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Jeol Ltd patents


Recent patent applications related to Jeol Ltd. Jeol Ltd is listed as an Agent/Assignee. Note: Jeol Ltd may have other listings under different names/spellings. We're not affiliated with Jeol Ltd, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "J" | Jeol Ltd-related inventors


Inductive coupling in multiple resonance circuits in a nuclear magnetic resonance probe and methods of use

In various embodiments of the invention, inductive coupling can be to a secondary coil rather than a primary coil in order to optimize the topology of the nmr probe. In addition, by coupling to a secondary coil using a detection coil located below the lower insulator the rf homogeneity and signal to noise can be improved together with the nmr probe topology. ... Jeol Ltd

Scanning electron microscope

A scanning electron microscope includes: a liner tube which transmits an electron beam; a scintillator having a through-hole into which the liner tube is inserted; a light guide which guides light generated by the scintillator; a conductive layer provided on a sensitive surface of the scintillator; and a conductive member provided in the scintillator, wherein the shortest distance between the liner tube and the conductive member is shorter than the shortest distance between the liner tube and the conductive layer, a voltage for accelerating electrons is applied to the conductive layer, and the conductive layer and the conductive member have a same potential.. . ... Jeol Ltd

Ionization method selection assisting apparatus and method

An ionization method selection assisting image includes a coefficient axis indicating the magnitude of a partition coefficient, a plurality of method indicators representing a plurality of coefficients or a plurality of coefficient ranges corresponding to a plurality of ionization methods, and a sample marker representing the partition coefficient specified for a sample. The ionization method selection assisting image is displayed to a user. ... Jeol Ltd

Liner tube and electron microscope

There is provided a liner tube capable of reducing the effects of magnetic field variations on an electron beam. The liner tube (10) is disposed inside the electron optical column (2) of an electron microscope (100). ... Jeol Ltd

Nmr measurement method and apparatus

A whole measurement process includes a plurality of step combinations. Each of the step combinations is composed of a solution-state measurement step and a solid-state measurement step. ... Jeol Ltd

Method of image acquisition and electron microscope

There is provided a method of image acquisition capable of reducing the effects of diffraction contrast. This method of image acquisition is implemented in an electron microscope for generating electron microscope images with electrons transmitted through a sample. ... Jeol Ltd

Control device, and information storage medium

A control device controls an analyzing device or a processing device by using an application performing control for causing a gui image including a plurality of gui components to be displayed on a display screen of a display unit. The control device includes: a gui component designation information receiving unit that receives gui component designation information used for designating a gui component among the gui components; a position information acquiring unit that identifies the gui component designated on the basis of the gui component designation information and acquires position information indicating a position of the identified gui component on the display screen from an operation system; and an emphasizing image display control unit that performs control for causing an image for emphasizing the identified gui component to be displayed on the display screen on the basis of the position information.. ... Jeol Ltd

Method for quantifying vitamin d, mass spectrometer and reagent kit for quantifying vitamin d

Provided is a method for quantifying vitamin d, with the vitamin d contained in a biological sample being derivatized with a derivatization reagent and being measured with a mass spectrometer, the method including, a derivatization step of derivatizing n number of samples by using n types of 4-(4′-dimethylaminophenyl)-1,2,4-triazoline-3,5-dione (daptad) isotopologues respectively as derivatization reagents, a mixing step of mixing the n types of derivatization samples obtained in the derivatization step, and a quantitative analysis step of subjecting each of the n types of vitamin d derivatives contained in the mixed sample obtained in the mixing step to quantitative analysis using a mass spectrometer.. . ... Jeol Ltd

Electron microscope and method of operating same

There is provided an electron microscope capable of producing good images by reducing contrast nonuniformity. The electron microscope (1) includes: an electron beam source (11) for producing an electron beam; a noise cancelling aperture (12) and an amplifier (42) for detecting a part of the electron beam; an effective value computing circuit (44) and a low frequency cut-off circuit (46) for extracting a dc component of an effective value of a detection signal emanating from the amplifier (42); an image detector (15) for detecting a signal produced in response to impingement of the beam on a sample (a); a preamplifier circuit (20) and an amplifier circuit (30); a divider circuit (54) for performing a division of the output signal (x) from the amplifier circuit (30) by the output signal (y) from the amplifier circuit (42) and producing a quotient signal indicative of the result of the decision (x/y); and a multiplier circuit (58) for multiplying the quotient signal by a signal (z) extracted by the low frequency cut-off circuit (46).. ... Jeol Ltd

