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Global Unichip Corporation
Global Unichip Corp

Global Unichip Corp patents


Recent patent applications related to Global Unichip Corp. Global Unichip Corp is listed as an Agent/Assignee. Note: Global Unichip Corp may have other listings under different names/spellings. We're not affiliated with Global Unichip Corp, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "G" | Global Unichip Corp-related inventors


Testing apparatus and its probe connector

A probe connector includes a probe body, a flexible sleeve body, a slit and a conductive fluid. The flexible sleeve body is connected to the probe body. The conductive fluid is received in the flexible sleeve body and electrically connected to the slit and the probe body. The slit is... Global Unichip Corp

Analog-to-digital conversion device

An analog-to-digital conversion device is provided that includes a front SAR ADC and a plurality of rear SAR ADCs. The front SAR ADC is configured to convert an analog input signal into a group of higher bits of a digital output signal in response to different time periods. Each of... Global Unichip Corp

Unlock detector, unlock-detecting method and clock and data recovery circuit

An unlock detector includes a checker, an accumulator, and a comparator. The accumulator is electrically connected to the checker, and the comparator is electrically connected to the accumulator. The checker includes several checking units. The checker is configured to receive a sampled data signal and a sampled edge signal, and... Global Unichip Corp

Device and generating duty cycle

A device for generating a duty cycle includes a converter, a corrector, and a control circuit. The converter is configured to generate a first output signal having a duty cycle to an output terminal according to an input signal. The corrector is coupled to the output terminal, and is configured... Global Unichip Corp

Device and recovering clock and data

A clock and data recovery device includes a data sampling module, a phase detection circuit, a frequency estimator, a clock generation module, and a data recovery module. The data sampling module samples input data according to first clock signals to generate data values, in which phases of the first clock... Global Unichip Corp

Method, system for utilizing a probe card, and the probe card

A method for utilizing a probe card includes steps as follows. Providing a probe card having three alignment marks on a reference plane of a circuit board; moving the circuit board to be oriented to a wafer-loading plane of a wafer stage with the reference plane; determining whether a geometric... Global Unichip Corp

Probe card device

A probe card device includes a testing circuitry board, a flexible probe needle, a first solder portion, a second solder portion and an interconnected holder electrically connected to the testing circuitry board and the flexible probe needle in which one end of the interconnected holder is coupled to the flexible... Global Unichip Corp

Multilayer laminated substrate structure

A multilayer laminated substrate structure includes plural substrate layers stacked with each other, and a conductive via portion. One of the substrate layers is provided with a through hole. The conductive via portion includes a first signal conductive pad having a first rib, a second signal conductive pad having a... Global Unichip Corp

Cleaning apparatus

A cleaning apparatus includes a case and a cleaning head. The cleaning head is disposed on the case, and provided with a plurality of tines. The tines are separately arranged abreast. The tines are used to extend into gaps between plural conductive terminals of a semiconductor product for cleaning the... Global Unichip Corp

Image correction system and method thereof

An image correction system includes a storage device and a processor. The storage device is configured to store multiple reference patterns corresponding to different color temperatures. The processor is configured to execute operations of receiving an input image and correspondingly transforming the input image into multiple input gamut points; generating... Global Unichip Corp

Probe card and testing method

A probe card and a testing method are disclosed herein. The probe card includes a plurality of probe sets arranged as a testing unit. The testing unit is configured to test a plurality of dies in a test region on a wafer, and to move m unit along a first... Global Unichip Corp

Testing unit and testing apparatus using the same

A testing apparatus includes a substrate and a testing unit. The testing unit includes a testing pin, in which the testing pin is strip-shaped and has a connecting portion, a first end, and a second end. The first end and the second end of the testing pin are opposite to... Global Unichip Corp

Optical inspection device and optical inspection fixture thereof

An optical inspection fixture includes a first bracket, a second bracket and at least one loading surface. The first bracket is provided with at least one first arm. The second bracket and the first bracket are separated from each other so as to define a light traveling path that lights... Global Unichip Corp

Circuit probing system and its circuit probing device

A circuit probing system and a circuit probing device thereof are provided. The circuit probing device includes a probe card and a protective lid. The probe card is provided with a pin area, a bore hole and a first magnetic attraction member disposed in the bore hole. The protective lid... Global Unichip Corp

Probe card

A probe card includes a circuit board, a plurality of probes, and at least one deviation-compensating member. An end of each of the probes is connected to the circuit board. The deviation-compensating member is fixed to the circuit board and connected to the probes. The probes have a first thermal... Global Unichip Corp

Timing analysis digital circuit design and system thereof

(ETMs) are respectively generated according to the operating modes of the IC design, wherein each of the ETMs includes a none on-chip variation (NOCV) part and an on-chip variation (OCV) part. The ETMs corresponding to the operating modes are integrated into a NOCV ETM and an OCV ETM, wherein the... Global Unichip Corp

Common-mode filter

A common-mode filter includes a first transmission line, a second transmission line, a first wiring layer, a second wiring layer and a third wiring layer. The first wiring layer includes a first conductive capacitor plate, in which at least partial first transmission line is in the first wiring layer, and... Global Unichip Corp

Voltage mode transmitter

A voltage mode transmitter is provided. The voltage mode transmitter includes a control unit and a resistor ladder circuit. The control unit receives a first signal and delays an inverse of the first signal for a time period to obtain a second signal. The resistor ladder circuit is configured to... Global Unichip Corp








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