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Jeol Ltd patents

Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors

Image acquisition method and transmission electron microscope


Image acquisition method and transmission electron microscope

Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12015013697805/21/15 new patent  Focused ion beam system and making focal adjustment of ion beam
22015013698005/21/15 new patent  Image acquisition method and transmission electron microscope
32015013700005/21/15 new patent  Charged particle beam instrument and sample container
42015013700105/21/15 new patent  Charged particle beam instrument
52015008391303/26/15Radiation detector and sample analyzer
62015005797902/26/15System and processing nmr signals
72015002959301/29/15Spherical aberration corrector, spherical aberration correction, and charged particle beam instrument
82015001452701/15/15Scanning charged particle microscope, image acquisition method, and electron detection method
92014037459412/25/14Detector and charged particle beam instrument
102014036758512/18/14Method for axial alignment of charged particle beam and charged particle beam system
112014034146911/20/14Image processing method, image processor, imager, and computer program
122014031290010/23/14Spinning controller for nmr sample tube
132014029039310/02/14Sample introduction device and charged particle beam instrument
142014022911808/14/14Method and sample analysis
152014018335807/03/14Phase plate and fabricating same
162014016687406/19/14Imaging mass spectrometer and controlling same
172014015890106/12/14Chromatic aberration corrector and electron microscope
182014015890706/12/14Specimen positioning device, charged particle beam system, and specimen holder
192014015891006/12/14Disinfecting device
202014013853605/22/14Mass spectrometer and controlling same
212014013853905/22/14Mass spectrometer and adjusting same
222014011283004/24/14Automated analyzer
232014009121604/03/14Sample analyzer
242014008415803/27/14Scanning electron microscope
252014007707603/20/14Time-of-flight mass spectrometer and controlling same
262014005446802/27/14Chromatic aberration corrector and controlling same
272013030685911/21/13Tandem time-of-flight mass spectrometer and mass spectrometry using the same
282013028989210/31/13Time-of-flight mass spectrometer and data compression method therefor
292013026612010/10/13Spectroscopic apparatus
302013024869909/26/13Method of adjusting transmission electron microscope
312013024163309/19/13Method and signal processing
322013020698708/15/13Transmission electron microscope
332013016854907/04/13Method of evacuating sample holder, pumping system, and electron microscope
342013013432505/30/13Ion beam processing system and sample processing method
352013004024102/14/13Method and system for charged particle beam lithography
362012031830212/20/12Instrument and clinical examinations and cleaning method therefor
372012029885511/29/12Apparatus and time-of-flight mass spectrometry
382012024160909/27/12Electron detecting mechanism and charged particle beam system equipped therewith
392012022815809/13/12Method and electrolyte measurements
402012018142507/19/12Electron probe microanalyzer and data processing method implemented therein
412012016099806/28/12Mass spectrometer
422012015676406/21/12Automated analyzer
432012013879306/07/12Method of making axial alignment of charged particle beam and charged particle beam system
442012012848405/24/12Turbomolecular pump and connector device therefor
452012011910705/17/12Method for axial alignment of charged particle beam and charged particle beam system
462012008590504/12/12Tandem time-of-flight mass spectrometer
472012006806203/22/12Method and tandem time-of-flight mass spectrometry
482012006159303/15/12Charged-particle beam lithographic apparatus and lithographic method therefor
492011029100312/01/11Mass spectrometer
502011028474511/24/11Sample holder, inspection apparatus, and inspection method
512011028475811/24/11Spherical aberration corrector and spherical aberration correction
522011028476011/24/11Synchrotron power cycling apparatus and use thereof
532011028476111/24/11Synchrotron power supply apparatus and use thereof
542011028476211/24/11Charged particle extraction apparatus and use thereof
552011024167410/06/11Sample tube and measurement solid-state nmr
562011022078609/15/11Tandem time-of-flight mass spectrometer
572011017496707/21/11Time-of-flight mass spectrometer
582011013998606/16/11Electron microscope
592011013307306/09/11Method and time-of-flight mass spectrometry
602011008017104/07/11Method and accurately adjusting magic angle in nmr
612011006232603/17/11Method and system for acquisition of confocal stem images
622011000620901/13/11Electron beam apparatus
632010032101812/23/10High-resolution nmr probe
642010029493211/25/10Magnetic domain imaging system
652010028451311/11/10Wavelength-dispersive x-ray spectrometer
662010024388809/30/10Apparatus and inspecting samples
672010022478109/09/10Electron microscope
682010017515407/08/10Apparatus for controlling z-position of probe
692010016374207/01/10Silicon drift x-ray detector
702010014047106/10/10Electron beam apparatus and operating the same
712010013344806/03/10Object-positioning device for charged-particle beam system
722010009654904/22/10Sample inspection apparatus, sample inspection method and sample inspection system
732010008456704/08/10Chromatic aberration corrector for charged-particle beam system and correction method therefor
742010007238703/25/10Aberration corrector and charged-particle beam system equipped therewith
752010007299503/25/10Nmr measurement method
762010005180303/04/10Particle beam system
772010001914601/28/10Specimen holder, specimen inspection apparatus, and specimen inspection method
782009031495512/24/09Specimen holder, specimen inspection apparatus, and specimen inspection method
792009031074812/17/09Method and analysis using x-ray spectra
802009026182910/22/09Nmr probe
812009025607410/15/09Apparatus and inspection
822009025060910/08/09Inspection method and reagent solution
832009024276210/01/09Apparatus and inspecting sample
842009023031609/17/09Method of suppressing beam position drift, suppressing beam dimension drift, and charged-particle beam lithography system
852009023031909/17/09Specimen stage-moving device for charged-particle beam system
862009022416909/10/09Scanning transmission electron microscope and aberration correction therefor
872009021220808/27/09Method and time-of-flight mass spectrometry
882009018906207/30/09Method of calibrating beam position in charged-particle beam system
892009016653607/02/09Sample holder, observation and inspection, and observation and inspection
902009015979706/25/09Transmission electron microscope
912009012113005/14/09Orthogonal acceleration time-of-flight mass spectrometer
922009012605105/14/09Method and system for sample preparation
932009009061904/09/09Thin-film deposition system
942009005755203/05/09Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
952009005262002/26/09Apparatus and x-ray analysis of chemical state
962009004533702/19/09Charged-particle beam instrument
972009003270902/05/09Aberration correction system
982009003273902/05/09Method and system for charged-particle beam lithography

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by