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Jeol Ltd patents

Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors

Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12016016992506/16/16 Measurement-container supply device
22016016350106/09/16 Charged particle beam device and image acquisition method
32016016350706/09/16 Deposition method and focused ion beam system
42016015401706/02/16 Gripping mechanism
52016014877905/26/16 Specimen preparation device
62016013939805/19/16 Specimen holder, specimen preparation device, and positioning method
72016013343405/12/16 Image evaluation method and charged particle beam device
82016011089604/21/16 Scatter diagram display device and surface analyzer
92016011124804/21/16 Electron microscope and elemental mapping image generation method
102016009765904/07/16 Information processing device and information processing method
112016009783204/07/16 Electron spin resonance apparatus
122016008676703/24/16 Information processing device and information processing method
132016007903003/17/16 Electron microscope and adjusting monochromator
142016007903103/17/16 Method of constructing 3d image, image processor, and electron microscope
152016007168303/10/16 Electron microscope and adjusting same
162016004783302/18/16 Sample rack conveying unit and automatic analysis system
172016004106402/11/16 Aberration computing device, aberration computing method, image processor, image processing method, and electron microscope
182016001969601/21/16 Device and computing amount of drift and charged particle beam system
192016002006601/21/16 Device and computing angular range for measurement of aberrations and electron microscope
202016002006701/21/16 Radiation analyzer
212016001301201/14/16 Charged particle beam system
222016000198101/07/16 Measuring container supplying device
232015036244612/17/15 Phase analyzer, phase analysis method, and surface analyzer
242015035520912/10/15 Automated analyzer
252015034607012/03/15 Flow analyzer and flow analysis method
262015033288911/19/15 Multipole lens, aberration corrector, and electron microscope
272015031438911/05/15 Machine and additive manufacturing
282015030666610/29/15 Additive manufacturing machine
292015030669910/29/15 Machine and additive manufacturing
302015030670010/29/15 Machine and additive manufacturing
312015030906010/29/15 Apparatus and automated analysis
322015031102810/29/15 Apparatus and sample preparation
332015031102910/29/15 Transmission electron microscope
342015030302710/22/15 Charged-particle beam lithographic system
352015028756610/08/15 Multipole lens, fabricating same, and charged particle beam system
362015027362210/01/15 Machine and additive manufacturing
372015027663010/01/15 X-ray spectrometer and sample analyzer
382015027695210/01/15 Radiation detector assembly and sample analyzer
392015027008809/24/15 Electron gun, controlling same, and electron beam additive manufacturing machine
402015025978509/17/15 Method of fabricating sample support membrane
412015026278509/17/15 Transmission electron microscope and displaying tem images
422015025524509/10/15 Charged particle beam system
432015021954708/06/15 Particle analysis instrument and computer program
442015020670307/23/15 Sample introduction device and charged particle beam instrument
452015016832106/18/15 Surface analysis instrument
462015016843506/18/15 Automated analyzer
472015016851806/18/15 Device for attaching and detaching nmr probe
482015013697805/21/15 Focused ion beam system and making focal adjustment of ion beam
492015013698005/21/15 Image acquisition method and transmission electron microscope
502015013700005/21/15 Charged particle beam instrument and sample container
512015013700105/21/15 Charged particle beam instrument
522015008391303/26/15 Radiation detector and sample analyzer
532015005797902/26/15 System and processing nmr signals
542015002959301/29/15 Spherical aberration corrector, spherical aberration correction, and charged particle beam instrument
552015001452701/15/15 Scanning charged particle microscope, image acquisition method, and electron detection method
562014037459412/25/14 Detector and charged particle beam instrument
572014036758512/18/14 Method for axial alignment of charged particle beam and charged particle beam system
582014034146911/20/14 Image processing method, image processor, imager, and computer program
592014031290010/23/14 Spinning controller for nmr sample tube
602014029039310/02/14 Sample introduction device and charged particle beam instrument
612014022911808/14/14 Method and sample analysis
622014018335807/03/14 Phase plate and fabricating same
632014016687406/19/14 Imaging mass spectrometer and controlling same
642014015890106/12/14 Chromatic aberration corrector and electron microscope
652014015890706/12/14 Specimen positioning device, charged particle beam system, and specimen holder
662014015891006/12/14 Disinfecting device
672014013853605/22/14 Mass spectrometer and controlling same
682014013853905/22/14 Mass spectrometer and adjusting same
692014011283004/24/14 Automated analyzer
702014009121604/03/14 Sample analyzer
712014008415803/27/14 Scanning electron microscope
722014007707603/20/14 Time-of-flight mass spectrometer and controlling same
732014005446802/27/14 Chromatic aberration corrector and controlling same
