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Sk Hynix Inc
Sk Hynix Inc_20131212

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Sk Hynix, Inc. patents


      
Recent patent applications related to Sk Hynix, Inc.. Sk Hynix, Inc. is listed as an Agent/Assignee. Note: Sk Hynix, Inc. may have other listings under different names/spellings. We're not affiliated with Sk Hynix, Inc., we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "S" | Sk Hynix, Inc.-related inventors



Search recent Press Releases: Sk Hynix, Inc.-related press releases
Count Application # Date Sk Hynix, Inc. patents (updated weekly) - BOOKMARK this page
12014023194208/21/14Semiconductor device and method for fabricating the same
22014023201408/21/14Semiconductor device with buried bit line and method for fabricating the same
32014022641908/14/14Semiconductor apparatus
42014022642208/14/14Semiconductor memory device and method of testing the same
52014022763508/14/14Reflection type blank masks, methods of fabricating the same, and methods of fabricating reflection type photo masks using the same
62014022784008/14/143d non-volatile memory device and method for fabricating the same
72014022785108/14/14Semiconductor device and method for manufacturing the same
82014021754508/07/14Semiconductor device and method for fabricating the same
92014021810108/07/14Period signal generation circuits
102014021899508/07/14Semiconductor chips
112014021904008/07/14Semiconductor memory device including bulk voltage generation circuit
122014020984707/31/14Phase-change memory device having multiple diodes
132014020990707/31/14Semiconductor apparatus and stacked semiconductor apparatus for checking formation and connection of through silicon via
142014020990907/31/14Semiconductor device
152014021005807/31/14Semiconductor device and method of fabricating the same
162014020333707/24/14Method of forming gate dielectric layer and method of fabricating semiconductor device
172014020466407/24/14Method of driving phase change memory device capable of reducing heat disturbance
182014020468107/24/14Semiconductor memory device and method of operating the same
192014020468207/24/14Method and apparatus for simultaneously accessing a plurality of memory cells in a memory array to perform a read operation and/or a write operation
202014020595407/24/14Method for forming patterns of semiconductor device by using mixed assist feature system
212014020619407/24/14Method for manufacturing a semiconductor device
222014020804407/24/14Semiconductor device and method of operating the same
232014020818707/24/14Semiconductor apparatus and method of operating the same
242014019858507/17/14Semiconductor memory apparatus
252014019138907/10/14Semiconductor device and method of manufacturing the same
262014019258407/10/14Semiconductor device
272014018344007/03/14Variable resistance memory device
282014018364407/03/14Semiconductor device with high voltage transistor
292014018364907/03/14Semiconductor device having metal gate and high-k dielectric layer and method for manufacturing the same
302014018365007/03/14Cmos circuit and method for fabricating the same
312014018365107/03/14Semiconductor device with metal gate and high-k materials and method for fabricating the same
322014018368907/03/14Anti-fuse array of semiconductor device and method for forming the same
332014018372407/03/14Substrate for semiconductor package, semiconductor package using the same, and manufacturing method thereof
342014018423907/03/14Semiconductor device with fuse sensing circuit
352014018429307/03/14Pulse signal generation circuit and operating method thereof
362014018429407/03/14Duty cycle correction circuit and operation method thereof
372014018535307/03/14Memory
382014018535607/03/14Semiconductor integrated circuit and method of driving the same
392014018537007/03/14Nonvolatile memory apparatus having magnetoresistive memory elements and method for driving the same
402014018538107/03/14Semiconductor apparatus and method of operating the same
412014018538707/03/14Semiconductor memory device and method of operating the same
422014018539607/03/14Semiconductor memory, memory system, and operation method thereof
432014018539907/03/14Test mediation device and system and method for testing memory device
442014018703007/03/14Semiconductor device with dual work function gate stacks and method for fabricating the same
452014018703107/03/14Semiconductor device with recess gate and method for fabricating the same
462014018703707/03/14Semiconductor device with self-aligned air gap and method for fabricating the same
472014018925707/03/14Semiconductor memory device
482014018925807/03/14Semiconductor memory device
492014018928307/03/14Semiconductor memory device and operating method for the same
502014018940707/03/14Data storage device and method for operating the same
512014017536806/26/14Phase-change random access memory device and method of manufacturing the same
522014017543906/26/14Semiconductor integrated circuit and multi-chip package including the same
532014017552906/26/14Nonvolatile memory device and method for fabricating the same
542014017553306/26/14Nonvolatile memory device and method for fabricating the same
552014017553706/26/14Semiconductor apparatus and fabrication method thereof
