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Tektronix Inc
Tektronix Inc_20100121
Tektronix Inc_20131212

Tektronix Inc patents

Recent patent applications related to Tektronix Inc. Tektronix Inc is listed as an Agent/Assignee. Note: Tektronix Inc may have other listings under different names/spellings. We're not affiliated with Tektronix Inc, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "T" | Tektronix Inc-related inventors

 new patent  Recommending measurements based on detected waveform type

An oscilloscope including an input port for receiving training data including waveforms and corresponding known classifications and a processor for training a plurality of classifiers on the training data. Training includes iteratively applying each classifier to each waveform of the training data to obtain corresponding predicted waveform classifications and comparing... Tektronix Inc

Probe tip and probe assembly

A test probe tip can include a resistive element coupled with a tip component. The resistive element can include a resistive layer disposed on an exterior surface of a structural member of the resistive impedance element. In embodiments, the resistive element can be configured to form a structural component of... Tektronix Inc

Jitter and eye contour at ber measurements after dfe

A method of employing a Decision Feedback Equalizer (DFE) in a test and measurement system. The method includes obtaining an input signal data associated with an input signal suffering from inter-symbol interference (ISI). A bit sequence encoded in the input signal data is determined to support assigning portions of the... Tektronix Inc

High frequency time domain reflectometry probing system

A probe includes a self-aligning connector set, a moveable probe tip, a cable, a housing, and a spring. When the probe tip is pressed to a test point on a device-under-test, the probe tip moves within the housing to cause a first connector and a second connector of the self-aligning... Tektronix Inc

Composite user interface

A system for displaying information including a central processing unit, the central processing unit receiving real-time image data consisting of at least one of waveform and picture data, and web input data and producing a first graphics layer of web data, a second graphics layer of graticule data, and a... Tektronix Inc

Multi-band noise reduction systems and methods

Systems and methods directed towards reducing noise introduced into a signal when processing the signal are discussed herein. In embodiments a signal may initially be split by a multiplexer into two or more frequency bands. Each of the frequency bands can then be forwarded through an assigned channel. One or... Tektronix Inc

Determination of constellation impairment parameters via error-vector magnitude minimization

A test and measurement system is disclosed. The system includes a data store with a data description of a received in-phase (I) quadrature (Q) symbol. The received IQ symbol is received from a transmitter associated with impairments, and the received IQ symbol is modified from a corresponding ideal IQ symbol... Tektronix Inc

Electro-optic sensor system

An electro-optical sensor comprises an optical input configured to receive an optical carrier via an upstream fiber. The electro-optical sensor also includes an optical modulator configured to modulate an electrical signal onto the optical carrier to create an optical signal. The electro-optical sensor further includes an optical output configured to... Tektronix Inc

Multiple timebase sampling scope

A test and measurement instrument includes a first input port and a second input port that receive a first input signal modulated according to a first clock signal and a second input signal modulated according to a second clock signal, respectively. The first clock signal and the second clock signal... Tektronix Inc

Noise reduction in digitizing systems

Disclosed are systems and methods related to a noise reduction device employing an analog filter and a corresponding inverse digital filter. The combination and placement of the filters within the systems aids in reducing noise introduced by processing the signal. In some embodiments, the combination of filters may also provide... Tektronix Inc

Linear noise reduction for a test and measurement system

Disclosed is a mechanism for reducing noise caused by an analog to digital conversion in a test and measurement system. An adaptive linear filter is generated based on a converted digital signal and measured signal noise. The adaptive linear filter includes a randomness suppression factor for alleviating statistical errors caused... Tektronix Inc

Flexible resistive tip cable assembly for differential probing

A flexible resistive tip cable assembly includes a probe Radio Frequency (RF) connector structured to receive a RF differential signal and a testing connection assembly. A coaxial cable is structured to conduct the RF differential signal between the probe RF connector and the testing connection assembly. The coaxial cable includes... Tektronix Inc

