Real Time Touch

new TOP 200 Companies filing patents this week

new Companies with the Most Patent Filings (2010+)

Real Time Touch

Filing Names

Hitachi High technologies Corporation
Hitachi High technologies Corporation_20100107
Hitachi High technologies Corporation_20100114
Hitachi High technologies Corporation_20100121
Hitachi High technologies Corporation_20100128

Hitachi High technologies Corporation patents

Recent patent applications related to Hitachi High technologies Corporation. Hitachi High technologies Corporation is listed as an Agent/Assignee. Note: Hitachi High technologies Corporation may have other listings under different names/spellings. We're not affiliated with Hitachi High technologies Corporation, we're just tracking patents.

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "H" | Hitachi High technologies Corporation-related inventors

Date Hitachi High technologies Corporation patents (updated weekly) - BOOKMARK this page
12/07/17 new patent  Ion beam device
11/30/17Height measurement device and charged particle beam device
11/30/17Analysis method and analysis device
11/30/17Charged particle beam device
11/30/17Charged particle beam device and information-processing device
11/23/17Measurement system, head-mounted device, non-transitory computer readable medium, and service providing method
11/23/17Mass spectrometer
11/23/17Exposure condition evaluation device
11/23/17Plasma processing apparatus and plasma processing method
11/16/17Defect observation method and defect observation device
11/16/17Defect inspection device, display device, and defect classification device
11/16/17Automatic analysis device
11/16/17Sample test automation system
11/16/17Composite charged particle beam apparatus and control method thereof
11/16/17Charged particle beam device
11/09/17Overlay measurement method, device, and display device
11/09/17Defect quantification method, defect quantification device, and defect evaluation value display device
11/09/17Charged particle beam apparatus, electron microscope and sample observation method
11/09/17Charged particle beam device
11/09/17Ion beam device
11/02/17Charged particle beam apparatus
10/26/17Cytometric mechanism, cell culture device comprising same, and cytometric method
10/26/17Fixed position controller and method
10/26/17Scanning electron microscope
10/19/17Nucleic acid delivery controlling manufacturing same, and nucleic acid sequencing device
10/19/17Scanning electron microscope
09/28/17Charged particle beam device
09/28/17Plasma processing apparatus and plasma processing method
09/21/17Biomolecule measurement system and biomolecule measurement method
09/21/17Sample for coordinates calibration and fabricating the same
09/21/17Automatic analyzer
09/21/17Charged particle beam device
09/14/17Spot array substrate, producing same, and nucleic acid polymer analysis
09/14/17X-ray inspection
08/31/17Defect observation apparatus
08/31/17Charged particle beam apparatus and vibration damper for charged particle beam apparatus
08/24/17Plasma processing method
08/10/17Nucleic acid analysis device and device diagnosis nucleic acid analysis device
08/10/17Automatic analyzing apparatus
08/10/17Ion beam apparatus and ion beam irradiation method
08/10/17Vacuum processing apparatus
08/10/17Data management apparatus and monitoring same
08/03/17Automatic analyzing apparatus
08/03/17Ion milling device, ion source and ion milling method
08/03/17Charged particle beam device
08/03/17Charged particle beam device, electron microscope and sample observation method
08/03/17Ion milling device and ion milling method
07/27/17Temperature regulating container
07/27/17Pattern height measurement device and charged particle beam device
07/27/17Multichannel analysis device
07/27/17Automatic analysis device
07/27/17Automatic analysis apparatus
07/27/17Cryostation system
07/20/17Liquid stirring method
07/20/17Automatic analyzer
07/20/17Automatic analysis device
07/20/17Charged particle beam apparatus and image forming charged particle beam apparatus
07/13/17Reaction cell for automatic analysis device, automatic analysis device equipped with said reaction cell, and analysis method using said automatic analysis device
07/06/17Cell dispersion measurement mechanism, and cell subculture system utilizing same
07/06/17Automatic analyzer
07/06/17Method for releasing sample and plasma processing apparatus using same
07/06/17Manufacturing magnetoresistive element and vacuum processing apparatus
07/06/17Plasma processing method
06/29/17Scanning electron microscope and controlling same
06/29/17Plasma processor
Patent Packs
06/22/17Automatic analyzing apparatus
06/22/17Plasma processing apparatus and operating plasma processing apparatus
06/15/17Particle suction capture mechanism and unstopping device equipped with particle suction capture mechanism
06/15/17Charged particle beam device and installation method
06/15/17Electron microscope device and imaging method using same
06/08/17Cell concentration adjustment device, and automatic subculture system using same
06/08/17Cell culture device and image analysis device
06/08/17Pattern measurement condition setting device and pattern measuring device
