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United Microelectronics Corporation
United Microelectronics Corporation_20131212
  

United Microelectronics Corporation patents

Recent patent applications related to United Microelectronics Corporation. United Microelectronics Corporation is listed as an Agent/Assignee. Note: United Microelectronics Corporation may have other listings under different names/spellings. We're not affiliated with United Microelectronics Corporation, we're just tracking patents.

ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "U" | United Microelectronics Corporation-related inventors




Date United Microelectronics Corporation patents (updated weekly) - BOOKMARK this page
09/21/17 new patent  Method of epitaxial structure formation in a semiconductor
07/20/17Method for manufacturing a high-voltage finfet device having ldmos structure
04/27/17Device with reinforced metal gate spacer and fabricating
02/16/17Fin-shaped field effect transistor
12/22/16Novel dummy gate technology to avoid shorting circuit
12/22/16Integrated circuit and signal monitoring method thereof
12/08/16Semiconductor device and manufacturing the same
11/17/16Method for tuning metal gate work function before contact formation in fin-shapped field effect transistor manufacturing process
11/17/16Method of manufacturing non-volatile memory having sonos memory cells
11/10/16High-side field effect transistor
09/22/16Method of interfacial oxide layer formation in semiconductor device
09/22/16Method for manufacturing semiconductor device
09/15/16Method of fabricating electrostatic discharge protection structure
09/08/16Fabricating back-illuminated image sensor with dishing depression surface
09/08/16Fin field-effect transistor
06/23/16Method for coupling circuit element and package structure
06/09/16Fin field effect transistor device and fabrication method thereof
06/02/16Method for planarizing semiconductor device
05/26/16Finfet structure
05/19/16Method for forming semiconductor device with low sealing loss
05/19/16High-voltage finfet device having ldmos structure and manufacturing the same
05/12/16Metal-insulator-metal capacitor structure and manufacturing the same
04/14/16Method for cleaning contact hole and forming contact plug therein
03/31/16Capacitor structure and fabricating method thereof
03/31/16Semiconductor device and manufacturing the same
03/31/16Etching forming grooves in si-substrate and fin field-effect transistor
03/24/16Shallow trench isolation structures in semiconductor device and manufacturing the same
03/24/16Electrostatic discharge protector
03/10/16Integrated semiconductor device and fabricating the same
03/03/16Method for planarizing semiconductor device
03/03/16Pfet and cmos containing same
02/18/16Substrate cleaning cleaning a substrate
02/18/16Fin field effect transistor device and fabrication method thereof
02/18/16Semiconductor device and fabricating the same
02/11/16Semiconductor device and manufacturing the same
01/28/16Shallow trench isolation structures in semiconductor device and manufacturing the same
01/28/16Field-effect transistor and fabricating method thereof
01/21/16Asymmetry compensation method used in lithography overlay process
01/21/16Method for fabricating cmos image sensors and surface treating process thereof
12/17/15Method and post-opc verification
12/10/15Clock skew adjusting structure
11/19/15Method for compensating slit illumination uniformity
11/19/15Method and integrated circuit design
11/05/15Fabricating trench gate metal oxide semiconductor field effect transistor
10/29/15Spatial semiconductor structure
09/10/15Manufacturing process of gate stack structure with etch stop layer
09/03/15Semiconductor process
07/16/15Chuck and semiconductor process using the same
06/04/15Integrated semiconductor device and fabricating the same
05/28/15Ldmos structure and manufacturing method thereof
05/21/15Method for manufacturing metal-insulator-metal capacitor structure
05/14/15Semiconductor electrostatic discharge protection apparatus
04/16/15Method for forming damascene opening and applications thereof
04/02/15Process of forming seed layer in vertical trench/via
03/26/15Clock skew adjusting method and structure
03/19/15Interposer structure and manufacturing method thereof
03/12/15Vertical transistor device and fabricating method thereof
02/19/15Spatial semiconductor structure and fabricating the same
02/19/15Method for fabricating semiconductor device
01/22/15Chip with electrostatic discharge protection function
01/08/15Memory cell array
12/25/14Programmable memory cell and data read method thereof
12/25/14Method for planarizing semiconductor devices
12/18/14Method of fabricating semiconductor patterns
11/06/14Field-effect transistor and fabricating method thereof
Patent Packs
10/09/14Method and device for pulse width estimation
10/02/14Color filter layer and fabricating the same
08/14/14Method for fabricating integrated circuit with different gate heights and different materials
08/07/14Silicon wafer cleaning method
07/31/14Memory for a voltage regulator circuit
07/24/14Operation a supply voltage generation circuit used for a memory array
