmission and data alignment
922014010518504/17/14Timing event generation circuit for mobile communication device
932014010887604/17/14Processor switchable between test and debug modes
942014010343104/17/14Laterally double diffused metal oxide semiconductor transistors having a reduced surface field structures
952014010510104/17/14Method and system for low power transmission and data alignment
962014010518504/17/14Timing event generation circuit for mobile communication device
972014010887604/17/14Processor switchable between test and debug modes
982014009788404/10/14Integrated circuit device and method of implementing power gating within an integrated circuit device
992014009861504/10/14Latent slow bit detection for non-volatile memory
1002014009882404/10/14Integrated circuit device and method of performing cut-through forwarding of packet data
1012014010138704/10/14Opportunistic cache replacement policy
1022014009788404/10/14Integrated circuit device and method of implementing power gating within an integrated circuit device
1032014009861504/10/14Latent slow bit detection for non-volatile memory
1042014009882404/10/14Integrated circuit device and method of performing cut-through forwarding of packet data
1052014010138704/10/14Opportunistic cache replacement policy
1062014009788404/10/14Integrated circuit device and method of implementing power gating within an integrated circuit device
1072014009861504/10/14Latent slow bit detection for non-volatile memory
1082014009882404/10/14Integrated circuit device and method of performing cut-through forwarding of packet data
1092014010138704/10/14Opportunistic cache replacement policy
1102014009138004/03/14Split gate flash cell
1112014009171104/03/14Circuit arrangement, lighting apparatus and method of crosstalk-compensated current sensing
1122014009250004/03/14Ground loss monitoring circuit and integrated circuit comprising the same
1132014009415704/03/14Method and system for automatically controlling the insertion of control word in cpri daisy chain configuration
1142014009557204/03/14Multiply and accumulate feedback
1152014009138004/03/14Split gate flash cell
1162014009171104/03/14Circuit arrangement, lighting apparatus and method of crosstalk-compensated current sensing
1172014009250004/03/14Ground loss monitoring circuit and integrated circuit comprising the same
1182014009415704/03/14Method and system for automatically controlling the insertion of control word in cpri daisy chain configuration
1192014009557204/03/14Multiply and accumulate feedback
1202014008575803/27/14Integrated circuit device and method of enabling thermal regulation within an integrated circuit device
1212014008443203/27/14Method and apparatus for multi-chip structure semiconductor package
1222014008494003/27/14Apparatus and a method for detecting faults in the delivery of electrical power to electrical loads
1232014008627703/27/14Thermal sensor system and method based on current ratio
1242014008627903/27/14Thermal sensor system and method based on current ratio
1252014008630903/27/14Method and device for encoding and decoding an image
1262014008755003/27/14Method for forming patterned doping regions
1272014008575803/27/14Integrated circuit device and method of enabling thermal regulation within an integrated circuit device
1282014008443203/27/14Method and apparatus for multi-chip structure semiconductor package
1292014008494003/27/14Apparatus and a method for detecting faults in the delivery of electrical power to electrical loads
1302014008627703/27/14Thermal sensor system and method based on current ratio
1312014008627903/27/14Thermal sensor system and method based on current ratio
1322014008630903/27/14Method and device for encoding and decoding an image
1332014008755003/27/14Method for forming patterned doping regions
1342014007759803/20/14Voltage regulating circuit and method
1352014007787403/20/14Adjustable power splitters and corresponding methods & apparatus
1362014007907803/20/14Multiplexing and demultiplexing data
1372014007759803/20/14Voltage regulating circuit and method
1382014007787403/20/14Adjustable power splitters and corresponding methods & apparatus
1392014007907803/20/14Multiplexing and demultiplexing data
1402014007031103/13/14Semiconductor device and related fabrication methods
1412014007031203/13/14Semiconductor device and related fabrication methods
1422014007031303/13/14Power mosfet current sense structure and method
1432014007041503/13/14Microelectronic packages having trench vias and methods for the manufacture thereof
1442014007041603/13/14Guard ring structure and method for forming the same
