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Sk Hynix Inc_20131212

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Sk Hynix, Inc. patents


      
Recent patent applications related to Sk Hynix, Inc.. Sk Hynix, Inc. is listed as an Agent/Assignee. Note: Sk Hynix, Inc. may have other listings under different names/spellings. We're not affiliated with Sk Hynix, Inc., we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "S" | Sk Hynix, Inc.-related inventors



Sk Hynix

Method for manufacturing a semiconductor device

Search recent Press Releases: Sk Hynix, Inc.-related press releases
Count Application # Date Sk Hynix, Inc. patents (updated weekly) - BOOKMARK this page
12014020333707/24/14 new patent  Method of forming gate dielectric layer and method of fabricating semiconductor device
22014020466407/24/14 new patent  Method of driving phase change memory device capable of reducing heat disturbance
32014020468107/24/14 new patent  Semiconductor memory device and method of operating the same
42014020468207/24/14 new patent  Method and apparatus for simultaneously accessing a plurality of memory cells in a memory array to perform a read operation and/or a write operation
52014020595407/24/14 new patent  Method for forming patterns of semiconductor device by using mixed assist feature system
62014020619407/24/14 new patent  Method for manufacturing a semiconductor device
72014020804407/24/14 new patent  Semiconductor device and method of operating the same
82014020818707/24/14 new patent  Semiconductor apparatus and method of operating the same
92014019858507/17/14Semiconductor memory apparatus
102014019138907/10/14Semiconductor device and method of manufacturing the same
112014019258407/10/14Semiconductor device
122014018344007/03/14Variable resistance memory device
132014018364407/03/14Semiconductor device with high voltage transistor
142014018364907/03/14Semiconductor device having metal gate and high-k dielectric layer and method for manufacturing the same
152014018365007/03/14Cmos circuit and method for fabricating the same
162014018365107/03/14Semiconductor device with metal gate and high-k materials and method for fabricating the same
172014018368907/03/14Anti-fuse array of semiconductor device and method for forming the same
182014018372407/03/14Substrate for semiconductor package, semiconductor package using the same, and manufacturing method thereof
192014018423907/03/14Semiconductor device with fuse sensing circuit
202014018429307/03/14Pulse signal generation circuit and operating method thereof
212014018429407/03/14Duty cycle correction circuit and operation method thereof
222014018535307/03/14Memory
232014018535607/03/14Semiconductor integrated circuit and method of driving the same
242014018537007/03/14Nonvolatile memory apparatus having magnetoresistive memory elements and method for driving the same
252014018538107/03/14Semiconductor apparatus and method of operating the same
262014018538707/03/14Semiconductor memory device and method of operating the same
272014018539607/03/14Semiconductor memory, memory system, and operation method thereof
282014018539907/03/14Test mediation device and system and method for testing memory device
292014018703007/03/14Semiconductor device with dual work function gate stacks and method for fabricating the same
302014018703107/03/14Semiconductor device with recess gate and method for fabricating the same
312014018703707/03/14Semiconductor device with self-aligned air gap and method for fabricating the same
322014018925707/03/14Semiconductor memory device
332014018925807/03/14Semiconductor memory device
342014018928307/03/14Semiconductor memory device and operating method for the same
352014018940707/03/14Data storage device and method for operating the same
362014017536806/26/14Phase-change random access memory device and method of manufacturing the same
372014017543906/26/14Semiconductor integrated circuit and multi-chip package including the same
382014017552906/26/14Nonvolatile memory device and method for fabricating the same
392014017553306/26/14Nonvolatile memory device and method for fabricating the same
402014017553706/26/14Semiconductor apparatus and fabrication method thereof
412014017553806/26/14Semiconductor apparatus and fabrication method thereof
422014017555506/26/14Semiconductor devices having buried metal silicide layers and methods of fabricating the same
432014017558606/26/14Image sensor and method for fabricating the same
442014017560506/26/14Semiconductor chip and semiconductor apparatus with embedded capacitor
452014017563806/26/14Semiconductor packages including semiconductor chips having protrusions and methods of fabricating the same
462014017566006/26/14Stack packages having token ring loops
472014017566706/26/14Semiconductor integrated circuit and semiconductor system with the same
482014017566806/26/14Semiconductor integrated circuit
492014017568006/26/14Electrical characteristics of package substrates and semiconductor packages including the same
502014017610106/26/14Internal voltage generation circuits
512014017616706/26/14Semiconductor apparatus
522014017616806/26/14Semiconductor apparatus
532014017619106/26/14Comparator circuit and signal comparison method
542014017619206/26/14Semiconductor device