Electron microscope and image acquisition method

There is provided an electron microscope capable of recording images in a shorter time. The electron microscope (100) includes: an illumination system (4) for illuminating a sample (s) with an electron beam; an imaging system (6) for focusing electrons transmitted through the sample (s); an electron deflector (24) for deflecting the electrons transmitted through the sample (s); an imager (28) having a photosensitive surface (29) for detecting the electrons transmitted through the sample (s), the imager (28) being operative to record focused images formed by the electrons transmitted through the sample (s); and a controller (30) for controlling the electron deflector (24) such that an active electron incident region (2) of the photosensitive surface (29) currently hit by the beam is varied in response to variations in illumination conditions of the illumination system (4).. ... Jeol Ltd

Objective lens and transmission electron microscope

There is provided an objective lens capable of reducing the effects of magnetic fields on a sample. The objective lens permits observation of the sample at high resolution. ... Jeol Ltd

Observation method and specimen observation apparatus

Provided is an observation method including: acquiring an observed image that has been photographed by the first specimen observation apparatus with the specimen holder being mounted on the first specimen stage, the observed image having an observation target position of a specimen positioned at a center thereof, and including the plurality of markers (step s104); acquiring pixel coordinates of each of the plurality of markers in the observed image (step s106); acquiring stage coordinates of each of the plurality of markers on the second specimen stage having the specimen holder mounted thereon (step s108); and converting, based on the pixel coordinates of the plurality of markers and the stage coordinates of the plurality of markers, pixel coordinates of the center of the observed image into stage coordinates to move the second specimen stage to the obtained stage coordinates (step s112).. . ... Jeol Ltd

Method for derivatizing an s-cis-diene compound, derivatization reagent kit, and method for analyzing an s-cis-diene compound

Provided is a method for derivatizing an s-cis-diene compound with a cookson-type derivatization reagent, the method including adding, in a reaction stopping step of stopping a derivatization reaction of the s-cis-diene compound, a decomposition inhibitor to inhibit decomposition of a derivative to be obtained.. . ... Jeol Ltd

Image processing apparatus, image processing method, and analyzer

Provided is an image processing apparatus, which is configured to perform smoothing processing on a mapping image obtained by detecting a signal emitted from one of a plurality of analysis areas of a specimen. The image processing apparatus includes: a memory; and a processor configured to execute a program stored in the memory to perform: processing for calculating a difference between a maximum value and a minimum value of signal intensity data being intensity information on the signal of one of pixels within the mapping image, and determining a degree of smoothing to be used for the smoothing processing based on the difference; and processing for performing the smoothing processing based on the determined degree of smoothing.. ... Jeol Ltd

02/01/18 / #20180031657

Relaxation time measuring method and magnetic resonance measuring apparatus

A method includes forming n spin-cavity coupling states that are mutually different in coupling state between a cavity accommodating a sample therein and a spin of the sample, calculating n values of spin-cavity coupling constant, measuring n values of apparent relaxation time through magnetic resonance measurement applied on the sample, and calculating relaxation time corresponding to specific spin-cavity coupling constant based on the relationship between the n values of spin-cavity coupling constant and the n values of apparent relaxation time.. . ... Jeol Ltd

02/01/18 / #20180031591

Automatic analyzer and program

According to an aspect of the present invention, there is provided an automatic analyzer that detects a liquid level by using an electrostatic capacity system. Feature values are extracted from time-series oscillating frequency data of an alternating current signal that is output by an oscillation circuit in a period from a time point at which a dispensing probe starts moving downward till a time point at which a certain period of time has elapsed. ... Jeol Ltd

02/01/18 / #20180031499

Magnetic coupling high resolution nuclear magnetic resolution probe and method of use

In an embodiment of the invention inductive coupling of an idler coil to a parent coil is used to provide a double resonance circuit without the disadvantages of capacitive coupling to the parent coil. In an embodiment of the invention, an inductive coupling coil can be used to achieve a double-tuned circuit. ... Jeol Ltd

01/25/18 / #20180024207

Method for manufacturing detection coil for magnetic resonance measurement

A manufacturing method includes forming a superconductive thin-film layer on a substrate and processing the superconductive thin-film layer into a shape of a detection coil for magnetic resonance measurement. Accordingly, a superconductive thin-film layer having the detection coil shape can be formed. ... Jeol Ltd

