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Sk Hynix Inc
Sk Hynix Inc_20131212

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Sk Hynix, Inc. patents


      
Recent patent applications related to Sk Hynix, Inc.. Sk Hynix, Inc. is listed as an Agent/Assignee. Note: Sk Hynix, Inc. may have other listings under different names/spellings. We're not affiliated with Sk Hynix, Inc., we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "S" | Sk Hynix, Inc.-related inventors



Sk Hynix

Electronic devices having semiconductor memory unit

Sk Hynix

Semiconductor integrated circuit capable of controlling read command

Sk Hynix

Semiconductor device and method for fabricating the same

Search recent Press Releases: Sk Hynix, Inc.-related press releases
Count Application # Date Sk Hynix, Inc. patents (updated weekly) - BOOKMARK this page
12014025245809/11/14 new patent  Semiconductor device having vertical channel transistor and method for fabricating the same
22014025265209/11/14 new patent  Bonding structure of semiconductor package, method for fabricating the same, and stack-type semiconductor package
32014025423909/11/14 new patent  Electronic device comprising a semiconductor memory unit
42014025424309/11/14 new patent  Electronic device and method for fabricating the same
52014025425609/11/14 new patent  Vertical type semiconductor device, fabrication method thereof and operation method thereof
62014025428109/11/14 new patent  3d non-volatile memory device and method for operating and fabricating the same
72014025428709/11/14 new patent  Semiconductor integrated circuit capable of controlling read command
82014025610309/11/14 new patent  Method for fabricating electronic devices having semiconductor memory unit
92014025612509/11/14 new patent  Semiconductor device and method for fabricating the same
102014025862609/11/14 new patent  Electronic devices having semiconductor memory unit
112014025876709/11/14 new patent  Semiconductor device and semiconductor system including the same
122014024674209/04/14Semiconductor device
132014024764709/04/14Electronic device and method for fabricating the same
142014024764809/04/14Electronic device
152014024875009/04/14Vertical type semiconductor device and fabrication method thereof
162014024876509/04/14Semiconductor memory device having dummy conductive patterns on interconnection and fabrication method thereof
172014025024409/04/14Electronic devices having semiconductor magnetic memory units
182014023924708/28/14Transistor, resistance variable memory device including the same, and manufacturing method thereof
192014024103908/28/14Electronic device and method for operating the same
202014024104008/28/14Electronic device
212014024104108/28/14Reference column of semiconductor memory, and electronic device including the same
222014024104208/28/14Electronic device and method for operating the same
232014024104308/28/14Electronic device and method for operating electronic device
242014024107908/28/14Chip die and semiconductor memory device including the same
252014024275808/28/14Wafer and method for forming the same
262014024276508/28/143-dimensional non-volatile memory device including a selection gate having an l shape
272014024277208/28/14Method for fabricating semiconductor device
282014024277308/28/14Phase change memory device having self-aligned bottom electrode and fabrication method thereof
292014024493008/28/14Electronic devices having semiconductor magnetic memory units
302014024493108/28/14Electronic device
312014024494508/28/14Electronic device and method for operating electronic device
322014023194208/21/14Semiconductor device and method for fabricating the same
332014023201408/21/14Semiconductor device with buried bit line and method for fabricating the same
342014022641908/14/14Semiconductor apparatus
352014022642208/14/14Semiconductor memory device and method of testing the same
362014022763508/14/14Reflection type blank masks, methods of fabricating the same, and methods of fabricating reflection type photo masks using the same
372014022784008/14/143d non-volatile memory device and method for fabricating the same
382014022785108/14/14Semiconductor device and method for manufacturing the same
392014021754508/07/14Semiconductor device and method for fabricating the same
402014021810108/07/14Period signal generation circuits
412014021899508/07/14Semiconductor chips
422014021904008/07/14Semiconductor memory device including bulk voltage generation circuit
432014020984707/31/14Phase-change memory device having multiple diodes
442014020990707/31/14Semiconductor apparatus and stacked semiconductor apparatus for checking formation and connection of through silicon via
452014020990907/31/14Semiconductor device
462014021005807/31/14Semiconductor device and method of fabricating the same
472014020333707/24/14Method of forming gate dielectric layer and method of fabricating semiconductor device
482014020466407/24/14Method of driving phase change memory device capable of reducing heat disturbance
492014020468107/24/14Semiconductor memory device and method of operating the same
502014020468207/24/14Method and apparatus for simultaneously accessing a plurality of memory cells in a memory array to perform a read operation and/or a write operation
512014020595407/24/14Method for forming patterns of semiconductor device by using mixed assist feature system
522014020619407/24/14Method for manufacturing a semiconductor device