1452014007088103/13/14Quiescent current determination using in-package voltage measurements
1462014007165203/13/14Techniques for reducing inductance in through-die vias of an electronic assembly
1472014007441803/13/14Method and system for calibrating an inertial sensor
1482014007031103/13/14Semiconductor device and related fabrication methods
1492014007031203/13/14Semiconductor device and related fabrication methods
1502014007031303/13/14Power mosfet current sense structure and method
1512014007041503/13/14Microelectronic packages having trench vias and methods for the manufacture thereof
1522014007041603/13/14Guard ring structure and method for forming the same
1532014007088103/13/14Quiescent current determination using in-package voltage measurements
1542014007165203/13/14Techniques for reducing inductance in through-die vias of an electronic assembly
1552014007441803/13/14Method and system for calibrating an inertial sensor
1562014006171503/06/14Zener diode device and fabrication
1572014006171603/06/14Esd protection device
1582014006173103/06/14Tunable schottky diode
1592014006185803/06/14Semiconductor device with diagonal conduction path
1602014006194803/06/14Sensor packaging method and sensor packages
1612014006256003/06/14Reconfigurable flip-flop
1622014006374203/06/14Thermally enhanced electronic component packages with through mold vias
1632014006834403/06/14Method and apparatus for filtering trace information
1642014006834503/06/14Method and apparatus for filtering trace information
1652014006834603/06/14Data processor device for handling a watchpoint and method thereof
1662014006834903/06/14Data processor device for handling a watchpoint and method thereof
1672014006171503/06/14Zener diode device and fabrication
1682014006171603/06/14Esd protection device
1692014006173103/06/14Tunable schottky diode
1702014006185803/06/14Semiconductor device with diagonal conduction path
1712014006194803/06/14Sensor packaging method and sensor packages
1722014006256003/06/14Reconfigurable flip-flop
1732014006374203/06/14Thermally enhanced electronic component packages with through mold vias
1742014006834403/06/14Method and apparatus for filtering trace information
1752014006834503/06/14Method and apparatus for filtering trace information
1762014006834603/06/14Data processor device for handling a watchpoint and method thereof
1772014006834903/06/14Data processor device for handling a watchpoint and method thereof
1782014005469402/27/14Semiconductor device with hci protection region
1792014005470402/27/14Semiconductor device including an active region and two layers having different stress characteristics
1802014005474702/27/14Bipolar transistor
1812014005478302/27/14Stacked microelectronic packages having sidewall conductors and methods for the fabrication thereof
1822014005479602/27/14Stacked microelectronic packages having patterened sidewall conductors and methods for the fabrication thereof
1832014005479702/27/14Stacked microelectronic packages having sidewall conductors and methods for the fabrication thereof
1842014005479802/27/14Sensor packages and method of packaging dies of differing sizes
1852014004894602/20/14Sensor packages and method of packaging dies of various sizes
1862014005300302/20/14Random timeslot controller for enabling built-in self test module
1872014004303402/13/14Method and device for diagnosing a reservoir capacitor of a vehicle passenger protection system, and vechicle safety system incorporating such device
1882014004421502/13/14Block-based crest factor reduction
1892014003561002/06/14System and method to test a semiconductor power switch
1902014003660202/06/14Memory device
1912014003556002/06/14Method and apparatus for limiting access to an integrated circuit (ic)
1922014003556102/06/14Variable reluctance sensor interface with integration based arming threshold
1932014003563802/06/14System and method for clock signal generation
1942014003986402/06/14Method, computer program product, and apparatus for simulating electromagnetic immunity of an electronic device
1952014004059502/06/14Space efficient checkpoint facility and technique for processor with integrally indexed register mapping and free-list arrays
1962014004085802/06/14Method and apparatus for generating resource efficient computer program code
1972014002840801/30/14Comparator and relaxation oscillator employing same
1982014002962501/30/14Integrated circuit device and methods for performing cut-through forwarding
1992014002781001/30/14Single-event latch-up prevention techniques for a semiconductor device
