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Jeol Ltd patents


      
Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors



Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12014029039310/02/14Sample introduction device and charged particle beam instrument
22014022911808/14/14Method and apparatus for sample analysis
32014018335807/03/14Phase plate and method of fabricating same
42014016687406/19/14Imaging mass spectrometer and method of controlling same
52014015890106/12/14Chromatic aberration corrector and electron microscope
62014015890706/12/14Specimen positioning device, charged particle beam system, and specimen holder
72014015891006/12/14Disinfecting device
82014013853605/22/14Mass spectrometer and method of controlling same
92014013853905/22/14Mass spectrometer and method of adjusting same
102014013853605/22/14Mass spectrometer and method of controlling same
112014013853905/22/14Mass spectrometer and method of adjusting same
122014011283004/24/14Automated analyzer
132014011283004/24/14Automated analyzer
142014009121604/03/14Sample analyzer
152014009121604/03/14Sample analyzer
162014008415803/27/14Scanning electron microscope
172014008415803/27/14Scanning electron microscope
182014007707603/20/14Time-of-flight mass spectrometer and method of controlling same
192014007707603/20/14Time-of-flight mass spectrometer and method of controlling same
202014005446802/27/14Chromatic aberration corrector and method of controlling same
212013030685911/21/13Tandem time-of-flight mass spectrometer and method of mass spectrometry using the same
222013028989210/31/13Time-of-flight mass spectrometer and data compression method therefor
232013026612010/10/13Spectroscopic apparatus
242013024869909/26/13Method of adjusting transmission electron microscope
252013024163309/19/13Method and apparatus for signal processing
262013020698708/15/13Transmission electron microscope
272013020698708/15/13Transmission electron microscope
282013016854907/04/13Method of evacuating sample holder, pumping system, and electron microscope
292013016854907/04/13Method of evacuating sample holder, pumping system, and electron microscope
302013013432505/30/13Ion beam processing system and sample processing method
312013013432505/30/13Ion beam processing system and sample processing method
322013004024102/14/13Method and system for charged particle beam lithography
332012031830212/20/12Instrument and method for clinical examinations and cleaning method therefor
342012029885511/29/12Apparatus and method for time-of-flight mass spectrometry
352012024160909/27/12Electron detecting mechanism and charged particle beam system equipped therewith
362012022815809/13/12Method and apparatus for electrolyte measurements
372012018142507/19/12Electron probe microanalyzer and data processing method implemented therein
382012016099806/28/12Mass spectrometer
392012015676406/21/12Automated analyzer
402012013879306/07/12Method of making axial alignment of charged particle beam and charged particle beam system
412012012848405/24/12Turbomolecular pump and connector device therefor
422012011910705/17/12Method for axial alignment of charged particle beam and charged particle beam system
432012008590504/12/12Tandem time-of-flight mass spectrometer
442012006806203/22/12Method and apparatus for tandem time-of-flight mass spectrometry
452012006159303/15/12Charged-particle beam lithographic apparatus and lithographic method therefor
462011029100312/01/11Mass spectrometer
472011028474511/24/11Sample holder, inspection apparatus, and inspection method
482011028475811/24/11Spherical aberration corrector and method of spherical aberration correction
492011028476011/24/11Synchrotron power cycling apparatus and method of use thereof
502011028476111/24/11Synchrotron power supply apparatus and method of use thereof
512011028476211/24/11Charged particle extraction apparatus and method of use thereof
522011024167410/06/11Sample tube and measurement method for solid-state nmr
532011022078609/15/11Tandem time-of-flight mass spectrometer
542011017496707/21/11Time-of-flight mass spectrometer
552011013998606/16/11Electron microscope
562011013307306/09/11Method and apparatus for time-of-flight mass spectrometry
572011008017104/07/11Method and apparatus for accurately adjusting magic angle in nmr
582011006232603/17/11Method and system for acquisition of confocal stem images
592011000620901/13/11Electron beam apparatus
602010032101812/23/10High-resolution nmr probe
612010029493211/25/10Magnetic domain imaging system
622010028451311/11/10Wavelength-dispersive x-ray spectrometer
632010024388809/30/10Apparatus and method for inspecting samples
642010022478109/09/10Electron microscope
652010017515407/08/10Apparatus for controlling z-position of probe
662010016374207/01/10Silicon drift x-ray detector
672010014047106/10/10Electron beam apparatus and method of operating the same
682010013344806/03/10Object-positioning device for charged-particle beam system
692010009654904/22/10Sample inspection apparatus, sample inspection method and sample inspection system
702010008456704/08/10Chromatic aberration corrector for charged-particle beam system and correction method therefor
712010007238703/25/10Aberration corrector and charged-particle beam system equipped therewith
722010007299503/25/10Nmr measurement method
732010005180303/04/10Particle beam system
742010001914601/28/10Specimen holder, specimen inspection apparatus, and specimen inspection method
752009031495512/24/09Specimen holder, specimen inspection apparatus, and specimen inspection method
762009031074812/17/09Method and apparatus for analysis using x-ray spectra
772009026182910/22/09Nmr probe
782009025607410/15/09Apparatus and method for inspection
792009025060910/08/09Inspection method and reagent solution
802009024276210/01/09Apparatus and method for inspecting sample
812009023031609/17/09Method of suppressing beam position drift, method of suppressing beam dimension drift, and charged-particle beam lithography system
822009023031909/17/09Specimen stage-moving device for charged-particle beam system
832009022416909/10/09Scanning transmission electron microscope and method of aberration correction therefor
842009021220808/27/09Method and apparatus for time-of-flight mass spectrometry
852009018906207/30/09Method of calibrating beam position in charged-particle beam system
862009016653607/02/09Sample holder, method for observation and inspection, and apparatus for observation and inspection
872009015979706/25/09Transmission electron microscope
882009012113005/14/09Orthogonal acceleration time-of-flight mass spectrometer
892009012605105/14/09Method and system for sample preparation
902009009061904/09/09Thin-film deposition system
912009005755203/05/09Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
922009005262002/26/09Apparatus and method for x-ray analysis of chemical state
932009004533702/19/09Charged-particle beam instrument
942009003270902/05/09Aberration correction system
952009003273902/05/09Method and system for charged-particle beam lithography


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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