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Bruker Nano Inc patents


Recent patent applications related to Bruker Nano Inc. Bruker Nano Inc is listed as an Agent/Assignee. Note: Bruker Nano Inc may have other listings under different names/spellings. We're not affiliated with Bruker Nano Inc, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "B" | Bruker Nano Inc-related inventors


Sample vessel retention structure for scanning probe microscope

A sample vessel retention mechanism for an inverted microscope having an optical objective and a scanning probe microscope (spm) head. The inverted microscope includes a platform for supporting a sample vessel, in which is formed an aperture sized to provide a passage for the objective of the inverted microscope to approach the sample vessel from below. ... Bruker Nano Inc

Method and apparatus of operating a scanning probe microscope

Methods and apparatuses are provided for automatically controlling and stabilizing aspects of a scanning probe microscope (spm), such as an atomic force microscope (afm), using peak force tapping (pft) mode. In an embodiment, a controller automatically controls periodic motion of a probe relative to a sample in response to a substantially instantaneous force determined, and automatically controls a gain in a feedback loop. ... Bruker Nano Inc

Peakforce photothermal-based detection of ir nanoabsorption

An apparatus and method of performing photothermal chemical nanoidentification of a sample includes positioning a tip of a probe at a region of interest of the sample, with the tip-sample separation being less than about 10 nm. Then, ir electromagnetic energy having a selected frequency, ω, is directed towards the tip. ... Bruker Nano Inc

Chemical nano-identification of a sample using normalized near-field spectroscopy

Apparatus and method for nano-identification a sample by measuring, with the use of evanescent waves, optical spectra of near-field interaction between the sample and optical nanoantenna oscillating at nano-distance above the sample and discriminating background backscattered radiation not sensitive to such near-field interaction. Discrimination may be effectuated by optical data acquisition at periodically repeated moments of nanoantenna oscillation without knowledge of distance separating nanoantenna and sample. ... Bruker Nano Inc

Multi-module photon detector and use thereof

The invention relates to a photon detector (10), in particular an x-ray detector, in the form of a measurement finger, which extends along a detector axis (23) and has a detector head (11) at a first end of the measurement finger, wherein the detector head (11) comprises a plurality of at least two detector modules (22), each comprising a sensor chip (12) sensitive to photon radiation (14), in particular x-radiation, said sensor chip having an exposed end face (13) and a face facing away from the end face (13), wherein the detector modules (22) are arranged around the detector axis (23) in a plane (24) extending orthogonally to the detector axis (23).. . ... Bruker Nano Inc

Super resolution microscopy

A super resolution microscope system is disclosed and described. The system can include a sample stage (180) adapted to receive a sample (185) including probe molecules. ... Bruker Nano Inc

Method and apparatus of operating a scanning probe microscope

An improved mode of afm imaging (peak force tapping (pft) mode) uses force as the feedback variable to reduce tip-sample interaction forces while maintaining scan speeds achievable by all existing afm operating modes. Sample imaging and mechanical property mapping are achieved with improved resolution and high sample throughput, with the mode workable across varying environments, including gaseous, fluidic and vacuum.. ... Bruker Nano Inc

Force measurement with real-time baseline determination

An atomic force microscope (afm) and corresponding method to provide low force (sub-20 pn) afm control and mechanical property measurement is provided. The preferred embodiments employ real-time false deflection correction/discrimination by adaptively modifying the drive ramp to accommodate to deflection artifacts.. ... Bruker Nano Inc

Field-mapping and focal-spot tracking for s-snom

System and method for optical alignment of a near-field system, employing reiterative analysis of amplitude (irradiance) and phase maps of irradiated field obtained in back-scattered light while adjusting the system to arrive at field pattern indicative of and sensitive to a near-field optical wave produced by diffraction-limited irradiation of a tip of the near-field system. Demodulation of optical data representing such maps is carried out at different harmonics of probe-vibration frequency. ... Bruker Nano Inc

Peakforce photothermal-based detection of ir nanoabsorption

. . . . An apparatus and method of performing photothermal chemical nanoidentification of a sample includes positioning a tip of a probe at a region of interest of the sample, with the tip-sample separation being less than about 10 nm. Then, ir electromagnetic energy having a selected frequency, w, is directed towards the tip. ... Bruker Nano Inc








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