552014017619706/26/14Semiconductor device and operating method thereof
562014017620606/26/14Delay locked loop and semiconductor apparatus
572014017620706/26/14Semiconductor apparatus
582014017620906/26/14Clock generation circuit and clock generation system using the same
592014017621406/26/14Phase splitter
602014017626006/26/14Signal transmission circuit
612014017731306/26/14Semiconductor device and method of operation
622014017731406/26/14Semiconductor memory devices and semiconductor system having parameters, and methods of testing the same
632014017733106/26/14Semiconductor device and method for forming the same
642014017733206/26/14Operating circuit controlling device, semiconductor memory device and method of operating the same
652014017733606/26/14Non-volatile memory device and method of fabricating the same
662014017735306/26/14Nonvolatile memory apparatus
672014017735506/26/14Nonvolatile memory apparatus
682014017736006/26/14Device and method for controlling self-refresh
692014017736406/26/14One-time programmable memory and test method thereof
702014017736506/26/14Semiconductor apparatus, test method using the same and muti chips system
712014017736606/26/14Data input/output circuit and semiconductor memory device including the same
722014017736806/26/14Nonvolatile memory apparatus
732014017737406/26/14Driver of semiconductor memory device and driving method thereof
742014017737606/26/14Memory and memory system including the same
752014017769606/26/14Receiver circuit with de-emphasis function
762014017906906/26/14Fabrication method of semiconductor apparatus
772014017909206/26/14Method for forming void-free polysilicon and method for fabricating semiconductor device using the same
782014017910106/26/14Semiconductor device with air gap and method for fabricating the same
792014017910206/26/14Semiconductor device with air gaps and method for fabricating the same
802014017911806/26/14Surface treatment method for semiconductor device
812014018142406/26/14Semiconductor memory system and operation method thereof
822014018145606/26/14Memory, memory controller, memory system including the memory and the memory controller, and operating method of the memory system
832014018158806/26/14Semiconductor memory apparatus and operating method thereof
842014018160406/26/14Channel control circuit and semiconductor device having the same
852014016696306/19/14Semiconductor device and method of manufacturing the same
862014016696406/19/14Phase-change memory device and fabrication method thereof
872014016696506/19/14Resistive memory device and fabrication method thereof
882014016697106/19/14Variable resistance memory device and method of manufacturing the same
892014016703006/19/14Vertical type semiconductor device and fabrication method thereof
902014016712906/19/14Semiconductor device and method of manufacturing the same
912014016714906/19/14Semiconductor device and fabrication method thereof
922014016725006/19/14Semiconductor device
932014016727506/19/14Embedded package and method of manufacturing the same
942014016727606/19/14Substrate for semiconductor package, semiconductor package using the substrate, and method of manufacturing the semiconductor package
952014016728006/19/14Semiconductor device
962014016728106/19/14Stack type semiconductor circuit with impedance calibration
972014016729306/19/14Integrated circuit with bump connection scheme
982014016771306/19/14Regulator and voltage generator
992014016771906/19/14Voltage generation circuit
1002014016783906/19/14Negative voltage regulation circuit and voltage generation circuit including the same
1012014016784906/19/14Differential amplifier
1022014016905906/19/14Fuse repair device
1032014016906406/19/14Regulator, voltage generator and semiconductor memory device
1042014016906506/19/14High voltage generating circuit for resistive memory apparatus
1052014016906706/19/14Resistance memory device and memory apparatus and data processing system
1062014016909406/19/14Data transmission circuit, memory including the same, and data transmission method
1072014016909606/19/14Semiconductor memory device and operating method thereof
1082014016909706/19/14Semiconductor memory device, system having the same and program method thereof
1092014016911206/19/14Semiconductor memory system and operating method thereof
1102014016911806/19/14Address input circuit of semiconductor apparatus
1112014017081206/19/14Method and apparatus for manufacturing chip package
1122014017082806/19/14Plasma doping method and method for fabricating semiconductor device using the same
1132014017083006/19/14Variable resistance memory device and method for fabricating the same
1142014017318406/19/14Data storage device and operating method thereof
1152014017323106/19/14Semiconductor memory device and system operating method
1162014015896606/12/14Variable resistance memory device and method for fabricating the same
1172014015912706/12/14Semiconductor device and method of manufacturing the same
1182014015913106/12/14Reservoir capacitor of semiconductor device and method for fabricating the same
1192014015918406/12/14Image sensor and method for fabricating the same
1202014015919306/12/14Semiconductor device and method for fabricating the same
1212014015976506/12/14Semiconductor apparatus
