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Mitutoyo Corporation
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Mitutoyo Corporation patents

Recent patent applications related to Mitutoyo Corporation. Mitutoyo Corporation is listed as an Agent/Assignee. Note: Mitutoyo Corporation may have other listings under different names/spellings. We're not affiliated with Mitutoyo Corporation, we're just tracking patents.

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "M" | Mitutoyo Corporation-related inventors

Date Mitutoyo Corporation patents (updated weekly) - BOOKMARK this page
10/05/17Air bearing
10/05/17Measuring probe and measuring probe system
10/05/17Imaging system and imaging method
09/28/17Photoelectric encoder
09/21/17Absolute electromagnetic position encoder
09/21/17Absolute electromagnetic position encoder
09/21/17Part program generating device of surface texture measuring apparatus
09/21/17Control surface texture measuring apparatus
08/31/17Inner-wall measuring instrument and offset-amount calculation method
08/31/17Measuring probe
08/31/17Measuring probe
08/31/17Measurement method and measurement program
08/31/17Measurement method and measurement program
08/31/17Surface texture measuring apparatus
08/31/17Surface texture measuring apparatus and method
08/31/17Information processing apparatus, information processing method, and non-transitory computer readable recording medium
08/24/17Geometry measurement system, geometry measurement apparatus, and geometry measurement method
08/10/17Probe head of three-dimensional coordinate measuring device and touch detection method
08/10/17Chromatic confocal sensor and measurement method
08/10/17Photoelectric encoder
08/10/17Image measuring device and program
06/22/17Optical configuration for measurement device
06/22/17Measurement device with multiplexed position signals
06/22/17Photoelectric encoder and measuring instrument
06/22/17Multi-mode metrology user interface device
06/22/17Image measuring method and image measuring device
06/15/17Measuring device
06/15/17Optical measuring method and measuring external dimension
06/15/17Internal diameter measuring transparent tube
06/15/17Electronic absolute position encoder
06/08/17Image measurement device and controlling the same
05/25/17Measuring probe
05/18/17Interference objective lens and reference surface unit set
05/11/17Optical pickup device
05/04/17Hardness testing apparatus and hardness testing method
04/27/17Control profile measuring apparatus
04/27/17Inspection machine and attachment jig therefor
04/20/17Manual measuring system
04/20/17Battery-less data transmission module accessory for portable and handheld metrology devices
04/13/17Hardness testing apparatus and indenter of hardness testing apparatus
04/06/17Coordinate measuring apparatus
04/06/17Measuring probe and measuring probe system
03/30/17Linear displacement measuring apparatus
03/30/17Coefficient-of-thermal-expansion measurement dimension reference gauge, measuring device for coefficient of thermal expansion and reference gauge
03/30/17Optical encoder
03/30/17Absolute position encoder including a redundant spatial phase signal
03/30/17Signal processing circuit for measuring machine
03/30/17Method for controlling shape measuring apparatus
03/30/17Inspection program editing environment including integrated alignment program planning and editing features
03/30/17Signal processing measuring machine
03/16/17Photoelectric encoder
03/16/17Absolute position detection type photoelectric encoder
03/16/17Hardness tester
03/16/17Hardness test apparatus and hardness testing method
03/16/17Hardness test apparatus and hardness testing method
03/16/17Hardness test apparatus and hardness testing method
03/16/17Chromatic aberration correction in imaging system including variable focal length lens
03/16/17Machine vision inspection obtaining an image with an extended depth of field
03/09/17Inspection program editing environment providing user defined collision avoidance volumes
03/02/17Measuring apparatus
03/02/17Probe head rotating mechanism
03/02/17Multi-level image focus using a tunable lens in a machine vision inspection system
Patent Packs
03/02/17Image measuring apparatus and non-temporary recording medium on which control program of same apparatus is recorded
03/02/17Image measuring apparatus and non-temporary recording medium on which control program of same apparatus is recorded
02/23/17Method for measuring a height map of multiple fields of view and combining them to a composite height map with minimized sensitivity to instrument drift
02/02/17Displacement detecting device
02/02/17Displacement detecting device
01/19/17Instantaneous phase-shift interferometer
01/19/17Feedback control device
01/12/17Chromatic confocal range sensor comprising a camera portion
01/12/17Chromatic range sensor including dynamic intensity compensation function
01/12/17Adaptable operating frequency of a variable focal length lens in an adjustable magnification optical system
12/29/16Object-forming machine, cross-section measurement apparatus, and cross-section measurement method
12/29/16Optical probe and measuring apparatus
12/22/16Inspection program editing environment providing user defined collision avoidance volumes with integral modification properties
12/15/16Collision prevention device of measurer
12/15/16Optical encoder
Patent Packs
12/15/16Moving speed control optical element switching device
12/08/16Method for controlling shape measuring apparatus
12/01/16Telecentric optical apparatus
