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Mitutoyo Corporation patents


Recent patent applications related to Mitutoyo Corporation. Mitutoyo Corporation is listed as an Agent/Assignee. Note: Mitutoyo Corporation may have other listings under different names/spellings. We're not affiliated with Mitutoyo Corporation, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "M" | Mitutoyo Corporation-related inventors


 new patent  Industrial machine and control method of industrial machine

A coordinate measuring machine includes a body, a controller configured to control the driving of the body, and an operation unit configured to provide a command to the controller via, for instance, an operation lever to manually operate the body. A contact detection sensor is attached to the operation unit. ... Mitutoyo Corporation

 new patent  Winding and scale configuration for inductive position encoder

A pitch compensated inductive position encoder includes a scale comprising first and second tracks including periodic patterns having a wavelength w, a detector, and signal processing. The second track pattern may be shifted along the measuring direction by a pattern offset sto relative to the first track pattern. ... Mitutoyo Corporation

 new patent  Profile measuring machine and movement mechanism

A coordinate measuring machine includes: a table and a column which are configured to relatively move in a predetermined moving direction; a guide surface formed on the table and having a guide region and a drive region extending in the moving direction in parallel to each other; at least one air pad formed to the column and facing the guide region; and a drive roller formed to the column and rolling on the drive region.. . ... Mitutoyo Corporation

Variable focal length lens apparatus

A variable focal length lens apparatus includes a lens system where a refractive index changes in response to an input drive signal; a field lens arranged on the same optical axis as the lens system; an image detector detecting an image of a measured object through the lens system and the field lens; a pulse illuminator providing pulse illumination of the measured object based on an input light emission signal; a temperature sensor detecting temperature information for an interior of the lens system; and a controller outputting the drive signal and the light emission signal in addition to correcting the timing of the light emission signal based on the temperature information.. . ... Mitutoyo Corporation

Lens system and variable focal length lens apparatus

A lens system includes a tubular vibrating member that vibrates due to an input drive signal; a case accommodating the vibrating member; a fluid that fills the case and immerses the vibrating member; and a pressure mitigating member that is installed in a gap between the vibrating member and the case, further outward than the vibrating member. A foam body made of fluororubber and having a large number of closed cells is used as the pressure mitigating member.. ... Mitutoyo Corporation

Displacement encoder

A detection head movable relative to a scale detects diffracted light and outputs a detection result. The diffracted light is diffracted by an incremental pattern. ... Mitutoyo Corporation

Electronic position encoder and method for reducing short range errors

An electronic position encoder comprises a scale including a periodic scale pattern along a measuring axis direction having a scale period ps, and a detector portion comprising a first group of sensing elements, a second group of sensing elements, and a signal processing configuration. The second group of sensing elements is located at a group position which is equal to k2*ps+ps/m relative to the first group of sensing elements along the measuring axis direction, where k2 and m are integers. ... Mitutoyo Corporation

Coefficient-of-thermal-expansion measurement method and measuring device for coefficient of thermal expansion

A step gauge and a reference gauge block are placed in a temperature-controlled chamber in parallel with each other. A temperature of the step gauge is changed to a first temperature and a second temperature using a measurement-target temperature adjuster and the temperature-controlled chamber. ... Mitutoyo Corporation

Touch probe for cmm including digital signal communication

A compact cmm touch probe may include internal digital processing, a regulated power circuit, a trigger signal generating circuit, an interface connector limited to two electrical connections, and a differential signal configuration that inputs and outputs differential digital communication signals (including touch trigger signals) through the two connections, superimposed on a cmm supply voltage connected to them from the cmm. A specialized supply isolation circuit is configured in combination with various probe components and operating parameters, to couple the regulated power supply circuit to the cmm supply voltage at the two connections, while isolating it from loading the differential digital signals, which are ac coupled to the two connections. ... Mitutoyo Corporation

Encoder and light source of encoder

An encoder includes a light source. A booster circuit boosts a power supply voltage output by a battery, and outputs the boosted voltage. ... Mitutoyo Corporation

Trigger counter for measurement device with count values stored in flash memory

A system and method are provided for operating a touch probe for a coordinate measuring machine, wherein a value is permanently stored in the touch probe corresponding to an accumulated number of trigger signals generated in the touch probe over its operating history. For a non-erase cycle during which an erasable trigger counter block (e.g., included in a flash memory) of the touch probe is not erased, increasing values of an accumulated trigger count are stored in n address locations of the erasable trigger counter block. ... Mitutoyo Corporation

Control method of shape measuring apparatus

A scanning path is divided after every predetermined number of segments and a set of measurement commands is defined for each of the predetermined number of segments. While executing the measurement command, a speed pattern plan is created for the following measurement command. ... Mitutoyo Corporation

Variable focal length lens system with multi-level extended depth of field image processing

An imaging system including a tunable acoustic gradient (tag) lens is associated with a user interface including a live display of an extended depth of field (edof) image. The tag lens is utilized to produce a raw edof image, which may include defocus blur (e.g., resulting in part from the periodically modulated optical power variation of the tag lens). ... Mitutoyo Corporation

Encoder and signal processing circuit

A reference voltage generator circuit generates a reference voltage corresponding to a power supply voltage. A current/voltage converter circuit converts a photocurrent output by a photoreceiver into voltage, and outputs a voltage obtained by adding the converted voltage and the reference voltage. ... Mitutoyo Corporation

05/17/18 / #20180139390

Extending a focus search range in an imaging system including a high speed variable focal length lens

A method for controlling an imaging system comprising a variable focal length (vfl) lens having first and second operating resonant frequencies, a lens controller, and a camera is disclosed. The first frequency provides a larger optical power variation and large focus range, at the expense of aberration in the imaging system. ... Mitutoyo Corporation

05/17/18 / #20180135956

Coordinate measuring apparatus

A coordinate measuring apparatus (100) includes a probe (102) configured to detect a workpiece and a movement mechanism (110) configured to support the probe (102) and enable the probe (102) to move in mutually-orthogonal x, y, and z directions. The movement mechanism (110) includes a z-axis drive portion (141) and a spindle (162) configured to enable the z-axis drive portion (141) to move relative to the z direction. ... Mitutoyo Corporation

05/17/18 / #20180135704

Rotation transmitter

A rotation transmitter includes a first member, a second member, and an intermediate member. The first member is connected to the intermediate member by a first rotary mechanism. ... Mitutoyo Corporation

05/10/18 / #20180128593

Phase shift interferometer

The phase shift interferometer is configured to measure the shapes of measurement objects by acquiring a plurality of images of interference fringes while shifting the phases of the interference fringes. The interference fringes are provided with a phase difference of 90° relative to each other utilizing polarization of light. ... Mitutoyo Corporation

05/03/18 / #20180120242

Coordinate alignment tool for coordinate measuring device and measuring x-ray ct apparatus

A coordinate alignment tool includes a base having at least two ground faces to hold an attitude suitable for measurement by a coordinate measuring device and an attitude suitable for measurement by a measuring x-ray ct apparatus, and a fixer to fixate a measured object to the base; and at least three master balls arranged on the base.. . ... Mitutoyo Corporation

04/19/18 / #20180106646

Light source device and photoelectric encoder including the same

Provided are a light source device that can achieve higher accuracy while maintaining reliability by reducing stray light, and a photoelectric encoder including the same. A light source device 2 includes a translucent member 10 configured to accommodate a light emitting unit 5 thereinside, and to make light emitted from the light emitting unit 5, into parallel light. ... Mitutoyo Corporation

