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Sk Hynix Inc
Sk Hynix Inc_20131212

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Sk Hynix Inc patents


      
Recent patent applications related to Sk Hynix Inc. Sk Hynix Inc is listed as an Agent/Assignee. Note: Sk Hynix Inc may have other listings under different names/spellings. We're not affiliated with Sk Hynix Inc, we're just tracking patents.

ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "S" | Sk Hynix Inc-related inventors




Search recent Press Releases: Sk Hynix Inc-related press releases
Count Application # Date Sk Hynix Inc patents (updated weekly) - BOOKMARK this page
12016016994406/16/16 Electronic apparatus
22016017043206/16/16 Reference voltage generator
32016017064806/16/16 Data storage device and operating method thereof
42016017089806/16/16 Controller including map table, memory system including semiconductor memory device, and operating the same
52016017201206/16/16 Semiconductor memory device and operating method thereof
62016017203906/16/16 Semiconductor memory device and operating the same
72016017204206/16/16 Semiconductor device and operating the same
82016017204306/16/16 Semiconductor device and operating the same
92016017204706/16/16 Semiconductor device and operating method thereof
102016017204806/16/16 Semiconductor memory device
112016017204906/16/16 Semiconductor device and operating the same
122016017205006/16/16 Semiconductor memory device and operating method thereof
132016017205606/16/16 Semiconductor device
142016017230406/16/16 Semiconductor device including air gaps and fabricating the same
152016017233106/16/16 Semiconductor package including a plurality of stacked chips
162016017236406/16/16 Semiconductor device and forming the same
172016017237106/16/16 Semiconductor device and manufacturing the same
182016017237406/16/16 Three-dimensional nonvolatile memory device
192016017239306/16/16 Curved image sensor, fabricating the same, and electronic device having the same
202016017239806/16/16 Image sensor and fabricating the same
212016017243306/16/16 Surface treatment semiconductor device
222016017248806/16/16 Semiconductor device having dual work function gate structure, fabricating the same, transistor circuit having the same, memory cell having the same, and electronic device having the same
232016017327006/16/16 Semiconductor apparatus and system
242016017383506/16/16 Color filter array and image sensor having the same
252016016196806/09/16 Semiconductor apparatus including multichip package
262016016196906/09/16 Semiconductor device
272016016219106/09/16 Operation apparatus module
282016016220006/09/16 Memory controller
292016016230006/09/16 Semiconductor device and driving the same
302016016235106/09/16 Parity check circuit and memory device including the same
312016016335906/09/16 Data sense amplifier and memory device including the same
322016016336006/09/16 Latch circuit and latch circuit array including the same
332016016336106/09/16 Data output circuit
342016016336206/09/16 Input circuit of semiconductor apparatus and semiconductor system using the same
352016016336306/09/16 Semiconductor memory apparatus and input buffer therefor
362016016336406/09/16 Semiconductor memory device
372016016336506/09/16 Semiconductor device
382016016336706/09/16 Semiconductor memory apparatus
392016016336806/09/16 Address comparator circuit, memory device and memory system including the same
402016016337206/09/16 Semiconductor memory device and refresh control method thereof
412016016337506/09/16 Memory device
422016016338106/09/16 Memory system including semiconductor memory device and operating the same
432016016339006/09/16 Semiconductor device
442016016339406/09/16 Semiconductor memory reading data from the same
452016016359406/09/16 Method for forming void-free polysilicon and fabricating semiconductor device using the same
462016016360706/09/16 Semiconductor device, semiconductor system and testing semiconductor device
472016016361906/09/16 Semiconductor chip and stack type semiconductor apparatus using the same
482016016367806/09/16 Semiconductor apparatus having electrical connections with through-via and a metal layer and stacking method thereof
492016016373406/09/16 Three-dimensional nonvolatile memory device, semiconductor system including the same, and manufacturing the same
502016016445906/09/16 Oscillator and semiconductor device including the same
512016016446506/09/16 Buffer circuit capable of improving amplification performance
522016016449906/09/16 Signal input circuit and operating method thereof
532016016450106/09/16 Semiconductor apparatus
542016016450406/09/16 Latch circuit
552016016451306/09/16 Voltage generation apparatus
562016016452106/09/16 Semiconductor device
572016016466606/09/16 Clock and data recovery circuit and system using the same
582016016466706/09/16 Clock and data recovery circuit and system using the same
592016015415106/02/16 Color filter array, image sensor including the same, and infrared data acquisition method using the same
