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Sk Hynix Inc
Sk Hynix Inc_20131212

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Sk Hynix, Inc. patents


      
Recent patent applications related to Sk Hynix, Inc.. Sk Hynix, Inc. is listed as an Agent/Assignee. Note: Sk Hynix, Inc. may have other listings under different names/spellings. We're not affiliated with Sk Hynix, Inc., we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "S" | Sk Hynix, Inc.-related inventors



Digital counter

Sk Hynix

Digital counter

Semiconductor memory device and method of operating the same

Sk Hynix

Semiconductor memory device and method of operating the same

Semiconductor memory device and method of operating the same

Sk Hynix

Counting device for reducing power consumption in binning mode and method therefor

Search recent Press Releases: Sk Hynix, Inc.-related press releases
Count Application # Date Sk Hynix, Inc. patents (updated weekly) - BOOKMARK this page
12014033948811/20/14 new patent  Semiconductor device and method for fabricating the same, and microprocessor, processor, system, data storage system and memory system including the semiconductor device
22014034055111/20/14 new patent  Counting device for reducing power consumption in binning mode and method therefor
32014034096611/20/14 new patent  Semiconductor memory device and method of operating the same
42014034096811/20/14 new patent  Semiconductor integrated circuit
52014034096911/20/14 new patent  Semiconductor apparatus
62014034097111/20/14 new patent  Semiconductor circuit and leakage current test system
72014034133211/20/14 new patent  Digital counter
82014034251911/20/14 new patent  Three-dimensional non-volatile memory device, memory system and method of manufacturing the same
92014034255011/20/14 new patent  Method for fabricating semiconductor device by damascene process
102014034450511/20/14 new patent  Semiconductor device and method of operating the same
112014034461311/20/14 new patent  Semiconductor apparatus and memory system
122014034465411/20/14 new patent  Semiconductor system
132014033757411/13/14Memory system, semiconductor memory device and operating method thereof
142014033287011/13/14Spin transistor, and semiconductor device, memory device, microprocessor, processor, system, data storage system and memory system including the spin transistor
152014033287211/13/14Semiconductor device and method for forming the same
162014033287311/13/14Semiconductor device
172014033297711/13/14Semiconductor device
182014033423011/13/14Semiconductor memory device and system having the same
192014033756811/13/14Electronic device and method for operating the same
202014032640811/06/14Mask pattern for hole patterning and method for fabricating semiconductor device using the same
212014032708511/06/14Variable resistance device having parallel structure
222014032714711/06/14Semiconductor device and method for fabricating the same
232014032810411/06/14Semiconductor device
242014032813011/06/14Integrated circuit with bump connection scheme
252014031944510/30/14Resistive memory device and fabrication method thereof
262014031945110/30/14Memory cell array and variable resistive memory device including the same
272014031959510/30/14Nonvolatile memory device and method for fabricating the same
282014031964710/30/14Semiconductor integrated circuit having differential amplifier and method of arranging the same
292014032015610/30/14Apparatus for detecting misalignment of test pad
302014032101710/30/14Semiconductor integrated circuit
312014032119310/30/143d variable resistance memory device and method of manufacturing the same
322014032121910/30/14Semiconductor device
332014032122010/30/14Semiconductor memory apparatus and method of controlling external voltage using the same
342014032282910/30/14Semicondcutor device and method for fabricating the same
352014032287610/30/14Nonvolatile memory device and method for fabricating the same
362014032288610/30/14Resistive memory device and fabrication method thereof
372014032291510/30/14Semiconductor device having hard mask structure and fine pattern and forming method thereof
382014032512010/30/14Resistive memory device and operation method thereof
392014031229410/23/14Semiconductor device and method for fabricating the same, and microprocessor, processor, system, data storage system and memory system including the semiconductor device
402014031240510/23/14Nonvolatile memory device and method for fabricating the same
412014031241010/23/14Nonvolatile memory device and method for fabricating the same
422014031293010/23/14Semiconductor device, semiconductor system including the semiconductor device, and method for driving the semiconductor system
432014031293810/23/14Frequency multiplier
442014031294010/23/14Semiconductor device with clock-based signal input circuit
452014031295310/23/14Equalizer circuit and receiver circuit including the same
462014031296010/23/14Semiconductor device and operating method thereof
472014031297110/23/14Differential amplifier circuit
482014031380910/23/14Semiconductor apparatus
492014031381210/23/14Semiconductor device, and microprocessor, processor, system, data storage system and memory system including the semiconductor device
502014031384010/23/14Integrated circuit and memory device
512014031384110/23/14Integrated circuit with programmable storage cell array and boot-up operation method thereof
522014031384210/23/14E-fuse array circuit