11/24/16Method for controlling shape measuring apparatus
11/24/16Light source array used in an illumination portion of an optical encoder
10/27/16Encoder scale and manufacturing and attaching method thereof
10/27/16Measurement system using tracking-type laser interferometer and return the measurement system
10/20/16Method and device for controlling rotary table
10/20/16Image measurement apparatus, image measurement method, information processing apparatus, information processing method, and program
10/13/16Inspection program editing environment including real-time feedback related to throughput
10/13/16Probe measuring force adjuster
10/13/16Inspection program editing environment with simulation status and control continually responsive to selection operations
10/13/16Inspection program editing environment with editing environment automatically globally responsive to editing operations in any of its portions
10/06/16Tilt angle adjuster for form measuring device
10/06/16Tactile probing system
10/06/16Phase adjuster and encoder
10/06/16Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting program
09/22/16Method for assisting user input with touch display
09/15/16Compliant thumb wheel assembly coupled to a caliper jaw
09/15/16Calibration form measuring device
09/08/16Contact probe
09/08/16Measuring probe
09/08/16Measuring apparatus and support mechanism of columnar work piece
09/08/16Measuring probe
09/08/16Chromatic confocal sensor and measurement method
09/08/16Measuring probe
08/25/16Laser source device and adjustment method thereof
08/18/16Inside measuring instrument
08/18/16Laser-frequency stabilizer and laser-frequency stabilization method
08/11/16Test indicator
Social Network Patent Pack
07/21/16Displacement measuring device and displacement measuring method
07/07/16Interference objective lens and light interference measuring device
07/07/16Image processing device and image processing
06/30/16Scale fixating device
06/30/16Inductive detection type rotary encoder
06/23/16Bore imaging system
06/23/16Bore imaging system
06/16/16Ergonomic micrometer including two modes of adjustment
06/02/16Optical encoder
Patent Packs
05/26/16Image measuring apparatus and measuring apparatus
05/26/16Cmm moving path adjustment assisting method and apparatus
05/26/16Absolute encoder scale configuration with unique coded impedance modulations
05/26/16Led ring light and manufacture led ring light and image measuring device and optical device using led ring light
05/19/16Illumination portion for an optical encoder
05/19/16Optical apparatus
05/12/16Method of placing work piece on table of measuring device
05/12/16Form measuring machine and form measuring method
05/12/16Non-contact surface-shape measurment method and apparatus using white light interferometer optical head
05/12/16Measurement value correction method, computer-readable recording medium, and measurement device
05/05/16Handheld measuring device comprising a user interface responsive to changes in a displacement sensed by a displacement sensor
04/28/16Optical encoder
04/28/16Optical resonator
04/28/16Measurement transmission system for handheld metrology tools
04/14/16Method for programming a three-dimensional workpiece scan path for a metrology system
04/07/16Shape measuring apparatus and point sensor positioning unit
03/31/16Image measurement apparatus and guidance display image measurement apparatus
03/31/16Autofocus apparatus, autofocus method, and program
03/24/16Roundness measurement device and control method
03/17/16Position measuring device
03/10/16Jaw-mounted magnet accessory for calipers
03/03/16Measuring instrument
03/03/16Parameter setting measuring instrument and computer readable medium
03/03/16Optical observation apparatus and optical observation method
03/03/16Position measurement apparatus
02/25/16Encoder scale and manufacturing the same
02/25/16Absolute position encoder scale having layers in a stacked configuration
02/25/16Three-dimensional model generating method, three-dimensional model generating system, and a three-dimensional model generating program
02/25/16Three-dimensional model generating method, three-dimensional model generating system, and three-dimensional model generating program
02/11/16Outer dimension measuring apparatus and outer dimension measuring method
Patent Packs
01/28/16Method for measuring a high accuracy height map of a test surface
01/21/16Thickness measurement apparatus and thickness measurement method
01/21/16Spherical shape measurement method and apparatus
01/21/16Spherical shape measurement method and apparatus
01/21/16Method of correcting measurement error of shape measuring apparatus, and shape measuring apparatus
01/21/16Hardness tester
01/21/16Image measuring apparatus and gui program for image measuring apparatus
01/21/16Image measuring apparatus
01/21/16Image measuring apparatus
01/14/16Method for controlling motion of a coordinate measuring machine
01/14/16Laser frequency measurement using optical frequency comb
12/24/15Semiconductor integrated circuit and position detector
12/24/15Sensor signal detector
12/24/15Image measuring apparatus and image measuring method
12/17/15Method for calculating a height map of a body of transparent material having an inclined or curved surface
12/17/15Absolute position encoder scale having plates alternating with varying recesses
12/17/15Optical encoder and reference signal generation optical encoder
12/10/15Tape scale application jig and tape scale application method
12/03/15Multi-joint arm type measurement apparatus
12/03/15Scale and optical encoder