742013030685911/21/13 Tandem time-of-flight mass spectrometer and mass spectrometry using the same
752013028989210/31/13 Time-of-flight mass spectrometer and data compression method therefor
762013026612010/10/13 Spectroscopic apparatus
772013024869909/26/13 Method of adjusting transmission electron microscope
782013024163309/19/13 Method and signal processing
792013020698708/15/13 Transmission electron microscope
802013016854907/04/13 Method of evacuating sample holder, pumping system, and electron microscope
812013013432505/30/13 Ion beam processing system and sample processing method
822013004024102/14/13 Method and system for charged particle beam lithography
832012031830212/20/12 Instrument and clinical examinations and cleaning method therefor
842012029885511/29/12 Apparatus and time-of-flight mass spectrometry
852012024160909/27/12 Electron detecting mechanism and charged particle beam system equipped therewith
862012022815809/13/12 Method and electrolyte measurements
872012018142507/19/12 Electron probe microanalyzer and data processing method implemented therein
882012016099806/28/12 Mass spectrometer
892012015676406/21/12 Automated analyzer
902012013879306/07/12 Method of making axial alignment of charged particle beam and charged particle beam system
912012012848405/24/12 Turbomolecular pump and connector device therefor
922012011910705/17/12 Method for axial alignment of charged particle beam and charged particle beam system
932012008590504/12/12 Tandem time-of-flight mass spectrometer
942012006806203/22/12 Method and tandem time-of-flight mass spectrometry
952012006159303/15/12 Charged-particle beam lithographic apparatus and lithographic method therefor
962011029100312/01/11 Mass spectrometer
972011028474511/24/11 Sample holder, inspection apparatus, and inspection method
982011028475811/24/11 Spherical aberration corrector and spherical aberration correction
992011028476011/24/11 Synchrotron power cycling apparatus and use thereof
1002011028476111/24/11 Synchrotron power supply apparatus and use thereof
1012011028476211/24/11 Charged particle extraction apparatus and use thereof
1022011024167410/06/11 Sample tube and measurement solid-state nmr
1032011022078609/15/11 Tandem time-of-flight mass spectrometer
1042011017496707/21/11 Time-of-flight mass spectrometer
1052011013998606/16/11 Electron microscope
1062011013307306/09/11 Method and time-of-flight mass spectrometry
1072011008017104/07/11 Method and accurately adjusting magic angle in nmr
1082011006232603/17/11 Method and system for acquisition of confocal stem images
1092011000620901/13/11 Electron beam apparatus
1102010032101812/23/10 High-resolution nmr probe
1112010029493211/25/10 Magnetic domain imaging system
1122010028451311/11/10 Wavelength-dispersive x-ray spectrometer
1132010024388809/30/10 Apparatus and inspecting samples
1142010022478109/09/10 Electron microscope
1152010017515407/08/10 Apparatus for controlling z-position of probe
1162010016374207/01/10 Silicon drift x-ray detector
1172010014047106/10/10 Electron beam apparatus and operating the same
1182010013344806/03/10 Object-positioning device for charged-particle beam system
1192010009654904/22/10 Sample inspection apparatus, sample inspection method and sample inspection system
1202010008456704/08/10 Chromatic aberration corrector for charged-particle beam system and correction method therefor
1212010007238703/25/10 Aberration corrector and charged-particle beam system equipped therewith
1222010007299503/25/10 Nmr measurement method
1232010005180303/04/10 Particle beam system
1242010001914601/28/10 Specimen holder, specimen inspection apparatus, and specimen inspection method
1252009031495512/24/09 Specimen holder, specimen inspection apparatus, and specimen inspection method
1262009031074812/17/09 Method and analysis using x-ray spectra
1272009026182910/22/09 Nmr probe
1282009025607410/15/09 Apparatus and inspection
1292009025060910/08/09 Inspection method and reagent solution
1302009024276210/01/09 Apparatus and inspecting sample
1312009023031609/17/09 Method of suppressing beam position drift, suppressing beam dimension drift, and charged-particle beam lithography system
1322009023031909/17/09 Specimen stage-moving device for charged-particle beam system
1332009022416909/10/09 Scanning transmission electron microscope and aberration correction therefor
1342009021220808/27/09 Method and time-of-flight mass spectrometry
1352009018906207/30/09 Method of calibrating beam position in charged-particle beam system
1362009016653607/02/09 Sample holder, observation and inspection, and observation and inspection
1372009015979706/25/09 Transmission electron microscope
1382009012113005/14/09 Orthogonal acceleration time-of-flight mass spectrometer
1392009012605105/14/09 Method and system for sample preparation
1402009009061904/09/09 Thin-film deposition system
1412009005755203/05/09 Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
1422009005262002/26/09 Apparatus and x-ray analysis of chemical state
1432009004533702/19/09 Charged-particle beam instrument
1442009003270902/05/09 Aberration correction system
1452009003273902/05/09 Method and system for charged-particle beam lithography

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by