532014031384510/23/14Semiconductor chip, semiconductor integrated circuit including the semiconductor chip, semiconductor system including the semiconductor integrated circuit and method of driving the semiconductor system
542014031733210/23/14Semiconductor device for performing test and repair operations
552014031733810/23/14Memory device and memory system including the same, and operation method of memory device
562014031734410/23/14Semiconductor device
572014031746810/23/14Encoder, decoder and semiconductor device including the same
582014031747210/23/14Encoder, decoder and semiconductor device including the same
592014030627810/16/14Semiconductor device with buried bit line and method for fabricating the same
602014030628710/16/14Semiconductor device and fabrication method thereof
612014030635110/16/14Semiconductor device with air gap and method of fabricating the same
622014030673810/16/14Input/output line driver circuit
632014030674710/16/14Semiconductor integrated circuit having voltage stabilizing circuit
642014030674810/16/14Multi-chip package
652014030749810/16/14Semiconductor memory device including flag cells
662014030878610/16/14High-integration semiconductor memory device and method of manufacturing the same
672014030879410/16/14Semiconductor device with air gap and method for fabricating the same
682014030879610/16/14Method for fabricating a semiconductor device
692014029983110/09/143d variable resistance memory device and method of manufacturing the same
702014029991810/09/14Semiconductor substrate and fabrication method thereof, and semiconductor apparatus using the same and fabrication method thereof
712014029993010/09/14Nonvolatile memory device
722014029995010/09/14Electronic devices having semiconductor memory units
732014029995210/09/14Magnetic tunnel junction device and method for fabricating the same
742014029998910/09/14Semiconductor device with air gap and method for fabricating the same
752014030039210/09/14Signal receiver circuit
762014030112710/09/14Semiconductor device and electronic device including the same
772014030112810/09/143d variable resistance memory device having junction fet and driving method thereof
782014030114810/09/14Semiconductor memory apparatus and operation method using the same
792014030115010/09/14Memory device and operating method of memory device and memory system
802014030265510/09/14Non-volatile memory device with vertical memory cells and method for fabricating the same
812014030266310/09/14Semiconductor device with isolation layer, electronic device having the same, and method for fabricating the same
822014029183710/02/14Embedded package and method for manufacturing the same
832014029185510/02/14Semiconductor device and semiconductor system including the same
842014029239010/02/14Data transmission circuits and system having the same
852014029239710/02/14Internal voltage generation circuits
862014029255010/02/14Analog-to-digital conversion circuit, analog-to-digital conversion method, and image sensor
872014029367210/02/14Electronic device
882014029367710/02/14Electronic device and method for fabricating the same
892014029368410/02/14Nonvolatile memory apparatus
902014029370810/02/14Nonvolatile memory devices and methods of operating the same
912014029370910/02/14Single-layer gate eeprom cell, cell array including the same, and method of operating the cell array
922014029792510/02/14Storage device with self-contained information storage space
932014029798610/02/14Semiconductor memory devices and semiconductor systems including the same
942014029807110/02/14Semiconductor devices and semiconductor systems including the same
952014029814710/02/14Data transferring systems, data receivers and methods of transferring data using the same
962014028479509/25/14Semiconductor package and method for manufacturing the same
972014028609009/25/14Semiconductor integrated circuit system and method for driving the same
982014028753509/25/14Electronic device and method for fabricating the same
992014026457009/18/14Semiconductor device and method for forming the same
1002014026483309/18/14Semiconductor package and method for fabricating the same
1012014026484809/18/14Semiconductor package and method for fabricating the same
1022014026899609/18/14Variable resistance memory device and method of driving the same
1032014026900509/18/14Electronic devices having semiconductor memory units and method for fabricating the same
1042014026903909/18/14Electronic device and variable resistance element
1052014026913809/18/14Semiconductor memory device for reducing standby current
1062014028123109/18/14Electronic device and method for fabricating the same
1072014025245809/11/14Semiconductor device having vertical channel transistor and method for fabricating the same
1082014025265209/11/14Bonding structure of semiconductor package, method for fabricating the same, and stack-type semiconductor package
1092014025423909/11/14Electronic device comprising a semiconductor memory unit
1102014025424309/11/14Electronic device and method for fabricating the same
1112014025425609/11/14Vertical type semiconductor device, fabrication method thereof and operation method thereof
1122014025428109/11/143d non-volatile memory device and method for operating and fabricating the same
1132014025428709/11/14Semiconductor integrated circuit capable of controlling read command
1142014025610309/11/14Method for fabricating electronic devices having semiconductor memory unit
1152014025612509/11/14Semiconductor device and method for fabricating the same
1162014025862609/11/14Electronic devices having semiconductor memory unit