602016015475006/02/16 Semiconductor device including a global buffer shared by a plurality of memory controllers
612016015548306/02/16 Semiconductor device and semiconductor system including the same
622016015549006/02/16 Memory device and memory system including the memory device
632016015549406/02/16 Memory system and operating the same
642016015549806/02/16 Vertical type semiconductor device, fabrication method thereof and operation method thereof
652016015550306/02/16 Electronic device having resistance element
662016015550406/02/16 Semiconductor memory device
672016015550906/02/16 Memory string and semiconductor device including the same
682016015551106/02/16 Nonvolatile memory device and operating method thereof
692016015565906/02/16 Interconnection structure including air gap, semiconductor device including air gap, and manufacturing the same
702016015567306/02/16 Semiconductor device having tungsten gate electrode and fabricating the same
712016015577906/02/16 Stack type semiconductor memory device
722016015581006/02/16 Semiconductor device with buried gates and fabrication method thereof
732016015593306/02/16 Electronic device and fabricating the same
742016015593706/02/16 Vertical type semiconductor device, fabrication method thereof and operation method thereof
752016014667705/26/16 Temperature sensor
762016014725005/26/16 Semiconductor package and semiconductor system including the same
772016014746305/26/16 Semiconductor device having network-on-chip structure and routing method thereof
782016014762405/26/16 Semiconductor device and operating the same
792016014866805/26/16 Cell array, memory, and memory system including the same
802016014869005/26/16 Semiconductor memory device and operating method thereof
812016014869305/26/16 Semiconductor device
822016014869505/26/16 Data storage device and programming memory cells
832016014869605/26/16 Semiconductor memory device and operating the same
842016014888405/26/16 Memory apparatus having power pad
852016014890805/26/16 Multi-chip package system
862016014893405/26/16 Semiconductor device including gate structure for threshold voltage modulation in transistors and fabricating the same
872016014893805/26/16 Semiconductor device having a gate and a conductive line in a pillar pattern
882016014894105/26/16 Semiconductor device and manufacturing the same
892016014894805/26/16 Semiconductor device and manufacturing the same
902016014897405/26/16 Electronic device and fabricating the same
912016014897905/26/16 Electronic device and fabricating the same
922016014912005/26/16 Electronic device and fabricating the same
932016014912105/26/16 Electronic device and fabricating the same
942016014912505/26/16 Resistive memory device and fabrication method thereof
952016014948505/26/16 Internal voltage generation circuits
962016014955205/26/16 Data transmitter
972016014956305/26/16 Semiconductor device
982016014956505/26/16 Semiconductor device and operating method thereof
992016014957505/26/16 Buffer circuit and operation method thereof
1002016015016805/26/16 Image sensor having vertical transfer gate and electronic device having the same
1012016013920305/19/16 Test setting circuit, semiconductor device, and test setting method
1022016013998405/19/16 Data storage device and operating method thereof
1032016014100505/19/16 Semiconductor integrated circuit and driving the same
1042016014100905/19/16 Semiconductor apparatus and operating method thereof
1052016014101005/19/16 Semiconductor memory apparatus and system including the same
1062016014101105/19/16 Semiconductor device and operating method thereof
1072016014101405/19/16 Semiconductor integrated circuit
1082016014102605/19/16 Memory system and operating the same
1092016014102705/19/16 Resistance variable memory apparatus, read circuit unit and operation method therefor
1102016014103505/19/16 Semiconductor memory device and operating the same
1112016014103705/19/16 Semiconductor memory system and operating the same
1122016014103805/19/16 Semiconductor device
1132016014104305/19/16 Semiconductor device
1142016014104905/19/16 Anti-fuse type one-time programmable memory cell array and operating the same
1152016014124505/19/16 Radio-frequency integrated circuits including inductors and methods of fabricating the same
1162016014130205/19/16 Semiconductor device and manufacturing the same
1172016014205805/19/16 Delay circuit
1182016014206005/19/16 Delay locked loop circuit and operation method thereof
1192016014215505/19/16 Semiconductor packages with optical interconnection structures, memory cards including the same, and electronic systems including the same
1202016013169705/12/16 Built-in test circuit of semiconductor apparatus
1212016013171005/12/16 Test system for semiconductor apparatus and test method using the same
1222016013240605/12/16 Data storage device and operating method thereof
1232016013330205/12/16 Nonvolatile memory device and operating the same
1242016013331105/12/16 Semiconductor device and driving the same
