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Carl Zeiss Microscopy Gmbh patents


Recent patent applications related to Carl Zeiss Microscopy Gmbh. Carl Zeiss Microscopy Gmbh is listed as an Agent/Assignee. Note: Carl Zeiss Microscopy Gmbh may have other listings under different names/spellings. We're not affiliated with Carl Zeiss Microscopy Gmbh, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "C" | Carl Zeiss Microscopy Gmbh-related inventors


Imaging device for imaging an object and for imaging a structural unit in a particle beam apparatus

The system described herein relates to an imaging device for imaging an object in a particle beam apparatus and/or for imaging a structural unit of a particle beam apparatus, and to a particle beam apparatus having such an imaging device. The imaging device has an illumination unit having a first switching state and a second switching state for illuminating the object and/or the structural unit with illumination light, where, in the first switching state, the illumination light comprises only light of a first spectral range and where, in the second switching state, the illumination light comprises only light of a second spectral range. ... Carl Zeiss Microscopy Gmbh

High-voltage supply unit and circuit arrangement for generating a high voltage for a particle beam apparatus

The system described herein relates to a high-voltage supply unit for providing an output voltage for a particle beam apparatus, wherein the particle beam apparatus is embodied as, for example, an electron beam apparatus and/or an ion beam apparatus. The system described herein is based on the fact that it was recognized that a bipolar voltage supply unit can be formed by means of a unipolar first current source and a unipolar second current source, said bipolar voltage supply unit enabling a load current in two directions. ... Carl Zeiss Microscopy Gmbh

High-resolution spectrally selective scanning microscopy of a sample

The invention relates to the high-resolution spectrally selective scanning microscopy of a sample. The sample is excited with illumination radiation in order to emit fluorescence radiation such that the illumination radiation is bundled into an illumination spot in or on the sample. ... Carl Zeiss Microscopy Gmbh

Multi-line detection method

A method for multi-line detection, in which a number m of regions rm to be read, with m=1, . . ... Carl Zeiss Microscopy Gmbh

Devices and methods for spectroscopic analysis

The present invention relates to devices and methods for spectrometric analysis of light-emitting samples. The device comprises a particle beam source, which generates a primary particle beam directed to the sample in such a way that the primary particle beam is incident on the sample and photons are released from the sample due to the interaction between primary particle beam and sample material. ... Carl Zeiss Microscopy Gmbh

Method of operating a microscope

. . A method of operating a microscope comprises recording a first image i1h of a sample, wherein the first image contains a first feature f1; recording a second image i2h of the sample, wherein the second image contains a second feature f2 arranged at a distance from the first feature; displacing the sample relative to the microscope by a displacement ; recording a third image i3h of the sample, wherein the third image contains the second feature; recording a fourth image i4h of the sample, wherein the fourth image contains a third feature f3 arranged at a distance from the second feature; and determining a position of the third feature relative to the first feature based on the first, second, third and fourth images.. . ... Carl Zeiss Microscopy Gmbh

Assembly and method for beam shaping and for light sheet microscopy

A beam shaping assembly has a device for generating a collimated radiation, which contains, in the beam path of the collimated radiation in a space domain a diffraction device for generating a non-diffraction-limited beam, and in a frequency domain a modification device for converting the non-diffraction-limited beam. The present invention furthermore relates to a method for beam shaping and to an assembly for light sheet microscopy. ... Carl Zeiss Microscopy Gmbh

Light sheet microscopy arrangement and method

An arrangement and method for light sheet microscopy. The arrangement has an illumination apparatus for producing a light sheet for illuminating a stripe of a specimen, and has a detection apparatus for detecting fluorescence radiation emitted by the specimen. ... Carl Zeiss Microscopy Gmbh

Apparatus and method for capturing images using lighting from different lighting angles

Methods and apparatuses in which a plurality of images are recorded at different illumination angles are provided. The plurality of images are combined in order to produce a results image with an increased depth of field.. ... Carl Zeiss Microscopy Gmbh

Movable mirror device

. . A movable mirror device is provided as a unitary device with a position sensor and an analog-to-digital converter included in the unitary device.. . ... Carl Zeiss Microscopy Gmbh

Particle beam system and method for operating a particle optical unit

A method for operating a multi-beam particle optical unit comprises includes providing a first setting of effects of particle-optical components, wherein a particle-optical imaging is characterizable by at least two parameters. The method also includes determining a matrix a, and determining a matrix s. ... Carl Zeiss Microscopy Gmbh

