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Sk Hynix Inc_20131212

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Sk Hynix, Inc. patents


      
Recent patent applications related to Sk Hynix, Inc.. Sk Hynix, Inc. is listed as an Agent/Assignee. Note: Sk Hynix, Inc. may have other listings under different names/spellings. We're not affiliated with Sk Hynix, Inc., we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "S" | Sk Hynix, Inc.-related inventors



Sk Hynix

Electronic device and method for fabricating the same

Sk Hynix

Semiconductor integrated circuit system and method for driving the same

Search recent Press Releases: Sk Hynix, Inc.-related press releases
Count Application # Date Sk Hynix, Inc. patents (updated weekly) - BOOKMARK this page
12014028479509/25/14 new patent  Semiconductor package and method for manufacturing the same
22014028609009/25/14 new patent  Semiconductor integrated circuit system and method for driving the same
32014028753509/25/14 new patent  Electronic device and method for fabricating the same
42014026457009/18/14Semiconductor device and method for forming the same
52014026483309/18/14Semiconductor package and method for fabricating the same
62014026484809/18/14Semiconductor package and method for fabricating the same
72014026899609/18/14Variable resistance memory device and method of driving the same
82014026900509/18/14Electronic devices having semiconductor memory units and method for fabricating the same
92014026903909/18/14Electronic device and variable resistance element
102014026913809/18/14Semiconductor memory device for reducing standby current
112014028123109/18/14Electronic device and method for fabricating the same
122014025245809/11/14Semiconductor device having vertical channel transistor and method for fabricating the same
132014025265209/11/14Bonding structure of semiconductor package, method for fabricating the same, and stack-type semiconductor package
142014025423909/11/14Electronic device comprising a semiconductor memory unit
152014025424309/11/14Electronic device and method for fabricating the same
162014025425609/11/14Vertical type semiconductor device, fabrication method thereof and operation method thereof
172014025428109/11/143d non-volatile memory device and method for operating and fabricating the same
182014025428709/11/14Semiconductor integrated circuit capable of controlling read command
192014025610309/11/14Method for fabricating electronic devices having semiconductor memory unit
202014025612509/11/14Semiconductor device and method for fabricating the same
212014025862609/11/14Electronic devices having semiconductor memory unit
222014025876709/11/14Semiconductor device and semiconductor system including the same
232014024674209/04/14Semiconductor device
242014024764709/04/14Electronic device and method for fabricating the same
252014024764809/04/14Electronic device
262014024875009/04/14Vertical type semiconductor device and fabrication method thereof
272014024876509/04/14Semiconductor memory device having dummy conductive patterns on interconnection and fabrication method thereof
282014025024409/04/14Electronic devices having semiconductor magnetic memory units
292014023924708/28/14Transistor, resistance variable memory device including the same, and manufacturing method thereof
302014024103908/28/14Electronic device and method for operating the same
312014024104008/28/14Electronic device
322014024104108/28/14Reference column of semiconductor memory, and electronic device including the same
332014024104208/28/14Electronic device and method for operating the same
342014024104308/28/14Electronic device and method for operating electronic device
352014024107908/28/14Chip die and semiconductor memory device including the same
362014024275808/28/14Wafer and method for forming the same
372014024276508/28/143-dimensional non-volatile memory device including a selection gate having an l shape
382014024277208/28/14Method for fabricating semiconductor device
392014024277308/28/14Phase change memory device having self-aligned bottom electrode and fabrication method thereof
402014024493008/28/14Electronic devices having semiconductor magnetic memory units
412014024493108/28/14Electronic device
422014024494508/28/14Electronic device and method for operating electronic device
432014023194208/21/14Semiconductor device and method for fabricating the same
442014023201408/21/14Semiconductor device with buried bit line and method for fabricating the same
452014022641908/14/14Semiconductor apparatus
462014022642208/14/14Semiconductor memory device and method of testing the same
472014022763508/14/14Reflection type blank masks, methods of fabricating the same, and methods of fabricating reflection type photo masks using the same
482014022784008/14/143d non-volatile memory device and method for fabricating the same
492014022785108/14/14Semiconductor device and method for manufacturing the same
502014021754508/07/14Semiconductor device and method for fabricating the same
512014021810108/07/14Period signal generation circuits
522014021899508/07/14Semiconductor chips
532014021904008/07/14Semiconductor memory device including bulk voltage generation circuit
542014020984707/31/14Phase-change memory device having multiple diodes
552014020990707/31/14Semiconductor apparatus and stacked semiconductor apparatus for checking formation and connection of through silicon via
