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Dcg Systems Inc patents (2015 archive)


Recent patent applications related to Dcg Systems Inc. Dcg Systems Inc is listed as an Agent/Assignee. Note: Dcg Systems Inc may have other listings under different names/spellings. We're not affiliated with Dcg Systems Inc, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "D" | Dcg Systems Inc-related inventors


12/31/15 / #20150377958

Apparatus and method for nanoprobing of electronic devices

A method for probing a semiconductor device under test (dut) using a combination of scanning electron microscope (sem) and nanoprobes, by: obtaining an sem image of a region of interest (roi) in the dut; obtaining a cad design image of the roi; registering the cad design image with the sem image to identify contact targets; obtaining a netlist corresponding to the contact targets and using the netlist to determine which of the contact targets should be selected as test target; and, navigating nanoprobes to land a nanoprobe on each of the test targets and form electrical contact between the nanoprobe and the respective test target.. . ... Dcg Systems Inc

12/31/15 / #20150377921

Through process flow intra-chip and inter-chip electrical analysis and process control using in-line nanoprobing

System for performing in-line nanoprobing on semiconductor wafer. A wafer support or vertical wafer positioner is attached to a wafer stage. ... Dcg Systems Inc

12/10/15 / #20150355118

Method for examination of a sample by means of the lock-in thermography

Method for a non-destructive and image forming examination of a sample (1) by means of a heat flow thermography method where the examination consists of evaluating the presence of any gradients in heat flow velocity at respective depth distances from a surface of the sample (1), comprising exciting the sample (1) by means of periodic heat pulses p1 from at least one excitation source, and capturing thermal image sequences of a thermal flow originating from the heat pulses by at least one infrared camera (5), implementing relative time delays Δt between a starting point of imaging of the respective image sequences and a starting point of the periodic excitation, combining all captured image sequences to a resulting image sequence in which all images are arranged in a correct time sequence, and extracting from the resulting image sequence an indication of the existence and depth distance of a heat flow velocity transition from a surface of the sample. Exciting the sample (1) comprises applying heat pulses to the sample with a lock-in frequency equal to or higher than one fourth of the imaging frequency of the camera for exciting the sample (1), controlling an excitation period of the heat pulses during which the excitation of the sample (1) by means of the heat pulses takes place, and capturing thermal image sequences comprises capturing the plural image sequences during successive excitation periods of the heat pulses with the imaging frequency. ... Dcg Systems Inc

11/26/15 / #20150338458

Lock in thermal laser stimulation through one side of the device while acquiring lock-in thermal emission images on the opposite side

Controlled amount of heat is injected into a stacked die using a light beam, and the propagated heat is measuring with lit camera from the other side of the die. The thermal image obtained can be characterized so that it can be used to calibrate the phase shift from a given stack layer, or can be used to identify defects in the stacked die. ... Dcg Systems Inc

10/22/15 / #20150301078

System and method for non-contact microscopy for three-dimensional pre-characterization of a sample for fast and non-destructive on sample navigation during nanoprobing

A system for performing sample probing. The system including an topography microscope configured to receive three-dimensional coordinates for a sample based on at least three fiducial marks; receive the sample mounted in a holder; and navigate to at least a location on the sample based on the at least three fiducial marks and the three-dimensional coordinates.. ... Dcg Systems Inc

09/17/15 / #20150260976

Self correcting floating sil tip

An optics arrangement for a solid immersion lens (sil) is disclosed. The arrangement enables the sil to freely tilt. ... Dcg Systems Inc

09/17/15 / #20150260789

System and method for fault isolation by emission spectra analysis

An apparatus and method for optical probing of a dut is disclosed. The system enables identifying, localizing and classifying faulty devices within the dut. ... Dcg Systems Inc

06/18/15 / #20150168444

Probe-based data collection system with adaptive mode of probing

A system for analyzing a sample is described. The system for analyzing a sample includes a probe and a controller circuit. ... Dcg Systems Inc

05/28/15 / #20150146424

Led lighting device

Led illuminating device, comprises a housing (2), within which an array of led elements (26) is arranged, a plurality of lenses (28) which are associated with the led elements (26), as well as a supporting plate (20) with openings (34) for receiving the lenses (28), wherein the openings (34) for the lenses (28) in the supporting plate (20) are arranged, at least in part, out-of-center with respect to the led elements (26).. . ... Dcg Systems Inc

04/02/15 / #20150091602

Optimized wavelength photon emission microscope for vlsi devices

A method for emission testing of a semiconductor device (dut), by mounting the dut onto an test bench of an emission tester, the emission tester having an optical detector; electrically connecting the dut to an electrical tester; applying electrical test signals to the dut while keeping test parameters constant; serially inserting one of a plurality of shortpass filters into an optical path of the emission tester and collecting emission test signal from the optical detector until all available shortpass filters have been inserted into the optical path; determining appropriate shortpass filter providing highest signal to noise ratio of the emission signal; inserting the appropriate shortpass filter into the optical path; and, performing emission testing on the dut.. . ... Dcg Systems Inc








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