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Jeol Ltd patents


      
Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors



Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12014018335807/03/14Phase plate and method of fabricating same
22014016687406/19/14Imaging mass spectrometer and method of controlling same
32014015890106/12/14Chromatic aberration corrector and electron microscope
42014015890706/12/14Specimen positioning device, charged particle beam system, and specimen holder
52014015891006/12/14Disinfecting device
62014013853605/22/14Mass spectrometer and method of controlling same
72014013853905/22/14Mass spectrometer and method of adjusting same
82014013853605/22/14Mass spectrometer and method of controlling same
92014013853905/22/14Mass spectrometer and method of adjusting same
102014011283004/24/14Automated analyzer
112014011283004/24/14Automated analyzer
122014009121604/03/14Sample analyzer
132014009121604/03/14Sample analyzer
142014008415803/27/14Scanning electron microscope
152014008415803/27/14Scanning electron microscope
162014007707603/20/14Time-of-flight mass spectrometer and method of controlling same
172014007707603/20/14Time-of-flight mass spectrometer and method of controlling same
182014005446802/27/14Chromatic aberration corrector and method of controlling same
192013030685911/21/13Tandem time-of-flight mass spectrometer and method of mass spectrometry using the same
202013028989210/31/13Time-of-flight mass spectrometer and data compression method therefor
212013026612010/10/13Spectroscopic apparatus
222013024869909/26/13Method of adjusting transmission electron microscope
232013024163309/19/13Method and apparatus for signal processing
242013020698708/15/13Transmission electron microscope
252013020698708/15/13Transmission electron microscope
262013016854907/04/13Method of evacuating sample holder, pumping system, and electron microscope
272013016854907/04/13Method of evacuating sample holder, pumping system, and electron microscope
282013013432505/30/13Ion beam processing system and sample processing method
292013013432505/30/13Ion beam processing system and sample processing method
302013004024102/14/13Method and system for charged particle beam lithography
312012031830212/20/12Instrument and method for clinical examinations and cleaning method therefor
322012029885511/29/12Apparatus and method for time-of-flight mass spectrometry
332012024160909/27/12Electron detecting mechanism and charged particle beam system equipped therewith
342012022815809/13/12Method and apparatus for electrolyte measurements
352012018142507/19/12Electron probe microanalyzer and data processing method implemented therein
362012016099806/28/12Mass spectrometer
372012015676406/21/12Automated analyzer
382012013879306/07/12Method of making axial alignment of charged particle beam and charged particle beam system
392012012848405/24/12Turbomolecular pump and connector device therefor
402012011910705/17/12Method for axial alignment of charged particle beam and charged particle beam system
412012008590504/12/12Tandem time-of-flight mass spectrometer
422012006806203/22/12Method and apparatus for tandem time-of-flight mass spectrometry
432012006159303/15/12Charged-particle beam lithographic apparatus and lithographic method therefor
442011029100312/01/11Mass spectrometer
452011028474511/24/11Sample holder, inspection apparatus, and inspection method
462011028475811/24/11Spherical aberration corrector and method of spherical aberration correction
472011028476011/24/11Synchrotron power cycling apparatus and method of use thereof
482011028476111/24/11Synchrotron power supply apparatus and method of use thereof
492011028476211/24/11Charged particle extraction apparatus and method of use thereof
502011024167410/06/11Sample tube and measurement method for solid-state nmr
512011022078609/15/11Tandem time-of-flight mass spectrometer
522011017496707/21/11Time-of-flight mass spectrometer
532011013998606/16/11Electron microscope
542011013307306/09/11Method and apparatus for time-of-flight mass spectrometry
552011008017104/07/11Method and apparatus for accurately adjusting magic angle in nmr
562011006232603/17/11Method and system for acquisition of confocal stem images
572011000620901/13/11Electron beam apparatus
582010032101812/23/10High-resolution nmr probe
592010029493211/25/10Magnetic domain imaging system
602010028451311/11/10Wavelength-dispersive x-ray spectrometer
612010024388809/30/10Apparatus and method for inspecting samples
622010022478109/09/10Electron microscope
632010017515407/08/10Apparatus for controlling z-position of probe
642010016374207/01/10Silicon drift x-ray detector
652010014047106/10/10Electron beam apparatus and method of operating the same
662010013344806/03/10Object-positioning device for charged-particle beam system
672010009654904/22/10Sample inspection apparatus, sample inspection method and sample inspection system
682010008456704/08/10Chromatic aberration corrector for charged-particle beam system and correction method therefor
692010007238703/25/10Aberration corrector and charged-particle beam system equipped therewith
702010007299503/25/10Nmr measurement method
712010005180303/04/10Particle beam system
722010001914601/28/10Specimen holder, specimen inspection apparatus, and specimen inspection method
732009031495512/24/09Specimen holder, specimen inspection apparatus, and specimen inspection method
742009031074812/17/09Method and apparatus for analysis using x-ray spectra
752009026182910/22/09Nmr probe
762009025607410/15/09Apparatus and method for inspection
772009025060910/08/09Inspection method and reagent solution
782009024276210/01/09Apparatus and method for inspecting sample
792009023031609/17/09Method of suppressing beam position drift, method of suppressing beam dimension drift, and charged-particle beam lithography system
802009023031909/17/09Specimen stage-moving device for charged-particle beam system
812009022416909/10/09Scanning transmission electron microscope and method of aberration correction therefor
822009021220808/27/09Method and apparatus for time-of-flight mass spectrometry
832009018906207/30/09Method of calibrating beam position in charged-particle beam system
842009016653607/02/09Sample holder, method for observation and inspection, and apparatus for observation and inspection
852009015979706/25/09Transmission electron microscope
862009012113005/14/09Orthogonal acceleration time-of-flight mass spectrometer
872009012605105/14/09Method and system for sample preparation
882009009061904/09/09Thin-film deposition system
892009005755203/05/09Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
902009005262002/26/09Apparatus and method for x-ray analysis of chemical state
912009004533702/19/09Charged-particle beam instrument
922009003270902/05/09Aberration correction system
932009003273902/05/09Method and system for charged-particle beam lithography


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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