1172014025876709/11/14Semiconductor device and semiconductor system including the same
1182014024674209/04/14Semiconductor device
1192014024764709/04/14Electronic device and method for fabricating the same
1202014024764809/04/14Electronic device
1212014024875009/04/14Vertical type semiconductor device and fabrication method thereof
1222014024876509/04/14Semiconductor memory device having dummy conductive patterns on interconnection and fabrication method thereof
1232014025024409/04/14Electronic devices having semiconductor magnetic memory units
1242014023924708/28/14Transistor, resistance variable memory device including the same, and manufacturing method thereof
1252014024103908/28/14Electronic device and method for operating the same
1262014024104008/28/14Electronic device
1272014024104108/28/14Reference column of semiconductor memory, and electronic device including the same
1282014024104208/28/14Electronic device and method for operating the same
1292014024104308/28/14Electronic device and method for operating electronic device
1302014024107908/28/14Chip die and semiconductor memory device including the same
1312014024275808/28/14Wafer and method for forming the same
1322014024276508/28/143-dimensional non-volatile memory device including a selection gate having an l shape
1332014024277208/28/14Method for fabricating semiconductor device
1342014024277308/28/14Phase change memory device having self-aligned bottom electrode and fabrication method thereof
1352014024493008/28/14Electronic devices having semiconductor magnetic memory units
1362014024493108/28/14Electronic device
1372014024494508/28/14Electronic device and method for operating electronic device
1382014023194208/21/14Semiconductor device and method for fabricating the same
1392014023201408/21/14Semiconductor device with buried bit line and method for fabricating the same
1402014022641908/14/14Semiconductor apparatus
1412014022642208/14/14Semiconductor memory device and method of testing the same
1422014022763508/14/14Reflection type blank masks, methods of fabricating the same, and methods of fabricating reflection type photo masks using the same
1432014022784008/14/143d non-volatile memory device and method for fabricating the same
1442014022785108/14/14Semiconductor device and method for manufacturing the same
1452014021754508/07/14Semiconductor device and method for fabricating the same
1462014021810108/07/14Period signal generation circuits
1472014021899508/07/14Semiconductor chips
1482014021904008/07/14Semiconductor memory device including bulk voltage generation circuit
1492014020984707/31/14Phase-change memory device having multiple diodes
1502014020990707/31/14Semiconductor apparatus and stacked semiconductor apparatus for checking formation and connection of through silicon via
1512014020990907/31/14Semiconductor device
1522014021005807/31/14Semiconductor device and method of fabricating the same
1532014020333707/24/14Method of forming gate dielectric layer and method of fabricating semiconductor device
1542014020466407/24/14Method of driving phase change memory device capable of reducing heat disturbance
1552014020468107/24/14Semiconductor memory device and method of operating the same
1562014020468207/24/14Simultaneously accessing a plurality of memory cells in a memory array to perform a read operation and/or a write operation
1572014020595407/24/14Method for forming patterns of semiconductor device by using mixed assist feature system
1582014020619407/24/14Method for manufacturing a semiconductor device
1592014020804407/24/14Semiconductor device and method of operating the same
1602014020818707/24/14Semiconductor apparatus and method of operating the same
1612014019858507/17/14Semiconductor memory apparatus
1622014019138907/10/14Semiconductor device and method of manufacturing the same
1632014019258407/10/14Semiconductor device
1642014018344007/03/14Variable resistance memory device
1652014018364407/03/14Semiconductor device with high voltage transistor
1662014018364907/03/14Semiconductor device having metal gate and high-k dielectric layer and method for manufacturing the same
1672014018365007/03/14Cmos circuit and method for fabricating the same
1682014018365107/03/14Semiconductor device with metal gate and high-k materials and method for fabricating the same
1692014018368907/03/14Anti-fuse array of semiconductor device and method for forming the same
1702014018372407/03/14Substrate for semiconductor package, semiconductor package using the same, and manufacturing method thereof
1712014018423907/03/14Semiconductor device with fuse sensing circuit
1722014018429307/03/14Pulse signal generation circuit and operating method thereof
1732014018429407/03/14Duty cycle correction circuit and operation method thereof
1742014018535307/03/14Memory
1752014018535607/03/14Semiconductor integrated circuit and method of driving the same
1762014018537007/03/14Nonvolatile memory apparatus having magnetoresistive memory elements and method for driving the same
1772014018538107/03/14Semiconductor apparatus and method of operating the same
1782014018538707/03/14Semiconductor memory device and method of operating the same
1792014018539607/03/14Semiconductor memory, memory system, and operation method thereof
1802014018539907/03/14Test mediation device and system and method for testing memory device
1812014018703007/03/14Semiconductor device with dual work function gate stacks and method for fabricating the same
1822014018703107/03/14Semiconductor device with recess gate and method for fabricating the same