562014017553806/26/14Semiconductor apparatus and fabrication method thereof
572014017555506/26/14Semiconductor devices having buried metal silicide layers and methods of fabricating the same
582014017558606/26/14Image sensor and method for fabricating the same
592014017560506/26/14Semiconductor chip and semiconductor apparatus with embedded capacitor
602014017563806/26/14Semiconductor packages including semiconductor chips having protrusions and methods of fabricating the same
612014017566006/26/14Stack packages having token ring loops
622014017566706/26/14Semiconductor integrated circuit and semiconductor system with the same
632014017566806/26/14Semiconductor integrated circuit
642014017568006/26/14Electrical characteristics of package substrates and semiconductor packages including the same
652014017610106/26/14Internal voltage generation circuits
662014017616706/26/14Semiconductor apparatus
672014017616806/26/14Semiconductor apparatus
682014017619106/26/14Comparator circuit and signal comparison method
692014017619206/26/14Semiconductor device
702014017619706/26/14Semiconductor device and operating method thereof
712014017620606/26/14Delay locked loop and semiconductor apparatus
722014017620706/26/14Semiconductor apparatus
732014017620906/26/14Clock generation circuit and clock generation system using the same
742014017621406/26/14Phase splitter
752014017626006/26/14Signal transmission circuit
762014017731306/26/14Semiconductor device and method of operation
772014017731406/26/14Semiconductor memory devices and semiconductor system having parameters, and methods of testing the same
782014017733106/26/14Semiconductor device and method for forming the same
792014017733206/26/14Operating circuit controlling device, semiconductor memory device and method of operating the same
802014017733606/26/14Non-volatile memory device and method of fabricating the same
812014017735306/26/14Nonvolatile memory apparatus
822014017735506/26/14Nonvolatile memory apparatus
832014017736006/26/14Device and method for controlling self-refresh
842014017736406/26/14One-time programmable memory and test method thereof
852014017736506/26/14Semiconductor apparatus, test method using the same and muti chips system
862014017736606/26/14Data input/output circuit and semiconductor memory device including the same
872014017736806/26/14Nonvolatile memory apparatus
882014017737406/26/14Driver of semiconductor memory device and driving method thereof
892014017737606/26/14Memory and memory system including the same
902014017769606/26/14Receiver circuit with de-emphasis function
912014017906906/26/14Fabrication method of semiconductor apparatus
922014017909206/26/14Method for forming void-free polysilicon and method for fabricating semiconductor device using the same
932014017910106/26/14Semiconductor device with air gap and method for fabricating the same
942014017910206/26/14Semiconductor device with air gaps and method for fabricating the same
952014017911806/26/14Surface treatment method for semiconductor device
962014018142406/26/14Semiconductor memory system and operation method thereof
972014018145606/26/14Memory, memory controller, memory system including the memory and the memory controller, and operating method of the memory system
982014018158806/26/14Semiconductor memory apparatus and operating method thereof
992014018160406/26/14Channel control circuit and semiconductor device having the same
1002014016696306/19/14Semiconductor device and method of manufacturing the same
1012014016696406/19/14Phase-change memory device and fabrication method thereof
1022014016696506/19/14Resistive memory device and fabrication method thereof
1032014016697106/19/14Variable resistance memory device and method of manufacturing the same
1042014016703006/19/14Vertical type semiconductor device and fabrication method thereof
1052014016712906/19/14Semiconductor device and method of manufacturing the same
1062014016714906/19/14Semiconductor device and fabrication method thereof
1072014016725006/19/14Semiconductor device
1082014016727506/19/14Embedded package and method of manufacturing the same
1092014016727606/19/14Substrate for semiconductor package, semiconductor package using the substrate, and method of manufacturing the semiconductor package
1102014016728006/19/14Semiconductor device
1112014016728106/19/14Stack type semiconductor circuit with impedance calibration
1122014016729306/19/14Integrated circuit with bump connection scheme
1132014016771306/19/14Regulator and voltage generator
1142014016771906/19/14Voltage generation circuit
1152014016783906/19/14Negative voltage regulation circuit and voltage generation circuit including the same
1162014016784906/19/14Differential amplifier
1172014016905906/19/14Fuse repair device
1182014016906406/19/14Regulator, voltage generator and semiconductor memory device
1192014016906506/19/14High voltage generating circuit for resistive memory apparatus
1202014016906706/19/14Resistance memory device and memory apparatus and data processing system
1212014016909406/19/14Data transmission circuit, memory including the same, and data transmission method
1222014016909606/19/14Semiconductor memory device and operating method thereof
