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Jeol Ltd patents

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Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors

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Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
10/06/16Coil assembly for accurate adjustment of magic angle in solid-state nmr apparatus and adjusting magic angle using such coil assembly
09/22/16Phase plate, fabricating same, and electron microscope
09/15/16Electron spectrometer and measurement method
09/08/16Image display device, image display method, and information storage medium
09/01/16Measurement method and electron microscope
08/11/16Nmr probe
08/04/16Nmr probe
08/04/16Multipole lens and charged particle beam system
08/04/16Electron microscope and measuring aberrations
08/04/16Mass spectrometry data processing apparatus and mass spectrometry data processing method
06/30/16Actuator, sample positioning device, and charged particle beam system
06/30/16Liquid suction tool, liquid supply unit and automated analyzer
06/30/16Automated analyzer and lifting and lowering rod-like member in automated analyzer
06/30/16Electron microscope and operating same
06/16/16Measurement-container supply device
06/09/16Charged particle beam device and image acquisition method
06/09/16Deposition method and focused ion beam system
06/02/16Gripping mechanism
05/26/16Specimen preparation device
05/19/16Specimen holder, specimen preparation device, and positioning method
05/12/16Image evaluation method and charged particle beam device
04/21/16Scatter diagram display device and surface analyzer
04/21/16Electron microscope and elemental mapping image generation method
04/07/16Information processing device and information processing method
04/07/16Electron spin resonance apparatus
03/24/16Information processing device and information processing method
03/17/16Electron microscope and adjusting monochromator
03/17/16Method of constructing 3d image, image processor, and electron microscope
03/10/16Electron microscope and adjusting same
02/18/16Sample rack conveying unit and automatic analysis system
02/11/16Aberration computing device, aberration computing method, image processor, image processing method, and electron microscope
01/21/16Device and computing amount of drift and charged particle beam system
01/21/16Device and computing angular range for measurement of aberrations and electron microscope
01/21/16Radiation analyzer
01/14/16Charged particle beam system
01/07/16Measuring container supplying device
12/17/15Phase analyzer, phase analysis method, and surface analyzer
12/10/15Automated analyzer
12/03/15Flow analyzer and flow analysis method
11/19/15Multipole lens, aberration corrector, and electron microscope
11/05/15Machine and additive manufacturing
10/29/15Additive manufacturing machine
10/29/15Machine and additive manufacturing
10/29/15Machine and additive manufacturing
10/29/15Apparatus and automated analysis
10/29/15Apparatus and sample preparation
10/29/15Transmission electron microscope
10/22/15Charged-particle beam lithographic system
10/08/15Multipole lens, fabricating same, and charged particle beam system
10/01/15Machine and additive manufacturing
10/01/15X-ray spectrometer and sample analyzer
10/01/15Radiation detector assembly and sample analyzer
09/24/15Electron gun, controlling same, and electron beam additive manufacturing machine
09/17/15Method of fabricating sample support membrane
09/17/15Transmission electron microscope and displaying tem images
09/10/15Charged particle beam system
08/06/15Particle analysis instrument and computer program
07/23/15Sample introduction device and charged particle beam instrument
06/18/15Surface analysis instrument
06/18/15Automated analyzer
06/18/15Device for attaching and detaching nmr probe
05/21/15Focused ion beam system and making focal adjustment of ion beam
05/21/15Image acquisition method and transmission electron microscope
05/21/15Charged particle beam instrument and sample container
05/21/15Charged particle beam instrument
03/26/15Radiation detector and sample analyzer
02/26/15System and processing nmr signals
01/29/15Spherical aberration corrector, spherical aberration correction, and charged particle beam instrument
01/15/15Scanning charged particle microscope, image acquisition method, and electron detection method
12/25/14Detector and charged particle beam instrument
12/18/14Method for axial alignment of charged particle beam and charged particle beam system
11/20/14Image processing method, image processor, imager, and computer program
10/23/14Spinning controller for nmr sample tube
10/02/14Sample introduction device and charged particle beam instrument
08/14/14Method and sample analysis