532014020804407/24/14Semiconductor device and method of operating the same
542014020818707/24/14Semiconductor apparatus and method of operating the same
552014019858507/17/14Semiconductor memory apparatus
562014019138907/10/14Semiconductor device and method of manufacturing the same
572014019258407/10/14Semiconductor device
582014018344007/03/14Variable resistance memory device
592014018364407/03/14Semiconductor device with high voltage transistor
602014018364907/03/14Semiconductor device having metal gate and high-k dielectric layer and method for manufacturing the same
612014018365007/03/14Cmos circuit and method for fabricating the same
622014018365107/03/14Semiconductor device with metal gate and high-k materials and method for fabricating the same
632014018368907/03/14Anti-fuse array of semiconductor device and method for forming the same
642014018372407/03/14Substrate for semiconductor package, semiconductor package using the same, and manufacturing method thereof
652014018423907/03/14Semiconductor device with fuse sensing circuit
662014018429307/03/14Pulse signal generation circuit and operating method thereof
672014018429407/03/14Duty cycle correction circuit and operation method thereof
682014018535307/03/14Memory
692014018535607/03/14Semiconductor integrated circuit and method of driving the same
702014018537007/03/14Nonvolatile memory apparatus having magnetoresistive memory elements and method for driving the same
712014018538107/03/14Semiconductor apparatus and method of operating the same
722014018538707/03/14Semiconductor memory device and method of operating the same
732014018539607/03/14Semiconductor memory, memory system, and operation method thereof
742014018539907/03/14Test mediation device and system and method for testing memory device
752014018703007/03/14Semiconductor device with dual work function gate stacks and method for fabricating the same
762014018703107/03/14Semiconductor device with recess gate and method for fabricating the same
772014018703707/03/14Semiconductor device with self-aligned air gap and method for fabricating the same
782014018925707/03/14Semiconductor memory device
792014018925807/03/14Semiconductor memory device
802014018928307/03/14Semiconductor memory device and operating method for the same
812014018940707/03/14Data storage device and method for operating the same
822014017536806/26/14Phase-change random access memory device and method of manufacturing the same
832014017543906/26/14Semiconductor integrated circuit and multi-chip package including the same
842014017552906/26/14Nonvolatile memory device and method for fabricating the same
852014017553306/26/14Nonvolatile memory device and method for fabricating the same
862014017553706/26/14Semiconductor apparatus and fabrication method thereof
872014017553806/26/14Semiconductor apparatus and fabrication method thereof
882014017555506/26/14Semiconductor devices having buried metal silicide layers and methods of fabricating the same
892014017558606/26/14Image sensor and method for fabricating the same
902014017560506/26/14Semiconductor chip and semiconductor apparatus with embedded capacitor
912014017563806/26/14Semiconductor packages including semiconductor chips having protrusions and methods of fabricating the same
922014017566006/26/14Stack packages having token ring loops
932014017566706/26/14Semiconductor integrated circuit and semiconductor system with the same
942014017566806/26/14Semiconductor integrated circuit
952014017568006/26/14Electrical characteristics of package substrates and semiconductor packages including the same
962014017610106/26/14Internal voltage generation circuits
972014017616706/26/14Semiconductor apparatus
982014017616806/26/14Semiconductor apparatus
992014017619106/26/14Comparator circuit and signal comparison method
1002014017619206/26/14Semiconductor device
1012014017619706/26/14Semiconductor device and operating method thereof
1022014017620606/26/14Delay locked loop and semiconductor apparatus
1032014017620706/26/14Semiconductor apparatus
1042014017620906/26/14Clock generation circuit and clock generation system using the same
1052014017621406/26/14Phase splitter
1062014017626006/26/14Signal transmission circuit
1072014017731306/26/14Semiconductor device and method of operation
1082014017731406/26/14Semiconductor memory devices and semiconductor system having parameters, and methods of testing the same
1092014017733106/26/14Semiconductor device and method for forming the same
1102014017733206/26/14Operating circuit controlling device, semiconductor memory device and method of operating the same
1112014017733606/26/14Non-volatile memory device and method of fabricating the same
1122014017735306/26/14Nonvolatile memory apparatus
1132014017735506/26/14Nonvolatile memory apparatus
1142014017736006/26/14Device and method for controlling self-refresh
1152014017736406/26/14One-time programmable memory and test method thereof
1162014017736506/26/14Semiconductor apparatus, test method using the same and muti chips system
1172014017736606/26/14Data input/output circuit and semiconductor memory device including the same
1182014017736806/26/14Nonvolatile memory apparatus
1192014017737406/26/14Driver of semiconductor memory device and driving method thereof
1202014017737606/26/14Memory and memory system including the same
1212014017769606/26/14Receiver circuit with de-emphasis function
1222014017906906/26/14Fabrication method of semiconductor apparatus