562014020990907/31/14Semiconductor device
572014021005807/31/14Semiconductor device and method of fabricating the same
582014020333707/24/14Method of forming gate dielectric layer and method of fabricating semiconductor device
592014020466407/24/14Method of driving phase change memory device capable of reducing heat disturbance
602014020468107/24/14Semiconductor memory device and method of operating the same
612014020468207/24/14Method and apparatus for simultaneously accessing a plurality of memory cells in a memory array to perform a read operation and/or a write operation
622014020595407/24/14Method for forming patterns of semiconductor device by using mixed assist feature system
632014020619407/24/14Method for manufacturing a semiconductor device
642014020804407/24/14Semiconductor device and method of operating the same
652014020818707/24/14Semiconductor apparatus and method of operating the same
662014019858507/17/14Semiconductor memory apparatus
672014019138907/10/14Semiconductor device and method of manufacturing the same
682014019258407/10/14Semiconductor device
692014018344007/03/14Variable resistance memory device
702014018364407/03/14Semiconductor device with high voltage transistor
712014018364907/03/14Semiconductor device having metal gate and high-k dielectric layer and method for manufacturing the same
722014018365007/03/14Cmos circuit and method for fabricating the same
732014018365107/03/14Semiconductor device with metal gate and high-k materials and method for fabricating the same
742014018368907/03/14Anti-fuse array of semiconductor device and method for forming the same
752014018372407/03/14Substrate for semiconductor package, semiconductor package using the same, and manufacturing method thereof
762014018423907/03/14Semiconductor device with fuse sensing circuit
772014018429307/03/14Pulse signal generation circuit and operating method thereof
782014018429407/03/14Duty cycle correction circuit and operation method thereof
792014018535307/03/14Memory
802014018535607/03/14Semiconductor integrated circuit and method of driving the same
812014018537007/03/14Nonvolatile memory apparatus having magnetoresistive memory elements and method for driving the same
822014018538107/03/14Semiconductor apparatus and method of operating the same
832014018538707/03/14Semiconductor memory device and method of operating the same
842014018539607/03/14Semiconductor memory, memory system, and operation method thereof
852014018539907/03/14Test mediation device and system and method for testing memory device
862014018703007/03/14Semiconductor device with dual work function gate stacks and method for fabricating the same
872014018703107/03/14Semiconductor device with recess gate and method for fabricating the same
882014018703707/03/14Semiconductor device with self-aligned air gap and method for fabricating the same
892014018925707/03/14Semiconductor memory device
902014018925807/03/14Semiconductor memory device
912014018928307/03/14Semiconductor memory device and operating method for the same
922014018940707/03/14Data storage device and method for operating the same
932014017536806/26/14Phase-change random access memory device and method of manufacturing the same
942014017543906/26/14Semiconductor integrated circuit and multi-chip package including the same
952014017552906/26/14Nonvolatile memory device and method for fabricating the same
962014017553306/26/14Nonvolatile memory device and method for fabricating the same
972014017553706/26/14Semiconductor apparatus and fabrication method thereof
982014017553806/26/14Semiconductor apparatus and fabrication method thereof
992014017555506/26/14Semiconductor devices having buried metal silicide layers and methods of fabricating the same
1002014017558606/26/14Image sensor and method for fabricating the same
1012014017560506/26/14Semiconductor chip and semiconductor apparatus with embedded capacitor
1022014017563806/26/14Semiconductor packages including semiconductor chips having protrusions and methods of fabricating the same
1032014017566006/26/14Stack packages having token ring loops
1042014017566706/26/14Semiconductor integrated circuit and semiconductor system with the same
1052014017566806/26/14Semiconductor integrated circuit
1062014017568006/26/14Electrical characteristics of package substrates and semiconductor packages including the same
1072014017610106/26/14Internal voltage generation circuits
1082014017616706/26/14Semiconductor apparatus
1092014017616806/26/14Semiconductor apparatus
1102014017619106/26/14Comparator circuit and signal comparison method
1112014017619206/26/14Semiconductor device
1122014017619706/26/14Semiconductor device and operating method thereof
1132014017620606/26/14Delay locked loop and semiconductor apparatus
1142014017620706/26/14Semiconductor apparatus
1152014017620906/26/14Clock generation circuit and clock generation system using the same
1162014017621406/26/14Phase splitter
1172014017626006/26/14Signal transmission circuit
1182014017731306/26/14Semiconductor device and method of operation
1192014017731406/26/14Semiconductor memory devices and semiconductor system having parameters, and methods of testing the same
1202014017733106/26/14Semiconductor device and method for forming the same
1212014017733206/26/14Operating circuit controlling device, semiconductor memory device and method of operating the same
1222014017733606/26/14Non-volatile memory device and method of fabricating the same