1252016013331305/12/16 Semiconductor memory and operating the same
1262016013332805/12/16 Semiconductor device and operating the same
1272016013333605/12/16 Shift register circuit and memory device including the same
1282016013333905/12/16 Test apparatus, test system and operating test apparatus
1292016013334305/12/16 Electronic device and operating electronic device
1302016013334405/12/16 Repair circuit, semiconductor memory device and operating the same
1312016013351105/12/16 Semiconductor device and manufacturing the same
1322016013356405/12/16 Semiconductor device with damascene bit line and fabricating the same
1332016013360705/12/16 Semiconductor system
1342016013364205/12/16 Semiconductor device and fabricating the same
1352016013373105/12/16 Lateral bipolar junction transistors having high current-driving capability
1362016012464005/05/16 Memory system and operating the same
1372016012480405/05/16 Nonvolatile memory system and data recovery method thereof
1382016012480505/05/16 Nonvolatile memory system and data recovery method thereof
1392016012511905/05/16 Semiconductor integrated circuit having differential amplifier and arranging the same
1402016012593505/05/16 Semiconductor device and operating the same
1412016012593705/05/16 Semiconductor integrated circuit device including a leakage current sensing unit and operating the same
1422016012594005/05/16 Semiconductor integrated circuit device including a leakage current sensing unit and operating the same
1432016012594405/05/16 Semiconductor device
1442016012594605/05/16 Semiconductor device and operating method thereof
1452016012594905/05/16 Semiconductor device and operating method thereof
1462016012624705/05/16 Nonvolatile memory devices having single-layered gates
1472016012627205/05/16 Curved image sensor, fabricating the same, and electronic device having the same
1482016012627705/05/16 Image sensor and fabricating the same
1492016011692604/28/16 Integrated circuit
1502016011697204/28/16 Memory system and operating method thereof
1512016011809204/28/16 Driving apparatus and selection of a dead zone of an internal voltage
1522016011809404/28/16 Semiconductor apparatus capable of self-tunning a timing margin
1532016011810904/28/16 Semiconductor memory device
1542016011811504/28/16 Multi-level memory apparatus and data sensing method thereof
1552016011813904/28/16 Semiconductor devices
1562016011830604/28/16 Semiconductor device with buried metal layer
1572016011833704/28/16 Embedded packages, methods of fabricating the same, electronic systems including the same, and memory cards including the same
1582016011837504/28/16 Semiconductor integrated circuit
1592016011837604/28/16 Semiconductor integrated circuit
1602016011839504/28/16 Semiconductor device and fabricating the same
1612016011840304/28/16 Semiconductor device and manufacturing the same
1622016011844204/28/16 Electronic device and fabricating the same
1632016011847404/28/16 Semiconductor device and forming the same
1642016011857504/28/16 Electronic devices having semiconductor magnetic memory units
1652016011896304/28/16 Latch circuit and latch circuit array including the same
1662016011896904/28/16 Delay adjusting apparatus and operating apparatus including the same
1672016011897804/28/16 Reference voltage generator having noise cancelling function and cmos image sensor using the same
1682016011898304/28/16 Calibration circuit and calibration apparatus including the same
1692016010952004/21/16 Test path compensating circuit and test path compensating system
1702016011113504/21/16 Input/output strobe pulse control circuit and semiconductor memory device including the same
1712016011113604/21/16 Address decoding circuit and semiconductor apparatus including the same
1722016011114004/21/16 Semiconductor device and driving the same
1732016011115104/21/16 Resistance variable memory apparatus, read/write circuit unit and operation method thereof
1742016011117104/21/16 Memory device and memory system including the same
1752016011117204/21/16 Semiconductor device
1762016011129104/21/16 Semiconductor memory device and manufacturing method thereof
1772016011136104/21/16 3d nonvolatile memory device
1782016011139704/21/16 Semiconductor chip and stacked semiconductor package having the same
1792016011139904/21/16 Semiconductor system having semiconductor apparatus and determining delay amount using the semiconductor apparatus
1802016011143304/21/16 Semiconductor device and manufacturing the same
1812016011147204/21/16 Electronic device and fabricating the same
1822016011153504/21/16 Semiconductor device with one-side-contact and fabricating the same
1832016011206804/21/16 Controller, semiconductor memory system, data storage system and operating method thereof
1842016010451704/14/16 Semiconductor apparatus and system capable of reducing peak current in transmitting signals
1852016010453804/14/16 Semiconductor device
1862016010454004/14/16 Non-volatile memory device and operating method thereof
1872016010454604/14/16 Repair circuit and semiconductor memory device including the same
