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Mitutoyo Corporation patents


Recent patent applications related to Mitutoyo Corporation. Mitutoyo Corporation is listed as an Agent/Assignee. Note: Mitutoyo Corporation may have other listings under different names/spellings. We're not affiliated with Mitutoyo Corporation, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "M" | Mitutoyo Corporation-related inventors


 new patent  Control profile measuring apparatus

wherein Vf is a vector along which a probe is displaced along a scanning path, Ve is a vector maintaining a deflection amount of the probe toward a work piece at a standard deflection amount. Vc2 is represented by (Vc1·q)q, Vc1 is a vector in a direction correcting a probe... Mitutoyo Corporation

Absolute position encoder including scale with varying spatial characteristic and utilizing fourier transform or other signal processing

An electronic absolute position encoder is provided including a scale, a detector portion and a signal processing configuration. The scale includes a first scale pattern of signal modulating elements, wherein the first scale pattern includes a spatial characteristic of the signal modulating elements which progressively changes as a function of... Mitutoyo Corporation

Method for operating a coordinate measuring machine

A method is disclosed for operating a coordinate measuring machine (CMM) including a CMM control system, a surface scanning probe that measures a workpiece surface by outputting probe workpiece measurements, and a probe measurement timing subsystem. The method comprises: operating the CMM control system to output a measurement synchronization trigger... Mitutoyo Corporation

Method for operating a coordinate measuring machine

A method is disclosed for operating a coordinate measuring machine (CMM) including a workpiece scanning probe. The method provides two different measurement sampling period durations in the scanning probe: a first shorter sampling duration provides a faster measurement having a first accuracy, a second longer sampling duration provides a slower... Mitutoyo Corporation

Laser adjustment method and laser source device

A laser adjustment method includes a first adjustment step and a second adjustment step. In the first adjustment step, using a light detector detecting a second harmonic light, optical intensity and wavelength of the second harmonic light is detected and a first temperature adjuster is adjusted to adjust temperatures of... Mitutoyo Corporation

Current control device and laser device

A current control device supplies a current to a semiconductor laser in order to output laser light to the semiconductor laser, and includes a current commander and a supplier. The current commander outputs a command value corresponding to a current value by increasing the command value with a lapse of... Mitutoyo Corporation

Industrial machine

A coordinate measurement machine includes a column that can move relative to a placement surface on which a workpiece is placed, a guide part that is provided on the placement surface, the guide part guiding the column, a scale of a linear encoder that is supported on a side surface... Mitutoyo Corporation

Interference measuring device and measurement using the same device

The present invention provides an interference measuring device with an optical system that can receive light reflected from a measurement object of a surface profile that is not perpendicular to an optical axis. An interference measuring device includes a light source for emitting light and an interferometric objective lens. The... Mitutoyo Corporation

Position specifying apparatus and position specifying method

A measurement apparatus includes an image acquisition part that acquires a captured image obtained by imaging a partial area on a two-dimensional scale on which a plurality of two-dimensional codes having a first code, which is specified by a combination pattern of a first pixel value image and a second... Mitutoyo Corporation

Super resolution bore imaging system

A super resolution bore imaging system is disclosed for imaging a cylindrical bore. The system includes a controller, a photodetector configuration having a known pixel geometry, and an imaging arrangement that images bore surface segments onto the photodetector. In one embodiment, the controller is configured to acquire respective combinable sets... Mitutoyo Corporation

Measuring instrument

A measuring instrument includes a measuring unit, an electric component unit and a pin jack. The electric component unit includes a signal processing part. The signal processing part is configured to calculate a measurement data based on a detection signal obtained by the measuring unit. The pin jack is provided... Mitutoyo Corporation

Holding mechanism

A holding mechanism used in a measuring device includes a first groove, a second groove, and a pair of holding members holding the detection device by being attached to first and second sides in a length direction of a scale frame. The pair of holding member include a plate-like main... Mitutoyo Corporation

