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Kabushiki Kaisha Nihon Micronics
Kabushiki Kaisha Nihon Micronics_20100121
Kabushiki Kaisha Nihon Micronics_20131212
Kabushiki Kaisha Nihon Micronics_20100128
  

Kabushiki Kaisha Nihon Micronics patents

Recent patent applications related to Kabushiki Kaisha Nihon Micronics. Kabushiki Kaisha Nihon Micronics is listed as an Agent/Assignee. Note: Kabushiki Kaisha Nihon Micronics may have other listings under different names/spellings. We're not affiliated with Kabushiki Kaisha Nihon Micronics, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "K" | Kabushiki Kaisha Nihon Micronics-related inventors




Date Kabushiki Kaisha Nihon Micronics patents (updated weekly) - BOOKMARK this page
09/22/16Secondary battery and manufacturing the same
06/23/16Secondary battery-mounted circuit chip and manufacturing method thereof
05/26/16Contact inspection device
05/26/16Probe and contact inspection device
04/28/16Electrical contactor and electrical connecting apparatus
02/11/16Stacked-type secondary battery
07/09/15Semiconductor probe, testing device and testing testing quantum battery
07/02/15Secondary battery
07/02/15Charging/discharging device
06/04/15Electrode structure of solid type secondary battery
05/28/15Inspection apparatus and inspection method
05/14/15Inspection apparatus
04/23/15Multi-layer wiring board and process for manufcturing the same
04/23/15Inspection apparatus and inspection method
04/23/15Secondary battery
03/12/15Secondary battery
01/08/15Electric connecting apparatus
01/08/15Electric connecting apparatus
01/01/15Repair apparatus of sheet type cell
12/25/14Inspection apparatus and inspection inspecting a wiring board
12/18/14Method for aligning plate-like members and manufacturing electrical connecting apparatus
12/18/14Probe card and manufacturing the same
12/04/14Repeatedly chargeable and dischargeable quantum battery
11/06/14Evaluation apparatus and evaluation sheet type cell
10/30/14Testing device and testing quantum battery using semiconductor probe
10/09/14Probe assembly and probe base plate
05/29/14Probe card and inspection device
05/22/14Multilayer wiring board and manufacturing the same
05/01/14Inspection unit, probe card, inspection device, and control system for inspection device
04/24/14Method for manufacturing a probe
03/13/14Method for manufacturing electric film body
02/13/14Contact probe and probe card
01/23/14Contact inspection device
01/09/14Electrical contactor and contact the same
12/12/13Probe card
12/05/13Electrical test probe
09/19/13Wiring base plate and manufacturing the same
08/15/13Electrical connecting assembling the same
07/25/13Inspection apparatus
06/27/13Method for aligning plate-like members and manufacturing electrical connecting apparatus
06/20/13Probe assembly, probe card including the same, and methods for manufacturing these
06/06/13Probe assembly for inspecting power semiconductor devices and inspection apparatus using the same
06/06/13Inspection semiconductor devices and chuck stage used for the inspectionapparatus
05/16/13Probe card and manufacturing the same
05/09/13Probe block, probe card and probe apparatus both having the probe block
08/23/12Contact and electrical connecting apparatus
06/21/12Wire forming device
06/14/12Electrical connecting manufacturing the same
05/24/12Chip stack device testing method, chip stack device rearranging unit, and chip stack device testing apparatus
05/24/12Contact and electrical connecting apparatus
03/22/12Electrical test probe and probe assembly
02/23/12Method for manufacturing probe card
02/23/12Method for manufacturing probe card
01/26/12Method for forming terminal of stacked package element and forming stacked package
01/05/12Electrical connecting apparatus and contacts used therefor
07/21/11Probe for electrical test and manufacturing the same, and electrical connecting manufacturing the same
06/30/11Method for manufacturing probe sheet
05/19/11Probe for electrical test, electrical connecting apparatus using the same, and manufacturing probe
04/28/11Electrical connecting apparatus and testing system using the same
01/27/11Test apparatus of semiconductor device and method thereof
01/06/11Testing integrated circuit
12/30/10Probe card and inspection apparatus
12/02/10Stacked package and forming stacked package
11/18/10Inspection apparatus
09/02/10Probe and electrical connecting apparatus using it
Patent Packs
08/26/10Probe for current test, probe assembly and production method thereof
08/19/10Electrical connecting apparatus
08/05/10Electrical connecting apparatus
07/29/10Electrical connecting apparatus
07/01/10Method and testing integrated circuit
06/24/10Probe card
06/03/10Electrical connecting apparatus
05/13/10Contact and electrical connecting apparatus
04/29/10Electrical connecting apparatus
04/22/10Electrical connecting apparatus
03/18/10Electrical connecting apparatus
03/11/10Electrical connecting apparatus
02/18/10Method for forming terminal of stacked package element and forming stacked package
02/04/10Electrical connecting apparatus
01/28/10Electrical connecting apparatus
Patent Packs
01/21/10Stacked package and forming stacked package
11/19/09Method for assembling electrical connecting apparatus
11/05/09Contact for electrical test of electronic devices, manufacturing the same, and probe assembly
10/22/09Probe sheet and electrical connecting apparatus
10/01/09Multilayer wiring board and electrical connecting apparatus using the same
09/17/09Contact for electrical test, electrical connecting apparatus using it, and producing the contact
08/27/09Electrical connecting apparatus
06/25/09Electric connecting apparatus
06/25/09Contactor for electrical test, electrical connecting apparatus using the same, and manufacturing contactor
06/04/09Probe card
05/07/09Electrical connecting apparatus
04/23/09Contacts and electrical connecting apparatus using the same
03/05/09Probe assembly, producing it and electrical connecting apparatus
03/05/09Electrical test probe
03/05/09Electrical connecting apparatus
02/26/09Probe for electrical test and electrical connecting apparatus using it
02/05/09Electrical connecting apparatus
12/12/13Probe card
01/28/10Electrical connecting apparatus
01/21/10Stacked package and forming stacked package







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