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Jeol Ltd patents

Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors

Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12014034146911/20/14Image processing method, image processor, imager, and computer program
22014031290010/23/14Spinning controller for nmr sample tube
32014029039310/02/14Sample introduction device and charged particle beam instrument
42014022911808/14/14Sample analysis
52014018335807/03/14Phase plate and method of fabricating same
62014016687406/19/14Imaging mass spectrometer and method of controlling same
72014015890106/12/14Chromatic aberration corrector and electron microscope
82014015890706/12/14Specimen positioning device, charged particle beam system, and specimen holder
92014015891006/12/14Disinfecting device
102014013853605/22/14Mass spectrometer and method of controlling same
112014013853905/22/14Mass spectrometer and method of adjusting same
122014011283004/24/14Automated analyzer
132014009121604/03/14Sample analyzer
142014008415803/27/14Scanning electron microscope
152014007707603/20/14Time-of-flight mass spectrometer and method of controlling same
162014005446802/27/14Chromatic aberration corrector and method of controlling same
172013030685911/21/13Tandem time-of-flight mass spectrometer and method of mass spectrometry using the same
182013028989210/31/13Time-of-flight mass spectrometer and data compression method therefor
192013026612010/10/13Spectroscopic apparatus
202013024869909/26/13Method of adjusting transmission electron microscope
212013024163309/19/13Signal processing
222013020698708/15/13Transmission electron microscope
232013016854907/04/13Method of evacuating sample holder, pumping system, and electron microscope
242013013432505/30/13Ion beam processing system and sample processing method
252013004024102/14/13Charged particle beam lithography
262012031830212/20/12Instrument and method for clinical examinations and cleaning method therefor
272012029885511/29/12Apparatus and method for time-of-flight mass spectrometry
282012024160909/27/12Electron detecting mechanism and charged particle beam system equipped therewith
292012022815809/13/12Electrolyte measurements
302012018142507/19/12Electron probe microanalyzer and data processing method implemented therein
312012016099806/28/12Mass spectrometer
322012015676406/21/12Automated analyzer
332012013879306/07/12Method of making axial alignment of charged particle beam and charged particle beam system
342012012848405/24/12Turbomolecular pump and connector device therefor
352012011910705/17/12Method for axial alignment of charged particle beam and charged particle beam system
362012008590504/12/12Tandem time-of-flight mass spectrometer
372012006806203/22/12Tandem time-of-flight mass spectrometry
382012006159303/15/12Charged-particle beam lithographic apparatus and lithographic method therefor
392011029100312/01/11Mass spectrometer
402011028474511/24/11Sample holder, inspection apparatus, and inspection method
412011028475811/24/11Spherical aberration corrector and method of spherical aberration correction
422011028476011/24/11Synchrotron power cycling apparatus and method of use thereof
432011028476111/24/11Synchrotron power supply apparatus and method of use thereof
442011028476211/24/11Charged particle extraction apparatus and method of use thereof
452011024167410/06/11Sample tube and measurement method for solid-state nmr
462011022078609/15/11Tandem time-of-flight mass spectrometer
472011017496707/21/11Time-of-flight mass spectrometer
482011013998606/16/11Electron microscope
492011013307306/09/11Time-of-flight mass spectrometry
502011008017104/07/11Accurately adjusting magic angle in nmr
512011006232603/17/11Acquisition of confocal stem images
522011000620901/13/11Electron beam apparatus
532010032101812/23/10High-resolution nmr probe
542010029493211/25/10Magnetic domain imaging system
552010028451311/11/10Wavelength-dispersive x-ray spectrometer
562010024388809/30/10Apparatus and method for inspecting samples
572010022478109/09/10Electron microscope
582010017515407/08/10Apparatus for controlling z-position of probe
592010016374207/01/10Silicon drift x-ray detector
602010014047106/10/10Electron beam apparatus and method of operating the same
612010013344806/03/10Object-positioning device for charged-particle beam system
622010009654904/22/10Sample inspection apparatus, sample inspection method and sample inspection system
632010008456704/08/10Chromatic aberration corrector for charged-particle beam system and correction method therefor
642010007238703/25/10Aberration corrector and charged-particle beam system equipped therewith
652010007299503/25/10Nmr measurement method
662010005180303/04/10Particle beam system
672010001914601/28/10Specimen holder, specimen inspection apparatus, and specimen inspection method
682009031495512/24/09Specimen holder, specimen inspection apparatus, and specimen inspection method
692009031074812/17/09Analysis using x-ray spectra
702009026182910/22/09Nmr probe
712009025607410/15/09Apparatus and method for inspection
722009025060910/08/09Inspection method and reagent solution
732009024276210/01/09Apparatus and method for inspecting sample
742009023031609/17/09Method of suppressing beam position drift, method of suppressing beam dimension drift, and charged-particle beam lithography system
752009023031909/17/09Specimen stage-moving device for charged-particle beam system
762009022416909/10/09Scanning transmission electron microscope and method of aberration correction therefor
772009021220808/27/09Time-of-flight mass spectrometry
782009018906207/30/09Method of calibrating beam position in charged-particle beam system
792009016653607/02/09Sample holder, method for observation and inspection, and apparatus for observation and inspection
802009015979706/25/09Transmission electron microscope
812009012113005/14/09Orthogonal acceleration time-of-flight mass spectrometer
822009012605105/14/09Sample preparation
832009009061904/09/09Thin-film deposition system
842009005755203/05/09Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
852009005262002/26/09Apparatus and method for x-ray analysis of chemical state
862009004533702/19/09Charged-particle beam instrument
872009003270902/05/09Aberration correction system
882009003273902/05/09Charged-particle beam lithography

ARCHIVE: New 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by



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