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Microvision Inc patents


Recent patent applications related to Microvision Inc. Microvision Inc is listed as an Agent/Assignee. Note: Microvision Inc may have other listings under different names/spellings. We're not affiliated with Microvision Inc, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "M" | Microvision Inc-related inventors


Touch interactivity with occlusions in returned illumination data

A projection system emits light pulses in a field of view and measures properties of reflections. Properties may include time of flight and return amplitude. ... Microvision Inc

Transmitter/receiver disparity for occlusion-based height estimation

A projection system emits light pulses in a field of view and measures properties of reflections. Properties may include time of flight and return amplitude. ... Microvision Inc

Occlusion-based height estimation

A projection system emits light pulses in a field of view and measures properties of reflections. Properties may include time of flight and return amplitude. ... Microvision Inc

Devices and methods for providing foveated scanning laser image projection with depth mapping

Devices and methods are described herein for providing foveated image projection. In general, at least one source of laser light is used to generate a laser beam, and scanning mirror(s) that reflect the laser beam into a pattern of scan lines. ... Microvision Inc

Speckle reduction in multi-laser beam scanning display

A scanning projector includes one or more scanning mirrors that reflect a light beam to create an image. The beam is created by multiple laser light sources, at least two of which create light at substantially the same color. ... Microvision Inc

Dual-folding eyeglasses and eyeglass collapsible case

Eyeglasses are provided for folding into a substantially flat configuration to be fitted inside a compact case. The eyeglasses include a frame surrounding a pair of lenses, and a pair of temples which extend from respective outer edges of the frame. ... Microvision Inc

Method and machine for examining wafers

Method and machine utilizes the real-time recipe to perform weak point inspection on a series of wafers during the fabrication of integrated circuits. Each real-time recipe essentially corresponds to a practical fabrication history of a wafer to be examined and/or the examination results of at least one examined wafer of same “lot”. ... Microvision Inc

Devices and methods for providing depth mapping with scanning laser image projection

Devices and methods are described herein for combining image projection with surface scanning. In general, the devices and methods utilize at least one source of laser light to generate a laser beam, and scanning mirror(s) that reflect the laser beam into a pattern of scan lines. ... Microvision Inc

Devices and methods for adjustable resolution depth mapping

Devices and methods are described that provide for scanning surfaces and generating 3-dimensional point clouds that describe the depth of the measured surface at each point. In general, the devices and methods utilize scanning mirror(s) that reflect a laser beam into a pattern of scan lines. ... Microvision Inc

Apparatus of plural charged-particle beams

A multi-beam apparatus for observing a sample with high resolution and high throughput is proposed. In the apparatus, a source-conversion unit changes a single electron source into a virtual multi-source array, a primary projection imaging system projects the array to form plural probe spots on the sample, and a condenser lens adjusts the currents of the plural probe spots. ... Microvision Inc

Devices and methods for speckle reduction in scanning projectors

Devices and methods are described herein that use a first solid figure element, a polarizing beam splitter, and a second solid figure element to reduce speckle in projected images. Specifically, laser light is generated and split into two portions having orthogonal polarizations. ... Microvision Inc

Devices and methods for speckle reduction in scanning projectors using birefringence

Devices and methods are described herein that use birefringent elements to reduce speckle. The birefringent elements are angularly separate received laser light into two separated light beams, and then recombine the two angularly separated light beams. ... Microvision Inc

Multi-stripes lasers for laser based projector displays

A scanning projector and method is provided that that uses at least one multi-stripe laser to generate the laser light for the scanned image. Specifically, the multi-stripe laser includes at least a first laser element and a second laser element formed together on a semiconductor die. ... Microvision Inc

Optical steering of component wavelengths of a multi-wavelength beam to enable interactivity

