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Johnstech International Corporation patents


Recent patent applications related to Johnstech International Corporation. Johnstech International Corporation is listed as an Agent/Assignee. Note: Johnstech International Corporation may have other listings under different names/spellings. We're not affiliated with Johnstech International Corporation, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Johnstech International Corporation-related inventors


Low resistance low wear test pin for test contactor

A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining... Johnstech International Corporation

Electrically conductive pins for microcircuit tester

The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a... Johnstech International Corporation

Electrically conductive pins microcircuit tester

The terminals of a device under test (DUT) are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane with a top facing the device under test, a bottom facing... Johnstech International Corporation

Wafer level integrated circuit probe array and construction

A testing device for wafer level testing of IC circuits is disclosed. An upper and lower pin (22, 62) are configured to slide relatively to each other and are held in electrically biased contact by an elastomer (80). To prevent rotation of the pins in the pin guide, a walled... Johnstech International Corporation

Testing microcircuit testing with conical bias pad and conductive test pin rings

The test system provides an array of test probes. The probes pass through a first or upper probe guide retainer which has a plurality of slot sized to receive the probes in a way that they cannot rotate. A plurality of flex circuits at the different heights engage bottom probe... Johnstech International Corporation

Low resistance low wear test pin for test contactor

A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining... Johnstech International Corporation








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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Johnstech International Corporation in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Johnstech International Corporation with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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