03/29/18 / #20180089360

Context sensitive relational feature/measurement command menu display in coordinate measurement machine (cmm) user interface

. . A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer-aided design (cad) file processing portion, a geometric relationship analyzer, an inspection motion path generation portion, and a user interface including an editable plan representation of a current workpiece feature inspection plan, a workpiece inspection program simulation portion configured to display a 3d view including geometric features and inspection operation representations, and a context sensitive menu portion. ... Mitutoyo Corporation

03/29/18 / #20180088440

Variable focal length lens system with focus monitoring and control

A variable focal length (vfl) lens system is provided including a tunable acoustic gradient (tag) lens and an optical focus monitoring configuration for providing a focus monitoring signal that reflects a focus state with high accuracy and without significant latency. An input illumination pattern is transmitted through the tag lens to provide a corresponding output illumination pattern that has a size and intensity that depends on the optical power of the tag lens. ... Mitutoyo Corporation

03/29/18 / #20180087931

Optical encoder configured to mitigate undesired interfering light components

A device for measuring the relative displacement between two members comprises a scale grating, an illumination source, a detector portion, and an imaging portion. The illumination source outputs diffracted light components (dlc) to the scale grating. ... Mitutoyo Corporation

03/15/18 / #20180073898

Photoelectric encoder

An encoder includes a scale having graduations arranged in a measurement direction, a head including a light receiving unit configured to receive, via the scale, light emitted from a light source, and being configured to detect a relative movement amount with respect to the scale by relatively moving in the measurement direction of the scale, and a control unit configured to control the head. The control unit includes a light amount control unit configured to perform control so as to keep a predetermined light receiving amount by increasing or decreasing a light amount of the light source, an error determination unit configured to determine an error based on light received by the light receiving unit, and a light amount suppression unit configured to suppress a light amount of the light source by stopping control performed by the light amount control unit, when the error determination unit determines as an error.. ... Mitutoyo Corporation

03/15/18 / #20180073852

Roundness measuring machine

A roundness measuring machine includes: a base; a table rotatable relative to the base; a probe configured to scan a surface of a workpiece mounted on the table; a motor configured to rotate the table; and a control device configured to control a rotation of the motor. The control device includes: a starting current detector configured to detect a starting current of the motor; and an acceleration/deceleration time setting unit configured to detect at least one of acceleration time and deceleration time for the motor in accordance with the starting current. ... Mitutoyo Corporation

03/01/18 / #20180058883

Winding configuration for inductive position encoder

An electronic position encoder is provided including a scale, a detector and a signal processing configuration. The scale extends along an x-axis direction and includes a signal modulating scale pattern. ... Mitutoyo Corporation

03/01/18 / #20180058847

Coordinate measuring machine and coordinate correction method

A processing device includes: a pushing drive mechanism control unit that brings a measurement tip into contact with a surface of a calibration artifact at a single point in each of five directions are all normal directions to the surface of the calibration artifact; a scanning drive mechanism control unit that reciprocates the measurement tip on the surface of the calibration artifact on each of three planes perpendicular to one another; a coordinate acquisition unit that acquires a moving amount and a probe output of a measuring probe; a matrix generation unit that generates a correction matrix; and a probe output correction unit that corrects the probe output with the correction matrix. This enables an improvement in asymmetric probe characteristics of the probe output, which is outputted from the measuring probe, in a particular plane. ... Mitutoyo Corporation

03/01/18 / #20180058836

Roundness measuring apparatus

A roundness measuring device including: an angle detector detecting a current rotation angle of a table relative to an x axis direction; a joystick (external operator) issuing an instruction for an operation amount of a rotation axis line of the table; a centering controller calculating a cx axis displacement amount and a cy axis displacement amount from the operation amount and the rotation angle, and displacing a cx axis displacement mechanism and cy axis displacement mechanism based on the calculated cx axis displacement amount and cy axis displacement amount; and a centering controller calculating an lx axis tilt amount and an ly axis tilt amount from the operation amount and the rotation angle, and displacing an lx axis tilt mechanism and ly axis tilt mechanism based on the calculated lx axis tilt amount and ly axis tilt amount.. . ... Mitutoyo Corporation

03/01/18 / #20180058834

Coordinate correction method and coordinate measuring machine

As a former correction step, a coordinate correction method includes: a step of setting a measuring probe in a drive mechanism; a step of restraining a measurement tip; a step of acquiring a moving amount and a probe output; and a step of generating a former correction matrix including linear correction elements and non-linear correction elements. As a latter correction step, the coordinate correction method includes: a step of setting a measuring probe in a drive mechanism; a step of restraining a measurement tip; a step of acquiring a moving amount and a probe output; a step of generating an intermediate correction matrix including linear correction elements for correcting the probe output; and a step of correcting the probe output with a latter correction matrix. ... Mitutoyo Corporation

03/01/18 / #20180058832

Coordinate measuring machine and coordinate correction method

A processing device includes: a coordinate acquisition unit that acquires a moving amount of a measuring probe and a probe output; a matrix generation unit that generates a correction matrix including linear correction elements and non-linear correction elements; and a probe output correction unit that corrects the probe output with the correction matrix. The coordinate acquisition unit acquires the moving amount and the probe output of the measuring probe in each of measurement points in a quantity larger than or equal to the sum of the number of the linear correction elements and the number of the non-linear correction elements. ... Mitutoyo Corporation

02/22/18 / #20180052017

External device for measuring instrument

An external device is configured to be detachably attached to a measuring instrument via a connector. The external device includes a connector part, an external device body part and a movable connection part. ... Mitutoyo Corporation

02/15/18 / #20180045806

Feedback gain adjusting method and device of tracking-type laser interferometer and tracking-type laser interferometer

A laser interferometer that includes a laser interferometer, an position sensitive detector detecting an offset of an optical axis of the laser interferometer, a biaxial rotator turning the laser interferometer toward an arbitrary direction, an angle sensor detecting a rotation angle of the biaxial rotator, a retro reflector reflecting reflected light in a direction parallel to incident light, and a controller performing feedback control of the biaxial rotator so as to track the retro reflector based on signals from the position sensitive detector and the angle sensor. The tracking-type laser interferometer starts tracking control when return light from the retro reflector is returned to a detection range of the position sensitive detector, and changes gain for the feedback control in accordance with a behavior for a position of the return light on the position sensitive detector due to the tracking control.. ... Mitutoyo Corporation

02/08/18 / #20180038960

Method and apparatus for inspecting positioning machine by laser tracking interferometer

To inspect a positioning machine by a laser tracking interferometer that tracks a retroreflector using a laser beam, the positioning accuracy of the positioning machine is evaluated by comparing a distance Δdij,c with a distance Δdij,l measured by the laser tracking interferometer, the distance Δdij,c being acquired by orthogonal projection of the position vectors of measurement points pi and pj measured by the positioning machine to the straight line gk passing through the rotation center m of the laser tracking interferometer.. . ... Mitutoyo Corporation

02/01/18 / #20180031415

Interferometer system having a continuously variable broadband reflector and method to generate an interference signal of a surface of a sample

An interferometer system to generate an interference signal of a surface of a sample includes a broadband illuminator to provide a broadband illumination beam, a beam splitter to split the broadband illumination beam in a reference beam for reflection on a reference reflector and a measurement beam for reflection on the surface of the sample, and a detector to receive an interference radiation intensity created between the reference beam reflected from the reference reflector and the reflected measurement beam from the surface of the sample to generate an interference signal. The interferometer system having a continuous variable broadband reflector in the beam splitter and/or the reference reflector to adjust the broadband radiation intensity balance between the measurement beam and the reference beam.. ... Mitutoyo Corporation

