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Jeol Ltd patents


      
Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors



Scanning charged particle microscope, image acquisition method, and electron detection method

Jeol

Scanning charged particle microscope, image acquisition method, and electron detection method

Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12015002959301/29/15 new patent  Spherical aberration corrector, spherical aberration correction, and charged particle beam instrument
22015001452701/15/15Scanning charged particle microscope, image acquisition method, and electron detection method
32014037459412/25/14Detector and charged particle beam instrument
42014036758512/18/14Method for axial alignment of charged particle beam and charged particle beam system
52014034146911/20/14Image processing method, image processor, imager, and computer program
62014031290010/23/14Spinning controller for nmr sample tube
72014029039310/02/14Sample introduction device and charged particle beam instrument
82014022911808/14/14Method and sample analysis
92014018335807/03/14Phase plate and fabricating same
102014016687406/19/14Imaging mass spectrometer and controlling same
112014015890106/12/14Chromatic aberration corrector and electron microscope
122014015890706/12/14Specimen positioning device, charged particle beam system, and specimen holder
132014015891006/12/14Disinfecting device
142014013853605/22/14Mass spectrometer and controlling same
152014013853905/22/14Mass spectrometer and adjusting same
162014011283004/24/14Automated analyzer
172014009121604/03/14Sample analyzer
182014008415803/27/14Scanning electron microscope
192014007707603/20/14Time-of-flight mass spectrometer and controlling same
202014005446802/27/14Chromatic aberration corrector and controlling same
212013030685911/21/13Tandem time-of-flight mass spectrometer and mass spectrometry using the same
222013028989210/31/13Time-of-flight mass spectrometer and data compression method therefor
232013026612010/10/13Spectroscopic apparatus
242013024869909/26/13Method of adjusting transmission electron microscope
252013024163309/19/13Method and signal processing
262013020698708/15/13Transmission electron microscope
272013016854907/04/13Method of evacuating sample holder, pumping system, and electron microscope
282013013432505/30/13Ion beam processing system and sample processing method
292013004024102/14/13Method and system for charged particle beam lithography
302012031830212/20/12Instrument and clinical examinations and cleaning method therefor
312012029885511/29/12Apparatus and time-of-flight mass spectrometry
322012024160909/27/12Electron detecting mechanism and charged particle beam system equipped therewith
332012022815809/13/12Method and electrolyte measurements
342012018142507/19/12Electron probe microanalyzer and data processing method implemented therein
352012016099806/28/12Mass spectrometer
362012015676406/21/12Automated analyzer
372012013879306/07/12Method of making axial alignment of charged particle beam and charged particle beam system
382012012848405/24/12Turbomolecular pump and connector device therefor
392012011910705/17/12Method for axial alignment of charged particle beam and charged particle beam system
402012008590504/12/12Tandem time-of-flight mass spectrometer
412012006806203/22/12Method and tandem time-of-flight mass spectrometry
422012006159303/15/12Charged-particle beam lithographic apparatus and lithographic method therefor
432011029100312/01/11Mass spectrometer
442011028474511/24/11Sample holder, inspection apparatus, and inspection method
452011028475811/24/11Spherical aberration corrector and spherical aberration correction
462011028476011/24/11Synchrotron power cycling apparatus and use thereof
472011028476111/24/11Synchrotron power supply apparatus and use thereof
482011028476211/24/11Charged particle extraction apparatus and use thereof
492011024167410/06/11Sample tube and measurement solid-state nmr
502011022078609/15/11Tandem time-of-flight mass spectrometer
512011017496707/21/11Time-of-flight mass spectrometer
522011013998606/16/11Electron microscope
532011013307306/09/11Method and time-of-flight mass spectrometry
542011008017104/07/11Method and accurately adjusting magic angle in nmr
552011006232603/17/11Method and system for acquisition of confocal stem images
562011000620901/13/11Electron beam apparatus
572010032101812/23/10High-resolution nmr probe
582010029493211/25/10Magnetic domain imaging system
592010028451311/11/10Wavelength-dispersive x-ray spectrometer
602010024388809/30/10Apparatus and inspecting samples
612010022478109/09/10Electron microscope
622010017515407/08/10Apparatus for controlling z-position of probe
632010016374207/01/10Silicon drift x-ray detector
642010014047106/10/10Electron beam apparatus and operating the same
652010013344806/03/10Object-positioning device for charged-particle beam system
662010009654904/22/10Sample inspection apparatus, sample inspection method and sample inspection system
672010008456704/08/10Chromatic aberration corrector for charged-particle beam system and correction method therefor
682010007238703/25/10Aberration corrector and charged-particle beam system equipped therewith
692010007299503/25/10Nmr measurement method
702010005180303/04/10Particle beam system
712010001914601/28/10Specimen holder, specimen inspection apparatus, and specimen inspection method
722009031495512/24/09Specimen holder, specimen inspection apparatus, and specimen inspection method
732009031074812/17/09Method and analysis using x-ray spectra
742009026182910/22/09Nmr probe
752009025607410/15/09Apparatus and inspection
762009025060910/08/09Inspection method and reagent solution
772009024276210/01/09Apparatus and inspecting sample
782009023031609/17/09Method of suppressing beam position drift, suppressing beam dimension drift, and charged-particle beam lithography system
792009023031909/17/09Specimen stage-moving device for charged-particle beam system
802009022416909/10/09Scanning transmission electron microscope and aberration correction therefor
812009021220808/27/09Method and time-of-flight mass spectrometry
822009018906207/30/09Method of calibrating beam position in charged-particle beam system
832009016653607/02/09Sample holder, observation and inspection, and observation and inspection
842009015979706/25/09Transmission electron microscope
852009012113005/14/09Orthogonal acceleration time-of-flight mass spectrometer
862009012605105/14/09Method and system for sample preparation
872009009061904/09/09Thin-film deposition system
882009005755203/05/09Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
892009005262002/26/09Apparatus and x-ray analysis of chemical state
902009004533702/19/09Charged-particle beam instrument
912009003270902/05/09Aberration correction system
922009003273902/05/09Method and system for charged-particle beam lithography


ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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