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Jeol Ltd patents

Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors

Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12015008391303/26/15Radiation detector and sample analyzer
22015005797902/26/15System and processing nmr signals
32015002959301/29/15Spherical aberration corrector, spherical aberration correction, and charged particle beam instrument
42015001452701/15/15Scanning charged particle microscope, image acquisition method, and electron detection method
52014037459412/25/14Detector and charged particle beam instrument
62014036758512/18/14Method for axial alignment of charged particle beam and charged particle beam system
72014034146911/20/14Image processing method, image processor, imager, and computer program
82014031290010/23/14Spinning controller for nmr sample tube
92014029039310/02/14Sample introduction device and charged particle beam instrument
102014022911808/14/14Method and sample analysis
112014018335807/03/14Phase plate and fabricating same
122014016687406/19/14Imaging mass spectrometer and controlling same
132014015890106/12/14Chromatic aberration corrector and electron microscope
142014015890706/12/14Specimen positioning device, charged particle beam system, and specimen holder
152014015891006/12/14Disinfecting device
162014013853605/22/14Mass spectrometer and controlling same
172014013853905/22/14Mass spectrometer and adjusting same
182014011283004/24/14Automated analyzer
192014009121604/03/14Sample analyzer
202014008415803/27/14Scanning electron microscope
212014007707603/20/14Time-of-flight mass spectrometer and controlling same
222014005446802/27/14Chromatic aberration corrector and controlling same
232013030685911/21/13Tandem time-of-flight mass spectrometer and mass spectrometry using the same
242013028989210/31/13Time-of-flight mass spectrometer and data compression method therefor
252013026612010/10/13Spectroscopic apparatus
262013024869909/26/13Method of adjusting transmission electron microscope
272013024163309/19/13Method and signal processing
282013020698708/15/13Transmission electron microscope
292013016854907/04/13Method of evacuating sample holder, pumping system, and electron microscope
302013013432505/30/13Ion beam processing system and sample processing method
312013004024102/14/13Method and system for charged particle beam lithography
322012031830212/20/12Instrument and clinical examinations and cleaning method therefor
332012029885511/29/12Apparatus and time-of-flight mass spectrometry
342012024160909/27/12Electron detecting mechanism and charged particle beam system equipped therewith
352012022815809/13/12Method and electrolyte measurements
362012018142507/19/12Electron probe microanalyzer and data processing method implemented therein
372012016099806/28/12Mass spectrometer
382012015676406/21/12Automated analyzer
392012013879306/07/12Method of making axial alignment of charged particle beam and charged particle beam system
402012012848405/24/12Turbomolecular pump and connector device therefor
412012011910705/17/12Method for axial alignment of charged particle beam and charged particle beam system
422012008590504/12/12Tandem time-of-flight mass spectrometer
432012006806203/22/12Method and tandem time-of-flight mass spectrometry
442012006159303/15/12Charged-particle beam lithographic apparatus and lithographic method therefor
452011029100312/01/11Mass spectrometer
462011028474511/24/11Sample holder, inspection apparatus, and inspection method
472011028475811/24/11Spherical aberration corrector and spherical aberration correction
482011028476011/24/11Synchrotron power cycling apparatus and use thereof
492011028476111/24/11Synchrotron power supply apparatus and use thereof
502011028476211/24/11Charged particle extraction apparatus and use thereof
512011024167410/06/11Sample tube and measurement solid-state nmr
522011022078609/15/11Tandem time-of-flight mass spectrometer
532011017496707/21/11Time-of-flight mass spectrometer
542011013998606/16/11Electron microscope
552011013307306/09/11Method and time-of-flight mass spectrometry
562011008017104/07/11Method and accurately adjusting magic angle in nmr
572011006232603/17/11Method and system for acquisition of confocal stem images
582011000620901/13/11Electron beam apparatus
592010032101812/23/10High-resolution nmr probe
602010029493211/25/10Magnetic domain imaging system
612010028451311/11/10Wavelength-dispersive x-ray spectrometer
622010024388809/30/10Apparatus and inspecting samples
632010022478109/09/10Electron microscope
642010017515407/08/10Apparatus for controlling z-position of probe
652010016374207/01/10Silicon drift x-ray detector
662010014047106/10/10Electron beam apparatus and operating the same
672010013344806/03/10Object-positioning device for charged-particle beam system
682010009654904/22/10Sample inspection apparatus, sample inspection method and sample inspection system
692010008456704/08/10Chromatic aberration corrector for charged-particle beam system and correction method therefor
702010007238703/25/10Aberration corrector and charged-particle beam system equipped therewith
712010007299503/25/10Nmr measurement method
722010005180303/04/10Particle beam system
732010001914601/28/10Specimen holder, specimen inspection apparatus, and specimen inspection method
742009031495512/24/09Specimen holder, specimen inspection apparatus, and specimen inspection method
752009031074812/17/09Method and analysis using x-ray spectra
762009026182910/22/09Nmr probe
772009025607410/15/09Apparatus and inspection
782009025060910/08/09Inspection method and reagent solution
792009024276210/01/09Apparatus and inspecting sample
802009023031609/17/09Method of suppressing beam position drift, suppressing beam dimension drift, and charged-particle beam lithography system
812009023031909/17/09Specimen stage-moving device for charged-particle beam system
822009022416909/10/09Scanning transmission electron microscope and aberration correction therefor
832009021220808/27/09Method and time-of-flight mass spectrometry
842009018906207/30/09Method of calibrating beam position in charged-particle beam system
852009016653607/02/09Sample holder, observation and inspection, and observation and inspection
862009015979706/25/09Transmission electron microscope
872009012113005/14/09Orthogonal acceleration time-of-flight mass spectrometer
882009012605105/14/09Method and system for sample preparation
892009009061904/09/09Thin-film deposition system
902009005755203/05/09Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
912009005262002/26/09Apparatus and x-ray analysis of chemical state
922009004533702/19/09Charged-particle beam instrument
932009003270902/05/09Aberration correction system
942009003273902/05/09Method and system for charged-particle beam lithography

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by