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Teradyne Inc
Teradyne Inc A Massachusetts Corporation

Teradyne Inc patents


Recent patent applications related to Teradyne Inc. Teradyne Inc is listed as an Agent/Assignee. Note: Teradyne Inc may have other listings under different names/spellings. We're not affiliated with Teradyne Inc, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "T" | Teradyne Inc-related inventors


Thermal control using phase-change material

An example test system includes: a test slot to hold a device under test (DUT); a temperature control system comprising a phase-change material, with the temperature control system for maintaining a temperature of the phase-change material in a steady-state condition, with the phase-change material changing phase during a transient condition... Teradyne Inc

Vibration testing tool

An example apparatus, such as a vibration testing tool, includes: a housing configured to fit into, and to connect to, a test slot configured to house a device for testing, with the test slot being part of a device test system; accelerometers connected to the housing and configured to output... Teradyne Inc

Thermal control of a probe card assembly

An example test system includes a test head and a probe card assembly connected to the test head. The probe card assembly includes: a probe card having electrical contacts, a stiffener connected to the probe card to impart rigidity to the probe card, and a heater to heat to at... Teradyne Inc

Time-aligning a signal

An example method includes: obtaining sinusoidal signals comprising components of a first time-domain signal; shifting phases of the sinusoidal signals by amounts corresponding to a specified time-shift to produce phase-shifted signals, and converting the phase-shifted signals to the time domain to produce time-shifted signals. The shifting may be performed to... Teradyne Inc

Automatic test system with focused test hardware

A tester interface unit comprising a test hardware module. The test hardware module may have a simple construction, relying on control and/or signal processing in one or more tester instruments to generate or analyze test signals for a device under test. The test hardware module may be disposed within the... Teradyne Inc

Pocketed circuit board

An example circuit board structure includes: a substrate; and vias that are electrically conductive and that pass through the substrate to enable electrical connection through the circuit board structure. The substrate is thinner, and lengths of the vias are shorter, in first areas of the circuit board structure that deliver... Teradyne Inc

Front end module for automatic test equipment

Example automatic test equipment (ATE) includes: a test instrument for outputting test signals to test a device under test (DUT), and for receiving output signals from the DUT, with the test instrument including a front-end module, and with the front-end module including internal circuitry for performing functions relating to the... Teradyne Inc

Determining electrical path length

An example process for determining electrical path lengths includes: injecting current into a transmission line having a known capacitance per unit of length; determining a rate of change in voltage on the transmission line in response to the current; determining a capacitance of the transmission line based on the change... Teradyne Inc

Calibration device for automatic test equipment

Example automatic test equipment (ATE) includes: a test instrument for outputting test signals to test a device under test (DUT), and for receiving response signals based on the test signals; a device interface board (DIB) connected to the test instrument, with the DIB including an application space having a site... Teradyne Inc

Manipulator in automatic test equipment

An example manipulator for transporting a test head includes: a tower having a base and a track, with the track being vertical relative to the base; an arm to enable support for the test head, with the arm being connected to the track to move the test head vertically relative... Teradyne Inc

Conductive temperature control

A test system includes a transporter having test sockets, where each test socket is configured to receive a device to be tested by the test system, and each test socket includes an element that is controllable to change a temperature of a device in the test socket through thermal conduction.... Teradyne Inc

Mem relay assembly for calibrating automated test equipment

Apparatus and methods for calibrating tester channels of an automated test system are described. A relay matrix assembly comprising a plurality of microelectromechanical (MEM) switches may be used to connect a plurality of tester channels to analyzer calibration instrument rapidly without requiring serial, robotic probing of the test channels. The... Teradyne Inc








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