Light microscope and method for recording images with a light microscope

The invention relates to a method for recording images with a light microscope, wherein a specimen container with a specimen is arranged on a specimen holder of the light microscope, and wherein illuminating light is guided onto the specimen. The illuminating light can hereby be cut in a cross-section transversely to an optical axis of the light microscope through a wall of the specimen container to a limited cross-sectional region. ... Carl Zeiss Microscopy Gmbh

Microscope for the spherically corrected imaging of three-dimensional objects

The invention relates to a system for spherically correcting imaging of a three-dimensional object, comprising a microscope comprising an immersion medium and an embedding medium for holding the three-dimensional object separated from the immersion medium of the microscope by a boundary surface or a cover slip. According to the invention, the thickness (Δs) of the immersion medium and the position (Δs′) of the primary intermediate image of the three-dimensional object can be variably modified.. ... Carl Zeiss Microscopy Gmbh

Method and device for determining the position of an optical boundary surface along a first direction

A method for determining the position of an optical boundary surface along a first direction includes a) imaging a pattern in a plane transverse to the first direction, and recording a two-dimensional image of the pattern imaged in the plane; b) repeating step a) for different positions in the first direction, wherein the different positions cover an area in the first direction in which the optical boundary surface lies; c) averaging each image from step a) along a direction transverse to the second direction such that in each case a one-dimensional data set is produced; d) transforming each data set from step c) into a frequency domain; e) determining the frequency of the greatest amplitude of all data sets transformed in step d); and f) determining the position along the first direction by evaluating the data sets transformed in step d) at the frequency determined in step e).. . ... Carl Zeiss Microscopy Gmbh

12/07/17 / #20170350763

Detector device for detection of a spectral portion for a microscope

A detection device (113) for a microscope comprises a dispersive element (211) in the beam path (290) of light and a selection element (212). The selection element (212) separates a beam path (291) of a spectral portion of the light from the beam path (290) of the light. ... Carl Zeiss Microscopy Gmbh

11/23/17 / #20170336335

Generating an image of an object or a representation of data about the object

Generating an image of an object and/or a representation of data about the object uses a particle beam apparatus. The particle beam apparatus comprises at least one control unit for setting a guide unit by selecting a value of a control parameter of the control unit. ... Carl Zeiss Microscopy Gmbh

11/16/17 / #20170329129

Method for generating a control function and method for operating a scanning unit

A method for generating a control signal is provided. The method includes the steps of decomposing a desired movement into two partial movements which are separately equalized, and the desired control signal is obtained by summing up the corrected components. ... Carl Zeiss Microscopy Gmbh

11/09/17 / #20170322409

Microscope

A microscope includes a holder for holding a sample, an objective for imaging at least apart of a sample held by the holder, a detection module, a control unit for setting the focus position of the objective in a first direction for the recording by means of the detection module, and a focusing module for maintaining a set focus position of the objective. The focusing module includes the control unit, a second detector and first focusing optics with adjustable focal length. ... Carl Zeiss Microscopy Gmbh

10/26/17 / #20170309443

Method for generating a composite image of an object and particle beam device for carrying out the method

The system described herein relates to a method for generating a composite image of an object using, for example, a particle beam device such as an electron beam device and/or an ion beam device. A composite image is generated by relatively arranging a first sub image to a second sub image such that the first sub image overlaps the second sub image in the entire common region, a calculated first image position of a first marking in the first sub image is arranged on the first image position of the first marking in the second sub image, and a calculated second image position of a second marking in the first sub image is arranged on the second image position of the second marking in the second sub image.. ... Carl Zeiss Microscopy Gmbh

10/12/17 / #20170294285

Charged particle beam system

An ion source includes an external housing, an electrically conductive tip, a gas supply system, configured to supply an operating gas into the neighborhood of the tip, and a cooling system configured to cool the tip. The gas supply system includes a first tube with a hollow interior, and a chemical getter material is provided in the hollow interior of the tube.. ... Carl Zeiss Microscopy Gmbh

10/12/17 / #20170293126

Microscope and component for multi-beam scanning

A laser-scanning microscope having an illumination-beam path and a detection-beam path and a microscope objective. A component for generating a plurality of scanning beams from at least one illumination beam is located in the illumination-beam path. ... Carl Zeiss Microscopy Gmbh

09/28/17 / #20170280039

Image capturing device and method for image capturing

. . For image recording purposes, an object is illuminated at a plurality of illumination angles. A detector captures a plurality of images (41-43) of the object for the plurality of illumination angles. ... Carl Zeiss Microscopy Gmbh

