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Sk Hynix Inc_20131212

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Sk Hynix, Inc. patents


      
Recent patent applications related to Sk Hynix, Inc.. Sk Hynix, Inc. is listed as an Agent/Assignee. Note: Sk Hynix, Inc. may have other listings under different names/spellings. We're not affiliated with Sk Hynix, Inc., we're just tracking patents.

ARCHIVE: New 2014 2013 2012 2011 2010 2009 | Company Directory "S" | Sk Hynix, Inc.-related inventors



Semiconductor device with air gap and method for fabricating the same

Sk Hynix

Semiconductor device with air gap and method for fabricating the same

Sk Hynix

Method for fabricating a semiconductor device

Search recent Press Releases: Sk Hynix, Inc.-related press releases
Count Application # Date Sk Hynix, Inc. patents (updated weekly) - BOOKMARK this page
12014030627810/16/14 new patent  Semiconductor device with buried bit line and method for fabricating the same
22014030628710/16/14 new patent  Semiconductor device and fabrication method thereof
32014030635110/16/14 new patent  Semiconductor device with air gap and method of fabricating the same
42014030673810/16/14 new patent  Input/output line driver circuit
52014030674710/16/14 new patent  Semiconductor integrated circuit having voltage stabilizing circuit
62014030674810/16/14 new patent  Multi-chip package
72014030749810/16/14 new patent  Semiconductor memory device including flag cells
82014030878610/16/14 new patent  High-integration semiconductor memory device and method of manufacturing the same
92014030879410/16/14 new patent  Semiconductor device with air gap and method for fabricating the same
102014030879610/16/14 new patent  Method for fabricating a semiconductor device
112014029983110/09/143d variable resistance memory device and method of manufacturing the same
122014029991810/09/14Semiconductor substrate and fabrication method thereof, and semiconductor apparatus using the same and fabrication method thereof
132014029993010/09/14Nonvolatile memory device
142014029995010/09/14Electronic devices having semiconductor memory units
152014029995210/09/14Magnetic tunnel junction device and method for fabricating the same
162014029998910/09/14Semiconductor device with air gap and method for fabricating the same
172014030039210/09/14Signal receiver circuit
182014030112710/09/14Semiconductor device and electronic device including the same
192014030112810/09/143d variable resistance memory device having junction fet and driving method thereof
202014030114810/09/14Semiconductor memory apparatus and operation method using the same
212014030115010/09/14Memory device and operating method of memory device and memory system
222014030265510/09/14Non-volatile memory device with vertical memory cells and method for fabricating the same
232014030266310/09/14Semiconductor device with isolation layer, electronic device having the same, and method for fabricating the same
242014029183710/02/14Embedded package and method for manufacturing the same
252014029185510/02/14Semiconductor device and semiconductor system including the same
262014029239010/02/14Data transmission circuits and system having the same
272014029239710/02/14Internal voltage generation circuits
282014029255010/02/14Analog-to-digital conversion circuit, analog-to-digital conversion method, and image sensor
292014029367210/02/14Electronic device
302014029367710/02/14Electronic device and method for fabricating the same
312014029368410/02/14Nonvolatile memory apparatus
322014029370810/02/14Nonvolatile memory devices and methods of operating the same
332014029370910/02/14Single-layer gate eeprom cell, cell array including the same, and method of operating the cell array
342014029792510/02/14Storage device with self-contained information storage space
352014029798610/02/14Semiconductor memory devices and semiconductor systems including the same
362014029807110/02/14Semiconductor devices and semiconductor systems including the same
372014029814710/02/14Data transferring systems, data receivers and methods of transferring data using the same
382014028479509/25/14Semiconductor package and method for manufacturing the same
392014028609009/25/14Semiconductor integrated circuit system and method for driving the same
402014028753509/25/14Electronic device and method for fabricating the same
412014026457009/18/14Semiconductor device and method for forming the same
422014026483309/18/14Semiconductor package and method for fabricating the same
432014026484809/18/14Semiconductor package and method for fabricating the same
442014026899609/18/14Variable resistance memory device and method of driving the same
452014026900509/18/14Electronic devices having semiconductor memory units and method for fabricating the same
462014026903909/18/14Electronic device and variable resistance element
472014026913809/18/14Semiconductor memory device for reducing standby current
482014028123109/18/14Electronic device and method for fabricating the same
492014025245809/11/14Semiconductor device having vertical channel transistor and method for fabricating the same
502014025265209/11/14Bonding structure of semiconductor package, method for fabricating the same, and stack-type semiconductor package
512014025423909/11/14Electronic device comprising a semiconductor memory unit
522014025424309/11/14Electronic device and method for fabricating the same