Social Network Patent Pack
12/03/15Focus detection unit and optical apparatus
11/19/15Digital comparator
11/12/15High speed contact detector for measurement sensors
11/12/15Coordinate measuring system, coordinate measuring method, and probe
11/05/15Caliper force indicator with tactile or auditory feedback
10/22/15Display device for measuring instrument, measuring instrument, analogically displaying measured value, and program of analogically displaying measured value
10/15/15Form measuring machine
10/15/15Induction detecting type rotary encoder
10/08/15Interference measuring device
10/08/15Measuring instrument
10/08/15Image measuring device
10/01/15Layer scanning inspection system for use in conjunction with an additive workpiece fabrication system
10/01/15Flexible mount for coupling force actuator to caliper jaw
10/01/15Correction device and correction optical measuring apparatus
10/01/15Optical displacement encoder
09/03/15Wheel assembly for moving caliper jaw with repeatable force
09/03/15Displacement sensor for force indicating caliper
08/27/15Coordinate measuring machine and calculating correction matrix by coordinate measuring machine
08/27/15Grazing incidence interferometer
08/20/15Shape measuring apparatus and shape measurement error correction method
Social Network Patent Pack
08/20/15Measuring device having data transmission function
08/13/15Grazing incidence interferometer
08/13/15Optical probe, attachable cover, and shape measuring apparatus
08/13/15Optical probe, attachable cover, and shape measuring apparatus
08/13/15Position measuring device and position measuring method
08/06/15Induction type position measuring apparatus
08/06/15Image sequence and evaluation structured illumination microscopy
08/06/15Linear encoder
07/30/15Illumination apparatus, illumination method, measuring apparatus, and measuring method
07/30/15Manual measuring system
07/30/15Interchangeable reflective assembly for a chromatic range sensor optical pen
07/30/15Remote controllable measuring apparatus and measuring system
07/23/15Drive controller, driving system, and drive control method
06/25/15Light interference measuring device and program therefor
06/25/15Optical encoder
06/25/15Remote accessory for generating customized and synchronized reference notes for a programmable metrology system
06/25/15Remote accessory management in a programming environment for a progammable metrology system
06/18/15System and programming workpiece feature inspection operations for a coordinate measuring machine
06/11/15Multi-axis type three-dimensional measuring apparatus
06/11/15Hole-measurement systems and methods using a non-rotating chromatic point sensor (cps) pen
05/28/15Arm type three-dimensional measuring apparatus and deflection correction method in arm type three-dimensional measuring apparatus
05/28/15Form measuring apparatus and form measurement method
05/28/15Machine vision inspection obtaining an image with an extended depth of field
05/21/15Structured illumination microscopy optical arrangement including projection artifact supression element
05/14/15Industrial machine and measuring amount of expansion/contraction of industrial machine
04/30/15Arm type three-dimensional measuring machine and inclination correction base part for supporting arm type three-dimensional measuring machine
04/16/15System and controlling a tracking autofocus (taf) sensor in a machine vision inspection system
03/26/15Moving mechanism and form measuring apparatus
03/19/15Lever type measuring machine
03/19/15Coordinate measuring apparatus
Social Network Patent Pack
03/12/15Information processing apparatus, information processing method, program, and vision measuring apparatus
03/05/15Calibration control device for metrology tools
03/05/15Method for validating a workpiece measurement in a dimensional metrology hand tool
03/05/15Photoelectric encoder
03/05/15Slide guide device
02/26/15Form measuring apparatus and measuring v groove center
02/26/15Form measuring apparatus and registering coordinate system for rotary table
02/12/15Information processing apparatus, information processing method, program, storage medium, and information processing system
02/05/15Physical quantity detector
01/15/15Focus height repeatability improvement in a machine vision inspection system
01/08/15Chromatic range sensor probe detachment sensor
01/01/15Three-dimensional shape measurement system and software for controlling the same
01/01/15Autofocus mechanism
01/01/15Autofocus mechanism
01/01/15Temperature-controlled bath
12/18/14Scale for photoelectric encoder
12/18/14Machine vision inspection performing high-speed focus height measurement operations
12/11/14Structured illumination projection with enhanced exposure control
12/11/14Interferometer system and method to generate an interference signal of a surface of a sample
12/11/14Position detection encoder
11/27/14Laser tracking interferometer
11/27/14Light source apparatus
11/20/14Linear encoder
11/20/14Reference signal generation apparatus and reference signal generation system
11/20/14Reference signal generation apparatus and reference signal generation system
11/20/14Dustproof member and measurement device
11/20/14Interchangeable chromatic range sensor probe for a coordinate measuring machine
11/20/14Optical measuring apparatus

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Mitutoyo Corporation in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Mitutoyo Corporation with additional patents listed. Browse our Agent directory for other possible listings. Page by