Differential pin to rf adaptor for probing applications

A differential pin to RF adaptor includes a center conductor contact with an RF connector on one end and a signal contact on the other end. An insulating sleeve surrounds the central contact. A reference contact surrounds the insulating sleeve. The signal pin of the differential pair interfaces with the... Tektronix Inc

Dynamic output clamping for a probe or accessory

A probe or accessory for use with an electrical test and measurement instrument can include an input to receive an input signal from a device under test (DUT), a clamp control unit or oscilloscope to apply a clamping/limiting level to the input signal to generate an output signal, and/or a... Tektronix Inc

Active noise suppression for optical voltage sensor

A sensor head of a test and measurement instrument can include an input configured to receive an input signal from a device under test (DUT), an optical voltage sensor having signal input electrodes and control electrodes or one set of electrodes, wherein the input is connected to the signal input... Tektronix Inc

Trigger on final occurrence

This disclosure relates generally to test and measurement instruments structured to detect that a series of events occurred, and structured to generate a trigger signal in response to detecting that a final event in the series of events occurred. The trigger may be generated based on a timeout signal, or... Tektronix Inc

Camera stop calibrator

A stop-weighted light reference includes an LED light source and a pulse-generator structured to drive the light source at pre-defined levels. The pre-defeined levels relate to one another on a loge scale. The light reference may be used to characterize a non-calibrated camera. A look-up-table (LUT) of output values may... Tektronix Inc

Selective extraction of network link training information

An apparatus and method that captures a complete history of serial network Link Training negotiations by continuously monitoring multiple analog signals representing both sides of full duplex lanes in real-time by pattern matching the Link Training Frame Marker and the subsequent negotiation request/response data values. The apparatus and method compare... Tektronix Inc

Reducing an amount of captured network traffic data to analyze

A system and method for monitoring a communication network is provided. The method includes capturing network data from network traffic of the communication network by a plurality of probes monitoring the communication network. The method further includes detecting by lightweight analysis a data packet of the captured network data that... Tektronix Inc

Event activity trigger

Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the... Tektronix Inc

Calibration for test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing

A test and measurement instrument includes a coefficient storage facility coupled to a programmable filter. The coefficient storage facility is configured to store at least two pre-determined filter coefficient sets, and configured to pass a selected one of the at least two pre-determined filter coefficient sets to the filter based... Tektronix Inc

Group delay based averaging

Embodiments of the present invention provide techniques and methods for improving signal-to-noise ratio (SNR) when averaging two or more data signals by finding a group delay between the signals and using it to calculate an averaged result. In one embodiment, a direct average of the signals is computed and phases... Tektronix Inc

Joint estimation of coefficients for skew, gain imbalance and channel response for signal sources

A method of characterizing a test system includes generating a multi-tone stimulus signal, producing at least one pair of baseband signals form the multi-tone stimulus signal, capturing the at least one pair of baseband signals with a test instrument, characterizing the at least one pair of baseband signals to generate... Tektronix Inc

Position sensing in a probe to modify transfer characteristics in a system

Test and measurement probes include a body, an adjustable member moveably coupled to the body and having a changeable position relative to the body, and a transducer subsystem structured to measure the position of the adjustable member and configured to output a position signal indicative of the position of the... Tektronix Inc

Low complexity perceptual visual quality evaluation for jpeg2000 compressed streams

A method of detecting image quality in a wavelet transform-encoded image includes receiving wavelet transform-encoded image data partitioned into tiles, each tile partitioned into a number of subbands, evaluating a number of wavelets in fewer than the number of subbands, assigning a measure to each of the subbands evaluated for... Tektronix Inc

Offset stacked compressor amplifiers in a discrete digitizer system for noise reduction and increased resolution

A test and measurement instrument, including a splitter configured to split an input signal into two split input signals and output each split input signal onto a separate path and a combiner configured to receive and combine an output of each path to reconstruct the input signal. Each path includes... Tektronix Inc

Adaptive compensation for internal asymmetric delay in network based timing systems

