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Semiconductor Manufacturing International beijing Corporation patents

Recent patent applications related to Semiconductor Manufacturing International beijing Corporation. Semiconductor Manufacturing International beijing Corporation is listed as an Agent/Assignee. Note: Semiconductor Manufacturing International beijing Corporation may have other listings under different names/spellings. We're not affiliated with Semiconductor Manufacturing International beijing Corporation, we're just tracking patents.

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "S" | Semiconductor Manufacturing International beijing Corporation-related inventors




Date Semiconductor Manufacturing International beijing Corporation patents (updated weekly) - BOOKMARK this page
05/25/17 new patent  Memory control method and memory control apparatus
05/11/17Method for thermal treatment using heat reservoir chamber
05/11/17Interconnection structure, fabricating method thereof, and exposure alignment system
05/11/17Semiconductor structures and fabrication methods thereof
05/11/17Semiconductor structures and fabrication methods thereof
05/04/17Semiconductor device and related manufacturing method
05/04/17Method and device for compact efuse array
05/04/17Substrate having two semiconductor materials on insulator
05/04/17Semiconductor structures and fabrication methods thereof
05/04/17Conductive plug structure and fabrication method thereof
05/04/17Flash memory and fabricating method thereof
05/04/17Semiconductor device and fabrication forming the same
05/04/17Semiconductor device and fabricating method thereof
04/27/17Efuse bit cell, and read/write method thereof, and efuse array
04/27/17Semiconductor structures and fabrication method thereof
04/27/17Semiconductor structure and fabricating method thereof
04/27/17Method and structure for cmos metal gate stack
04/27/17Contact via structure and fabricating method thereof
04/27/17Semiconductor device and fabrication method thereof
04/20/17Method and device for metal gate stacks
04/13/17Method for repairing mask defects
04/13/17Electrostatic discharge protection device and forming the same
04/13/17Transistor and forming the same
04/13/17Power-on reset circuit
03/30/17Semiconductor device and related manufacturing method
03/30/17Conductive plug structure and fabrication method thereof
03/30/17Resistive random access memory and fabrication method thereof
03/30/17Phase-locked loop device
03/23/17Test structure, fabrication method, and test method
03/23/17Test structure, fabrication method, and test method
03/23/17Bonding pad structure, bonding ring structure, and mems device packaging method
03/23/17Semiconductor device having vertical semiconductor pillars
03/02/17Shallow trench isolation structure and fabricating method thereof
03/02/17Metal interconnect structure and fabrication method thereof
03/02/17Shallow trench isolation structure and fabricating method thereof
03/02/17Fin field-effect transistor and fabrication method thereof
03/02/17Wafer structure, fabrication method, and spray apparatus
03/02/17Three-dimensional transistor and fabrication method thereof
03/02/17New bjt structure design for 14nm finfet device
03/02/17Method to thin down indium phosphide layer
03/02/17Method to enhance 14nm finfet device performance by the sti oxide loss control
02/02/17Semiconductor device and fabricating method thereof
02/02/17Semiconductor device and fabrication method thereof
01/26/17Wafer-level bonding packaging method and wafer structure
01/19/17Semiconductor testing structures and semiconductor testing apparatus
01/12/17Interconnect structures and fabrication method thereof
01/05/17Memory device and related method
10/20/16Semiconductor interconnect device
07/28/16Bipolar transistor, band-gap reference circuit and virtual ground reference circuit
03/31/16Semiconductor device structure and manufacturing methods
03/31/16Methods for forming vertical semiconductor pillars
03/24/16Resistive random access memory device and manufacturing methods
03/24/16Methods for high-k metal gate cmos with sic and sige source/drain regions
02/25/16Capacitive pressure sensors
01/28/16Heat reservoir chamber, and thermal treatment
01/14/16Semiconductor device and manufacturing method thereof
12/24/15Method for manufacturing semiconductor device
12/03/15Semiconductor device and fabrication method thereof
12/03/15Semiconductor device and fabrication method thereof
11/12/15Method for setting a flash memory for htol testing
11/05/15Semiconductor testing structures and fabrication method thereof
11/05/15In-chip static-current device failure detecting methods and apparatus
10/29/15Semiconductor device and manufacturing the same
10/29/15Multi-gate vdmos transistor
10/22/15Integrated circuit and related manufacturing method
Patent Packs
08/13/15Method of finfet formation
08/06/15Pixel structures of cmos imaging sensors
07/16/15Semiconductor memory device and manufacturing method thereof
07/02/15Chemical mechanical planarization apparatus and methods
07/02/15Wearable intelligent systems and interaction methods thereof
06/25/15Metal interconnect structures and fabrication method thereof
06/18/15Weak points auto-correction process for opc tape-out
06/18/15Fin field effect transistors and fabrication method thereof
06/11/15Interconnect structures and fabrication method thereof
05/21/15Electrically conductive device and manufacturing method thereof
04/23/15Enhanced optical proximity correction (opc) method and system
04/23/15Enhanced optical proximity correction (opc) method and system