06/08/17Analysis device and analysis method
06/08/17Charged particle beam apparatus and aberration corrector
06/08/17Mass spectrometry device
06/08/17Dry-etching method
06/01/17Automatic analysis apparatus
06/01/17Automatic analysis device
06/01/17Automatic analyzer
Patent Packs
05/25/17Defect inspection device and defect inspection method
05/18/17Pattern measurement method and pattern measurement device
05/18/17Hole formation method and measurement device
05/18/17Device for storing biochemical reagents, and biochemical analyzer
05/11/17Automatic analytical apparatus
05/11/17Electron microscope and sample observation method
05/04/17Mass spectrometer
04/27/17Fluorescence spectrometer
04/27/17Defect inspection method, low light detecting method, and low light detector
04/27/17Charged particle beam device and spherical aberration correction method
04/20/17Defect observation and defect detection device
04/20/17Inspection apparatus and method using pattern matching
04/20/17Charged particle beam apparatus
04/20/17Plasma processing equipment and plasma generation equipment
04/13/17Defect inspection method and its device
04/13/17Defect inspection device and defect inspection method
04/06/17Test apparatus
04/06/17Chromatograph mass spectrometer and control method therefor
03/30/17Analysis device
03/30/17Automatic analyzer
03/30/17Charged-particle-beam device
03/30/17Measurement device, calibration measurement device, and calibration member
03/30/17Plasma processing apparatus and plasma processing method
03/23/17Defect reviewing
03/23/17Plasma etching method
03/16/17Ion beam device
03/09/17Sample holder, observation system, and image generation method
03/02/17Sample dispensing device and nozzle tip for sample dispensing device
03/02/17Charged particle radiation apparatus
02/23/17Charged particle beam device and detection method using said device
Social Network Patent Pack
02/16/17Microscope observation container and observation device
02/16/17Sample processing method and charged particle beam device
02/16/17Measurement system and measurement method
02/16/17Ion milling apparatus and sample processing method
02/09/17Cell culture device
02/09/17Electron beam device
02/09/17Plasma processing apparatus
02/09/17Charged particle beam device and inspection device
02/02/17Pattern measurement method and measurement apparatus
02/02/17Evaluation condition setting semiconductor device, and evaluation condition setting apparatus
Patent Packs
02/02/17Plasma processing apparatus and plasma processing method
01/26/17Microspectroscopy device
01/26/17Charged particle beam apparatus
01/26/17Plasma processing apparatus
01/26/17Plasma processing apparatus
01/26/17Plasma processing apparatus and plasma processing method
01/19/17Sequence data analyzer, dna analysis system and sequence data analysis method
01/19/17Scanning electron microscope
01/19/17Sample holder for charged particle beam device, and charged particle beam device
01/19/17Plasma processing apparatus
01/12/17Terahertz wave phase difference measurement device
01/12/17Automatic analyzer
01/12/17Automatic analyzer
01/12/17Automatic analyzer
01/12/17Plasma processing device
12/29/16Fluid switching valve and liquid chromatograph apparatus using the same
12/29/16Charged particle beam apparatus
12/29/16Scanning electron microscope system, pattern measurement method using same, and scanning electron microscope
12/29/16Vacuum processing apparatus
12/29/16Plasma processing apparatus and data analysis apparatus
12/22/16Plasma processing apparatus
12/15/16Automated analyzer
12/15/16Stage device and charged particle beam device using the same
12/08/16Reaction cell and automatic biochemical analyzer
12/08/16Pattern-measuring device and computer program
12/08/16Charged particle beam apparatus
12/08/16Defect image classification apparatus
12/01/16Plasma processing apparatus and plasma processing method
12/01/16Plasma processing apparatus and plasma processing method
11/24/16Automatic analysis device
Patent Packs
11/24/16Dispensing device and dispensing method
11/24/16Electron scanning microscope and image generation method
11/24/16Method of improving quality of scanning charged particle microscope image, and scanning charged particle microscope apparatus
11/24/16Charged particle beam apparatus, specimen observation system and operation program
11/17/16Flow-type ion selective electrode, electrolyte concentration measuring device using the same, and biochemical automatic analyzer
11/17/16Automatic analysis apparatus
11/17/16Automatic analytical apparatus
11/17/16Automatic analyzer
11/17/16Charged-particle-beam device, specimen-image acquisition method, and program recording medium
11/17/16Plasma processing apparatus, data processing apparatus and data processing method
11/17/16Plasma processing apparatus and plasma processing method
11/10/16Automatic analyzer
11/10/16Automated analyzer device
11/10/16Charged particle beam device
11/10/16Charged particle beam device, image generation method, observation system
11/03/16Flow-path control method, and cell culture device
11/03/16Pattern measurement device, and computer program for measuring pattern
11/03/16Inspection device and measurement device
10/27/16Pattern measurement device and computer program
