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Semiconductor Manufacturing International shanghai Corporation
Semiconductor Manufacturing International shanghai Corporation_20100107
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Semiconductor Manufacturing International shanghai Corporation patents

Recent patent applications related to Semiconductor Manufacturing International shanghai Corporation. Semiconductor Manufacturing International shanghai Corporation is listed as an Agent/Assignee. Note: Semiconductor Manufacturing International shanghai Corporation may have other listings under different names/spellings. We're not affiliated with Semiconductor Manufacturing International shanghai Corporation, we're just tracking patents.

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "S" | Semiconductor Manufacturing International shanghai Corporation-related inventors




Date Semiconductor Manufacturing International shanghai Corporation patents (updated weekly) - BOOKMARK this page
08/17/17 new patent  Vertical junctionless transistor devices
08/10/17Semiconductor structure and fabrication method thereof
08/10/17Static random access memory and fabrication method thereof
08/10/17Non-volatile memory device having reduced drain and read disturbances
08/10/17Finfet devices having a material formed on reduced source/drain region
08/10/17Semiconductor structure and fabrication method thereof
08/03/17Memory cell and fabrication method thereof
08/03/17Methods for reading and operating memory device
08/03/17Methods for reading and operating memory device
08/03/17Apparatus and forming metal by hot-wire assisted cleaning and atomic layer deposition
08/03/17Method and system for uniform deposition of metal
08/03/17Mark structure and fabrication method thereof
08/03/17Method to improve device performance for finfet
08/03/17Method and structure for finfet sram
08/03/17Nonvolatile memory device and manufacturing the same
08/03/17Asar adc circuit and conversion method thereof
07/27/17Sealing structure for a bonded wafer and forming the sealing structure
07/27/17Semiconductor structures
07/20/17Method of manufacturing a cmos image sensor
07/13/17Membrane transducer structures and methods of manufacturing same using thin-film encapsulation
07/13/17Electromechanical device, related manufacturing method, and related electronic device
07/13/17Reference voltage generator and related method
07/13/17Semiconductor device and related manufacturing method
07/13/17Semiconductor device and fabrication method thereof
07/13/17Method of manufacturing an eeprom device
07/13/17Cmos image sensor and fabrication method thereof
07/13/17Semiconductor device and related manufacturing method
07/13/17Method to improve gate dielectric quality for finfet
07/13/17Fin field-effect transistor and fabrication method thereof
07/13/17Pmos transistor and fabrication method thereof
07/13/17D flip-flop and signal driving method
07/13/17Signal receiver, related method, and related electronic device
07/06/17Eeprom backup
07/06/17Nand flash memory and fabrication method thereof
07/06/17Method for manufacturing memory device
07/06/17Electrostatic discharge protection structure and fabrication method thereof
07/06/17Buried-channel mosfet and a surface-channel mosfet of a same type and fabrication method thereof
07/06/17Semiconductor structure and fabrication method thereof
06/29/17Compact efuse array with different mos sizes according to physical location in a word line
06/29/17Fin-fet device and fabrication method thereof
06/29/17Metal gate transistor and fabrication method thereof
06/22/17Method and device to improve shallow trench isolation
06/22/17Semiconductor device with local interconnect structure and manufacturing method thereof
06/22/17Method and device for reducing finfet self-heating effect
06/22/17Semiconductor device and related manufacturing method
06/15/17Method for fabricating ultra-capacity battery
06/15/17Nand flash memory and fabrication methods thereof
06/15/17Method for reducing loss of silicon cap layer over sige source/drain in a cmos device
06/15/17Photolithography alignment mark structures and semiconductor structures
06/15/17Cmos image sensor and fabrication method thereof
06/15/17Semiconductor device and fabrication method thereof
06/15/17Resonator and related manufacturing method
06/08/17Nanowire device and manufacturing the same
06/08/17Polishing pad, and monitoring method and monitoring system thereof
06/08/17Fin-fet device and fabrication method thereof
06/08/17Semiconductor device and fabrication method thereof
06/08/17Method for manufacturing a device isolation structure
06/08/17Semiconductor nanowire device and fabrication method thereof
06/08/17High-k metal gate transistor structure and fabrication method thereof
06/01/17Memory control method and apparatus
06/01/17Well implantation process for finfet device
06/01/17Semiconductor device and manufacturing method thereof
06/01/17Physically unclonable product and fabrication method thereof
05/25/17Memory control method and memory control apparatus
05/18/17Semiconductor device including shallow trench isolation structures
Patent Packs
05/11/17Method for thermal treatment using heat reservoir chamber
05/11/17Interconnection structure, fabricating method thereof, and exposure alignment system
05/11/17Semiconductor device and manufacturing the same
05/11/17Semiconductor structures and fabrication methods thereof
05/11/17Semiconductor structures and fabrication methods thereof
05/04/17Method and device for compact efuse array