Measuring apparatus and support mechanism of columnar work piece

Measuring apparatus includes an upper support supporting a first end of a columnar work piece in an axis direction, a lower support supporting a second end of the work piece in the axis direction, a probe measuring the work piece supported by the upper support and lower support, a rotary... Mitutoyo Corporation

Light-emitting unit, light-emitting and light-receiving unit and photoelectric encoder

A light-emitting unit includes: a light source; and a reflector having reflection faces of first and second partial paraboloids, the first and second partial paraboloids being spaced from each other in an optical axis direction of the light source, the first and second partial paraboloids having a focal point on... Mitutoyo Corporation

Encoder

An encoder includes: a reading device that reads respective electric signals from two incremental patterns respectively having graduation array pitches different from each other; a control device that calculates a measurement value, based on the electric signals; and an output device that outputs the measurement value. The control device includes:... Mitutoyo Corporation

Measurement switching set value for adjustment

A measurement system includes detachable parts, on which one filter module out of a plurality of filter modules including optical filters that each transmit different types of special light is detachably mounted, a specification part that specifies the optical filter of the one filter module mounted on the detachable parts,... Mitutoyo Corporation

Sensor signal offset compensation system for a cmm touch probe

A touch probe circuit comprises a displacement sensor having a sensor signal responsive to touch probe stylus displacement, an offset compensation controller, and a difference amplifier. The offset compensation controller provides a varying offset compensation signal to compensate drift in a rest-state signal component of the sensor signal. The difference... Mitutoyo Corporation

Non-contact 3d measuring system

A non-contact 3D measuring system is configured to provide a combined three-dimensional shape of an object to be imaged based on a frame image, which has been captured by a camera while a measuring head is being scanned in an optical axis (Z-axis) direction, and the information on the position... Mitutoyo Corporation

Autofocus system for a high speed periodically modulated variable focal length lens

A system for providing an automatically focused image comprises an imaging system including a high speed periodically modulated variable focal length (VFL) lens, a VFL lens controller, a VFL-projected light source, a focus determining portion, an exposure timing adjustment circuit, and an exposure strobe time controller. The focus determining portion... Mitutoyo Corporation

Linear gage

A linear gage includes a spindle, a guide cylinder surrounding a portion of the spindle and configured to guide the spindle to move forward and rearward in an axis line direction, and a guide slit portion having a guide slit extending parallel to the axis line of the guide cylinder,... Mitutoyo Corporation

Variable focal length imaging system

A variable focal length (VFL) imaging system comprises a camera system, a first high speed variable focal length (VFL) lens, a second high speed variable focal length (VFL) lens, a first relay lens comprising a first relay focal length, a second relay lens comprising a second relay focal length, and... Mitutoyo Corporation

Method and detecting defect in transparent body

A quantitative, high-sensitivity examination of defects in a transparent product is realized, using a low-cost and space-saving optical dimension measuring apparatus to carry out measurement in a non-contact manner to avoid damaging the object of inspection and to avoid sensory examination. A transparent body to be examined is disposed between... Mitutoyo Corporation

Air bearing

The air bearing includes a main body part having a bearing surface opposed to a guide face, first and second flow path parts, which are provided in the main body part, for allowing compressed air supplied from outside to flow, an air supply hole, which is provided in the flow... Mitutoyo Corporation

Measuring probe and measuring probe system

A measuring probe for measuring a screw groove of a relatively movable ball screw includes a light source, an objective lens formed to correspond to the screw groove of the ball screw, arranged to be opposed to the screw groove of the ball screw in a non-contact manner, and configured... Mitutoyo Corporation

Imaging system and imaging method

An imaging system includes: an image forming device that obtains image information of an object with the focal length to the object being changed by a variable focal length lens in an optical system, so as to form an all-focused image of the object; a sensor device that detects variations... Mitutoyo Corporation

