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Rigaku Corporation patents

Recent patent applications related to Rigaku Corporation. Rigaku Corporation is listed as an Agent/Assignee. Note: Rigaku Corporation may have other listings under different names/spellings. We're not affiliated with Rigaku Corporation, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "R" | Rigaku Corporation-related inventors

X-ray diffraction apparatus

An X-ray diffraction apparatus including an X-ray detector that is configured to detect diffracted X-rays diffracted from a sample when a surface of the sample is irradiated with X-rays, a counter arm which rotates around a rotation center axis set within the surface of the sample while the X-ray detector... Rigaku Corporation

Methods for manufacturing doubly bent x-ray focusing device, doubly bent x-ray focusing device assembly, doubly bent x-ray spectroscopic device and doubly bent x-ray spectroscopic device assembly

A doubly bent X-ray spectroscopic device (1) according to the present invention includes: a glass plate (3) which is deformed into a shape having a doubly bent surface by being sandwiched between a doubly curved convex surface (21a) of a convex forming die (21) and a doubly curved concave surface... Rigaku Corporation

Processing method, processing apparatus and processing program

Provided are a processing method, a processing apparatus and a processing program which can perform pole figure measurement continuously without overlapping of an angle α in a pole figure with the small number of times of φ scan, thereby enabling the efficient measurement. The processing method for determining conditions of... Rigaku Corporation

Radiation detector, and x-ray analysis apparatus and radiation detection method using the same

There are provided a radiation detector capable of detecting radiation without occurrence of dead time while maintaining an exposure state in which radiation enters continuously, and an X-ray analysis apparatus and a radiation detection method using the radiation detector. A radiation detector 100 that detects radiation in synchronization with an... Rigaku Corporation

X-ray diffractometer

An X-ray diffractometer for obtaining X-ray diffraction angles of diffracted X-rays by detecting with an X-ray detector diffracted X-rays diffracted at a sample when X-rays are emitted at the sample at each angle of the angles about a center point of goniometer circles, the X-ray diffractometer having a pinhole member... Rigaku Corporation

Crystalline phase identification method, crystalline phase identification device, and x-ray diffraction measurement system

A crystalline phase contained in a sample is identified, from X-ray diffraction data of the sample which contain data of a plurality of ring-shaped diffraction patterns, using a database in which are registered data related to peak positions and peak intensity ratios of X-ray diffraction patterns for a plurality of... Rigaku Corporation

Operation guide system for x-ray analysis,operation guide method therefor, and operation guide program therefor

Provided are operation guide system for X-ray analysis to enable users to easily understand measurement of X-ray optical system to be selected. The operation guide system includes: measurement information acquisition unit for acquiring information on a sample and each X-ray measurement optical system part; sample magnification acquisition unit for acquiring... Rigaku Corporation

X-ray fluorescence spectrometer

A measurement line evaluation unit (23): calculates, for all of specified measurement lines, estimated measured intensities by theoretical calculation on the basis of a composition and/or a thickness specified for a thin film; changes, by a predetermined amount, only an estimated measured intensity of one measurement line, and obtains quantitative... Rigaku Corporation

X-ray thin film inspection device

An X-ray thin film inspection device according to the present invention has an X-ray irradiation unit 40 mounted in a first rotation arm 32, an X-ray detector 50 mounted in a second rotation arm 33, a fluorescence x-ray detector 60 for detecting fluorescent X-ray occurring from an inspection target due... Rigaku Corporation

Grazing incidence x-ray fluorescence spectrometer and grazing incidence x-ray fluorescence analyzing method

A grazing incidence X-ray fluorescence spectrometer (1) of the present invention includes: a bent spectroscopic device (4) to monochromate X-rays (3) from an X-ray source (2) and generate an X-ray beam (5) focused on a fixed position (15) on a surface of a sample (S); a slit member (6) disposed... Rigaku Corporation

X-ray thin film inspection device

An X-ray thin film inspection device of the present invention includes an X-ray irradiation unit 40 installed on a first rotation arm 32, an X-ray detector 50 installed on a second rotation arm 33, and a fluorescence X-ray detector 60 for detecting fluorescence X-rays generated from an inspection target upon... Rigaku Corporation