04/16/15Nanoscale silicon schottky diode array for low power phase change memory application
04/02/15Pixel structures of cmos imaging sensors and fabrication method thereof
04/02/15Enhanced stress memorization technique for metal gate transistors
Patent Packs
03/26/15Flash memory and fabrication method thereof
03/26/15Semiconductor structures and fabrication method thereof
03/19/15Method of measuring threshold voltage of mos transistor in sram array
03/05/15Transistors and fabrication methods thereof
03/05/15Finfet device and forming fin in the same
03/05/15Cmos transistors and fabrication method thereof
03/05/15Capacitive pressure sensors and fabrication methods thereof
02/26/15Semiconductor device and fabrication method
02/12/15Fin field effect transistor and forming the same
02/12/15Multi-gate vdmos transistor and forming the same
02/12/15Ldmos device and fabrication method
02/12/15Semiconductor device including sti structure and forming the same
02/05/15Semiconductor structure and forming the same
02/05/15Semiconductor device and manufacturing method thereof
01/22/15Semiconductor device and manufacturing method thereof
01/22/15Semiconductor device and manufacturing method thereof
01/22/15System and integrated circuits with cylindrical gate structures
12/25/14Method of fabricating a magnetic tunnel junction device
12/04/14Bipolar transistor, band-gap reference circuit and virtual ground reference circuit
01/02/14Semiconductor device and manufacturing method thereof
12/05/13Semiconductor device
06/13/13Semiconductor device and manufacturing method thereof
06/13/13Integrated semiconductor device and manufacturing method therefor
06/13/13Chip-to-wafer bonding method and three-dimensional integrated semiconductor device
06/06/13Semiconductor device and manufacturing the same
05/30/13Semiconductor device and manufacturing method thereof
05/23/13Reaction processing wafer, electrostatic chuck and wafer temperature control method
05/16/13Semiconductor device and manufacturing method thereof
05/16/13Semiconductor device and manufacturing method thereof
05/02/13Semiconductor device and manufacturing method thereof
Social Network Patent Pack
05/02/13Mask, manufacturing method thereof and mask haze monitoring method
05/02/13Method of fabricating semiconductor devices
04/25/13Novel magnetic tunnel junction device and its fabricating method
04/25/13Magnetic tunnel junction device and its fabricating method
04/18/13Post-etch treating method
04/04/13Photolithographic apparatus
04/04/13Method, optical module and auto-focusing system for wafer edge exposure
04/04/13Apparatus and detecting marks and semiconductor device processing system
04/04/13Photolithographic method
03/28/13Double gate transistor and fabricating the same
Patent Packs
03/28/13Photolithography alignment mark, mask and semiconductor wafer containing the same mark
03/28/13Semiconductor device manufacturing method
03/21/13Semiconductor wafer and processing method therefor
03/21/13Electrostatic discharge protection circuit and electrostatic discharge protection method
03/14/13Method for manufacturing semiconductor device
03/14/13Semiconductor device and manufacturing method thereof
03/14/13Semiconductor device and manufacturing the same
03/07/13Semiconductor device capable of reducing plasma induced damage and fabrication method thereof
03/07/13Method for forming pattern and mask pattern, and manufacturing semiconductor device
02/28/13Semiconductor device and manufacturing method thereof
02/28/13Semiconductor device and manufacturing method thereof
02/28/13Semiconductor device and manufacturing method thereof
02/21/13Semiconductor device and manufacturing method thereof
02/21/13Electric-controlled operator
02/21/13Method of manufacturing a semiconductor device
02/14/13Semiconductor device and manufacturing method thereof
02/14/13Semiconductor device and manufacturing method thereof
02/14/13Method of fabricating a semiconductor device
02/07/13Semiconductor device and manufacturing method thereof
02/07/13Method of fabricating a semiconductor device
02/07/13Method for manufacturing a semiconductor device
01/24/13Semiconductor device and manufacturing method thereof
01/24/13Semiconductor device and manufacturing method thereof
01/17/13Semiconductor device and manufacturing method thereof
01/17/13Method of fabricating a semiconductor device
01/17/13Method for fabricating a semiconductor device
12/27/12Semiconductor device and manufacturing method therefor
12/27/12Semiconductor device and manufacturing method thereof
12/20/12Semiconductor device and manufacturing method thereof
12/20/12Semiconductor device and manufacturing method thereof
Patent Packs
12/13/12Semiconductor device and manufacturing method thereof
12/13/12Semiconductor device and manufacturing method thereof
12/13/12Method of fabricating a semiconductor device
12/06/12Method of fabricating semiconductor devices
12/06/12Method of fabricating semiconductor devices
12/06/12Method of fabricating semiconductor devices
11/22/12Method for forming hard mask in semiconductor device fabrication
11/15/12Semiconductor device and manufacturing method thereof
07/05/12Transistor and forming the same
07/05/12Transistor and forming the same
06/28/12Phase change memory and fabricating the same
06/28/12Phase change memory and fabricating the same
06/28/12Polishing method
06/21/12Method for chip scale package and package structure thereof
06/21/12Bga package structure and fabricating the same
06/07/12Semiconductor device and forming the same
06/07/12Method for forming metal gate and mos transistor
05/31/12Method for forming a gate electrode







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