12/21/17 / #20170365442

Charged particle beam system and method of aberration correction

. . There is provided a charged particle beam system for reducing phase variations in a charged particle beam due to sixth order three-lobe aberration. The charged particle beam system (100) is equipped with an aberration corrector (30) for correcting aberrations in the optical system, and includes: an aberration measuring section (44) for measuring sixth order three-lobe aberration of sixth order geometric aberration, a computing section (46) for computing the magnitude of at least one of fourth order three-lobe aberration of fourth order geometric aberration and three-fold astigmatism of second order geometric aberration for reducing phase variations in the charged particle beam due to the sixth order three-lobe aberration on the basis of the measured sixth order three-lobe aberration, and a controller (48) for controlling the aberration corrector (30) to produce at least one of the fourth order three-lobe aberration and the three-fold astigmatism on the basis of the computed magnitude.. ... Jeol Ltd

11/23/17 / #20170336485

Magnetic resonance signal detection module

A pair of detection coils, one coil provided on each side of a sample container across the width of the sample container. The detection coil is made of a superconductor and has an electric circuit pattern capable of detecting a magnetic resonance signal from a sample. ... Jeol Ltd

11/16/17 / #20170330723

Electron microscope and method of controlling same

There is provided an electron microscope in which a crossover position can be kept constant. The electron microscope (100) includes: an electron source (110) for emitting an electron beam; an acceleration tube (170) having acceleration electrodes (170a-170f) and operative to accelerate the electron beam; a first electrode (160) operative such that a lens action is produced between this first electrode (160) and the initial stage of acceleration electrode (170a); an accelerating voltage supply (112) for supplying an accelerating voltage to the acceleration tube (170); a first electrode voltage supply (162) for supplying a voltage to the first electrode (160); and a controller (109b) for controlling the first electrode voltage supply (162). ... Jeol Ltd

09/28/17 / #20170278669

Three-dimensional image reconstruction method, image processor, and electron microscope

A three-dimensional image reconstruction method associated with the present invention comprises the steps of: obtaining a first transmission electron microscope image of a sample containing the membrane proteins present within a lipid membrane, the image having been taken by illuminating an electron beam on the sample from a direction tilted relative to a line normal to the membrane surface of the lipid membrane (step s10); obtaining a second transmission electron microscope image of the sample taken by illuminating the electron beam on the sample perpendicularly to the membrane surface of the lipid membrane (step s12); identifying orientations of the membrane proteins of the first transmission electron microscope image on a basis of the second transmission electron microscope image (step s14); and analyzing a three-dimensional structure of the membrane proteins from the first transmission electron microscope image on a basis of information about the identified orientations of the membrane proteins (step s18).. . ... Jeol Ltd

08/17/17 / #20170236684

Electron microscope and method of aberration measurement

There is provided an electron microscope capable of measuring aberration with high accuracy. The electron microscope (100) comprises: an electron beam source (10) for producing an electron beam (eb); an illumination lens system (101) for focusing the electron beam (eb) onto a sample (s); a scanner (12) for scanning the focused electron beam (eb) over the sample (s); an aperture stop (30) having a plurality of detection angle-limiting holes (32) for extracting rays of the electron beam (eb) having mutually different detection angles from the electron beam (eb) transmitted through the sample (s); and a detector (20) for detecting the rays of the electron beam (eb) passed through the aperture stop (30).. ... Jeol Ltd

08/17/17 / #20170236681

Method of aberration correction and charged particle beam system

There are disclosed an aberration correction method and a charged particle beam system capable of correcting off-axis first order aberrations. The aberration correction method is for use in the charged particle beam system (100) equipped with an aberration corrector (30) which has plural stages of multipole elements (32a, 32b) and a transfer lens system (34) disposed between the multipole elements (32a, 32b). ... Jeol Ltd

08/17/17 / #20170236680

Charged particle beam system

There is provided a charged particle beam system in which a detector can be placed in an appropriate analysis position. The charged particle beam system (100) includes: a charged particle source (11) for producing charged particles; a sample holder (20) for holding a sample (s); a detector (40) for detecting, in the analysis position, a signal produced from the sample (s) by impingement of the charged particles on the sample (s); a drive mechanism (42) for moving the detector (40) into the analysis position; and a controller (52) for controlling the drive mechanism (42). ... Jeol Ltd

07/20/17 / #20170205479

Nmr measuring probe

A sample tube is arranged in a sample temperature adjusting pipe, and a temperature adjustment gas is supplied. A vacuum vessel is formed with the sample temperature adjusting pipe and an outer wall body, and a detection coil and the like to be placed in a cooling state are arranged in the vacuum vessel. ... Jeol Ltd

06/22/17 / #20170176362

Nuclear magnetic resonance measurement apparatus and method for processing exhaust gas

