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Hermes microvision Inc
Hermes microvision Inc_20100128
  

Hermes microvision Inc patents

Recent patent applications related to Hermes microvision Inc. Hermes microvision Inc is listed as an Agent/Assignee. Note: Hermes microvision Inc may have other listings under different names/spellings. We're not affiliated with Hermes microvision Inc, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "H" | Hermes microvision Inc-related inventors




Date Hermes microvision Inc patents (updated weekly) - BOOKMARK this page
07/28/16Objective lens system for fast scanning large fov
03/03/16Apparatus of plural charged particle beams with multi-axis magnetic lenses
06/25/15Multi-axis magnetic lens for focusing a plurality of charged particle beams
03/12/15Hot spot identification, inspection, and review
03/05/15Apparatus of plural charged particle beams with multi-axis magnetic lens
10/02/14Charged particle beam apparatus
09/12/13High efficiency secondary and back scattered electron detector
07/18/13Multi-axis magnetic lens for focusing a plurality of charged particle beams
05/09/13Wien filter
04/05/12System and removing organic residue from a charged particle beam system
04/05/12Structure and determining a defect in integrated circuit manufacturing process
02/23/12Method and charged particle beam inspection
08/11/11Selectable coulomb aperture in e-beam system
04/14/11Thermal field emission cathode
01/27/11Electron gun with magnetic immersion double condenser lenses
12/02/10Cluster e-beam lithography system
10/28/10System and a charged particle beam
06/17/10E-beam defect review system
06/10/10Operation stage for wafer edge inspection and review
04/29/10Electron beam apparatus
04/29/10Wafer grounding methodology
01/28/10Apparatus for increasing electric conductivity to a semiconductor wafer substrate when exposure to electron beam
12/24/09Thermal field emission cathode
10/01/09Method and charged particle beam inspection
05/14/09Cluster e-beam lithography system
04/09/09Charged particle detection devices
01/28/10Apparatus for increasing electric conductivity to a semiconductor wafer substrate when exposure to electron beam







ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009



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