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Jordan Valley Semiconductors Ltd patents

Recent patent applications related to Jordan Valley Semiconductors Ltd. Jordan Valley Semiconductors Ltd is listed as an Agent/Assignee. Note: Jordan Valley Semiconductors Ltd may have other listings under different names/spellings. We're not affiliated with Jordan Valley Semiconductors Ltd, we're just tracking patents.

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Date Jordan Valley Semiconductors Ltd patents (updated weekly) - BOOKMARK this page
05/05/16Measurement of small features using xrf
12/24/15X-ray scatterometry apparatus
12/24/15Using multiple sources/detectors for high-throughput x-ray topography measurement
11/19/15Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-xrf
08/27/15X-ray source assembly
07/23/15Angle calibration for grazing-incidence x-ray fluorescence (gixrf)
09/25/14Estimation of xrf intensity from an array of micro-bumps
10/31/13X-ray beam conditioning
04/11/13X-ray inspection of bumps on a semiconductor substrate
02/14/13Detection of wafer-edge defects
11/08/12High-resolution x-ray diffraction measurement with enhanced sensitivity
11/01/12Combining x-ray and vuv analysis of thin film layers
07/19/12Optical vacuum ultra-violet wavelength nanoimprint metrology
06/07/12Fast measurement of x-ray diffraction from tilted layers
01/19/12Enhancing accuracy of fast high-resolution x-ray diffractometry
07/07/11High-resolution x-ray diffraction measurement with enhanced sensitivity
12/30/10Broad band referencing reflectometer
12/02/10Method and accurate calibration of vuv reflectometer
11/18/10Method and system for using reflectometry below deep ultra-violet (duv) wavelengths for measuring properties of diffracting or scattering structures on substrate work pieces
11/04/10Combined optical metrology techniques
03/19/09Accurate measurement of layer dimensions using xrf
03/19/09Automated selection of x-ray reflectometry measurement locations







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