07/03/14Phase plate and fabricating same
06/19/14Imaging mass spectrometer and controlling same
06/12/14Chromatic aberration corrector and electron microscope
06/12/14Specimen positioning device, charged particle beam system, and specimen holder
06/12/14Disinfecting device
05/22/14Mass spectrometer and controlling same
05/22/14Mass spectrometer and adjusting same
04/24/14Automated analyzer
04/03/14Sample analyzer
03/27/14Scanning electron microscope
03/20/14Time-of-flight mass spectrometer and controlling same
02/27/14Chromatic aberration corrector and controlling same
11/21/13Tandem time-of-flight mass spectrometer and mass spectrometry using the same
10/31/13Time-of-flight mass spectrometer and data compression method therefor
10/10/13Spectroscopic apparatus
09/26/13Method of adjusting transmission electron microscope
09/19/13Method and signal processing
08/15/13Transmission electron microscope
07/04/13Method of evacuating sample holder, pumping system, and electron microscope
05/30/13Ion beam processing system and sample processing method
02/14/13Method and system for charged particle beam lithography
12/20/12Instrument and clinical examinations and cleaning method therefor
11/29/12Apparatus and time-of-flight mass spectrometry
09/27/12Electron detecting mechanism and charged particle beam system equipped therewith
09/13/12Method and electrolyte measurements
07/19/12Electron probe microanalyzer and data processing method implemented therein
06/28/12Mass spectrometer
06/21/12Automated analyzer
06/07/12Method of making axial alignment of charged particle beam and charged particle beam system
05/24/12Turbomolecular pump and connector device therefor
05/17/12Method for axial alignment of charged particle beam and charged particle beam system
04/12/12Tandem time-of-flight mass spectrometer
03/22/12Method and tandem time-of-flight mass spectrometry
03/15/12Charged-particle beam lithographic apparatus and lithographic method therefor
12/01/11Mass spectrometer
11/24/11Sample holder, inspection apparatus, and inspection method
11/24/11Spherical aberration corrector and spherical aberration correction
11/24/11Synchrotron power cycling apparatus and use thereof
11/24/11Synchrotron power supply apparatus and use thereof
11/24/11Charged particle extraction apparatus and use thereof
10/06/11Sample tube and measurement solid-state nmr
09/15/11Tandem time-of-flight mass spectrometer
07/21/11Time-of-flight mass spectrometer
06/16/11Electron microscope
06/09/11Method and time-of-flight mass spectrometry
04/07/11Method and accurately adjusting magic angle in nmr
03/17/11Method and system for acquisition of confocal stem images
01/13/11Electron beam apparatus
12/23/10High-resolution nmr probe
11/25/10Magnetic domain imaging system
11/11/10Wavelength-dispersive x-ray spectrometer
09/30/10Apparatus and inspecting samples
09/09/10Electron microscope
07/08/10Apparatus for controlling z-position of probe
07/01/10Silicon drift x-ray detector
06/10/10Electron beam apparatus and operating the same
06/03/10Object-positioning device for charged-particle beam system
04/22/10Sample inspection apparatus, sample inspection method and sample inspection system
04/08/10Chromatic aberration corrector for charged-particle beam system and correction method therefor
03/25/10Aberration corrector and charged-particle beam system equipped therewith
03/25/10Nmr measurement method
03/04/10Particle beam system
01/28/10Specimen holder, specimen inspection apparatus, and specimen inspection method
12/24/09Specimen holder, specimen inspection apparatus, and specimen inspection method
12/17/09Method and analysis using x-ray spectra
10/22/09Nmr probe
10/15/09Apparatus and inspection
10/08/09Inspection method and reagent solution
10/01/09Apparatus and inspecting sample
09/17/09Method of suppressing beam position drift, suppressing beam dimension drift, and charged-particle beam lithography system
09/17/09Specimen stage-moving device for charged-particle beam system
09/10/09Scanning transmission electron microscope and aberration correction therefor
08/27/09Method and time-of-flight mass spectrometry
07/30/09Method of calibrating beam position in charged-particle beam system
07/02/09Sample holder, observation and inspection, and observation and inspection
06/25/09Transmission electron microscope
05/14/09Orthogonal acceleration time-of-flight mass spectrometer
05/14/09Method and system for sample preparation
04/09/09Thin-film deposition system
03/05/09Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
02/26/09Apparatus and x-ray analysis of chemical state
02/19/09Charged-particle beam instrument
02/05/09Aberration correction system
02/05/09Method and system for charged-particle beam lithography

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by