02/01/18 / #20180031398

Measuring instrument

A measuring instrument is configured to detect a displacement of a contact point provided to be movable and to digitally display a measured value on a display unit provided on an outer surface of a case. The measuring instrument includes an input unit. ... Mitutoyo Corporation

01/25/18 / #20180023936

Measurement probe and measuring device

A probe includes a movable plate to which a stylus capable of contacting a measurable object is mounted, the movable plate displaceable in an x direction; a static plate arranged to overlap with the movable plate; a counter plate facing the movable plate and the static plate; an elastic movable side connection plate, the movable side connection plate connecting the counter plate at at least three places with each of a first end connector positioned toward a first end of the movable plate in the x direction and second end connectors positioned toward a second end in the x direction; and a static side connection plate which connects the static plate and the counter plate. An entire length of the first end connector in a y direction orthogonal to the x direction is the same size as the entire length of the second end connectors in the y direction.. ... Mitutoyo Corporation

01/04/18 / #20180003524

Absolute position encoder including scale with varying spatial characteristic and utilizing fourier transform or other signal processing

. . An electronic absolute position encoder is provided including a scale, a detector portion and a signal processing configuration. The scale includes a first scale pattern of signal modulating elements, wherein the first scale pattern includes a spatial characteristic of the signal modulating elements which progressively changes as a function of position along a measuring axis direction and defines an absolute measuring range. ... Mitutoyo Corporation

12/28/17 / #20170373467

Current control device and laser device

A current control device supplies a current to a semiconductor laser in order to output laser light to the semiconductor laser, and includes a current commander and a supplier. The current commander outputs a command value corresponding to a current value by increasing the command value with a lapse of time until reaching a target command value corresponding to a current value for outputting the laser light with a predetermined strength. ... Mitutoyo Corporation

12/28/17 / #20170373463

Laser adjustment method and laser source device

A laser adjustment method includes a first adjustment step and a second adjustment step. In the first adjustment step, using a light detector detecting a second harmonic light, optical intensity and wavelength of the second harmonic light is detected and a first temperature adjuster is adjusted to adjust temperatures of a nd:yvo4 crystal and a ktp crystal such that the detected wavelength of the second harmonic light approaches a desired wavelength and such that the optical intensity of the second harmonic light reaches at least a predetermined value. ... Mitutoyo Corporation

12/28/17 / #20170370689

Method for operating a coordinate measuring machine

A method is disclosed for operating a coordinate measuring machine (cmm) including a workpiece scanning probe. The method provides two different measurement sampling period durations in the scanning probe: a first shorter sampling duration provides a faster measurement having a first accuracy, a second longer sampling duration provides a slower measurement having a second (better) accuracy. ... Mitutoyo Corporation

12/28/17 / #20170370688

Method for operating a coordinate measuring machine

A method is disclosed for operating a coordinate measuring machine (cmm) including a cmm control system, a surface scanning probe that measures a workpiece surface by outputting probe workpiece measurements, and a probe measurement timing subsystem. The method comprises: operating the cmm control system to output a measurement synchronization trigger signal at predictable times; operating the probe measurement timing subsystem to determine a pre-trigger lead time that is a fraction of a current duration of a probe workpiece measurement sample period, to initiate a current instance of the probe measurement sample period at the pre-trigger lead time before a next predictable time of the measurement synchronization trigger signal; operating the cmm control system to latch a current set of cmm position coordinate values; and operating the surface scanning probe to output the current instance of the probe workpiece measurement in association with the current set of cmm position coordinate values.. ... Mitutoyo Corporation

12/21/17 / #20170366714

Super resolution bore imaging system

A super resolution bore imaging system is disclosed for imaging a cylindrical bore. The system includes a controller, a photodetector configuration having a known pixel geometry, and an imaging arrangement that images bore surface segments onto the photodetector. ... Mitutoyo Corporation

12/21/17 / #20170364723

Position specifying apparatus and position specifying method

A measurement apparatus includes an image acquisition part that acquires a captured image obtained by imaging a partial area on a two-dimensional scale on which a plurality of two-dimensional codes having a first code, which is specified by a combination pattern of a first pixel value image and a second pixel value image, and a second code, which is specified by a pattern of a type different from the combination pattern, are arranged, a code specification part that specifies the first code and the second code corresponding to the two-dimensional code included in the captured image, and a position specification part that specifies position information on the two-dimensional scale of the two-dimensional code including the first code and the second code on the basis of the first code and the second code.. . ... Mitutoyo Corporation

12/21/17 / #20170363411

Interference measuring device and method of measurement using the same device

The present invention provides an interference measuring device with an optical system that can receive light reflected from a measurement object of a surface profile that is not perpendicular to an optical axis. An interference measuring device includes a light source for emitting light and an interferometric objective lens. ... Mitutoyo Corporation

12/21/17 / #20170363401

Industrial machine

A coordinate measurement machine includes a column that can move relative to a placement surface on which a workpiece is placed, a guide part that is provided on the placement surface, the guide part guiding the column, a scale of a linear encoder that is supported on a side surface of the guide part, and detectors that are provided on the column, the detectors detecting a relative displacement with respect to the scale. The detectors detect a displacement of the column in each of a moving direction and a vertical direction. ... Mitutoyo Corporation

12/14/17 / #20170356737

Holding mechanism

A holding mechanism used in a measuring device includes a first groove, a second groove, and a pair of holding members holding the detection device by being attached to first and second sides in a length direction of a scale frame. The pair of holding member include a plate-like main body, a first hook portion engaging with the first groove, a second hook portion engaging with the second groove, and a projecting tab projecting from the main body and positioned at a gap. ... Mitutoyo Corporation

12/14/17 / #20170356731

Measuring instrument

A measuring instrument includes a measuring unit, an electric component unit and a pin jack. The electric component unit includes a signal processing part. ... Mitutoyo Corporation

11/30/17 / #20170344417

Encoder

An encoder includes: a reading device that reads respective electric signals from two incremental patterns respectively having graduation array pitches different from each other; a control device that calculates a measurement value, based on the electric signals; and an output device that outputs the measurement value. The control device includes: an absolute position synthesis unit that synthesizes two electric signals to generate a synthesized absolute position; a detection unit that detects two relative positions from the two electric signals; a position calculation unit that performs an arithmetic operation between the relative positions and the synthesized absolute position to calculate a calculated absolute position; an absolute position comparison unit that compares the calculated absolute position with the synthesized absolute position; and a relative position comparison unit that compares the two relative positions with each other. ... Mitutoyo Corporation

11/30/17 / #20170343388

Light-emitting unit, light-emitting and light-receiving unit and photoelectric encoder

A light-emitting unit includes: a light source; and a reflector having reflection faces of first and second partial paraboloids, the first and second partial paraboloids being spaced from each other in an optical axis direction of the light source, the first and second partial paraboloids having a focal point on the light source, wherein: the second partial paraboloid is between the light source and the first partial paraboloid in the optical axis direction; the second partial paraboloid has a coefficient different from that of the first partial paraboloid; and the second partial paraboloid is positioned on a reflection direction side of a light from the light source reflected by the first partial paraboloid, with respect to a plane that is obtained on a presumption that the first partial paraboloid is extended to the light source side in accordance with the coefficient of the first partial paraboloid.. . ... Mitutoyo Corporation