Photoelectric encoder

A scale is provided with a two-level code pattern according to a pseudo random code sequence along a length measurement direction. Each code of the two-level code pattern indicates a code “1” or “0”, each code includes two bits, and each bit of the two bits is L or H.... Mitutoyo Corporation

Absolute electromagnetic position encoder

An absolute electromagnetic position encoder comprises a readhead and an absolute scale. The readhead comprises a spatially modulated signal coupling configuration and a readhead processor. The absolute scale comprises a passive signal pattern, an active signal pattern and a timing and activation circuit connected to the active signal pattern. During... Mitutoyo Corporation

Absolute electromagnetic position encoder

An absolute electromagnetic position encoder comprises a readhead and an absolute scale. The readhead comprises field generation and detection configuration and a readhead processor. The absolute scale comprises an active periodic signal pattern, an active absolute signal pattern, and timing and activation circuitry connected to the active signal pattern. During... Mitutoyo Corporation

Part program generating device of surface texture measuring apparatus

A part program generating device includes a CAD data memory storing CAD data of a work piece, a measurement condition definer receiving an input operation performed by a user and defining a measurement procedure, and a part program generator converting the measurement procedure defined by the measurement condition definer into... Mitutoyo Corporation

Control surface texture measuring apparatus

A part program generating device includes a CAD data memory storing CAD data of a work piece, a measurement condition definer receiving an input operation performed by a user and defining a measurement procedure, and a part program generator converting the measurement procedure defined by the measurement condition definer into... Mitutoyo Corporation

Inner-wall measuring instrument and offset-amount calculation method

An inner-wall measuring instrument includes: a placement surface on which an object to be measured is placed; a base relatively movable with respect to the placement surface in three axis directions orthogonal to one another; a touch probe that is disposed at a first position of the base and brought... Mitutoyo Corporation

Measuring probe

A measuring probe includes: a stylus having a contact part to be brought into contact with an object to be measured; a probe housing capable of supporting the stylus on an axial center; and a detection element capable of detecting a movement of the contact part. The measuring probe further... Mitutoyo Corporation

Measuring probe

A measuring probe includes two supporting members, each having a rotationally symmetric shape and allowing for an attitude change of a stylus, in an axial direction of a probe housing. Four detection elements are disposed at fourfold symmetric positions in one of the two supporting members that includes four deformable... Mitutoyo Corporation

Measurement method and measurement program

According to an embodiment of the present invention, a method of measuring a shape based on reflected light from a surface of an object irradiated with light from a measurement head, includes: acquiring a first measurement result by setting a measurement condition suitable for the measurement of a first region... Mitutoyo Corporation

Measurement method and measurement program

According to an embodiment of the present invention, a method of measuring a surface of an object having a curved shape by measuring a distance from a measurement head to the object, includes: setting a measuring region of the object and a threshold value of concave and convex; acquiring shape... Mitutoyo Corporation

08/31/17 / #20170248415

Surface texture measuring apparatus

A surface texture measuring apparatus includes an X axis displacement mechanism and a Y axis displacement mechanism displacing a measurable object having an interior wall along an XY plane; a measurement sensor measuring a surface texture of the interior wall without contact; a Z axis displacement mechanism displacing the measurement... Mitutoyo Corporation

08/31/17 / #20170248416

Surface texture measuring apparatus and method

A surface texture measuring apparatus includes: a measurement sensor measuring, without contact, a surface texture of an interior wall of a cylinder portion of a measurable object while displacing in a normal direction of the interior wall at each measurement region into which the interior wall is divided in a... Mitutoyo Corporation

08/31/17 / #20170248419

Information processing apparatus, information processing method, and non-transitory computer readable recording medium

Provided is an information processing apparatus including: an input unit into which shape data of a surface to be measured including a plurality of recesses is input; and a setting unit that detects each of the plurality of recesses on the basis of the input shape data and sets, for... Mitutoyo Corporation

08/24/17 / #20170241767

Geometry measurement system, geometry measurement apparatus, and geometry measurement method

