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Teradyne Inc patents

Recent patent applications related to Teradyne Inc. Teradyne Inc is listed as an Agent/Assignee. Note: Teradyne Inc may have other listings under different names/spellings. We're not affiliated with Teradyne Inc, we're just tracking patents.

ARCHIVE: New 2018 2017 2016 2015 2014 2013 2012 2011 2010 2009 | Company Directory "T" | Teradyne Inc-related inventors

Protection circuit

An example system includes a channel over which signals are transmitted between test equipment and a device under test (dut); and limiting circuitry to limit a voltage on the channel. The limiting circuitry includes a pn-junction device connected to pass current in response to the voltage on the channel exceeding a limit.. ... Teradyne Inc

Test fixture

An example test fixture, which interfaces a tester and a unit under test (uut), includes the following: first electrical contacts that face the tester; second electrical contacts that face the uut; a substrate made of sections of printed first material, with the first material being electrically non-conductive, and with the substrate being between the first electrical contacts and the second electrical contacts; and structures through the substrate, with the structures including sections of second material, with the second material being electrically conductive, and with at least one of the structures electrically connecting a first electrical contact and a second electrical contact.. . ... Teradyne Inc

Combining current sourced by channels of automatic test equipment

An example test system includes: multiple channels, where each of the multiple channels is configured to force voltage and to source current; and circuitry to combine current sourced by the multiple channels to produce a combined current for output on a single channel to a device under test (dut), where each of the multiple channels includes a load sharing resistor to control a contribution of the channel to the combined current.. . ... Teradyne Inc

Thermal control using phase-change material

An example test system includes: a test slot to hold a device under test (dut); a temperature control system comprising a phase-change material, with the temperature control system for maintaining a temperature of the phase-change material in a steady-state condition, with the phase-change material changing phase during a transient condition to affect a temperature of a thermally-conductive structure, and with the steady-state condition being longer in duration than the transient condition; and an air mover to direct air over the thermally-conductive structure and towards the dut in the test slot in order to affect a temperature of the dut.. . ... Teradyne Inc

Vibration testing tool

An example apparatus, such as a vibration testing tool, includes: a housing configured to fit into, and to connect to, a test slot configured to house a device for testing, with the test slot being part of a device test system; accelerometers connected to the housing and configured to output signals representing movement of the apparatus; and circuitry connected to the housing to generate data based on the signals, with the data being usable to determine multiple independent accelerations of the apparatus.. . ... Teradyne Inc

Thermal control of a probe card assembly

An example test system includes a test head and a probe card assembly connected to the test head. The probe card assembly includes: a probe card having electrical contacts, a stiffener connected to the probe card to impart rigidity to the probe card, and a heater to heat to at least part of the probe card assembly. ... Teradyne Inc

Time-aligning a signal

An example method includes: obtaining sinusoidal signals comprising components of a first time-domain signal; shifting phases of the sinusoidal signals by amounts corresponding to a specified time-shift to produce phase-shifted signals, and converting the phase-shifted signals to the time domain to produce time-shifted signals. The shifting may be performed to more closely align an envelope of the first time-domain signal with an envelope of a second time-domain signal.. ... Teradyne Inc

Automatic test system with focused test hardware

A tester interface unit comprising a test hardware module. The test hardware module may have a simple construction, relying on control and/or signal processing in one or more tester instruments to generate or analyze test signals for a device under test. ... Teradyne Inc

Pocketed circuit board

An example circuit board structure includes: a substrate; and vias that are electrically conductive and that pass through the substrate to enable electrical connection through the circuit board structure. The substrate is thinner, and lengths of the vias are shorter, in first areas of the circuit board structure that deliver first speed signals than in second areas of the circuit board structure that deliver second speed signals and power. ... Teradyne Inc

Front end module for automatic test equipment

Example automatic test equipment (ate) includes: a test instrument for outputting test signals to test a device under test (dut), and for receiving output signals from the dut, with the test instrument including a front-end module, and with the front-end module including internal circuitry for performing functions relating to the dut; and external circuitry for performing the functions relative to the dut via the test instrument, with the external circuitry being external to the front-end module and being shared among multiple front-end modules or channels of the test instrument. The test instrument is configurable to use either (i) the internal circuitry, (ii) the external circuitry, or (iii) a combination of circuits in the internal circuitry and the external circuitry to perform the functions.. ... Teradyne Inc

Manipulator in automatic test equipment

An example manipulator for transporting a test head includes: a tower having a base and a track, with the track being vertical relative to the base; an arm to enable support for the test head, with the arm being connected to the track to move the test head vertically relative to the tower; one or more motors to drive movement of the arm along the track; and pneumatic cylinders to control movement of the arm to cause the test head to apply an amount of force to a peripheral device.. . ... Teradyne Inc

Conductive temperature control

A test system includes a transporter having test sockets, where each test socket is configured to receive a device to be tested by the test system, and each test socket includes an element that is controllable to change a temperature of a device in the test socket through thermal conduction. The test system includes a test rack comprising slots. ... Teradyne Inc

Mem relay assembly for calibrating automated test equipment

Apparatus and methods for calibrating tester channels of an automated test system are described. A relay matrix assembly comprising a plurality of microelectromechanical (mem) switches may be used to connect a plurality of tester channels to analyzer calibration instrument rapidly without requiring serial, robotic probing of the test channels. ... Teradyne Inc

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This listing is an abstract for educational and research purposes is only meant as a recent sample of applications filed, not a comprehensive history. is not affiliated or associated with Teradyne Inc in any way and there may be associated servicemarks. This data is also published to the public by the USPTO and available for free on their website. Note that there may be alternative spellings for Teradyne Inc with additional patents listed. Browse our Agent directory for other possible listings. Page by