11/30/17 / #20170341192

Measuring apparatus and support mechanism of columnar work piece

Measuring apparatus includes an upper support supporting a first end of a columnar work piece in an axis direction, a lower support supporting a second end of the work piece in the axis direction, a probe measuring the work piece supported by the upper support and lower support, a rotary table coupled to the lower support and capable of rotating centered in the axis direction, and a post provided to the rotary table and mounting a first position determiner and a second position determiner so as to be switchable, the first and second position determiner determining a position of the work piece with respect to the rotary table. When a first columnar work piece as the work piece is supported by the upper support and lower support, the first position determiner is mounted to the post to determine a position by contacting the first work piece.. ... Mitutoyo Corporation

11/23/17 / #20170336327

Measurement system and method for switching set value for adjustment

A measurement system includes detachable parts, on which one filter module out of a plurality of filter modules including optical filters that each transmit different types of special light is detachably mounted, a specification part that specifies the optical filter of the one filter module mounted on the detachable parts, and a set value switching part that switches, according to the specified optical filter specified by the specification part, set values for adjustment used in a measurement using a specific optical filter.. . ... Mitutoyo Corporation

11/16/17 / #20170330340

Non-contact 3d measuring system

A non-contact 3d measuring system is configured to provide a combined three-dimensional shape of an object to be imaged based on a frame image, which has been captured by a camera while a measuring head is being scanned in an optical axis (z-axis) direction, and the information on the position at which the image has been acquired. The system includes: a position detector for detecting a scanning position of the measuring head while a plurality of raw images are captured; and a computer for generating an interpolation image by linear interpolation for the captured raw image using the information of the scanning position as well as generating a combined frame image using the interpolation image.. ... Mitutoyo Corporation

11/16/17 / #20170328697

Sensor signal offset compensation system for a cmm touch probe

A touch probe circuit comprises a displacement sensor having a sensor signal responsive to touch probe stylus displacement, an offset compensation controller, and a difference amplifier. The offset compensation controller provides a varying offset compensation signal to compensate drift in a rest-state signal component of the sensor signal. ... Mitutoyo Corporation

11/09/17 / #20170324895

Autofocus system for a high speed periodically modulated variable focal length lens

A system for providing an automatically focused image comprises an imaging system including a high speed periodically modulated variable focal length (vfl) lens, a vfl lens controller, a vfl-projected light source, a focus determining portion, an exposure timing adjustment circuit, and an exposure strobe time controller. The focus determining portion comprises an optical detector that inputs reflected vfl-projected light that is projected to, and reflected from, a workpiece through the vfl lens, and provides a focus deviation signal. ... Mitutoyo Corporation

10/26/17 / #20170307546

Method and apparatus for detecting defect in transparent body

A quantitative, high-sensitivity examination of defects in a transparent product is realized, using a low-cost and space-saving optical dimension measuring apparatus to carry out measurement in a non-contact manner to avoid damaging the object of inspection and to avoid sensory examination. A transparent body to be examined is disposed between a light emitting unit and a light-receiving unit arranged opposite each other. ... Mitutoyo Corporation

10/05/17 / #20170285318

Imaging system and imaging method

An imaging system includes: an image forming device that obtains image information of an object with the focal length to the object being changed by a variable focal length lens in an optical system, so as to form an all-focused image of the object; a sensor device that detects variations in the surface level of the object in a focus direction; and a position adjustment device that adjusts the position of the object in the focus direction in accordance with the surface level variations of the object detected by the sensor device. The position adjustment device adjusts the position of the object in the focus direction in such a manner that the surface level of the object becomes closer to the center of a variable focal length range of the variable focal length lens.. ... Mitutoyo Corporation

10/05/17 / #20170284794

Measuring probe and measuring probe system

A measuring probe for measuring a screw groove of a relatively movable ball screw includes a light source, an objective lens formed to correspond to the screw groove of the ball screw, arranged to be opposed to the screw groove of the ball screw in a non-contact manner, and configured to emit light from the light source to the screw groove of the ball screw, and a line sensor configured to detect an interference pattern generated by reflected light from the screw groove of the ball screw and reflected light on a surface of the objective lens. This enables high-accuracy measurement of a specified area of a shape of a side surface of a relatively movable work in a non-contact manner.. ... Mitutoyo Corporation

10/05/17 / #20170284462

Air bearing

The air bearing includes a main body part having a bearing surface opposed to a guide face, first and second flow path parts, which are provided in the main body part, for allowing compressed air supplied from outside to flow, an air supply hole, which is provided in the flow path part, for supplying compressed air to the guide face to form an air film between the bearing surface and the guide face, and a negative pressure generating part, which is provided in the second flow path part intersecting with the first flow path part, for generating a negative pressure for sucking air between the guide face and the main body part by increasing the flow velocity of the compressed air.. . ... Mitutoyo Corporation

09/28/17 / #20170276522

Photoelectric encoder

A scale is provided with a two-level code pattern according to a pseudo random code sequence along a length measurement direction. Each code of the two-level code pattern indicates a code “1” or “0”, each code includes two bits, and each bit of the two bits is l or h. ... Mitutoyo Corporation

09/21/17 / #20170270685

Control method of surface texture measuring apparatus

A part program generating device includes a cad data memory storing cad data of a work piece, a measurement condition definer receiving an input operation performed by a user and defining a measurement procedure, and a part program generator converting the measurement procedure defined by the measurement condition definer into a part program language. The measurement condition definer provides the user with, as a graphical user interface, an editing window capable of editing the measurement procedure in an editing language and a command icon providing a command to be used for defining the measurement procedure as an icon. ... Mitutoyo Corporation

09/21/17 / #20170270684

Part program generating device of surface texture measuring apparatus

A part program generating device includes a cad data memory storing cad data of a work piece, a measurement condition definer receiving an input operation performed by a user and defining a measurement procedure, and a part program generator converting the measurement procedure defined by the measurement condition definer into a part program language. The measurement condition definer provides the user with, as a graphical user interface, an editing window capable of editing the measurement procedure in an editing language and a command icon providing a command to be used for defining the measurement procedure as an icon. ... Mitutoyo Corporation

09/21/17 / #20170268906

Absolute electromagnetic position encoder

An absolute electromagnetic position encoder comprises a readhead and an absolute scale. The readhead comprises field generation and detection configuration and a readhead processor. ... Mitutoyo Corporation

09/21/17 / #20170268905

Absolute electromagnetic position encoder

An absolute electromagnetic position encoder comprises a readhead and an absolute scale. The readhead comprises a spatially modulated signal coupling configuration and a readhead processor. ... Mitutoyo Corporation

08/31/17 / #20170248419

Information processing apparatus, information processing method, and non-transitory computer readable recording medium

Provided is an information processing apparatus including: an input unit into which shape data of a surface to be measured including a plurality of recesses is input; and a setting unit that detects each of the plurality of recesses on the basis of the input shape data and sets, for the detected recess, a region to be removed including the recess.. . ... Mitutoyo Corporation

08/31/17 / #20170248416

Surface texture measuring apparatus and method

A surface texture measuring apparatus includes: a measurement sensor measuring, without contact, a surface texture of an interior wall of a cylinder portion of a measurable object while displacing in a normal direction of the interior wall at each measurement region into which the interior wall is divided in a circumferential direction of the cylinder portion; a w axis displacer displacing the measurement sensor in a w axis direction; a θ axis displacer displacing the measurement sensor in the circumferential direction, after measurement of the surface texture of a first measurement region, such that the measurement sensor faces a second measurement region adjacent to the first measurement region in the circumferential direction; and a controller adjusting a w axis direction measurement position for measuring the surface texture of the second measurement region while displacing the measurement sensor in the w axis direction.. . ... Mitutoyo Corporation