09/28/17 / #20170276923

Phase contrast imaging

An object is illuminated from at least one illuminating direction. For each illuminating direction, an intensity image of the object is captured during the illumination. ... Carl Zeiss Microscopy Gmbh

09/21/17 / #20170269345

Light sheet microscope and method for operating same

A microscope including an illumination objective with a first optical axis, embodied to produce a light sheet, and a detection objective with a second optical axis, embodied to detect light coming from the specimen plane. The illumination objective and the detection objective are aligned relative to one another and the specimen plane so that the first and second optical axes intersect in the specimen plane and include a substantially right angle therebetween. ... Carl Zeiss Microscopy Gmbh

09/14/17 / #20170264876

Method for correcting a color reproduction of a digital microscope and digital microscopee

. . A method for correcting colors of a color reproduction of a digital microscope and a digital microscope are described. In a first step of a method according to the invention, a color image of a sample that is to be examined under the microscope is recorded. ... Carl Zeiss Microscopy Gmbh

09/14/17 / #20170262968

Method for generating a result image and optical device

An object (100) is illuminated sequentially using at least two illumination geometries (110-1, 110-2). An intensity image of the object (100) is captured for each one of the at least two illumination geometries (110-1, 110-2). ... Carl Zeiss Microscopy Gmbh

09/14/17 / #20170261741

Image capturing device and method for image capturing

For image recording purposes, an object is illuminated at a plurality of illumination angles. A detector captures a plurality of images (41-43) of the object for the plurality of illumination angles. ... Carl Zeiss Microscopy Gmbh

09/07/17 / #20170254640

Method for determining height information of a sample, and scanning microscope

The invention relates to a method for determining height information of a sample, and to a scanning microscope. The method comprises the following steps: generating an illumination spot; illuminating the sample with the illumination spot; capturing an image of a reflection of the illumination spot at the sample; evaluating the lateral distribution of the image; determining the height information from the lateral distribution; wherein the illumination spot has a three dimensional illumination pattern and/or the image in a detection beam path has a three dimensional detection pattern. ... Carl Zeiss Microscopy Gmbh

08/24/17 / #20170242233

Adjusting mechanism of a sample holder, microscope with adjusting mechanism, and method

An adjusting mechanism of a sample holder is provided. The adjusting mechanism includes a base with drives arranged thereon, and a carrier that is adjustable by means of the drives and is designed to receive the sample holder. ... Carl Zeiss Microscopy Gmbh

08/17/17 / #20170236683

Particle beam apparatus and method for operating a particle beam apparatus

The system described herein relates to a particle beam apparatus for analyzing and/or for processing an object and to a method for operating a particle beam apparatus. The particle beam apparatus is designed for example as an electron beam apparatus and/or an ion beam apparatus. ... Carl Zeiss Microscopy Gmbh

08/10/17 / #20170227749

High-resolution scanning microscopy with discrimination between at least two wavelength ranges

A microscopy high-resolution scanning method, including exciting a sample with illumination radiation focused at a point to form a diffraction-limited illumination spot so as to emit fluorescence radiation. The point is imaged in a diffraction image on a spatially resolving two-dimensional detector. ... Carl Zeiss Microscopy Gmbh

08/10/17 / #20170227748

Device and method for multispot scanning microscopy

The invention relates to a device for multispot scanning microscopy, having a multicolour light source for providing at least one illumination light beam, having a splitting device for splitting the illumination light beam into a plurality of illumination sub-beams, having first optical means for providing an illumination optical path for guiding and focussing the individual illumination sub-beams respectively into a light spot on or in a specimen to be examined, having a scan unit for guiding the light spots over the probe, having a detection unit for detecting detection light emitted by the specimen in detection sub-beams after irradiation with the individual illumination sub-beams, having second optical means for providing a detection optical path for guiding the detection sub-beams to the detector unit, having a control and evaluation unit for controlling the scan unit and for evaluating the detection light detected by the detection unit. The device is characterised in that in the illumination optical path for at least two of the illumination sub-beams a controllable beam manipulation means is present for independent setting of a spectral composition of the respective illumination sub-beam, and the control and evaluation unit is designed to control the beam manipulation means. ... Carl Zeiss Microscopy Gmbh

08/03/17 / #20170219811

Method for illuminating an object in a digital light microscope, digital light microscope and bright field reflected-light illumination device for a digital light microscope