07/17/14Image sensor and fabricating the same
07/17/14Method of fabricating capacitor structure
07/03/14Electrostatic discharge protection structure
07/03/14Electrostatic discharge protection structure and fabricating method thereof
05/29/14Memory and operation method thereof
05/22/14Memory cell and memory cell array using the same
04/10/14Method for fabricating semiconductor device
04/03/14Fabricating trench-gate metal oxide semiconductor device
03/27/14Layout semiconductor circuit structure
Patent Packs
03/20/14Method for fabricating optical micro structure and applications thereof
03/13/14Compound semiconductor epitaxial structure and fabricating the same
03/13/14Fabricating shallow trench isolation structure
03/06/14Capacitor structure and fabricating method thereof
03/06/14Chuck and semiconductor process using the same
02/06/14Metal oxide semiconductor transistor
12/26/13Manufacturing anti punch-through leakage current metal-oxide-semiconductor transistor
12/19/13Method for fabricating patterned polyimide film and applications thereof
12/19/13Back-illuminated image sensor and fabricating method thereof
12/12/13Manufacturing process of gate stack structure with etch stop layer
12/05/13Method for fabricating semiconductor device
11/28/13Thinned wafer and fabricating method thereof
11/28/13Electrostatic discharge protection circuit
10/24/13Semiconductor chip and fabricating method thereof
10/03/13Wafer sawing method and wafer structure beneficial for performing the same
09/26/13Method for fabricating patterned dichroic film
09/26/13Non-volatile memory
09/26/13Liquid crystal on silicon display panel and manufacturing the same
09/19/13Semiconductor device and fabricating the same
09/12/13Integrated circuit and fabricating the same
09/05/13Method for fabricating semiconductor device
08/22/13Cleaning solution and damascene process using the same
08/15/13Semiconductor device
08/15/13Electrostatic discharge protection apparatus
07/25/13High voltage mosfet device
07/18/13Memory device and voltage interpreting read bit line
07/04/13Integrated circuit configuration and fabricating method thereof
07/04/13Semiconductor device for electrostatic discharge protecting circuit
07/04/13Sense-amplifier circuit of memory and calibrating method thereof
06/20/13Fin-type field effect transistor
Social Network Patent Pack
06/13/13Monitoring testkey used in semiconductor fabrication
06/13/13Substrate carrier and applications thereof
05/23/13High voltage semiconductor device
05/23/13Electrostatic discharge protection circuit
05/23/13Semiconductor device and fabrication method thereof
05/09/13High voltage semiconductor device and fabricating method thereof
05/09/13Metal-insulator-metal capacitor structure and manufacturing the same
05/02/13Fabricating semiconductor element
04/18/13Bond pad structure and fabricating method thereof
04/11/13Fin field-effect transistor structure
Patent Packs
04/11/13Semiconductor device and fabrication method thereof
04/11/13Electrostatic discharge (esd) protection device
04/11/13Fin field-effect transistor structure and manufacturing process thereof
03/21/13Bonding pad structure and fabricating method thereof
03/21/13Image sensor and fabricating the same
03/21/13Circuit structure of test-key and test method thereof
03/21/13Fabricating semiconductor elements
03/14/13Integrated circuit device
03/14/13Chip stacking structure
03/07/13Diaphragm of mems electroacoustic transducer
03/07/13Integrated circuit and fabricating the same
02/28/13Pre-clean epitaxial deposition and applications thereof
02/21/13Shallow trench isolation structure and fabricating method thereof
02/21/13Charge pump
02/14/13Trench-gate metal oxide semiconductor device and fabricating method thereof
02/14/13Probe calibration device and calibration method
02/14/13Buffer circuit with regulating function and regulating circuit thereof
02/14/13Reticle removing apparatus and reticle removing method using the same
09/20/12Method of fabricating complementary metal-oxide-semiconductor (cmos) device
08/09/12Fin field-effect transistor structure
06/14/12Damascene structure
10/20/11Metal gate structure and fabricating method thereof
10/13/11Wafer level package of mems microphone and manufacturing method thereof
10/06/11Integrated circuit and fabricating method thereof
08/11/11Electro-static discharge (esd) clamping device
08/11/11Alternating current (ac) stress test circuit, evaluating ac stress induced hot carrier injection (hci) degradation, and test structure for hci degradation evaluation
08/11/11Method for controlling polishing wafer
08/04/11Method of etching oxide layer and nitride layer
06/23/11Light emitting diode and fabricating method thereof
06/23/11Method of forming an electrical fuse and a metal gate transistor and the related electrical fuse
Patent Packs
06/23/11Method of etching oxide layer and nitride layer
03/25/10Method for forming barrier layer and the related damascene structure
12/12/13Manufacturing process of gate stack structure with etch stop layer







ARCHIVE: New 2017 2016 2015 2014 2013 2012 2011 2010 2009



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