08/31/17 / #20170248415

Surface texture measuring apparatus

A surface texture measuring apparatus includes an x axis displacement mechanism and a y axis displacement mechanism displacing a measurable object having an interior wall along an xy plane; a measurement sensor measuring a surface texture of the interior wall without contact; a z axis displacement mechanism displacing the measurement sensor in a z axis direction orthogonal to the xy plane and bringing the measurement sensor to face the interior wall; a w axis displacement mechanism displacing the measurement sensor facing the interior wall in a normal direction of the interior wall; and a θ axis displacement mechanism displacing the measurement sensor facing the interior wall along the interior wall.. . ... Mitutoyo Corporation

08/31/17 / #20170248410

Measurement method and measurement program

According to an embodiment of the present invention, a method of measuring a surface of an object having a curved shape by measuring a distance from a measurement head to the object, includes: setting a measuring region of the object and a threshold value of concave and convex; acquiring shape reference data including the curved shape of the object; acquiring three-dimensional data of the surface of the object by measuring the distance between the object in the measuring region and the measurement head; acquiring curve removed data by removing the shape reference data from the three-dimensional data; calculating second reference data by calculating first reference data based on the curve removed data, by removing data exceeding the threshold value with respect to the first reference data, from the curve removed data, and by averaging the curve removed data; and calculating shape data of the concave and convex.. . ... Mitutoyo Corporation

08/31/17 / #20170248409

Measurement method and measurement program

According to an embodiment of the present invention, a method of measuring a shape based on reflected light from a surface of an object irradiated with light from a measurement head, includes: acquiring a first measurement result by setting a measurement condition suitable for the measurement of a first region of the object and by measuring a first scanning range of the surface with a first scanning pitch; determining a second region of the surface except the first region from the first measurement result; and acquiring a second measurement result by setting a measurement condition suitable for the measurement of the second region and by measuring a second scanning range of the surface narrower than the first scanning range with a second scanning pitch finer than the first scanning pitch.. . ... Mitutoyo Corporation

08/31/17 / #20170248402

Measuring probe

A measuring probe includes two supporting members, each having a rotationally symmetric shape and allowing for an attitude change of a stylus, in an axial direction of a probe housing. Four detection elements are disposed at fourfold symmetric positions in one of the two supporting members that includes four deformable arm parts. ... Mitutoyo Corporation

08/31/17 / #20170248400

Measuring probe

A measuring probe includes: a stylus having a contact part to be brought into contact with an object to be measured; a probe housing capable of supporting the stylus on an axial center; and a detection element capable of detecting a movement of the contact part. The measuring probe further includes: two supporting members disposed in an axial direction of the probe housing, the supporting member allowing for an attitude change of the stylus; and a coupling shaft for coupling the two supporting members together. ... Mitutoyo Corporation

08/31/17 / #20170248399

Inner-wall measuring instrument and offset-amount calculation method

An inner-wall measuring instrument includes: a placement surface on which an object to be measured is placed; a base relatively movable with respect to the placement surface in three axis directions orthogonal to one another; a touch probe that is disposed at a first position of the base and brought into contact with the object; an image probe that is disposed at a second position of the base and capable of imaging the object with a direction parallel to the placement surface being an imaging direction; a rotational drive unit that rotates the image probe around an axis extending in a direction perpendicular to the placement surface; a linear drive unit that moves the image probe in the imaging direction; and a calculator that calculates an offset amount between the touch probe disposed at the first position and the image probe disposed at the second position.. . ... Mitutoyo Corporation

08/24/17 / #20170241767

Geometry measurement system, geometry measurement apparatus, and geometry measurement method

The geometry measurement apparatus includes: an image acquisition part that acquires a plurality of captured images generated by imaging an object to be measured, onto which a plurality of respectively different projection patterns are sequentially projected; a quantization part that generates a quantization value of a luminance value for each pixel in the plurality of captured images by comparing the luminance value with a predetermined reference value; a selection part that selects, based on the relationship between the reference value and the luminance value for a plurality of pixels having the same coordinates in the plurality of captured images, a quantization value to be used for identifying the geometry of the object to be measured, from among a plurality of quantization values corresponding to the plurality of captured images; and a geometry identification part that identifies the geometry of the object to be measured based on the quantization value selected by the selection part.. . ... Mitutoyo Corporation

08/10/17 / #20170228884

Image measuring device and program

An image measuring device includes an image capturer capturing an image of a work piece, a displacer relatively displacing the work piece and the image capturer, a position acquirer obtaining a position where the image is captured by the image capturer, a controller controlling the image capturer to capture partial images of the work piece while displacing the image capturer relative to the work piece at a fixed speed using the displacer, a total image former forming a total image of the work piece by pasting together a plurality of partial images captured by the image capturer based on position data obtained by the position acquirer, and a light source integrally displacing with the image capturer relative to the work piece and emitting light at a portion of the work piece captured by the image capturer.. . ... Mitutoyo Corporation

08/10/17 / #20170227384

Photoelectric encoder

The photoelectric encoder 1 includes a scale 2, and a detection head 3 including a light emitting unit 4, an index 5, and a detection unit 6. The index 5 includes a first index portion 50 consisting of diffraction portions and non-diffraction portions alternately juxtaposed at a predetermined pitch along the longitudinal direction of the scale 2, and a second index portion 51 consisting of diffraction portions and non-diffraction portions alternately juxtaposed at twice the pitch of the first index portion 50. ... Mitutoyo Corporation

08/10/17 / #20170227352

Chromatic confocal sensor and measurement method

Provided is a chromatic confocal sensor including: a first light source that emits measurement light including a plurality of light beams having different wavelengths; a second light source that emits a visible light beam having a predetermined wavelength; an optical head that causes incident light to be converged at a focal position corresponding to a wavelength of the incident light and outputs reflection light reflected by an object to be measured at the focal position; a position calculation section that calculates a position of the object to be measured on the basis of the reflection light output by the optical head; and a switching section that selectively switches between a first operation in which only the measurement light enters the optical head and a second operation in which at least the visible light beam enters the optical head.. . ... Mitutoyo Corporation

08/10/17 / #20170227345

Probe head of three-dimensional coordinate measuring device and touch detection method

A probe head of a three-dimensional coordinate measuring device according to an embodiment of the present invention includes a measurer, a first and second diaphragm, a first oscillator, and a second oscillator. The measurer extends in a first direction. ... Mitutoyo Corporation

06/22/17 / #20170178315

Image measuring method and image measuring device

. . An image measuring method performed with an image measuring device measuring a dimension of a measured object from an image of the measured object captured by an image capturer. The method executes a standard reference object measurement measuring a dimension of the standard reference object with the image measuring device; a standard reference dimension input inputting a dimension of the standard reference object specified by a device other than the image measuring device; a preset value calculation calculating a preset value from the dimension of the measured standard reference object and from a dimension of the standard reference object measured by a predetermined measurement tool; a measurement measuring a dimension of a measured object other than the standard reference object using the image measuring device; and a correction correcting the dimension of the measured object other than the standard reference object measured by the image measuring device.. ... Mitutoyo Corporation

06/22/17 / #20170176226

Multi-mode metrology user interface device

A multi-mode metrology user interface device includes a signal processing and control portion, a user input interface portion, and a communication portion. The signal processing and control portion includes a measurement display mode configured to display measurement values from multiple metrology devices. ... Mitutoyo Corporation