1232014016909706/19/14Semiconductor memory device, system having the same and program method thereof
1242014016911206/19/14Semiconductor memory system and operating method thereof
1252014016911806/19/14Address input circuit of semiconductor apparatus
1262014017081206/19/14Method and apparatus for manufacturing chip package
1272014017082806/19/14Plasma doping method and method for fabricating semiconductor device using the same
1282014017083006/19/14Variable resistance memory device and method for fabricating the same
1292014017318406/19/14Data storage device and operating method thereof
1302014017323106/19/14Semiconductor memory device and system operating method
1312014015896606/12/14Variable resistance memory device and method for fabricating the same
1322014015912706/12/14Semiconductor device and method of manufacturing the same
1332014015913106/12/14Reservoir capacitor of semiconductor device and method for fabricating the same
1342014015918406/12/14Image sensor and method for fabricating the same
1352014015919306/12/14Semiconductor device and method for fabricating the same
1362014015976506/12/14Semiconductor apparatus
1372014015977706/12/14Voltage detector and semiconductor device including the same
1382014015978906/12/14Semiconductor apparatus
1392014015979206/12/14Voltage generation circuit
1402014016083706/12/14Resistive memory device and method of manufacturing the same
1412014016083906/12/14Semiconductor intergrated circuit device, method of manufacturing the same, and method of driving the same
1422014016084606/12/14Semiconductor memory device and method of operating the same
1432014016085606/12/14Semiconductor memory device and program method thereof
1442014016086306/12/14Semiconductor device having transistor and semiconductor memory device using the same
1452014016086406/12/14Semiconductor device including current compensator
1462014016087206/12/14Voltage generation circuit, and write driver and semiconductor memory apparatus including the same
1472014016242906/12/14Semiconductor intergrated circuit device, method of manufacturing the same, and method of driving the same
1482014016244806/12/14Semiconductor device with metal gates and method for fabricating the same
1492014016245306/12/14Semiconductor device and method for fabricating the same
1502014016468206/12/14Nonvolatile memory apparatus, operating method thereof, and data processing system having the same
1512014016468306/12/14Nonvolatile memory apparatus, operating method thereof, and data processing system having the same
1522014015162706/05/14Semiconductor device and method of manufacturing the same
1532014015177906/05/14Semiconductor memory device and method of manufacturing the same
1542014015178006/05/14Nonvolatile memory device and method of fabricating the same
1552014015178406/05/14Semiconductor memory device and method of manufacturing the same
1562014015180506/05/14Method for fabricating a connection region in a semiconductor device
1572014015184206/05/14Semiconductor apparatus
1582014015235806/05/14Semiconductor apparatus and duty cycle correction method thereof
1592014015236006/05/14Phase difference quantization circuit, delay value control circuit thereof, and delay circuit
1602014015334006/05/14Method for erasing charge trap devices
1612014015334206/05/14Semiconductor integrated circuit and method for monitoring reference voltage thereof
1622014015334406/05/14Semiconductor memory device, system having the same and method for generating reference voltage for operating the same
1632014015486606/05/14Method of forming a semiconductor memory device
1642014015688206/05/14Memory device, operating method thereof, and data storage device including the same
1652014015692406/05/14Semiconductor memory device with improved operating speed and data storage device including the same
1662014015708206/05/14Data storage device and method for processing error correction code thereof
1672014014514005/29/14Variable resistance memory device
1682014014534305/29/14Semiconductor device and method for manufacturing the same
1692014014569005/29/14Internal voltage generation circuits
1702014014575405/29/14Integrated circuit and operation method thereof
1712014014576405/29/14Multi-phase clock generation circuit
1722014014576605/29/14Initialization circuit
1732014014660805/29/14Oscillator circuit with location-based charge pump enable and semiconductor memory including the same
1742014014685205/29/14Semiconductor device
1752014013860605/22/14Resistance variable memory device
1762014013868705/22/14Semiconductor device and method of manufacturing the same
1772014013876505/22/14Semiconductor device and method of manufacturing the same
1782014013876805/22/14Semiconductor integrated circuit device having reduced unit cell area and method for manufacturing the same
1792014013926905/22/14Multi-chip system and semiconductor package
1802014014001605/22/14Power metal mesh and semiconductor memory device and method including the same
1812014014012705/22/14Magnetic random access memory apparatus, methods for programming and verifying reference cells therefor
1822014014013605/22/14Semiconductor device and method of operating the same
1832014014014805/22/14Semiconductor memory device, memory system including the same and method of operating the same
