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Horiba Jobin Yvon Sas patents

Recent patent applications related to Horiba Jobin Yvon Sas. Horiba Jobin Yvon Sas is listed as an Agent/Assignee. Note: Horiba Jobin Yvon Sas may have other listings under different names/spellings. We're not affiliated with Horiba Jobin Yvon Sas, we're just tracking patents.

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Device and method for characterizing a sample using localized measurements

A device for characterizing a sample includes a measuring instrument for determining a physical characteristic of the sample, and a positioning system for positioning the measuring instrument in relation to the sample. The positioning system includes a localization target, a unit for acquiring and analysing images, and image analysis unit suitable for analysing the image of the portion of the localization target to determine the position and orientation of the optical imaging system in relation to the localization target and a processing unit processing results of image analysis and calibration, suitable for determining an absolute position of the localized measurement point in a referential system linked to the sample, the measuring instrument being positioned to take the measurement at said localized measurement point and the physical characteristic of the sample being determined by the measuring instrument at the localized measurement point.. ... Horiba Jobin Yvon Sas

System and method for transferring a fluid sample in a fluid cell

A system for transferring a fluid sample in a fluid cell, includes a first and a second fluid circuit connected, respectively, to a first and a second inlet-outlet (1, 2) of a fluid cell (10), first injection elements (80) configured so as to inject, in series, into the first fluid circuit (11, 12, 13): a buffer solution, a first separation fluid volume followed by a fluid sample, then a second separation fluid volume and another buffer solution. The system includes first discharge elements arranged on the first fluid circuit near the first inlet-outlet (1), second injection elements (90, 91) arranged on the second fluid circuit (21, 22, 23) near the second inlet-outlet (2), and two-way circulation elements configured so as to circulate the fluid sample in two opposite directions in the fluid cell (10) without the passage of separation fluid into the fluid cell (10).. ... Horiba Jobin Yvon Sas

Apparatus and method for optical beam scanning microscopy

An optical beam scanning microscopy apparatus includes a light source adapted to emit an optical beam (2) and a microscope objective (1) adapted for focusing the optical beam (2) in an object plane (11). The microscopy apparatus includes first and second reflecting optical elements (m-x1, m-x2) disposed in series on the optical path of the optical beam (2) between the light source and the microscope objective (1), first elements of angular tilting (21, 25) adapted for tilting the first reflecting optical elements (m-x1, m-xy1) according to a first predetermined rotation angle (rx1), and second elements of angular tilting (22, 26) adapted for tilting the second reflecting optical elements (m-x2, m-xy2) according to a second rotation angle (rx2), in such a way as to angularly tilt the axis (12) of the optical beam (2) by pivoting about the center (o) of the pupil of the microscope objective (1).. ... Horiba Jobin Yvon Sas

Glow discharge spectroscopy method and system for measuring in situ the etch depth of a sample

A glow discharge spectrometry system includes a glow discharge lamp suitable for receiving a solid sample (10) and forming a glow discharge etching plasma (19). The system (100) for measuring in situ the depth of the erosion crater generated by etching of the sample (10) includes an optical separator (3), optical elements (4) suitable for directing a first incident beam (21) toward a first zone (11) of the sample, the first zone being exposed to the etching plasma, and a second incident beam (22) toward a second zone (12) of the same side of the sample, the second zone being protected from the etching plasma, respectively, and an optical recombining device (3) suitable for forming an interferometric beam (30) so as to determine the depth (d) of the erosion crater.. ... Horiba Jobin Yvon Sas

Process and apparatus for measuring an organic solid sample by glow discharge spectrometry

A system and a process for measuring, by glow discharge spectrometry, the elemental and/or molecular chemical composition of an organic solid sample (10). The sample (10) is positioned so as to seal a glow discharge plasma reactor (2), a gaseous mixture including at least one inert gas and gaseous oxygen is injected into the reactor (2), the concentration of gaseous oxygen being between 0.1% and 15% by weight of the gaseous mixture, an electric discharge of radiofrequency type is applied to the electrodes of the plasma reactor (2) in order to generate a glow discharge plasma, and the solid sample (10) is exposed to the plasma so as to etch an erosion crater in the solid sample (10); at least one signal representative of an ionized species of negative charge is selected and measured using a mass spectrometer (4).. ... Horiba Jobin Yvon Sas

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