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Infinitesima Limited patents


Recent patent applications related to Infinitesima Limited. Infinitesima Limited is listed as an Agent/Assignee. Note: Infinitesima Limited may have other listings under different names/spellings. We're not affiliated with Infinitesima Limited, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "I" | Infinitesima Limited-related inventors


Measurement system

A measurement system comprising: a radiation source arranged to generated a detection beam; a probe; and a probe positioning system arranged to move the probe from an un-aligned position in which it is not illuminated by the detection beam, to an aligned position in which it is illuminated by the detection beam and the detection beam is reflected by the probe to generate a reflected detection beam. A scanner generates a relative scanning motion between the probe and a sample, the sample being aligned with the probe and interacting with the probe during the relative scanning motion. ... Infinitesima Limited

Scanning probe system with two prove drivers

A scanning probe system with a probe comprising a cantilever extending from a base to a free end, and a probe tip carried by the free end of the cantilever. A first driver is provided with a first driver input, the first driver arranged to drive the probe in accordance with a first drive signal at the first driver input. ... Infinitesima Limited

Scanning probe system with multiple probes

A method of operating a scanning probe system that includes a probe support and probes carried by the probe support is disclosed. Each probe includes a cantilever extending from the support to a free end and a tip carried by the free end. ... Infinitesima Limited

Probe actuation system with feedback controller

A probe actuation system has a detection system arranged to measure a position or angle of a probe to generate a detection signal. An illumination system is arranged to illuminate the probe. ... Infinitesima Limited

Probe system with multiple actuation locations

A probe system comprising a probe with first and second arms and a probe tip carried by the first and second arms. An illumination system is arranged to deform the probe by illuminating the first arm at a first actuation location and the second arm at a second actuation location each with a respective illumination power. ... Infinitesima Limited








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