X-ray generator and x-ray analyzer

Provided is an X-ray generator having: an anode that faces a cathode which generates electrons; a plurality of X-ray generation zones; a casing housing the cathode and the anode; an anode support body for supporting the anode; an air cylinder for producing advancing and retreating movement of the anode support... Rigaku Corporation

X-ray generator and x-ray analyzer

An X-ray generator including a cathode, an anode provided with two X-ray generation zones, a casing in which the cathode and anode are accommodated, two air cylinders for causing the anode to move, two linear guides for guiding the movement of the anode, and a bellows serving as a seal... Rigaku Corporation

X-ray diffractometer

Only X-rays having a specific wavelength out of focusing X-rays 2 diffracted from a sample S is reflected from a monochromator 60 based on a Bragg's condition, passed through a receiving slit 30 and detected by an X-ray detector 20. The monochromator 60 is configured to be freely removable, and... Rigaku Corporation

X-ray analyzing apparatus

The X-ray analyzing apparatus according to the present invention includes, in combination: a first correcting unit (13A, 13B) to output a first gain to cause a pulse height of a target peak which is estimated on the basis of a sum of counting rates obtained in preliminary measurement, to match... Rigaku Corporation

X-ray detection signal processing device and x-ray analyzing apparatus using same

An X-ray detection signal processing device (10) and the like according to the present invention includes: a comparator (17) configured to output a High signal when a level of a signal from a continuous reset type preamplifier (13) having an CR circuit (13a) does not exceed a predetermined upper limit... Rigaku Corporation

X-ray fluorescence spectrometer and x-ray fluorescence analyzing method

An X-ray fluorescence spectrometer includes: an X-ray source (3) to irradiate, with primary X-rays (6), a sample (1) that is multiple nanoparticles placed on a substrate (10); an irradiation angle adjustment unit (5) to adjust an irradiation angle at which a surface (10a) of the substrate is irradiated; a detection... Rigaku Corporation

Analyzer, analysis method and analysis program of bone mineral density

To make a user easily obtain an objective and stable analysis result of bone mineral density. An analyzer 100 of bone mineral density using CT image data of a phantom having a known bone mineral density includes: a known data storage part 105 that stores known data of bone mineral... Rigaku Corporation

Stress analysis apparatus, method, and program

A stress analysis apparatus capable of improving the accuracy of a stress value, a method, and a program are provided. A stress analysis apparatus 100 that calculates a residual stress of a sample S includes an analysis unit configured to calculate an error as one of solutions by using an... Rigaku Corporation

X-ray small angle optical system

Provided is an X-ray small angle optical system, which easily achieves a desired angular resolution, including: an X-ray source having a microfocus; a multilayer mirror having an elliptical reflection surface, and being configured to collect X-rays emitted from the X-ray source and to irradiate a sample; and an X-ray detector... Rigaku Corporation

Sensor unit for thermal analysis equipment and thermal analysis equipment

First and second multi-pair thermocouples (21, 22) are formed on the upper surface of a heat-sensitive member (10), and a thermally uniformizing member (30) is adhesively attached to a base portion (11) of the heat-sensitive member (10). The thermally uniformizing member (30) is formed of a heat-resistant and electrically insulating... Rigaku Corporation

Operation guide system for x-ray analysis, operation guide method therefor, and operation guide program therefor

Provided is an operation guide system for an X-ray analysis, including: a sample information acquisition portion for acquiring sample information on a sample to be measured for a predetermined analysis purpose with an X-ray measuring unit; a measurement condition acquisition portion for acquiring a plurality of measurement conditions different from... Rigaku Corporation

Beam generation unit and x-ray small-angle scattering apparatus

A micro beam generation unit capable of simultaneously capturing anisotropic images in a high signal-to-background ratio with a compact configuration and an X-ray small-angle scattering apparatus are provided. A micro beam generation unit 110 generates X-rays having a micro spot size, with which a sample is irradiated, in order to... Rigaku Corporation

X-ray generator and adjustment method therefor

Provided are an X-ray generator capable of suppressing effects of a fluctuation in a disturbance magnetic field and an adjustment method therefor. The X-ray generator includes: an electron-beam generating unit configured to emit an electron beam; an electron target onto which the electron beam is radiated to generate an X-ray;... Rigaku Corporation

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Rigaku Corporation in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Rigaku Corporation with additional patents listed. Browse our Agent directory for other possible listings. Page by