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Hitachi High technologies Corporation
Hitachi High technologies Corporation_20100107
Hitachi High technologies Corporation_20100114
Hitachi High technologies Corporation_20100121
Hitachi High technologies Corporation_20100128

Hitachi High technologies Corporation patents

Recent patent applications related to Hitachi High technologies Corporation. Hitachi High technologies Corporation is listed as an Agent/Assignee. Note: Hitachi High technologies Corporation may have other listings under different names/spellings. We're not affiliated with Hitachi High technologies Corporation, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "H" | Hitachi High technologies Corporation-related inventors

Date Hitachi High technologies Corporation patents (updated weekly) - BOOKMARK this page
03/23/17 new patent  Defect reviewing
03/23/17 new patent  Plasma etching method
03/16/17Ion beam device
03/09/17Sample holder, observation system, and image generation method
03/02/17Sample dispensing device and nozzle tip for sample dispensing device
03/02/17Charged particle radiation apparatus
02/23/17Charged particle beam device and detection method using said device
02/16/17Microscope observation container and observation device
02/16/17Sample processing method and charged particle beam device
02/16/17Measurement system and measurement method
02/16/17Ion milling apparatus and sample processing method
02/09/17Cell culture device
02/09/17Electron beam device
02/09/17Plasma processing apparatus
02/09/17Charged particle beam device and inspection device
02/02/17Pattern measurement method and measurement apparatus
02/02/17Evaluation condition setting semiconductor device, and evaluation condition setting apparatus
02/02/17Plasma processing apparatus and plasma processing method
01/26/17Microspectroscopy device
01/26/17Charged particle beam apparatus
01/26/17Plasma processing apparatus
01/26/17Plasma processing apparatus
01/26/17Plasma processing apparatus and plasma processing method
01/19/17Sequence data analyzer, dna analysis system and sequence data analysis method
01/19/17Scanning electron microscope
01/19/17Sample holder for charged particle beam device, and charged particle beam device
01/19/17Plasma processing apparatus
01/12/17Terahertz wave phase difference measurement device
01/12/17Automatic analyzer
01/12/17Automatic analyzer
01/12/17Automatic analyzer
01/12/17Plasma processing device
12/29/16Fluid switching valve and liquid chromatograph apparatus using the same
12/29/16Charged particle beam apparatus
12/29/16Scanning electron microscope system, pattern measurement method using same, and scanning electron microscope
12/29/16Vacuum processing apparatus
12/29/16Plasma processing apparatus and data analysis apparatus
12/22/16Plasma processing apparatus
12/15/16Automated analyzer
12/15/16Stage device and charged particle beam device using the same
12/08/16Reaction cell and automatic biochemical analyzer
12/08/16Pattern-measuring device and computer program
12/08/16Charged particle beam apparatus
12/08/16Defect image classification apparatus
12/01/16Plasma processing apparatus and plasma processing method
12/01/16Plasma processing apparatus and plasma processing method
11/24/16Automatic analysis device
11/24/16Dispensing device and dispensing method
11/24/16Electron scanning microscope and image generation method
11/24/16Method of improving quality of scanning charged particle microscope image, and scanning charged particle microscope apparatus
11/24/16Charged particle beam apparatus, specimen observation system and operation program
11/17/16Flow-type ion selective electrode, electrolyte concentration measuring device using the same, and biochemical automatic analyzer
11/17/16Automatic analysis apparatus
11/17/16Automatic analytical apparatus
11/17/16Automatic analyzer
11/17/16Charged-particle-beam device, specimen-image acquisition method, and program recording medium
11/17/16Plasma processing apparatus, data processing apparatus and data processing method
11/17/16Plasma processing apparatus and plasma processing method
11/10/16Automatic analyzer
11/10/16Automated analyzer device
11/10/16Charged particle beam device
11/10/16Charged particle beam device, image generation method, observation system
11/03/16Flow-path control method, and cell culture device
11/03/16Pattern measurement device, and computer program for measuring pattern
11/03/16Inspection device and measurement device
Patent Packs
10/27/16Pattern measurement device and computer program
10/20/16Defect inspection using same
10/20/16Pattern measurement device and computer program
10/20/16Dry etching method
10/13/16Far-infrared imaging device and far-infrared imaging method
10/13/16Light measuring device and light measuring method
10/13/16Charged-particle-beam device
10/13/16Hybrid ion source, mass spectrometer, and ion mobility device
10/06/16Automatic analyzing apparatus and analyzing method
10/06/16Automatic analysis device
09/29/16Curved grating, manufacturing the same, and optical device
09/29/16Stage apparatus and charged particle radiation apparatus equipped with stage apparatus
09/29/16Plasma processing apparatus and plasma processing method
09/22/16Automatic analysis device and analysis method
