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Malvern Instruments Limited patents


Recent patent applications related to Malvern Instruments Limited. Malvern Instruments Limited is listed as an Agent/Assignee. Note: Malvern Instruments Limited may have other listings under different names/spellings. We're not affiliated with Malvern Instruments Limited, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "M" | Malvern Instruments Limited-related inventors


Cuvette carrier

A cuvette carrier comprising: a plurality of walls defining a holding volume for a cuvette; a first and second transmissive region included in the plurality of walls; and a first optical polariser arranged to polarise light passing through the first transmissive region.. . ... Malvern Instruments Limited

Surface charge measurement

The invention relates to methods and apparatus for determining properties of a surface. Embodiments disclosed include an apparatus for measuring a surface charge of a sample, comprising: a sample holder having an opposed pair of electrodes and configured to hold a sample in position in a measurement volume between the electrodes such that a planar surface of the sample is aligned orthogonal to the electrode surfaces; a measurement chamber for containing a measurement liquid and having an open end configured to receive the sample holder to position the electrodes in a preset orientation; a laser light source positioned and configured to direct a laser beam through the measurement chamber between the electrodes and parallel to the planar surface of the sample when the sample holder is received in the measurement chamber; and a detector positioned and configured to detect scattered light from the measurement volume, wherein the apparatus is configured to allow for detection of the scattered light by the detector over a range of distances from the surface of the sample.. ... Malvern Instruments Limited

Thermal compensation

Method of characterizing particles suspended in a fluid dispersant by light diffraction, comprising: obtaining measurement data from a detector element, the detector element being arranged to measure the intensity of scattered light; identifying a measurement contribution arising from light scattered by inhomogeneities in the dispersant; processing the measurement data to remove or separate the measurement contribution arising from light scattered by inhomogeneities in the dispersant; calculating a particle size distribution from the processed measurement. The detector element is one of a plurality of detector elements from which the measurement data is obtained. ... Malvern Instruments Limited

Suspended particle characterization system

An apparatus (10) for characterizing particles, comprising: a microscope objective with an optical axis and a depth of field; a holder cell (22) configured to position the particles in a generally planar volume below the microscope objective, the planar volume being substantially normal to the optical axis and having a depth that is less than or equal to the depth of field, wherein a portion of the cell holder (22) for positioning in the optical axis of the microscope objective is substantially free of significant spectral features in a raman spectral range; an x-y stage (20) to move the microscope objective relative to the holder cell (22) in x and y directions to align particles with the optical axis of the microscope objective while the particles are held by the holder cell (22), a detector (18) for acquiring an image of a particle through the microscope objective, a laser operable to illuminate a particle held by the holder cell (22), a raman spectrometer (16) arranged to obtain a spectrum including the raman spectral range from the illuminated particle, and characterizing logic operative to characterize the particle based on image processing operations performed on the acquired image and based on the raman spectrum. The holder cell (22) comprises a first plate (34) and a second plate (36) that are separated by a predetermined distance defining the planar volume depth.. ... Malvern Instruments Limited

Particle characterisation instrument

An instrument and a method for measuring the characteristics of particles in a sample. The instrument comprises a light source operable to provide a light beam and defining an illumination axis; a sample cell placed on the illumination axis; a scattered light detector positioned to receive scattered light along a detection path from a sample in the sample cell, the scattered light produced by the interaction of the light beam with the sample; and a filter changer positioned between the sample cell and the scattered light detector. ... Malvern Instruments Limited

High-throughput fluid sample characterization

A particle characterization apparatus and corresponding method is disclosed. The apparatus comprises a sample cell (14). ... Malvern Instruments Limited








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