1882016010468404/14/16 Semiconductor memory device having pads
1892016010476404/14/16 Method for fabricating capacitor of semiconductor device
1902016010478304/14/16 Semiconductor device and manufacturing the same
1912016010479804/14/16 Vertical-channel semiconductor device
1922016010517104/14/16 Semiconductor device having through chip via
1932016010519204/14/16 Digital to analog converter
1942016009780904/07/16 Semiconductor device and multi-semiconductor package including the same
1952016009781204/07/16 Semiconductor package
1962016009820104/07/16 Data storage device and operating method thereof
1972016009821404/07/16 Data storage device and operating method thereof
1982016009828004/07/16 Semiconductor device and semiconductor system including the same
1992016009903004/07/16 Strobe signal interval detection circuit and memory system including the same
2002016009905504/07/16 Eprom cell array, operating the same, and memory device including the same
2012016009906004/07/16 Semiconductor memory device including a dummy memory cell and programming the same
2022016009906304/07/16 Semiconductor device
2032016009907404/07/16 Fuse circuit and semiconductor apparatus including the same
2042016009907504/07/16 Fuse array circuit and semiconductor system including the same
2052016009907604/07/16 Semiconductor memory device
2062016009907904/07/16 Repair circuit and semiconductor apparatus using the same
2072016009915204/07/16 Semiconductor device and fabricating the same
2082016009920304/07/16 Semiconductor stack packages
2092016009922904/07/16 Semiconductor devices having through electrodes, semiconductor packages including the same, methods of manufacturing the same, electronic systems including the same, and memory cards including the same
2102016009923004/07/16 Multi-chip package, test system and operating the same
2112016009940704/07/16 Multilayered magnetic thin film stack and nonvolatile memory device having the same
2122016009970604/07/16 Resistance element generator and output driver using the same
2132016009191103/31/16 Semiconductor apparatus
2142016009337803/31/16 Semiconductor memory device
2152016009338103/31/16 Method of manufacturing semiconductor device
2162016009339103/31/16 Semiconductor device
2172016009350903/31/16 Semiconductor device and forming the same
2182016009352703/31/16 Method for fabricating semiconductor device including silicon-containing layer and metal-containing layer, and conductive structure of the same
2192016009358103/31/16 Semiconductor device with a through electrode
2202016009365403/31/16 Image sensor and operating the same
2212016009371003/31/16 Semiconductor device and forming the same
2222016009371703/31/16 Dual work function buried gate type transistor and fabricating the same
2232016008524903/24/16 Voltage conversion circuit, semiconductor memory apparatus having the same, and operating method
2242016008664403/24/16 Semiconductor device
2252016008664903/24/16 Smart refresh device
2262016008665003/24/16 Semiconductor memory device and memory system including the same
2272016008665103/24/16 Semiconductor memory device and semiconductor memory system including the same
2282016008665303/24/16 Semiconductor device having transistor and semiconductor memory device using the same
2292016008666303/24/16 Semiconductor system including semiconductor memory apparatus and temperature control method thereof
2302016008666703/24/16 System having a semiconductor integrated circuit device
2312016008666903/24/16 Nonvolatile memory device with improved voltage drop and driving the same
2322016008667903/24/16 Electronic device
2332016008688803/24/16 Semiconductor device and forming the same
2342016008691903/24/16 Multi-chip package
2352016008692003/24/16 Semiconductor devices and semiconductor systems including the same
2362016008695703/24/16 Semiconductor device with buried bit line and fabricating the same
2372016008700603/24/16 3-dimensional stack memory device
2382016008701103/24/16 Electronic device and fabricating the same
2392016008707203/24/16 Dummy bit line mos capacitor and device using the same
2402016008742803/24/16 Semiconductor apparatus and test system including the same
2412016008763803/24/16 Multi-channel delay locked loop
2422016007743503/17/16 Methods of forming patterns
2432016007805103/17/16 Data pattern detecting device, semiconductor device including the same, and operating method thereof
2442016007890803/17/16 Semiconductor memory apparatus and operation method using the same
2452016007891803/17/16 Memory device and memory system including the same
2462016007894203/17/16 Operating characteristics of a semiconductor device
2472016007894603/17/16 Memory system and operation method thereof
2482016007895003/17/16 Semiconductor device and operating method thereof
2492016007896203/17/16 Anti-fuse type one-time programmable memory cell and anti-fuse type one-time programmable memory cell arrays



ARCHIVE: New 2016 2015 2014 2013 2012 2011 2010 2009



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