Patent Packs
09/22/16Charged particle beam apparatus, image forming method using a charged particle beam apparatus, and image processing apparatus
09/15/16Reagent vessel holder for an analytical instrument, reagent supply system for an analytical instrument and an analytical instrument
09/15/16Liquid mixing device, and liquid chromatography apparatus
09/15/16Analyte testing automation system, biological sample check module, and biological sample check method
09/08/16Far-ultraviolet absorbance detection device for liquid chromatography
09/01/16Specimen transport device, specimen pretreatment system, analysis system, and specimen testing automation system
09/01/16Specimen pre-processing connection device and system provided with device
09/01/16Plasma processing apparatus and plasma processing method
08/25/16Sample transfer device and sample processing system
08/25/16Dna transport control device and producing same, as well as dna sequencing device
08/25/16Nucleic acid analysis device and diagnosis method
08/25/16Biomolecule measuring device
08/18/16Automatic analyzer
08/18/16Automatic analysis device
08/18/16Plasma ion source and charged particle beam apparatus
08/18/16Charged particle beam device
08/18/16Plasma ion source and charged particle beam apparatus
08/11/16Charged particle beam device
08/11/16Plasma processing apparatus and plasma processing method
08/04/16Ion-selective electrode
08/04/16Ion beam device and emitter tip adjustment method
08/04/16Electron microscope
08/04/16Charged particle beam device and charged particle beam measurement method
08/04/16Plasma processing apparatus
08/04/16Plasma processing apparatus, plasma processing method and plasma processing analysis method
07/28/16Nucleic-acid-sequence determination device and nucleic-acid-sequence determination method
07/28/16Defect inspection device and defect inspection method
07/28/16Electrophoresis medium receptacle and electrophoresis apparatus
07/28/16Method of transmitting control data for system conversion among liquid chromatographs
07/28/16Charged particle beam device
Social Network Patent Pack
07/28/16Charged particle beam inclination correction method and charged particle beam device
07/28/16Charged particle beam device and sample holder for charged particle beam device
07/28/16Vacuum processing apparatus
07/28/16Plasma processing apparatus
07/21/16Componential analyzer, drug efficacy analyzer, and analysis method
07/21/16Automatic analyzer
07/21/16Sample holder and charged particle device
07/21/16Method and reviewing defects
07/21/16Plasma processing method and plasma processing apparatus
07/21/16Plasma processing apparatus
Patent Packs
07/14/16Specimen storage apparatus, specimen processing system, and controlling method thereof
07/14/16Anti-contamination trap, and vacuum application device
07/14/16Electron microscope
07/14/16Charged particle beam apparatus and sample image acquiring method
07/14/16Inspection equipment
07/14/16Charged particle beam device and charged particle beam device control method
07/14/16Data analysis plasma processing apparatus, plasma processing method and plasma processing apparatus
07/14/16Plasma processing apparatus and plasma processing method
07/07/16Nozzle cleaning method and automated analyzer
07/07/16Analysis device and analysis method
07/07/16Automated analyzer
07/07/16Automated analyzer
07/07/16Hybrid ion source and mass spectrometric device
06/30/16Pattern shape evaluation device and method
06/23/16Plasma processing apparatus and operation method thereof
06/23/16Surface shape measuring apparatus
06/23/16Plasma processing method
06/23/16Plasma processing apparatus and plasma processing method
06/16/16Flow cell for nucleic acid analysis and nucleic acid analyzer
06/16/16Cell culturing method, particulate culture carrier, and particle-encompassing cell aggregate
06/16/16Charged particle beam device
06/16/16Plasma processing apparatus
06/09/16Defect inspection method and defect inspection device
06/09/16Automatic analyzer
06/09/16Charged particle beam device enabling facilitated ebsd detector analysis of desired position and control method thereof
06/09/16Ion milling device
06/02/16Capillary electrophoresis device
06/02/16Analysis device
06/02/16Automatic analyzer
06/02/16Ion milling device and processing method using the ion milling device
Patent Packs
06/02/16Plasma processing apparatus
06/02/16Plasma processing apparatus and sample stage thereof
05/26/16Nucleic acid amplification/detection device and nucleic acid inspection device using same
05/26/16Holder for transferring test tube
05/26/16Automatic analyzer
05/26/16Charged particle beam apparatus and inspection method using the same
05/26/16Scanning electron microscope
05/19/16Plasma processing method
05/19/16Inspection device
05/19/16Cartridge for dispensing a fluid, automatic analyzer and analyzing a biological sample
05/19/16Template creation device for sample observation device, and sample observation device
05/19/16Plasma processing apparatus
05/19/16Mass spectrometric device and mass spectrometric device control method
05/19/16Dry etching apparatus and method
05/12/16Anion sensor
05/12/16Charged particle beam device
05/12/16Plasma processing apparatus and plasma processing method
