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Kabushiki Kaisha Nihon Micronics patents


Recent patent applications related to Kabushiki Kaisha Nihon Micronics. Kabushiki Kaisha Nihon Micronics is listed as an Agent/Assignee. Note: Kabushiki Kaisha Nihon Micronics may have other listings under different names/spellings. We're not affiliated with Kabushiki Kaisha Nihon Micronics, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "K" | Kabushiki Kaisha Nihon Micronics-related inventors


Method for manufacturing secondary cell

A method for manufacturing a secondary cell, the secondary cell including a charging layer that captures electrons by forming energy levels in a band gap by causing a photoexcited structural change in an n-type metal oxide semiconductor coated with an insulating material, includes: a coating step to coat a liquid so as to form a coating film that includes constituents that will form the charging layer; a drying step to dry the coating liquid coated in the coating step; a uv irradiating step to form a uv-irradiated coating film by irradiating the dried coating film obtained through the drying step with ultraviolet light; and a burning step to burn a plurality of the uv-irradiated coating films, after forming the plurality of uv-irradiated coating films by repeating a set plural times, the set including the coating step, the drying step, and the uv irradiating step.. . ... Kabushiki Kaisha Nihon Micronics

Battery and method of charging and discharging the same

A battery having desired characteristics and a method of charging and discharging a battery are provided. A battery according to an embodiment of the present invention includes: a first electrode layer (6); a second electrode layer (7); and a charging layer (3) including an n-type metal oxide semiconductor and an insulating material, a charge voltage generated between the first electrode layer (6) and the second electrode layer (7) being applied to the charging layer (3). ... Kabushiki Kaisha Nihon Micronics

Control server and control system

Provided are a control server and a control system both capable of preventing traffic accidents more effectively. The control server is configured to control multiple traffic signals installed on a road, and includes: a pressure information obtainer configured to obtain pressure information which is outputted from a pressure sensor installed at a stop position on the road corresponding to each of the multiple traffic signals, and which includes a value representing pressure received from a vehicle running on the road; an abrupt braking information obtainer configured to, based on the pressure information, obtain abrupt braking information on an abrupt braking operation performed by the vehicle running on the road; and a traffic signal controller configured to, based on the abrupt braking information, generate a control signal for controlling the multiple traffic signals.. ... Kabushiki Kaisha Nihon Micronics

Probe, probe card and contact inspection device

A probe includes: a probe base body having a first end as a portion that contacts a test object in an inspection and a second end that contacts a contact point member; a covering member that covers the probe base body between the first end and the second end; and an enlarged diameter portion 6 provided at an exposed portion on the second end side of the probe base body. The probe is attached in a bent-deformed state by pressing a terminal portion on the first end side of the covering member against a base portion of the contact inspection device. ... Kabushiki Kaisha Nihon Micronics

Probe card with temperature control function, inspection device using the same, and inspection method

A probe card having uniform temperature distribution under control to a desired temperature is provided, so as to provide an inspection apparatus and an inspection method. The probe card includes a supporting substrate, a wiring layer arranged including a wiring on a main surface of the supporting substrate, a probe arranged on a surface serving as an opposite side to a side of the supporting substrate of the wiring layer so as to be connected to the wiring, and a plurality of heaters. ... Kabushiki Kaisha Nihon Micronics

Semiconductor module, electrical connector, and inspection apparatus

A semiconductor module includes a control ic mounted on a mounting substrate and a plurality of semiconductor chips mounted on the mounting substrate, and each of the plurality of semiconductor chips includes first and second transistors connected in series between a device to be inspected and a tester. The first transistor and the second transistor have a common drain electrode on a substrate side of the semiconductor chip. ... Kabushiki Kaisha Nihon Micronics








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