532014025425609/11/14Vertical type semiconductor device, fabrication method thereof and operation method thereof
542014025428109/11/143d non-volatile memory device and method for operating and fabricating the same
552014025428709/11/14Semiconductor integrated circuit capable of controlling read command
562014025610309/11/14Method for fabricating electronic devices having semiconductor memory unit
572014025612509/11/14Semiconductor device and method for fabricating the same
582014025862609/11/14Electronic devices having semiconductor memory unit
592014025876709/11/14Semiconductor device and semiconductor system including the same
602014024674209/04/14Semiconductor device
612014024764709/04/14Electronic device and method for fabricating the same
622014024764809/04/14Electronic device
632014024875009/04/14Vertical type semiconductor device and fabrication method thereof
642014024876509/04/14Semiconductor memory device having dummy conductive patterns on interconnection and fabrication method thereof
652014025024409/04/14Electronic devices having semiconductor magnetic memory units
662014023924708/28/14Transistor, resistance variable memory device including the same, and manufacturing method thereof
672014024103908/28/14Electronic device and method for operating the same
682014024104008/28/14Electronic device
692014024104108/28/14Reference column of semiconductor memory, and electronic device including the same
702014024104208/28/14Electronic device and method for operating the same
712014024104308/28/14Electronic device and method for operating electronic device
722014024107908/28/14Chip die and semiconductor memory device including the same
732014024275808/28/14Wafer and method for forming the same
742014024276508/28/143-dimensional non-volatile memory device including a selection gate having an l shape
752014024277208/28/14Method for fabricating semiconductor device
762014024277308/28/14Phase change memory device having self-aligned bottom electrode and fabrication method thereof
772014024493008/28/14Electronic devices having semiconductor magnetic memory units
782014024493108/28/14Electronic device
792014024494508/28/14Electronic device and method for operating electronic device
802014023194208/21/14Semiconductor device and method for fabricating the same
812014023201408/21/14Semiconductor device with buried bit line and method for fabricating the same
822014022641908/14/14Semiconductor apparatus
832014022642208/14/14Semiconductor memory device and method of testing the same
842014022763508/14/14Reflection type blank masks, methods of fabricating the same, and methods of fabricating reflection type photo masks using the same
852014022784008/14/143d non-volatile memory device and method for fabricating the same
862014022785108/14/14Semiconductor device and method for manufacturing the same
872014021754508/07/14Semiconductor device and method for fabricating the same
882014021810108/07/14Period signal generation circuits
892014021899508/07/14Semiconductor chips
902014021904008/07/14Semiconductor memory device including bulk voltage generation circuit
912014020984707/31/14Phase-change memory device having multiple diodes
922014020990707/31/14Semiconductor apparatus and stacked semiconductor apparatus for checking formation and connection of through silicon via
932014020990907/31/14Semiconductor device
942014021005807/31/14Semiconductor device and method of fabricating the same
952014020333707/24/14Method of forming gate dielectric layer and method of fabricating semiconductor device
962014020466407/24/14Method of driving phase change memory device capable of reducing heat disturbance
972014020468107/24/14Semiconductor memory device and method of operating the same
982014020468207/24/14Method and apparatus for simultaneously accessing a plurality of memory cells in a memory array to perform a read operation and/or a write operation
992014020595407/24/14Method for forming patterns of semiconductor device by using mixed assist feature system
1002014020619407/24/14Method for manufacturing a semiconductor device
1012014020804407/24/14Semiconductor device and method of operating the same
1022014020818707/24/14Semiconductor apparatus and method of operating the same
1032014019858507/17/14Semiconductor memory apparatus
1042014019138907/10/14Semiconductor device and method of manufacturing the same
1052014019258407/10/14Semiconductor device
1062014018344007/03/14Variable resistance memory device
1072014018364407/03/14Semiconductor device with high voltage transistor
1082014018364907/03/14Semiconductor device having metal gate and high-k dielectric layer and method for manufacturing the same
1092014018365007/03/14Cmos circuit and method for fabricating the same
1102014018365107/03/14Semiconductor device with metal gate and high-k materials and method for fabricating the same
1112014018368907/03/14Anti-fuse array of semiconductor device and method for forming the same
1122014018372407/03/14Substrate for semiconductor package, semiconductor package using the same, and manufacturing method thereof
1132014018423907/03/14Semiconductor device with fuse sensing circuit
1142014018429307/03/14Pulse signal generation circuit and operating method thereof
1152014018429407/03/14Duty cycle correction circuit and operation method thereof
1162014018535307/03/14Memory
1172014018535607/03/14Semiconductor integrated circuit and method of driving the same
1182014018537007/03/14Nonvolatile memory apparatus having magnetoresistive memory elements and method for driving the same