06/22/17 / #20170176219

Encoder

A scale has a first pattern area and a second pattern areas disposed with an offset from the first pattern area in a measurement direction by 1/(2×s) of pitch. A detection head detects interference fringes caused by positive s-th-order diffracted beams and negative s-th-order diffracted beams diffracted by the scale, and output a detection result. ... Mitutoyo Corporation

06/22/17 / #20170176218

Encoder

A scale is provided with a reference mark and an incremental pattern. A detection head is relatively movable in a measurement direction with respect to the scale, and detects a light intensity distribution of diffracted beams if beams radiated onto the scale are diffracted by the reference mark, and outputs the detection result. ... Mitutoyo Corporation

06/22/17 / #20170176171

Measurement device with multiplexed position signals

A scanning probe responsive in three axes is provided for use with a coordinate measuring machine. The scanning probe utilizes multiplexing techniques for producing x, y and z position signals. ... Mitutoyo Corporation

06/22/17 / #20170176170

Optical configuration for measurement device

A scanning probe is provided for use with a coordinate measuring machine. The scanning probe includes a rotary position detection configuration which outputs x and y position signals indicative of a rotation of a stylus coupling portion about a rotation center, and an axial position detection configuration which outputs a z position signal indicative of the position of the stylus coupling portion along the axial direction. ... Mitutoyo Corporation

06/15/17 / #20170167893

Electronic absolute position encoder

An electronic absolute position encoder comprises a scale, a detector and a signal processing configuration. The scale comprises a signal modulating scale pattern including a first periodic pattern component having a spatial wavelength λ1, and a second periodic pattern component having a spatial wavelength λ2. ... Mitutoyo Corporation

06/15/17 / #20170167854

Internal diameter measuring method for transparent tube

A transparent tube is placed in a parallel laser light beam emitted from a light projector and reaching a photoreciever, and a detection signal indicating an amount of light received corresponding to a width direction position of the parallel laser light beam is obtained from the photoreceiver. Peaks formed in the detection signal by beams reflected by an inner circumferential surface of the transparent tube and incident to the photoreceiver are detected; width direction positions of two intersection points where the peaks cross a predetermined threshold value are detected; the width direction positions of the light beam reflected by the inner circumferential surface of the transparent tube are calculated from an average value of the two intersection points; and an internal diameter of the transparent tube is measured from the width direction positions.. ... Mitutoyo Corporation

06/15/17 / #20170167852

Optical measuring method and measuring apparatus for external dimension

A light emitter and a reflector are placed such that an optical axis of a measuring light beam and an optical axis of a reflection light beam intersect, and further the measuring light beam and the reflection light beam are formed inside the same virtual measuring plane; a first measuring light beam and a second measuring light beam are defined in the measuring light beam, a first and second reflection light beam are defined in the reflection light beam, a measured object is placed in a measuring region on a measuring plane where the first and second measuring light beams overlap, an external diameter of the measured object in a first direction is measured from a shadow appearing in the first reflection light beam and an external diameter of the measured object in a second direction is measured from a shadow appearing in the second reflection light beam.. . ... Mitutoyo Corporation

06/15/17 / #20170167840

Measuring device

A measuring device which reduces reading errors caused by parallax. The measuring device has a gauge head abutting against an object to be measured, and includes a pointer-type display part which displays displacement of the gauge head obtained by being enlarged by an enlarging mechanism and being converted into a rotation amount of a pointer. ... Mitutoyo Corporation

06/08/17 / #20170161904

Image measurement device and controlling method of the same

An image measurement device according to the present invention comprises: a stage on which a measurement object is mounted; an imaging device imaging the measurement object for a certain imaging range and outputting image information; a position control device that moves the imaging device to a plurality of measurement positions and scans in a scanning direction; and an arithmetic processing device that calculates a displacement of the measurement object. The imaging device is configured capable of imaging a preliminary measurement range broader than the certain imaging range. ... Mitutoyo Corporation

05/18/17 / #20170139194

Interference objective lens and reference surface unit set

An interference objective lens includes: an objective lens configured to converge a light to be emitted from a light source toward a measurement target; a reference surface unit having a reference surface; and a beam splitter configured to split the light having passed through the objective lens into a reference optical path facing toward the reference surface and a measurement optical path facing toward the measurement target, to synthesize a reflected light from the reference surface and a reflected light from the measurement target, and to output the same as an interference light, wherein the reference surface unit is configured to be replaceable.. . ... Mitutoyo Corporation

05/11/17 / #20170131535

Optical pickup device

An optical pickup device according to an embodiment of the present invention includes: a light source that outputs a light beam; an irradiation optical system that projects onto a measurement target the light beam outputted from the light source; an imaging optical system that converges and images the light beam reflected by the measurement target; a light receiving part that receives the light beam imaged by the imaging optical system; and a peak separation part that when the light beams reflected by a first surface and a second surface of the measurement target are assumed to be a first reflected beam and a second reflected beam, separates peaks of light intensity of the first and second reflected beams with respect to a distance between the irradiation optical system and the measurement target in the light receiving part.. . ... Mitutoyo Corporation

05/04/17 / #20170122856

Hardness testing apparatus and hardness testing method

A hardness tester includes a correlation memory storing correlation data which associates hardness of a standard reference sample based on dimensions of an indentation formed by pressing an indenter into a surface of the standard reference sample, and hardness of the standard reference sample based on test force and depression amount during formation of the indentation in the standard reference sample. A cpu measures the test force and depression amount during formation of the indentation in a measured sample; calculates an estimated value of the hardness of the measured sample based on the measured test force and depression amount; and calculates the hardness of the measured sample based on the calculated estimated value and the correlation data.. ... Mitutoyo Corporation

04/27/17 / #20170115141

Inspection machine and attachment jig therefor

A jig includes three columnar members, a stylus head receiving member, and a jig fixation portion. The second columnar member extends in a z direction. ... Mitutoyo Corporation

04/27/17 / #20170115109

Control method of profile measuring apparatus

During a retraction where a stylus tip separates from a work piece from a state where the stylus tip and the work piece are in contact, whether there is contact between the stylus tip and the work piece is monitored. When the contact between the stylus tip and the work piece is detected during the retraction, a probe is displaced to a position where the stylus tip does not come in contact with the work piece and a recovery process is executed. ... Mitutoyo Corporation

04/20/17 / #20170110007

Battery-less data transmission module accessory for portable and handheld metrology devices

A data transmission module is provided as a battery-less accessory for attachment to portable metrology devices (e.g., handheld digital calipers, micrometers, indicators, etc.). Rather than utilizing battery resources from the metrology devices, the data transmission module utilizes energy harvested wirelessly from a remote data node (e.g., a computer system, display, etc.) to power transmission of measurement data signals to the remote data node. ... Mitutoyo Corporation

04/20/17 / #20170108324

Manual measuring system

A manual measuring system (an articulated three-dimensional coordinate measuring machine or a gantry three-dimensional coordinate measuring machine) allows a measuring probe to be manually moved while enabling a user to focus on making measurements and allows the user to manually move the measuring probe in order to facilitate and accelerate measurements. The manual measuring system includes a sub-monitor (portable terminal) that is mounted near the tip of the measuring probe. ... Mitutoyo Corporation

04/13/17 / #20170102305

Hardness testing apparatus and indenter of hardness testing apparatus

A hardness tester loads a predetermined test force on an indenter and presses into a surface of a sample to form an indentation. The indenter includes an indenter memory storing indenter information specific to the indenter. ... Mitutoyo Corporation