The invention relates to a method for illuminating an object in a digital light microscope, to a digital light microscope, and to a bright field reflected-light illumination device for a digital light microscope. According to the invention, the bright field reflected-light illumination and the dark field reflected-light illumination are configured with light-emitting diodes as light sources and are individually or jointly drivable via a control unit. ... Carl Zeiss Microscopy Gmbh

07/20/17 / #20170205617

Method and device for imaging an object

At least two images (201-1-201-3) of an object (100) are obtained, wherein each image has an illumination field (110-1-110-3) associated therewith, which is associated with predetermined beam shape properties (111-1-111-3). For each one of the at least two images (201-1-201-3) an effect of the beam shape properties is added to a predetermined approximation of the object, the approximation is adjusted by means of fourier ptychography techniques on the basis of the respective image and then the effect of the beam shape properties is removed from the adapted approximation of the object.. ... Carl Zeiss Microscopy Gmbh

07/06/17 / #20170192216

Light microscope and microscopy method

An optical microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. ... Carl Zeiss Microscopy Gmbh

06/29/17 / #20170184834

High-resolution scanning microscopy

In a microscope for high resolution scanning microscopy of a sample, said microscope comprising—an illumination device for illuminating the sample, —an imaging device for scanning at least one point spot or line spot across the sample and for imaging the point spot or line spot into a diffraction-limited, stationary single image with magnification into a detection plane, —a detector device for detecting the single image in the detection plane for different scanning positions with a spatial resolution, which, taking into consideration the magnification, is at least twice as high as a full width at half maximum of the diffraction-limited single image, —an evaluation device for evaluating a diffraction pattern of the single image for the scanning positions from data of the detector device and for generating an image of the sample, said image having a resolution that is increased beyond the diffraction limit, provision is made for—the detector device to have a detector array, which has pixels and is larger than the single image, and—a non-imaging redistribution element, which is disposed upstream of the detector array and distributes the radiation from the detection plane in a non-imaging manner among the pixels of the detector array.. . ... Carl Zeiss Microscopy Gmbh

06/22/17 / #20170176734

Method for correcting illumination-dependent aberrations in a modular digital microscope, digital microscope and data-processing program

. . The invention relates to a method of correcting illumination-dependent aberrations in a modular digital microscope comprising a coaxial bright field illumination apparatus, a motor-driven zoom apparatus, an objective, a digital image acquisition unit and an image processing unit. The method according to the invention is based on the use of calibration data, which are preferably stored in the image processing unit as a calibration data record. ... Carl Zeiss Microscopy Gmbh

06/22/17 / #20170176337

Fast high-resolution microscopy method and fast high-resolution microscope

A fast, high-resolution localization microscopy method for a specimen containing fluorescence emitters. In a bright state, emitters emit fluorescent radiation upon excitation irradiation, and in a dark state, the fluorescence emitters do not emit fluorescent radiation upon excitation irradiation. ... Carl Zeiss Microscopy Gmbh

06/15/17 / #20170168284

Light field imaging with scanning optical unit

An optical device comprises a light source and a detector, and also a sample holder, which is configured to fix an object in the optical path of light. A scanning optical unit is configured, for a multiplicity of scanning positions, in each case selectively to direct light incident from different angular ranges from the object onto the detector. ... Carl Zeiss Microscopy Gmbh

06/15/17 / #20170168283

3d localization microscopy and 4d localization microscopy and tracking methods and systems

A 3d localization microscopy system, 4d localisation microscopy system, or an emitter tracking system arranged to cause a phase difference between light passing to or from one part of the objective relative to light passing to or from another part of the objective, to produce a point emitter image which comprises two lobes, a separation between which is related to the position of the emitter relative to the objective of the imaging system, and in the 4d system a further property of the image or of the light to or from the objective is related to another location independent property of the emitter.. . ... Carl Zeiss Microscopy Gmbh

06/15/17 / #20170167856

Determining the position of an object in the beam path of an optical device

To determine a position of an object (100) parallel to the optical axis (120) of an optical device (1), the object (100) is illumined from a first illumination direction (210-1) and from a second illumination direction (210-2) and an image (230-1, 230-2) is acquired in each case. The position of the object (100) is determined based on a distance (250) between imaging locations of the object (220-1, 220-2) in the images (230-1, 230-2).. ... Carl Zeiss Microscopy Gmbh

06/08/17 / #20170162364

Detecting charged particles

The system described herein detects charged particles which, for example, are generated by interaction of a charged particle beam with an object to be analyzed using, for example, a particle beam device. Detection is carried out for imaging of the object. ... Carl Zeiss Microscopy Gmbh