Embodiments of the invention include a network-based timing instrument that has a master unit and an internal switch that communicate with a slave device. The master unit includes a timing compensator. The internal switch is coupled to the master unit by the internal network and is also coupled to an... Tektronix Inc

Method for automatically finding the optimum sampling point in an eye diagram

A system and method of multi-symbol communications from a transmitter to a receiver via a channel, including transmitting signals as a waveform representing a sequence of symbols, each symbol of unit-interval duration and each symbol associated with its own signal level. This method includes graphically representing the waveform as an... Tektronix Inc

Reduced stress electrical connector

An electrical connector including a main body, a base portion, and a tapered end. The electrical connector extends axially in a first direction and an opposite second direction. The main body is configured to connect to an electrical cable. The base portion abuts the main body at a first end... Tektronix Inc

Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter

A test and measurement instrument, including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signal, a plurality of harmonic mixers, each harmonic mixer configured to mix an associated split... Tektronix Inc

Continuous rf signal visualization with high resolution

A method and apparatus for continuous RF signal visualization with high resolution acquires RF signal data within a specified frequency bandwidth seamlessly to produce digitized time domain data. The digitized time domain data is processed in both the frequency and time domains to form high resolution spectral and time traces... Tektronix Inc

Test connector for coaxial cables

A connector for terminating a cable including a compressible fitting and a crimp nut. The compressible fitting has an inner passage to receive a portion of the cable and a threaded outer wall coaxial with and surrounding the inner passage. The outer wall includes a first slot extending radially through... Tektronix Inc

Test and measurement probe with adjustable test point contact

A probe for making electrical contact with a device-under-test test point includes a body, a rigid member capable of travelling linearly with respect to the body, a flexible arm having a test point contact at one end and fastened to the rigid member at the other end, and a flexible... Tektronix Inc

Cable assembly with spine for instrument probe

Embodiments of the present invention provide an improved cable assembly for connecting an electrical test and measurement probe to a device under test. One end of the probe is connected to a device under test (“DUT”), while the other end is connected to the instrument through one or more cables.... Tektronix Inc

Synchronization of unstable signal sources for use in a phase stable instrument

A vector network analyzer (VNA) can include a control processor, a plurality of receivers coupled with the control processor, the plurality of receivers having a common signal generator source, and a coupler/power divider network configured to distribute each of a plurality of source reference signals to a corresponding one of... Tektronix Inc

02/02/17 / #20170030945

Apparatus and time correlated signal acquisition and viewing

A test and measurement instrument and method are disclosed. The test and measurement instrument includes a display having a time domain graticule and a frequency domain graticule. A processor is configured to sample an input signal to generate a time domain waveform for display in the time domain graticule. The... Tektronix Inc

01/26/17 / #20170023628

Time corrected time-domain reflectometer

A test and measurement instrument including an input configured to receive a reflected and/or transmitted pulse signal from a device under test, a reference clock input configured to receive a reference signal, the reference signal being asynchronous from the reflected pulse signal, a phase reference module configured to acquire samples... Tektronix Inc

01/19/17 / #20170016935

High bandwidth differential lead with device connection

A signal lead structured to be attached to an electrical device that comprises a signal pad, a spring housing, a spring, and a flexible conduit. The spring is carried in the spring housing, and a portion of the spring extends beyond a surface of the spring housing when the spring... Tektronix Inc

01/12/17 / #20170012841

Method and system for optimizing a communication network feature prior to implementing a new service

A method, device and system for method of optimizing a feature of a communication network prior to implementing a future service is provided. A plurality of network nodes in the communication network is assigned to a network cluster. At least one value for a respective key performance indicator (KPI) for... Tektronix Inc

01/05/17 / #20170003321

Automatic frequency prescaler

A test and measurement instrument including an input port configured to receive an input signal. One or more divider circuits, coupled to the input port, employ a plurality of divide ratios such that each divide ratio scales an event signal indicating events in the input signal by a predetermined integer... Tektronix Inc

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009


This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Tektronix Inc in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Tektronix Inc with additional patents listed. Browse our Agent directory for other possible listings. Page by