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Kabushiki Kaisha Nihon Micronics
Kabushiki Kaisha Nihon Micronics_20100121
Kabushiki Kaisha Nihon Micronics_20131212
Kabushiki Kaisha Nihon Micronics_20100128

Kabushiki Kaisha Nihon Micronics patents


Recent patent applications related to Kabushiki Kaisha Nihon Micronics. Kabushiki Kaisha Nihon Micronics is listed as an Agent/Assignee. Note: Kabushiki Kaisha Nihon Micronics may have other listings under different names/spellings. We're not affiliated with Kabushiki Kaisha Nihon Micronics, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "K" | Kabushiki Kaisha Nihon Micronics-related inventors


Probe, probe card and contact inspection device

A probe includes: a probe base body having a first end as a portion that contacts a test object in an inspection and a second end that contacts a contact point member; a covering member that covers the probe base body between the first end and the second end; and... Kabushiki Kaisha Nihon Micronics

Probe card with temperature control function, inspection device using the same, and inspection method

A probe card having uniform temperature distribution under control to a desired temperature is provided, so as to provide an inspection apparatus and an inspection method. The probe card includes a supporting substrate, a wiring layer arranged including a wiring on a main surface of the supporting substrate, a probe... Kabushiki Kaisha Nihon Micronics

Semiconductor module, electrical connector, and inspection apparatus

A semiconductor module includes a control IC mounted on a mounting substrate and a plurality of semiconductor chips mounted on the mounting substrate, and each of the plurality of semiconductor chips includes first and second transistors connected in series between a device to be inspected and a tester. The first... Kabushiki Kaisha Nihon Micronics

Electrical contactor and electrical connecting apparatus

An electrical contactor of this invention includes: a first plunger to contact one member, the first plunger including a tip portion formed into a plurality of chevron shapes; a second plunger to contact a counterpart member, the second plunger working in cooperation with the first plunger to form electrical conduction... Kabushiki Kaisha Nihon Micronics

Testing device and testing sheet-shaped cell

A testing device for a sheet-shaped cell and a testing method for a sheet-shaped cell according to the present invention includes a folding unit that folds a sheet-shaped cell having electrode layers on both faces while alternately changing a folding direction, and a testing unit that performs a predetermined test... Kabushiki Kaisha Nihon Micronics

Battery

According to the present invention, an excellent battery is provided. A battery according to an exemplary embodiment of the present invention includes a first electrode layer (6), a second electrode layer (7), and a charging element (3) to which a charging voltage between the first and second electrode layers is... Kabushiki Kaisha Nihon Micronics








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