06/01/17 / #20170154752

Charged particle optical apparatus for through-the lens detection of particles

Disclosed is a charged particle optical apparatus. The charged particle optical apparatus has a liner electrode in a first vacuum zone. ... Carl Zeiss Microscopy Gmbh

05/18/17 / #20170138855

Device for simultaneous fluorescence contrasting effect in transmitted light and reflected light

The invention relates to a device for simultaneous fluorescence contrasting effect in transmitted light and reflected light, having a reflected light optical path for focusing of the excitation light via a lens onto a sample, having a fluorescence signal, which extends from the sample and is directed onto the same lens, having a dichroite, an emission filter, and a detection unit for the purpose of separating the excitation light from the fluorescence signal and for detection, having a luminescent layer behind the sample and a diaphragm for partial coverage of the excitation optical path between the sample and the luminescent layer, whereby a part of the excitation optical path, which impinges onto the luminescent layer, emits light, which irradiates the sample past the diaphragm by forming an oblique transmitted light illumination.. . ... Carl Zeiss Microscopy Gmbh

05/11/17 / #20170133194

Particle beam system

Particle beam system comprising a particle source; a first multi-aperture plate with a multiplicity of openings downstream of which particle beams are formed; a second multi-aperture plate with a multiplicity of openings which are penetrated by the particle beams; an aperture plate with an opening which is penetrated by all the particles which also penetrate the openings in the first and the second multi-aperture plate; a third multi-aperture plate with a multiplicity of openings which are penetrated by the particle beams, and with a multiplicity of field generators which respectively provide a dipole field or quadrupole field for a beam; and a controller for feeding electric potentials to the multi-aperture plates and the aperture plate so that the second openings in the second multi-aperture plate respectively act as a lens on the particle beams 3 and feed adjustable excitations to the field generators.. . ... Carl Zeiss Microscopy Gmbh

05/11/17 / #20170131534

Microscope

A microscope including a sample carrier configured to support a sample. Excitation light illuminates the sample via an excitation beam path. ... Carl Zeiss Microscopy Gmbh

05/04/17 / #20170123198

Device for optical examination of a specimen, method for examining a specimen and method for transferring a device into an operation-ready state

The invention relates to a device for optical examination of a specimen with a cryo-immersion objective, having a stative, to which the cryo-immersion objective is fixed, wherein the cryo-immersion objective has a plurality of optical components, in particular lenses, and wherein the cryo-immersion objective has an optical front component which is in contact during operation with a coolable immersion liquid, having a specimen carrier for a specimen to be examined, having means for providing a cooled immersion liquid between the optical front component and the specimen to be examined on or against the specimen carrier. The device is characterised in that insulating means are present for interrupting a heat transition between the stative and the optical front component. ... Carl Zeiss Microscopy Gmbh

04/27/17 / #20170117114

Method for operating a multi-beam particle microscope

A method includes: generating a multiplicity of particle beams such that the particle beams penetrate a predetermined plane side-by-side and have within a volume region around the predetermined plane in each case one beam focus; scanning a first region of the surface of an object with the particle beams and detecting first intensities of particles produced by the particle beams while setting an operating parameter of the multi-beam particle microscope; and determining first values of an object property based on the first intensities. The first values represent the object property within the first region, and the object property represents a physical property of the object. ... Carl Zeiss Microscopy Gmbh

04/27/17 / #20170116746

Method for segmenting a color image and digital microscope

The present invention relates to a method for automatically segmenting a color image composed of pixels having been captured for example using a digital microscope. The method provides for a color to be selected representing a region to be segmented of the color image. ... Carl Zeiss Microscopy Gmbh

04/20/17 / #20170108682

Confocal microscope with aperture correlation

The invention relates to a confocal microscope and a method for determining a topography of a sample by means of correlative spinning disk microscopy. An object stage and/or a focus drive is moved vertically in order to determine the topography, while first and second images of a sample placed on the object stage are captured in an alternating manner. ... Carl Zeiss Microscopy Gmbh

04/13/17 / #20170102533

Image correction method and microscope

An image correction method is provided in which, in order to capture images, a scanning beam is guided over an object plane by a beam-directing element, and at detection times a brightness value of a detection signal of an object location scanned at the respective detection time is detected in the object plane, wherein actual positions of the beam-directing element and the positions of the object locations which are associated with the actual positions are known at every detection time. A pixel array with known positions of each pixel of the pixel array is defined in the object plane, a number of pixels adjacent to the object location is acquired, and the brightness value which is detected at an object location is assigned proportionally to the adjacent pixels of the object location as brightness value portions. ... Carl Zeiss Microscopy Gmbh

