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Teradyne Inc
Teradyne Inc A Massachusetts Corporation
  

Teradyne Inc patents

Recent patent applications related to Teradyne Inc. Teradyne Inc is listed as an Agent/Assignee. Note: Teradyne Inc may have other listings under different names/spellings. We're not affiliated with Teradyne Inc, we're just tracking patents.

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "T" | Teradyne Inc-related inventors




Date Teradyne Inc patents (updated weekly) - BOOKMARK this page
06/15/17Pocketed circuit board
06/08/17Front end module for automatic test equipment
05/25/17Determining electrical path length
05/25/17Calibration device for automatic test equipment
04/27/17Manipulator in automatic test equipment
03/02/17Conductive temperature control
02/09/17Mem relay assembly for calibrating automated test equipment
10/20/16Bus interface system
08/25/16Virtual distance test techniques for radar applications
08/04/16High speed data transfer using calibrated, single-clock source synchronous serializer-deserializer protocol
06/30/16Braking system
06/23/16Controlling a per-pin measurement unit
05/12/16Assembling devices for probe card testing
04/28/16Thermal control
03/31/16Grasping gripper
03/03/16Multi-stage equalization
03/03/16One-shot circuit
02/25/16Probe alignment
02/25/16Capacitive opens testing of low profile components
01/21/16Coaxial structure for transmission of signals in test equipment
01/14/16Controlling signal path inductance in automatic test equipment
01/07/16Edge generator-based phase locked loop reference clock generator for automated test system
12/31/15Structure for transmitting signals in an application space between a device under test and test electronics
10/22/15Circuitry to protect a test instrument
10/01/15Current regulation for accurate and low-cost voltage measurements at the wafer level
10/01/15Equi-resistant probe distribution for high-accuracy voltage measurements at the wafer level
05/21/15Automated test system with edge steering
05/21/15Interconnect for transmitting signals between a device and a tester
05/07/15Automated test system with event detection capability
03/12/15Executing code on a test instrument in response to an event
03/05/15Synchronizing data from different clock domains
10/16/14Electronic assembly test system
09/18/14Air circulation in a system
09/18/14Smooth vi mode crossover method at compliance limit threshold
09/18/14Method and low latency communication in an automatic testing system
09/18/14Method and device testing using multiple processing paths
08/28/14Rotatable camera module testing system
08/28/14Matrix testing targets
07/24/14Embedded tester
07/03/14Test system having liquid containment chambers over connectors
07/03/14Interface for a test system
05/22/14Debugging in a semiconductor device test environment
10/03/13Managing energy transmission
10/03/13Edge triggered calibration
05/16/13Fast single-ended to differential converter
05/02/13Determining propagation delay
05/02/13Controlling the temperature of an object
05/02/13Programmable test instrument
05/02/13Test instrument having a configurable interface
05/02/13Programmable test instrument
04/25/13Test system supporting simplified configuration for controlling test block concurrency
03/21/13Storage device testing systems
12/20/12Bulk transfer of storage devices using manual loading
12/13/12Test equipment calibration
10/18/12Probe-card interposer constructed using hexagonal modules
09/06/12Identifying fuel cell defects
08/30/12General purpose protocol engine
05/31/12Storage device transport, clamping and testing
04/26/12Storage device testing
04/05/12Electro-optical communications link
04/05/12Emergency discharge feature
03/01/12Engaging test slots
02/09/12Transferring disk drives within disk drive testing systems
12/22/11Damping vibrations within storage device testing systems
12/22/11Transferring storage devices within storage device testing systems
Patent Packs
12/15/11Management of air-borne vibration
11/10/11System for concurrent test of semiconductor devices
09/01/11Fast open circuit detection for open power and ground pins
08/25/11Method and testing electrical connections on a printed circuit board
08/04/11Test slot carriers
08/04/11Storage device testing system cooling
07/14/11Enclosed operating area for storage device testing systems
04/14/11Temperature control within storage device testing systems
04/14/11Programmable protocol generator
03/24/11Methods and connecting printed circuit boards using zero-insertion wiping force connectors
03/17/11Storage device testing system cooling
02/17/11Laser targeting mechanism
01/20/11Test slot cooling system for a storage device testing system
12/09/10Method for testing in a reconfigurable tester
12/09/10Protocol aware digital channel apparatus
Patent Packs
12/02/10Temperature control within disk drive testing systems
10/21/10Disk drive transport, clamping and testing
10/21/10Disk drive transport, clamping and testing
10/14/10Automated test equipment employing test signal transmission channel with embedded series isolation resistors
08/19/10Test access component for automatic testing of circuit assemblies
08/05/10Vibration isolation within disk drive testing systems
08/05/10Disk drive transport, clamping and testing
08/05/10Disk drive transport, clamping and testing
07/08/10Processing storage devices
04/08/10Disk drive emulator and use thereof
12/03/09Processing storage devices
10/22/09Enclosed operating area for disk drive testing systems
10/22/09Temperature control within disk drive testing systems
10/22/09Vibration isolation within disk drive testing systems
10/22/09Fast, low power formatter for automatic test system
10/22/09Transferring disk drives within disk drive testing systems
10/22/09Bulk feeding disk drives to disk drive testing systems
10/22/09Temperature control within disk drive testing systems
10/22/09Temperature control within disk drive testing systems
10/22/09Transferring storage devices within storage device testing systems
10/22/09Dependent temperature control within disk drive testing systems
10/22/09Disk drive emulator and use thereof
09/10/09System and mounting shielded cables to printed circuit board assemblies
08/27/09Test system with high frequency interposer
07/02/09Time measurement of periodic signals
07/02/09Timing signal generator providing synchronized timing signals at non-integer clock multiples adjustable by more than one period
07/02/09Device and method to reduce simultaneous switching noise
07/02/09Decoding of lvds protocols
07/02/09Apparatus and controlling memory overrun
06/18/09Disk drive testing
Social Network Patent Pack
06/18/09Disk drive testing
06/18/09Disk drive transport, clamping and testing
06/04/09Vacuum assisted manipulation of objects
05/21/09Method and computing interpolation factors in sample rate conversion systems
04/30/09Protocol aware digital channel apparatus
04/23/09Automated test equipment interface
04/23/09Laser targeting mechanism
04/16/09Adjustable test pattern results latency
03/26/09X-ray inspection of solder reflow in high-density printed circuit board applications
06/30/11Test slot cooling system for a storage device testing system
Patent Packs
01/20/11Conductive heating
01/20/11Storage device temperature sensing
09/16/10Compensating for harmonic distortion in an instrument channel
07/08/10Bulk feeding disk drives to disk drive testing systems
07/01/10Transferring disk drives within disk drive testing systems
07/01/10Transferring storage devices within storage device testing systems







ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009



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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. Freshpatents.com is not affiliated or associated with Teradyne Inc in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Teradyne Inc with additional patents listed. Browse our Agent directory for other possible listings. Page by FreshPatents.com

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