Briefly, in accordance with one or more embodiments, an information handling system comprises a scanning system to scan one or more component wavelength beams into a combined multi-component beam in a first field of view, and a redirecting system to redirect one or more of the component wavelength beams into a second field of view. A first subset of the one or more component wavelength beams is projected in the first field of view and a second subset of the one or more component wavelength beams is projected in the second field of view. ... Microvision Inc

07/27/17 / #20170214898

Scanning projector with feedback from border fixture

A scanning projector and method is provided that generates a feedback signal from at least one photodetector. In the scanning projector, a scanning mirror is configured to reflect laser light into an image region and an over scanned region. ... Microvision Inc

07/27/17 / #20170213688

Apparatus of plural charged-particle beams

A new multi-beam apparatus with a total fov variable in size, orientation and incident angle, is proposed. The new apparatus provides more flexibility to speed the sample observation and enable more samples observable. ... Microvision Inc

07/06/17 / #20170195647

Mems scan controlled keystone and distortion correction

Briefly, in accordance with one or more embodiments, a mems scanned beam projector includes a light source to emit a light beam, a scanning platform to redirect the light beam impinging on the platform, and a display controller to control the light source and the scanning platform to cause the scanning platform to scan the light beam in a vertical direction and a horizontal direction in a scan pattern to project an image onto a projection surface. The display controller is configured to correct for image distortion in the projected image by providing a compensated drive signal to the scanning platform to compensate for the image distortion.. ... Microvision Inc

06/22/17 / #20170180690

System and method for feedback control in scanning projectors

A scanning projector and method is provided that generates a feedback signal from at least one photodetector. In the scanning projector, a scanning mirror is configured to reflect laser light into an image region and an over scanned region. ... Microvision Inc

06/22/17 / #20170176358

Test device for defect inspection

A structure, for defect inspection, is provided, which includes a scanning pad scanned by an electron beam inspection tool and a test key. The structure can be located in the scribe line. ... Microvision Inc

06/01/17 / #20170154756

Apparatus of plural charged-particle beams

A secondary projection imaging system in a multi-beam apparatus is proposed, which makes the secondary electron detection with high collection efficiency and low cross-talk. The system employs one zoom lens, one projection lens and one anti-scanning deflection unit. ... Microvision Inc

05/04/17 / #20170125206

Apparatus of plural charged-particle beams

A multi-beam apparatus for observing a sample with high resolution and high throughput is proposed. In the apparatus, a source-conversion unit changes a single electron source into a virtual multi-source array, a primary projection imaging system projects the array to form plural probe spots on the sample, and a condenser lens adjusts the currents of the plural probe spots. ... Microvision Inc

05/04/17 / #20170125205

Apparatus of plural charged-particle beams

One modified source-conversion unit and one method to reduce the coulomb effect in a multi-beam apparatus are proposed. In the modified source-conversion unit, the aberration-compensation function is carried out after the image-forming function has changed each beamlet to be on-axis locally, and therefore avoids undesired aberrations due to the beamlet tilting/shifting. ... Microvision Inc

05/04/17 / #20170125204

Charged particle source

This invention provides a charged particle source, which comprises an emitter and means of generating a magnetic field distribution. The magnetic field distribution is minimum, about zero, or preferred zero at the tip of the emitter, and along the optical axis is maximum away from the tip immediately. ... Microvision Inc

05/04/17 / #20170125203

Charged particle source

This invention provides a charged particle source, which comprises an emitter and means fo generating a magnetic field distribution. The magnetic field distribution is minimum, about zero, or preferred zero at the tip of the emitter, and along the optical axis is maximum away from the tip immediately. ... Microvision Inc

05/04/17 / #20170125202

Charged particle source

This invention provides a charged particle source, which comprises an emitter and means of generating a magnetic field distribution. The magnetic field distribution is minimum, about zero, or preferred zero at the tip of the emitter, and along the optical axis is maximum away from the tip immediately. ... Microvision Inc

