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Olympus Ndt Inc patents (2015 archive)


Recent patent applications related to Olympus Ndt Inc. Olympus Ndt Inc is listed as an Agent/Assignee. Note: Olympus Ndt Inc may have other listings under different names/spellings. We're not affiliated with Olympus Ndt Inc, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "O" | Olympus Ndt Inc-related inventors


10/01/15 / #20150276371

Aparatus and method for conducting and real-time application of ec probe calibration

A system and method for carrying out non-destructive testing and inspection of test objects to inspect for anomaly using eddy current instruments, the instrument has an on-board calibration module configured to provide probe-specific conductivity or thickness correction data over a plurality of testing points of a standard block having known conductivity and thicknesses using the same physical probe as is used for the inspection measurements. When the same probe induces eddy current into a test object, the instrument having a processor or computing unit, computes a conductivity or thickness value, corrected by the above said correction data pertaining to the specific probe.. ... Olympus Ndt Inc

07/30/15 / #20150212184

Packet based dds minimizing mathematical and dac noise

Disclosed are a method of and an apparatus devising a packet based dds circuitry for performing packet based a direct digital synthesizing (dds) function within an electronic testing instrument. The circuitry comprising a dds logic circuit configured to execute direct digital syntheses on a plurality of consecutive packets of sine-like waves, each packet having a length of a period precisely chosen such that the sine wave at the end of one packet matches up with the sine wave at the start of the immediate subsequent packet. ... Olympus Ndt Inc

03/26/15 / #20150085143

Method and circuitry for removing circling drifts in ndt/ndi measurement display

Disclosed is a method and an apparatus for removing circling drifts on the display of the measured eddy current or other continuous waves. The circling dot which is supposed to be a static dot can obscure information required by the operator to judge if a small defect is present. ... Olympus Ndt Inc

02/19/15 / #20150049108

Method and system of signal representation for ndt/ndi devices

Disclosed is a method and system to provide an improved signal representation of non-destructive test/inspection instruments by proper color display, in order to emulate as closely as possible, the visual rendering effect of those seen in the traditional non-electronic testing, including penetrant testing and magnetic particle testing. The foregoing object of the invention is preferably realized by providing an eddy current or phased array instrument with a color palette module that allows the deployment of an array of color representation system typically used in traditional non-electronic testing methods.. ... Olympus Ndt Inc

02/05/15 / #20150039245

System and method of non-destructive inspection with a visual scanning guide

Disclosed is an inspection device and method of guiding an inspection probe according to a predetermined inspection plan. The device is couple with a probe which is to be moved according to the inspection plan on the test object, the device including an inspection guide unit having a guide control unit, a position encoding such as a 3-d camera and visual feedback eyewear. ... Olympus Ndt Inc








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