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Jeol Ltd patents

Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors

Method for derivatizing an s-cis-diene compound, derivatization reagent kit, and analyzing an s-cis-diene compound

Provided is a method for derivatizing an s-cis-diene compound with a Cookson-type derivatization reagent, the method including adding, in a reaction stopping step of stopping a derivatization reaction of the s-cis-diene compound, a decomposition inhibitor to inhibit decomposition of a derivative to be obtained.... Jeol Ltd

Observation method and specimen observation apparatus

Provided is an observation method including: acquiring an observed image that has been photographed by the first specimen observation apparatus with the specimen holder being mounted on the first specimen stage, the observed image having an observation target position of a specimen positioned at a center thereof, and including the... Jeol Ltd

Image processing apparatus, image processing method, and analyzer

Provided is an image processing apparatus, which is configured to perform smoothing processing on a mapping image obtained by detecting a signal emitted from one of a plurality of analysis areas of a specimen. The image processing apparatus includes: a memory; and a processor configured to execute a program stored... Jeol Ltd

Magnetic coupling high resolution nuclear magnetic resolution probe and use

In an embodiment of the invention inductive coupling of an idler coil to a parent coil is used to provide a double resonance circuit without the disadvantages of capacitive coupling to the parent coil. In an embodiment of the invention, an inductive coupling coil can be used to achieve a... Jeol Ltd

Automatic analyzer and program

According to an aspect of the present invention, there is provided an automatic analyzer that detects a liquid level by using an electrostatic capacity system. Feature values are extracted from time-series oscillating frequency data of an alternating current signal that is output by an oscillation circuit in a period from... Jeol Ltd

Relaxation time measuring method and magnetic resonance measuring apparatus

A method includes forming N spin-cavity coupling states that are mutually different in coupling state between a cavity accommodating a sample therein and a spin of the sample, calculating N values of spin-cavity coupling constant, measuring N values of apparent relaxation time through magnetic resonance measurement applied on the sample,... Jeol Ltd

Method for manufacturing detection coil for magnetic resonance measurement

A manufacturing method includes forming a superconductive thin-film layer on a substrate and processing the superconductive thin-film layer into a shape of a detection coil for magnetic resonance measurement. Accordingly, a superconductive thin-film layer having the detection coil shape can be formed. The method further includes irradiating the shape-processed superconductive... Jeol Ltd

Mass spectrometry data analysis method

regarding DA, DB, dA, and dB, and obtaining degree-of-polymerization information nA and nB, and displaying plots corresponding to each peak on two-dimensional coordinates where nA and nB are axes.... Jeol Ltd

Charged particle beam system and aberration correction

There is provided a charged particle beam system for reducing phase variations in a charged particle beam due to sixth order three-lobe aberration. The charged particle beam system (100) is equipped with an aberration corrector (30) for correcting aberrations in the optical system, and includes: an aberration measuring section (44)... Jeol Ltd

Magnetic resonance signal detection module

A pair of detection coils, one coil provided on each side of a sample container across the width of the sample container. The detection coil is made of a superconductor and has an electric circuit pattern capable of detecting a magnetic resonance signal from a sample. The detection coil includes... Jeol Ltd

Electron microscope and controlling same

There is provided an electron microscope in which a crossover position can be kept constant. The electron microscope (100) includes: an electron source (110) for emitting an electron beam; an acceleration tube (170) having acceleration electrodes (170a-170f) and operative to accelerate the electron beam; a first electrode (160) operative such... Jeol Ltd

Automatic analysis device and separation and washing method

An automatic analysis device and method having a BF separation process, wherein the width in a container conveyance direction of a surface facing a reaction container of a magnet for preliminary magnetic collection of a first magnetic generation part (32p) is set to have a length including a region for... Jeol Ltd

Luminescence measuring device and automatic analysis device

The present invention is a luminescence measuring device that is provided with: a black box-like housing (10) having a vessel accommodating portion for a reaction vessel (S), a reaction vessel insertion/withdrawal opening (12), and a penetrating light path (13) that connects the vessel accommodating portion to the outside; a light... Jeol Ltd

Beam alignment method and electron microscope

There is provided a beam alignment method capable of easily aligning an electron beam with a coma-free axis in an electron microscope. The method starts with tilting the electron beam (EB) in a first direction (+X) relative to a reference axis (A) and obtaining a first TEM (transmission electron microscope)... Jeol Ltd

Three-dimensional image reconstruction method, image processor, and electron microscope

A three-dimensional image reconstruction method associated with the present invention comprises the steps of: obtaining a first transmission electron microscope image of a sample containing the membrane proteins present within a lipid membrane, the image having been taken by illuminating an electron beam on the sample from a direction tilted... Jeol Ltd

Charged particle beam system

There is provided a charged particle beam system in which a detector can be placed in an appropriate analysis position. The charged particle beam system (100) includes: a charged particle source (11) for producing charged particles; a sample holder (20) for holding a sample (S); a detector (40) for detecting,... Jeol Ltd

