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Mpi Corporation patents

Recent patent applications related to Mpi Corporation. Mpi Corporation is listed as an Agent/Assignee. Note: Mpi Corporation may have other listings under different names/spellings. We're not affiliated with Mpi Corporation, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "M" | Mpi Corporation-related inventors

Coaxial probe card device

A coaxial probe card device includes a substrate, a plurality of probe holders, and a plurality of probes. The substrate has a through hole. The plurality of probe holders is disposed on the substrate and is configured in a radial manner surrounding the through hole by using the through hole... Mpi Corporation

Probe module having cantilever mems probe and making the same

A method of making a cantilever MEMS probe module includes the steps of forming a cantilever MEMS probe on a first surface of a circuit substrate by a MEMS fabrication process in a way that the cantilever MEMS probe has a support post electrically and mechanically connected with an electric... Mpi Corporation

Probe card having replaceable probe module and assembling method and probe module replacing the same

A probe card includes a substrate module having an installation hole and a first stair-shaped structure provided on two stairs thereof with a first connection surface and a first transmission surface having a first contact pad, a probe module having a probe and a second stair-shaped structure provided on two... Mpi Corporation

Probe card

A probe card includes a wiring board, a top cover, a retractable structure and a probe. The top cover couples with the wiring board and has an air inlet. The retractable structure connects with the top cover and includes a first and a second rings. The first ring has vent... Mpi Corporation

Method for compensating probe misplacement and probe apparatus

A method for compensating probe misplacement and a probe apparatus are provided. The method is applicable to a probe module which includes a probe and a fixing base. The probe includes a probe body section and a probe tip section. The probe body section is fixed on the fixing base.... Mpi Corporation

Wafer cassette

A wafer cassette includes a case, a plurality of wafer trays, and a plurality of transmission mechanisms. The wafer trays are disposed in the case. Each of the wafer trays includes a central opening, a first groove, and a second groove. The diameter of the second groove is greater than... Mpi Corporation

Integrating sphere cover and integrating sphere module

An integrating sphere cover covering an integrating sphere having a light receiving entrance is provided and includes a first casing and a fixing assembly. The first casing partially covers the integrating sphere and includes a first opening where the light receiving entrance passes. A curvature radius of the first casing... Mpi Corporation

Probe structure and probe device

A probe structure includes a tube body and a pin body. The tube body has a central axis and includes a first rigid section, a first spring section, a second rigid section, and a second spring section. The first spring section surrounds the central axis and extends in a direction... Mpi Corporation

Microelectromechanical probe, manufacturing the same and probe set

A microelectromechanical probe is manufactured by a MEMS manufacturing process forming a probe body and a cutting process providing a pinpoint portion a cutting face. The probe has a top surface, a body portion, and a pinpoint portion extended in a probing direction from the body portion and provided with... Mpi Corporation

Probe seat of vertical probe device

A probe seat of a vertical probe device includes a lower die, a middle die fixed on the lower die, at least one upper die fixed on the middle die, and at least one reinforcing die fixedly disposed in at least one through trough of the middle die. The lower... Mpi Corporation

Method of calibrating and debugging testing system

A method of calibrating and debugging a testing system is provided. First, values of different electrical path segments are calibrated, and parameters of the electrical path segments while being calibrated are saved. After calibration, electrical tests can be processed on a DUT. If the testing system malfunctions, the values of... Mpi Corporation

Multilayer circuit board

A multilayer circuit board includes a first substrate and a second substrate in stack. The first substrate is provided with two first pads, two second pads, and two first sub-circuits. The first pads and the second pads are electrically connected to the first sub-circuits. The second substrate has a top... Mpi Corporation

Probe head

A probe head includes a probe base, a film, and a probe assembly. The probe base includes first, second, and third guiding boards. The second guiding board is fixed between the first and third guiding boards. The film is fixed to the probe base and has a hole. The probe... Mpi Corporation

Probe module

A probe module includes a base adapted to be fixed to a tester, an engaging seat engaged with the base, a signal connector, an electrical signal transmitting member, and two probes located below the engaging seat. The engaging seat has an engaging opening and a first end surface. The signal... Mpi Corporation

Spring probe having outer sleeve and probe device having the same

A spring probe includes a needle, a spring sleeve sleeved onto and fixed to the needle and having non-spring sections and at least one spring section, and an outer sleeve sleeved onto the spring sleeve and covering the at least one spring section. A part of the outer sleeve is... Mpi Corporation

Working fluid pipe for temperature control system

A working fluid pipe for a temperature control system includes an inner tube unit for a working fluid to flow therethrough, an outer tube unit surrounding the inner tube unit, an air chamber between the inner tube unit and the outer tube unit, and an air inlet and at least... Mpi Corporation

Spring probe and probe card having spring probe

A probe card includes a probe seat having upper and lower dies and a probe accommodating hole, a spring probe inserted through the probe accommodating hole and including a spring sleeve having upper and lower non-spring sections, and a circuit board disposed on the upper die and having a contact... Mpi Corporation

Temperature control system and method thereof

A temperature control system and method are provided. The system includes a first channel, a second channel, a heating element, a DUT chamber, a converter, a first PID controller, and at least one switching regulator. The heating element is disposed downstream of the first and the second channels to heat... Mpi Corporation

Probe card capable of transmitting high-frequency signals

A probe card which is capable of transmitting high-frequency signals provided by a DUT, and the DUT includes an output pin group and an input pin group for sending and receiving the high-frequency signals respectively. The probe card includes a first signal pin group, a second signal pin group, and... Mpi Corporation

Probe head

A probe head includes a first guiding board, a second guiding board, a spacer, a positioning assembly and probes. The second guiding board is stacked over the first guiding board, in which an accommodating space is formed between the first guiding board and the second guiding board. The spacer is... Mpi Corporation

Probe device

A probe device includes a case, a fixing base, a probe stage, a first camera and a first mirror. The case includes a bottom plate and a first side wall, which includes a first through hole and is vertically connected to the bottom plate. The fixing base, disposed inside the... Mpi Corporation

Probe module supporting loopback test

A probe module, which supports loopback test and is provided between a PCB and a DUT, includes an adapter, two probes, two inductive components provided at the adapter, and a capacitive component. The adapter has two connecting circuits. An end of each of the probes is connected to one of... Mpi Corporation

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Mpi Corporation in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Mpi Corporation with additional patents listed. Browse our Agent directory for other possible listings. Page by