04/06/17 / #20170097221

Measuring probe and measuring probe system

A measuring probe for measuring a screw groove of a relatively rotatable ball screw includes a stylus having a tip end portion configured to contact the screw groove, a radial-direction displacement mechanism configured to support the stylus so as for the stylus to be displaceable in an x direction toward an axial center of the ball screw, an axial-direction displacement mechanism configured to support the stylus so as for the stylus to be displaceable in an axial direction (z direction) of the axial center, and sensors configured to detect displacement of the stylus produced by the radial-direction displacement mechanism and the axial-direction displacement mechanism. This enables high-accuracy measurement of a predetermined position of a side surface of a relatively rotatable work.. ... Mitutoyo Corporation

04/06/17 / #20170097220

Coordinate measuring apparatus

A coordinate measuring apparatus includes a base on which an object to be measured is mounted, a movable x-axis beam, a y-axis column with a hollow part that is provided on the base and supports the x-axis beam, a control unit that is provided under the base and controls the movement of the x-axis beam, and a cable that is wired from the x-axis beam to the control unit through the hollow part of the y-axis column.. . ... Mitutoyo Corporation

03/30/17 / #20170093413

Signal processing apparatus for measuring machine

. . There is provided a signal processing apparatus, which can perform measurement with a wide dynamic range and high resolution, for a measuring machine. A first analog-to-digital (ad) converter ad-converts a sensor signal into an upper digital signal. ... Mitutoyo Corporation

03/30/17 / #20170090742

Inspection program editing environment including integrated alignment program planning and editing features

A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine (cmm), including a user interface that comprises a workpiece inspection program simulation portion configurable to display a 3-d view of a workpiece; an editing user interface portion comprising an editable plan representation of a current workpiece feature inspection plan for the workpiece; and an editable alignment program plan representation for the workpiece. The system is configured with the editable alignment program plan representation being automatically responsive to editing operations, regardless of whether the editing operations are performed in the 3-d view or the editable plan representation. ... Mitutoyo Corporation

03/30/17 / #20170089741

Signal processing circuit for measuring machine

There is provided a signal processing circuit, which improves a signal sn ratio, for a measuring machine. A sensor uses two or more reference signals processed so as to have a mutual predetermined phase difference. ... Mitutoyo Corporation

03/30/17 / #20170089738

Absolute position encoder including a redundant spatial phase signal

An electronic absolute position encoder is provided having a scale, a detector, and a signal processor configured to determine an absolute position of the detector along the scale. The scale includes a signal modulating scale pattern comprising a periodic pattern component and a gradual pattern variation component. ... Mitutoyo Corporation

03/30/17 / #20170089737

Optical encoder

An optical encoder comprises an illumination source, a scale grating extending along a measuring axis direction, an optical portion, a moiré grating, and a detector portion. The optical portion comprises an aperture portion for spatial filtering of scale light from the scale grating. ... Mitutoyo Corporation

03/30/17 / #20170089683

Coefficient-of-thermal-expansion measurement method of dimension reference gauge, measuring device for coefficient of thermal expansion and reference gauge

A measurement target and a reference gauge are placed in parallel in an inside of a temperature-controlled chamber. After an interior temperature of the temperature-controlled chamber is set at a first temperature, a relative measurement of a length from a first surface to a second surface of the measurement target is performed with reference to a length from a first reference surface to a second reference surface of the reference gauge. ... Mitutoyo Corporation

03/30/17 / #20170089681

Linear displacement measuring apparatus

There is provided a linear displacement measuring apparatus which notifies a user when being installed defectively. A slider includes a traveling body which travels along a main scale on the main scale, a carriage part mounted on an object, and coupling means which couples the traveling body with the carriage part. ... Mitutoyo Corporation

03/16/17 / #20170078549

Machine vision inspection system and method for obtaining an image with an extended depth of field

A method for providing an extended depth of field (edof) image includes: periodically modulating an imaging system focus position at a high frequency; using an image exposure comprising discrete image exposure increments acquired at discrete focus positions during an image integration time comprising a plurality of modulation periods of the focus position; and using strobe operations having controlled timings configured to define a set of evenly spaced focus positions for the image exposure increments. The timings are configured so that adjacent focus positions in the set are acquired at times that are separated by at least one reversal of the direction of change of the focus position during its periodic modulation. ... Mitutoyo Corporation

03/16/17 / #20170078532

Chromatic aberration correction in imaging system including variable focal length lens

An image acquisition system is operated to provide an image that is relatively free of the effect of longitudinal chromatic aberration. The system includes a variable focal length lens (e.g., a tunable acoustic gradient index of refraction lens) that is operated to periodically modulate a focus position. ... Mitutoyo Corporation

03/16/17 / #20170076436

Hardness test apparatus and hardness testing method

A hardness tester includes a memory associating and storing a parts program having defined measurement conditions with respect to a sample, including a test position, and an image file acquired by capturing an image of the shape of the sample; an image acquirer acquiring image data of the sample to be measured; a pattern matcher performing a pattern matching process on the image data of the sample using the image file associated with the parts program; a determiner determining whether an image file exists which has a shape related to the image data of the sample; a retriever retrieving the parts program associated with the image file having a related shape; and a measurer measuring hardness of the sample based on the retrieved parts program.. . ... Mitutoyo Corporation

03/16/17 / #20170074765

Hardness test apparatus and hardness testing method

A hardness tester includes a memory storing, as a parts program, definitions of measurement conditions including a coordinate system and test position defined with respect to an image of a standard reference sample; a pattern searcher performing a pattern searching process, with reference to a plurality of samples to be measured, using a pattern image based on the image of the standard reference sample, and detecting a number of samples having a shape identical to that of the standard reference sample, as well as a position and angle of the samples having the identical shape; a pattern definer defining a coordinate system and test position for each of the samples having the identical shape based on the position and angle of each of the samples having the identical shape; and a measurer measuring the hardness of the samples for which the coordinate system and test position have been defined.. . ... Mitutoyo Corporation

03/16/17 / #20170074764

Hardness test apparatus and hardness testing method

The present invention includes: an image capturer capturing an image of the sample to be measured; an image acquirer acquiring image data of the sample captured by the image capturer; a pattern searcher performing, on the image data of the sample acquired by the image acquirer, pattern searching process using a pattern image selected based on the sample and identifying a position in the image matching the pattern image; a profile extractor extracting a profile of the sample based on the position in the image identified by the pattern searcher; a calculator calculating a hardness measurement position of the sample based on the profile extracted by the profile extractor; and a measurer executing hardness testing on the sample based on the hardness measurement position calculated by the calculator and measuring the hardness of the sample.. . ... Mitutoyo Corporation

03/16/17 / #20170074763

Hardness tester

A hardness tester forms an indentation on a surface of a sample by loading a predetermined test force with an indenter and measures a hardness of the sample using the indentation. The hardness tester includes a light source emitting light on the surface of the sample and forming an illumination pattern having a spot; and a controller forming the indentation by bringing the indenter into contact with the sample in a state where a perpendicular line of a vertex of the indenter overlaps a test point when the position of the spot of the illumination pattern formed by the light source on the surface of the sample is used as the test point.. ... Mitutoyo Corporation

03/16/17 / #20170074687

Absolute position detection type photoelectric encoder

There is provided an absolute position detection type photoelectric encoder which improves robustness to dirt while maintaining high resolution. A two-level code pattern according to a pseudo random code sequence is provided on a scale along a length measurement direction. ... Mitutoyo Corporation

