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Hitachi High tech Science Corporation patents

Recent patent applications related to Hitachi High tech Science Corporation. Hitachi High tech Science Corporation is listed as an Agent/Assignee. Note: Hitachi High tech Science Corporation may have other listings under different names/spellings. We're not affiliated with Hitachi High tech Science Corporation, we're just tracking patents.

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "H" | Hitachi High tech Science Corporation-related inventors




Date Hitachi High tech Science Corporation patents (updated weekly) - BOOKMARK this page
06/22/17Charged particle beam apparatus
05/25/17Method for correcting evolved gas analyzer and evolved gas analyzer
05/25/17Evolved gas analyzer and analyzing evolved gas
05/25/17Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus
05/25/17Method for analyzing evolved gas and evolved gas analyzer
05/25/17Method for analyzing evolved gas and evolved gas analyzer
05/04/17Automatic sample preparation apparatus
03/30/17Sample positioning method and charged particle beam apparatus
03/30/17Method for acquiring image and ion beam apparatus
03/09/17Focused ion beam apparatus
03/02/17Scanning probe microscope and optical axis adjustment scanning probe microscope
03/02/17X-ray analysis device
03/02/17Transport device, treatment device, vacuum device, and charged particle beam device
03/02/17Sample holder and sample holder set
02/02/17X-ray transmission inspection apparatus and inspection method using the same
12/22/16Microsample stage and manufacturing the same
12/08/16Scanning probe microscope
11/24/16Cross-section processing-and-observation method and cross-section processing-and-observation apparatus
11/03/16Repair apparatus
10/06/16Sequential icp optical emission spectrometer and correcting measurement wavelength
10/06/16Method for measuring spreading resistance and spreading resistance microscope
10/06/16Scanning probe microscope and measurement range adjusting scanning probe microscope
09/29/16Two-dimensional liquid chromatographic analyzer and analytical method
09/29/16Scanning probe microscope
09/15/16Inductively coupled plasma generating device and inductively coupled plasma analysis device
08/25/16Sample processing evaluation apparatus
08/11/16X-ray analyzer
08/11/16Radiation analyzing apparatus
08/04/16Sample carrying device and vacuum apparatus
08/04/16Focused ion beam apparatus
07/21/16Radiation analyzing apparatus
06/09/16X-ray fluorescence analyzer
05/26/16X-ray fluorescence analyzer and x-ray fluorescence analyzing method
04/28/16X-ray generator and fluorescent x-ray analyzer
03/31/16Composite charged particle beam apparatus
03/31/16Charged particle beam apparatus
03/10/16X-ray fluorescence analyzer and measurement position adjusting method therefore
03/03/16X-ray fluorescence analyzer and displaying sample thereof
03/03/16Charged particle beam apparatus
02/04/16Semiconductor radiation detector array
01/14/16Sample plate for x-ray analysis and x-ray fluorescent analyzer
01/14/16Three-dimensional fine movement device
12/17/15X-ray fluorescence analyzer
12/10/15Emitter structure, gas ion source and focused ion beam system
10/01/15Icp emission spectrometer
10/01/15Icp emission spectrometer
10/01/15X-ray transmission inspection apparatus
10/01/15Method for measuring vibration characteristic of cantilever
10/01/15Scanning probe microscope
09/24/15Icp optical emission spectrometer
09/24/15X-ray analyzer
09/24/15X-ray analyzer
09/24/15Energy dispersive x-ray analyzer and energy dispersive x-ray analysis
09/24/15Charged particle beam apparatus
09/24/15Focused ion beam apparatus
09/17/15Thermal analyzer
09/17/15Cross-section processing and observation method and cross-section processing and observation apparatus
09/17/15Imaging thermal analyzer and thermal analyzer including the same
08/13/15Crystal analysis apparatus, composite charged particle beam device, and crystal analysis method
08/13/15Sample holder for x-ray analysis and jig for sample installation
08/13/15Charged particle beam apparatus
08/13/15Charged particle beam apparatus
08/06/15Charged particle beam apparatus
07/23/15Charged particle beam device, control charged particle beam device, and cross-section processing observation apparatus
07/23/15Charged particle beam apparatus and sample observation method
Patent Packs
07/23/15Charged particle beam apparatus and processing method
06/25/15X-ray fluorescence analysis apparatus
06/11/15Focused ion beam apparatus
06/04/15Thermal analyzer
05/14/15Measured data digitization apparatus, measured data digitization method and non-transitory computer-readable medium
04/30/15Cross section processing method and cross section processing apparatus
03/05/15Cross-section processing-and-observation method and cross-section processing-and-observation apparatus
03/05/15Charged particle beam apparatus
03/05/15Charged particle beam apparatus
02/26/15Repair apparatus
02/12/15Iridium tip, gas field ion source, focused ion beam apparatus, electron source, electron microscope, electron beam applied analysis apparatus, ion-electron multi-beam apparatus, scanning probe microscope, and mask repair apparatus
10/02/14Focused ion beam apparatus, observing cross-section of sample by using the same, and storage medium
10/02/14Charged particle beam forming observation image
10/02/14Charged particle beam apparatus and sample processing method using charged particle beam apparatus
10/02/14Focused ion beam apparatus and working sample using the same
Patent Packs
10/02/14Emitter structure, gas ion source and focused ion beam system
10/02/14Focused ion beam apparatus and control method thereof
10/02/14X-ray fluorescence spectrometer
10/02/14Foreign matter detector
10/02/14X-ray fluorescence spectrometer
10/02/14Actuator position calculation device, actuator position calculation method, and actuator position calculation program
09/25/14Focused ion beam system, sample processing method using the same, and sample processing program using focused ion beam
09/25/14Focused ion beam system
09/25/14X-ray fluorescence analyzer
09/04/14Method for fabricating emitter
05/15/14Cross-section processing and observation method and cross-section processing and observation apparatus
03/20/14Crystal analysis apparatus, composite charged particle beam device, and crystal analysis method
03/06/14Composite charged particle beam apparatus and thin sample processing method
02/27/14Scanning probe microscope
02/20/14Radiation analyzer and analyzing radiation
09/26/13Method for fabricating emitter
09/26/13Sample observation method, sample preparation method, and charged particle beam apparatus
09/26/13Cross-section processing and observation method and cross-section processing and observation apparatus
09/26/13Cross-section processing and observation apparatus
09/26/13Ion beam apparatus
09/26/13Composite charged particle beam apparatus
09/26/13Sample preparation method
09/19/13Focused ion beam apparatus and adjusting ion beam optics
09/19/13Charged particle beam apparatus and sample transporting apparatus
09/19/13Sample preparation apparatus and sample preparation method
08/22/13Sample preparation method and apparatus
08/15/13Tem sample preparation method
08/15/13Method of preparing sample for tem observation







ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Hitachi High tech Science Corporation in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Hitachi High tech Science Corporation with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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