05/04/17Substrate having two semiconductor materials on insulator
05/04/17Semiconductor structures and fabrication methods thereof
05/04/17Conductive plug structure and fabrication method thereof
05/04/17Semiconductor device and related manufacturing method
05/04/17Flash memory and fabricating method thereof
05/04/17Semiconductor device and fabrication forming the same
05/04/17Semiconductor device and fabricating method thereof
04/27/17Semiconductor device, related manufacturing method, and related electronic device
04/27/17Efuse bit cell, and read/write method thereof, and efuse array
Patent Packs
04/27/17Semiconductor structures and fabrication method thereof
04/27/17Semiconductor structure and fabricating method thereof
04/27/17Method and structure for cmos metal gate stack
04/27/17Contact via structure and fabricating method thereof
04/27/17Semiconductor device and fabrication method thereof
04/20/17Memory device, related method, and related electronic device
04/20/17Method and device for metal gate stacks
04/13/17Method for repairing mask defects
04/13/17Electrostatic discharge protection device and forming the same
04/13/17Transistor and forming the same
04/13/17Power-on reset circuit
03/30/17Semiconductor device and related manufacturing method
03/30/17Conductive plug structure and fabrication method thereof
03/30/17Resistive random access memory and fabrication method thereof
03/30/17Phase-locked loop device
03/23/17Patterning method
03/23/17Test structure, fabrication method, and test method
03/23/17Edge bead removal apparatus
03/23/17Bonding pad structure, bonding ring structure, and mems device packaging method
03/23/17Semiconductor device having vertical semiconductor pillars
03/23/17Fin field-effect transistor
03/16/17Semiconductor device, related manufacturing method, and related electronic device
03/09/17Inductor device
03/02/17Mems device and fabrication method thereof
03/02/17Control method and control apparatus of memory decoding system
03/02/17Shallow trench isolation structure and fabricating method thereof
03/02/17Method for manufacturing a conductor to be used as interconnect member
03/02/17Fin field-effect transistor and fabrication method thereof
03/02/17Metal interconnect structure and fabrication method thereof
03/02/17Wafer structure, fabrication method, and spray apparatus
Social Network Patent Pack
03/02/17Three-dimensional transistor and fabrication method thereof
03/02/17New bjt structure design for 14nm finfet device
03/02/17Method to thin down indium phosphide layer
03/02/17Method to enhance 14nm finfet device performance by the sti oxide loss control
03/02/17Tunneling nanotube field effect transistor and manufacturing method thereof
02/23/17Double-side process silicon mos and passive devices for rf front-end modules
02/16/17Method for fabricating semiconductor structure
02/16/17Method for reducing crosstalk in cmos image sensor
02/09/17Mems device
02/09/17Semiconductor device having improved core and input/output device reliability
Patent Packs
02/02/17Semiconductor structure and fabrication method thereof
02/02/17Interconnection structure
02/02/17Semiconductor device and fabricating method thereof
02/02/17Semiconductor device and fabrication method thereof
01/26/17Wafer-level bonding packaging method and wafer structure
01/19/17Semiconductor testing structures and semiconductor testing apparatus
01/12/17Interconnect structures and fabrication method thereof
01/12/17Finfet structure
01/05/17Method for forming photolithographic pattern
01/05/17Selected gate driver circuit in memory circuits, and control device and control method thereof
01/05/17Memory device and related method
01/05/17Semiconductor device and manufacturing method thereof
01/05/17Semiconductor structure and fabrication method thereof
01/05/17Fin field effect transistor and fabricating method thereof
12/29/16Extreme ultraviolet light source, exposure apparatus, and integrated rotary structure fabricating method
12/29/16Semiconductor device and manufacturing method thereof
12/29/16Semiconductor device, related manufacturing method, and related electronic device
12/22/16Low voltage triggered silicon controlled rectifier with high holding voltage and small silicon area
12/22/16Semiconductor device and related manufacturing method
12/15/16Memory device structure and fabricating method thereof
12/15/16Magnetoresistive sensor, related manufacturing method, and related electronic device
12/08/16Interconnect structure
12/01/16Semiconductor structure and fabrication method thereof
12/01/16Memory device
12/01/16Semiconductor device, finfet transistor and fabrication method thereof
12/01/16Pmos transistor and fabrication method thereof
12/01/16Circuit and generating clock-signals
11/24/16Seal ring structure to avoid delamination defect
11/24/16Zener triggered silicon controlled rectifier with small silicon area
11/17/16Semiconductor structure and forming the same
Patent Packs
11/17/16Chip packaging structures
11/17/16Semiconductor transistor having buffer layer between channel and substrate
11/17/16High voltage level shifter in ultra low power supply memory application
11/10/163d nand device and fabrication method thereof
11/10/16Mos transistor and fabrication method
11/10/16Semiconductor device and related manufacturing method
11/03/16Semiconductor device
11/03/16N-type fin field-effect transistor and fabrication method thereof
10/27/16Apparatus and overlay measurement
10/27/16Apparatus and overlay measurement
10/20/16Phase-change device, related manufacturing method, and related electronic device