1842014014015105/22/14Semiconductor memory apparatus
1852014014038505/22/14Equalizer and operating method thereof
1862014014043105/22/14Transmitter circuit, receiver circuit, and transmitting/receiving system
1872014014159305/22/14Semiconductor device and method for forming the same
1882014014349105/22/14Semiconductor apparatus and operating method thereof
1892014013860605/22/14Resistance variable memory device
1902014013868705/22/14Semiconductor device and method of manufacturing the same
1912014013876505/22/14Semiconductor device and method of manufacturing the same
1922014013876805/22/14Semiconductor integrated circuit device having reduced unit cell area and method for manufacturing the same
1932014013926905/22/14Multi-chip system and semiconductor package
1942014014001605/22/14Power metal mesh and semiconductor memory device and method including the same
1952014014012705/22/14Magnetic random access memory apparatus, methods for programming and verifying reference cells therefor
1962014014013605/22/14Semiconductor device and method of operating the same
1972014014014805/22/14Semiconductor memory device, memory system including the same and method of operating the same
1982014014015105/22/14Semiconductor memory apparatus
1992014014038505/22/14Equalizer and operating method thereof
2002014014043105/22/14Transmitter circuit, receiver circuit, and transmitting/receiving system
2012014014159305/22/14Semiconductor device and method for forming the same
2022014014349105/22/14Semiconductor apparatus and operating method thereof
2032014013178305/15/14Semiconductor device and method of manufacturing the same
2042014013178505/15/14Semiconductor device and method of manufacturing the same
2052014013233905/15/14Filtering circuit, phase identity determination circuit and delay locked loop
2062014013321405/15/14Resistive memory device and method for driving the same
2072014013324705/15/14Semiconductor memory device and method for testing the same
2082014013325605/15/14Voltage generation circuit of semiconductor memory apparatus
2092014013178305/15/14Semiconductor device and method of manufacturing the same
2102014013178505/15/14Semiconductor device and method of manufacturing the same
2112014013233905/15/14Filtering circuit, phase identity determination circuit and delay locked loop
2122014013321405/15/14Resistive memory device and method for driving the same
2132014013324705/15/14Semiconductor memory device and method for testing the same
2142014013325605/15/14Voltage generation circuit of semiconductor memory apparatus
2152014012486405/08/14Antifuse of semiconductor device and method of fabricating the same
2162014012489205/08/14Semiconductor device and method for forming the same
2172014012492105/08/14Semiconductor package
2182014012492205/08/14Bump structures in semiconductor packages and methods of fabricating the same
2192014012495305/08/14Multi-chip semiconductor apparatus
2202014012628505/08/14Semiconductor memory device and operating method thereof
2212014012629805/08/14Semiconductor memory device and method of operating the same
2222014012630105/08/14Memory device and test method thereof
2232014012630205/08/14Memory device and test method thereof
2242014012630405/08/14Memory system and operating method thereof
2252014012630805/08/14Integrated circuit and memory device
2262014012631105/08/14Refresh control circuit of semiconductor apparatus
2272014012631705/08/14E-fuse array circuit
2282014012631805/08/14Integrated circuit including e-fuse array circuit
2292014012631905/08/14Setting information storage circuit and integrated circuit chip including the same
2302014012790305/08/14Semiconductor device and method for manufacturing the same
2312014012486405/08/14Antifuse of semiconductor device and method of fabricating the same
2322014012489205/08/14Semiconductor device and method for forming the same
2332014012492105/08/14Semiconductor package
2342014012492205/08/14Bump structures in semiconductor packages and methods of fabricating the same
2352014012495305/08/14Multi-chip semiconductor apparatus
2362014012628505/08/14Semiconductor memory device and operating method thereof
2372014012629805/08/14Semiconductor memory device and method of operating the same
2382014012630105/08/14Memory device and test method thereof
2392014012630205/08/14Memory device and test method thereof
2402014012630405/08/14Memory system and operating method thereof
2412014012630805/08/14Integrated circuit and memory device
2422014012631105/08/14Refresh control circuit of semiconductor apparatus
2432014012631705/08/14E-fuse array circuit
2442014012631805/08/14Integrated circuit including e-fuse array circuit
2452014012631905/08/14Setting information storage circuit and integrated circuit chip including the same
2462014012790305/08/14Semiconductor device and method for manufacturing the same
2472014011730405/01/14Variable resistance memory device
2482014011735405/01/14Semiconductor package
2492014011743005/01/14Semiconductor package


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Sk Hynix, Inc. in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Sk Hynix, Inc. with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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