04/27/17 / #20170115506

Dual-folding eyeglasses and eyeglass collapsible case

Embodiments of this patent disclosure provide for eyeglasses with multiple set of hinges for folding into a compact configuration to be fitted inside a compact case for easy storage and carrying. In one aspect, a pair of foldable eyeglasses having multiple set of hinges is disclosed. ... Microvision Inc

03/09/17 / #20170070714

Dynamic constancy of brightness or size of projected content in a scanning display system

A scanning projector includes a mems device with a scanning mirror that sweeps a beam in two dimensions. Actuating circuits receive scan angle information and provide signal stimulus to the mems device to control the amount of mirror deflection on two axes. ... Microvision Inc

03/09/17 / #20170070662

Laser beam scanning assisted autofocus

An apparatus with autofocus includes a scanning laser projector to provide autofocus assist. The scanning laser projector may project visible or nonvisible light in contrasting patterns to provide passive autofocus assist. ... Microvision Inc

03/09/17 / #20170069255

Virtual touch overlay on touchscreen for control of secondary display

A device with a touchscreen includes a transparent virtual touch overlay used to modify content on a secondary display. The device may send display content to the secondary display either wired or wirelessly. ... Microvision Inc

03/09/17 / #20170068393

Hybrid data acquisition in scanned beam display

A scanning display system includes hybrid data acquisition. Data can be acquired in a time-of-flight mode, or in a non-time-of-flight mode. ... Microvision Inc

03/09/17 / #20170068319

Mixed-mode depth detection

Briefly, in accordance with one or more embodiments, a mems laser beam display to implement mixed-mode depth detection comprises an imaging engine to project an image in a field of view of the mems laser beam display, a time of flight (tof) depth detector to determine a distance to a target within the field of view in a first mode of depth detection, wherein the tof depth detector determines coarse depth data of the target, and a structured light depth detector to determine a distance to the target in a second mode of depth detection, wherein the structured light depth detector determines fine depth data of the target. Depth processing circuitry may generate a composite three-dimensional (3d) image of the target, or may identify a gesture region of the target for gesture recognition.. ... Microvision Inc

02/23/17 / #20170053774

Structure electron beam inspection system for inspecting extreme ultraviolet mask and structure for discharging extreme ultraviolet mask

A structure for discharging an extreme ultraviolet mask (euv mask) is provided to discharge the euv mask during the inspection by an electron beam inspection tool. The structure for discharging an euv mask includes at least one grounding pin to contact conductive areas on the euv mask, wherein the euv mask may have further conductive layer on sidewalls or/and bottom. ... Microvision Inc

02/23/17 / #20170052129

Method and system for inspecting an euv mask

A structure for grounding an extreme ultraviolet mask (euv mask) is provided to discharge the euv mask during the inspection by an electron beam inspection tool. The structure for grounding an euv mask includes at least one grounding pin to contact conductive areas on the euv mask, wherein the euv mask may have further conductive layer on sidewalls or/and back side. ... Microvision Inc

01/26/17 / #20170025243

Apparatus of plural charged-particle beams

A multi-beam apparatus for observing a sample with high resolution and high throughput is proposed. In the apparatus, a source-conversion unit forms plural and parallel images of one single electron source by deflecting plural beamlets of a parallel primary-electron beam therefrom, and one objective lens focuses the plural deflected beamlets onto a sample surface and forms plural probe spots thereon. ... Microvision Inc

01/26/17 / #20170025241

Apparatus of plural charged-particle beams

A multi-beam apparatus for observing a sample with high resolution and high throughput and in flexibly varying observing conditions is proposed. The apparatus uses a movable collimating lens to flexibly vary the currents of the plural probe spots without influencing the intervals thereof, a new source-conversion unit to form the plural images of the single electron source and compensate off-axis aberrations of the plural probe spots with respect to observing conditions, and a pre-beamlet-forming means to reduce the strong coulomb effect due to the primary-electron beam.. ... Microvision Inc








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