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Dcg Systems Inc patents (2016 archive)


Recent patent applications related to Dcg Systems Inc. Dcg Systems Inc is listed as an Agent/Assignee. Note: Dcg Systems Inc may have other listings under different names/spellings. We're not affiliated with Dcg Systems Inc, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "D" | Dcg Systems Inc-related inventors


Particle beam heating to identify defects

A charged particle beam, such as an electron beam or an ion beam, scans a device while a signal is applied to the device. As the particle beam scans, it locally heats the device, altering the local electrical characteristics of the device. ... Dcg Systems Inc

Method and system for resolving hot spots in lit

Localizing hot spots in multi layered device under test (dut) by using lock-in thermography (lit) where plural hot spots of electrical circuits are buried in the dut at different depth layers from a bottom layer to a top layer, comprises applying test signals of multiple frequencies to the electrical circuits of the dut for exciting the hot spots; imaging a top surface of the top layer of the dut at timed intervals to obtain ir images of the dut while the test signal is applied to the electrical circuits wherein the images are in correlation to a propagation of heat from the hot spots in the dut; detecting the thermal response signals at the timed intervals from the images taken from the dut; and determining changes in the appearance of hot spot images on the top surface of the dut in relation to the frequencies of the thermal response signals.. . ... Dcg Systems Inc

Method for imaging a feature using a scanning probe microscope

Using a local-potential-driving probe drives a conductor to a known potential while adjacent lines are grounded through the sample body reduces electrostatic scanning microscope signal from adjacent lines, allows imaging of metal lines deeper in the sample. Providing different potentials locally on different conductive lines using multiple local-potential-driving probes allows different conductors to be highlighted in the same image, for example, by changing the phase of the signal being applied to the different local-potential-driving probes.. ... Dcg Systems Inc

Laser-assisted device alteration using synchronized laser pulses

A pulsed-laser lada system is provided, which utilizes temporal resolution to enhance spatial resolution. The system is capable of resolving cmos pairs within the illumination spot using synchronization of laser pulses with the dut clock. ... Dcg Systems Inc

Systems and method for laser voltage imaging state mapping

An apparatus and method for laser probing of a dut is disclosed. The system enables laser voltage imaging state mapping of devices within the dut. ... Dcg Systems Inc

System and method for modulation mapping

Probing an integrated circuit (ic), by: electrically applying stimulation signal to said ic; scanning a selected area of said ic with a monochromatic beam; collecting beam reflection from the selected area of said ic, wherein the beam reflection correspond to modulation of the monochromatic beam by active devices of said ic; converting said beam reflection to an electrical probing signal; selecting a frequency or a band of frequencies of said probing signal; utilizing the probing signal to generate a spatial modulation map for various locations over the selected area of said ic; and displaying the spatial map on a monitor, wherein grey scale values correspond to modulation signal values.. . ... Dcg Systems Inc








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