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Jeol Ltd patents

Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors

Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12016014877905/26/16  new patent  Specimen preparation device
22016013939805/19/16 Specimen holder, specimen preparation device, and positioning method
32016013343405/12/16 Image evaluation method and charged particle beam device
42016011089604/21/16 Scatter diagram display device and surface analyzer
52016011124804/21/16 Electron microscope and elemental mapping image generation method
62016009765904/07/16 Information processing device and information processing method
72016009783204/07/16 Electron spin resonance apparatus
82016008676703/24/16 Information processing device and information processing method
92016007903003/17/16 Electron microscope and adjusting monochromator
102016007903103/17/16 Method of constructing 3d image, image processor, and electron microscope
112016007168303/10/16 Electron microscope and adjusting same
122016004783302/18/16 Sample rack conveying unit and automatic analysis system
132016004106402/11/16 Aberration computing device, aberration computing method, image processor, image processing method, and electron microscope
142016001969601/21/16 Device and computing amount of drift and charged particle beam system
152016002006601/21/16 Device and computing angular range for measurement of aberrations and electron microscope
162016002006701/21/16 Radiation analyzer
172016001301201/14/16 Charged particle beam system
182016000198101/07/16 Measuring container supplying device
192015036244612/17/15 Phase analyzer, phase analysis method, and surface analyzer
202015035520912/10/15 Automated analyzer
212015034607012/03/15 Flow analyzer and flow analysis method
222015033288911/19/15 Multipole lens, aberration corrector, and electron microscope
232015031438911/05/15 Machine and additive manufacturing
242015030666610/29/15 Additive manufacturing machine
252015030669910/29/15 Machine and additive manufacturing
262015030670010/29/15 Machine and additive manufacturing
272015030906010/29/15 Apparatus and automated analysis
282015031102810/29/15 Apparatus and sample preparation
292015031102910/29/15 Transmission electron microscope
302015030302710/22/15 Charged-particle beam lithographic system
312015028756610/08/15 Multipole lens, fabricating same, and charged particle beam system
322015027362210/01/15 Machine and additive manufacturing
332015027663010/01/15 X-ray spectrometer and sample analyzer
342015027695210/01/15 Radiation detector assembly and sample analyzer
352015027008809/24/15 Electron gun, controlling same, and electron beam additive manufacturing machine
362015025978509/17/15 Method of fabricating sample support membrane
372015026278509/17/15 Transmission electron microscope and displaying tem images
382015025524509/10/15 Charged particle beam system
392015021954708/06/15 Particle analysis instrument and computer program
402015020670307/23/15 Sample introduction device and charged particle beam instrument
412015016832106/18/15 Surface analysis instrument
422015016843506/18/15 Automated analyzer
432015016851806/18/15 Device for attaching and detaching nmr probe
442015013697805/21/15 Focused ion beam system and making focal adjustment of ion beam
452015013698005/21/15 Image acquisition method and transmission electron microscope
462015013700005/21/15 Charged particle beam instrument and sample container
472015013700105/21/15 Charged particle beam instrument
482015008391303/26/15 Radiation detector and sample analyzer
492015005797902/26/15 System and processing nmr signals
502015002959301/29/15 Spherical aberration corrector, spherical aberration correction, and charged particle beam instrument
512015001452701/15/15 Scanning charged particle microscope, image acquisition method, and electron detection method
522014037459412/25/14 Detector and charged particle beam instrument
532014036758512/18/14 Method for axial alignment of charged particle beam and charged particle beam system
542014034146911/20/14 Image processing method, image processor, imager, and computer program
552014031290010/23/14 Spinning controller for nmr sample tube
562014029039310/02/14 Sample introduction device and charged particle beam instrument
572014022911808/14/14 Method and sample analysis
582014018335807/03/14 Phase plate and fabricating same
592014016687406/19/14 Imaging mass spectrometer and controlling same
602014015890106/12/14 Chromatic aberration corrector and electron microscope
612014015890706/12/14 Specimen positioning device, charged particle beam system, and specimen holder
622014015891006/12/14 Disinfecting device
632014013853605/22/14 Mass spectrometer and controlling same
642014013853905/22/14 Mass spectrometer and adjusting same
652014011283004/24/14 Automated analyzer
662014009121604/03/14 Sample analyzer
672014008415803/27/14 Scanning electron microscope
682014007707603/20/14 Time-of-flight mass spectrometer and controlling same
692014005446802/27/14 Chromatic aberration corrector and controlling same
702013030685911/21/13 Tandem time-of-flight mass spectrometer and mass spectrometry using the same