1832014018703707/03/14Semiconductor device with self-aligned air gap and method for fabricating the same
1842014018925707/03/14Semiconductor memory device
1852014018925807/03/14Semiconductor memory device
1862014018928307/03/14Semiconductor memory device and operating method for the same
1872014018940707/03/14Data storage device and method for operating the same
1882014017536806/26/14Phase-change random access memory device and method of manufacturing the same
1892014017543906/26/14Semiconductor integrated circuit and multi-chip package including the same
1902014017552906/26/14Nonvolatile memory device and method for fabricating the same
1912014017553306/26/14Nonvolatile memory device and method for fabricating the same
1922014017553706/26/14Semiconductor apparatus and fabrication method thereof
1932014017553806/26/14Semiconductor apparatus and fabrication method thereof
1942014017555506/26/14Semiconductor devices having buried metal silicide layers and methods of fabricating the same
1952014017558606/26/14Image sensor and method for fabricating the same
1962014017560506/26/14Semiconductor chip and semiconductor apparatus with embedded capacitor
1972014017563806/26/14Semiconductor packages including semiconductor chips having protrusions and methods of fabricating the same
1982014017566006/26/14Stack packages having token ring loops
1992014017566706/26/14Semiconductor integrated circuit and semiconductor system with the same
2002014017566806/26/14Semiconductor integrated circuit
2012014017568006/26/14Electrical characteristics of package substrates and semiconductor packages including the same
2022014017610106/26/14Internal voltage generation circuits
2032014017616706/26/14Semiconductor apparatus
2042014017616806/26/14Semiconductor apparatus
2052014017619106/26/14Comparator circuit and signal comparison method
2062014017619206/26/14Semiconductor device
2072014017619706/26/14Semiconductor device and operating method thereof
2082014017620606/26/14Delay locked loop and semiconductor apparatus
2092014017620706/26/14Semiconductor apparatus
2102014017620906/26/14Clock generation circuit and clock generation system using the same
2112014017621406/26/14Phase splitter
2122014017626006/26/14Signal transmission circuit
2132014017731306/26/14Semiconductor device and method of operation
2142014017731406/26/14Semiconductor memory devices and semiconductor system having parameters, and methods of testing the same
2152014017733106/26/14Semiconductor device and method for forming the same
2162014017733206/26/14Operating circuit controlling device, semiconductor memory device and method of operating the same
2172014017733606/26/14Non-volatile memory device and method of fabricating the same
2182014017735306/26/14Nonvolatile memory apparatus
2192014017735506/26/14Nonvolatile memory apparatus
2202014017736006/26/14Device and method for controlling self-refresh
2212014017736406/26/14One-time programmable memory and test method thereof
2222014017736506/26/14Semiconductor apparatus, test method using the same and muti chips system
2232014017736606/26/14Data input/output circuit and semiconductor memory device including the same
2242014017736806/26/14Nonvolatile memory apparatus
2252014017737406/26/14Driver of semiconductor memory device and driving method thereof
2262014017737606/26/14Memory and memory system including the same
2272014017769606/26/14Receiver circuit with de-emphasis function
2282014017906906/26/14Fabrication method of semiconductor apparatus
2292014017909206/26/14Method for forming void-free polysilicon and method for fabricating semiconductor device using the same
2302014017910106/26/14Semiconductor device with air gap and method for fabricating the same
2312014017910206/26/14Semiconductor device with air gaps and method for fabricating the same
2322014017911806/26/14Surface treatment method for semiconductor device
2332014018142406/26/14Semiconductor memory system and operation method thereof
2342014018145606/26/14Memory, memory controller, memory system including the memory and the memory controller, and operating method of the memory system
2352014018158806/26/14Semiconductor memory apparatus and operating method thereof
2362014018160406/26/14Channel control circuit and semiconductor device having the same
2372014016696306/19/14Semiconductor device and method of manufacturing the same
2382014016696406/19/14Phase-change memory device and fabrication method thereof
2392014016696506/19/14Resistive memory device and fabrication method thereof
2402014016697106/19/14Variable resistance memory device and method of manufacturing the same
2412014016703006/19/14Vertical type semiconductor device and fabrication method thereof
2422014016712906/19/14Semiconductor device and method of manufacturing the same
2432014016714906/19/14Semiconductor device and fabrication method thereof
2442014016725006/19/14Semiconductor device
2452014016727506/19/14Embedded package and method of manufacturing the same
2462014016727606/19/14Substrate for semiconductor package, semiconductor package using the substrate, and method of manufacturing the semiconductor package
2472014016728006/19/14Semiconductor device
2482014016728106/19/14Stack type semiconductor circuit with impedance calibration
2492014016729306/19/14Integrated circuit with bump connection scheme


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Sk Hynix, Inc. in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Sk Hynix, Inc. with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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