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Jeol Ltd patents

Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors

Search recent Press Releases: Jeol Ltd-related press releases
Count Application # Date Jeol Ltd patents (updated weekly) - BOOKMARK this page
12016001969601/21/16 Device and computing amount of drift and charged particle beam system
22016002006601/21/16 Device and computing angular range for measurement of aberrations and electron microscope
32016002006701/21/16 Radiation analyzer
42016001301201/14/16 Charged particle beam system
52016000198101/07/16 Measuring container supplying device
62015036244612/17/15 Phase analyzer, phase analysis method, and surface analyzer
72015035520912/10/15 Automated analyzer
82015034607012/03/15 Flow analyzer and flow analysis method
92015033288911/19/15 Multipole lens, aberration corrector, and electron microscope
102015031438911/05/15 Machine and additive manufacturing
112015030666610/29/15 Additive manufacturing machine
122015030669910/29/15 Machine and additive manufacturing
132015030670010/29/15 Machine and additive manufacturing
142015030906010/29/15 Apparatus and automated analysis
152015031102810/29/15 Apparatus and sample preparation
162015031102910/29/15 Transmission electron microscope
172015030302710/22/15 Charged-particle beam lithographic system
182015028756610/08/15 Multipole lens, fabricating same, and charged particle beam system
192015027362210/01/15 Machine and additive manufacturing
202015027663010/01/15 X-ray spectrometer and sample analyzer
212015027695210/01/15 Radiation detector assembly and sample analyzer
222015027008809/24/15 Electron gun, controlling same, and electron beam additive manufacturing machine
232015025978509/17/15 Method of fabricating sample support membrane
242015026278509/17/15 Transmission electron microscope and displaying tem images
252015025524509/10/15 Charged particle beam system
262015021954708/06/15 Particle analysis instrument and computer program
272015020670307/23/15 Sample introduction device and charged particle beam instrument
282015016832106/18/15 Surface analysis instrument
292015016843506/18/15 Automated analyzer
302015016851806/18/15 Device for attaching and detaching nmr probe
312015013697805/21/15 Focused ion beam system and making focal adjustment of ion beam
322015013698005/21/15 Image acquisition method and transmission electron microscope
332015013700005/21/15 Charged particle beam instrument and sample container
342015013700105/21/15 Charged particle beam instrument
352015008391303/26/15 Radiation detector and sample analyzer
362015005797902/26/15 System and processing nmr signals
372015002959301/29/15 Spherical aberration corrector, spherical aberration correction, and charged particle beam instrument
382015001452701/15/15 Scanning charged particle microscope, image acquisition method, and electron detection method
392014037459412/25/14 Detector and charged particle beam instrument
402014036758512/18/14 Method for axial alignment of charged particle beam and charged particle beam system
412014034146911/20/14 Image processing method, image processor, imager, and computer program
422014031290010/23/14 Spinning controller for nmr sample tube
432014029039310/02/14 Sample introduction device and charged particle beam instrument
442014022911808/14/14 Method and sample analysis
452014018335807/03/14 Phase plate and fabricating same
462014016687406/19/14 Imaging mass spectrometer and controlling same
472014015890106/12/14 Chromatic aberration corrector and electron microscope
482014015890706/12/14 Specimen positioning device, charged particle beam system, and specimen holder
492014015891006/12/14 Disinfecting device
502014013853605/22/14 Mass spectrometer and controlling same
512014013853905/22/14 Mass spectrometer and adjusting same
522014011283004/24/14 Automated analyzer
532014009121604/03/14 Sample analyzer
542014008415803/27/14 Scanning electron microscope
552014007707603/20/14 Time-of-flight mass spectrometer and controlling same
562014005446802/27/14 Chromatic aberration corrector and controlling same
572013030685911/21/13 Tandem time-of-flight mass spectrometer and mass spectrometry using the same
582013028989210/31/13 Time-of-flight mass spectrometer and data compression method therefor
592013026612010/10/13 Spectroscopic apparatus
602013024869909/26/13 Method of adjusting transmission electron microscope
612013024163309/19/13 Method and signal processing
622013020698708/15/13 Transmission electron microscope
632013016854907/04/13 Method of evacuating sample holder, pumping system, and electron microscope
642013013432505/30/13 Ion beam processing system and sample processing method
652013004024102/14/13 Method and system for charged particle beam lithography