1232014017909206/26/14Method for forming void-free polysilicon and method for fabricating semiconductor device using the same
1242014017910106/26/14Semiconductor device with air gap and method for fabricating the same
1252014017910206/26/14Semiconductor device with air gaps and method for fabricating the same
1262014017911806/26/14Surface treatment method for semiconductor device
1272014018142406/26/14Semiconductor memory system and operation method thereof
1282014018145606/26/14Memory, memory controller, memory system including the memory and the memory controller, and operating method of the memory system
1292014018158806/26/14Semiconductor memory apparatus and operating method thereof
1302014018160406/26/14Channel control circuit and semiconductor device having the same
1312014016696306/19/14Semiconductor device and method of manufacturing the same
1322014016696406/19/14Phase-change memory device and fabrication method thereof
1332014016696506/19/14Resistive memory device and fabrication method thereof
1342014016697106/19/14Variable resistance memory device and method of manufacturing the same
1352014016703006/19/14Vertical type semiconductor device and fabrication method thereof
1362014016712906/19/14Semiconductor device and method of manufacturing the same
1372014016714906/19/14Semiconductor device and fabrication method thereof
1382014016725006/19/14Semiconductor device
1392014016727506/19/14Embedded package and method of manufacturing the same
1402014016727606/19/14Substrate for semiconductor package, semiconductor package using the substrate, and method of manufacturing the semiconductor package
1412014016728006/19/14Semiconductor device
1422014016728106/19/14Stack type semiconductor circuit with impedance calibration
1432014016729306/19/14Integrated circuit with bump connection scheme
1442014016771306/19/14Regulator and voltage generator
1452014016771906/19/14Voltage generation circuit
1462014016783906/19/14Negative voltage regulation circuit and voltage generation circuit including the same
1472014016784906/19/14Differential amplifier
1482014016905906/19/14Fuse repair device
1492014016906406/19/14Regulator, voltage generator and semiconductor memory device
1502014016906506/19/14High voltage generating circuit for resistive memory apparatus
1512014016906706/19/14Resistance memory device and memory apparatus and data processing system
1522014016909406/19/14Data transmission circuit, memory including the same, and data transmission method
1532014016909606/19/14Semiconductor memory device and operating method thereof
1542014016909706/19/14Semiconductor memory device, system having the same and program method thereof
1552014016911206/19/14Semiconductor memory system and operating method thereof
1562014016911806/19/14Address input circuit of semiconductor apparatus
1572014017081206/19/14Method and apparatus for manufacturing chip package
1582014017082806/19/14Plasma doping method and method for fabricating semiconductor device using the same
1592014017083006/19/14Variable resistance memory device and method for fabricating the same
1602014017318406/19/14Data storage device and operating method thereof
1612014017323106/19/14Semiconductor memory device and system operating method
1622014015896606/12/14Variable resistance memory device and method for fabricating the same
1632014015912706/12/14Semiconductor device and method of manufacturing the same
1642014015913106/12/14Reservoir capacitor of semiconductor device and method for fabricating the same
1652014015918406/12/14Image sensor and method for fabricating the same
1662014015919306/12/14Semiconductor device and method for fabricating the same
1672014015976506/12/14Semiconductor apparatus
1682014015977706/12/14Voltage detector and semiconductor device including the same
1692014015978906/12/14Semiconductor apparatus
1702014015979206/12/14Voltage generation circuit
1712014016083706/12/14Resistive memory device and method of manufacturing the same
1722014016083906/12/14Semiconductor intergrated circuit device, method of manufacturing the same, and method of driving the same
1732014016084606/12/14Semiconductor memory device and method of operating the same
1742014016085606/12/14Semiconductor memory device and program method thereof
1752014016086306/12/14Semiconductor device having transistor and semiconductor memory device using the same
1762014016086406/12/14Semiconductor device including current compensator
1772014016087206/12/14Voltage generation circuit, and write driver and semiconductor memory apparatus including the same
1782014016242906/12/14Semiconductor intergrated circuit device, method of manufacturing the same, and method of driving the same
1792014016244806/12/14Semiconductor device with metal gates and method for fabricating the same
1802014016245306/12/14Semiconductor device and method for fabricating the same
1812014016468206/12/14Nonvolatile memory apparatus, operating method thereof, and data processing system having the same
1822014016468306/12/14Nonvolatile memory apparatus, operating method thereof, and data processing system having the same
1832014015162706/05/14Semiconductor device and method of manufacturing the same
1842014015177906/05/14Semiconductor memory device and method of manufacturing the same
1852014015178006/05/14Nonvolatile memory device and method of fabricating the same
1862014015178406/05/14Semiconductor memory device and method of manufacturing the same
1872014015180506/05/14Method for fabricating a connection region in a semiconductor device
