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Jeol Ltd patents

Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors

Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12016011089604/21/16 Scatter diagram display device and surface analyzer
22016011124804/21/16 Electron microscope and elemental mapping image generation method
32016009765904/07/16 Information processing device and information processing method
42016009783204/07/16 Electron spin resonance apparatus
52016008676703/24/16 Information processing device and information processing method
62016007903003/17/16 Electron microscope and adjusting monochromator
72016007903103/17/16 Method of constructing 3d image, image processor, and electron microscope
82016007168303/10/16 Electron microscope and adjusting same
92016004783302/18/16 Sample rack conveying unit and automatic analysis system
102016004106402/11/16 Aberration computing device, aberration computing method, image processor, image processing method, and electron microscope
112016001969601/21/16 Device and computing amount of drift and charged particle beam system
122016002006601/21/16 Device and computing angular range for measurement of aberrations and electron microscope
132016002006701/21/16 Radiation analyzer
142016001301201/14/16 Charged particle beam system
152016000198101/07/16 Measuring container supplying device
162015036244612/17/15 Phase analyzer, phase analysis method, and surface analyzer
172015035520912/10/15 Automated analyzer
182015034607012/03/15 Flow analyzer and flow analysis method
192015033288911/19/15 Multipole lens, aberration corrector, and electron microscope
202015031438911/05/15 Machine and additive manufacturing
212015030666610/29/15 Additive manufacturing machine
222015030669910/29/15 Machine and additive manufacturing
232015030670010/29/15 Machine and additive manufacturing
242015030906010/29/15 Apparatus and automated analysis
252015031102810/29/15 Apparatus and sample preparation
262015031102910/29/15 Transmission electron microscope
272015030302710/22/15 Charged-particle beam lithographic system
282015028756610/08/15 Multipole lens, fabricating same, and charged particle beam system
292015027362210/01/15 Machine and additive manufacturing
302015027663010/01/15 X-ray spectrometer and sample analyzer
312015027695210/01/15 Radiation detector assembly and sample analyzer
322015027008809/24/15 Electron gun, controlling same, and electron beam additive manufacturing machine
332015025978509/17/15 Method of fabricating sample support membrane
342015026278509/17/15 Transmission electron microscope and displaying tem images
352015025524509/10/15 Charged particle beam system
362015021954708/06/15 Particle analysis instrument and computer program
372015020670307/23/15 Sample introduction device and charged particle beam instrument
382015016832106/18/15 Surface analysis instrument
392015016843506/18/15 Automated analyzer
402015016851806/18/15 Device for attaching and detaching nmr probe
412015013697805/21/15 Focused ion beam system and making focal adjustment of ion beam
422015013698005/21/15 Image acquisition method and transmission electron microscope
432015013700005/21/15 Charged particle beam instrument and sample container
442015013700105/21/15 Charged particle beam instrument
452015008391303/26/15 Radiation detector and sample analyzer
462015005797902/26/15 System and processing nmr signals
472015002959301/29/15 Spherical aberration corrector, spherical aberration correction, and charged particle beam instrument
482015001452701/15/15 Scanning charged particle microscope, image acquisition method, and electron detection method
492014037459412/25/14 Detector and charged particle beam instrument
502014036758512/18/14 Method for axial alignment of charged particle beam and charged particle beam system
512014034146911/20/14 Image processing method, image processor, imager, and computer program
522014031290010/23/14 Spinning controller for nmr sample tube
532014029039310/02/14 Sample introduction device and charged particle beam instrument
542014022911808/14/14 Method and sample analysis
552014018335807/03/14 Phase plate and fabricating same
562014016687406/19/14 Imaging mass spectrometer and controlling same
572014015890106/12/14 Chromatic aberration corrector and electron microscope
582014015890706/12/14 Specimen positioning device, charged particle beam system, and specimen holder
592014015891006/12/14 Disinfecting device
602014013853605/22/14 Mass spectrometer and controlling same
612014013853905/22/14 Mass spectrometer and adjusting same
622014011283004/24/14 Automated analyzer
632014009121604/03/14 Sample analyzer
642014008415803/27/14 Scanning electron microscope
652014007707603/20/14 Time-of-flight mass spectrometer and controlling same
662014005446802/27/14 Chromatic aberration corrector and controlling same
672013030685911/21/13 Tandem time-of-flight mass spectrometer and mass spectrometry using the same
682013028989210/31/13 Time-of-flight mass spectrometer and data compression method therefor