The geometry measurement apparatus includes: an image acquisition part that acquires a plurality of captured images generated by imaging an object to be measured, onto which a plurality of respectively different projection patterns are sequentially projected; a quantization part that generates a quantization value of a luminance value for each... Mitutoyo Corporation

08/10/17 / #20170227345

Probe head of three-dimensional coordinate measuring device and touch detection method

A probe head of a three-dimensional coordinate measuring device according to an embodiment of the present invention includes a measurer, a first and second diaphragm, a first oscillator, and a second oscillator. The measurer extends in a first direction. The first and second diaphragms are provided at two different positions... Mitutoyo Corporation

08/10/17 / #20170227352

Chromatic confocal sensor and measurement method

Provided is a chromatic confocal sensor including: a first light source that emits measurement light including a plurality of light beams having different wavelengths; a second light source that emits a visible light beam having a predetermined wavelength; an optical head that causes incident light to be converged at a... Mitutoyo Corporation

08/10/17 / #20170227384

Photoelectric encoder

The photoelectric encoder 1 includes a scale 2, and a detection head 3 including a light emitting unit 4, an index 5, and a detection unit 6. The index 5 includes a first index portion 50 consisting of diffraction portions and non-diffraction portions alternately juxtaposed at a predetermined pitch along... Mitutoyo Corporation

08/10/17 / #20170228884

Image measuring device and program

An image measuring device includes an image capturer capturing an image of a work piece, a displacer relatively displacing the work piece and the image capturer, a position acquirer obtaining a position where the image is captured by the image capturer, a controller controlling the image capturer to capture partial... Mitutoyo Corporation

06/22/17 / #20170176170

Optical configuration for measurement device

A scanning probe is provided for use with a coordinate measuring machine. The scanning probe includes a rotary position detection configuration which outputs X and Y position signals indicative of a rotation of a stylus coupling portion about a rotation center, and an axial position detection configuration which outputs a... Mitutoyo Corporation

06/22/17 / #20170176171

Measurement device with multiplexed position signals

A scanning probe responsive in three axes is provided for use with a coordinate measuring machine. The scanning probe utilizes multiplexing techniques for producing X, Y and Z position signals. The X and Y position signals are indicative of a rotation of a stylus coupling portion about a rotation center,... Mitutoyo Corporation

06/22/17 / #20170176218

Encoder

A scale is provided with a reference mark and an incremental pattern. A detection head is relatively movable in a measurement direction with respect to the scale, and detects a light intensity distribution of diffracted beams if beams radiated onto the scale are diffracted by the reference mark, and outputs... Mitutoyo Corporation

06/22/17 / #20170176219

Encoder

A scale has a first pattern area and a second pattern areas disposed with an offset from the first pattern area in a measurement direction by 1/(2×s) of pitch. A detection head detects interference fringes caused by positive s-th-order diffracted beams and negative s-th-order diffracted beams diffracted by the scale,... Mitutoyo Corporation

06/22/17 / #20170176220

Photoelectric encoder and measuring instrument

A photoelectric encoder includes light receiving units 6 configured to output a plurality of photocurrent signals obtained by receiving light emitted from a light emission unit 5, via a scale SC, a signal conversion unit 10 configured to output a conversion signal by converting the plurality of photocurrent signals, a... Mitutoyo Corporation

06/22/17 / #20170176226

Multi-mode metrology user interface device

A multi-mode metrology user interface device includes a signal processing and control portion, a user input interface portion, and a communication portion. The signal processing and control portion includes a measurement display mode configured to display measurement values from multiple metrology devices. The signal processing and control portion further includes... Mitutoyo Corporation

06/22/17 / #20170178315

Image measuring method and image measuring device

An image measuring method performed with an image measuring device measuring a dimension of a measured object from an image of the measured object captured by an image capturer. The method executes a standard reference object measurement measuring a dimension of the standard reference object with the image measuring device;... Mitutoyo Corporation

