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Jeol Ltd patents

Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors

Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12015033288911/19/15 Multipole lens, aberration corrector, and electron microscope
22015031438911/05/15 Machine and additive manufacturing
32015030666610/29/15 Additive manufacturing machine
42015030669910/29/15 Machine and additive manufacturing
52015030670010/29/15 Machine and additive manufacturing
62015030906010/29/15 Apparatus and automated analysis
72015031102810/29/15 Apparatus and sample preparation
82015031102910/29/15 Transmission electron microscope
92015030302710/22/15 Charged-particle beam lithographic system
102015028756610/08/15 Multipole lens, fabricating same, and charged particle beam system
112015027362210/01/15 Machine and additive manufacturing
122015027663010/01/15 X-ray spectrometer and sample analyzer
132015027695210/01/15 Radiation detector assembly and sample analyzer
142015027008809/24/15 Electron gun, controlling same, and electron beam additive manufacturing machine
152015025978509/17/15 Method of fabricating sample support membrane
162015026278509/17/15 Transmission electron microscope and displaying tem images
172015025524509/10/15 Charged particle beam system
182015021954708/06/15 Particle analysis instrument and computer program
192015020670307/23/15 Sample introduction device and charged particle beam instrument
202015016832106/18/15 Surface analysis instrument
212015016843506/18/15 Automated analyzer
222015016851806/18/15 Device for attaching and detaching nmr probe
232015013697805/21/15 Focused ion beam system and making focal adjustment of ion beam
242015013698005/21/15 Image acquisition method and transmission electron microscope
252015013700005/21/15 Charged particle beam instrument and sample container
262015013700105/21/15 Charged particle beam instrument
272015008391303/26/15 Radiation detector and sample analyzer
282015005797902/26/15 System and processing nmr signals
292015002959301/29/15 Spherical aberration corrector, spherical aberration correction, and charged particle beam instrument
302015001452701/15/15 Scanning charged particle microscope, image acquisition method, and electron detection method
312014037459412/25/14 Detector and charged particle beam instrument
322014036758512/18/14 Method for axial alignment of charged particle beam and charged particle beam system
332014034146911/20/14 Image processing method, image processor, imager, and computer program
342014031290010/23/14 Spinning controller for nmr sample tube
352014029039310/02/14 Sample introduction device and charged particle beam instrument
362014022911808/14/14 Method and sample analysis
372014018335807/03/14 Phase plate and fabricating same
382014016687406/19/14 Imaging mass spectrometer and controlling same
392014015890106/12/14 Chromatic aberration corrector and electron microscope
402014015890706/12/14 Specimen positioning device, charged particle beam system, and specimen holder
412014015891006/12/14 Disinfecting device
422014013853605/22/14 Mass spectrometer and controlling same
432014013853905/22/14 Mass spectrometer and adjusting same
442014011283004/24/14 Automated analyzer
452014009121604/03/14 Sample analyzer
462014008415803/27/14 Scanning electron microscope
472014007707603/20/14 Time-of-flight mass spectrometer and controlling same
482014005446802/27/14 Chromatic aberration corrector and controlling same
492013030685911/21/13 Tandem time-of-flight mass spectrometer and mass spectrometry using the same
502013028989210/31/13 Time-of-flight mass spectrometer and data compression method therefor
512013026612010/10/13 Spectroscopic apparatus
522013024869909/26/13 Method of adjusting transmission electron microscope
532013024163309/19/13 Method and signal processing
542013020698708/15/13 Transmission electron microscope
552013016854907/04/13 Method of evacuating sample holder, pumping system, and electron microscope
562013013432505/30/13 Ion beam processing system and sample processing method
572013004024102/14/13 Method and system for charged particle beam lithography
582012031830212/20/12 Instrument and clinical examinations and cleaning method therefor
592012029885511/29/12 Apparatus and time-of-flight mass spectrometry
602012024160909/27/12 Electron detecting mechanism and charged particle beam system equipped therewith
