FreshPatents.com Logo


new TOP 200 Companies filing patents this week

new Companies with the Most Patent Filings (2010+)


Popular
Companies


Web
Adobe patents
Amazon patents
Apple patents
Ebay patents
Facebook patents
Google patents
IBM patents
Linkedin patents
Microsoft patents
Oracle patents
Red Hat patents
Yahoo patents

Food/Health
Adidas
Nike patents
Pfizer patents
Monsanto patents
Medtronic patents
Kraft patents

Transportation
Boeing patents
Tesla Motors patents

Telecom
Qualcomm patents
Motorola patents
Nokia patents
RIMM patents

Industrial/Electronics
AMD
Applied Materials
Seagate patents
General Electric
Caterpillar patents
Samsung
Wal-mart patents

Jeol Ltd patents


      
Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors


Device for attaching and detaching nmr probe

Jeol

Device for attaching and detaching nmr probe

Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12015016832106/18/15Surface analysis instrument
22015016843506/18/15Automated analyzer
32015016851806/18/15Device for attaching and detaching nmr probe
42015013697805/21/15Focused ion beam system and making focal adjustment of ion beam
52015013698005/21/15Image acquisition method and transmission electron microscope
62015013700005/21/15Charged particle beam instrument and sample container
72015013700105/21/15Charged particle beam instrument
82015008391303/26/15Radiation detector and sample analyzer
92015005797902/26/15System and processing nmr signals
102015002959301/29/15Spherical aberration corrector, spherical aberration correction, and charged particle beam instrument
112015001452701/15/15Scanning charged particle microscope, image acquisition method, and electron detection method
122014037459412/25/14Detector and charged particle beam instrument
132014036758512/18/14Method for axial alignment of charged particle beam and charged particle beam system
142014034146911/20/14Image processing method, image processor, imager, and computer program
152014031290010/23/14Spinning controller for nmr sample tube
162014029039310/02/14Sample introduction device and charged particle beam instrument
172014022911808/14/14Method and sample analysis
182014018335807/03/14Phase plate and fabricating same
192014016687406/19/14Imaging mass spectrometer and controlling same
202014015890106/12/14Chromatic aberration corrector and electron microscope
212014015890706/12/14Specimen positioning device, charged particle beam system, and specimen holder
222014015891006/12/14Disinfecting device
232014013853605/22/14Mass spectrometer and controlling same
242014013853905/22/14Mass spectrometer and adjusting same
252014011283004/24/14Automated analyzer
262014009121604/03/14Sample analyzer
272014008415803/27/14Scanning electron microscope
282014007707603/20/14Time-of-flight mass spectrometer and controlling same
292014005446802/27/14Chromatic aberration corrector and controlling same
302013030685911/21/13Tandem time-of-flight mass spectrometer and mass spectrometry using the same
312013028989210/31/13Time-of-flight mass spectrometer and data compression method therefor
322013026612010/10/13Spectroscopic apparatus
332013024869909/26/13Method of adjusting transmission electron microscope
342013024163309/19/13Method and signal processing
352013020698708/15/13Transmission electron microscope
362013016854907/04/13Method of evacuating sample holder, pumping system, and electron microscope
372013013432505/30/13Ion beam processing system and sample processing method
382013004024102/14/13Method and system for charged particle beam lithography
392012031830212/20/12Instrument and clinical examinations and cleaning method therefor
402012029885511/29/12Apparatus and time-of-flight mass spectrometry
412012024160909/27/12Electron detecting mechanism and charged particle beam system equipped therewith
422012022815809/13/12Method and electrolyte measurements
432012018142507/19/12Electron probe microanalyzer and data processing method implemented therein
442012016099806/28/12Mass spectrometer
452012015676406/21/12Automated analyzer
462012013879306/07/12Method of making axial alignment of charged particle beam and charged particle beam system
472012012848405/24/12Turbomolecular pump and connector device therefor
482012011910705/17/12Method for axial alignment of charged particle beam and charged particle beam system
492012008590504/12/12Tandem time-of-flight mass spectrometer
502012006806203/22/12Method and tandem time-of-flight mass spectrometry
512012006159303/15/12Charged-particle beam lithographic apparatus and lithographic method therefor
522011029100312/01/11Mass spectrometer
532011028474511/24/11Sample holder, inspection apparatus, and inspection method
542011028475811/24/11Spherical aberration corrector and spherical aberration correction
552011028476011/24/11Synchrotron power cycling apparatus and use thereof
562011028476111/24/11Synchrotron power supply apparatus and use thereof
572011028476211/24/11Charged particle extraction apparatus and use thereof
582011024167410/06/11Sample tube and measurement solid-state nmr
592011022078609/15/11Tandem time-of-flight mass spectrometer
602011017496707/21/11Time-of-flight mass spectrometer
612011013998606/16/11Electron microscope
622011013307306/09/11Method and time-of-flight mass spectrometry
632011008017104/07/11Method and accurately adjusting magic angle in nmr
642011006232603/17/11Method and system for acquisition of confocal stem images
652011000620901/13/11Electron beam apparatus
662010032101812/23/10High-resolution nmr probe
672010029493211/25/10Magnetic domain imaging system
682010028451311/11/10Wavelength-dispersive x-ray spectrometer
692010024388809/30/10Apparatus and inspecting samples
702010022478109/09/10Electron microscope
712010017515407/08/10Apparatus for controlling z-position of probe
722010016374207/01/10Silicon drift x-ray detector
732010014047106/10/10Electron beam apparatus and operating the same
742010013344806/03/10Object-positioning device for charged-particle beam system
752010009654904/22/10Sample inspection apparatus, sample inspection method and sample inspection system
762010008456704/08/10Chromatic aberration corrector for charged-particle beam system and correction method therefor
772010007238703/25/10Aberration corrector and charged-particle beam system equipped therewith
782010007299503/25/10Nmr measurement method
792010005180303/04/10Particle beam system
802010001914601/28/10Specimen holder, specimen inspection apparatus, and specimen inspection method
812009031495512/24/09Specimen holder, specimen inspection apparatus, and specimen inspection method
822009031074812/17/09Method and analysis using x-ray spectra
832009026182910/22/09Nmr probe
842009025607410/15/09Apparatus and inspection
852009025060910/08/09Inspection method and reagent solution
862009024276210/01/09Apparatus and inspecting sample
872009023031609/17/09Method of suppressing beam position drift, suppressing beam dimension drift, and charged-particle beam lithography system
882009023031909/17/09Specimen stage-moving device for charged-particle beam system
892009022416909/10/09Scanning transmission electron microscope and aberration correction therefor
902009021220808/27/09Method and time-of-flight mass spectrometry
912009018906207/30/09Method of calibrating beam position in charged-particle beam system
922009016653607/02/09Sample holder, observation and inspection, and observation and inspection
932009015979706/25/09Transmission electron microscope
942009012113005/14/09Orthogonal acceleration time-of-flight mass spectrometer
952009012605105/14/09Method and system for sample preparation
962009009061904/09/09Thin-film deposition system
972009005755203/05/09Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
982009005262002/26/09Apparatus and x-ray analysis of chemical state
992009004533702/19/09Charged-particle beam instrument
1002009003270902/05/09Aberration correction system
1012009003273902/05/09Method and system for charged-particle beam lithography



ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009



###

This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

###

     SHARE