712013028989210/31/13 Time-of-flight mass spectrometer and data compression method therefor
722013026612010/10/13 Spectroscopic apparatus
732013024869909/26/13 Method of adjusting transmission electron microscope
742013024163309/19/13 Method and signal processing
752013020698708/15/13 Transmission electron microscope
762013016854907/04/13 Method of evacuating sample holder, pumping system, and electron microscope
772013013432505/30/13 Ion beam processing system and sample processing method
782013004024102/14/13 Method and system for charged particle beam lithography
792012031830212/20/12 Instrument and clinical examinations and cleaning method therefor
802012029885511/29/12 Apparatus and time-of-flight mass spectrometry
812012024160909/27/12 Electron detecting mechanism and charged particle beam system equipped therewith
822012022815809/13/12 Method and electrolyte measurements
832012018142507/19/12 Electron probe microanalyzer and data processing method implemented therein
842012016099806/28/12 Mass spectrometer
852012015676406/21/12 Automated analyzer
862012013879306/07/12 Method of making axial alignment of charged particle beam and charged particle beam system
872012012848405/24/12 Turbomolecular pump and connector device therefor
882012011910705/17/12 Method for axial alignment of charged particle beam and charged particle beam system
892012008590504/12/12 Tandem time-of-flight mass spectrometer
902012006806203/22/12 Method and tandem time-of-flight mass spectrometry
912012006159303/15/12 Charged-particle beam lithographic apparatus and lithographic method therefor
922011029100312/01/11 Mass spectrometer
932011028474511/24/11 Sample holder, inspection apparatus, and inspection method
942011028475811/24/11 Spherical aberration corrector and spherical aberration correction
952011028476011/24/11 Synchrotron power cycling apparatus and use thereof
962011028476111/24/11 Synchrotron power supply apparatus and use thereof
972011028476211/24/11 Charged particle extraction apparatus and use thereof
982011024167410/06/11 Sample tube and measurement solid-state nmr
992011022078609/15/11 Tandem time-of-flight mass spectrometer
1002011017496707/21/11 Time-of-flight mass spectrometer
1012011013998606/16/11 Electron microscope
1022011013307306/09/11 Method and time-of-flight mass spectrometry
1032011008017104/07/11 Method and accurately adjusting magic angle in nmr
1042011006232603/17/11 Method and system for acquisition of confocal stem images
1052011000620901/13/11 Electron beam apparatus
1062010032101812/23/10 High-resolution nmr probe
1072010029493211/25/10 Magnetic domain imaging system
1082010028451311/11/10 Wavelength-dispersive x-ray spectrometer
1092010024388809/30/10 Apparatus and inspecting samples
1102010022478109/09/10 Electron microscope
1112010017515407/08/10 Apparatus for controlling z-position of probe
1122010016374207/01/10 Silicon drift x-ray detector
1132010014047106/10/10 Electron beam apparatus and operating the same
1142010013344806/03/10 Object-positioning device for charged-particle beam system
1152010009654904/22/10 Sample inspection apparatus, sample inspection method and sample inspection system
1162010008456704/08/10 Chromatic aberration corrector for charged-particle beam system and correction method therefor
1172010007238703/25/10 Aberration corrector and charged-particle beam system equipped therewith
1182010007299503/25/10 Nmr measurement method
1192010005180303/04/10 Particle beam system
1202010001914601/28/10 Specimen holder, specimen inspection apparatus, and specimen inspection method
1212009031495512/24/09 Specimen holder, specimen inspection apparatus, and specimen inspection method
1222009031074812/17/09 Method and analysis using x-ray spectra
1232009026182910/22/09 Nmr probe
1242009025607410/15/09 Apparatus and inspection
1252009025060910/08/09 Inspection method and reagent solution
1262009024276210/01/09 Apparatus and inspecting sample
1272009023031609/17/09 Method of suppressing beam position drift, suppressing beam dimension drift, and charged-particle beam lithography system
1282009023031909/17/09 Specimen stage-moving device for charged-particle beam system
1292009022416909/10/09 Scanning transmission electron microscope and aberration correction therefor
1302009021220808/27/09 Method and time-of-flight mass spectrometry
1312009018906207/30/09 Method of calibrating beam position in charged-particle beam system
1322009016653607/02/09 Sample holder, observation and inspection, and observation and inspection
1332009015979706/25/09 Transmission electron microscope
1342009012113005/14/09 Orthogonal acceleration time-of-flight mass spectrometer
1352009012605105/14/09 Method and system for sample preparation
1362009009061904/09/09 Thin-film deposition system
1372009005755203/05/09 Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
1382009005262002/26/09 Apparatus and x-ray analysis of chemical state
1392009004533702/19/09 Charged-particle beam instrument
1402009003270902/05/09 Aberration correction system
1412009003273902/05/09 Method and system for charged-particle beam lithography

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by