612012022815809/13/12 Method and electrolyte measurements
622012018142507/19/12 Electron probe microanalyzer and data processing method implemented therein
632012016099806/28/12 Mass spectrometer
642012015676406/21/12 Automated analyzer
652012013879306/07/12 Method of making axial alignment of charged particle beam and charged particle beam system
662012012848405/24/12 Turbomolecular pump and connector device therefor
672012011910705/17/12 Method for axial alignment of charged particle beam and charged particle beam system
682012008590504/12/12 Tandem time-of-flight mass spectrometer
692012006806203/22/12 Method and tandem time-of-flight mass spectrometry
702012006159303/15/12 Charged-particle beam lithographic apparatus and lithographic method therefor
712011029100312/01/11 Mass spectrometer
722011028474511/24/11 Sample holder, inspection apparatus, and inspection method
732011028475811/24/11 Spherical aberration corrector and spherical aberration correction
742011028476011/24/11 Synchrotron power cycling apparatus and use thereof
752011028476111/24/11 Synchrotron power supply apparatus and use thereof
762011028476211/24/11 Charged particle extraction apparatus and use thereof
772011024167410/06/11 Sample tube and measurement solid-state nmr
782011022078609/15/11 Tandem time-of-flight mass spectrometer
792011017496707/21/11 Time-of-flight mass spectrometer
802011013998606/16/11 Electron microscope
812011013307306/09/11 Method and time-of-flight mass spectrometry
822011008017104/07/11 Method and accurately adjusting magic angle in nmr
832011006232603/17/11 Method and system for acquisition of confocal stem images
842011000620901/13/11 Electron beam apparatus
852010032101812/23/10 High-resolution nmr probe
862010029493211/25/10 Magnetic domain imaging system
872010028451311/11/10 Wavelength-dispersive x-ray spectrometer
882010024388809/30/10 Apparatus and inspecting samples
892010022478109/09/10 Electron microscope
902010017515407/08/10 Apparatus for controlling z-position of probe
912010016374207/01/10 Silicon drift x-ray detector
922010014047106/10/10 Electron beam apparatus and operating the same
932010013344806/03/10 Object-positioning device for charged-particle beam system
942010009654904/22/10 Sample inspection apparatus, sample inspection method and sample inspection system
952010008456704/08/10 Chromatic aberration corrector for charged-particle beam system and correction method therefor
962010007238703/25/10 Aberration corrector and charged-particle beam system equipped therewith
972010007299503/25/10 Nmr measurement method
982010005180303/04/10 Particle beam system
992010001914601/28/10 Specimen holder, specimen inspection apparatus, and specimen inspection method
1002009031495512/24/09 Specimen holder, specimen inspection apparatus, and specimen inspection method
1012009031074812/17/09 Method and analysis using x-ray spectra
1022009026182910/22/09 Nmr probe
1032009025607410/15/09 Apparatus and inspection
1042009025060910/08/09 Inspection method and reagent solution
1052009024276210/01/09 Apparatus and inspecting sample
1062009023031609/17/09 Method of suppressing beam position drift, suppressing beam dimension drift, and charged-particle beam lithography system
1072009023031909/17/09 Specimen stage-moving device for charged-particle beam system
1082009022416909/10/09 Scanning transmission electron microscope and aberration correction therefor
1092009021220808/27/09 Method and time-of-flight mass spectrometry
1102009018906207/30/09 Method of calibrating beam position in charged-particle beam system
1112009016653607/02/09 Sample holder, observation and inspection, and observation and inspection
1122009015979706/25/09 Transmission electron microscope
1132009012113005/14/09 Orthogonal acceleration time-of-flight mass spectrometer
1142009012605105/14/09 Method and system for sample preparation
1152009009061904/09/09 Thin-film deposition system
1162009005755203/05/09 Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
1172009005262002/26/09 Apparatus and x-ray analysis of chemical state
1182009004533702/19/09 Charged-particle beam instrument
1192009003270902/05/09 Aberration correction system
1202009003273902/05/09 Method and system for charged-particle beam lithography

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by