662012031830212/20/12 Instrument and clinical examinations and cleaning method therefor
672012029885511/29/12 Apparatus and time-of-flight mass spectrometry
682012024160909/27/12 Electron detecting mechanism and charged particle beam system equipped therewith
692012022815809/13/12 Method and electrolyte measurements
702012018142507/19/12 Electron probe microanalyzer and data processing method implemented therein
712012016099806/28/12 Mass spectrometer
722012015676406/21/12 Automated analyzer
732012013879306/07/12 Method of making axial alignment of charged particle beam and charged particle beam system
742012012848405/24/12 Turbomolecular pump and connector device therefor
752012011910705/17/12 Method for axial alignment of charged particle beam and charged particle beam system
762012008590504/12/12 Tandem time-of-flight mass spectrometer
772012006806203/22/12 Method and tandem time-of-flight mass spectrometry
782012006159303/15/12 Charged-particle beam lithographic apparatus and lithographic method therefor
792011029100312/01/11 Mass spectrometer
802011028474511/24/11 Sample holder, inspection apparatus, and inspection method
812011028475811/24/11 Spherical aberration corrector and spherical aberration correction
822011028476011/24/11 Synchrotron power cycling apparatus and use thereof
832011028476111/24/11 Synchrotron power supply apparatus and use thereof
842011028476211/24/11 Charged particle extraction apparatus and use thereof
852011024167410/06/11 Sample tube and measurement solid-state nmr
862011022078609/15/11 Tandem time-of-flight mass spectrometer
872011017496707/21/11 Time-of-flight mass spectrometer
882011013998606/16/11 Electron microscope
892011013307306/09/11 Method and time-of-flight mass spectrometry
902011008017104/07/11 Method and accurately adjusting magic angle in nmr
912011006232603/17/11 Method and system for acquisition of confocal stem images
922011000620901/13/11 Electron beam apparatus
932010032101812/23/10 High-resolution nmr probe
942010029493211/25/10 Magnetic domain imaging system
952010028451311/11/10 Wavelength-dispersive x-ray spectrometer
962010024388809/30/10 Apparatus and inspecting samples
972010022478109/09/10 Electron microscope
982010017515407/08/10 Apparatus for controlling z-position of probe
992010016374207/01/10 Silicon drift x-ray detector
1002010014047106/10/10 Electron beam apparatus and operating the same
1012010013344806/03/10 Object-positioning device for charged-particle beam system
1022010009654904/22/10 Sample inspection apparatus, sample inspection method and sample inspection system
1032010008456704/08/10 Chromatic aberration corrector for charged-particle beam system and correction method therefor
1042010007238703/25/10 Aberration corrector and charged-particle beam system equipped therewith
1052010007299503/25/10 Nmr measurement method
1062010005180303/04/10 Particle beam system
1072010001914601/28/10 Specimen holder, specimen inspection apparatus, and specimen inspection method
1082009031495512/24/09 Specimen holder, specimen inspection apparatus, and specimen inspection method
1092009031074812/17/09 Method and analysis using x-ray spectra
1102009026182910/22/09 Nmr probe
1112009025607410/15/09 Apparatus and inspection
1122009025060910/08/09 Inspection method and reagent solution
1132009024276210/01/09 Apparatus and inspecting sample
1142009023031609/17/09 Method of suppressing beam position drift, suppressing beam dimension drift, and charged-particle beam lithography system
1152009023031909/17/09 Specimen stage-moving device for charged-particle beam system
1162009022416909/10/09 Scanning transmission electron microscope and aberration correction therefor
1172009021220808/27/09 Method and time-of-flight mass spectrometry
1182009018906207/30/09 Method of calibrating beam position in charged-particle beam system
1192009016653607/02/09 Sample holder, observation and inspection, and observation and inspection
1202009015979706/25/09 Transmission electron microscope
1212009012113005/14/09 Orthogonal acceleration time-of-flight mass spectrometer
1222009012605105/14/09 Method and system for sample preparation
1232009009061904/09/09 Thin-film deposition system
1242009005755203/05/09 Mass spectrometer equipped with maldi ion source and sample plate for maldi ion source
1252009005262002/26/09 Apparatus and x-ray analysis of chemical state
1262009004533702/19/09 Charged-particle beam instrument
1272009003270902/05/09 Aberration correction system
1282009003273902/05/09 Method and system for charged-particle beam lithography

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jeol Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jeol Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by