1192014018538107/03/14Semiconductor apparatus and method of operating the same
1202014018538707/03/14Semiconductor memory device and method of operating the same
1212014018539607/03/14Semiconductor memory, memory system, and operation method thereof
1222014018539907/03/14Test mediation device and system and method for testing memory device
1232014018703007/03/14Semiconductor device with dual work function gate stacks and method for fabricating the same
1242014018703107/03/14Semiconductor device with recess gate and method for fabricating the same
1252014018703707/03/14Semiconductor device with self-aligned air gap and method for fabricating the same
1262014018925707/03/14Semiconductor memory device
1272014018925807/03/14Semiconductor memory device
1282014018928307/03/14Semiconductor memory device and operating method for the same
1292014018940707/03/14Data storage device and method for operating the same
1302014017536806/26/14Phase-change random access memory device and method of manufacturing the same
1312014017543906/26/14Semiconductor integrated circuit and multi-chip package including the same
1322014017552906/26/14Nonvolatile memory device and method for fabricating the same
1332014017553306/26/14Nonvolatile memory device and method for fabricating the same
1342014017553706/26/14Semiconductor apparatus and fabrication method thereof
1352014017553806/26/14Semiconductor apparatus and fabrication method thereof
1362014017555506/26/14Semiconductor devices having buried metal silicide layers and methods of fabricating the same
1372014017558606/26/14Image sensor and method for fabricating the same
1382014017560506/26/14Semiconductor chip and semiconductor apparatus with embedded capacitor
1392014017563806/26/14Semiconductor packages including semiconductor chips having protrusions and methods of fabricating the same
1402014017566006/26/14Stack packages having token ring loops
1412014017566706/26/14Semiconductor integrated circuit and semiconductor system with the same
1422014017566806/26/14Semiconductor integrated circuit
1432014017568006/26/14Electrical characteristics of package substrates and semiconductor packages including the same
1442014017610106/26/14Internal voltage generation circuits
1452014017616706/26/14Semiconductor apparatus
1462014017616806/26/14Semiconductor apparatus
1472014017619106/26/14Comparator circuit and signal comparison method
1482014017619206/26/14Semiconductor device
1492014017619706/26/14Semiconductor device and operating method thereof
1502014017620606/26/14Delay locked loop and semiconductor apparatus
1512014017620706/26/14Semiconductor apparatus
1522014017620906/26/14Clock generation circuit and clock generation system using the same
1532014017621406/26/14Phase splitter
1542014017626006/26/14Signal transmission circuit
1552014017731306/26/14Semiconductor device and method of operation
1562014017731406/26/14Semiconductor memory devices and semiconductor system having parameters, and methods of testing the same
1572014017733106/26/14Semiconductor device and method for forming the same
1582014017733206/26/14Operating circuit controlling device, semiconductor memory device and method of operating the same
1592014017733606/26/14Non-volatile memory device and method of fabricating the same
1602014017735306/26/14Nonvolatile memory apparatus
1612014017735506/26/14Nonvolatile memory apparatus
1622014017736006/26/14Device and method for controlling self-refresh
1632014017736406/26/14One-time programmable memory and test method thereof
1642014017736506/26/14Semiconductor apparatus, test method using the same and muti chips system
1652014017736606/26/14Data input/output circuit and semiconductor memory device including the same
1662014017736806/26/14Nonvolatile memory apparatus
1672014017737406/26/14Driver of semiconductor memory device and driving method thereof
1682014017737606/26/14Memory and memory system including the same
1692014017769606/26/14Receiver circuit with de-emphasis function
1702014017906906/26/14Fabrication method of semiconductor apparatus
1712014017909206/26/14Method for forming void-free polysilicon and method for fabricating semiconductor device using the same
1722014017910106/26/14Semiconductor device with air gap and method for fabricating the same
1732014017910206/26/14Semiconductor device with air gaps and method for fabricating the same
1742014017911806/26/14Surface treatment method for semiconductor device
1752014018142406/26/14Semiconductor memory system and operation method thereof
1762014018145606/26/14Memory, memory controller, memory system including the memory and the memory controller, and operating method of the memory system
1772014018158806/26/14Semiconductor memory apparatus and operating method thereof
1782014018160406/26/14Channel control circuit and semiconductor device having the same
1792014016696306/19/14Semiconductor device and method of manufacturing the same
1802014016696406/19/14Phase-change memory device and fabrication method thereof
1812014016696506/19/14Resistive memory device and fabrication method thereof
1822014016697106/19/14Variable resistance memory device and method of manufacturing the same
1832014016703006/19/14Vertical type semiconductor device and fabrication method thereof
1842014016712906/19/14Semiconductor device and method of manufacturing the same
1852014016714906/19/14Semiconductor device and fabrication method thereof
1862014016725006/19/14Semiconductor device