A probe head in a nuclear magnetic resonance measurement apparatus includes a rotating mechanism. In the probe head, an exhaust gas having a high temperature or a low temperature is discharged from a discharge port of the rotating mechanism. ... Jeol Ltd

06/01/17 / #20170154753

Specimen loading method, specimen stage, and charged particle beam device

A specimen loading method for loading a specimen that contains water into a specimen chamber of a charged particle beam device, includes: a step (s100) of mounting the specimen on a specimen support; a step (s102) of covering a predetermined area of the specimen with a water retention material; a step (s104) of evacuating the specimen chamber in which the specimen having the predetermined area covered with the water retention material is placed; and a step (s106) of exposing the predetermined area covered with the water retention material.. . ... Jeol Ltd

05/11/17 / #20170133197

Charged particle beam system

There is provided a charged particle beam system capable of reducing contamination of at least one sample. The charged particle beam system (100) has a sample chamber (15) in which the sample (s) is irradiated with a charged particle beam. ... Jeol Ltd

05/11/17 / #20170133196

Charged particle system and measuring method

There is provided a charged particle system capable of measuring deflection fields in a sample without using a segmented detector. The charged particle system (100) has: illumination optics (104) for illuminating the sample with charged particles; an imaging deflector system (112) disposed behind an objective lens (110) and operative to deflect the charged particles; a detector (116) having a detection surface (115) and operative to detect the charged particles incident thereon, imaging optics (114) disposed behind the imaging deflector system (112) and operative to focus the charged particles as diffraction discs (2) onto the detection surface (115); a storage unit (120) for storing intensity information detected by the detector (116); and a controller (130) for controlling the imaging deflector system (112). ... Jeol Ltd

05/11/17 / #20170131313

Method for clinical examinations and cleaning method therefor

An method is offered which can clean the nozzles of a reaction cuvette wash unit. A first detergent is put in first reagent containers located on a first reagent turntable. ... Jeol Ltd

04/27/17 / #20170117117

Detector apparatus and charged particle beam system

There is provided a detector apparatus capable of detecting the position or tilt angle of a sample stage with high resolution and high reliability. The detector apparatus (100) is operative to detect the position or tilt angle of the sample stage (2), and has a potentiometer (10) for detecting the position or tilt angle of the sample stage (2), an encoder (20) for detecting the position or tilt angle of the sample stage (2), and a computing unit (30) for calculating the position or tilt angle of the sample stage (2), based both on an output signal from the potentiometer (10) and on an output signal from the encoder (20).. ... Jeol Ltd

04/27/17 / #20170117116

Calibration method and charged particle beam system

There is provided a method capable of calibrating a sample stage easily. This method is for use in a charged particle beam system having the sample stage for moving a sample and an imaging subsystem for capturing a charged particle beam image and obtaining a final image. ... Jeol Ltd

03/09/17 / #20170067837

Analysis method and x-ray photoelectron spectroscope

An analysis method includes: acquiring a photoelectron spectrum and an x-ray-excited auger spectrum, the photoelectron spectrum being obtained by detecting photoelectrons emitted from a specimen by irradiating the specimen with x-rays, and the x-ray-excited auger spectrum being obtained by detecting auger electrons emitted from the specimen by irradiating the specimen with x-rays; calculating a quantitative value of each element included in the specimen based on the photoelectron spectrum; and performing a curve fitting process on the x-ray-excited auger spectrum by using an electron beam-excited auger electron standard spectrum, and calculating a quantitative value of an analysis target element in each chemical bonding state included in the specimen.. . ... Jeol Ltd

01/26/17 / #20170025248

Electron microscope and measurement method

An electron microscope is provided which can measure, with high sensitivity and high positional resolution, an amount of deflection of an electron beam occurring when it is transmitted through a sample. The electron microscope (100) is adapted to measure the amount of deflection of the electron beam (eb) when it is transmitted through the sample (s), and has an electron beam source (10) producing the electron beam (eb), an illumination lens system for focusing the electron beam (eb) onto the sample (s), an aperture (30) having an electron beam blocking portion (32) for providing a shield between a central portion (eb1) and an outer peripheral portion (eb2) of the cross section of the beam (eb) impinging on the sample (s), and a segmented detector (20) having a detection surface (22) for detecting the electron beam (eb) transmitted through the sample (s). ... Jeol Ltd

01/26/17 / #20170025244

Electron microscope

There is provided an electron microscope capable of easily achieving power saving. The electron microscope (100) includes a controller (60) for switching the mode of operation of the microscope from a first mode where electron lenses (12, 14, 18, 20) are activated to a second mode where the electron lenses (12, 14, 18, 20) are not activated. ... Jeol Ltd








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