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Kabushiki Kaisha Nihon Micronics
Kabushiki Kaisha Nihon Micronics_20100121
Kabushiki Kaisha Nihon Micronics_20131212
Kabushiki Kaisha Nihon Micronics_20100128

Kabushiki Kaisha Nihon Micronics patents

Recent patent applications related to Kabushiki Kaisha Nihon Micronics. Kabushiki Kaisha Nihon Micronics is listed as an Agent/Assignee. Note: Kabushiki Kaisha Nihon Micronics may have other listings under different names/spellings. We're not affiliated with Kabushiki Kaisha Nihon Micronics, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "K" | Kabushiki Kaisha Nihon Micronics-related inventors

Probe, probe card and contact inspection device

A probe includes: a probe base body having a first end as a portion that contacts a test object in an inspection and a second end that contacts a contact point member; a covering member that covers the probe base body between the first end and the second end; and... Kabushiki Kaisha Nihon Micronics

Probe card with temperature control function, inspection device using the same, and inspection method

A probe card having uniform temperature distribution under control to a desired temperature is provided, so as to provide an inspection apparatus and an inspection method. The probe card includes a supporting substrate, a wiring layer arranged including a wiring on a main surface of the supporting substrate, a probe... Kabushiki Kaisha Nihon Micronics

Semiconductor module, electrical connector, and inspection apparatus

A semiconductor module includes a control IC mounted on a mounting substrate and a plurality of semiconductor chips mounted on the mounting substrate, and each of the plurality of semiconductor chips includes first and second transistors connected in series between a device to be inspected and a tester. The first... Kabushiki Kaisha Nihon Micronics

Electrical contactor and electrical connecting apparatus

An electrical contactor of this invention includes: a first plunger to contact one member, the first plunger including a tip portion formed into a plurality of chevron shapes; a second plunger to contact a counterpart member, the second plunger working in cooperation with the first plunger to form electrical conduction... Kabushiki Kaisha Nihon Micronics

Testing device and testing sheet-shaped cell

A testing device for a sheet-shaped cell and a testing method for a sheet-shaped cell according to the present invention includes a folding unit that folds a sheet-shaped cell having electrode layers on both faces while alternately changing a folding direction, and a testing unit that performs a predetermined test... Kabushiki Kaisha Nihon Micronics


According to the present invention, an excellent battery is provided. A battery according to an exemplary embodiment of the present invention includes a first electrode layer (6), a second electrode layer (7), and a charging element (3) to which a charging voltage between the first and second electrode layers is... Kabushiki Kaisha Nihon Micronics

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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Kabushiki Kaisha Nihon Micronics in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Kabushiki Kaisha Nihon Micronics with additional patents listed. Browse our Agent directory for other possible listings. Page by