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Jeol Ltd patents

Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors

Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12015028756610/08/15  new patent  Multipole lens, fabricating same, and charged particle beam system
22015027362210/01/15 Machine and additive manufacturing
32015027663010/01/15 X-ray spectrometer and sample analyzer
42015027695210/01/15 Radiation detector assembly and sample analyzer
52015027008809/24/15 Electron gun, controlling same, and electron beam additive manufacturing machine
62015025978509/17/15 Method of fabricating sample support membrane
72015026278509/17/15 Transmission electron microscope and displaying tem images
82015025524509/10/15 Charged particle beam system
92015021954708/06/15 Particle analysis instrument and computer program
102015020670307/23/15 Sample introduction device and charged particle beam instrument
112015016832106/18/15 Surface analysis instrument
122015016843506/18/15 Automated analyzer
132015016851806/18/15 Device for attaching and detaching nmr probe
142015013697805/21/15 Focused ion beam system and making focal adjustment of ion beam
152015013698005/21/15 Image acquisition method and transmission electron microscope
162015013700005/21/15 Charged particle beam instrument and sample container
172015013700105/21/15 Charged particle beam instrument
182015008391303/26/15 Radiation detector and sample analyzer
192015005797902/26/15 System and processing nmr signals
202015002959301/29/15 Spherical aberration corrector, spherical aberration correction, and charged particle beam instrument
212015001452701/15/15 Scanning charged particle microscope, image acquisition method, and electron detection method
222014037459412/25/14 Detector and charged particle beam instrument
232014036758512/18/14 Method for axial alignment of charged particle beam and charged particle beam system
242014034146911/20/14 Image processing method, image processor, imager, and computer program
252014031290010/23/14 Spinning controller for nmr sample tube
262014029039310/02/14 Sample introduction device and charged particle beam instrument
272014022911808/14/14 Method and sample analysis
282014018335807/03/14 Phase plate and fabricating same
292014016687406/19/14 Imaging mass spectrometer and controlling same
302014015890106/12/14 Chromatic aberration corrector and electron microscope
312014015890706/12/14 Specimen positioning device, charged particle beam system, and specimen holder
322014015891006/12/14 Disinfecting device
332014013853605/22/14 Mass spectrometer and controlling same
342014013853905/22/14 Mass spectrometer and adjusting same
352014011283004/24/14 Automated analyzer
362014009121604/03/14 Sample analyzer
372014008415803/27/14 Scanning electron microscope
382014007707603/20/14 Time-of-flight mass spectrometer and controlling same
392014005446802/27/14 Chromatic aberration corrector and controlling same
402013030685911/21/13 Tandem time-of-flight mass spectrometer and mass spectrometry using the same
412013028989210/31/13 Time-of-flight mass spectrometer and data compression method therefor
422013026612010/10/13 Spectroscopic apparatus
432013024869909/26/13 Method of adjusting transmission electron microscope
442013024163309/19/13 Method and signal processing
452013020698708/15/13 Transmission electron microscope
462013016854907/04/13 Method of evacuating sample holder, pumping system, and electron microscope
472013013432505/30/13 Ion beam processing system and sample processing method
482013004024102/14/13 Method and system for charged particle beam lithography
492012031830212/20/12 Instrument and clinical examinations and cleaning method therefor
502012029885511/29/12 Apparatus and time-of-flight mass spectrometry
512012024160909/27/12 Electron detecting mechanism and charged particle beam system equipped therewith
522012022815809/13/12 Method and electrolyte measurements
532012018142507/19/12 Electron probe microanalyzer and data processing method implemented therein
542012016099806/28/12 Mass spectrometer
552012015676406/21/12 Automated analyzer
562012013879306/07/12 Method of making axial alignment of charged particle beam and charged particle beam system
572012012848405/24/12 Turbomolecular pump and connector device therefor
582012011910705/17/12 Method for axial alignment of charged particle beam and charged particle beam system
592012008590504/12/12 Tandem time-of-flight mass spectrometer
602012006806203/22/12 Method and tandem time-of-flight mass spectrometry
612012006159303/15/12 Charged-particle beam lithographic apparatus and lithographic method therefor
622011029100312/01/11 Mass spectrometer
632011028474511/24/11 Sample holder, inspection apparatus, and inspection method
642011028475811/24/11 Spherical aberration corrector and spherical aberration correction
652011028476011/24/11 Synchrotron power cycling apparatus and use thereof
662011028476111/24/11 Synchrotron power supply apparatus and use thereof
672011028476211/24/11 Charged particle extraction apparatus and use thereof
682011024167410/06/11 Sample tube and measurement solid-state nmr
692011022078609/15/11 Tandem time-of-flight mass spectrometer
702011017496707/21/11 Time-of-flight mass spectrometer
712011013998606/16/11 Electron microscope
722011013307306/09/11 Method and time-of-flight mass spectrometry
732011008017104/07/11 Method and accurately adjusting magic angle in nmr
742011006232603/17/11 Method and system for acquisition of confocal stem images
752011000620901/13/11 Electron beam apparatus
762010032101812/23/10 High-resolution nmr probe
772010029493211/25/10 Magnetic domain imaging system
782010028451311/11/10 Wavelength-dispersive x-ray spectrometer
792010024388809/30/10 Apparatus and inspecting samples
802010022478109/09/10 Electron microscope
812010017515407/08/10 Apparatus for controlling z-position of probe
822010016374207/01/10 Silicon drift x-ray detector
832010014047106/10/10 Electron beam apparatus and operating the same
842010013344806/03/10 Object-positioning device for charged-particle beam system
852010009654904/22/10 Sample inspection apparatus, sample inspection method and sample inspection system
862010008456704/08/10 Chromatic aberration corrector for charged-particle beam system and correction method therefor
872010007238703/25/10 Aberration corrector and charged-particle beam system equipped therewith
882010007299503/25/10 Nmr measurement method
892010005180303/04/10 Particle beam system
902010001914601/28/10 Specimen holder, specimen inspection apparatus, and specimen inspection method
912009031495512/24/09 Specimen holder, specimen inspection apparatus, and specimen inspection method
922009031074812/17/09 Method and analysis using x-ray spectra
932009026182910/22/09 Nmr probe
942009025607410/15/09 Apparatus and inspection
952009025060910/08/09 Inspection method and reagent solution
962009024276210/01/09 Apparatus and inspecting sample
972009023031609/17/09 Method of suppressing beam position drift, suppressing beam dimension drift, and charged-particle beam lithography system
982009023031909/17/09 Specimen stage-moving device for charged-particle beam system
992009022416909/10/09 Scanning transmission electron microscope and aberration correction therefor
1002009021220808/27/09 Method and time-of-flight mass spectrometry
1012009018906207/30/09 Method of calibrating beam position in charged-particle beam system
1022009016653607/02/09 Sample holder, observation and inspection, and observation and inspection
1032009015979706/25/09 Transmission electron microscope
1042009012113005/14/09 Orthogonal acceleration time-of-flight mass spectrometer
1052009012605105/14/09 Method and system for sample preparation
1062009009061904/09/09 Thin-film deposition system
1072009005755203/05/09 Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
1082009005262002/26/09 Apparatus and x-ray analysis of chemical state
1092009004533702/19/09 Charged-particle beam instrument
1102009003270902/05/09 Aberration correction system
1112009003273902/05/09 Method and system for charged-particle beam lithography

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by