06/15/17 / #20170167840

Measuring device

A measuring device which reduces reading errors caused by parallax. The measuring device has a gauge head abutting against an object to be measured, and includes a pointer-type display part which displays displacement of the gauge head obtained by being enlarged by an enlarging mechanism and being converted into a... Mitutoyo Corporation

06/15/17 / #20170167852

Optical measuring method and measuring external dimension

A light emitter and a reflector are placed such that an optical axis of a measuring light beam and an optical axis of a reflection light beam intersect, and further the measuring light beam and the reflection light beam are formed inside the same virtual measuring plane; a first measuring... Mitutoyo Corporation

06/15/17 / #20170167854

Internal diameter measuring transparent tube

A transparent tube is placed in a parallel laser light beam emitted from a light projector and reaching a photoreciever, and a detection signal indicating an amount of light received corresponding to a width direction position of the parallel laser light beam is obtained from the photoreceiver. Peaks formed in... Mitutoyo Corporation

06/15/17 / #20170167893

Electronic absolute position encoder

An electronic absolute position encoder comprises a scale, a detector and a signal processing configuration. The scale comprises a signal modulating scale pattern including a first periodic pattern component having a spatial wavelength λ1, and a second periodic pattern component having a spatial wavelength λ2. The detector comprises a set... Mitutoyo Corporation

06/08/17 / #20170161904

Image measurement device and controlling the same

An image measurement device according to the present invention comprises: a stage on which a measurement object is mounted; an imaging device imaging the measurement object for a certain imaging range and outputting image information; a position control device that moves the imaging device to a plurality of measurement positions... Mitutoyo Corporation

05/25/17 / #20170146336

Measuring probe

A measuring probe includes a stylus having a contact part, an axial motion mechanism, and a rotary motion mechanism. The axial motion mechanism includes first diaphragm structures and a moving member that allows the contact part to move in an axial direction. The rotary motion mechanism includes a second diaphragm... Mitutoyo Corporation

05/18/17 / #20170139194

Interference objective lens and reference surface unit set

An interference objective lens includes: an objective lens configured to converge a light to be emitted from a light source toward a measurement target; a reference surface unit having a reference surface; and a beam splitter configured to split the light having passed through the objective lens into a reference... Mitutoyo Corporation

05/11/17 / #20170131535

Optical pickup device

An optical pickup device according to an embodiment of the present invention includes: a light source that outputs a light beam; an irradiation optical system that projects onto a measurement target the light beam outputted from the light source; an imaging optical system that converges and images the light beam... Mitutoyo Corporation

05/04/17 / #20170122856

Hardness testing apparatus and hardness testing method

A hardness tester includes a correlation memory storing correlation data which associates hardness of a standard reference sample based on dimensions of an indentation formed by pressing an indenter into a surface of the standard reference sample, and hardness of the standard reference sample based on test force and depression... Mitutoyo Corporation

04/27/17 / #20170115109

Control profile measuring apparatus

During a retraction where a stylus tip separates from a work piece from a state where the stylus tip and the work piece are in contact, whether there is contact between the stylus tip and the work piece is monitored. When the contact between the stylus tip and the work... Mitutoyo Corporation

04/27/17 / #20170115141

Inspection machine and attachment jig therefor

A jig includes three columnar members, a stylus head receiving member, and a jig fixation portion. The second columnar member extends in a Z direction. The first columnar member extends in an X direction and is configured as a cantilever beam protruding in the X direction by having a first... Mitutoyo Corporation

04/20/17 / #20170108324

Manual measuring system

A manual measuring system (an articulated three-dimensional coordinate measuring machine or a gantry three-dimensional coordinate measuring machine) allows a measuring probe to be manually moved while enabling a user to focus on making measurements and allows the user to manually move the measuring probe in order to facilitate and accelerate... Mitutoyo Corporation

04/20/17 / #20170110007

Battery-less data transmission module accessory for portable and handheld metrology devices

