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Olympus Ndt Inc patents

Recent patent applications related to Olympus Ndt Inc. Olympus Ndt Inc is listed as an Agent/Assignee. Note: Olympus Ndt Inc may have other listings under different names/spellings. We're not affiliated with Olympus Ndt Inc, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "O" | Olympus Ndt Inc-related inventors




Date Olympus Ndt Inc patents (updated weekly) - BOOKMARK this page
10/01/15Aparatus and conducting and real-time application of ec probe calibration
07/30/15Packet based dds minimizing mathematical and dac noise
03/26/15Method and circuitry for removing circling drifts in ndt/ndi measurement display
02/19/15Method and system of signal representation for ndt/ndi devices
02/05/15System and non-destructive inspection with a visual scanning guide
08/21/14Sizing of a defect using phased array system
05/15/14Hall effect measurement instrument with temperature compensation
04/24/14Ultrasonic testing instrument with dithery pulsing
03/27/14Non-destructive testing instrument with display features indicating signal saturation
02/06/14Assembly with a universal manipulator for inspecting dovetail of different sizes
01/02/14Eddy current array configuration with reduced length and thickness
10/31/13Method and system of using 1.5d phased array probe for cylindrical parts inspection
09/26/13Eddy current array probe and lift-off compensation during operation without known lift references
08/01/13Method and a device of phased array inspection with pulse rate optimization
03/07/13Image processing ndt/ndi testing devices
01/31/13Circuitry for measuring and compensating phase and amplitude differences in ndt/ndi operation
10/18/12Non-destructive inspection instrument employing multiple sensor technologies in an integral enclosure
08/16/12Shielded eddy current coils and methods for forming same on printed circuit boards
05/24/12System and conducting refraction angle verification for phased array probes using standard calibration blocks
02/02/12Orthogonal eddy current probe for multi-directional inspection
01/12/122d coil and a obtaining ec response of 3d coils using the 2d coil configuration
10/20/11Rotating array probe system for non-destructive testing
06/09/11High dynamic range ndt/ndi inspection device with selective noise averaging
05/19/11Ultrasonic internal rotating inspection probe that self-eliminates air bubbles
04/22/10User designated measurement display ndt/ndi with high rate input data







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