2002014002781701/30/14Hybrid transistor
2012014002784901/30/14Ldmos device and method for improved soa
2022014002934801/30/14Dynamic programming for flash memory
2032014003213901/30/14Electronic device and method
2042014003280301/30/14Prediction of electronic component behavior in bus-based systems
2052014002155701/23/14Apparatus for forward well bias in a semiconductor integrated circuit
2062014002162101/23/14Packaged semiconductor die with power rail pads
2072014002200501/23/14Configurable multistage charge pump using a supply detect scheme
2082014002202201/23/14Error detection at an oscillator
2092014002593101/23/14Method and apparatus for controlling fetch-ahead in a vles processor architecture
2102014002596701/23/14Techniques for reducing processor power consumption through dynamic processor resource allocation
2112014001550901/16/14Bandgap reference circuit and regulator circuit with common amplifier
2122014001974101/16/14Method and system for booting electronic device from nand flash memory
2132014001509001/16/14Bipolar transistor with high breakdown voltage
2142014001512301/16/14Sensor package and method of forming same
2152014001980601/16/14Classifying processor testcases
2162014001999001/16/14Integrated circuit device and method for enabling cross-context access
2172014001308701/09/14Processor system with predicate register, computer system, method for managing predicates and computer program product
2182014001329401/09/14Method for ranking paths for power optimization of an integrated circuit design and corresponding computer program product
2192014000768101/09/14Angular rate sensor with quadrature error compensation
2202014000873901/09/14Semiconductor device and method of fabricating same
2212014000881101/09/14Device package with rigid interconnect structure connecting die and substrate and method thereof
2222014001134401/09/14Methods of forming electronic elements with esd protection
2232014001308801/09/14Integrated circuit device and methods of performing bit manipulation therefor
2242014000229101/02/14Analog to digital conversion architecture and method with input and reference voltage scaling
2252014000143201/02/14Applications for nanopillar structures
2262014000154501/02/14High breakdown voltage ldmos device
2272014000154801/02/14Semiconductor device and driver circuit with an active device and isolation structure interconnected through a diode circuit, and method of manufacture thereof
2282014000154901/02/14Semiconductor device and driver circuit with an active device and isolation structure interconnected through a resistor circuit, and method of manufacture thereof
2292014000159401/02/14Schottky diode with leakage current control structures
2302014000161601/02/14Semiconductor device package and method of manufacture
2312014000165001/02/14Electronic device including interconnects with a cavity therebetween and a process of forming the same
2322014000213201/02/14Method and device for low power control
2332014000216001/02/14Integrated circuit and method for reducing an impact of electrical stress in an integrated circuit
2342014000684101/02/14Clock glitch detection circuit
2352014000702901/02/14Method for analyzing placement context sensitivity of standard cells
2362013034179612/26/13Semiconductor device with redistributed contacts
2372013034313312/26/13System and method for soft error detection in memory devices
2382013034465612/26/13Method of making surface mount stacked semiconductor devices
2392013034677512/26/13System for reducing dynamic power consumption of wakeup source
2402013034681912/26/13Scan testing of integrated circuits and on-chip modules
2412013034137812/26/13System and method for inspecting free air ball
2422013034167812/26/13Semiconductor device with selectively etched surface passivation
2432013034167912/26/13Semiconductor device with selectively etched surface passivation
2442013034171712/26/13Semiconductor device with floating resurf region
2452013034467212/26/13Semiconductor device with self-biased isolation
2462013034592412/26/13Channel diagnostic system for sent receiver
2472013034679812/26/13Codeword error injection via checkbit modification
2482013034177612/26/13Semiconductor device apparatus and assembly with opposite die orientations
2492013033961912/19/13System for reducing memory latency in processor


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Freescale Semiconductor, Inc. in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Freescale Semiconductor, Inc. with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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