Method of aberration correction and charged particle beam system

There are disclosed an aberration correction method and a charged particle beam system capable of correcting off-axis first order aberrations. The aberration correction method is for use in the charged particle beam system (100) equipped with an aberration corrector (30) which has plural stages of multipole elements (32a, 32b) and... Jeol Ltd

Electron microscope and aberration measurement

There is provided an electron microscope capable of measuring aberration with high accuracy. The electron microscope (100) comprises: an electron beam source (10) for producing an electron beam (EB); an illumination lens system (101) for focusing the electron beam (EB) onto a sample (S); a scanner (12) for scanning the... Jeol Ltd

Nmr measuring probe

A sample tube is arranged in a sample temperature adjusting pipe, and a temperature adjustment gas is supplied. A vacuum vessel is formed with the sample temperature adjusting pipe and an outer wall body, and a detection coil and the like to be placed in a cooling state are arranged... Jeol Ltd

Nuclear magnetic resonance measurement processing exhaust gas

A probe head in a nuclear magnetic resonance measurement apparatus includes a rotating mechanism. In the probe head, an exhaust gas having a high temperature or a low temperature is discharged from a discharge port of the rotating mechanism. An additive gas having room temperature is introduced into the probe... Jeol Ltd

Container supply unit and automated analyzer

A container supply unit and an automated analyzer in which anomalous orientations of containers ejected from a container (cuvette) ejection part can be prevented. This container supply unit has a container storage part, a container ejection part, and a container alignment part. The container ejection part includes a circular belt,... Jeol Ltd

Automated analyzer and nozzle-cleaning method

To clean a nozzle that is part of an automated analyzer and is provided with both a tubular discharge unit that discharges a cleaning liquid and a tubular suction unit that suctions in cleaning liquid that was discharged from the discharge unit and is running down an outer surface, first... Jeol Ltd

Specimen loading method, specimen stage, and charged particle beam device

A specimen loading method for loading a specimen that contains water into a specimen chamber of a charged particle beam device, includes: a step (S100) of mounting the specimen on a specimen support; a step (S102) of covering a predetermined area of the specimen with a water retention material; a... Jeol Ltd

Method for clinical examinations and cleaning method therefor

An method is offered which can clean the nozzles of a reaction cuvette wash unit. A first detergent is put in first reagent containers located on a first reagent turntable. A computer controller drives a first reagent pipette to aspirate the detergent from the first reagent containers and to deliver... Jeol Ltd

Charged particle system and measuring method

There is provided a charged particle system capable of measuring deflection fields in a sample without using a segmented detector. The charged particle system (100) has: illumination optics (104) for illuminating the sample with charged particles; an imaging deflector system (112) disposed behind an objective lens (110) and operative to... Jeol Ltd

Charged particle beam system

There is provided a charged particle beam system capable of reducing contamination of at least one sample. The charged particle beam system (100) has a sample chamber (15) in which the sample (S) is irradiated with a charged particle beam. The system (100) has a receptacle chamber (21) which is... Jeol Ltd

Calibration method and charged particle beam system

There is provided a method capable of calibrating a sample stage easily. This method is for use in a charged particle beam system having the sample stage for moving a sample and an imaging subsystem for capturing a charged particle beam image and obtaining a final image. The method includes... Jeol Ltd

Detector apparatus and charged particle beam system

There is provided a detector apparatus capable of detecting the position or tilt angle of a sample stage with high resolution and high reliability. The detector apparatus (100) is operative to detect the position or tilt angle of the sample stage (2), and has a potentiometer (10) for detecting the... Jeol Ltd

Reagent vessel housing unit and automatic analysis device

This reagent vessel housing unit 7 is provided with a drive unit 121, a base member 122, a first opening/closing mechanism 135, and a second opening/closing mechanism 136. By means of the driving force of the drive unit 121, the base member 122 can move to an initial position, at... Jeol Ltd

Analysis method and x-ray photoelectron spectroscope

An analysis method includes: acquiring a photoelectron spectrum and an X-ray-excited Auger spectrum, the photoelectron spectrum being obtained by detecting photoelectrons emitted from a specimen by irradiating the specimen with X-rays, and the X-ray-excited Auger spectrum being obtained by detecting Auger electrons emitted from the specimen by irradiating the specimen... Jeol Ltd

Electron microscope

There is provided an electron microscope capable of easily achieving power saving. The electron microscope (100) includes a controller (60) for switching the mode of operation of the microscope from a first mode where electron lenses (12, 14, 18, 20) are activated to a second mode where the electron lenses... Jeol Ltd

Electron microscope and measurement method

An electron microscope is provided which can measure, with high sensitivity and high positional resolution, an amount of deflection of an electron beam occurring when it is transmitted through a sample. The electron microscope (100) is adapted to measure the amount of deflection of the electron beam (EB) when it... Jeol Ltd

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by