1882014015184206/05/14Semiconductor apparatus
1892014015235806/05/14Semiconductor apparatus and duty cycle correction method thereof
1902014015236006/05/14Phase difference quantization circuit, delay value control circuit thereof, and delay circuit
1912014015334006/05/14Method for erasing charge trap devices
1922014015334206/05/14Semiconductor integrated circuit and method for monitoring reference voltage thereof
1932014015334406/05/14Semiconductor memory device, system having the same and method for generating reference voltage for operating the same
1942014015486606/05/14Method of forming a semiconductor memory device
1952014015688206/05/14Memory device, operating method thereof, and data storage device including the same
1962014015692406/05/14Semiconductor memory device with improved operating speed and data storage device including the same
1972014015708206/05/14Data storage device and method for processing error correction code thereof
1982014014514005/29/14Variable resistance memory device
1992014014534305/29/14Semiconductor device and method for manufacturing the same
2002014014569005/29/14Internal voltage generation circuits
2012014014575405/29/14Integrated circuit and operation method thereof
2022014014576405/29/14Multi-phase clock generation circuit
2032014014576605/29/14Initialization circuit
2042014014660805/29/14Oscillator circuit with location-based charge pump enable and semiconductor memory including the same
2052014014685205/29/14Semiconductor device
2062014013860605/22/14Resistance variable memory device
2072014013868705/22/14Semiconductor device and method of manufacturing the same
2082014013876505/22/14Semiconductor device and method of manufacturing the same
2092014013876805/22/14Semiconductor integrated circuit device having reduced unit cell area and method for manufacturing the same
2102014013926905/22/14Multi-chip system and semiconductor package
2112014014001605/22/14Power metal mesh and semiconductor memory device and method including the same
2122014014012705/22/14Magnetic random access memory apparatus, methods for programming and verifying reference cells therefor
2132014014013605/22/14Semiconductor device and method of operating the same
2142014014014805/22/14Semiconductor memory device, memory system including the same and method of operating the same
2152014014015105/22/14Semiconductor memory apparatus
2162014014038505/22/14Equalizer and operating method thereof
2172014014043105/22/14Transmitter circuit, receiver circuit, and transmitting/receiving system
2182014014159305/22/14Semiconductor device and method for forming the same
2192014014349105/22/14Semiconductor apparatus and operating method thereof
2202014013860605/22/14Resistance variable memory device
2212014013868705/22/14Semiconductor device and method of manufacturing the same
2222014013876505/22/14Semiconductor device and method of manufacturing the same
2232014013876805/22/14Semiconductor integrated circuit device having reduced unit cell area and method for manufacturing the same
2242014013926905/22/14Multi-chip system and semiconductor package
2252014014001605/22/14Power metal mesh and semiconductor memory device and method including the same
2262014014012705/22/14Magnetic random access memory apparatus, methods for programming and verifying reference cells therefor
2272014014013605/22/14Semiconductor device and method of operating the same
2282014014014805/22/14Semiconductor memory device, memory system including the same and method of operating the same
2292014014015105/22/14Semiconductor memory apparatus
2302014014038505/22/14Equalizer and operating method thereof
2312014014043105/22/14Transmitter circuit, receiver circuit, and transmitting/receiving system
2322014014159305/22/14Semiconductor device and method for forming the same
2332014014349105/22/14Semiconductor apparatus and operating method thereof
2342014013178305/15/14Semiconductor device and method of manufacturing the same
2352014013178505/15/14Semiconductor device and method of manufacturing the same
2362014013233905/15/14Filtering circuit, phase identity determination circuit and delay locked loop
2372014013321405/15/14Resistive memory device and method for driving the same
2382014013324705/15/14Semiconductor memory device and method for testing the same
2392014013325605/15/14Voltage generation circuit of semiconductor memory apparatus
2402014013178305/15/14Semiconductor device and method of manufacturing the same
2412014013178505/15/14Semiconductor device and method of manufacturing the same
2422014013233905/15/14Filtering circuit, phase identity determination circuit and delay locked loop
2432014013321405/15/14Resistive memory device and method for driving the same
2442014013324705/15/14Semiconductor memory device and method for testing the same
2452014013325605/15/14Voltage generation circuit of semiconductor memory apparatus
2462014012486405/08/14Antifuse of semiconductor device and method of fabricating the same
2472014012489205/08/14Semiconductor device and method for forming the same
2482014012492105/08/14Semiconductor package
2492014012492205/08/14Bump structures in semiconductor packages and methods of fabricating the same


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Sk Hynix, Inc. in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Sk Hynix, Inc. with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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