10/20/16Defect inspection using same
Social Network Patent Pack
10/20/16Pattern measurement device and computer program
10/20/16Dry etching method
10/13/16Far-infrared imaging device and far-infrared imaging method
10/13/16Light measuring device and light measuring method
10/13/16Charged-particle-beam device
10/13/16Hybrid ion source, mass spectrometer, and ion mobility device
10/06/16Automatic analyzing apparatus and analyzing method
10/06/16Automatic analysis device
09/29/16Curved grating, manufacturing the same, and optical device
09/29/16Stage apparatus and charged particle radiation apparatus equipped with stage apparatus
09/29/16Plasma processing apparatus and plasma processing method
09/22/16Automatic analysis device and analysis method
09/22/16Charged particle beam apparatus, image forming method using a charged particle beam apparatus, and image processing apparatus
09/15/16Reagent vessel holder for an analytical instrument, reagent supply system for an analytical instrument and an analytical instrument
09/15/16Liquid mixing device, and liquid chromatography apparatus
09/15/16Analyte testing automation system, biological sample check module, and biological sample check method
09/08/16Far-ultraviolet absorbance detection device for liquid chromatography
09/01/16Specimen transport device, specimen pretreatment system, analysis system, and specimen testing automation system
09/01/16Specimen pre-processing connection device and system provided with device
Social Network Patent Pack
09/01/16Plasma processing apparatus and plasma processing method
08/25/16Sample transfer device and sample processing system
08/25/16Dna transport control device and producing same, as well as dna sequencing device
08/25/16Nucleic acid analysis device and diagnosis method
08/25/16Biomolecule measuring device
08/18/16Automatic analyzer
08/18/16Automatic analysis device
08/18/16Plasma ion source and charged particle beam apparatus
08/18/16Charged particle beam device
08/18/16Plasma ion source and charged particle beam apparatus
08/11/16Charged particle beam device
08/11/16Plasma processing apparatus and plasma processing method
08/04/16Ion-selective electrode
08/04/16Ion beam device and emitter tip adjustment method
08/04/16Electron microscope
08/04/16Charged particle beam device and charged particle beam measurement method
08/04/16Plasma processing apparatus
08/04/16Plasma processing apparatus, plasma processing method and plasma processing analysis method
07/28/16Nucleic-acid-sequence determination device and nucleic-acid-sequence determination method
07/28/16Defect inspection device and defect inspection method
07/28/16Electrophoresis medium receptacle and electrophoresis apparatus
07/28/16Method of transmitting control data for system conversion among liquid chromatographs
07/28/16Charged particle beam device
07/28/16Charged particle beam inclination correction method and charged particle beam device
07/28/16Charged particle beam device and sample holder for charged particle beam device
07/28/16Vacuum processing apparatus
07/28/16Plasma processing apparatus
07/21/16Componential analyzer, drug efficacy analyzer, and analysis method
07/21/16Automatic analyzer
07/21/16Sample holder and charged particle device
Social Network Patent Pack
07/21/16Method and reviewing defects
07/21/16Plasma processing method and plasma processing apparatus
07/21/16Plasma processing apparatus
07/14/16Specimen storage apparatus, specimen processing system, and controlling method thereof
07/14/16Anti-contamination trap, and vacuum application device
07/14/16Electron microscope
07/14/16Charged particle beam apparatus and sample image acquiring method
07/14/16Inspection equipment
07/14/16Charged particle beam device and charged particle beam device control method
07/14/16Data analysis plasma processing apparatus, plasma processing method and plasma processing apparatus
07/14/16Plasma processing apparatus and plasma processing method
07/07/16Nozzle cleaning method and automated analyzer
07/07/16Analysis device and analysis method
07/07/16Automated analyzer
07/07/16Automated analyzer
07/07/16Hybrid ion source and mass spectrometric device
06/30/16Pattern shape evaluation device and method
06/23/16Plasma processing apparatus and operation method thereof
06/23/16Surface shape measuring apparatus
06/23/16Plasma processing method
06/23/16Plasma processing apparatus and plasma processing method
06/16/16Flow cell for nucleic acid analysis and nucleic acid analyzer
06/16/16Cell culturing method, particulate culture carrier, and particle-encompassing cell aggregate
06/16/16Charged particle beam device
06/16/16Plasma processing apparatus
06/09/16Defect inspection method and defect inspection device
06/09/16Automatic analyzer
06/09/16Charged particle beam device enabling facilitated ebsd detector analysis of desired position and control method thereof
06/09/16Ion milling device

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Hitachi High technologies Corporation in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Hitachi High technologies Corporation with additional patents listed. Browse our Agent directory for other possible listings. Page by