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Rudolph Technologies Inc patents

Recent patent applications related to Rudolph Technologies Inc. Rudolph Technologies Inc is listed as an Agent/Assignee. Note: Rudolph Technologies Inc may have other listings under different names/spellings. We're not affiliated with Rudolph Technologies Inc, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "R" | Rudolph Technologies Inc-related inventors

Substrate handling and identification mechanism

A structure and method for employing the structure to reliably read indicia formed on a substrate such as a panel or wafer is disclosed. A gripping member pulls the substrate into at least partial compliance with a locating structure to facilitate the proper function of a code reader. ... Rudolph Technologies Inc

Method of measuring and assessing a probe card with an inspection device

A method of assessing functionality of a probe card includes providing a probe card analyzer without a probe card interface, removably coupling a probe card having probes to a support plate of the probe card analyzer, aligning a sensor head of the probe card analyzer with the probe card, and measuring a component of the probes with the sensor head.. . ... Rudolph Technologies Inc

System and method of characterizing micro-fabrication processes

A system for assessing a structure and the tools and processes used to form the structure is described. 2d images of the structure are captured and processed to obtain 3d information concerning the structure. ... Rudolph Technologies Inc

Opto-acoustic metrology of signal attenuating structures

Methods and systems for manufacturing and analyzing interconnect structures in integrated circuit (ic) devices. The methods include forming an interconnect structure, such as a pillar, in an ic device. ... Rudolph Technologies Inc

Volumetric substrate scanner

A system for scanning a substrate and specifically a volume of that substrate to identify anomalous structures or defects is herein described. Radiation is focused at locations within the volume of the substrate and measurements of scattered light are made. ... Rudolph Technologies Inc

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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Rudolph Technologies Inc in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Rudolph Technologies Inc with additional patents listed. Browse our Agent directory for other possible listings. Page by