1232014017735306/26/14Nonvolatile memory apparatus
1242014017735506/26/14Nonvolatile memory apparatus
1252014017736006/26/14Device and method for controlling self-refresh
1262014017736406/26/14One-time programmable memory and test method thereof
1272014017736506/26/14Semiconductor apparatus, test method using the same and muti chips system
1282014017736606/26/14Data input/output circuit and semiconductor memory device including the same
1292014017736806/26/14Nonvolatile memory apparatus
1302014017737406/26/14Driver of semiconductor memory device and driving method thereof
1312014017737606/26/14Memory and memory system including the same
1322014017769606/26/14Receiver circuit with de-emphasis function
1332014017906906/26/14Fabrication method of semiconductor apparatus
1342014017909206/26/14Method for forming void-free polysilicon and method for fabricating semiconductor device using the same
1352014017910106/26/14Semiconductor device with air gap and method for fabricating the same
1362014017910206/26/14Semiconductor device with air gaps and method for fabricating the same
1372014017911806/26/14Surface treatment method for semiconductor device
1382014018142406/26/14Semiconductor memory system and operation method thereof
1392014018145606/26/14Memory, memory controller, memory system including the memory and the memory controller, and operating method of the memory system
1402014018158806/26/14Semiconductor memory apparatus and operating method thereof
1412014018160406/26/14Channel control circuit and semiconductor device having the same
1422014016696306/19/14Semiconductor device and method of manufacturing the same
1432014016696406/19/14Phase-change memory device and fabrication method thereof
1442014016696506/19/14Resistive memory device and fabrication method thereof
1452014016697106/19/14Variable resistance memory device and method of manufacturing the same
1462014016703006/19/14Vertical type semiconductor device and fabrication method thereof
1472014016712906/19/14Semiconductor device and method of manufacturing the same
1482014016714906/19/14Semiconductor device and fabrication method thereof
1492014016725006/19/14Semiconductor device
1502014016727506/19/14Embedded package and method of manufacturing the same
1512014016727606/19/14Substrate for semiconductor package, semiconductor package using the substrate, and method of manufacturing the semiconductor package
1522014016728006/19/14Semiconductor device
1532014016728106/19/14Stack type semiconductor circuit with impedance calibration
1542014016729306/19/14Integrated circuit with bump connection scheme
1552014016771306/19/14Regulator and voltage generator
1562014016771906/19/14Voltage generation circuit
1572014016783906/19/14Negative voltage regulation circuit and voltage generation circuit including the same
1582014016784906/19/14Differential amplifier
1592014016905906/19/14Fuse repair device
1602014016906406/19/14Regulator, voltage generator and semiconductor memory device
1612014016906506/19/14High voltage generating circuit for resistive memory apparatus
1622014016906706/19/14Resistance memory device and memory apparatus and data processing system
1632014016909406/19/14Data transmission circuit, memory including the same, and data transmission method
1642014016909606/19/14Semiconductor memory device and operating method thereof
1652014016909706/19/14Semiconductor memory device, system having the same and program method thereof
1662014016911206/19/14Semiconductor memory system and operating method thereof
1672014016911806/19/14Address input circuit of semiconductor apparatus
1682014017081206/19/14Method and apparatus for manufacturing chip package
1692014017082806/19/14Plasma doping method and method for fabricating semiconductor device using the same
1702014017083006/19/14Variable resistance memory device and method for fabricating the same
1712014017318406/19/14Data storage device and operating method thereof
1722014017323106/19/14Semiconductor memory device and system operating method
1732014015896606/12/14Variable resistance memory device and method for fabricating the same
1742014015912706/12/14Semiconductor device and method of manufacturing the same
1752014015913106/12/14Reservoir capacitor of semiconductor device and method for fabricating the same
1762014015918406/12/14Image sensor and method for fabricating the same
1772014015919306/12/14Semiconductor device and method for fabricating the same
1782014015976506/12/14Semiconductor apparatus
1792014015977706/12/14Voltage detector and semiconductor device including the same
1802014015978906/12/14Semiconductor apparatus
1812014015979206/12/14Voltage generation circuit
1822014016083706/12/14Resistive memory device and method of manufacturing the same
1832014016083906/12/14Semiconductor intergrated circuit device, method of manufacturing the same, and method of driving the same
1842014016084606/12/14Semiconductor memory device and method of operating the same
1852014016085606/12/14Semiconductor memory device and program method thereof
1862014016086306/12/14Semiconductor device having transistor and semiconductor memory device using the same
1872014016086406/12/14Semiconductor device including current compensator
1882014016087206/12/14Voltage generation circuit, and write driver and semiconductor memory apparatus including the same
1892014016242906/12/14Semiconductor intergrated circuit device, method of manufacturing the same, and method of driving the same