04/06/17 / #20170099429

Autofocus method for microscope and microscope comprising autofocus device

A microscope including an objective having a focal plane in a sample space, and an autofocus device comprising a light modulator for generating a luminous modulation object that is intensity-modulated periodically along one direction, an autofocus illumination optical unit that images the modulation object such that its image arises in the sample space, an autofocus camera, an autofocus imaging optical unit that images the image of the modulation object in the sample space onto the autofocus camera, a control device, which receives signals of the autofocus camera and determines an intensity distribution of the image of the modulation object and generates a focus control signal therefrom. The control device determines an intensity distribution of the image of a luminous comparison object imaged by the optical unit to correct the intensity distribution of the image of the modulation object with regard to reflectivity variations in the sample space.. ... Carl Zeiss Microscopy Gmbh

03/30/17 / #20170090176

Microscope

A microscope is provided with a holder for holding a sample carrier, an imaging unit which comprises a first detector and a first imaging optical system for imaging at least one part of a sample held by the sample carrier along a first optical axis onto the first detector, a control unit and a detection unit which comprises an illuminating module, a second detector and a second imaging optical system. The control unit only analyzes the measured values originating from the analysis area by the second detector in order to determine the direction of the change of position of the focus of the first imaging optical system along the first optical axis with the aim of positioning the boundary surface of the sample carrier directed towards the sample side in the depth of field area of the first imaging optical system.. ... Carl Zeiss Microscopy Gmbh

02/09/17 / #20170038575

Arrangement for light sheet microscopy

. . An arrangement for lightsheet microscopy. In the arrangement, a detection objective includes a first adaptive optical detection correction element arranged in the beam path or which can be introduced into the latter. ... Carl Zeiss Microscopy Gmbh

02/09/17 / #20170038321

Analyzing an object using a particle beam apparatus

Described herein is a method for analyzing an object using a particle beam apparatus, for example an electron beam apparatus and/or an ion beam apparatus, or using an x-ray beam device and a particle beam apparatus or an x-ray beam device, by means of which the method is carried out. In the method, information about the object is loaded from a data memory into a control device. ... Carl Zeiss Microscopy Gmbh

02/02/17 / #20170032925

Charged particle detecting device and charged particle beam system with same

A charged particle detecting device is disclosed which includes: a holding structure; a first charged particle detector at the terminal portion of the holding structure, the first charged particle detector being configured to generate a first electrical signal when a first species of charged particles impinges on the first charged particle detector; a second charged particle detector at the terminal portion of the holding structure, the second charged particle detector is configured to generate a second electrical signal when a second species of charged particles impinges on the second charged particle detector; a detector head at the terminal portion of the holding structure, the detector head defining a hollow volume within which a particle entrance surface of the first charged particle detector and a particle entrance surface of the second charged particle detector are arranged; and a first electrode which is transmissive for the first and second species of charged particles covering an entrance opening of the detector head.. . ... Carl Zeiss Microscopy Gmbh

01/26/17 / #20170025249

Method of determining crystallographic properties of a sample and electron beam microscope for performing the method

A method of determining crystallographic properties of a sample includes: generating first and second electron beams of electrons having first and second mean kinetic energies, respectively; detecting, for each of first locations of a region of the sample, a two-dimensional spatial distribution of electrons incident onto a detection area while directing the first electron beam onto the first locations; generating, for each of the first locations, first data representing the two-dimensional spatial distribution; detecting, for each of second locations of the region of the sample, a two-dimensional spatial distribution of electrons incident onto the detection area while directing the second electron beam onto the second locations; generating, for each of the second locations, second data representing the two-dimensional spatial distribution; and determining the crystallographic properties for target locations of the region based on the first data of the first locations and the second data of the second locations.. . ... Carl Zeiss Microscopy Gmbh

01/12/17 / #20170011885

Method for preparing cross-sections by ion beam milling

The disclosure provides a method for preparing a cross-section of a sample by milling with a focused ion beam. The cross-section is to be prepared at a pre-defined position. ... Carl Zeiss Microscopy Gmbh

01/05/17 / #20170003489

Optics device with an optics module that comprises at least one optical element

An optics device with an optics module that includes at least one optical element and a control module for controlling the optics device is provided. The optics module includes a sub-system with a memory as well as at least one of an actuator and a sensor. ... Carl Zeiss Microscopy Gmbh








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