692013026612010/10/13 Spectroscopic apparatus
702013024869909/26/13 Method of adjusting transmission electron microscope
712013024163309/19/13 Method and signal processing
722013020698708/15/13 Transmission electron microscope
732013016854907/04/13 Method of evacuating sample holder, pumping system, and electron microscope
742013013432505/30/13 Ion beam processing system and sample processing method
752013004024102/14/13 Method and system for charged particle beam lithography
762012031830212/20/12 Instrument and clinical examinations and cleaning method therefor
772012029885511/29/12 Apparatus and time-of-flight mass spectrometry
782012024160909/27/12 Electron detecting mechanism and charged particle beam system equipped therewith
792012022815809/13/12 Method and electrolyte measurements
802012018142507/19/12 Electron probe microanalyzer and data processing method implemented therein
812012016099806/28/12 Mass spectrometer
822012015676406/21/12 Automated analyzer
832012013879306/07/12 Method of making axial alignment of charged particle beam and charged particle beam system
842012012848405/24/12 Turbomolecular pump and connector device therefor
852012011910705/17/12 Method for axial alignment of charged particle beam and charged particle beam system
862012008590504/12/12 Tandem time-of-flight mass spectrometer
872012006806203/22/12 Method and tandem time-of-flight mass spectrometry
882012006159303/15/12 Charged-particle beam lithographic apparatus and lithographic method therefor
892011029100312/01/11 Mass spectrometer
902011028474511/24/11 Sample holder, inspection apparatus, and inspection method
912011028475811/24/11 Spherical aberration corrector and spherical aberration correction
922011028476011/24/11 Synchrotron power cycling apparatus and use thereof
932011028476111/24/11 Synchrotron power supply apparatus and use thereof
942011028476211/24/11 Charged particle extraction apparatus and use thereof
952011024167410/06/11 Sample tube and measurement solid-state nmr
962011022078609/15/11 Tandem time-of-flight mass spectrometer
972011017496707/21/11 Time-of-flight mass spectrometer
982011013998606/16/11 Electron microscope
992011013307306/09/11 Method and time-of-flight mass spectrometry
1002011008017104/07/11 Method and accurately adjusting magic angle in nmr
1012011006232603/17/11 Method and system for acquisition of confocal stem images
1022011000620901/13/11 Electron beam apparatus
1032010032101812/23/10 High-resolution nmr probe
1042010029493211/25/10 Magnetic domain imaging system
1052010028451311/11/10 Wavelength-dispersive x-ray spectrometer
1062010024388809/30/10 Apparatus and inspecting samples
1072010022478109/09/10 Electron microscope
1082010017515407/08/10 Apparatus for controlling z-position of probe
1092010016374207/01/10 Silicon drift x-ray detector
1102010014047106/10/10 Electron beam apparatus and operating the same
1112010013344806/03/10 Object-positioning device for charged-particle beam system
1122010009654904/22/10 Sample inspection apparatus, sample inspection method and sample inspection system
1132010008456704/08/10 Chromatic aberration corrector for charged-particle beam system and correction method therefor
1142010007238703/25/10 Aberration corrector and charged-particle beam system equipped therewith
1152010007299503/25/10 Nmr measurement method
1162010005180303/04/10 Particle beam system
1172010001914601/28/10 Specimen holder, specimen inspection apparatus, and specimen inspection method
1182009031495512/24/09 Specimen holder, specimen inspection apparatus, and specimen inspection method
1192009031074812/17/09 Method and analysis using x-ray spectra
1202009026182910/22/09 Nmr probe
1212009025607410/15/09 Apparatus and inspection
1222009025060910/08/09 Inspection method and reagent solution
1232009024276210/01/09 Apparatus and inspecting sample
1242009023031609/17/09 Method of suppressing beam position drift, suppressing beam dimension drift, and charged-particle beam lithography system
1252009023031909/17/09 Specimen stage-moving device for charged-particle beam system
1262009022416909/10/09 Scanning transmission electron microscope and aberration correction therefor
1272009021220808/27/09 Method and time-of-flight mass spectrometry
1282009018906207/30/09 Method of calibrating beam position in charged-particle beam system
1292009016653607/02/09 Sample holder, observation and inspection, and observation and inspection
1302009015979706/25/09 Transmission electron microscope
1312009012113005/14/09 Orthogonal acceleration time-of-flight mass spectrometer
1322009012605105/14/09 Method and system for sample preparation
1332009009061904/09/09 Thin-film deposition system
1342009005755203/05/09 Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
1352009005262002/26/09 Apparatus and x-ray analysis of chemical state
1362009004533702/19/09 Charged-particle beam instrument
1372009003270902/05/09 Aberration correction system
1382009003273902/05/09 Method and system for charged-particle beam lithography

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by