A data transmission module is provided as a battery-less accessory for attachment to portable metrology devices (e.g., handheld digital calipers, micrometers, indicators, etc.). Rather than utilizing battery resources from the metrology devices, the data transmission module utilizes energy harvested wirelessly from a remote data node (e.g., a computer system, display,... Mitutoyo Corporation

04/13/17 / #20170102305

Hardness testing apparatus and indenter of hardness testing apparatus

A hardness tester loads a predetermined test force on an indenter and presses into a surface of a sample to form an indentation. The indenter includes an indenter memory storing indenter information specific to the indenter. The indenter is detachably mounted to an indenter shaft. A CPU acquires, from the... Mitutoyo Corporation

04/06/17 / #20170097220

Coordinate measuring apparatus

A coordinate measuring apparatus includes a base on which an object to be measured is mounted, a movable X-axis beam, a Y-axis column with a hollow part that is provided on the base and supports the X-axis beam, a control unit that is provided under the base and controls the... Mitutoyo Corporation

Patent Packs
04/06/17 / #20170097221

Measuring probe and measuring probe system

A measuring probe for measuring a screw groove of a relatively rotatable ball screw includes a stylus having a tip end portion configured to contact the screw groove, a radial-direction displacement mechanism configured to support the stylus so as for the stylus to be displaceable in an X direction toward... Mitutoyo Corporation

03/30/17 / #20170089681

Linear displacement measuring apparatus

There is provided a linear displacement measuring apparatus which notifies a user when being installed defectively. A slider includes a traveling body which travels along a main scale on the main scale, a carriage part mounted on an object, and coupling means which couples the traveling body with the carriage... Mitutoyo Corporation

03/30/17 / #20170089683

Coefficient-of-thermal-expansion measurement dimension reference gauge, measuring device for coefficient of thermal expansion and reference gauge

A measurement target and a reference gauge are placed in parallel in an inside of a temperature-controlled chamber. After an interior temperature of the temperature-controlled chamber is set at a first temperature, a relative measurement of a length from a first surface to a second surface of the measurement target... Mitutoyo Corporation

03/30/17 / #20170089737

Optical encoder

An optical encoder comprises an illumination source, a scale grating extending along a measuring axis direction, an optical portion, a moiré grating, and a detector portion. The optical portion comprises an aperture portion for spatial filtering of scale light from the scale grating. The moiré grating is configured to receive... Mitutoyo Corporation

03/30/17 / #20170089738

Absolute position encoder including a redundant spatial phase signal

An electronic absolute position encoder is provided having a scale, a detector, and a signal processor configured to determine an absolute position of the detector along the scale. The scale includes a signal modulating scale pattern comprising a periodic pattern component and a gradual pattern variation component. The detector includes... Mitutoyo Corporation

03/30/17 / #20170089741

Signal processing circuit for measuring machine

There is provided a signal processing circuit, which improves a signal SN ratio, for a measuring machine. A sensor uses two or more reference signals processed so as to have a mutual predetermined phase difference. The signal processing circuit includes a phase correcting circuit which removes an offset due to... Mitutoyo Corporation

03/30/17 / #20170090455

Method for controlling shape measuring apparatus

q is a trajectory correcting direction vector given by a vector product of a normal line of a surface of the workpiece and the path velocity vector Vf.... Mitutoyo Corporation

03/30/17 / #20170090742

Inspection program editing environment including integrated alignment program planning and editing features

A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine (CMM), including a user interface that comprises a workpiece inspection program simulation portion configurable to display a 3-D view of a workpiece; an editing user interface portion comprising an editable plan representation of a current... Mitutoyo Corporation

03/30/17 / #20170093413

Signal processing measuring machine

There is provided a signal processing apparatus, which can perform measurement with a wide dynamic range and high resolution, for a measuring machine. A first analog-to-digital (AD) converter AD-converts a sensor signal into an upper digital signal. A first digital-to-analog (DA) converter DA-converts the upper digital signal into an upper... Mitutoyo Corporation