1222014015977706/12/14Voltage detector and semiconductor device including the same
1232014015978906/12/14Semiconductor apparatus
1242014015979206/12/14Voltage generation circuit
1252014016083706/12/14Resistive memory device and method of manufacturing the same
1262014016083906/12/14Semiconductor intergrated circuit device, method of manufacturing the same, and method of driving the same
1272014016084606/12/14Semiconductor memory device and method of operating the same
1282014016085606/12/14Semiconductor memory device and program method thereof
1292014016086306/12/14Semiconductor device having transistor and semiconductor memory device using the same
1302014016086406/12/14Semiconductor device including current compensator
1312014016087206/12/14Voltage generation circuit, and write driver and semiconductor memory apparatus including the same
1322014016242906/12/14Semiconductor intergrated circuit device, method of manufacturing the same, and method of driving the same
1332014016244806/12/14Semiconductor device with metal gates and method for fabricating the same
1342014016245306/12/14Semiconductor device and method for fabricating the same
1352014016468206/12/14Nonvolatile memory apparatus, operating method thereof, and data processing system having the same
1362014016468306/12/14Nonvolatile memory apparatus, operating method thereof, and data processing system having the same
1372014015162706/05/14Semiconductor device and method of manufacturing the same
1382014015177906/05/14Semiconductor memory device and method of manufacturing the same
1392014015178006/05/14Nonvolatile memory device and method of fabricating the same
1402014015178406/05/14Semiconductor memory device and method of manufacturing the same
1412014015180506/05/14Method for fabricating a connection region in a semiconductor device
1422014015184206/05/14Semiconductor apparatus
1432014015235806/05/14Semiconductor apparatus and duty cycle correction method thereof
1442014015236006/05/14Phase difference quantization circuit, delay value control circuit thereof, and delay circuit
1452014015334006/05/14Method for erasing charge trap devices
1462014015334206/05/14Semiconductor integrated circuit and method for monitoring reference voltage thereof
1472014015334406/05/14Semiconductor memory device, system having the same and method for generating reference voltage for operating the same
1482014015486606/05/14Method of forming a semiconductor memory device
1492014015688206/05/14Memory device, operating method thereof, and data storage device including the same
1502014015692406/05/14Semiconductor memory device with improved operating speed and data storage device including the same
1512014015708206/05/14Data storage device and method for processing error correction code thereof
1522014014514005/29/14Variable resistance memory device
1532014014534305/29/14Semiconductor device and method for manufacturing the same
1542014014569005/29/14Internal voltage generation circuits
1552014014575405/29/14Integrated circuit and operation method thereof
1562014014576405/29/14Multi-phase clock generation circuit
1572014014576605/29/14Initialization circuit
1582014014660805/29/14Oscillator circuit with location-based charge pump enable and semiconductor memory including the same
1592014014685205/29/14Semiconductor device
1602014013860605/22/14Resistance variable memory device
1612014013868705/22/14Semiconductor device and method of manufacturing the same
1622014013876505/22/14Semiconductor device and method of manufacturing the same
1632014013876805/22/14Semiconductor integrated circuit device having reduced unit cell area and method for manufacturing the same
1642014013926905/22/14Multi-chip system and semiconductor package
1652014014001605/22/14Power metal mesh and semiconductor memory device and method including the same
1662014014012705/22/14Magnetic random access memory apparatus, methods for programming and verifying reference cells therefor
1672014014013605/22/14Semiconductor device and method of operating the same
1682014014014805/22/14Semiconductor memory device, memory system including the same and method of operating the same
1692014014015105/22/14Semiconductor memory apparatus
1702014014038505/22/14Equalizer and operating method thereof
1712014014043105/22/14Transmitter circuit, receiver circuit, and transmitting/receiving system
1722014014159305/22/14Semiconductor device and method for forming the same
1732014014349105/22/14Semiconductor apparatus and operating method thereof
1742014013860605/22/14Resistance variable memory device
1752014013868705/22/14Semiconductor device and method of manufacturing the same
1762014013876505/22/14Semiconductor device and method of manufacturing the same
1772014013876805/22/14Semiconductor integrated circuit device having reduced unit cell area and method for manufacturing the same
1782014013926905/22/14Multi-chip system and semiconductor package
1792014014001605/22/14Power metal mesh and semiconductor memory device and method including the same
1802014014012705/22/14Magnetic random access memory apparatus, methods for programming and verifying reference cells therefor
1812014014013605/22/14Semiconductor device and method of operating the same