05/12/16Plasma etching method
05/05/16Method for determining cell state and autoanalyzer using said method
05/05/16Method and device for line pattern shape evaluation
Social Network Patent Pack
05/05/16Automatic analyzer
05/05/16Automatic analyzer
05/05/16Wafer appearance inspection apparatus
05/05/16Ion milling device
05/05/16Charged-particle-beam device and specimen observation method
04/28/16Defect inspecting method and defect inspecting apparatus
04/28/16Charged particle beam device and adjusting charged particle beam device
04/21/16Detection device and biological-sample analysis device
04/21/16Nucleic acid analyzer and nucleic acid analysis method using same
04/21/16Defect inspection for same
04/21/16Adsorbent and analysis method using same
04/14/16Electron gun, charged particle gun, and charged particle beam apparatus using electron gun and charged particle gun
04/07/16Electrochemiluminescence detecting an analyte in a liquid sample and analysis system
03/31/16Surface profile measurement used therein
03/24/16Automated analyzer
03/24/16Automatic analyzer and sample-processing system
03/24/16Charged particle beam device
03/17/16Electrode for electrochemical measurement, electrolysis cell for electrochemical measurement, analyzer for electrochemical measurement, and methods for producing same
03/17/16Automatic analysis device and automatic analysis method
03/17/16Plasma processing apparatus
Social Network Patent Pack
03/17/16Sample cleaning apparatus and sample cleaning method
03/17/16Plasma processing method
03/17/16Plasma processing apparatus
03/10/16Automatic analyzer
03/10/16Defect detection method and defect detection device and defect observation device provided with same
03/10/16Charged particle beam device and filter member
03/10/16Charged particle radiation device and specimen preparation method using said device
03/10/16Sample observation device
03/03/16Automatic analyzing device
03/03/16Pattern evaluation device and visual inspection device comprising pattern evaluation device
03/03/16Charged particle beam apparatus and image generation method
03/03/16Electron microscope and sample observation method
03/03/16Plasma processing apparatus
02/25/16Electrolyte concentration measuring apparatus and measuring method using same
02/25/16Superposition measuring apparatus, superposition measuring method, and superposition measuring system
02/11/16Method and inspecting defects
02/11/16X-ray transmission inspection apparatus and extraneous substance detecting method
02/04/16Pattern shape evaluation method, semiconductor device manufacturing method, and pattern shape evaluation device
01/28/16Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member
01/28/16Analysis system
01/28/16Analyzer and automatic analyzer
01/28/16Plasma processing apparatus
01/28/16Plasma processing apparatus and plasma processing method
01/28/16Plasma processing apparatus and sample stage fabricating method
01/21/16Liquid feeder and chemical analyzer including same
01/21/16Method for reviewing a defect and apparatus
01/21/16Defect inspection method and defect inspection device
01/21/16Mass spectrometer system and method
01/21/16Data analysis plasma processing apparatus, plasma processing method and plasma processing apparatus
01/14/16Defect inspection using same
Social Network Patent Pack
01/14/16Charged particle beam apparatus
01/07/16Bioanalysis device and biomolecule analyzer
01/07/16Pattern-measuring apparatus and semiconductor-measuring system
01/07/16Charged particle beam apparatus, stage controlling method, and stage system
12/31/15Automatic analyzer
12/31/15Charged particle beam device, adjusting charged particle beam device, and inspecting or observing sample
12/24/15Nucleic acid amplifying device and detecting abnormal temperature regulating function
12/24/15Defect inspection device and defect inspection method
12/24/15Automatic analysis apparatus
12/24/15Automated analyzing apparatus
12/24/15Charged particle radiation apparatus
12/24/15Device for dust emitting of foreign matter and dust emission cause analysis device
12/24/15Measurement and inspection device
12/24/15Plasma processing apparatus
12/24/15Method and device for mass spectrometry
12/24/15Plasma processing apparatus and plasma processing method
12/17/15Centrifuging system, sample preprocessing system, and control method
12/17/15Biochemical cartridge, and biochemical cartridge and cartridge holder set
12/17/15Biomolecule measuring device
12/17/15Automatic analyzer
12/17/15Data analysis device and method therefor
12/17/15Charged particle beam application device
12/17/15Composite charged particle beam detector, charged particle beam device, and charged particle beam detector
12/10/15Surface measurement apparatus
12/10/15Inspection apparatus
12/10/15Electrochemical measurement device
12/10/15Charged particle beam device
12/10/15Charged particle beam device
12/10/15Charged particle beam apparatus and trajectory correction method in charged particle beam apparatus

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Hitachi High technologies Corporation in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Hitachi High technologies Corporation with additional patents listed. Browse our Agent directory for other possible listings. Page by