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Jordan Valley Semiconductors Ltd patents

Recent patent applications related to Jordan Valley Semiconductors Ltd. Jordan Valley Semiconductors Ltd is listed as an Agent/Assignee. Note: Jordan Valley Semiconductors Ltd may have other listings under different names/spellings. We're not affiliated with Jordan Valley Semiconductors Ltd, we're just tracking patents.

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jordan Valley Semiconductors Ltd-related inventors

Date Jordan Valley Semiconductors Ltd patents (updated weekly) - BOOKMARK this page
05/05/16Measurement of small features using xrf
12/24/15X-ray scatterometry apparatus
12/24/15Using multiple sources/detectors for high-throughput x-ray topography measurement
11/19/15Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-xrf
08/27/15X-ray source assembly
07/23/15Angle calibration for grazing-incidence x-ray fluorescence (gixrf)
09/25/14Estimation of xrf intensity from an array of micro-bumps
10/31/13X-ray beam conditioning
04/11/13X-ray inspection of bumps on a semiconductor substrate
02/14/13Detection of wafer-edge defects
11/08/12High-resolution x-ray diffraction measurement with enhanced sensitivity
11/01/12Combining x-ray and vuv analysis of thin film layers
07/19/12Optical vacuum ultra-violet wavelength nanoimprint metrology
06/07/12Fast measurement of x-ray diffraction from tilted layers
01/19/12Enhancing accuracy of fast high-resolution x-ray diffractometry
07/07/11High-resolution x-ray diffraction measurement with enhanced sensitivity
12/30/10Broad band referencing reflectometer
12/02/10Method and accurate calibration of vuv reflectometer
11/18/10Method and system for using reflectometry below deep ultra-violet (duv) wavelengths for measuring properties of diffracting or scattering structures on substrate work pieces
11/04/10Combined optical metrology techniques
03/19/09Accurate measurement of layer dimensions using xrf
03/19/09Automated selection of x-ray reflectometry measurement locations

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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Jordan Valley Semiconductors Ltd in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Jordan Valley Semiconductors Ltd with additional patents listed. Browse our Agent directory for other possible listings. Page by