10/20/16Semiconductor interconnect device
10/20/16Semiconductor device and related electronic device
10/20/16Semiconductor devices
10/20/16Transistor and fabrication method thereof
10/13/16Semiconductor device and manufacturing the same
10/06/16Mask read-only memory array, memory device, and fabrication method thereof
10/06/16Power semiconductor device and fabrication method thereof
10/06/16Fin field-effect transistor and fabrication method thereof
10/06/16Power semiconductor device and fabrication method thereof
Social Network Patent Pack
10/06/16Transistor and fabrication method thereof
09/29/16Semiconductor structure and fabrication method thereof
09/29/16Semiconductor device, related manufacturing method, and related electronic device
09/22/16Semiconductor structure and fabrication method thereof
09/22/16Ldmos device and fabrication method thereof
09/08/16System and integrated circuits with cylindrical gate structures
09/08/16Methods for forming cmos inverters
09/08/16Electromechanical nonvolatile memory
09/08/16Fin field-effct transistors
09/01/16Method and facilitating manufacturing of semiconductor device
09/01/16Semiconductor device including stripe structures
08/25/16Method for forming deep trench isolation for rf devices on soi
08/25/16Fin field effect transistor
08/25/16Semiconductor devices and fabrication method thereof
08/18/16Finfet structure and forming same
08/18/16Semiconductor device, related manufacturing method, and related electronic device
08/11/16Semiconductor device, related manufacturing method, and related electronic device
08/04/16Novel design rule check for off-grid irregular layout with on-grid design rule check deck
08/04/16Electrostatic discharge protection structure in a semiconductor device
08/04/16Non-volatile memory device and manufacturing the same
Social Network Patent Pack
08/04/16Method for manufacturing semiconductor device
08/04/16Method and device for high k metal gate transistors
07/28/16Technique of reducing shallow trench isolation loss during fin formation in finfets
07/21/16Semiconductor device, related manufacturing method, and related electronic device
07/14/16Simplified zener diode dc spice model
07/14/16Memory device, related method, and related electronic device
07/14/16Semiconductor device and fabrication method thereof
07/14/16Backside processed semiconductor device
07/14/16Semiconductor device, related manufacturing method, and related electronic device
07/14/16Semiconductor device and fabrication method thereof
07/14/16Semiconductor die and die cutting method
07/14/16Semiconductor device and formation method thereof
07/14/16Method and device for a finfet
07/14/16Semiconductor device, related manufacturing method, and related electronic device
07/14/16New layout for ldmos
07/07/16Finfet device and fabrication method thereof
07/07/16Semiconductor structures and fabrication method thereof
07/07/16Electrically programmable fuse structure and fabrication method thereof
07/07/16Finfet device and fabrication method thereof
07/07/16Fin field effect transistors and fabrication method thereof
07/07/16Semiconductor structure and fabrication method thereof, and static random access memory cell
07/07/16Mask read-only memory device and fabrication method thereof
07/07/16Finfet and forming the same
06/30/16Accelerometer with little cross effect
06/30/16Semiconductor device, related manufacturing method, and related electronic device
06/30/16Complementary carbon nanotube neuron device
06/30/16Complementary high mobility nanowire neuron device
06/30/16Carbon nanotube neuron device and making the same
06/30/16Transistor device, related method, and related electronic device
06/23/16Semiconductor structure and fabrication method thereof
Social Network Patent Pack
06/23/16Semiconductor structure and fabrication method thereof
06/16/16Semiconductor device including sti structure
06/09/16Memory device, related method, and related electronic device
06/09/16Semiconductor structure and fabrication method thereof
06/09/16Semiconductor structure and fabrication method thereof
06/09/16Semiconductor device and fabrication method thereof
06/09/16Layouts and fabrication methods for static random access memory
06/09/16Flash memory
06/09/16Finfet semiconductor device and fabrication method
06/09/16Frequency divider and phase-locked loop including the same
06/02/16Novel finfet 6t sram cell structure
06/02/16Mems capacitive pressure sensors
06/02/16Mems capping method
06/02/16Rf soi switch with backside cavity and the method to form it
06/02/16Static memory cell
06/02/16Semiconductor device with three or four-terminal-finfet
06/02/16Nldmos transistor and fabrication method thereof
06/02/16Method and system for cmos image sensing device
05/26/16Semiconductor device and fabrication method thereof
05/26/16Semiconductor device and fabricating same
05/19/16Method and device for testing semiconductor manufacturing equipment automation program
05/19/16Method and device for designing electrical circuit
05/19/16Method for semiconductor selective etching and bsi image sensor
05/12/16Semiconductor device and an electronic apparatus
05/12/16Transistor and fabrication method thereof
05/05/16Transistor and fabrication method thereof
04/28/16Light source and photolithography apparatus containing the same, calibrating apparatus and method
04/28/16Wafer level packaging approach for semiconductor devices
04/28/16Semiconductor structures and fabrication methods thereof







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