1902014016244806/12/14Semiconductor device with metal gates and method for fabricating the same
1912014016245306/12/14Semiconductor device and method for fabricating the same
1922014016468206/12/14Nonvolatile memory apparatus, operating method thereof, and data processing system having the same
1932014016468306/12/14Nonvolatile memory apparatus, operating method thereof, and data processing system having the same
1942014015162706/05/14Semiconductor device and method of manufacturing the same
1952014015177906/05/14Semiconductor memory device and method of manufacturing the same
1962014015178006/05/14Nonvolatile memory device and method of fabricating the same
1972014015178406/05/14Semiconductor memory device and method of manufacturing the same
1982014015180506/05/14Method for fabricating a connection region in a semiconductor device
1992014015184206/05/14Semiconductor apparatus
2002014015235806/05/14Semiconductor apparatus and duty cycle correction method thereof
2012014015236006/05/14Phase difference quantization circuit, delay value control circuit thereof, and delay circuit
2022014015334006/05/14Method for erasing charge trap devices
2032014015334206/05/14Semiconductor integrated circuit and method for monitoring reference voltage thereof
2042014015334406/05/14Semiconductor memory device, system having the same and method for generating reference voltage for operating the same
2052014015486606/05/14Method of forming a semiconductor memory device
2062014015688206/05/14Memory device, operating method thereof, and data storage device including the same
2072014015692406/05/14Semiconductor memory device with improved operating speed and data storage device including the same
2082014015708206/05/14Data storage device and method for processing error correction code thereof
2092014014514005/29/14Variable resistance memory device
2102014014534305/29/14Semiconductor device and method for manufacturing the same
2112014014569005/29/14Internal voltage generation circuits
2122014014575405/29/14Integrated circuit and operation method thereof
2132014014576405/29/14Multi-phase clock generation circuit
2142014014576605/29/14Initialization circuit
2152014014660805/29/14Oscillator circuit with location-based charge pump enable and semiconductor memory including the same
2162014014685205/29/14Semiconductor device
2172014013860605/22/14Resistance variable memory device
2182014013868705/22/14Semiconductor device and method of manufacturing the same
2192014013876505/22/14Semiconductor device and method of manufacturing the same
2202014013876805/22/14Semiconductor integrated circuit device having reduced unit cell area and method for manufacturing the same
2212014013926905/22/14Multi-chip system and semiconductor package
2222014014001605/22/14Power metal mesh and semiconductor memory device and method including the same
2232014014012705/22/14Magnetic random access memory apparatus, methods for programming and verifying reference cells therefor
2242014014013605/22/14Semiconductor device and method of operating the same
2252014014014805/22/14Semiconductor memory device, memory system including the same and method of operating the same
2262014014015105/22/14Semiconductor memory apparatus
2272014014038505/22/14Equalizer and operating method thereof
2282014014043105/22/14Transmitter circuit, receiver circuit, and transmitting/receiving system
2292014014159305/22/14Semiconductor device and method for forming the same
2302014014349105/22/14Semiconductor apparatus and operating method thereof
2312014013860605/22/14Resistance variable memory device
2322014013868705/22/14Semiconductor device and method of manufacturing the same
2332014013876505/22/14Semiconductor device and method of manufacturing the same
2342014013876805/22/14Semiconductor integrated circuit device having reduced unit cell area and method for manufacturing the same
2352014013926905/22/14Multi-chip system and semiconductor package
2362014014001605/22/14Power metal mesh and semiconductor memory device and method including the same
2372014014012705/22/14Magnetic random access memory apparatus, methods for programming and verifying reference cells therefor
2382014014013605/22/14Semiconductor device and method of operating the same
2392014014014805/22/14Semiconductor memory device, memory system including the same and method of operating the same
2402014014015105/22/14Semiconductor memory apparatus
2412014014038505/22/14Equalizer and operating method thereof
2422014014043105/22/14Transmitter circuit, receiver circuit, and transmitting/receiving system
2432014014159305/22/14Semiconductor device and method for forming the same
2442014014349105/22/14Semiconductor apparatus and operating method thereof
2452014013178305/15/14Semiconductor device and method of manufacturing the same
2462014013178505/15/14Semiconductor device and method of manufacturing the same
2472014013233905/15/14Filtering circuit, phase identity determination circuit and delay locked loop
2482014013321405/15/14Resistive memory device and method for driving the same
2492014013324705/15/14Semiconductor memory device and method for testing the same


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Sk Hynix, Inc. in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Sk Hynix, Inc. with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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