03/16/17 / #20170074686

Photoelectric encoder

A photoelectric encoder of the present invention includes: a scale which includes a grid scale; a light emitting portion which irradiates light toward the scale; a light receiving portion which detects an image of the grid scale of the scale; and a telecentric optical unit which is provided between the scale and the light receiving portion and forms the image of the grid scale on the light receiving portion, wherein the telecentric optical unit includes a first optical element which is disposed near the scale, a second optical element which is disposed near the light receiving portion in relation to the first optical element and is disposed so that a gap is formed between the second optical element and the first optical element, and an aperture which is provided in at least one of a face near the second optical element in the first optical element and a face near the first optical element in the second optical element.. . ... Mitutoyo Corporation

03/09/17 / #20170067758

Encoder

A scale includes a grating pattern arranged in a measurement direction. A detection head can be moved relative to the scale in the measurement direction and outputs an electric signal indicating a result of detection of the pattern. ... Mitutoyo Corporation

03/09/17 / #20170067737

Inspection program editing environment providing user defined collision avoidance volumes

A system is provided for programming workpiece feature inspection operations for a coordinate measuring machine. The system includes a computer aided design (cad) file processing portion, an inspection motion path generation portion and a user interface. ... Mitutoyo Corporation

03/02/17 / #20170061649

Image measuring apparatus and non-temporary recording medium on which control program of same apparatus is recorded

An image measuring apparatus according to an embodiment of the present invention comprises: an imaging device that images a workpiece to acquire an image of this workpiece; and a processing device that performs measurement of the workpiece based on this image and outputs a measurement result. Moreover, the processing device, based on the above-described image, generates another image whose number-of-pixels is smaller than that of the image, sets a plurality of regions based on this another image, and calculates the above-described measurement result based on these plurality of regions.. ... Mitutoyo Corporation

03/02/17 / #20170061614

Image measuring apparatus and non-temporary recording medium on which control program of same apparatus is recorded

An image measuring apparatus according to an embodiment of the present invention comprises: an imaging device that images a workpiece to acquire an image of this workpiece; and a processing device that performs measurement of the workpiece based on this image and outputs a measurement result. Moreover, the processing device sets a region in the image, sets a plurality of first points along a contour line of this region, sequentially moves these plurality of first points so that the plurality of first points approximate to the contour line included in the image, acquires the moved plurality of first points as a plurality of second points, and calculates the measurement result based on these plurality of second points.. ... Mitutoyo Corporation

03/02/17 / #20170061601

Multi-level image focus using a tunable lens in a machine vision inspection system

A method is provided for defining operations for acquiring a multi-exposure image of a workpiece including first and second regions of interest at different z heights. The multi-exposure image is acquired by a machine vision inspection system including strobed illumination and a variable focal length lens (e.g., a tunable acoustic gradient index of refraction lens) used for periodically modulating a focus position. ... Mitutoyo Corporation

03/02/17 / #20170059297

Probe head rotating mechanism

A probe head rotation mechanism, situated between a spindle and a probe of a coordinate measurement device, includes: a main body frame supported by the spindle; a rotor supported by the main body frame so as to be capable of tilting with respect to an axial center of the spindle; the main body frame; and a motor supported by the main body frame and driving the rotor. A motor main body is arranged away from lying on the axial center of the spindle, and an axial center of the motor is oriented outward in a diameter direction of the spindle.. ... Mitutoyo Corporation

03/02/17 / #20170059295

Measuring apparatus

A measuring apparatus of the present invention includes a stage on which a measured object is placed, a measurement head having an information obtainer obtaining an image of the object, and a vertical driver supporting the measurement head so as to allow movement in a vertical direction. The vertical driver includes a counterbalance mechanism having a hanger of the measurement head, a pulley winding up and withdrawing the hanger by rotation, a spring increasing elastic force by stretching the spring when the measurement head displaces downward, and a cam rotating in conjunction with the pulley and having a cam shape decreasing rotational torque provided to the pulley by the elastic force as a stretching amount of the spring increases.. ... Mitutoyo Corporation

02/23/17 / #20170052018

Method for measuring a height map of multiple fields of view and combining them to a composite height map with minimized sensitivity to instrument drift

A method for measuring a height map of multiple fields of view on a surface of a substrate with an optical profilometer and combining them to a composite height map, the method includes: moving the profilometer relative to the surface from field to field along a route; measuring height maps of fields on the surface along the route with the profilometer; and, combining a plurality of height maps of measured fields by normalizing said height maps to each other to produce a composite height map of the surface; wherein the route is configured to minimize sensitivity to height drifting of the profilometer during combining a plurality of the height maps.. . ... Mitutoyo Corporation

02/02/17 / #20170030745

Displacement detecting device

A displacement detecting device includes a main scale and a detecting head unit. The detecting head unit includes a light source, a light receiving unit, and an index scale group that is disposed in the middle of a light path from the main scale to the light receiving unit. ... Mitutoyo Corporation

02/02/17 / #20170030744

Displacement detecting device

A displacement detecting device includes a scale diffraction grating and a detecting head unit. The detecting head unit includes a light source, a first retroreflecting unit that retroreflectes positive first-order diffracted light of light diffracted by the scale diffraction grating, such that the retroreflected light enters the scale diffraction grating again, a second retroreflecting unit that retroreflectes negative first-order diffracted light of the light diffracted by the scale diffraction grating, such that the retroreflected light enters the scale diffraction grating again, and a light receiving unit that receives an interference signal each of the first retroreflecting unit and the second retroreflecting unit has a deflecting function of deflecting light incident on the corresponding retroreflecting unit by a predetermined angle and then emitting the light.. ... Mitutoyo Corporation

01/19/17 / #20170019053

Feedback control device

Motor control device includes a controller controlling a motor (a calculator controller and an electric current controller), and a detector (an electric current loop) detecting an electric current of the motor and returning the detected electric current to the controller. The electric current loop includes a first detection system, a second detection system, and an electric current calculator which sums output signals from each system. ... Mitutoyo Corporation

01/19/17 / #20170016711

Instantaneous phase-shift interferometer

An instantaneous phase-shift interferometer uses a light source having a coherence length shorter than a difference in optical path length between the light reflected from a reference surface and the light reflected from a measured surface. A beam from the light source is split and, using an adjustable delay optical path, a first beam is delayed to cause a difference in optical path length and is superimposed on the same optical axis as a second beam, after which the reference beam and the measurement beam are generated. ... Mitutoyo Corporation

01/12/17 / #20170013185

Adaptable operating frequency of a variable focal length lens in an adjustable magnification optical system

An imaging system is provided for a precision machine vision inspection or metrology system. The imaging system optical path includes a variable magnification lens portion and a variable focal length lens portion. ... Mitutoyo Corporation

01/12/17 / #20170010452

Chromatic range sensor including dynamic intensity compensation function

A chromatic point sensor (cps) system is provided, which compensates for potential errors due to input spectral profile intensity inconsistencies that arise when driving a cps illumination source using different power levels. The cps system includes an optical pen comprising a confocal optical path including a chromatically dispersive element and configured to focus different wavelengths at different distances proximate to a workpiece surface to be measured, an illumination source, and cps electronics. ... Mitutoyo Corporation

01/12/17 / #20170010096

Chromatic confocal range sensor comprising a camera portion

A chromatic confocal range sensor optical pen comprises a housing, an in/out optical fiber, a chromatically dispersive lens configuration, a reflected light dividing configuration comprising a lower na zone and a higher na zone, and a camera portion. The lens configuration is configured to receive source light from the optical fiber and output focused source light to a workpiece surface with axial chromatic dispersion, and receive reflected light from the workpiece surface and focus at least a portion of the reflected light to the fiber aperture. ... Mitutoyo Corporation








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