03/16/17 / #20170074686

Photoelectric encoder

A photoelectric encoder of the present invention includes: a scale which includes a grid scale; a light emitting portion which irradiates light toward the scale; a light receiving portion which detects an image of the grid scale of the scale; and a telecentric optical unit which is provided between the... Mitutoyo Corporation

03/16/17 / #20170074687

Absolute position detection type photoelectric encoder

There is provided an absolute position detection type photoelectric encoder which improves robustness to dirt while maintaining high resolution. A two-level code pattern according to a pseudo random code sequence is provided on a scale along a length measurement direction. Each code of the two-level code pattern indicates a code... Mitutoyo Corporation

03/16/17 / #20170074763

Hardness tester

A hardness tester forms an indentation on a surface of a sample by loading a predetermined test force with an indenter and measures a hardness of the sample using the indentation. The hardness tester includes a light source emitting light on the surface of the sample and forming an illumination... Mitutoyo Corporation

03/16/17 / #20170074764

Hardness test apparatus and hardness testing method

The present invention includes: an image capturer capturing an image of the sample to be measured; an image acquirer acquiring image data of the sample captured by the image capturer; a pattern searcher performing, on the image data of the sample acquired by the image acquirer, pattern searching process using... Mitutoyo Corporation

03/16/17 / #20170074765

Hardness test apparatus and hardness testing method

A hardness tester includes a memory storing, as a parts program, definitions of measurement conditions including a coordinate system and test position defined with respect to an image of a standard reference sample; a pattern searcher performing a pattern searching process, with reference to a plurality of samples to be... Mitutoyo Corporation

03/16/17 / #20170076436

Hardness test apparatus and hardness testing method

A hardness tester includes a memory associating and storing a parts program having defined measurement conditions with respect to a sample, including a test position, and an image file acquired by capturing an image of the shape of the sample; an image acquirer acquiring image data of the sample to... Mitutoyo Corporation

Patent Packs
03/16/17 / #20170078532

Chromatic aberration correction in imaging system including variable focal length lens

An image acquisition system is operated to provide an image that is relatively free of the effect of longitudinal chromatic aberration. The system includes a variable focal length lens (e.g., a tunable acoustic gradient index of refraction lens) that is operated to periodically modulate a focus position. First, second, third,... Mitutoyo Corporation

03/16/17 / #20170078549

Machine vision inspection obtaining an image with an extended depth of field

A method for providing an extended depth of field (EDOF) image includes: Periodically modulating an imaging system focus position at a high frequency; using an image exposure comprising discrete image exposure increments acquired at discrete focus positions during an image integration time comprising a plurality of modulation periods of the... Mitutoyo Corporation

03/09/17 / #20170067737

Inspection program editing environment providing user defined collision avoidance volumes

A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer aided design (CAD) file processing portion, an inspection motion path generation portion and a user interface. The user interface includes a workpiece inspection program simulation portion and auxiliary collision avoidance... Mitutoyo Corporation

03/09/17 / #20170067758

Encoder

A scale includes a grating pattern arranged in a measurement direction. A detection head can be moved relative to the scale in the measurement direction and outputs an electric signal indicating a result of detection of the pattern. An operation unit calculates a relative displacement of the detection head relative... Mitutoyo Corporation

03/02/17 / #20170059295

Measuring apparatus

A measuring apparatus of the present invention includes a stage on which a measured object is placed, a measurement head having an information obtainer obtaining an image of the object, and a vertical driver supporting the measurement head so as to allow movement in a vertical direction. The vertical driver... Mitutoyo Corporation

03/02/17 / #20170059297

Probe head rotating mechanism

A probe head rotation mechanism, situated between a spindle and a probe of a coordinate measurement device, includes: a main body frame supported by the spindle; a rotor supported by the main body frame so as to be capable of tilting with respect to an axial center of the spindle;... Mitutoyo Corporation