1872014016727506/19/14Embedded package and method of manufacturing the same
1882014016727606/19/14Substrate for semiconductor package, semiconductor package using the substrate, and method of manufacturing the semiconductor package
1892014016728006/19/14Semiconductor device
1902014016728106/19/14Stack type semiconductor circuit with impedance calibration
1912014016729306/19/14Integrated circuit with bump connection scheme
1922014016771306/19/14Regulator and voltage generator
1932014016771906/19/14Voltage generation circuit
1942014016783906/19/14Negative voltage regulation circuit and voltage generation circuit including the same
1952014016784906/19/14Differential amplifier
1962014016905906/19/14Fuse repair device
1972014016906406/19/14Regulator, voltage generator and semiconductor memory device
1982014016906506/19/14High voltage generating circuit for resistive memory apparatus
1992014016906706/19/14Resistance memory device and memory apparatus and data processing system
2002014016909406/19/14Data transmission circuit, memory including the same, and data transmission method
2012014016909606/19/14Semiconductor memory device and operating method thereof
2022014016909706/19/14Semiconductor memory device, system having the same and program method thereof
2032014016911206/19/14Semiconductor memory system and operating method thereof
2042014016911806/19/14Address input circuit of semiconductor apparatus
2052014017081206/19/14Method and apparatus for manufacturing chip package
2062014017082806/19/14Plasma doping method and method for fabricating semiconductor device using the same
2072014017083006/19/14Variable resistance memory device and method for fabricating the same
2082014017318406/19/14Data storage device and operating method thereof
2092014017323106/19/14Semiconductor memory device and system operating method
2102014015896606/12/14Variable resistance memory device and method for fabricating the same
2112014015912706/12/14Semiconductor device and method of manufacturing the same
2122014015913106/12/14Reservoir capacitor of semiconductor device and method for fabricating the same
2132014015918406/12/14Image sensor and method for fabricating the same
2142014015919306/12/14Semiconductor device and method for fabricating the same
2152014015976506/12/14Semiconductor apparatus
2162014015977706/12/14Voltage detector and semiconductor device including the same
2172014015978906/12/14Semiconductor apparatus
2182014015979206/12/14Voltage generation circuit
2192014016083706/12/14Resistive memory device and method of manufacturing the same
2202014016083906/12/14Semiconductor intergrated circuit device, method of manufacturing the same, and method of driving the same
2212014016084606/12/14Semiconductor memory device and method of operating the same
2222014016085606/12/14Semiconductor memory device and program method thereof
2232014016086306/12/14Semiconductor device having transistor and semiconductor memory device using the same
2242014016086406/12/14Semiconductor device including current compensator
2252014016087206/12/14Voltage generation circuit, and write driver and semiconductor memory apparatus including the same
2262014016242906/12/14Semiconductor intergrated circuit device, method of manufacturing the same, and method of driving the same
2272014016244806/12/14Semiconductor device with metal gates and method for fabricating the same
2282014016245306/12/14Semiconductor device and method for fabricating the same
2292014016468206/12/14Nonvolatile memory apparatus, operating method thereof, and data processing system having the same
2302014016468306/12/14Nonvolatile memory apparatus, operating method thereof, and data processing system having the same
2312014015162706/05/14Semiconductor device and method of manufacturing the same
2322014015177906/05/14Semiconductor memory device and method of manufacturing the same
2332014015178006/05/14Nonvolatile memory device and method of fabricating the same
2342014015178406/05/14Semiconductor memory device and method of manufacturing the same
2352014015180506/05/14Method for fabricating a connection region in a semiconductor device
2362014015184206/05/14Semiconductor apparatus
2372014015235806/05/14Semiconductor apparatus and duty cycle correction method thereof
2382014015236006/05/14Phase difference quantization circuit, delay value control circuit thereof, and delay circuit
2392014015334006/05/14Method for erasing charge trap devices
2402014015334206/05/14Semiconductor integrated circuit and method for monitoring reference voltage thereof
2412014015334406/05/14Semiconductor memory device, system having the same and method for generating reference voltage for operating the same
2422014015486606/05/14Method of forming a semiconductor memory device
2432014015688206/05/14Memory device, operating method thereof, and data storage device including the same
2442014015692406/05/14Semiconductor memory device with improved operating speed and data storage device including the same
2452014015708206/05/14Data storage device and method for processing error correction code thereof
2462014014514005/29/14Variable resistance memory device
2472014014534305/29/14Semiconductor device and method for manufacturing the same
2482014014569005/29/14Internal voltage generation circuits
2492014014575405/29/14Integrated circuit and operation method thereof


ARCHIVE: New 2014 2013 2012 2011 2010 2009



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