1822014014014805/22/14Semiconductor memory device, memory system including the same and method of operating the same
1832014014015105/22/14Semiconductor memory apparatus
1842014014038505/22/14Equalizer and operating method thereof
1852014014043105/22/14Transmitter circuit, receiver circuit, and transmitting/receiving system
1862014014159305/22/14Semiconductor device and method for forming the same
1872014014349105/22/14Semiconductor apparatus and operating method thereof
1882014013178305/15/14Semiconductor device and method of manufacturing the same
1892014013178505/15/14Semiconductor device and method of manufacturing the same
1902014013233905/15/14Filtering circuit, phase identity determination circuit and delay locked loop
1912014013321405/15/14Resistive memory device and method for driving the same
1922014013324705/15/14Semiconductor memory device and method for testing the same
1932014013325605/15/14Voltage generation circuit of semiconductor memory apparatus
1942014013178305/15/14Semiconductor device and method of manufacturing the same
1952014013178505/15/14Semiconductor device and method of manufacturing the same
1962014013233905/15/14Filtering circuit, phase identity determination circuit and delay locked loop
1972014013321405/15/14Resistive memory device and method for driving the same
1982014013324705/15/14Semiconductor memory device and method for testing the same
1992014013325605/15/14Voltage generation circuit of semiconductor memory apparatus
2002014012486405/08/14Antifuse of semiconductor device and method of fabricating the same
2012014012489205/08/14Semiconductor device and method for forming the same
2022014012492105/08/14Semiconductor package
2032014012492205/08/14Bump structures in semiconductor packages and methods of fabricating the same
2042014012495305/08/14Multi-chip semiconductor apparatus
2052014012628505/08/14Semiconductor memory device and operating method thereof
2062014012629805/08/14Semiconductor memory device and method of operating the same
2072014012630105/08/14Memory device and test method thereof
2082014012630205/08/14Memory device and test method thereof
2092014012630405/08/14Memory system and operating method thereof
2102014012630805/08/14Integrated circuit and memory device
2112014012631105/08/14Refresh control circuit of semiconductor apparatus
2122014012631705/08/14E-fuse array circuit
2132014012631805/08/14Integrated circuit including e-fuse array circuit
2142014012631905/08/14Setting information storage circuit and integrated circuit chip including the same
2152014012790305/08/14Semiconductor device and method for manufacturing the same
2162014012486405/08/14Antifuse of semiconductor device and method of fabricating the same
2172014012489205/08/14Semiconductor device and method for forming the same
2182014012492105/08/14Semiconductor package
2192014012492205/08/14Bump structures in semiconductor packages and methods of fabricating the same
2202014012495305/08/14Multi-chip semiconductor apparatus
2212014012628505/08/14Semiconductor memory device and operating method thereof
2222014012629805/08/14Semiconductor memory device and method of operating the same
2232014012630105/08/14Memory device and test method thereof
2242014012630205/08/14Memory device and test method thereof
2252014012630405/08/14Memory system and operating method thereof
2262014012630805/08/14Integrated circuit and memory device
2272014012631105/08/14Refresh control circuit of semiconductor apparatus
2282014012631705/08/14E-fuse array circuit
2292014012631805/08/14Integrated circuit including e-fuse array circuit
2302014012631905/08/14Setting information storage circuit and integrated circuit chip including the same
2312014012790305/08/14Semiconductor device and method for manufacturing the same
2322014011730405/01/14Variable resistance memory device
2332014011735405/01/14Semiconductor package
2342014011743005/01/14Semiconductor package
2352014011743205/01/14Nonvolatile memory device, method for fabricating the same, and method for operating the same
2362014012071005/01/14Semiconductor device with buried gate and method for fabricating the same
2372014011730405/01/14Variable resistance memory device
2382014011735405/01/14Semiconductor package
2392014011743005/01/14Semiconductor package
2402014011743205/01/14Nonvolatile memory device, method for fabricating the same, and method for operating the same
2412014012071005/01/14Semiconductor device with buried gate and method for fabricating the same
2422014011077304/24/14Semiconductor device including line-type active region and method for manufacturing the same
2432014011077404/24/14Semiconductor device and method of manufacturing the same
2442014011078104/24/14Semiconductor device with buried bit line and method for fabricating the same
2452014011079504/24/14Semiconductor device and method of manufacturing the same
2462014011125104/24/14Semiconductor device
2472014011125404/24/14Integrated circuit chip and system having the same
2482014011125504/24/14Integrated circuit chip and system having the same
2492014011125604/24/14Deserializers


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Sk Hynix, Inc. in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Sk Hynix, Inc. with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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