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Mpi Corporation patents

Recent patent applications related to Mpi Corporation. Mpi Corporation is listed as an Agent/Assignee. Note: Mpi Corporation may have other listings under different names/spellings. We're not affiliated with Mpi Corporation, we're just tracking patents.

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "M" | Mpi Corporation-related inventors

Date Mpi Corporation patents (updated weekly) - BOOKMARK this page
05/25/17 new patent  Method of calibrating and debugging testing system
05/25/17 new patent  Multilayer circuit board
05/04/17Probe head
04/27/17Probe module
04/06/17Spring probe having outer sleeve and probe device having the same
03/23/17Working fluid pipe for temperature control system
03/23/17Spring probe and probe card having spring probe
03/23/17Temperature control system and method thereof
03/02/17Probe card capable of transmitting high-frequency signals
03/02/17Probe head
01/19/17Probe device
01/05/17Probe module supporting loopback test
10/20/16Probe card
09/15/16Testing machine and operation method thereof
09/08/16Temperature controlling equipment
08/18/16Adaptive temperature control system for cooling working fluid
08/18/16Cooling system capable of defrosting
08/04/16Probe head and upper guider plate
07/21/16Operating inspecting equipment
06/30/16Vertical probe device having positioning film
06/16/16Working fluid output device for temperature control system
05/19/16High-frequency cantilever type probe card
05/19/16Multilayer circuit board
05/12/16Fluid discharge device
05/05/16Multilayer circuit board
02/18/16Probe card and test equipment with the same
01/21/16Probe card, and connecting circuit board and signal feeding structure thereof
01/21/16Probe card, and connecting circuit board and signal feeding structure thereof
12/31/15Positioner of probe card and probe head of probe card
12/31/15Apparatus for probing die electricity and forming the same
12/10/15Probe and manufacturing the probe
10/01/15Vertical probe device and supporter used in the same
10/01/15Probe device having spring probe
10/01/15Probe device having spring probe
09/10/15Spring probe
09/10/15Assembling method and maintaining vertical probe device
09/03/15Spring probe
08/27/15Method of calibrating and debugging testing system
08/20/15Testing testing of electrical connections
07/30/15Method of calibrating and operating testing system
07/23/15Heating device using photodetector to detect temperature and protecting the same
07/23/15Testing jig
07/23/15Testing jig
07/23/15Electrical testing device
07/23/15Electrical testing machine
07/23/15Testing system and instant informing with the same
07/23/15Method of operating testing system
07/23/15Method for making support structure for probing device
07/02/15Probe module
07/02/15Manufacturing probing device
06/18/15Probe module
06/18/15Probe module
06/18/15Probe module
06/18/15Calibration plate
04/23/15Method for manufacturing space transformer by using carrier substrate made for chip package and provided with elongated contacts
02/05/15Assembly direct-docking probing device
01/29/15High frequency probe card for probing photoelectric device
01/22/15Integrated high-speed probe system
01/15/15Multilayer circuit board
01/15/15Probe module supporting loopback test
01/15/15Cantilever probe card for high-frequency signal transmission
01/15/15Signal path switch and probe card having the signal path switch
12/04/14Probe needle and probe module using the same
10/16/14Position adjustable probing device and probe card assembly using the same
10/16/14Alignment adjusting mechanism for probe card, position adjusting module using the same and modularized probing device
Patent Packs
10/02/14Method of manufacturing space transformer for probe card
08/21/14Probe card of low power loss
07/31/14Wafer testing probe card
07/24/14Probe module
07/17/14Probe head
07/17/14Current-diverting guide plate for probe module and probe module using the same
04/17/14Probe card having configurable structure for exchanging or swapping electronic components for impedance matching
03/20/14Probe card and manufacturing method thereof
09/26/13Probing apparatus equipped with heating device
03/21/13Probing device and manufacturing method thereof
02/07/13Probing device
10/07/10Probe for high frequency signal transmission
09/23/10Probe card
08/27/09Method of making high-frequency probe, probe card using the high-frequency probe

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Mpi Corporation in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Mpi Corporation with additional patents listed. Browse our Agent directory for other possible listings. Page by