03/02/17 / #20170061601

Multi-level image focus using a tunable lens in a machine vision inspection system

A method is provided for defining operations for acquiring a multi-exposure image of a workpiece including first and second regions of interest at different Z heights. The multi-exposure image is acquired by a machine vision inspection system including strobed illumination and a variable focal length lens (e.g., a tunable acoustic... Mitutoyo Corporation

03/02/17 / #20170061614

Image measuring apparatus and non-temporary recording medium on which control program of same apparatus is recorded

An image measuring apparatus according to an embodiment of the present invention comprises: an imaging device that images a workpiece to acquire an image of this workpiece; and a processing device that performs measurement of the workpiece based on this image and outputs a measurement result. Moreover, the processing device... Mitutoyo Corporation

03/02/17 / #20170061649

Image measuring apparatus and non-temporary recording medium on which control program of same apparatus is recorded

An image measuring apparatus according to an embodiment of the present invention comprises: an imaging device that images a workpiece to acquire an image of this workpiece; and a processing device that performs measurement of the workpiece based on this image and outputs a measurement result. Moreover, the processing device,... Mitutoyo Corporation

02/23/17 / #20170052018

Method for measuring a height map of multiple fields of view and combining them to a composite height map with minimized sensitivity to instrument drift

A method for measuring a height map of multiple fields of view on a surface of a substrate with an optical profilometer and combining them to a composite height map, the method includes: moving the profilometer relative to the surface from field to field along a route; measuring height maps... Mitutoyo Corporation

02/02/17 / #20170030744

Displacement detecting device

A displacement detecting device includes a scale diffraction grating and a detecting head unit. The detecting head unit includes a light source, a first retroreflecting unit that retroreflectes positive first-order diffracted light of light diffracted by the scale diffraction grating, such that the retroreflected light enters the scale diffraction grating... Mitutoyo Corporation

02/02/17 / #20170030745

Displacement detecting device

A displacement detecting device includes a main scale and a detecting head unit. The detecting head unit includes a light source, a light receiving unit, and an index scale group that is disposed in the middle of a light path from the main scale to the light receiving unit. The... Mitutoyo Corporation

01/19/17 / #20170016711

Instantaneous phase-shift interferometer

An instantaneous phase-shift interferometer uses a light source having a coherence length shorter than a difference in optical path length between the light reflected from a reference surface and the light reflected from a measured surface. A beam from the light source is split and, using an adjustable delay optical... Mitutoyo Corporation

01/19/17 / #20170019053

Feedback control device

Motor control device includes a controller controlling a motor (a calculator controller and an electric current controller), and a detector (an electric current loop) detecting an electric current of the motor and returning the detected electric current to the controller. The electric current loop includes a first detection system, a... Mitutoyo Corporation

01/12/17 / #20170010096

Chromatic confocal range sensor comprising a camera portion

A chromatic confocal range sensor optical pen comprises a housing, an in/out optical fiber, a chromatically dispersive lens configuration, a reflected light dividing configuration comprising a lower NA zone and a higher NA zone, and a camera portion. The lens configuration is configured to receive source light from the optical... Mitutoyo Corporation

01/12/17 / #20170010452

Chromatic range sensor including dynamic intensity compensation function

A chromatic point sensor (CPS) system is provided, which compensates for potential errors due to input spectral profile intensity inconsistencies that arise when driving a CPS illumination source using different power levels. The CPS system includes an optical pen comprising a confocal optical path including a chromatically dispersive element and... Mitutoyo Corporation

01/12/17 / #20170013185

Adaptable operating frequency of a variable focal length lens in an adjustable magnification optical system

An imaging system is provided for a precision machine vision inspection or metrology system. The imaging system optical path includes a variable magnification lens portion and a variable focal length lens portion. The variable magnification lens portion includes various magnification states (e.g., 0.5× to 100×, using interchangeable lenses, or the... Mitutoyo Corporation








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