new TOP 200 Companies filing patents this week

new Companies with the Most Patent Filings (2010+)


Adobe patents
Amazon patents
Apple patents
Ebay patents
Facebook patents
Google patents
IBM patents
Linkedin patents
Microsoft patents
Oracle patents
Red Hat patents
Yahoo patents

Nike patents
Pfizer patents
Monsanto patents
Medtronic patents
Kraft patents

Boeing patents
Tesla Motors patents

Qualcomm patents
Motorola patents
Nokia patents
RIMM patents

Applied Materials
Seagate patents
General Electric
Caterpillar patents
Wal-mart patents


Jeol Ltd patents

Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors

Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12015020670307/23/15  new patent  Sample introduction device and charged particle beam instrument
22015016832106/18/15 Surface analysis instrument
32015016843506/18/15 Automated analyzer
42015016851806/18/15 Device for attaching and detaching nmr probe
52015013697805/21/15 Focused ion beam system and making focal adjustment of ion beam
62015013698005/21/15 Image acquisition method and transmission electron microscope
72015013700005/21/15 Charged particle beam instrument and sample container
82015013700105/21/15 Charged particle beam instrument
92015008391303/26/15 Radiation detector and sample analyzer
102015005797902/26/15 System and processing nmr signals
112015002959301/29/15 Spherical aberration corrector, spherical aberration correction, and charged particle beam instrument
122015001452701/15/15 Scanning charged particle microscope, image acquisition method, and electron detection method
132014037459412/25/14 Detector and charged particle beam instrument
142014036758512/18/14 Method for axial alignment of charged particle beam and charged particle beam system
152014034146911/20/14 Image processing method, image processor, imager, and computer program
162014031290010/23/14 Spinning controller for nmr sample tube
172014029039310/02/14 Sample introduction device and charged particle beam instrument
182014022911808/14/14 Method and sample analysis
192014018335807/03/14 Phase plate and fabricating same
202014016687406/19/14 Imaging mass spectrometer and controlling same
212014015890106/12/14 Chromatic aberration corrector and electron microscope
222014015890706/12/14 Specimen positioning device, charged particle beam system, and specimen holder
232014015891006/12/14 Disinfecting device
242014013853605/22/14 Mass spectrometer and controlling same
252014013853905/22/14 Mass spectrometer and adjusting same
262014011283004/24/14 Automated analyzer
272014009121604/03/14 Sample analyzer
282014008415803/27/14 Scanning electron microscope
292014007707603/20/14 Time-of-flight mass spectrometer and controlling same
302014005446802/27/14 Chromatic aberration corrector and controlling same
312013030685911/21/13 Tandem time-of-flight mass spectrometer and mass spectrometry using the same
322013028989210/31/13 Time-of-flight mass spectrometer and data compression method therefor
332013026612010/10/13 Spectroscopic apparatus
342013024869909/26/13 Method of adjusting transmission electron microscope
352013024163309/19/13 Method and signal processing
362013020698708/15/13 Transmission electron microscope
372013016854907/04/13 Method of evacuating sample holder, pumping system, and electron microscope
382013013432505/30/13 Ion beam processing system and sample processing method
392013004024102/14/13 Method and system for charged particle beam lithography
402012031830212/20/12 Instrument and clinical examinations and cleaning method therefor
412012029885511/29/12 Apparatus and time-of-flight mass spectrometry
422012024160909/27/12 Electron detecting mechanism and charged particle beam system equipped therewith
432012022815809/13/12 Method and electrolyte measurements
442012018142507/19/12 Electron probe microanalyzer and data processing method implemented therein
452012016099806/28/12 Mass spectrometer
462012015676406/21/12 Automated analyzer
472012013879306/07/12 Method of making axial alignment of charged particle beam and charged particle beam system
482012012848405/24/12 Turbomolecular pump and connector device therefor
492012011910705/17/12 Method for axial alignment of charged particle beam and charged particle beam system
502012008590504/12/12 Tandem time-of-flight mass spectrometer
512012006806203/22/12 Method and tandem time-of-flight mass spectrometry
522012006159303/15/12 Charged-particle beam lithographic apparatus and lithographic method therefor
532011029100312/01/11 Mass spectrometer
542011028474511/24/11 Sample holder, inspection apparatus, and inspection method
552011028475811/24/11 Spherical aberration corrector and spherical aberration correction
562011028476011/24/11 Synchrotron power cycling apparatus and use thereof
572011028476111/24/11 Synchrotron power supply apparatus and use thereof
582011028476211/24/11 Charged particle extraction apparatus and use thereof
592011024167410/06/11 Sample tube and measurement solid-state nmr
602011022078609/15/11 Tandem time-of-flight mass spectrometer
612011017496707/21/11 Time-of-flight mass spectrometer
622011013998606/16/11 Electron microscope
632011013307306/09/11 Method and time-of-flight mass spectrometry
642011008017104/07/11 Method and accurately adjusting magic angle in nmr
652011006232603/17/11 Method and system for acquisition of confocal stem images
662011000620901/13/11 Electron beam apparatus
672010032101812/23/10 High-resolution nmr probe
682010029493211/25/10 Magnetic domain imaging system
692010028451311/11/10 Wavelength-dispersive x-ray spectrometer
702010024388809/30/10 Apparatus and inspecting samples
712010022478109/09/10 Electron microscope
722010017515407/08/10 Apparatus for controlling z-position of probe
732010016374207/01/10 Silicon drift x-ray detector
742010014047106/10/10 Electron beam apparatus and operating the same
752010013344806/03/10 Object-positioning device for charged-particle beam system
762010009654904/22/10 Sample inspection apparatus, sample inspection method and sample inspection system
772010008456704/08/10 Chromatic aberration corrector for charged-particle beam system and correction method therefor
782010007238703/25/10 Aberration corrector and charged-particle beam system equipped therewith
792010007299503/25/10 Nmr measurement method
802010005180303/04/10 Particle beam system
812010001914601/28/10 Specimen holder, specimen inspection apparatus, and specimen inspection method
822009031495512/24/09 Specimen holder, specimen inspection apparatus, and specimen inspection method
832009031074812/17/09 Method and analysis using x-ray spectra
842009026182910/22/09 Nmr probe
852009025607410/15/09 Apparatus and inspection
862009025060910/08/09 Inspection method and reagent solution
872009024276210/01/09 Apparatus and inspecting sample
882009023031609/17/09 Method of suppressing beam position drift, suppressing beam dimension drift, and charged-particle beam lithography system
892009023031909/17/09 Specimen stage-moving device for charged-particle beam system
902009022416909/10/09 Scanning transmission electron microscope and aberration correction therefor
912009021220808/27/09 Method and time-of-flight mass spectrometry
922009018906207/30/09 Method of calibrating beam position in charged-particle beam system
932009016653607/02/09 Sample holder, observation and inspection, and observation and inspection
942009015979706/25/09 Transmission electron microscope
952009012113005/14/09 Orthogonal acceleration time-of-flight mass spectrometer
962009012605105/14/09 Method and system for sample preparation
972009009061904/09/09 Thin-film deposition system
982009005755203/05/09 Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
992009005262002/26/09 Apparatus and x-ray analysis of chemical state
1002009004533702/19/09 Charged-particle beam instrument
1012009003270902/05/09 Aberration correction system
1022009003273902/05/09 Method and system for charged-particle beam lithography

ARCHIVE: New 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by