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Jeol Ltd patents

Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors

Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12015021954708/06/15 Particle analysis instrument and computer program
22015020670307/23/15 Sample introduction device and charged particle beam instrument
32015016832106/18/15 Surface analysis instrument
42015016843506/18/15 Automated analyzer
52015016851806/18/15 Device for attaching and detaching nmr probe
62015013697805/21/15 Focused ion beam system and making focal adjustment of ion beam
72015013698005/21/15 Image acquisition method and transmission electron microscope
82015013700005/21/15 Charged particle beam instrument and sample container
92015013700105/21/15 Charged particle beam instrument
102015008391303/26/15 Radiation detector and sample analyzer
112015005797902/26/15 System and processing nmr signals
122015002959301/29/15 Spherical aberration corrector, spherical aberration correction, and charged particle beam instrument
132015001452701/15/15 Scanning charged particle microscope, image acquisition method, and electron detection method
142014037459412/25/14 Detector and charged particle beam instrument
152014036758512/18/14 Method for axial alignment of charged particle beam and charged particle beam system
162014034146911/20/14 Image processing method, image processor, imager, and computer program
172014031290010/23/14 Spinning controller for nmr sample tube
182014029039310/02/14 Sample introduction device and charged particle beam instrument
192014022911808/14/14 Method and sample analysis
202014018335807/03/14 Phase plate and fabricating same
212014016687406/19/14 Imaging mass spectrometer and controlling same
222014015890106/12/14 Chromatic aberration corrector and electron microscope
232014015890706/12/14 Specimen positioning device, charged particle beam system, and specimen holder
242014015891006/12/14 Disinfecting device
252014013853605/22/14 Mass spectrometer and controlling same
262014013853905/22/14 Mass spectrometer and adjusting same
272014011283004/24/14 Automated analyzer
282014009121604/03/14 Sample analyzer
292014008415803/27/14 Scanning electron microscope
302014007707603/20/14 Time-of-flight mass spectrometer and controlling same
312014005446802/27/14 Chromatic aberration corrector and controlling same
322013030685911/21/13 Tandem time-of-flight mass spectrometer and mass spectrometry using the same
332013028989210/31/13 Time-of-flight mass spectrometer and data compression method therefor
342013026612010/10/13 Spectroscopic apparatus
352013024869909/26/13 Method of adjusting transmission electron microscope
362013024163309/19/13 Method and signal processing
372013020698708/15/13 Transmission electron microscope
382013016854907/04/13 Method of evacuating sample holder, pumping system, and electron microscope
392013013432505/30/13 Ion beam processing system and sample processing method
402013004024102/14/13 Method and system for charged particle beam lithography
412012031830212/20/12 Instrument and clinical examinations and cleaning method therefor
422012029885511/29/12 Apparatus and time-of-flight mass spectrometry
432012024160909/27/12 Electron detecting mechanism and charged particle beam system equipped therewith
442012022815809/13/12 Method and electrolyte measurements
452012018142507/19/12 Electron probe microanalyzer and data processing method implemented therein
462012016099806/28/12 Mass spectrometer
472012015676406/21/12 Automated analyzer
482012013879306/07/12 Method of making axial alignment of charged particle beam and charged particle beam system
492012012848405/24/12 Turbomolecular pump and connector device therefor
502012011910705/17/12 Method for axial alignment of charged particle beam and charged particle beam system
512012008590504/12/12 Tandem time-of-flight mass spectrometer
522012006806203/22/12 Method and tandem time-of-flight mass spectrometry
532012006159303/15/12 Charged-particle beam lithographic apparatus and lithographic method therefor
542011029100312/01/11 Mass spectrometer
552011028474511/24/11 Sample holder, inspection apparatus, and inspection method
562011028475811/24/11 Spherical aberration corrector and spherical aberration correction
572011028476011/24/11 Synchrotron power cycling apparatus and use thereof
582011028476111/24/11 Synchrotron power supply apparatus and use thereof
592011028476211/24/11 Charged particle extraction apparatus and use thereof
602011024167410/06/11 Sample tube and measurement solid-state nmr
612011022078609/15/11 Tandem time-of-flight mass spectrometer
622011017496707/21/11 Time-of-flight mass spectrometer
632011013998606/16/11 Electron microscope
642011013307306/09/11 Method and time-of-flight mass spectrometry
652011008017104/07/11 Method and accurately adjusting magic angle in nmr
662011006232603/17/11 Method and system for acquisition of confocal stem images
672011000620901/13/11 Electron beam apparatus
682010032101812/23/10 High-resolution nmr probe
692010029493211/25/10 Magnetic domain imaging system
702010028451311/11/10 Wavelength-dispersive x-ray spectrometer
712010024388809/30/10 Apparatus and inspecting samples
722010022478109/09/10 Electron microscope
732010017515407/08/10 Apparatus for controlling z-position of probe
742010016374207/01/10 Silicon drift x-ray detector
752010014047106/10/10 Electron beam apparatus and operating the same
762010013344806/03/10 Object-positioning device for charged-particle beam system
772010009654904/22/10 Sample inspection apparatus, sample inspection method and sample inspection system
782010008456704/08/10 Chromatic aberration corrector for charged-particle beam system and correction method therefor
792010007238703/25/10 Aberration corrector and charged-particle beam system equipped therewith
802010007299503/25/10 Nmr measurement method
812010005180303/04/10 Particle beam system
822010001914601/28/10 Specimen holder, specimen inspection apparatus, and specimen inspection method
832009031495512/24/09 Specimen holder, specimen inspection apparatus, and specimen inspection method
842009031074812/17/09 Method and analysis using x-ray spectra
852009026182910/22/09 Nmr probe
862009025607410/15/09 Apparatus and inspection
872009025060910/08/09 Inspection method and reagent solution
882009024276210/01/09 Apparatus and inspecting sample
892009023031609/17/09 Method of suppressing beam position drift, suppressing beam dimension drift, and charged-particle beam lithography system
902009023031909/17/09 Specimen stage-moving device for charged-particle beam system
912009022416909/10/09 Scanning transmission electron microscope and aberration correction therefor
922009021220808/27/09 Method and time-of-flight mass spectrometry
932009018906207/30/09 Method of calibrating beam position in charged-particle beam system
942009016653607/02/09 Sample holder, observation and inspection, and observation and inspection
952009015979706/25/09 Transmission electron microscope
962009012113005/14/09 Orthogonal acceleration time-of-flight mass spectrometer
972009012605105/14/09 Method and system for sample preparation
982009009061904/09/09 Thin-film deposition system
992009005755203/05/09 Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
1002009005262002/26/09 Apparatus and x-ray analysis of chemical state
1012009004533702/19/09 Charged-particle beam instrument
1022009003270902/05/09 Aberration correction system
1032009003273902/05/09 Method and system for charged-particle beam lithography

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by